CN208999529U - Imbrication photovoltaic module cell slice test device - Google Patents

Abstract

The disclosure belongs to photovoltaic module testing field, and in particular to a kind of imbrication photovoltaic module cell slice test device.The device includes: the first test department, including hollow structure, hollow structure first end is equipped with multiple first and adjusts component, and it is equipped with the opposite second end of the first end and adjusts component corresponding second with each first and adjust component, and be connected with test lead between corresponding a pair of first adjusting component and the second adjusting component；Second test department, surface are equipped with multiple support columns of array arrangement to carry imbrication photovoltaic module cell piece to be measured, and lateral every row support column is corresponding with test lead position in multiple support columns of array arrangement.The case where disclosure can reduce the positive shielded area of cell piece, improve the accuracy of test data, make cell piece stress relative equilibrium, avoid the occurrence of crack or fragment realizes the validity test to asymmetric imbrication cell piece.

Description

Imbrication photovoltaic module cell slice test device

Technical field

This disclosure relates to technical field of photovoltaic module test more particularly to a kind of imbrication photovoltaic module cell slice test dress It sets.

Background technique

Welding such as busbar connection structure is used between conventional photovoltaic component cell piece, and the use of a large amount of busbars increases Loss inside photovoltaic module, and all there are certain interval spaces between string and string cell piece and piece, battery, from monoblock unit From the point of view of the space it is larger and power generation can not be played the role of, these combined factors lead to the photoelectric conversion effect for reducing photovoltaic module Rate.

Imbrication photovoltaic module be it is a kind of photovoltaic cell is cut into multi-disc after, welded with similar conducting resinl special material The photovoltaic component apparatus of bunchiness assembling, the cell piece after being cut through due to every can overlap in assembling, with area feelings Condition lower component can be laid with more cell pieces, therefore greatly reduce non-effective space, increase effective extinction area, while also dropping The low loss of component internal, to improve the photoelectric conversion efficiency of monolith photovoltaic module.

The mechanism for testing of conventional photovoltaic component cell piece is the measuring technology using upper and lower probe at present, and inventor studies It was found that the measuring technology is not particularly suited for the test of imbrication photovoltaic module cell piece, it is therefore necessary to propose a kind of suitable imbrication light Lie prostrate the device of component cell slice test.

Utility model content

The disclosure is designed to provide a kind of imbrication photovoltaic module cell slice test device, and then at least to a certain degree On overcome the problems, such as caused by the limitation and defect due to the relevant technologies one or more.

The embodiment of the present disclosure provides a kind of imbrication photovoltaic module cell slice test device, which includes:

First test department, including hollow structure, the first end of the hollow structure are equipped with multiple first and adjust components, with this The opposite second end in one end, which is equipped with, adjusts component with each first adjusting component corresponding second, and described in corresponding a pair Test lead is connected between first adjusting component and the second adjusting component；

Second test department, surface are equipped with multiple support columns of array arrangement, to carry imbrication photovoltaic module electricity to be measured Pond piece；Wherein, laterally every row support column is corresponding with a test lead position in multiple support columns of array arrangement, this second Test department can be moved closely to the first test lower surface, so that each test lead electrical contact is described to be measured folded Watt positive grid line of photovoltaic module cell piece.

In embodiment of the disclosure, it is each it is described first adjusting component include set on the first end the first adjusting block and The first elastic component being connect with first adjusting block；

Each second adjusting component includes connecting set on the second adjusting block of the second end and with second adjusting block The second elastic component connect；Each test lead is connected between corresponding first elastic component and the second elastic component.

In embodiment of the disclosure, first elastic component and the second elastic component are spring.

In embodiment of the disclosure, the multiple support column is copper post, and the upper surface of each copper post and described second Difference in height between test department surface is 1~10 micron.

In embodiment of the disclosure, at least partly copper post is electrically connected the imbrication photovoltaic module to be measured in multiple copper posts The grid line at the cell piece back side.

In embodiment of the disclosure, one or more of second test department, the first adjusting block and second adjusting block It is made of plastic material；First test department is made of cast aluminium material.

In embodiment of the disclosure, second test department surface is equipped with the adsorption hole of perforation；And/or second survey Examination portion surface is equipped at least two parallel belt grooves.

