CN211741348U

CN211741348U - Vertical probe card

Info

Publication number: CN211741348U
Application number: CN201922192567.4U
Authority: CN
Inventors: 李芳�
Original assignee: Shenzhen Haosheng Precision Co ltd
Current assignee: Shenzhen Haosheng Precision Co ltd
Priority date: 2019-12-10
Filing date: 2019-12-10
Publication date: 2020-10-23
Anticipated expiration: 2029-12-10

Abstract

The utility model discloses a vertical probe card belongs to probe card technical field, including the probe card main part, the bottom of probe card main part is provided with the drain pan, the four corners department at the top of drain pan all is provided with surveys the chip, the outside at drain pan top is provided with the draw-in groove, the top of drain pan is provided with the top cap, the both sides at drain pan top all evenly are provided with multiunit test terminal, the inboard intermediate position department of drain pan is provided with spacing hole. The utility model discloses a spacing hole that sets up to fix the one end of probe pin with the drain pan through epoxy, extend away the other end of probe pin through indent and ring groove, and place the position in spacing hole through the fixed plate, thereby make the other end of probe pin install the position department of the butt joint in fixed plate and spacing hole, be convenient for fix a position probe pin fixedly, make the butt joint effect between probe and the probe card cutting ferrule better, and improved the rate of utilization.

Description

Vertical probe card

Technical Field

The utility model relates to a probe card technical field specifically is a vertical probe card.

Background

The probe card is a test interface, and is mainly used for testing a bare chip, and testing parameters of the chip by connecting a test machine and the chip and transmitting signals.

However, when the existing probe card fixes the probe, a pre-limiting component is lacked, so that the butt joint effect of the probe and a probe card sleeve is poor, the utilization rate is reduced, and when the upper card and the lower card of the existing probe card are bonded, the edge of the upper card and the edge of the lower card need to be cut through an external pin cutting device, so that the butt joint process of the probe card is complex to a certain extent, and the working efficiency is reduced.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a: the vertical probe card aims to solve the problems that when an existing probe card fixes a probe, a pre-limiting assembly is lacked, so that the butt joint effect of the probe and a probe card sleeve is poor, the utilization rate is reduced, when an upper card and a lower card of the existing probe card are bonded, the edge of the existing probe card needs to be cut through an external pin cutting device, the butt joint process of the probe card is complex to a certain extent, and the working efficiency is reduced.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a vertical probe card, includes the probe card main part, the bottom of probe card main part is provided with the drain pan, the four corners department at the top of drain pan all is provided with surveys the chip, the outside at drain pan top is provided with the draw-in groove, the top of drain pan is provided with the top cap, the both sides at drain pan top all evenly are provided with multiunit test terminal, the inboard intermediate position department of drain pan is provided with spacing hole, the inside in spacing hole be provided with spacing hole assorted fixed plate, the inboard in spacing hole evenly is provided with multiunit probe pin, the top of drain pan evenly is provided with the multiunit hole, the inside in hole all is provided with epoxy, the top of drain pan evenly is provided with the multiunit indent, the intermediate position department of drain pan.

Preferably, the inboard in spacing hole evenly is provided with multiunit arc draw-in groove, the outside of fixed plate evenly is provided with multiunit and ring groove assorted protruding piece, the fixed plate passes through mutually supporting and spacing hole fixed connection of arc draw-in groove and protruding piece.

Preferably, the number of the press grooves, the epoxy resin and the ring-shaped clamping grooves is sixteen, and the plurality of groups of press grooves are all located on the inner sides of the plurality of groups of epoxy resin.

Preferably, one end of each probe pin is fixedly connected with the bottom shell through epoxy resin.

Preferably, the bottom of clamping ring with the multiunit the top contact of indent, and the clamping ring adopts insulating rubber material.

