CN208743085U - A kind of automatic testing classification system of semiconductor laser - Google Patents
A kind of automatic testing classification system of semiconductor laser Download PDFInfo
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- CN208743085U CN208743085U CN201821373833.2U CN201821373833U CN208743085U CN 208743085 U CN208743085 U CN 208743085U CN 201821373833 U CN201821373833 U CN 201821373833U CN 208743085 U CN208743085 U CN 208743085U
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- splicing
- feeding
- test
- suction nozzle
- semiconductor laser
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Abstract
The utility model relates to a kind of automatic testing classification systems of semiconductor laser.The automatic testing classification system of semiconductor laser described in the utility model, including feed system, test turntable, categorizing system and slide laterally arm, operation workflow is that semiconductor laser to be measured is first placed on feed system to await orders, semiconductor laser to be measured is sequentially moved to test turntable again to test, to ensure that the function of semiconductor laser can normally operate, semiconductor laser to be measured is completed after test, again it be placed by classification in categorizing system according to the good product hierarchy of default, so as to the progress of the next step.
Description
Technical field
The utility model relates to a kind of automatic testing classification systems of semiconductor laser, belong to semiconductor laser test
The technical field of sorter.
Background technique
After decades of development, semiconductor laser increasingly obtains known to society, and in many places field
To application, the photoelectric conversion efficiency of semiconductor laser is in 60% or more, significantly larger than the photoelectric conversion effect of other similar products
The advantages that rate, low energy consumption, and heat accumulation is few in device, the service life is long, collimation is good, illumination distances are remote is made in the similar industry of society
It is more and more extensive for a kind of emerging technical application.All kinds of advantages possessed by semiconductor laser determine its it is higher and higher by
The extensive attention of various circles of society.
Semiconductor laser needs to form and come into operation by multiple production processes, semiconductor laser envelope
It installs into later, in order to ensure relevant issues such as quality, rate, stability and the compatibility of semiconductor laser when in use,
It is both needed to execute detection operation usually to eliminate defective products semiconductor laser, and classifies to the semiconductor laser after test
Processing.
At present in field of semiconductor lasers, the test item of semiconductor laser be primarily to see product be powered after power with
And the wavelength case of spectrum.The test of semiconductor laser at present is mainly manually carried out with classification, manually will be partly
Conductor laser is attached on special socket, and then power-up is tested manually, is judged by the test result on display screen
The product that test is completed is put into different product boxes by the good degree of semiconductor laser out according to good degree, thus
Realize the purpose of classification.The mode efficiency of this manual test is too low, and the wavelength of product and power need separately test,
The quality for judging product is mainly observed by the naked eye in test process, inevitably will appear deviation, while manual test is inevitable
Product is polluted, product quality is influenced.
Chinese document CN206514762U discloses a kind of line automatic test machine, which makes
Used time, artificial loading, after testing automatically, automatic blanking, this equipment can be extended to the automatic connection with preceding station, complete
Automatic loading/unloading, the function of testing automatically reduce production cost, improve the test yield of product.But this patent disclosure
Automatic test machine is mainly the automatic connecting realized with front and back process, and there is no the classification function to product during the test
Energy.
In field of semiconductor lasers, the power and wavelength of noise spectra of semiconductor lasers carries out automatic test and already belongs to existing skill
Art, for example, Chinese patent, publication number 103308159A discloses a kind of semiconductor laser tube power and wavelength characteristic and tests automatically
Device and method, by respectively by the current signal input of semiconductor laser and light signal output end and controllable current source,
Adjustable optical attenuator connection, realizes that the power and wavelength of semiconductor laser is tested automatically.
Utility model content
In view of the deficiencies of the prior art, the utility model provides a kind of automatic testing classification system of semiconductor laser.