In embodiment of the disclosure, the second test department surface bulge forms arc structure, the rise of the arc structure For 2~3mm.

In embodiment of the disclosure, the test lead is copper wire or gold thread, and the diameter of copper wire is 0.4~0.6mm.

In embodiment of the disclosure, the copper wire includes voltage copper wire and electric current copper wire, and at least partly corresponding described Voltage copper wire and electric current copper wire are connected simultaneously between one adjusting component and the second adjusting component, and laterally every row support column and electricity Press copper wire and electric current copper wire position corresponding.

The technical scheme provided by this disclosed embodiment can include the following benefits:

Imbrication photovoltaic module cell slice test device in the embodiment of the present disclosure includes removable the closely contacted up and down One test department and the second test department, and the first test department includes hollow structure, is equipped between the opposite both ends of the hollow structure more To component is adjusted, corresponding a pair of adjust is connected with test lead between component；And the array arrangement on the second test department surface Laterally every row support column is corresponding with a test lead position in multiple support columns.In this way, when second test department is moved When closely testing lower surface to described first, each test lead electrical contact imbrication photovoltaic module electricity to be measured can be made The positive grid line of pond piece, test lead can accordingly test the cell piece after connecting corresponding test equipment, the present embodiment Middle but test lead to be used to test by the way of being different from the test of existing probe, and cell piece is located at the hollow structure Lower section, to greatly reduce the positive shielded area of cell piece, and then when improving cell slice test test data accuracy； In addition, the second test department surface is equipped with multiple support columns of array arrangement, and laterally every row support column and a test lead Position is corresponding, can make cell piece stress relative equilibrium always using test lead and support column form, avoid the occurrence of crack or broken The case where piece, and for two-sided asymmetric imbrication cell piece, it is ensured that the contraposition accuracy of cell piece front and back, it is ensured that survey Examination conducting wire can well be tested with cell piece front face, and adjustment operation is also more convenient.

Detailed description of the invention

Fig. 1 shows imbrication photovoltaic module cell slice test schematic device in the embodiment of the present disclosure；

Fig. 2 shows the schematic top plan views of the first test department of the embodiment of the present disclosure；

The positional relationship that Fig. 3 shows each test lead and the support intercolumniation on the second test department in the embodiment of the present disclosure is shown It is intended to；

Fig. 4 shows the second test department schematic top plan view in disclosure exemplary embodiment；

Fig. 5 shows imbrication photovoltaic module cell slice test device stereoscopic schematic diagram in the embodiment of the present disclosure.

Specific embodiment

Example embodiment is described more fully with reference to the drawings.However, example embodiment can be with a variety of shapes Formula is implemented, and is not understood as limited to example set forth herein；On the contrary, thesing embodiments are provided so that the disclosure will more Fully and completely, and by the design of example embodiment comprehensively it is communicated to those skilled in the art.Described feature, knot Structure or characteristic can be incorporated in any suitable manner in one or more embodiments.

In addition, attached drawing is only the schematic illustrations of the disclosure, it is not necessarily drawn to scale.Identical attached drawing mark in figure Note indicates same or similar part, thus will omit repetition thereof.Some block diagrams shown in the drawings are function Energy entity, not necessarily must be corresponding with physically or logically independent entity.

The mechanism for testing of conventional photovoltaic component cell piece is the measuring technology using upper and lower probe, and for for example asymmetric Imbrication cell piece, there are several big difficult points in when test, and it is asymmetric that a problem, which is the front of cell piece, back side main grid, uses Probe not can guarantee the aligning accuracy of the back side main grid of cell piece, not can guarantee the accuracy of test, if in addition using probe Mechanism, it is difficult to which the stress balance for guaranteeing imbrication cell piece leads to crack or fragment occur, while with imbrication cell piece main grid Increase, the quantity of probe row also will increase, and so positive shading-area of cell piece can also accordingly increase, to test data Accuracy has a significant impact.

In order to solve the problems, such as it is above-mentioned at least one or more, a kind of imbrication photovoltaic module is provided in this example embodiment Cell slice test device, with reference to shown in Fig. 1~2, the apparatus may include the first test departments 100 and the second test department 200；Its In, first test department 100 includes hollow structure 110, and the first end 101 of the hollow structure 110 is equipped with multiple first and adjusts Component, and be equipped with the opposite second end 102 of the first end 101 and adjust the corresponding second adjusting group of component with each described first Part, and test lead 107 is connected between corresponding a pair first adjusting component and the second adjusting component.In an example In, first test department 100 can be made of cast aluminium material, and first test department 100 may include such as four frames The hollow structure 110 surrounded, is certainly not limited to this.

