CN211402575U - Testing device for radio frequency feed point output type microwave radio frequency assembly without connector - Google Patents

Testing device for radio frequency feed point output type microwave radio frequency assembly without connector Download PDF

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CN211402575U
CN211402575U CN201922114321.5U CN201922114321U CN211402575U CN 211402575 U CN211402575 U CN 211402575U CN 201922114321 U CN201922114321 U CN 201922114321U CN 211402575 U CN211402575 U CN 211402575U
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test
radio frequency
assembly
feed point
testing
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郭立涛
李秀芳
王振亚
王立发
赵瑞华
王乔楠
袁彪
刘金
庞龙
连智富
戎子龙
刘爱平
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CETC 13 Research Institute
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Abstract

本实用新型提供了一种无连接器射频馈点输出型微波射频组件的测试装置,属于射频组件测试技术领域,包括测试台、测试组件以及弹性定位组件,其中,测试台用于固定安装微波射频组件,测试台上横向滑动连接有第一托板,第一托板上纵向滑动连接有第二托板,第二托板上固定连接有滑座;测试组件与滑座沿上下方向滑动连接;测试组件用于与测试电缆电连接,且用于测试微波射频组件上的射频馈点;弹性定位组件设于测试组件与滑座之间,用于向下定位测试组件的测试位置及带动测试组件向上弹起.本实用新型提供的一种无连接器射频馈点输出型微波射频组件的测试装置,测试效率高,测试过程安全可靠,而且能够通用多种无连接器射频馈点输出型微波射频组件。

Figure 201922114321

The utility model provides a test device for a connectorless radio frequency feed point output type microwave radio frequency component, which belongs to the technical field of radio frequency component testing and includes a test table, a test component and an elastic positioning component, wherein the test table is used for fixed installation of microwave radio frequency components component, a first support plate is slidably connected on the test stand horizontally, a second support plate is longitudinally slidably connected on the first support plate, and a sliding seat is fixedly connected on the second support plate; the test assembly and the sliding seat are slidably connected in the up and down direction; The test component is used for electrical connection with the test cable, and is used to test the RF feed point on the microwave radio frequency component; the elastic positioning component is arranged between the test component and the sliding seat, and is used to locate the test position of the test component downward and drive the test component Bounce up. A test device for a connectorless radio frequency feed point output type microwave radio frequency assembly provided by the utility model has high test efficiency, a safe and reliable test process, and can be used for a variety of connectorless radio frequency feed point output type microwave radio frequency components. components.

Figure 201922114321

Description

一种无连接器射频馈点输出型微波射频组件的测试装置A test device for a connectorless radio frequency feed point output microwave radio frequency component

技术领域technical field

本实用新型属于射频组件测试技术领域,更具体地说,是涉及一种无连接器射频馈点输出型微波射频组件的测试装置。The utility model belongs to the technical field of radio frequency component testing, and more particularly relates to a testing device for a connectorless radio frequency feed point output type microwave radio frequency component.

背景技术Background technique

当前,为进一步降低微波射频组件的成本,电子装备和器件都在向高集成化、易于装配、简化元器件等方向发展。目前芯片级封装技术手段很多,而且技术较为成熟,相对于尺寸稍大的模块级和组件级产品,特别是射频/微波领域产品,大多采用局部气密封装功能模块的方式进行封装设计,该类设计为无连接器形式,但是,当下无连接器的微波射频组件测试手段匮乏,针对不同的产品需要定制相应的工装,测试效率低、成本高,无法适应大批量、低成本的生产测试应用。At present, in order to further reduce the cost of microwave radio frequency components, electronic equipment and devices are developing in the direction of high integration, easy assembly, and simplified components. At present, there are many chip-level packaging technologies, and the technology is relatively mature. Compared with module-level and component-level products with slightly larger sizes, especially products in the RF/microwave field, most of them are packaged by partially hermetically sealing functional modules for packaging design. It is designed in the form of no connector. However, there is a lack of testing methods for microwave radio frequency components without connectors. Corresponding tooling needs to be customized for different products. The test efficiency is low and the cost is high, which cannot be adapted to high-volume, low-cost production test applications.

实用新型内容Utility model content

本实用新型的目的在于提供一种无连接器射频馈点输出型微波射频组件的测试装置,旨在解决现有技术中无连接器射频馈点输出型微波射频组件的测试工作效率低、可靠性差的问题。The purpose of the utility model is to provide a test device for a connectorless radio frequency feed point output type microwave radio frequency component, which aims to solve the low test work efficiency and poor reliability of the connectorless radio frequency feed point output type microwave radio frequency component in the prior art The problem.

为实现上述目的,本实用新型采用的技术方案是:提供一种无连接器射频馈点输出型微波射频组件的测试装置,包括:In order to achieve the above-mentioned purpose, the technical scheme adopted by the present utility model is to provide a test device for a connectorless radio frequency feed point output type microwave radio frequency component, including:

测试台,用于固定安装微波射频组件;测试台上横向滑动连接有第一托板,第一托板上纵向滑动连接有第二托板;第二托板上固定连接有滑座;a test bench, used for fixed installation of microwave radio frequency components; a first support plate is slidably connected to the test bench horizontally, a second support plate is longitudinally slidably connected to the first support plate, and a sliding seat is fixedly connected to the second support plate;

测试组件,与滑座沿上下方向滑动连接;测试组件用于与测试电缆电连接,且用于测试微波射频组件上的射频馈点;The test assembly is slidably connected with the sliding seat in the up and down direction; the test assembly is used for electrical connection with the test cable, and is used for testing the radio frequency feed point on the microwave radio frequency assembly;

弹性定位组件,设于测试组件与滑座之间,用于向下定位测试组件的测试位置及带动测试组件向上弹起。The elastic positioning component is arranged between the testing component and the sliding seat, and is used for positioning the testing position of the testing component downwards and driving the testing component to bounce upwards.

