CN211426723U - Be applicable to lithium cell charge and discharge probe aging testing device - Google Patents
Be applicable to lithium cell charge and discharge probe aging testing device Download PDFInfo
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- CN211426723U CN211426723U CN201921216749.4U CN201921216749U CN211426723U CN 211426723 U CN211426723 U CN 211426723U CN 201921216749 U CN201921216749 U CN 201921216749U CN 211426723 U CN211426723 U CN 211426723U
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Abstract
A device suitable for aging test of a lithium battery charging and discharging probe comprises a frame; the charging and discharging test device is arranged in a test area of the rack and comprises an installation rack body, a detection unit and a contact unit; the testing power supply is arranged in the mounting area of the rack, and the power supply end of the testing power supply is electrically connected with the power transmission end of the charging and discharging testing device; the test control device comprises a charge and discharge processor and a signal acquisition unit, wherein the charge and discharge controller is arranged in an installation area of the rack, and a control end of the charge and discharge processor is electrically connected with a control port of the charge and discharge test device; the signal acquisition unit is arranged in a test area and/or a mounting area of the rack, and the signal output end of the signal acquisition unit is electrically connected with the signal input end of the charge-discharge processor respectively. The utility model has the advantages that: can carry out aging test to the probe, easy operation, it is convenient to change, can change the probe of different models moreover.
Description
Technical Field
The utility model relates to a be applicable to lithium cell charge and discharge probe aging testing device belongs to lithium cell test technical field.
Background
The lithium ion battery has the advantages of high energy, small volume, light weight, high specific energy, good safety, flexible design and the like, and is widely applied to products such as new energy automobiles, energy storage facilities and the like.
In the production process of the lithium ion battery, the probe is one of the very critical processes for charging and discharging the lithium ion battery, and the reliability and the safety of the probe in the charging and discharging process of the lithium ion battery are very important.
With the development of the lithium battery industry, manufacturers of lithium batteries have higher and higher requirements on the performance of the batteries so as to gain higher market share. The aging test of the probe is needed because the service life and the contact resistance of the probe are higher, but the aging test of the battery is generally performed by the aging device of the present day, and the aging test of the probe is lacked.
Disclosure of Invention
In order to solve the problem that lacks the probe and carry out aging testing, the utility model provides a test is simple, change the convenience, can carry out aging testing's a lithium cell charge and discharge probe aging testing device is applicable to the probe.
A be applicable to lithium cell charge and discharge probe aging testing device, a serial communication port, include:
the frame is provided with a test area and a mounting area;
the charging and discharging testing device is arranged in a testing area of the rack and comprises an installation rack body, a detection unit and a contact unit, wherein the installation rack body is provided with a quality accommodating space for accommodating the detection unit and the contact unit, and the installation rack body is installed in the testing area of the rack; the detection unit is arranged at the bottom of the quality containing space, the contact unit is suspended at the upper part of the quality containing space, and a probe for contact connection with the detection unit is detachably arranged on the end surface of the contact unit facing the detection unit, wherein the connecting end of the contact unit is electrically connected with the test power supply and the test control device;
the testing power supply is arranged in the mounting area of the rack, and the power supply end of the testing power supply is electrically connected with the power transmission end of the charging and discharging testing device and used for providing testing current for the charging and discharging testing device;
the test control device comprises a charge and discharge processor and a signal acquisition unit, wherein the charge and discharge controller is arranged in an installation area of the rack, and a control end of the charge and discharge processor is electrically connected with a control port of the charge and discharge test device; the signal acquisition unit is arranged in a test area and/or a mounting area of the rack, and the signal output end of the signal acquisition unit is electrically connected with the signal input end of the charge-discharge processor respectively.
The mounting frame comprises an upper top plate, a lifting plate, a lower bottom plate and guide posts, wherein the upper top plate and the lower bottom plate are respectively mounted at the upper end and the lower end of each guide post and are kept horizontal, and a gap between the upper top plate and the lower bottom plate is used as a mass containing space of the mounting frame; the lifting plate is arranged between the upper top plate and the lower bottom plate and is in sliding connection with the guide posts, so that the lifting plate can lift along the axial direction of the guide posts.