Preferably, the outside of top cap bottom is provided with the snap ring with draw-in groove assorted, the top cap passes through mutually supporting and drain pan fixed connection of draw-in groove and snap ring.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the utility model discloses a spacing hole that sets up to fix the one end of probe pin with the drain pan through epoxy, extend the other end of probe pin through indent and ring groove, and place in the position of spacing hole through the fixed plate, thereby make the other end of probe pin install the position department of the butt joint of fixed plate and spacing hole, be convenient for fix a position probe pin, make the butt joint effect between probe and the probe card cutting ferrule better, and improved the rate of utilization;

2. the utility model discloses a set up corresponding draw-in groove and snap ring on drain pan and top cap, be convenient for fix drain pan and top cap to avoided original drain pan and top cap problem of misplacing easily when the laminating, thereby made the butt joint process of this probe card more simple, improved work efficiency.

Drawings

Fig. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic view of a partial structure of the present invention;

fig. 3 is a schematic structural view of the top cover of the present invention;

fig. 4 is an enlarged view of the present invention a.

In the figure: 1. a probe card body; 2. a bottom case; 3. a card slot; 4. a test terminal; 5. a top cover; 6. a snap ring; 7. pressing a ring; 8. a fixing plate; 9. a limiting hole; 10. pressing a groove; 11. a probe pin; 12. an epoxy resin; 13. detecting a chip; 14. and (4) holes.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, a vertical probe card includes a probe card main body 1, a bottom shell 2 is disposed at the bottom of the probe card main body 1, four corners of the top of the bottom shell 2 are all provided with a probing chip 13, a clamping groove 3 is disposed at the outer side of the top of the bottom shell 2, a top cover 5 is disposed above the bottom shell 2, two sides of the top of the bottom shell 2 are all uniformly provided with a plurality of groups of testing terminals 4, a limiting hole 9 is disposed at an intermediate position of the inner side of the bottom shell 2, a fixing plate 8 matched with the limiting hole 9 is disposed inside the limiting hole 9, a plurality of groups of probe pins 11 are uniformly disposed inside the limiting hole 9, a plurality of groups of holes 14 are uniformly disposed at the top of the bottom shell 2, epoxy resin 12 is disposed inside the holes 14, a plurality of groups of press.

The utility model discloses a set up corresponding draw-in groove 3 and snap ring 6 on drain pan 2 and top cap 5, be convenient for fix drain pan 2 and top cap 5 to avoided original drain pan 2 and top cap 5 easy problem of misplacing when the laminating, thereby made the butt joint process of this probe card more simple, improved work efficiency.

Please refer to fig. 1, 2 and 3, the inner side of the limiting hole 9 is uniformly provided with a plurality of sets of arc-shaped slots, the outer side of the fixing plate 8 is uniformly provided with a plurality of sets of protruding blocks matched with the annular slots, and the fixing plate 8 is fixedly connected with the limiting hole 9 through the mutual matching of the arc-shaped slots and the protruding blocks.

This kind of vertical probe card is through mutually supporting of arc draw-in groove and protruding piece, the fixed plate 8 and the 9 fixed connection in spacing hole of being convenient for, and be provided with in the inboard of protruding piece with probe pin 11 assorted breach, be convenient for extend probe pin 11 to the below of drain pan 2 through the breach to fixed effect to probe pin 11 is better.

Please refer to fig. 1, 2 and 3, the number of the pressure grooves 10, the epoxy resin 12 and the ring-shaped card slots is sixteen, the plurality of pressure grooves 10 are all located inside the plurality of epoxy resin 12, and one end of the probe pin 11 is fixedly connected with the bottom case 2 through the epoxy resin 12.

This kind of vertical probe card is convenient for fix probe pin 11 through indent 10, epoxy 12 and ring groove, and makes the probe pin 11 tiling that concentrates on spacing hole 9 position more neat through indent 10 to intercrossing has been avoided between probe pin 11, and makes probe pin 11 and drain pan 2 fixed connection through epoxy 12, thereby has reduced the degree of difficulty of installation.