The technical solution of the utility model are as follows:
A kind of automatic testing classification system of semiconductor laser, the feeding system including workbench upper surface is arranged in
System tests turntable, categorizing system and slides laterally arm；The left and right sides of test turntable is arranged in feed system and categorizing system；
The feed system includes feed table and the feeding suction nozzle that is arranged in right above feed table；The upper surface setting of the test turntable
There is test base；The categorizing system includes receiver and the splicing suction nozzle that is arranged in right above receiver；The feed table and
Receiver passes through the upper surface that sliding rail in the front-back direction is slidably arranged in workbench respectively；The feed table and receiver it is upper
Surface is provided with groove；The feeding suction nozzle and splicing suction nozzle pass through the feeding travelling arm being vertically arranged and splicing sliding respectively
Arm, which is slidably arranged in, to be slid laterally on arm；The feeding suction nozzle and splicing suction nozzle are slidably arranged in feeding travelling arm and splicing respectively
On travelling arm；Described slide laterally is provided with sending of sliding feeding travelling arm and splicing travelling arm in left-right direction on arm
Expect x-axis motor and splicing x-axis motor；Being respectively arranged on feeding travelling arm and splicing travelling arm makes feeding suction nozzle and splicing suction nozzle
The feeding z-axis motor and splicing z-axis motor slided along the vertical direction；The upper surface of the workbench be provided with make feed table and
The feeding y-axis motor and splicing y-axis motor that receiver slides along the longitudinal direction.Groove in feed table is for fixing product material
Box stores product to be measured in magazine；Groove on receiver is also used for fixed product magazine, the production that storage test is completed in magazine
Product；Product is carried to test turntable by feed table by feeding suction nozzle, feeding suction nozzle by feeding z-axis motor control its along the vertical direction
It moves up and down, by feeding x-axis motor control, it is moved left and right feeding suction nozzle in left-right direction；The production that splicing suction nozzle completes test
Product are transported by test macro to categorizing system, and by splicing z-axis motor control, it is moved up and down splicing suction nozzle along the vertical direction, splicing
By splicing x-axis motor control, it is moved left and right suction nozzle in left-right direction.
It is preferred according to the utility model, multiple test machines are evenly arranged on the circumference of the test disk upper surface
Seat.
It is preferred according to the utility model, multiple grooves are respectively arranged on the feed table and receiver.
Preferred according to the utility model, the test turntable is driven by drive motor.
The utility model has the following beneficial effects:
1. the automatic testing classification system of semiconductor laser described in the utility model realizes that noise spectra of semiconductor lasers is automatic
Test, after testing automatically, system is classified automatically according to test result；Solves the work drawback of manual test, while real
The integrated testing for having showed wavelength and power realizes the automated production of testing producing lines, reduces manually, reduces and be produced into
This, improves the test yield of product；
2. the automatic testing classification system of semiconductor laser described in the utility model, measuring accuracy is high, speed is fast, improve
Pollution of the manual test to product is avoided while working efficiency.
Detailed description of the invention
Fig. 1 is the structural scheme of mechanism of the automatic testing classification system of semiconductor laser described in the utility model；
In figure, 1, feed table；2, receiver；3, turntable is tested；4, base is tested；5, feeding suction nozzle；6, splicing suction nozzle；7,
Groove；8, feeding y-axis motor；9, splicing y-axis motor；10, feeding z-axis motor；11, splicing z-axis motor；12, feeding x-axis horse
It reaches；13, splicing x-axis motor；14, feeding travelling arm；15, arm is slid laterally；16, splicing travelling arm.
Specific embodiment
The utility model is described further below with reference to embodiment and Figure of description, but not limited to this.
Embodiment 1
As shown in Figure 1.
