CN211348401U - Discharge voltage test equipment - Google Patents
Discharge voltage test equipment Download PDFInfo
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- CN211348401U CN211348401U CN201922088243.6U CN201922088243U CN211348401U CN 211348401 U CN211348401 U CN 211348401U CN 201922088243 U CN201922088243 U CN 201922088243U CN 211348401 U CN211348401 U CN 211348401U
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Abstract
The utility model relates to a discharge test equipment field discloses a discharge voltage test equipment, including singlechip, memory, touch screen, battery, invertion power supply module, DC power supply module, current measurement circuit, measurement protection circuit, voltage measurement circuit and overvoltage protector, singlechip and memory, touch screen, invertion power supply module, DC power supply module, current measurement circuit, measurement protection circuit and voltage measurement circuit connection, the battery is connected with invertion power supply module and DC power supply module respectively, invertion power supply module and DC power supply module still all are connected with current measurement circuit; the direct current power supply module comprises a voltage input end, a first resistor, a first MOS (metal oxide semiconductor) tube, a first triode, a first diode, a second resistor, a second triode, a third resistor, a fourth resistor and a voltage output end. Implement the utility model discloses a discharge voltage test equipment has following beneficial effect: the circuit has high safety and reliability and can meet the requirement of safe power supply.
Description
Technical Field
The utility model relates to a discharge test equipment field, in particular to discharge voltage test equipment.
Background
When partial discharge is generated under test voltage, pulse current is generated through a coupling capacitor Ck, a pulse signal is picked up by an input unit, and after the pulse signal is subjected to low-noise pre-amplification, filter amplifier selection of a required frequency band and main amplification, discharge pulses are displayed on an elliptic scanning baseline of an oscillographic screen and are simultaneously sent to a pulse peak value table (log table) to display the peak value of the discharge pulses. The time window unit controls the working time of the pulse peak value table in each period of the test voltage, and highlights the display of the display screen in the period, so that the width and the position can be changed, and the anti-interference capability is further enhanced. The discharge tester has the advantages of high sensitivity, large dynamic range of an amplifier system, wide range of tested products, simple and convenient operation and the like. The device adopts advanced anti-interference components and a unique door display circuit, has strong anti-interference capability and four high-frequency elliptical scans, and is suitable for the type and delivery test of high-voltage products, the research and test of new products, and the quantitative test of partial discharge of motors, transformers, cables, sleeves, capacitors, transformers, lightning arresters, switches and other high-voltage electrical appliances. Can be used in the field of manufacturing factories, scientific research departments and electric power departments. In the prior art, some power supply parts of the discharge voltage test equipment lack corresponding circuit protection functions, such as: the current-limiting protection function is lacked, so that the safety and reliability of the circuit are low, and the requirement of safe power supply cannot be met.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model lies in, to the above-mentioned defect of prior art, provide the discharge voltage test equipment that the security and the reliability of a circuit are higher, can satisfy the requirement of safe power supply.
The utility model provides a technical scheme that its technical problem adopted is: the discharge voltage testing equipment comprises a single chip microcomputer, a memory, a touch screen, a battery, an inverter power supply module, a direct current power supply module, a current measuring circuit, a measuring protection circuit, a voltage measuring circuit and an overvoltage protector, wherein the single chip microcomputer is respectively connected with the memory, the touch screen, the inverter power supply module, the direct current power supply module, the current measuring circuit, the measuring protection circuit and the voltage measuring circuit;
the direct current power supply module comprises a voltage input end, a first resistor, a first MOS (metal oxide semiconductor) tube, a first triode, a first diode, a second resistor, a second triode, a third resistor, a fourth resistor and a voltage output end, wherein the voltage input end is respectively connected with the anode of the first diode, one end of the first resistor and the source electrode of the first MOS tube, the grid electrode of the first MOS tube is respectively connected with the other end of the first resistor and the collector electrode of the first triode, the base electrode of the first triode is respectively connected with the cathode of the first diode, one end of the second resistor and the collector electrode of the second triode, the drain electrode of the first MOS tube is respectively connected with the voltage output end and one end of the third resistor, and the base electrode of the second triode is respectively connected with the other end of the third resistor and one end of the fourth resistor, and the emitting electrode of the first triode, the other end of the second resistor, the emitting electrode of the second triode and the other end of the fourth resistor are all grounded.
In the discharge voltage testing apparatus of the present invention, the first diode has a model of S-152T.
In the discharge voltage testing apparatus, the dc power supply module further includes a fifth resistor, one end of the fifth resistor is connected to the base of the first triode, and the other end of the fifth resistor is connected to the collector of the second triode.
In the discharge voltage testing apparatus of the present invention, the resistance of the fifth resistor is 45k Ω.
In the discharge voltage testing apparatus of the present invention, the first transistor is an NPN transistor.
In the discharge voltage testing apparatus of the present invention, the second transistor is an NPN transistor.
In the discharge voltage testing apparatus of the present invention, the first MOS transistor is a P-channel MOS transistor.