Specifically, in embodiment of the disclosure, each first adjusting component includes being set to the first end 101 First adjusting block 103 and the first elastic component 105 being connect with first adjusting block 103.Each described second, which adjusts component, includes The second adjusting block 104 set on the second end 102 and the second elastic component 106 for being connect with second adjusting block 104；Each institute Test lead 107 is stated to be connected between corresponding first elastic component 105 and the second elastic component 106.It is described in the present embodiment The cross section of first adjusting block 103 and the second adjusting block 104 is rectangle, naturally it is also possible to be other shapes such as circle etc..It is described First elastic component 105 and the second elastic component 106 are spring or rubber parts.As known, the test lead 107 and the first bullet Property 106 junction insulation processing of part 105 and the second elastic component, such as setting insulation material layer or the first elastic component 105 and the Two elastic components 106, which are adopted, to be made from an insulative material.When actual test, 107 both ends of test lead are connected to phase by conducting wire The test equipment (not shown) answered, these can refer to existing mature technology.

Illustratively, a first end 101 such as frame can be equipped with threaded hole, and a screw thread is attached across the screw thread Kong Houyu first adjusting block 103 connects (not shown), so that first adjusting block 103 is connected to the first end 101, it is similar , second adjusting block 104 is connected to the second end 102.Certainly in other embodiments, 103 He of the first adjusting block Second adjusting block 104 can also be integrally formed with the first end 101 and second end 102 of first test department 100.Described first The threaded hole of lateral direction penetrating can also be equipped on adjusting block 103, a screw 300 passes through the threaded hole on first adjusting block 103 It is connect afterwards with the first elastic component 105, the connection of second elastic component 106 and second adjusting block 104 is identical as which Or it is similar.Pass through 300 adjustable first elasticity of screw being threadedly coupled on the first adjusting block 103 or the second adjusting block 104 The distance between part 105 and the second elastic component 106, and then realize and the elasticity of the test lead 107 is adjusted, to guarantee to survey Contact of the test lead 107 with cell piece is good when examination.In one embodiment, each first adjusting block 103 and second One or more of adjusting block 104 is made of plastic material, is certainly not limited to this, and material requirements is wear-resisting, is unlikely to deform, and adds Work performance is good.First adjusting block 103 described in the present embodiment and the second adjusting block 104 are arranged in pairs, and logarithm is can be with It is determined according to the main grid quantity of cell piece, specifically can freely be adjusted according to imbrication cell piece main grid figure.

In some embodiments of the present disclosure, the test lead 107 be copper wire or gold thread, and the diameter of copper wire be 0.4~ 0.6mm.Copper wire is used in this implementation, and the diameter of the copper wire is 0.4~0.6mm, first is that cost can be saved compared to gold thread, separately Outside, the diameter that copper wire is arranged is 0.4~0.6mm, is tested when can guarantee adjustment test lead, that is, copper wire rate of tension, both can be with Tensioning copper wire is unlikely to break copper wire easily when stretching again, to guarantee follow-up test effect.

Further, in embodiment of the disclosure, it may include voltage copper wire and electricity that the test lead 107, which is copper wire, Copper wire is flowed, connection simultaneously is respectively used to voltage survey between at least partly corresponding first adjusting component and the second adjusting component The voltage copper wire and electric current copper wire of examination and testing current, and laterally every row support column and the voltage copper wire and electric current copper wire position pair It answers.Refering to what is shown in Fig. 3, for imbrication cell piece front, back side main grid asymmetric problem, electric current copper wire, voltage copper in this example Line arranges one by one according to sequence shown in Fig. 3, and in conjunction with shown in Fig. 1~3, laterally the first of apical position is adjusted up and down shown in Fig. 3 Only connect a copper wire between component and the second adjusting component, middle section all first adjust component and second adjust component it Between be all connected with two copper wire, i.e., wherein one is electric current copper wire and another is voltage copper wire, according to the difference of cell piece come Adjustment setting.Electric current copper wire is contacted with the thin grid in imbrication cell piece front, and with main grid 1~2mm of distance, electric current copper wire is not when adjustment It can directly bear against on imbrication cell piece main grid.