A kind of automatic testing classification system of semiconductor laser, the feeding system including workbench upper surface is arranged in
System tests turntable 3, categorizing system and slides laterally arm 15；The left and right two of test turntable 3 is arranged in feed system and categorizing system
Side；The feed system includes feed table 1 and the feeding suction nozzle 5 that 1 surface of feed table is arranged in；It is described to test the upper of turntable 3
Surface is provided with test base 4；The categorizing system includes receiver 2 and the splicing suction nozzle 6 that 2 surface of receiver is arranged in；
The feed table 1 and receiver 2 are slidably arranged in the upper surface of workbench by sliding rail in the front-back direction respectively；The feeding
The upper surface of disk 1 and receiver 2 is provided with groove 7；The feeding suction nozzle 5 and splicing suction nozzle 6 are respectively by being vertically arranged
Feeding travelling arm 14 and splicing travelling arm 16, which are slidably arranged in, to be slid laterally on arm 15；The feeding suction nozzle 5 and splicing suction nozzle 6 divide
It is not slidably arranged on feeding travelling arm 14 and splicing travelling arm 16；It is described slide laterally to be provided on arm 15 make feeding sliding respectively
The feeding x-axis motor 12 and splicing x-axis motor 13 that swing arm 14 and splicing travelling arm 16 slide in left-right direction；Feeding travelling arm 14
With the feeding z-axis motor 10 for sliding feeding suction nozzle 5 and splicing suction nozzle 6 along the vertical direction is respectively arranged on splicing travelling arm 16
With splicing z-axis motor 11；The upper surface of the workbench, which is provided with, slides feed table 1 and receiver 2 along the longitudinal direction
Feeding y-axis motor 8 and splicing y-axis motor 9.Groove 7 in feed table 1 stores production to be measured for fixing product magazine in magazine
Product；Groove 7 on receiver 2 is also used for fixed product magazine, the product that storage test is completed in magazine；Feeding suction nozzle 5 will produce
Product are carried to test turntable 3 by feed table 1, and feeding suction nozzle 5 controls it by feeding z-axis motor 10 and moves up and down along the vertical direction,
Feeding suction nozzle 5 controls it by feeding x-axis motor 12 and moves left and right in left-right direction；Splicing suction nozzle 6 by test complete product by
Test macro is transported to categorizing system, and splicing suction nozzle 6 controls it by splicing z-axis motor 11 and moves up and down along the vertical direction, splicing
Suction nozzle 6 controls it by splicing x-axis motor 13 and moves left and right in left-right direction.
Base 4 is tested there are four being uniformly arranged on the circumference of test 3 upper surface of turntable.Testing turntable 3 can be according to
Fixed angle rotation, rotation angle are 90 °, test and 4 test bases 4 are housed on turntable 3, and test base presses 90 ° of interval
Setting tests 90 ° of every turn of turntable, and test base 4 is by chance in test zone；Test base 4 is for fixing product to be measured, simultaneously
Product on test base 4 is tested accordingly.
12 grooves 7 are respectively arranged on the feed table 1 and receiver 2.The test turntable 3 is driven by drive motor
It is dynamic.
The method for carrying out the automatic testing classification of semiconductor laser using system described in the present embodiment, comprising the following steps:
1) magazine equipped with product to be measured is arranged in the groove 7 of feed table 1, vacant magazine is placed on receiver 2
Groove 7 in；Product to be measured has special magazine to hold, and feed table setting avoids producing dedicated for the groove of fixed product
Product magazine or so moves up and down, it is ensured that semiconductor laser remains that in the original location feeding suction nozzle 5 is enough accurately drawn to be measured
Product.The main function of feed system is the magazine of fixed product to be measured, while providing product to be measured for test turntable 3.
2) 12 cooperating of feeding y-axis motor 8 and feeding x-axis motor, make product to be measured be moved to feeding suction nozzle 5 just under
Side；Feeding z-axis motor 10 works, and control feeding suction nozzle 5 is moved to product upper surface to be measured straight down, and feeding suction nozzle 5 passes through
Vacuum suction draws product to be measured；
3) feeding z-axis motor 10, feeding x-axis motor 12 successively work, and feeding suction nozzle 5, which transports product to be measured to test, to be turned
3 top of disk is close to the side of feed system；
4) behind 3 top of product arrival test turntable to be measured, test turntable 3 is rotated, and test base 4 is made to reach feeding suction nozzle 5
Underface；Then, feeding z-axis motor 10 acts, and control feeding suction nozzle 5 moves straight down, and product to be measured is placed on survey
4 upper surface of test-run a machine seat；
5) vacuum of feeding suction nozzle 5 is cancelled, and product to be measured is fallen on test base 4；Feeding z-axis motor 10 controls feeding and inhales
Mouth 5 leaves test base 4, and feeding x-axis motor 12 controls feeding suction nozzle 5 and returns to feed system；Test the inductor inside base 4
It is powered on after sensing product to be measured to product to be measured, then passes through the performance ginseng of the spectrometer test product inside test base 4
Test software is counted and is sent to, test software classifies to product according to particular product performance parameters.