Implement the utility model discloses a discharge voltage test equipment has following beneficial effect: the direct current power supply module comprises a voltage input end, a first resistor, a first MOS (metal oxide semiconductor) tube, a first triode, a first diode, a second resistor, a second triode, a third resistor, a fourth resistor and a voltage output end, and the first diode is used for current-limiting protection, so that the safety and reliability of the circuit are higher, and the requirement of safe power supply can be met.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an embodiment of a discharge voltage testing apparatus according to the present invention;
fig. 2 is a schematic circuit diagram of the dc power supply module in the embodiment.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the embodiment of the discharge voltage testing device of the present invention, the schematic structural diagram of the discharge voltage testing device is shown in fig. 1. In fig. 1, the discharge voltage testing apparatus includes a single chip microcomputer 1, a memory 2, a touch screen 3, a battery 4, an inverter power module 5, a dc power module 6, a current measuring circuit 7, a measurement protection circuit 8, a voltage measuring circuit 9, and an overvoltage protector 10, where the single chip microcomputer 1 is connected to the memory 2, the touch screen 3, the inverter power module 5, the dc power module 6, the current measuring circuit 7, the measurement protection circuit 8, and the voltage measuring circuit 9, the battery 4 is connected to the inverter power module 5 and the dc power module 6, the inverter power module 5 and the dc power module 6 are also connected to the current measuring circuit 7, the measurement protection circuit 8 is also connected to the current measuring circuit 7 and the voltage measuring circuit 9, and the voltage measuring circuit 9 is connected to the overvoltage protector 10.
When a discharge test is carried out, the single chip microcomputer 1 detects an instruction input by the touch screen 3, simultaneously controls the power supply module to output to the inverter power supply module 5 for input, the inverter power supply module 5 starts the test by stepping and pressurizing any two phases, any phase and the ground of the overvoltage protector 10 at 0.1kV, when a current feedback loop detects current mutation, the value of the applied voltage is recorded, the output of the inverter power supply module 5 is cut off within 0.1 second, simultaneously a test result is displayed to the touch screen 3 through the single chip microcomputer 1, the measurement interval is not less than 10 seconds every time, three times of measurement are carried out, and the average value is obtained; when the discharge test is carried out, the power frequency power supply can be cut off within 0.1 second when the current mutation is detected, and the overvoltage impact of the three-phase overvoltage protector during the discharge test is effectively reduced.
In this embodiment, the single chip microcomputer 1, the memory 2, the touch screen 3, the battery 4, the inverter power module 5, the current measuring circuit 7, the measurement protection circuit 8, the voltage measuring circuit 9 and the overvoltage protector 10 are all implemented by using a structure in the prior art, and the working principle thereof is also the working principle in the prior art, and is not described in detail herein.
Fig. 2 is a schematic circuit diagram of the dc power supply module in this embodiment, in fig. 2, the dc power supply module 6 includes a voltage input terminal Vin, a first resistor R1, a first MOS transistor M1, a first transistor Q1, a first diode D1, a second resistor R2, a second transistor Q2, a third resistor R3, a fourth resistor R4, and a voltage output terminal Vo, wherein the voltage input terminal Vin is connected to an anode of the first diode D1, one end of the first resistor R1, and a source of the first MOS transistor M1, a gate of the first MOS transistor M1 is connected to the other end of the first resistor R1 and a collector of the first transistor Q1, a base of the first transistor Q1 is connected to a cathode of the first diode D1, one end of the second resistor 573r 5, and a collector of the second transistor Q2, a drain of the first MOS transistor M1 is connected to the voltage output terminal and one end of the third resistor R3, and a base of the first resistor R599, the emitter of the first triode Q1, the other end of the second resistor R2, the emitter of the second triode Q2 and the other end of the fourth resistor R4 are all grounded.
In this embodiment, the first diode D1 is a current limiting diode for current limiting protection. The current limiting protection principle is as follows: when the electric current of first diode D1 place branch road is great, can reduce the size of the electric current of first diode D1 place branch road through this first diode D1, make it keep at normal operating condition, and be unlikely to because of the too big components and parts that lead to burning out in the circuit of electric current, consequently the utility model discloses the security and the reliability of circuit are higher, can satisfy the requirement of safe power supply. It should be noted that in the present embodiment, the first diode D1 has a model number S-152T. Of course, in practical applications, the first diode D1 may also be another type of diode with similar functions.
Setting a preset voltage according to the requirement of the singlechip 1, namely adjusting the sizes of the third resistor R3 and the fourth resistor R4; then, the proportional relation between the third resistor R3 and the fourth resistor R4 is adjusted, so that when the output voltage of the voltage output end Vo is equal to the preset voltage, the second triode Q2 is just conducted; the second transistor Q2 is used as a switch for switching between a regulated state and a conducting state.
