CN210402096U - Automatic detection platform for input/output board of computer interlocking system - Google Patents

Automatic detection platform for input/output board of computer interlocking system Download PDF

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CN210402096U
CN210402096U CN201921402306.4U CN201921402306U CN210402096U CN 210402096 U CN210402096 U CN 210402096U CN 201921402306 U CN201921402306 U CN 201921402306U CN 210402096 U CN210402096 U CN 210402096U
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board
input
conversion unit
tested
output
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周红阳
侯伟波
刘大明
黄聪
费嘉宁
赵荣
石海晴
张稳稳
余嘉贤
孙亚
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Shanghai Railway Communication Co Ltd
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Shanghai Railway Communication Co Ltd
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Abstract

The utility model relates to an automatic testing platform of computer interlock system's input/output board, host computer and the next system including interconnect, the next system includes switching unit, agreement conversion unit and the signal conversion unit of being connected with the controller respectively, the controller passes through agreement conversion unit and host computer connection, the controller is respectively through switching unit and signal conversion unit and input/output interface connection, input/output interface and the input board that awaits measuring or the output board that awaits measuring are connected, the input board that awaits measuring or the output board that awaits measuring pass through agreement conversion unit and host computer connection, switching unit discernment await measuring the test content of board type and apolexis the different types of template. Compared with the prior art, the automatic test of the input board or the output board to be tested can be realized, the test efficiency and the test accuracy are improved, and meanwhile, a large number of connecting wires are simplified, so that the detection platform is more reliable and is easy to maintain.