Second test department 200, surface is equipped with multiple support columns 201 of array arrangement, to carry imbrication to be measured Photovoltaic module cell piece (not shown), full wafer cell piece substantially completely covers 200 surface of the second test department in the present embodiment.Its In, laterally every row support column is corresponding with 107 position of test lead in multiple support columns 201 of array arrangement, this second Test department 200 can be moved closely to 100 lower surface of the first test department, so that each test lead 107 is in electrical contact The positive grid line (not shown) of imbrication photovoltaic module cell piece to be measured.

Specifically, in embodiment of the disclosure, second test department 200 is supported by plastic material, and cross section can To be rectangle, it is certainly not limited to this.Illustratively, the multiple support column is copper post 201, is certainly not limited to this, is made It can guarantee the accuracy of test result with copper post 201.The upper surface of each copper post 201 and 200 surface of the second test department Between difference in height be 1~10 micron, keep small in this way height that can utmostly reduce the force unbalance of cell piece, keep away Exempt from the appearance of fragment or crack；At least partly copper post electrical connection imbrication photovoltaic module to be measured is electric in multiple copper posts 201 The grid line at the pond piece back side, to be applicable in different testing requirements.In the present embodiment, 201 diameter dimension of copper post requires to guarantee that first surveys Test lead 107 in examination portion 100 such as copper wire combination is mobile push after completely with corresponding a line copper on the second test department 200 201 position of column coincide, there is not allowed that copper wire pushes except the range for extruding copper post 201, to guarantee the accuracy of test contraposition.Battle array The quantity for arranging the every row copper post of transverse direction of the copper post 201 of arrangement can be set as odd number, and the copper post 201 of array arrangement can be divided into electricity Copper post and voltage copper post are flowed, the electric current copper post is one or more more than voltage copper post, with no restriction to this, can be used for surveying Try asymmetric imbrication cell piece, symmetrical imbrication cell piece or conventional batteries piece etc..The line number of multirow copper post 201 can be according to folded Watt cell piece main grid quantity determines.Wherein, when carrying out testing current, electric current copper post is electrically connected the phase at the imbrication cell piece to be measured back side When answering grid line, and voltage copper post is only played a supporting role, and carrying out voltage tester, voltage copper post electrical connection such as conducting wire connects to be measured The corresponding grid line at the imbrication cell piece back side, and electric current copper post is only played a supporting role, it specifically can be true according to cell piece grid line structure It is fixed.

In order to guarantee such as copper wire of test lead 107 with cell piece is positive well contacts, it is described in embodiment of the disclosure Second test department, 200 surface bulge forms arc structure (not shown), and the rise of the arc structure is 2~3mm, wherein rise table Show the arcuate midway point of arc structure to the distance of string.Forming one on 200 surface of the second test department so small slightly has The surface of radian, when the copper wire on the first test department 100 is mobile push after can coincide the radian and well connect with cell piece front Touching.

In embodiment of the disclosure, in conjunction with shown in Fig. 4~5,200 surface of the second test department is also provided with perforation Adsorption hole 202 is described to cooperate vacuum suction apparatus (not shown) vacuumizing and adsorbing cell piece in 200 surface of the second test department Second test department, 200 surface can be equipped at least two parallel belt grooves 203, and the groove widths of the belt grooves 203 can be according to matching Close the confirmation of board transmission belt size.It can refer to existing mature technology about vacuum suction apparatus and belt transmission mechanism etc., this Place repeats no more.

In the present embodiment, when test, the first test department 100 and the second test department 200 can be manually moved, it can also be with It is automation control mode, i.e., by mobile first test department 100 of control driving mechanisms control and the second test department 200, automatically Full wafer imbrication cell piece can be passed in transmission mechanism by transmission belt in change mode, the second test department 200 of control rises, on Start to adsorb imbrication cell piece by adsorption hole when being raised to certain position, the first test department 100 is mobile after absorption pushes until surveying Examination conducting wire 107 such as copper wire is depressed into stopping when elastic component generates certain deflection after cell piece, and then test macro carries out cell piece Corresponding test such as voltage or testing current, specific test process can refer to the prior art, details are not described herein again.