作为本申请另一实施例,弹性定位组件包括:As another embodiment of the present application, the elastic positioning assembly includes:

弹性元件,沿上下方向设于测试组件与滑座之间,弹性元件用于对测试组件施加向下的弹性力;The elastic element is arranged between the test assembly and the sliding seat along the up-down direction, and the elastic element is used to exert downward elastic force on the test assembly;

压杆,铰接于第二托板上,压杆的一端用于与测试组件的下端面抵接,另一端用于施加外力。The pressing rod is hinged on the second supporting plate, one end of the pressing rod is used for abutting with the lower end surface of the test assembly, and the other end is used for applying external force.

作为本申请另一实施例,测试组件上设有沿上下方向延伸的容置槽,滑座上设有挡板,挡板用于插入容置槽内,弹性元件的一端与容置槽的底壁抵接,另一端与挡板的下表面抵接。As another embodiment of the present application, the test assembly is provided with an accommodating groove extending in the up-down direction, the sliding seat is provided with a baffle plate, the baffle plate is used to be inserted into the accommodating groove, and one end of the elastic element is connected to the bottom of the accommodating groove. The wall abuts, and the other end abuts the lower surface of the baffle.

作为本申请另一实施例,测试组件包括:As another embodiment of the present application, the test component includes:

连接架,与滑座沿上下方向滑动连接;容置槽设置在连接架上;压杆与连接架的下端面抵接;The connecting frame is slidably connected with the sliding seat in the up and down direction; the accommodating groove is arranged on the connecting frame; the pressing rod is in contact with the lower end surface of the connecting frame;

测试架,与连接架纵向滑动连接;The test frame is longitudinally slidingly connected with the connecting frame;

测试探针,与测试架上下滑动连接。The test probe is connected with the test frame by sliding up and down.

作为本申请另一实施例,滑座上设有沿上下方向延伸的滑槽,连接架与滑槽滑动连接。As another embodiment of the present application, the sliding seat is provided with a sliding groove extending in the up-down direction, and the connecting frame is slidably connected with the sliding groove.

作为本申请另一实施例,滑槽两侧分别固接有第一导轨;连接架两侧分别固接有第二导轨;第一导轨与第二导轨滑动接触。As another embodiment of the present application, first guide rails are respectively fixed on both sides of the chute; second guide rails are fixed on both sides of the connecting frame respectively; the first guide rails are in sliding contact with the second guide rails.

作为本申请另一实施例,第一导轨、第二导轨的接触面上分别设有第一滑道、第二滑道,且第一滑道、第二滑道围成的空间内滑动连接有第一滑块。As another embodiment of the present application, the contact surfaces of the first guide rail and the second guide rail are respectively provided with a first slideway and a second slideway, and the space enclosed by the first slideway and the second slideway is slidably connected with first slider.

作为本申请另一实施例,滑座的下部设有避让槽,压杆与连接架的抵接端转动连接有套筒,套筒穿过避让槽,且与连接架的下端面抵靠。As another embodiment of the present application, the lower part of the sliding seat is provided with an escape groove, a sleeve is rotatably connected to the abutting end of the pressure rod and the connecting frame, and the sleeve passes through the escape groove and abuts against the lower end surface of the connecting frame.

作为本申请另一实施例,第一托板具有多个横向定位位置,且相邻横向定位位置之间的间距与相邻射频馈点之间的横向间距相等;第二托板具有多个纵向定位位置,且相邻纵向定位位置之间的间距与相邻射频馈点之间的纵向间距相等。As another embodiment of the present application, the first pallet has multiple lateral positioning positions, and the spacing between adjacent lateral positioning positions is equal to the lateral spacing between adjacent RF feed points; the second pallet has multiple longitudinal positions Positioning positions, and the spacing between adjacent longitudinal positioning positions is equal to the longitudinal spacing between adjacent RF feed points.

作为本申请另一实施例,测试台上横向间隔设有多个横向定位孔,第一托板上穿设有用于与横向定位孔插接的横向定位销;第一托板上纵向间隔设有多个纵向定位孔,第二托板上穿设有用于与纵向定位孔插接的纵向定位销。As another embodiment of the present application, a plurality of lateral positioning holes are provided at horizontal intervals on the test table, and lateral positioning pins for inserting with the lateral positioning holes are provided on the first support plate; A plurality of longitudinal positioning holes are provided, and longitudinal positioning pins for inserting with the longitudinal positioning holes are perforated on the second support plate.

本实用新型提供的一种无连接器射频馈点输出型微波射频组件的测试装置的有益效果在于:与现有技术相比,本实用新型一种无连接器射频馈点输出型微波射频组件的测试装置,通过测试台能够固定多种类型(尺寸、形状)的微波射频组件,第一托板、第二托板能够在测试台面上横向、纵向进行滑动,第二托板上固接有滑座,从而使连接在滑座上的测试组件依次对准微波射频组件的各个射频馈点进行测试,测试组件的位置调整方便,测试效率高,而且能够适用不同尺寸、形状类型的微波射频组件,通用性高,从而能够降低微波射频组件的测试成本,适合大批量的生产测试;The beneficial effect of the test device for a connectorless radio frequency feed point output type microwave radio frequency component provided by the utility model is: compared with the prior art, the connectorless radio frequency feed point output type microwave radio frequency component of the present invention has the beneficial effects. The test device can fix various types (sizes, shapes) of microwave radio frequency components through the test table, the first support plate and the second support plate can slide horizontally and vertically on the test table, and the second support plate is fixed with sliding Therefore, the test components connected to the sliding seat can be tested at each RF feed point of the microwave radio frequency components in turn. The position of the test components is convenient to adjust, the test efficiency is high, and it can be applied to microwave radio frequency components of different sizes and shapes. High versatility, which can reduce the testing cost of microwave RF components, suitable for mass production testing;

测试时弹性定位组件能够对测试组件施加弹性力,保证测试组件与各个射频馈点位置进行弹性抵接,确保测试组件与射频馈点位置对齐状态稳定可靠;每测试完一个射频馈点,测试组件转移至下一个射频馈点的过程,通过弹性定位组件带动测试组件向上方弹起,确保测试组件转移位置的过程中能够避让微波射频组件上高度较高的封装元件,避免损伤微波射频组件,确保测试过程安全可靠。During the test, the elastic positioning component can apply elastic force to the test component to ensure elastic contact between the test component and each RF feed point, and ensure that the test component and the RF feed point are aligned stably and reliably; after each test of a RF feed point, the test component In the process of transferring to the next RF feed point, the elastic positioning component drives the test component to bounce upwards to ensure that the higher package components on the microwave RF component can be avoided during the transfer position of the test component, so as to avoid damage to the microwave RF component and ensure The testing process is safe and reliable.