Description

Automatic detection platform for input/output board of computer interlocking system
Technical Field
The utility model belongs to the technical field of the station interlocking and specifically relates to an automatic testing platform of computer interlocking system's input/output board is related to.
Background
Railway stations basically realize the control of the operation of trains and trains in a way of establishing routes. The route is a special path composed of relevant turnout and track section and having signal indication and protection. The establishment of an access must check the relationship of signals, switches and track sections and satisfy the respective conditions, and once established must be "locked" to avoid compromising driving safety by damaging the access through mishandling or other factors. Interlocking is to ensure the correct relationship among signals, switches and routes by technical means. The interlocking equipment is the essential core basic equipment for ensuring the normal and safe running of the train and the train at the railway station.
The computer interlocking system realizes interlocking by controlling the relay, and the structure of the typical computer interlocking system comprises a man-machine interaction layer, a main control layer, an execution layer, an interface layer and a field device layer, wherein the main control layer comprises a main logic unit, the execution layer comprises an input board and an output board, the input board and the output board are parts used for driving and acquiring relay contact information of the computer interlocking system, the input board is represented by FIMI, and the output board is represented by FIMO. The input board comprises 32 independent input channels for acquiring the states of a station signal machine, a turnout and a route; the output board comprises 16 independent output channels and is used for driving a relay coil rear action signal machine and a turnout to ensure the driving safety. The detection platform is an important tool for testing whether each function of the input board and the output board meets the operation requirement and ensuring normal operation in the life cycle of the input board and the output board.
The existing product test platform uses a test machine cage and simultaneously adopts an independent condition box and a large number of wires to manufacture a test cable for connection. There are the following problems: 1. the condition box needs manual operation to realize the adjustment and measurement of voltage, and has low timeliness and insufficient accuracy. 2. The upper computer based on the DOS system can not realize automatic test. 3. The measurement result and the test report need to be filled in manually, the requirements of automatic recording and storage cannot be met, and the follow-up and management in the later period are inconvenient.
The specification of chinese patent CN103885439B discloses an automated test platform for FIMI and FIMO single disks, which is connected to a board to be tested, where the board to be tested includes a FIMI single disk and a FIMO single disk, the automated test platform includes a test fixture, a power supply module, an upper computer module and an interface module, the test fixture is connected to the board to be tested, the power supply module and the interface module, and both the power supply module and the upper computer module are connected to the interface module. The invention can not identify the type of the board to be detected and automatically switch to the corresponding mode.
SUMMERY OF THE UTILITY MODEL
The present invention is directed to provide an automatic testing platform for input/output boards of computer interlocking system for overcoming the above-mentioned drawbacks of the prior art.
The purpose of the utility model can be realized through the following technical scheme:
an input/output board automatic detection platform of a computer interlocking system comprises an upper computer and a lower system which are connected with each other, wherein the lower system comprises a switching unit, a protocol conversion unit and a signal conversion unit which are respectively connected with a controller, the controller is connected with the upper computer through the protocol conversion unit, the controller is respectively connected with an input/output interface through the switching unit and the signal conversion unit, the input/output interface is connected with an input board to be detected or an output board to be detected, and the output board to be detected or the input board to be detected is connected with the upper computer through the protocol conversion unit.
The lower system further comprises a power supply unit, and the power supply unit is respectively connected with the controller, the signal conversion unit, the protocol conversion unit and the switching unit.
The signal conversion unit comprises an AD conversion subunit and a DA conversion subunit, the AD conversion subunit converts an analog signal output by the output board to be detected into a digital signal and transmits the digital signal to the controller, and the DA conversion subunit converts the analog signal output by the controller into a digital signal and transmits the digital signal to the input board to be detected.
The AD conversion subunit comprises a voltage stabilizer, an operational amplifier and an AD chip which are sequentially connected, the DA conversion subunit comprises the operational amplifier and a DA chip which are mutually connected, the AD chip is connected with the input board to be detected, and the DA chip is connected with the output board to be detected.
The protocol conversion unit comprises a CAN interface circuit and a 5650 protocol conversion circuit, the controller is connected with the upper computer through the CAN interface circuit, and the input board to be tested or the output board to be tested is connected with the upper computer through the 5650 protocol conversion circuit.
The switching unit comprises an identification circuit and a chip selection relay array circuit which are connected with each other, the identification circuit identifies the type of the board to be tested, and the chip selection relay array circuit realizes the selection of the test channel.
The upper computer carries a Windows operating system.
The platform further comprises a database server, and the database server is connected with the upper computer.
The controller, the switching unit, the protocol conversion unit and the signal conversion unit are integrated in the cage, and the input/output interface is positioned on the cage.
Compared with the prior art, the utility model has the advantages of it is following:
(1) the lower system is controlled by the upper computer and comprises a switching unit controlled by the upper computer, the type of the board to be tested can be identified, the automatic test of the input board to be tested or the output board to be tested is completed, the test efficiency and the test accuracy are improved, and meanwhile, a large number of connecting wires are simplified, so that the detection platform is more reliable and is easy to maintain.
(2) The upper computer based on the Windows system can automatically obtain the measurement result and form a test report.
(3) The database server is connected with the upper computer, can automatically store the test result, is convenient to trace in the future and prepares for future digital informatization.
(4) High integration: all tests on the two single disks can be completed through one output/output interface without respectively manufacturing corresponding matching modules.
(5) Reliability and ease of maintenance: the detection platform adopts a standard integrated cage design, avoids using a large number of wires and test modules, and makes the system more reliable and easier to maintain.
Drawings
Fig. 1 is a schematic structural view of the present invention;
fig. 2 is a circuit diagram of a switching unit of the present invention;
fig. 3 is a circuit diagram of the protocol conversion unit of the present invention.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. The embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation manner and a specific operation process are given, but the scope of the present invention is not limited to the following embodiments.
Examples