The detection unit comprises a test platform and a contact piece arranged on the test platform, the bottom of the test platform is arranged on the lower bottom plate and keeps the test platform horizontal, and the surface of the test platform is provided with the contact piece for contact connection with the probe; and the power transmission end of the contact element is electrically connected with the power supply end of the test power supply.
The contact unit comprises a probe plate, probes arranged on the probe plate and a driving cylinder for driving the probe plate to vertically lift, the probe plate is detachably mounted on the bottom surface of the lifting plate, mounting holes for mounting the probes are formed in the probe plate, and each mounting hole is provided with a connecting port for electrically connecting with a charging and discharging test device, a test power supply and a test control device; the probe is arranged on the end face of the probe board facing the detection unit, and the connection port of the probe is in contact connection with the connection port of the mounting hole, so that the probe is electrically connected with the power supply end of the test power supply, the control end of the charge-discharge processor and the test control device through the corresponding connection port on the probe board; the driving cylinder is vertically installed on the lower base plate, and the lifting end of the driving cylinder is connected with the lifting plate and used for driving the lifting plate to drive the probe plate to lift along the axial direction of the guide column so as to adjust the distance between the probe and the contact element on the surface of the test platform.
The signal acquisition unit comprises a pressure sensor, a temperature sensor and a voltmeter, the pressure sensor is arranged between the test platform and the lower bottom plate, and the signal output end of the pressure sensor is electrically connected with the signal input end of the charge-discharge processor and is used for acquiring the pressure applied on the test platform to reflect the elastic force information of the probe; the temperature sensor is arranged on the probe board or the test platform, and the signal output end of the temperature sensor is electrically connected with the signal input end of the charge-discharge processor and is used for acquiring temperature information in the volume-mass space; the voltmeter is arranged in the mounting area of the rack, and the connecting end of the voltmeter is electrically connected with the corresponding connecting end on the probe board and used for measuring the contact resistance of the probe.
The testing area of the rack is additionally provided with a temperature controller, and the control end of the temperature controller is electrically connected with the control end of the charge and discharge processor and used for adjusting the temperature of the testing area.
The test power supply is a constant current power supply.
Utilize a aging testing method suitable for lithium cell charge and discharge probe aging testing device goes on, including following step:
1) mounting the probe on a probe card:
selecting a matched probe board according to the type of the probe, and electrically connecting a test end, a power transmission end and a control end of the probe with a corresponding voltmeter, a test power supply and a charge and discharge processor which are electrically connected with corresponding connection ports on the probe board respectively;
2) loading the probe card into a lifting plate of a charging and discharging test device:
the probe board is arranged in the testing tool mechanism, and connecting ports connected with the testing end, the power transmission end and the control end of the probe are respectively and electrically connected with the corresponding voltmeter, the testing power supply and the charging and discharging processor, so that the probe is electrically connected with the voltmeter, the testing power supply and the charging and discharging processor;
3) the service life, contact resistance, elasticity and temperature rise of the probe at different temperatures are measured:
driving the cylinder to contract to enable the probe plate to descend, enabling the probe to be in contact connection with a contact element of the test platform, enabling constant current to be supplied to the probe and the test platform by adopting a constant current source, inspecting the probe according to an aging process on the charge and discharge processor, testing the service life, contact resistance, elasticity and temperature rise of the probe in a normal temperature state and a high temperature state respectively, and transmitting a test result to the charge and discharge processor;
4) discharging:
after the test is finished, the probe board rises under the driving of the driving cylinder, the probe is separated from the contact element of the test platform, and the probe is taken out to finish the test.
The utility model has the advantages that: can carry out aging test to the probe, easy operation, it is convenient to change, can change the probe of different models moreover.
Drawings
Fig. 1a is a structural diagram of the present invention.
Fig. 1b is a front view of the present invention.
Fig. 1c is a side view of the present invention.
Fig. 1d is a rear view of the present invention.
Fig. 2a is a structure diagram of the probe card of the present invention.
Figure 2b is a side view of a probe card of the present invention.