附图说明Description of drawings

为了更清楚地说明本实用新型实施例中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本实用新型的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only for the present utility model. For some new embodiments, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.

图1为本实用新型实施例提供的一种无连接器射频馈点输出型微波射频组件的测试装置的立体结构示意图;1 is a schematic three-dimensional structural diagram of a testing device for a connectorless RF feed point output microwave RF component provided by an embodiment of the present invention;

图2为本实用新型实施例提供的一种无连接器射频馈点输出型微波射频组件的测试装置的正视结构示意图;2 is a schematic front view of the structure of a test device for a connectorless radio frequency feed point output microwave radio frequency component provided by an embodiment of the present invention;

图3为图2中A处的局部结构放大示意图;Fig. 3 is the partial structure enlarged schematic diagram at A place in Fig. 2;

图4为图1中B处的局部结构放大示意图;Fig. 4 is the partial structure enlarged schematic diagram at B in Fig. 1;

图5为本实用新型实施例所采用的连接架与滑座的连接结构示意图;5 is a schematic diagram of the connection structure of the connecting frame and the sliding seat adopted in the embodiment of the present invention;

图6为本实用新型实施例所采用的测试台与第一托板的连接结构示意图;FIG. 6 is a schematic diagram of the connection structure of the test table and the first pallet adopted in the embodiment of the present utility model;

图7为本实用新型实施例采用的第一托板与第二托板的连接结构示意图。FIG. 7 is a schematic diagram of the connection structure of the first support plate and the second support plate adopted in the embodiment of the present invention.

图中:1、测试台;10、横向定位孔;11、第四导轨;110、第四滑道;12、第二滑块;2、第一托板;20、纵向定位孔;21、第三导轨;210、第三滑道;22、第六导轨;220、第六滑道;23、横向定位销;3、第二托板;31、第五导轨;310、第五滑道;32、纵向定位销;33、第三滑块;4、滑座;40、滑槽;41、挡板;42、第一导轨;43、避让槽;420、第一滑道;5、测试组件;51、测试架;52、测试探针;6、连接架;60、容置槽;61、滑板;62、托架;63、第二导轨;630、第二滑道;64、第一滑块;7、压杆;71、套筒;8、弹性定位组件;80、弹性元件;9、测试电缆;100、微波射频组件;101、射频馈点。In the figure: 1. Test stand; 10. Horizontal positioning hole; 11. Fourth guide rail; 110, Fourth slideway; 12. Second sliding block; 2. First pallet; 20. Vertical positioning hole; 21. Three rails; 210, the third slide; 22, the sixth rail; 220, the sixth slide; 23, the lateral positioning pin; 3, the second pallet; 31, the fifth rail; 310, the fifth slide; 32 , longitudinal positioning pin; 33, the third slider; 4, the sliding seat; 40, the chute; 41, the baffle; 42, the first guide rail; 43, the avoidance slot; 420, the first slide; 51. Test frame; 52. Test probe; 6. Connecting frame; 60. Receiving slot; 61. Slide plate; 62. Bracket; 63. Second rail; 630, Second slide; 7, pressure rod; 71, sleeve; 8, elastic positioning assembly; 80, elastic element; 9, test cable; 100, microwave radio frequency assembly; 101, radio frequency feed point.

具体实施方式Detailed ways

为了使本实用新型所要解决的技术问题、技术方案及有益效果更加清楚明白,以下结合附图及实施例,对本实用新型进行进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本实用新型,并不用于限定本实用新型。In order to make the technical problems, technical solutions and beneficial effects to be solved by the present utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not intended to limit the present invention.

请一并参阅图1至图4,现对本实用新型提供的一种无连接器射频馈点输出型微波射频组件的测试装置进行说明。所述一种无连接器射频馈点输出型微波射频组件的测试装置,包括测试台1、测试组件5以及弹性定位组件8,其中,测试台1用于固定安装微波射频组件100,测试台1上横向滑动连接有第一托板2,第一托板2上纵向滑动连接有第二托板3,第二托板3上固定连接有滑座4;测试组件5与滑座4沿上下方向滑动连接;测试组件5用于与测试电缆9电连接,且用于测试微波射频组件100上的射频馈点101;弹性定位组件8设于测试组件5与滑座4之间,用于向下定位测试组件5的测试位置及带动测试组件5向上弹起。Please refer to FIG. 1 to FIG. 4 together, and now the test device of a connectorless RF feed point output type microwave radio frequency component provided by the present invention will be described. The test device for a connectorless radio frequency feed point output type microwave radio frequency assembly includes a test table 1, a test assembly 5 and an elastic positioning assembly 8, wherein the test table 1 is used for fixedly installing the microwave radio frequency assembly 100, and the test table 1 A first supporting plate 2 is slidably connected to the upper horizontally, a second supporting plate 3 is longitudinally slidably connected to the first supporting plate 2, and a sliding seat 4 is fixedly connected to the second supporting plate 3; Sliding connection; the test assembly 5 is used for electrical connection with the test cable 9, and is used to test the radio frequency feed point 101 on the microwave radio frequency assembly 100; the elastic positioning assembly 8 is arranged between the test assembly 5 and the sliding seat 4, for downward Position the test position of the test assembly 5 and drive the test assembly 5 to bounce up.