Please refer to fig. 1, the bottom of the pressing ring 7 contacts with the top of the plurality of sets of pressing grooves 10, the pressing ring 7 is made of insulating rubber, the outer side of the bottom of the top cover 5 is provided with a snap ring 6 matched with the snap groove 3, and the top cover 5 is fixedly connected with the bottom case 2 through the mutual matching of the snap groove 3 and the snap ring 6.

This kind of vertical probe card has avoided making the extrusion force to the probe card inside centre downwards installation top cap 5 through the clamping ring 7 of the insulating rubber material that sets up to play the effect of buffering, and improved life, and through mutually supporting of draw-in groove 3 and snap ring 6, make top cap 5 and drain pan 2 fixed connection, thereby make its fixed simpler.

The working principle is as follows: when the probe card is used, the bottom shell 2 is placed on a corresponding desktop, then two groups of detection chips are placed at the top of the bottom shell 2, then one end of the probe pin 11 is fixed with the bottom shell 2 through the epoxy resin 12 and is butted with the detection chip 13, so that the electrical connection between the probe pin 11 and the detection chip 13 is realized, then the other end of the probe pin 11 extends out through the pressure groove 10 and the annular clamping groove 3 and is placed at the position of the limiting hole 9 through the fixing plate 8, so that the other end of the probe pin 11 is installed at the butted position of the fixing plate 8 and the limiting hole 9, and the probe pins 11 are independently separated, thereby avoiding the crossing, and further ensuring that the detection effect of the probe card is better, then the clamping ring 6 on the top cover 5 is contacted with the clamping groove 3, and the top cover 5 is pressed towards one end of the bottom shell 2 until the clamping ring 6 extends to the inside of the clamping groove, while the pressure ring is in contact with the pressure groove 10.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. A vertical probe card comprising a probe card body (1), characterized in that: the probe card comprises a probe card body (1), wherein a bottom shell (2) is arranged at the bottom of the probe card body (1), detection chips (13) are arranged at two ends of the top of the bottom shell (2), a clamping groove (3) is arranged at the outer side of the top of the bottom shell (2), a top cover (5) is arranged above the bottom shell (2), a plurality of groups of test terminals (4) are uniformly arranged at two sides of the top of the bottom shell (2), a limiting hole (9) is arranged at the middle position of the inner side of the bottom shell (2), a fixing plate (8) matched with the limiting hole (9) is arranged inside the limiting hole (9), a plurality of groups of probe pins (11) are uniformly arranged inside the limiting hole (9), a plurality of groups of holes (14) are uniformly arranged at the top of the bottom shell (2), epoxy resin (12) is arranged inside the holes (14), and a plurality, and a pressing ring (7) is arranged in the middle of the bottom shell (2).

2. The vertical probe card of claim 1, wherein: the inboard of spacing hole (9) evenly is provided with multiunit arc draw-in groove, the outside of fixed plate (8) evenly is provided with multiunit and ring groove assorted protruding piece, fixed plate (8) are through mutually supporting and spacing hole (9) fixed connection of arc draw-in groove and protruding piece.

3. The vertical probe card of claim 1, wherein: the number of the pressure grooves (10), the epoxy resin (12) and the annular clamping grooves is sixteen, and the pressure grooves (10) are located on the inner sides of the epoxy resin (12).

4. The vertical probe card of claim 1, wherein: one end of each probe pin (11) is fixedly connected with the bottom shell (2) through epoxy resin (12).

5. The vertical probe card of claim 1, wherein: the bottom of clamping ring (7) and multiunit the top contact of indent (10), and clamping ring (7) adopt insulating rubber material.

6. The vertical probe card of claim 2, wherein: the outer side of the bottom of the top cover (5) is provided with a clamping ring (6) matched with the clamping groove (3), and the top cover (5) is fixedly connected with the bottom shell (2) through the mutual matching of the clamping groove (3) and the clamping ring (6).