Figure 2c is a front view of the probe card of the present invention.
Figure 2d is a front view of the probe card of the present invention.
Fig. 3a is the structure diagram of the charging and discharging testing device of the present invention.
Fig. 3b is a front view of the charging and discharging testing device of the present invention.
Fig. 3c is a side view of the charging and discharging testing apparatus of the present invention.
Fig. 3d is a top view of the charging and discharging testing device of the present invention.
Detailed Description
The present invention will be further described with reference to the accompanying drawings.
With reference to the accompanying drawings:
embodiment 1a be applicable to lithium cell charge and discharge probe aging testing device, include:
the device comprises a rack 1, a test area and a mounting area, wherein the rack is provided with the test area and the mounting area;
the charging and discharging testing device 2 is arranged in a testing area of the rack 1, and the charging and discharging testing device 2 comprises an installation rack body 21, a detection unit 22 and a contact unit 23, wherein a quality accommodating space for accommodating the detection unit and the contact unit is arranged on the installation rack body, and the installation rack body is installed in the testing area of the rack; the detection unit is arranged at the bottom of the quality containing space, the contact unit is suspended at the upper part of the quality containing space, and a probe for contact connection with the detection unit is detachably arranged on the end surface of the contact unit facing the detection unit, wherein the connecting end of the contact unit is electrically connected with the test power supply and the test control device;
the testing power supply 3 is arranged in the mounting area of the rack 1, and the power supply end of the testing power supply is electrically connected with the power transmission end of the charging and discharging testing device and used for providing testing current for the charging and discharging testing device;
the test control device comprises a charge and discharge processor and a signal acquisition unit, wherein the charge and discharge controller is arranged in an installation area of the rack, and a control end of the charge and discharge processor is electrically connected with a control port of the charge and discharge test device; the signal acquisition unit is arranged in a test area and/or a mounting area of the rack, and the signal output end of the signal acquisition unit is electrically connected with the signal input end of the charge-discharge processor respectively.
The mounting frame 21 comprises an upper top plate 211, a lifting plate 212, a lower bottom plate 213 and guide posts 214, the upper top plate 211 and the lower bottom plate 213 are respectively mounted at the upper end and the lower end of the guide posts 214, the upper top plate 211 and the lower bottom plate 213 are kept horizontal, and a gap between the upper top plate 211 and the lower bottom plate 213 is used as a mass accommodating space of the mounting frame 21; the lifting plate 212 is horizontally disposed between the upper top plate 211 and the lower base plate 213, and is slidably coupled to the guide posts 212 such that the lifting plate can be axially lifted along the guide posts.
The detection unit 22 comprises a test platform 221 and a contact piece 222 arranged on the test platform, the bottom of the test platform 221 is slidably mounted on the slide rail 4 of the lower base plate 213 and keeps the test platform horizontal, and the surface of the test platform is provided with a contact piece for contact connection with a probe; the power delivery terminal of the contact 222 is electrically connected to the power supply terminal of the test power supply.
The contact unit 23 comprises a probe board 231, probes 232 arranged on the probe board, and a driving cylinder 233 for driving the probe board to vertically lift, wherein the probe board 231 is detachably mounted on the bottom surface of the lifting board 212, mounting holes for mounting the probes are formed in the probe board 231, and each mounting hole is provided with a connection port for electrically connecting with a charging and discharging test device, a test power supply and a test control device; the probe is arranged on the end face of the probe board facing the detection unit, and the connection port of the probe is in contact connection with the connection port of the mounting hole, so that the probe is electrically connected with the power supply end of the test power supply, the control end of the charge-discharge processor and the test control device through the corresponding connection port on the probe board; the driving cylinder is vertically installed on the lower base plate, and the lifting end of the driving cylinder is connected with the lifting plate and used for driving the lifting plate to drive the probe plate to lift along the axial direction of the guide column so as to adjust the distance between the probe and the contact element on the surface of the test platform.