As shown in fig. 1, the present embodiment provides an automatic inspection platform for an input/output board of a computer interlocking system, the platform comprising: the system comprises an upper computer and a database server connected with the upper computer, wherein the upper computer is connected with a lower system, the lower system comprises a controller, a switching unit, a signal conversion unit, an input/output interface, a power supply unit and a protocol conversion unit, the signal conversion unit comprises an AD conversion subunit and a DA conversion subunit, and the controller is an MCU controller; as shown in fig. 3, the protocol conversion unit includes a CAN interface circuit and a 5650 protocol conversion circuit, and the input/output interface includes a set of test slots of 64-core test terminals and 32-core communication terminals, which are used as an interface between the input board or the output board to be tested and the test platform. The upper computer is connected with the controller through the protocol conversion unit, the controller is connected with the input/output interface through the switching unit, the AD conversion subunit and the DA conversion subunit, the input/output interface is connected with the input board to be tested or the output board to be tested, and the power supply unit provides power for all units in the platform.
The upper computer provides a graphical human-computer interaction interface based on a Windows operating system, visually presents and controls the whole test process and results, and can automatically generate a test report. The controller comprises an embedded ARM control chip and a supporting circuit, the ARM chip reads instructions of the upper computer through the CAN interface circuit, controls test contents and a test process of the lower system, obtains test data and state information of a tested object and transmits the test data and the state information of the tested object to the upper computer. As shown in fig. 2, the switching unit is composed of an identification circuit and a chip select relay array circuit, when the input board or the output board to be tested is inserted into the test slot and powered on, the identification circuit judges the type of the board to be tested by whether to acquire one-24 VDC and feeding back the VDC to the MCU, if the VDC is acquired, the output board (FIMO), and if not, the input board (FIMI), and the MCU controls the chip select chip to drive the relay to switch to the test environment matched with the board to be tested, so as to realize the matching of the channels and different types of test contents of the input board or the output board to be tested. The AD conversion subunit comprises a voltage stabilizer, an operational amplifier and an AD chip, wherein the AD chip is connected with the output board to be detected, and converts the analog voltage value output by the driving position of the output board to be detected into a digital signal and returns the digital signal to the MCU. The DA conversion subunit comprises an operational amplifier and a DA chip, wherein the DA chip is connected with the input board to be tested, and is controlled by the MCU to convert the 24VDC into a continuous adjustable voltage of 0-12VDC, and the continuous adjustable voltage is used for providing acquisition bit voltage for the input board to be tested. The power supply unit converts 220V alternating voltage into 5V and 24V direct voltage for the MCU, the AD conversion subunit, the DA conversion subunit and the like in the platform and the board to be tested. The CAN interface circuit of the protocol conversion unit is used as a channel for instruction and data transmission between the upper computer and the MCU controller, and the 5650 protocol conversion circuit is used for converting an encryption instruction in the board to be tested so as to enable the encryption instruction to be communicated with the upper computer through a CAN communication protocol. The database server is built in an enterprise intranet, provides access through the Ethernet and is used for storing test data, retrieving test records and the like.
The working principle is as follows: a tester installs a board to be tested in a test slot position of a 64-core test terminal of an input/output board automatic detection platform, a system runs an upper computer test program after being electrified, the tester can calibrate the voltage of an AD conversion subunit and a DA conversion subunit at a login interface and then select to enter an input board or output board test page, and the platform can automatically identify the type of the board to be tested through an identification circuit to prevent error test.
Input board testing: the upper computer sends a collection calling instruction to the 5650 protocol conversion circuit through the CAN interface circuit, and the 5650 protocol conversion circuit sends the converted instruction to the input board to be tested through the test slot position of the 32-core communication terminal. The input board to be tested collects the acquisition state of each channel and the alarm information and returns the acquisition state and the alarm information to the upper computer. Meanwhile, the upper computer sends a voltage regulating instruction (including continuous voltage regulation, fixed voltage or self-definition) to the MCU through the CAN interface circuit, the MCU controls the DA conversion subunit to realize voltage regulation, and the current voltage regulating value is returned to the upper computer through the CAN interface circuit. In addition, the MCU controls the switching unit to realize the selection of the test channel to form a specific input condition (single sampling, full sampling or self-defining). The logic 0 test, the DA conversion subunit is automatically adjusted to 0V from-5V, the upper computer takes the input board to be tested to feed back that 0 is acquired for the last time and no 'error acquisition abnormal' alarm is generated, and the alarm is taken as the boundary 0 voltage; and (3) performing logic 1 test, automatically adjusting the DA conversion subunit from 0V to-10V, and taking the input board to be tested by the upper computer to feed back 1 acquired for the last time without error acquisition and abnormal alarm, wherein the alarm is taken as the boundary 1 voltage. And finally, the upper computer judges whether the test result of each channel meets the requirement according to the preset range.
Testing an output plate: the upper computer sends a driving test instruction to the 5650 protocol conversion circuit through the CAN interface circuit, and the 5650 protocol conversion circuit is responsible for converting the test instruction and sending the test instruction to an output board to be tested (including single drive, full drive, circulation or self-definition) through a test slot position of the 32-core communication terminal. The output board to be tested collects the driving states of all paths and alarm information and transmits the driving states and the alarm information back to the upper computer. Meanwhile, the upper computer sends a voltage acquisition instruction to the MCU controller through the CAN interface circuit, the MCU controls the AD conversion subunit to complete the acquisition of each path of voltage of the output board to be tested, and the switching of the no-load test and the on-load test of the output board is realized through controlling the switching unit. And the upper computer records the no-load voltage and the loaded voltage of each channel, and if the voltage value of a certain channel is less than 20V or the no-load voltage of the certain channel is less than the loaded voltage, the channel is judged to output a fault. In addition, the mixed power test of the output board to be tested is realized under a single-drive instruction, the MCU controls the switching unit to insert one path of 10V direct current into the channel to be tested, and if the output board to be tested returns error reporting information, the mixed power test is passed.
A tester can select custom test or automatic test, if the automatic test is selected, the upper computer sends a compiled test command packet, the MCU receives an instruction and controls the platform to carry out alignment test on each channel drive signal of a tested object, after the test is finished, a test report is automatically generated, data are simultaneously stored in a local database and a server database, and a required test record can be searched by logging in the database server.
The improvement of the embodiment is as follows:
1. by adopting the automatic control flow, the testing efficiency and the testing accuracy are improved, and meanwhile, a large number of connecting wires are simplified, so that the detection platform is more reliable and is easy to maintain.
2. The upper computer is based on a Windows operating system, the operability and the control and management of the test process are more convenient, and meanwhile, the automatic production requirement is met.
3. The test result is specially set up with the server and stored, facilitate tracing and make preparation for future digital informationization in the future.