本实用新型提供的一种无连接器射频馈点输出型微波射频组件的测试装置的工作方式:将微波射频组件100固定安装在测试台1台面上,滑动第一托板2、第二托板3,使测试组件5对准微波测试组件5上的第一个射频馈点101,应当理解,微波射频组件100上的各个射频馈点101通常是几横几纵呈矩阵形式排列,为使测试过程有序,避免遗漏,通常选取位于最边缘的射频馈点101(第一横排与第一纵列的交点)为第一个射频馈点101作为整个测试过程的开始,然后依横向或纵向有序对各个射频馈点101进行测试,当然,也可以采用其他顺序测试,以能够对微波射频组件100上的所有射频馈点101进行测试,无遗漏为准。The working mode of a test device for a connectorless radio frequency feed point output type microwave radio frequency assembly provided by the utility model is as follows: the microwave radio frequency assembly 100 is fixedly installed on the table top of the test table 1, and the first support plate 2 and the second support plate are slid. 3. Align the test assembly 5 with the first radio frequency feed point 101 on the microwave test assembly 5. It should be understood that each radio frequency feed point 101 on the microwave radio frequency assembly 100 is usually arranged horizontally and vertically in a matrix form. The process is orderly to avoid omissions. Usually, the RF feed point 101 at the edge (the intersection of the first horizontal row and the first vertical column) is selected as the first RF feed point 101 as the beginning of the entire testing process, and then the horizontal or vertical Each radio frequency feed point 101 is tested in an orderly manner. Of course, other sequential tests may also be used, as long as all radio frequency feed points 101 on the microwave radio frequency assembly 100 can be tested, whichever is omitted.

本实用新型提供的一种无连接器射频馈点输出型微波射频组件的测试装置,与现有技术相比,通过测试台1能够固定多种类型(尺寸、形状)的微波射频组件100,第一托板2、第二托板3能够在测试台1面上横向、纵向进行滑动,第二托板3上固接有滑座4,从而使连接在滑座4上的测试组件5依次对准微波射频组件100的各个射频馈点101进行测试,测试组件5的位置调整方便,测试效率高,而且能够适用不同尺寸、形状类型的微波射频组件100,通用性高,从而能够降低微波射频组件100的测试成本,适合大批量的生产测试;Compared with the prior art, a test device for a connectorless radio frequency feed point output type microwave radio frequency assembly provided by the utility model can fix various types (sizes and shapes) of microwave radio frequency assemblies 100 through the test table 1 . The first pallet 2 and the second pallet 3 can slide laterally and longitudinally on the surface of the test table 1, and the second pallet 3 is fixed with the sliding seat 4, so that the test components 5 connected to the sliding seat 4 can be aligned with each other in sequence. Each radio frequency feed point 101 of the quasi-microwave radio frequency component 100 is tested, the position of the test component 5 is convenient to adjust, the test efficiency is high, and it can be applied to microwave radio frequency components 100 of different sizes and shapes, with high versatility, thereby reducing microwave radio frequency components. 100 test cost, suitable for mass production test;

测试时弹性定位组件8能够对测试组件5施加弹性力,保证测试组件5与各个射频馈点101位置进行弹性抵接,确保测试组件5与射频馈点101位置对齐状态稳定可靠;每测试完一个射频馈点101,测试组件5转移至下一个射频馈点101的过程,通过弹性定位组件8带动测试组件5向上方弹起,通过按压压杆7的施力端,使压杆7与连接架6的抵接端向远离测试台1台面的方向摆动,从而使连接架6克服弹性元件80的弹性力向远离微波射频组件100的方向滑动,确保测试组件5转移位置的过程中能够避让微波射频组件100上高度较高的封装元件,避免损伤微波射频组件100,确保测试过程安全可靠。During the test, the elastic positioning assembly 8 can apply elastic force to the test assembly 5 to ensure elastic contact between the test assembly 5 and each RF feed point 101, and to ensure that the position of the test assembly 5 and the RF feed point 101 is aligned stably and reliably; The RF feed point 101, the process of transferring the test assembly 5 to the next RF feed point 101, the elastic positioning assembly 8 drives the test assembly 5 to bounce upward, and by pressing the force end of the pressure rod 7, the pressure rod 7 and the connecting frame 6 are connected. The abutting end swings in a direction away from the table top of the test bench 1, so that the connecting frame 6 overcomes the elastic force of the elastic element 80 and slides in a direction away from the microwave radio frequency assembly 100, so as to ensure that the test assembly 5 can avoid the microwave radio frequency assembly 100 during the process of shifting the position. A packaged component with a higher height is used to avoid damage to the microwave radio frequency component 100 and ensure the safety and reliability of the testing process.

作为本实用新型提供的一种无连接器射频馈点输出型微波射频组件的测试装置的一种具体实施方式,请一并参阅图1至图3,弹性定位组件8包括:沿上下方向设于测试组件5与滑座4之间的弹性元件80,以及铰接于第二托板3上的压杆7,其中,弹性元件80用于对测试组件5施加向下的弹性力;压杆7的一端用于与测试组件5的下端面抵接,另一端用于施加外力。As a specific implementation of a connectorless RF feed point output type microwave radio frequency component testing device provided by the present invention, please refer to FIG. 1 to FIG. 3 together. The elastic positioning component 8 includes: The elastic element 80 between the test assembly 5 and the sliding seat 4, and the pressure rod 7 hinged on the second support plate 3, wherein the elastic element 80 is used to exert downward elastic force on the test assembly 5; One end is used for abutting with the lower end surface of the test assembly 5, and the other end is used for applying external force.

