CN209821348U - A semiconductor performance testing equipment with high oxygen barrier - Google Patents

Abstract

The invention relates to a semiconductor performance testing equipment with high oxygen barrier, which relates to the technical field of testing equipment. A semiconductor performance testing device with high oxygen barrier, which includes a box body, a circuit board, a semiconductor placement tank, a temperature sensor, a magnetic system, a temperature control system, a control box, a multimeter, a display screen, control buttons, connecting wires, semiconductor devices, Test the circuit, power supply, set the circuit board inside the box, the circuit board is equipped with a semiconductor placement slot, the semiconductor placement slot is fixedly connected to the temperature sensor, the temperature control system is set on the right side of the magnetic system, the box and the control box are connected by a connecting line , the control box is provided with a control button on the right side of the multimeter display screen, the semiconductor device is electrically connected to the test circuit, and the test circuit is electrically connected to the power supply. After adopting the above technical solution, the beneficial effects of the utility model are: its structural design is reasonable, it can carry out various performance tests, it is easy to use, it can meet the requirements of manufacturers for testing equipment, and it is suitable for popularization and use.

Description

A semiconductor performance testing equipment with high oxygen barrier

technical field

The utility model relates to the technical field of testing, in particular to semiconductor performance testing equipment with high oxygen barrier.

Background technique

Semiconductor refers to a material whose conductivity at room temperature is between that of a conductor and an insulator. Semiconductors have a wide range of applications in radios, televisions, and temperature measurement. For example, a diode is a device made of a semiconductor. A semiconductor is a material whose electrical conductivity can be controlled, ranging from an insulator to a conductor. No matter from the perspective of technology or economic development, the importance of semiconductors is enormous. With the innovation of science, semiconductor materials have been greatly developed, circuit boards and semiconductor devices have also been continuously developed and improved, and products with better performance are constantly appearing in circuit boards and semiconductor devices. Of course, the development of circuit boards and semiconductor devices has also put forward higher requirements for the quality and process of semiconductor materials, and the performance test of semiconductor materials is an indispensable key step. However, at present, the functions of semiconductor performance testing on the market are relatively single, and various characteristic tests cannot be performed. It is inconvenient to use, cannot meet the needs of manufacturers, and is not suitable for popularization and use.

Utility model content

The purpose of this utility model is to aim at the defects and deficiencies of the prior art, and provide a kind of 1. The setting of the temperature sensor is convenient for the staff to grasp the height of the temperature, which is conducive to the carrying out of the test and ensures the accuracy of the test; 2. Voltage display, current display The settings of the display and the display are convenient for the staff to grasp and record the test data; 3. The settings of the magnetic system and the temperature control system enable the equipment to perform various performance tests. Generally speaking, its structural design is reasonable, it can carry out various performance tests, it is easy to use, it can meet the requirements of manufacturers for testing equipment, and it is suitable for popularization and use.

In order to achieve the above object, the utility model adopts the following technical solutions: it includes a casing 1, a circuit board 11, a semiconductor placement groove 111, a temperature sensor 1111, a magnetic system 12, a temperature control system 13, a control box 2, a multimeter 21, Display screen 22, control buttons 23, connection wire 3, semiconductor device 4, test circuit 5, power supply 51, circuit board 11 is arranged inside the box body 1, semiconductor placement groove 111 is arranged on the circuit board 11, and semiconductor placement groove 111 is fixedly connected inside The temperature sensor 1111, the magnetic system 12 is set under the semiconductor placement tank 111, the temperature control system 13 is set on the right side of the magnetic system 12, the control box 2 is set on the right side of the box body 1, and the box body 1 and the control box 2 are connected through the connecting line 3 connection, the control box 2 is provided with a multimeter 21, a display screen 22 is provided below the multimeter 21, and a control button 23 is provided on the right side of the display screen 22, the semiconductor device 4 is electrically connected to the test circuit 5, and the test circuit 5 is electrically connected to the power supply 51 .