The signal acquisition unit comprises a pressure sensor, a temperature sensor and a voltmeter, the pressure sensor is arranged between the test platform 221 and the lower bottom plate 213, and a signal output end of the pressure sensor is electrically connected with a signal input end of the charge-discharge processor and is used for acquiring the pressure applied on the test platform to reflect the elastic force information of the probe; the temperature sensor is arranged on the probe board or the test platform, and the signal output end of the temperature sensor is electrically connected with the signal input end of the charge-discharge processor and is used for acquiring temperature information in the volume-mass space; the voltmeter is arranged in the mounting area of the rack, and the connecting end of the voltmeter is electrically connected with the corresponding connecting end on the probe board and used for measuring the contact resistance of the probe.
The testing area of the rack 1 is additionally provided with a temperature controller, and the control end of the temperature controller is electrically connected with the control end of the charge and discharge processor and used for adjusting the temperature of the testing area.
The test power supply is a constant current power supply and can provide constant current of 6-60A.
1) mounting the probe on a probe card:
selecting a matched probe board according to the type of the probe, and electrically connecting a test end, a power transmission end and a control end of the probe with a corresponding voltmeter, a test power supply and a charge and discharge processor which are electrically connected with corresponding connection ports on the probe board respectively;
2) loading the probe card into a lifting plate of a charging and discharging test device:
the probe board is arranged in the testing tool mechanism, and connecting ports connected with the testing end, the power transmission end and the control end of the probe are respectively and electrically connected with the corresponding voltmeter, the testing power supply and the charging and discharging processor, so that the probe is electrically connected with the voltmeter, the testing power supply and the charging and discharging processor;
3) the service life, contact resistance, elasticity and temperature rise of the probe at different temperatures are measured:
driving the cylinder to contract, so that the probe board descends, the probe is in contact connection with a contact element of the test platform, the probe is tested according to an aging process on the charge and discharge processor, the service life, the contact resistance, the elasticity and the temperature rise of the probe in a normal temperature state and a high temperature state are respectively tested, and a test result is transmitted to the charge and discharge processor; wherein, elasticity information is collected through the pressure sensor, temperature information is collected through the temperature sensor, and the voltmeter tests the contact resistance of the probe. The service life of the probe is tested by frequently ascending and descending the probe mounting plate. Testing the high and low temperature states by changing the temperature of the whole machine;
4) discharging:
after the test is finished, the probe board rises under the driving of the driving cylinder, the probe is separated from the contact element of the test platform, and the probe is taken out to finish the test.
The embodiments described in this specification are merely illustrative of implementations of the inventive concepts, and the scope of the invention should not be considered limited to the specific forms set forth in the embodiments, but rather the scope of the invention includes equivalent technical means that can be conceived by those skilled in the art based on the inventive concepts.
Claims (7)
1. The utility model provides a be applicable to lithium cell charge and discharge probe aging testing device which characterized in that includes:
the frame is provided with a test area and a mounting area;
the charging and discharging testing device is arranged in a testing area of the rack and comprises an installation rack body, a detection unit and a contact unit, wherein the installation rack body is provided with a quality accommodating space for accommodating the detection unit and the contact unit, and the installation rack body is installed in the testing area of the rack; the detection unit is arranged at the bottom of the quality containing space, the contact unit is suspended at the upper part of the quality containing space, and a probe for contact connection with the detection unit is detachably arranged on the end surface of the contact unit facing the detection unit, wherein the connecting end of the contact unit is electrically connected with the test power supply and the test control device;
the testing power supply is arranged in the mounting area of the rack, and the power supply end of the testing power supply is electrically connected with the power transmission end of the charging and discharging testing device and used for providing testing current for the charging and discharging testing device;
the test control device comprises a charge and discharge processor and a signal acquisition unit, wherein the charge and discharge controller is arranged in an installation area of the rack, and a control end of the charge and discharge processor is electrically connected with a control port of the charge and discharge test device; the signal acquisition unit is arranged in a test area and/or a mounting area of the rack, and the signal output end of the signal acquisition unit is electrically connected with the signal input end of the charge-discharge processor respectively.