第一个射频馈点101测试完成后,测试组件5转移至下一个射频馈点101的过程,需要按压压杆7的施力端,压杆7以铰接轴为中心进行摆动,从而使测试组件5克服弹性元件80的弹性力向上方滑动(远离微波射频组件100的方向),滑动距离以测试组件5的整体能够避让微波射频组件100上高度较高的封装元件为准,然后进行测试组件5的位置转移,测试组件5到达并对齐下一个射频馈点101后,松开压杆7的施力端,使测试组件5恢复与射频馈点101的抵靠,然后进行对该射频馈点101的测试,重复上述动作,直至所有射频馈点101测试完毕,结构简单稳定,操作方便可靠,确保测试工作安全高效。After the test of the first RF feed point 101 is completed, the process of transferring the test assembly 5 to the next RF feed point 101 requires pressing the force-applying end of the pressure rod 7, and the pressure rod 7 swings around the hinge axis, so that the test assembly 5 overcomes the The elastic force of the elastic element 80 slides upward (in the direction away from the microwave radio frequency assembly 100 ), and the sliding distance is based on the entirety of the test assembly 5 that can avoid the higher packaged components on the microwave radio frequency assembly 100 , and then the position of the test assembly 5 is determined. Transfer, after the test assembly 5 reaches and aligns the next RF feed point 101, release the force end of the pressing rod 7, so that the test assembly 5 restores the abutment with the RF feed point 101, and then test the RF feed point 101, repeat The above actions are performed until all the RF feed points 101 are tested, the structure is simple and stable, the operation is convenient and reliable, and the test work is safe and efficient.

在本实施例中,作为一种具体实施方式,请参阅图1至图3,弹性元件80设有至少两个。通过至少两个弹性元件80对测试组件5同时施加弹性力,确保测试组件5的受力平稳,保证测试精度。In this embodiment, as a specific implementation, please refer to FIG. 1 to FIG. 3 , there are at least two elastic elements 80 . At least two elastic elements 80 apply elastic force to the test assembly 5 at the same time, so as to ensure that the force of the test assembly 5 is stable and the test accuracy is ensured.

作为本实用新型实施例的一种具体实施方式,请参阅图3,测试组件5上设有沿上下方向延伸的容置槽60,滑座4上设有挡板41,挡板41用于插入容置槽60内,弹性元件80的一端与容置槽60的底壁抵接,另一端与挡板41的下表面抵接。As a specific implementation of the embodiment of the present invention, please refer to FIG. 3 , the test assembly 5 is provided with an accommodating groove 60 extending in the up-down direction, and the sliding seat 4 is provided with a baffle 41 , and the baffle 41 is used for inserting In the accommodating groove 60 , one end of the elastic element 80 abuts against the bottom wall of the accommodating groove 60 , and the other end abuts against the lower surface of the baffle plate 41 .

挡板41与滑座4固定连接并作为弹性元件80的一个抵接端,并将容置槽60的底壁(靠近测试台1台面的一端)作为弹性元件80的另一个抵接端,需要说明的是,弹性元件80在挡板41与容置槽60的底壁之间处于压缩状态,从而使弹性元件80对测试组件5施加向下的弹性力,使测试组件5保持弹性固定状态;当转移测试组件5的位置时,按压压杆7,压杆7与测试组件5的抵接端向上方摆动,从而克服弹性元件80的弹性力,使测试组件5向上滑动以避让高度较高的封装元件,连接结构简单稳定,可靠性高且操作方便。The baffle 41 is fixedly connected to the sliding seat 4 and serves as an abutting end of the elastic element 80, and the bottom wall of the accommodating groove 60 (the end close to the table top of the test bench 1) is used as the other abutting end of the elastic element 80. It is illustrated that the elastic element 80 is in a compressed state between the baffle 41 and the bottom wall of the accommodating groove 60, so that the elastic element 80 exerts a downward elastic force on the test assembly 5, so that the test assembly 5 is kept in an elastically fixed state; When transferring the position of the test assembly 5, the pressing rod 7 is pressed, and the abutting end of the pressing rod 7 and the test assembly 5 swings upward, thereby overcoming the elastic force of the elastic element 80, so that the test assembly 5 slides upward to avoid the high-height Packaged components, the connection structure is simple and stable, the reliability is high and the operation is convenient.

作为本实用新型实施例的一种具体实施方式,请参阅图4,测试组件5包括:与滑座4沿上下方向滑动连接的连接架6、与连接架6纵向滑动连接的测试架51,以及与测试架51上下滑动连接的测试探针52;其中,容置槽60设置在连接架6上;压杆7与连接架6的下端面抵接。As a specific implementation of the embodiment of the present invention, please refer to FIG. 4 , the test assembly 5 includes: a connecting frame 6 slidably connected with the sliding seat 4 in the up-down direction, a test frame 51 slidably connected with the connecting frame 6 longitudinally, and The test probe 52 is slidably connected to the test frame 51 up and down; the accommodating groove 60 is provided on the connection frame 6 ; the pressing rod 7 is in contact with the lower end surface of the connection frame 6 .

应当理解,微波射频组件100上的各个射频馈点101位置的加工难免出现轻度的误差,测试时,调整第一托板2、第二托板3的位置,使测试探针52与第一个射频馈点101位置对齐,第一个测试完成后对横向或者纵向的后续射频馈点101进行测试时,只需横向移动第一托板2或者纵向移动第二托板3,对于加工位置准确的射频馈点101能够直接对齐,而对于存在位置尺寸误差的射频馈点101,无法直接对齐,因此需要对测试架51进行微调,使测试探针52与射频馈点101位置准确对齐,确保测试精度;It should be understood that there will inevitably be slight errors in the processing of the positions of the RF feed points 101 on the microwave radio frequency assembly 100. During testing, adjust the positions of the first pallet 2 and the second pallet 3 so that the test probes 52 and the first pallet The positions of the RF feed points 101 are aligned. After the first test is completed, when testing the subsequent RF feed points 101 in the horizontal or vertical direction, it is only necessary to move the first pallet 2 horizontally or the second pallet 3 vertically, which is accurate for the processing position. The RF feed point 101 can be directly aligned, but the RF feed point 101 with position and size error cannot be directly aligned. Therefore, it is necessary to fine-tune the test frame 51 to make the test probe 52 and the RF feed point 101 accurately aligned to ensure the test precision;

测试架51与连接架6纵向滑动连接,在第一托板2横向移动并确保与射频馈点101位置横向对齐后,对安装在连接架6上的测试架51进行纵向微调,实现测试探针52与射频馈点101的精确对准;The test frame 51 is longitudinally slidingly connected with the connection frame 6. After the first pallet 2 is moved laterally and the position of the RF feed point 101 is ensured laterally aligned, the test frame 51 installed on the connection frame 6 is vertically fine-tuned to realize the test probe. 52 is precisely aligned with the RF feed point 101;