When the input voltage of the voltage input end Vin is higher, namely exceeds the preset voltage, the voltage stabilizing state is achieved, the second triode Q2 starts to be conducted, and the input voltage clamp is located at the preset voltage; the base of the first transistor Q1 starts to cut off, that is, the potential of the collector of the first transistor Q1 changes with the potential change fed back by the base of the second transistor Q2, thereby forming a negative feedback control, wherein the feedback voltage rises, even if the gate-source voltage of the gate of the first MOS transistor M1 drops, the output voltage is reduced, and the feedback voltage drops, even if the gate-source voltage of the first MOS transistor M1 rises, the output voltage is increased, so that the output potential is always clamped at the preset voltage.
When the output voltage of the voltage input end Vin is lower than the preset voltage, the second triode Q2 is switched off, and the output voltage is almost equal to the input voltage; the first triode Q1 is turned on, the collector potential of the first triode Q1 drops to be nearly grounded, the gate-source voltage of the first MOS transistor M1 reaches the maximum value, and the first MOS transistor M1 is completely turned on, so that the input voltage is output to the single chip microcomputer 1 with a negligible voltage drop.
In this embodiment, the first transistor Q1 is an NPN transistor, the second transistor Q2 is an NPN transistor, and the first MOS transistor M1 is a P-channel MOS transistor. Certainly, in practical applications, the first transistor Q1 and the second transistor Q2 may both adopt PNP transistors, and the first MOS transistor M1 may also adopt N-channel MOS transistors, but the structure of the circuit is also changed accordingly.
In this embodiment, the dc power supply module 6 further includes a fifth resistor R5, one end of the fifth resistor R5 is connected to the base of the first transistor Q1, and the other end of the fifth resistor R5 is connected to the collector of the second transistor Q2. The fifth resistor R5 is a current limiting resistor, and is used for current limiting protection of the collector current of the second transistor Q2. The current limiting protection principle is as follows: when the collector current of the second triode Q2 is large, the fifth resistor R5 can reduce the collector current of the second triode Q2 to keep the second triode Q2 in a normal working state, so that the device in the circuit is not burned out due to too large current, and the safety and reliability of the circuit are further enhanced. It should be noted that, in the present embodiment, the resistance of the fifth resistor R5 is 45k Ω. Of course, in practical applications, the resistance of the fifth resistor R5 may be adjusted according to specific situations, that is, the resistance of the fifth resistor R5 may be increased or decreased according to specific situations.
In short, in this embodiment, since the current-limiting diode is disposed in the dc power supply module 6, the safety and reliability of the circuit are high, and the requirement of safe power supply can be satisfied.
The above description is only a preferred embodiment of the present invention, and should not be taken as limiting the invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. A discharge voltage test device is characterized by comprising a single chip microcomputer, a memory, a touch screen, a battery, an inverter power supply module, a direct current power supply module, a current measurement circuit, a measurement protection circuit, a voltage measurement circuit and an overvoltage protector, wherein the single chip microcomputer is respectively connected with the memory, the touch screen, the inverter power supply module, the direct current power supply module, the current measurement circuit, the measurement protection circuit and the voltage measurement circuit;
the direct current power supply module comprises a voltage input end, a first resistor, a first MOS (metal oxide semiconductor) tube, a first triode, a first diode, a second resistor, a second triode, a third resistor, a fourth resistor and a voltage output end, wherein the voltage input end is respectively connected with the anode of the first diode, one end of the first resistor and the source electrode of the first MOS tube, the grid electrode of the first MOS tube is respectively connected with the other end of the first resistor and the collector electrode of the first triode, the base electrode of the first triode is respectively connected with the cathode of the first diode, one end of the second resistor and the collector electrode of the second triode, the drain electrode of the first MOS tube is respectively connected with the voltage output end and one end of the third resistor, and the base electrode of the second triode is respectively connected with the other end of the third resistor and one end of the fourth resistor, and the emitting electrode of the first triode, the other end of the second resistor, the emitting electrode of the second triode and the other end of the fourth resistor are all grounded.
2. The discharge voltage test apparatus of claim 1, wherein the first diode is of a type S-152T.
3. The discharge voltage test apparatus according to claim 1, wherein the dc power supply module further includes a fifth resistor, one end of the fifth resistor is connected to the base of the first transistor, and the other end of the fifth resistor is connected to the collector of the second transistor.
4. The discharge voltage testing apparatus of claim 3, wherein the resistance value of the fifth resistor is 45k Ω.
5. The discharge voltage test apparatus of any one of claims 1 to 4, wherein the first transistor is an NPN transistor.
6. The discharge voltage test apparatus of any one of claims 1 to 4, wherein the second transistor is an NPN transistor.
7. The discharge voltage testing apparatus according to any one of claims 1 to 4, wherein the first MOS transistor is a P-channel MOS transistor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922088243.6U CN211348401U (en) | 2019-11-27 | 2019-11-27 | Discharge voltage test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922088243.6U CN211348401U (en) | 2019-11-27 | 2019-11-27 | Discharge voltage test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211348401U true CN211348401U (en) | 2020-08-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922088243.6U Active CN211348401U (en) | 2019-11-27 | 2019-11-27 | Discharge voltage test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211348401U (en) |
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2019
- 2019-11-27 CN CN201922088243.6U patent/CN211348401U/en active Active
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