2. The aging test device for the charge and discharge probe of the lithium battery as claimed in claim 1, wherein: the mounting frame body comprises an upper top plate, a lifting plate, a lower bottom plate and guide posts, wherein the upper top plate and the lower bottom plate are respectively mounted at the upper end and the lower end of each guide post and keep the upper top plate and the lower bottom plate horizontal, and a gap between the upper top plate and the lower bottom plate is used as a mass containing space of the mounting frame; the lifting plate is arranged between the upper top plate and the lower bottom plate and is in sliding connection with the guide posts, so that the lifting plate can lift along the axial direction of the guide posts.
3. The aging test device for the charge and discharge probe of the lithium battery as claimed in claim 2, wherein: the detection unit comprises a test platform and a contact piece arranged on the test platform, the bottom of the test platform is arranged on the lower bottom plate and keeps the test platform horizontal, and the surface of the test platform is provided with the contact piece for contact connection with the probe; and the power transmission end of the contact element is electrically connected with the power supply end of the test power supply.
4. The aging test device for the charge and discharge probe of the lithium battery as claimed in claim 3, wherein: the contact unit comprises a probe plate, probes arranged on the probe plate and a driving cylinder for driving the probe plate to vertically lift, the probe plate is detachably mounted on the bottom surface of the lifting plate, mounting holes for mounting the probes are formed in the probe plate, and each mounting hole is provided with a connecting port for electrically connecting with a charging and discharging test device, a test power supply and a test control device; the probe is arranged on the end face of the probe board facing the detection unit, and the connection port of the probe is in contact connection with the connection port of the mounting hole, so that the probe is electrically connected with the power supply end of the test power supply, the control end of the charge-discharge processor and the test control device through the corresponding connection port on the probe board; the driving cylinder is vertically installed on the lower base plate, and the lifting end of the driving cylinder is connected with the lifting plate and used for driving the lifting plate to drive the probe plate to lift along the axial direction of the guide column so as to adjust the distance between the probe and the contact element on the surface of the test platform.
5. The aging test device for the charge and discharge probe of the lithium battery as claimed in claim 1, wherein: the signal acquisition unit comprises a pressure sensor, a temperature sensor and a voltmeter, the pressure sensor is arranged between the test platform and the lower bottom plate, and the signal output end of the pressure sensor is electrically connected with the signal input end of the charge-discharge processor and is used for acquiring the pressure applied on the test platform to reflect the elastic force information of the probe; the temperature sensor is arranged on the probe board or the test platform, and the signal output end of the temperature sensor is electrically connected with the signal input end of the charge-discharge processor and is used for acquiring temperature information in the volume-mass space; the voltmeter is arranged in the mounting area of the rack, and the connecting end of the voltmeter is electrically connected with the corresponding connecting end on the probe board and used for measuring the contact resistance of the probe.
6. The aging test device for the charge and discharge probe of the lithium battery as claimed in claim 1, wherein: the testing area of the rack is additionally provided with a temperature controller, and the control end of the temperature controller is electrically connected with the control end of the charge and discharge processor and used for adjusting the temperature of the testing area.
7. The aging test device for the charge and discharge probe of the lithium battery as claimed in claim 1, wherein: the test power supply is a constant current power supply.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921216749.4U CN211426723U (en) | 2019-07-30 | 2019-07-30 | Be applicable to lithium cell charge and discharge probe aging testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921216749.4U CN211426723U (en) | 2019-07-30 | 2019-07-30 | Be applicable to lithium cell charge and discharge probe aging testing device |
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| CN211426723U true CN211426723U (en) | 2020-09-04 |
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| CN201921216749.4U Active CN211426723U (en) | 2019-07-30 | 2019-07-30 | Be applicable to lithium cell charge and discharge probe aging testing device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110488200A (en) * | 2019-07-30 | 2019-11-22 | 浙江杭可科技股份有限公司 | One kind being suitable for charging and discharging lithium battery probe ageing tester and aging method |
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2019
- 2019-07-30 CN CN201921216749.4U patent/CN211426723U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110488200A (en) * | 2019-07-30 | 2019-11-22 | 浙江杭可科技股份有限公司 | One kind being suitable for charging and discharging lithium battery probe ageing tester and aging method |
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