当然,通过对第一托板2、第二托板3的位置同时进行调整,也能够满足对具有加工位置误差的射频馈点101的对齐,但是无疑通过微调测试架51的方式更加方便操作,调整精度更好,效率更高;Of course, by adjusting the positions of the first pallet 2 and the second pallet 3 at the same time, the alignment of the RF feed point 101 with the machining position error can also be satisfied, but it is undoubtedly more convenient to operate by fine-tuning the test stand 51, Better adjustment accuracy and higher efficiency;

另外,需要说明,本实施例针对GSG(Ground-signal-ground)结构弹性测试探针52,对射频馈点101的测试时需要测试探针52与射频馈点101进行抵接,测试探针52具有弹性,需要对射频馈点101具有一定的弹性压力,而不同类型的微波射频组件100,其尺寸、形状均存在不同,因此测试架51与射频馈点101之间的距离存在差异,测试探针52与测试架51为上下滑动连接,针对不同类型的微波射频组件100,能够通过微调测试探针52的上下位置,实现测试探针52与射频馈点101之间的具有满足测试需要的弹性力,结构简单,适用范围广。In addition, it should be noted that this embodiment is aimed at the GSG (Ground-signal-ground) structural elasticity test probe 52 . When testing the RF feed point 101 , the test probe 52 needs to be in contact with the RF feed point 101 , and the test probe 52 Elasticity requires a certain elastic pressure on the RF feed point 101. Different types of microwave RF components 100 have different sizes and shapes, so the distance between the test rack 51 and the RF feed point 101 is different. The needle 52 and the test frame 51 are connected by sliding up and down. For different types of microwave radio frequency components 100, the upper and lower positions of the test probe 52 can be fine-tuned to realize the elasticity between the test probe 52 and the radio frequency feed point 101 to meet the test requirements. It has simple structure and wide application range.

作为本实用新型实施例的一种具体实施方式,请参阅图4,滑座4上设有沿上下方向延伸的滑槽40,连接架6与滑槽40滑动连接。连接架6嵌入滑槽40内与滑槽40实现滑动连接,结构简单稳定,加工制作成本低。As a specific implementation of the embodiment of the present invention, please refer to FIG. 4 , the sliding seat 4 is provided with a sliding groove 40 extending in the up-down direction, and the connecting frame 6 is slidably connected with the sliding groove 40 . The connecting frame 6 is embedded in the chute 40 to realize sliding connection with the chute 40 , the structure is simple and stable, and the manufacturing cost is low.

在本实施例中,作为一种具体实施方式,请参阅图4,连接架6包括滑板61及固接于滑板61上的托架62;其中,滑板61用于插入滑槽40内与滑座4进行滑动连接,托架62用于安装测试组件5。将连接架6作为两部分能够方便加工,降低制作成本。In this embodiment, as a specific implementation, please refer to FIG. 4 , the connecting frame 6 includes a sliding plate 61 and a bracket 62 fixed on the sliding plate 61 ; wherein, the sliding plate 61 is used for inserting into the chute 40 to connect with the sliding seat. 4 make a sliding connection, and the bracket 62 is used to install the test assembly 5. Using the connecting frame 6 as two parts can facilitate processing and reduce the manufacturing cost.

作为本实用新型实施例的一种具体实施方式,请参阅图1及图5,滑槽40两侧分别固接有第一导轨42;连接架6两侧分别固接有第二导轨63;第一导轨42与第二导轨63滑动接触。通过第一导轨42与第二导轨63的滑动接触,一方面确保连接架6与滑槽40的连接间隙小,确保滑动过程运动稳定,避免连接架6在滑槽40内晃动影响测试组件5与射频馈点101的对齐,保证测试精度;另一方面第一导轨42与第二导轨63的加工精度高,两者之间的接触面的滑动摩擦系数低,滑动操作轻便灵活。As a specific implementation of the embodiment of the present invention, please refer to FIG. 1 and FIG. 5 , the first guide rails 42 are respectively fixed on both sides of the chute 40 ; the second guide rails 63 are respectively fixed on both sides of the connecting frame 6 ; A guide rail 42 is in sliding contact with the second guide rail 63 . Through the sliding contact between the first guide rail 42 and the second guide rail 63, on the one hand, the connection gap between the connecting frame 6 and the chute 40 is ensured to be small, so as to ensure stable movement during the sliding process, and avoid the shaking of the connecting frame 6 in the chute 40 to affect the test assembly 5 and the The alignment of the RF feed points 101 ensures the test accuracy; on the other hand, the first guide rail 42 and the second guide rail 63 have high machining precision, and the sliding friction coefficient of the contact surface between the two is low, and the sliding operation is light and flexible.

在本实施例中,作为进一步的实施方式,请参阅图5,第一导轨42、第二导轨63的接触面上分别设有第一滑道420、第二滑道630,且第一滑道420、第二滑道630围成的空间内滑动连接有第一滑块64。第一滑块64一部分与第一滑道420滑动连接,另一部分与第二滑道630滑动连接,第一滑道420、第二滑道630的长度能够决定连接架6能够在滑座4内滑动的距离,第一滑块64一方面能够起到限位作用,避免连接架6由滑座4内滑出,另一方面第一滑块64能够进一步提高连接架6与滑座4的连接稳定性,保证连接架6在静止或者滑动状态下的稳定性,确保对准和测试精度。In this embodiment, as a further implementation, please refer to FIG. 5 , the contact surfaces of the first guide rail 42 and the second guide rail 63 are respectively provided with a first slideway 420 and a second slideway 630 , and the first slideway is 420. A first sliding block 64 is slidably connected in the space enclosed by the second slideway 630. A part of the first sliding block 64 is slidably connected with the first sliding path 420 , and the other part is slidably connected with the second sliding path 630 . The sliding distance, on the one hand, the first sliding block 64 can play a limiting role to prevent the connecting frame 6 from sliding out of the sliding seat 4, on the other hand, the first sliding block 64 can further improve the connection between the connecting frame 6 and the sliding seat 4 Stability, to ensure the stability of the connecting frame 6 in a static or sliding state, and to ensure alignment and testing accuracy.