In the present embodiment by the way of being different from the test of existing probe, providing the new test device of one kind may be implemented to fold The test of watt for example asymmetric imbrication cell piece of cell piece.The test device substitutes probe using test lead such as copper wire, using survey Conducting wire test is tried, and cell piece is located at below the hollow structure, so that the positive shielded area of cell piece is greatly reduced, into And when improving cell slice test test data accuracy, increasing for subsequent imbrication cell piece main grid substantially will not be to cell piece Shading impacts；In addition, the second test department surface is equipped with multiple support columns of array arrangement, and laterally every row support column and one The test lead position is corresponding, and can making cell piece using test lead and support column such as copper post form, stress is relatively flat always The case where weighing, avoiding the occurrence of crack or fragment, and for two-sided asymmetric imbrication cell piece, it is ensured that cell piece front and back Contraposition accuracy, it is ensured that test lead can well be tested with cell piece front face, adjustment operation it is also very convenient.

The test device provided in this embodiment can solve the test problem of asymmetric imbrication cell piece, and shielded area is basic It not will increase, cell piece stress balance, adverse effect will not be generated to cell slice test substantially, and can be in the survey for guaranteeing cell piece The test for realizing asymmetric imbrication cell piece when examination in the case where contact performance also can be applied to more main grid cell pieces and routine The test of cell piece.

It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that There is also other identical elements in process, method, article or equipment including the element.

In short, those skilled in the art after considering the specification and implementing the invention disclosed here, will readily occur to this public affairs The other embodiments opened.This application is intended to cover any variations, uses, or adaptations of the disclosure, these modifications, Purposes or adaptive change follow the general principles of this disclosure and including the undocumented public affairs in the art of the disclosure Know common sense or conventional techniques.The description and examples are only to be considered as illustrative, the true scope and spirit of the disclosure by The attached claims are pointed out.

Claims (10)

1. a kind of imbrication photovoltaic module cell slice test device, which is characterized in that the device includes:

First test department, including hollow structure, the first end of the hollow structure is equipped with multiple first and adjusts component, with the first end Opposite second end, which is equipped with, adjusts component, and corresponding a pair described first with each first adjusting component corresponding second It adjusts and is connected with test lead between component and the second adjusting component；

Second test department, surface is equipped with multiple support columns of array arrangement, to carry imbrication photovoltaic module cell piece to be measured； Wherein, laterally every row support column is corresponding with a test lead position in multiple support columns of array arrangement, second test Portion can be moved closely to the first test lower surface, so that each test lead is in electrical contact the imbrication light to be measured Lie prostrate the positive grid line of component cell piece.

2. test device according to claim 1, which is characterized in that each described first to adjust component include being set to described the First adjusting block of one end and the first elastic component being connect with first adjusting block；

Each second adjusting component includes being set to the second adjusting block of the second end and connecting with second adjusting block Second elastic component；Each test lead is connected between corresponding first elastic component and the second elastic component.

3. test device according to claim 2, which is characterized in that first elastic component and the second elastic component are spring.

4. test device according to claim 2, which is characterized in that the multiple support column is copper post, and each copper post Upper surface and second test department surface between difference in height be 1~10 micron.

5. test device according to claim 4, which is characterized in that at least partly copper post is electrically connected institute in multiple copper posts State the grid line at the imbrication photovoltaic module cell piece back side to be measured.

6. the test device according to one of claim 2~5, which is characterized in that second test department, the first adjusting block and One or more of second adjusting block is made of plastic material；First test department is made of cast aluminium material.

7. test device according to claim 6, which is characterized in that second test department surface is equipped with the absorption of perforation Hole；And/or second test department surface is equipped at least two parallel belt grooves.

8. test device according to claim 6, which is characterized in that the second test department surface bulge forms circular arc knot Structure, the rise of the arc structure are 2~3mm.

9. test device according to claim 6, which is characterized in that the test lead is copper wire or gold thread, and copper wire Diameter is 0.4~0.6mm.

10. test device according to claim 9, which is characterized in that the copper wire includes voltage copper wire and electric current copper wire, until Voltage copper wire and electric current copper wire are connected simultaneously between the corresponding first adjusting component of small part and the second adjusting component, and horizontal It is corresponding with the voltage copper wire and electric current copper wire position to every row support column.