The box 1 is a high oxygen barrier box.

An insulating base 14 is arranged below the magnetic system 12 and the temperature control system 13 .

The surface of the multimeter 21 is provided with a voltage display 211 and a current display 212 , and the voltage display 211 is arranged on the left side of the current display 212 .

A control switch 24 is arranged below the control button 23 .

Both the box body 1 and the control box 2 are arranged on the bracket 6 .

The working principle of the utility model: the semiconductor device to be tested is placed in the semiconductor placement tank, the temperature sensor detects the temperature of the semiconductor device in real time, and the detected data is displayed on the display screen of the control box, when the semiconductor device needs to be tested under the change of the magnetic field When it is necessary to detect the characteristics of semiconductor devices under temperature changes, it is realized by controlling the magnetic system. When it is necessary to detect the characteristics of semiconductor devices under temperature changes, it is realized by changing the temperature control system.

After adopting the above technical scheme, the beneficial effects of the utility model are: 1. The setting of the temperature sensor is convenient for the staff to grasp the height of the temperature, which is beneficial to the test and ensures the accuracy of the test; 2. The setting of the voltage display, current display and display screen It is convenient for the staff to grasp and record the test data; 3. The settings of the magnetic system and temperature control system enable the equipment to perform various performance tests. Generally speaking, its structural design is reasonable, it can carry out various performance tests, it is easy to use, it can meet the requirements of manufacturers for testing equipment, and it is suitable for popularization and use.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are only some embodiments of the utility model, and those skilled in the art can also obtain other drawings according to these drawings without any creative effort.

Fig. 1 is a structural representation of the utility model;

Fig. 2 is an enlarged view corresponding to part A of Fig. 1;

Fig. 3 is a working principle block diagram of the utility model.

Explanation of reference numerals: box body 1, circuit board 11, semiconductor placement slot 111, temperature sensor 1111, magnetic system 12, temperature control system 13, insulating base 14, control box 2, multimeter 21, voltage display 211, current display 212 , a display screen 22 , a manipulation button 23 , a control switch 24 , a connecting wire 3 , a semiconductor device 4 , a test circuit 5 , a power supply 51 , and a bracket 6 .

Detailed ways

Referring to Fig. 1-shown in Fig. 3, the technical scheme adopted in this specific embodiment is: it is made up of casing 1, circuit board 11, semiconductor placement groove 111, temperature sensor 1111, magnetic system 12, temperature control system 13, control box 2. Multimeter 21, display screen 22, control button 23, connecting wire 3, semiconductor device 4, test circuit 5, and power supply 51 are composed. The circuit board 11 for testing is installed inside the box body 1, and the circuit board 11 is provided with a semiconductor placement slot 111. A temperature sensor 1111 is installed inside the semiconductor 111. The setting of the temperature sensor 1111 is convenient for the staff to control the temperature, which is conducive to the test and ensures the accuracy of the test. The magnetic system 12 and the temperature control system 13 are installed under the semiconductor placement slot 111 , the magnetic system 12 is located on the left side of the temperature control system 13, the magnetic system 12 and the temperature control system 13 can be set to test the characteristics of the semiconductor when the temperature changes and the magnetic field changes, and an optical detection system can also be installed inside the box 1 And the electrical system, the control box 2 is installed on the right side of the box body 1, the multimeter 21 is installed in the control box 2, the display screen 22 is installed below the multimeter 21, and the raised control button 23 is installed on the right side of the display screen 22, the control box 2 and the box body 1 The semiconductor to be tested is placed inside the semiconductor placement groove 111, the magnetic system 12 is electrically connected to the semiconductor device 4, the temperature control system 13 is also electrically connected to the semiconductor device 4, and the output terminal of the semiconductor device 4 It is electrically connected to the input end of the test circuit 5 , the output end of the power supply 51 is electrically connected to the input end of the test circuit 5 , and the test circuit 5 is electrically connected to the multimeter 21 .