作为本实用新型实施例的一种具体实施方式,请参阅图1、图6及图7,第一托板2上间隔设有两个横向延伸的第三导轨21,测试台1上固接有两个分别与两个第三导轨21对应滑动接触的第四导轨11;第三导轨21、第四导轨11的接触面上分别设有第三滑道210、第四滑道110,且第三滑道210、第四滑道110围成的空间内滑动连接有第二滑块12;As a specific implementation of the embodiment of the present invention, please refer to FIG. 1 , FIG. 6 and FIG. 7 , the first support plate 2 is provided with two horizontally extending third guide rails 21 at intervals, and the test table 1 is fixed with The two fourth guide rails 11 are in sliding contact with the two third guide rails 21 respectively; the contact surfaces of the third guide rail 21 and the fourth guide rail 11 are respectively provided with a third slideway 210 and a fourth slideway 110 , and the third The second sliding block 12 is slidably connected in the space enclosed by the slideway 210 and the fourth slideway 110 ;

第二托板3上间隔设有两个纵向延伸的第五导轨31,第一托板2上固接有两个分别与两个第五导轨31对应滑动接触的第六导轨22;第五导轨31、第六导轨22的接触面上分别设有第五滑道310、第六滑道220,且第五滑道310、第六滑道220围成的空间内滑动连接有第三滑块33。The second support plate 3 is provided with two longitudinally extending fifth guide rails 31 at intervals, and the first support plate 2 is fixed with two sixth guide rails 22 in sliding contact with the two fifth guide rails 31 respectively; 31. A fifth slideway 310 and a sixth slideway 220 are respectively provided on the contact surface of the sixth guide rail 22, and a third slide block 33 is slidably connected in the space enclosed by the fifth slideway 310 and the sixth slideway 220. .

结构连接简单,加工制作方便、成本低;结构紧凑,在保证较小的滑动间隙确保滑动稳定性的前提下具有较小的滑动摩擦阻力,滑动轻便省力。The structure is simple in connection, convenient in processing and production, and low in cost; the structure is compact, and on the premise of ensuring a small sliding gap to ensure sliding stability, it has a small sliding friction resistance, and the sliding is light and labor-saving.

作为本实用新型实施例的一种具体实施方式,请参阅图2至图4,滑座4的下部设有避让槽43,压杆7与连接架6的抵接端转动连接有套筒71,套筒71穿过避让槽43,并与连接架6的下端面抵靠。As a specific implementation of the embodiment of the present invention, please refer to FIG. 2 to FIG. 4 , the lower part of the sliding seat 4 is provided with an escape groove 43 , and a sleeve 71 is rotatably connected with the abutting end of the pressing rod 7 and the connecting frame 6 , The sleeve 71 passes through the escape groove 43 and abuts against the lower end surface of the connecting frame 6 .

在压杆7摆动过程中,套筒71能够在连接架6靠近测试台1台面的端面上进行滚动,一方面避免了压杆7与连接架6的抵接端划伤连接架6端面的问题,另一方面滚动摩擦力小,从而能够减小需要施加到压杆7上的作用力,保证连接架6的滑动过程轻便省力。当然,应当理解的是,将套筒71更换为滚轮、轴承或者其他滚动件具有和本实施例采用的套筒71相同的效果。During the swinging process of the pressing rod 7, the sleeve 71 can roll on the end face of the connecting frame 6 close to the table surface of the test bench 1, on the one hand, it avoids the problem that the abutting end of the pressing rod 7 and the connecting frame 6 scratches the end face of the connecting frame 6 On the other hand, the rolling friction force is small, so that the force that needs to be applied to the pressure rod 7 can be reduced, and the sliding process of the connecting frame 6 can be ensured light and labor-saving. Of course, it should be understood that replacing the sleeve 71 with a roller, a bearing or other rolling elements has the same effect as the sleeve 71 used in this embodiment.

作为本实用新型实施例的一种具体实施方式,请参阅图1,第一托板2具有多个横向定位位置,且相邻横向定位位置之间的间距与相邻射频馈点101之间的横向间距相等;第二托板3具有多个纵向定位位置,且相邻纵向定位位置之间的间距与相邻射频馈点101之间的纵向间距相等。As a specific implementation of the embodiment of the present invention, please refer to FIG. 1 , the first pallet 2 has a plurality of lateral positioning positions, and the distance between adjacent lateral positioning positions and the distance between adjacent RF feed points 101 The horizontal spacing is equal; the second pallet 3 has a plurality of vertical positioning positions, and the spacing between adjacent vertical positioning positions is equal to the vertical spacing between adjacent RF feed points 101 .

在转移测试组件5时,通过横向定位位置、纵向定位位置的定位,能够使第一托板2、第二托板3快速滑动至目标位置,从而使测试组件5与待测射频馈点101位置对齐,测试组件5的转移对齐过程方便、快速,节约测试组件5的转移寻址时间,从而缩短微波射频组件100的整体测试时间,工作效率高。When transferring the test assembly 5, the first pallet 2 and the second pallet 3 can be quickly slid to the target position through the positioning of the lateral positioning position and the vertical positioning position, so that the test assembly 5 and the RF feed point 101 to be tested are positioned Alignment, the transfer and alignment process of the test assembly 5 is convenient and fast, and the transfer and addressing time of the test assembly 5 is saved, thereby shortening the overall test time of the microwave radio frequency assembly 100, and the work efficiency is high.

在本实施例中,作为一种具体实施方式,请参阅图1,测试台1上横向间隔设有多个横向定位孔10,第一托板2上穿设有用于与横向定位孔10插接的横向定位销23;第一托板2上纵向间隔设有多个纵向定位孔20,第二托板3上穿设有用于与纵向定位孔20插接的纵向定位销32。In this embodiment, as a specific implementation, please refer to FIG. 1 , the test table 1 is provided with a plurality of lateral positioning holes 10 at horizontal intervals, and the first support plate 2 is provided with a plurality of lateral positioning holes 10 for inserting with the lateral positioning holes 10 . The first pallet 2 is provided with a plurality of longitudinal positioning holes 20 at longitudinal intervals, and the second pallet 3 is provided with longitudinal positioning pins 32 for inserting with the longitudinal positioning holes 20 .