6) after test base 4 completes test, test turntable 3 rotates product, the product that test is completed is moved to close
The side of categorizing system；
7) splicing x-axis motor 13, splicing z-axis motor 11 successively act, and splicing suction nozzle 6 is moved to the upper surface of product,
Splicing suction nozzle 6 draws product by vacuum suction；
8) splicing z-axis motor 11, splicing x-axis motor 13 successively act, and product is transported to the upper surface of receiver 2；
9) splicing y-axis motor 9 acts, and product is placed on receiver 2 corresponding vacant material according to the performance parameter of product
The surface of box；
10) vacuum of splicing suction nozzle 6 is cancelled, and product is fallen in vacant magazine.The test bag that product is completed in test base 4
Include power test and spectral wavelength test.Test software provides product hierarchy according to the performance parameter of product, splicing suction nozzle according to
Product is placed in the vacant magazine of response by the grade of product.
Claims (4)
1. a kind of automatic testing classification system of semiconductor laser, which is characterized in that including being arranged in workbench upper surface
Feed system, test turntable, categorizing system and slide laterally arm；A left side for test turntable is arranged in feed system and categorizing system
Right two sides；The feed system includes feed table and the feeding suction nozzle that is arranged in right above feed table；It is described to test the upper of turntable
Surface is provided with test base；The categorizing system includes receiver and the splicing suction nozzle that is arranged in right above receiver；It is described
Feed table and receiver pass through the upper surface that sliding rail in the front-back direction is slidably arranged in workbench respectively；It the feed table and connects
The upper surface of charging tray is provided with groove；The feeding suction nozzle and splicing suction nozzle pass through respectively the feeding travelling arm that is vertically arranged and
Splicing travelling arm, which is slidably arranged in, to be slid laterally on arm；The feeding suction nozzle and splicing suction nozzle are slidably arranged in feeding sliding respectively
On arm and splicing travelling arm；It is described slide laterally to be provided on arm make feeding travelling arm and splicing travelling arm respectively in left-right direction
The feeding x-axis motor and splicing x-axis motor of sliding；Be respectively arranged on feeding travelling arm and splicing travelling arm make feeding suction nozzle and
The feeding z-axis motor and splicing z-axis motor that splicing suction nozzle slides along the vertical direction；The upper surface of the workbench, which is provided with, to be made
The feeding y-axis motor and splicing y-axis motor that feed table and receiver slide along the longitudinal direction.
2. the automatic testing classification system of semiconductor laser according to claim 1, which is characterized in that the test turns
Multiple test bases are evenly arranged on the circumference of disk upper surface.
3. the automatic testing classification system of semiconductor laser according to claim 1, which is characterized in that the feed table
With multiple grooves are respectively arranged on receiver.
4. the automatic testing classification system of semiconductor laser according to claim 1, which is characterized in that the test turns
Disk is driven by drive motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821373833.2U CN208743085U (en) | 2018-08-24 | 2018-08-24 | A kind of automatic testing classification system of semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821373833.2U CN208743085U (en) | 2018-08-24 | 2018-08-24 | A kind of automatic testing classification system of semiconductor laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208743085U true CN208743085U (en) | 2019-04-16 |
Family
ID=66081105
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821373833.2U Active CN208743085U (en) | 2018-08-24 | 2018-08-24 | A kind of automatic testing classification system of semiconductor laser |
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| CN (1) | CN208743085U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110302969A (en) * | 2019-07-01 | 2019-10-08 | 孙广静 | A kind of automatic charging device and dielectric ceramic inspection equipment of dielectric ceramic |
-
2018
- 2018-08-24 CN CN201821373833.2U patent/CN208743085U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110302969A (en) * | 2019-07-01 | 2019-10-08 | 孙广静 | A kind of automatic charging device and dielectric ceramic inspection equipment of dielectric ceramic |
| CN110302969B (en) * | 2019-07-01 | 2021-10-26 | 苏州绿萃筑信息科技有限公司 | Automatic feeding device for dielectric ceramics and dielectric ceramics inspection equipment |
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