Claims (9)

1. An input/output board automatic detection platform of a computer interlocking system comprises an upper computer and a lower system which are connected with each other, and is characterized in that the lower system comprises a switching unit, a protocol conversion unit and a signal conversion unit which are respectively connected with a controller, the controller is connected with the upper computer through the protocol conversion unit, the controller is respectively connected with an input/output interface through the switching unit and the signal conversion unit, the input/output interface is connected with an input board to be detected or an output board to be detected, the input board to be detected or the output board to be detected is connected with the upper computer through the protocol conversion unit, and the switching unit identifies the type of the board to be detected and selects the test contents of different types of boards.
2. The platform of claim 1, wherein the lower system further comprises a power supply unit, and the power supply unit is connected to the controller, the signal conversion unit, the protocol conversion unit, and the switching unit.
3. The platform as claimed in claim 1, wherein the signal conversion unit comprises an AD conversion subunit and a DA conversion subunit, the AD conversion subunit converts the analog signal outputted from the output board to be tested into a digital signal and transmits the digital signal to the input board to be tested, and the DA conversion subunit converts the analog signal outputted from the controller into a digital signal and transmits the digital signal to the input board to be tested.
4. The platform of claim 3, wherein the AD conversion subunit comprises a voltage stabilizer, an operational amplifier and an AD chip connected in sequence, the DA conversion subunit comprises an operational amplifier and a DA chip connected with each other, the AD chip is connected with the input board to be tested, and the DA chip is connected with the output board to be tested.
5. The platform of claim 1, wherein the protocol conversion unit includes a CAN interface circuit and a 5650 protocol conversion circuit, the controller is connected to the host computer through the CAN interface circuit, and the input board or the output board to be tested is connected to the host computer through the 5650 protocol conversion circuit.
6. The automated testing platform for the input/output boards of the computer interlocking system as claimed in claim 1, wherein the switching unit comprises an identification circuit and a chip select relay array circuit which are connected with each other, the identification circuit identifies the type of the board to be tested, and the chip select relay array circuit realizes the selection of the testing channel.
7. The automated inspection platform for I/O boards of a computer interlocking system as claimed in claim 1, wherein the upper computer carries Windows operating system.
8. The I/O board automation detection platform of the computer interlocking system as claimed in claim 1, further comprising a database server, wherein the database server is connected with the upper computer.
9. The I/O board automation detection platform of the computer interlocking system as claimed in claim 1, wherein the controller, the switching unit, the protocol conversion unit and the signal conversion unit are integrated inside the cage, and the I/O interface is located on the cage.
CN201921402306.4U 2019-08-27 2019-08-27 Automatic detection platform for input/output board of computer interlocking system Active CN210402096U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557875A (en) * 2020-12-08 2021-03-26 苏州英嘉通半导体有限公司 Test development method and device for selecting through AD conversion result

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557875A (en) * 2020-12-08 2021-03-26 苏州英嘉通半导体有限公司 Test development method and device for selecting through AD conversion result
CN112557875B (en) * 2020-12-08 2023-02-17 苏州英嘉通半导体有限公司 Test development method and device for selecting through AD conversion result

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