The box 1 is a box with high oxygen barrier.

The magnetic system 12 and the temperature control system 13 are fixedly connected above the insulating base 14 .

The multimeter 21 is inlaid with a voltage display 211 and a current display 212 , and the voltage display 211 is installed on the left side of the current display 212 . The tested voltage data is displayed on the voltage display 211, and the tested current data is displayed on the current display 212, which is convenient for the staff to grasp and record the data.

A control switch 24 is installed below the control button 23 .

The lower surfaces of the box body 1 and the control box 2 are fixedly connected to the upper surface of the bracket 6 .

The working principle of the utility model: the semiconductor device to be tested is placed in the semiconductor placement tank, the temperature sensor detects the temperature of the semiconductor device in real time, and the detected data is displayed on the display screen of the control box, when the semiconductor device needs to be tested under the change of the magnetic field When it is necessary to detect the characteristics of semiconductor devices under temperature changes, it is realized by controlling the magnetic system. When it is necessary to detect the characteristics of semiconductor devices under temperature changes, it is realized by changing the temperature control system.

After adopting the above technical scheme, the beneficial effects of the utility model are: 1. The setting of the temperature sensor is convenient for the staff to grasp the height of the temperature, which is beneficial to the test and ensures the accuracy of the test; 2. The setting of the voltage display, current display and display screen It is convenient for the staff to grasp and record the test data; 3. The settings of the magnetic system and temperature control system enable the equipment to perform various performance tests. Generally speaking, its structural design is reasonable, it can carry out various performance tests, it is easy to use, it can meet the requirements of manufacturers for testing equipment, and it is suitable for popularization and use.

The above is only used to illustrate the technical solution of the utility model without limitation, other modifications or equivalent replacements made by those skilled in the art to the technical solution of the utility model, as long as they do not depart from the spirit and scope of the technical solution of the utility model , should be covered in the scope of the claims of the present utility model.

Claims (6)

1. A semiconductor performance test equipment with high oxygen isolation is characterized in that: the device comprises a box body (1), a circuit board (11), a semiconductor placing groove (111), a temperature sensor (1111), a magnetic system (12), a temperature control system (13), a control box (2), a universal meter (21), a display screen (22), an operating button (23), a connecting wire (3), a semiconductor device (4), a test circuit (5) and a power supply (51), wherein the circuit board (11) is arranged in the box body (1), the semiconductor placing groove (111) is arranged on the circuit board (11), the temperature sensor (1111) is fixedly connected in the semiconductor placing groove (111), the magnetic system (12) is arranged below the semiconductor placing groove (111), the temperature control system (13) is arranged on the right side of the magnetic system (12), the control box (2) is arranged on the right side of the box body (1), the box body (1) is connected with the control box (2) through the connecting wire (3), the universal meter (21) is arranged in the, multimeter (21) below sets up display screen (22), and display screen (22) right side is equipped with control button (23), semiconductor device (4) and test circuit (5) electric connection, test circuit (5) and power (51) electric connection.

2. The high oxygen barrier semiconductor performance test apparatus of claim 1, wherein: the box body (1) is a high oxygen isolation box body.

3. The high oxygen barrier semiconductor performance test apparatus of claim 1, wherein: an insulating base (14) is arranged below the magnetic system (12) and the temperature control system (13).

4. The high oxygen barrier semiconductor performance test apparatus of claim 1, wherein: the surface of the multimeter (21) is provided with a voltage display (211) and a current display (212), and the voltage display (211) is arranged on the left side of the current display (212).

5. The high oxygen barrier semiconductor performance test apparatus of claim 1, wherein: a control switch (24) is arranged below the control button (23).

6. The high oxygen barrier semiconductor performance test apparatus of claim 1, wherein: the box body (1) and the control box (2) are both arranged on the bracket (6).