通过定位销与定位孔的插接方式,实现第一托板2的横向定位以及第二托板3的纵向定位,定位精度高,且结构简单,加工制作成本低。The horizontal positioning of the first pallet 2 and the vertical positioning of the second pallet 3 are achieved through the insertion method of the positioning pin and the positioning hole, with high positioning accuracy, simple structure and low manufacturing cost.

以上所述仅为本实用新型的较佳实施例而已,并不用以限制本实用新型,凡在本实用新型的精神和原则之内所作的任何修改、等同替换和改进等,均应包含在本实用新型的保护范围之内。The above are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention shall be included in the present invention. within the scope of protection of the utility model.

Claims (10)

1. A kind of test device which has no output microwave radio frequency assembly of radio frequency feed point of the union, characterized by that, including:
the test bench is used for fixedly mounting the microwave radio frequency assembly; a first supporting plate is transversely and slidably connected to the test board, and a second supporting plate is longitudinally and slidably connected to the first supporting plate; a sliding seat is fixedly connected to the second supporting plate;
the test assembly is connected with the sliding seat in a sliding manner along the vertical direction; the test assembly is used for being electrically connected with the test cable and testing a radio frequency feed point on the microwave radio frequency assembly;
and the elastic positioning assembly is arranged between the test assembly and the sliding seat and is used for positioning the test position of the test assembly downwards and driving the test assembly to bounce upwards.
2. The apparatus for testing a connector-less rf feed point output-type microwave rf assembly as claimed in claim 1, wherein the elastic positioning assembly comprises:
the elastic element is arranged between the test assembly and the sliding seat along the up-down direction and is used for applying downward elastic force to the test assembly;
and the compression bar is hinged on the second supporting plate, one end of the compression bar is used for being abutted against the lower end face of the test assembly, and the other end of the compression bar is used for applying external force.
3. The apparatus for testing a connector-less rf feed point output type microwave rf module as claimed in claim 2, wherein: the testing assembly is provided with a containing groove extending along the vertical direction, the sliding seat is provided with a baffle plate, the baffle plate is used for being inserted into the containing groove, one end of the elastic element is abutted to the bottom wall of the containing groove, and the other end of the elastic element is abutted to the lower surface of the baffle plate.
4. The apparatus for testing a connector-less rf feed point output type microwave rf assembly as claimed in claim 3, wherein the test assembly comprises:
the connecting frame is connected with the sliding seat in a sliding manner along the vertical direction; the accommodating groove is arranged on the connecting frame; the compression bar is abutted against the lower end face of the connecting frame;
the test frame is longitudinally connected with the connecting frame in a sliding manner;
and the test probe is connected with the test frame in a vertical sliding manner.
5. The apparatus for testing a connector-less rf feed point output type microwave rf assembly as claimed in claim 4, wherein: the sliding seat is provided with a sliding groove extending along the up-down direction, and the connecting frame is in sliding connection with the sliding groove.
6. The apparatus for testing a connector-less rf feed point output type microwave rf module as claimed in claim 5, wherein: two sides of the sliding chute are respectively fixedly connected with a first guide rail; two sides of the connecting frame are fixedly connected with second guide rails respectively; the first guide rail is in sliding contact with the second guide rail.
7. The apparatus for testing a connector-less rf feed point output type microwave rf module as claimed in claim 6, wherein: the contact surfaces of the first guide rail and the second guide rail are respectively provided with a first slide way and a second slide way, and a space enclosed by the first slide way and the second slide way is connected with a first slide block in a sliding manner.
8. The apparatus for testing a connector-less rf feed point output type microwave rf module as claimed in claim 5, wherein: the lower part of slide is equipped with dodges the groove, the depression bar with the butt end of link rotates and is connected with the sleeve, the sleeve passes dodge the groove, and with the lower terminal surface of link supports and leans on.
9. The apparatus for testing a connector-less rf feed point output type microwave rf module as claimed in any one of claims 1 to 8, wherein: the first supporting plate is provided with a plurality of transverse positioning positions, and the distance between every two adjacent transverse positioning positions is equal to the transverse distance between every two adjacent radio frequency feed points;
the second supporting plate is provided with a plurality of longitudinal positioning positions, and the distance between every two adjacent longitudinal positioning positions is equal to the longitudinal distance between every two adjacent radio frequency feed points.
10. The apparatus for testing a connector-less rf feed point output type microwave rf module as claimed in claim 9, wherein: a plurality of transverse positioning holes are formed in the test board at intervals in the transverse direction, and transverse positioning pins used for being inserted into the transverse positioning holes are arranged on the first supporting plate in a penetrating mode;
the first supporting plate is provided with a plurality of longitudinal positioning holes at intervals in the longitudinal direction, and the second supporting plate is provided with longitudinal positioning pins in a penetrating mode and used for being connected with the longitudinal positioning holes in an inserting mode.
CN201922114321.5U 2019-11-29 2019-11-29 Testing device for radio frequency feed point output type microwave radio frequency assembly without connector Active CN211402575U (en)

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CN201922114321.5U CN211402575U (en) 2019-11-29 2019-11-29 Testing device for radio frequency feed point output type microwave radio frequency assembly without connector

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Application Number Priority Date Filing Date Title
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111025053A (en) * 2019-11-29 2020-04-17 中国电子科技集团公司第十三研究所 Testing device for radio frequency feed point output type microwave radio frequency assembly without connector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111025053A (en) * 2019-11-29 2020-04-17 中国电子科技集团公司第十三研究所 Testing device for radio frequency feed point output type microwave radio frequency assembly without connector
CN111025053B (en) * 2019-11-29 2024-06-21 中国电子科技集团公司第十三研究所 A test device for connector-free RF feed point output type microwave RF component

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