CN207457284U - Manual chip test base - Google Patents

Manual chip test base Download PDF

Info

Publication number
CN207457284U
CN207457284U CN201721358158.1U CN201721358158U CN207457284U CN 207457284 U CN207457284 U CN 207457284U CN 201721358158 U CN201721358158 U CN 201721358158U CN 207457284 U CN207457284 U CN 207457284U
Authority
CN
China
Prior art keywords
base
hook
floating
pedestal
lid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201721358158.1U
Other languages
Chinese (zh)
Inventor
李俊敏
李俊强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dongguan Rui Hui Electromechanical Technology Co Ltd
Original Assignee
Dongguan Rui Hui Electromechanical Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongguan Rui Hui Electromechanical Technology Co Ltd filed Critical Dongguan Rui Hui Electromechanical Technology Co Ltd
Priority to CN201721358158.1U priority Critical patent/CN207457284U/en
Application granted granted Critical
Publication of CN207457284U publication Critical patent/CN207457284U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The utility model discloses a kind of manual chip test bases, including testing lid and bottom seat, the test lid includes base lid and hook, the base lid side is equipped with counterbore, hook elastic component is equipped in the counterbore, the hook is articulated with base lid side, the hook elastic component props up hook one end, the hook other end is equipped with hook portion, the pedestal includes float plate and pedestal, the pedestal is equipped with sliding groove, the float plate is arranged in sliding groove, the pedestal side is equipped with card slot, the card slot is corresponding with the hook portion linked up with, the base lid is arranged on by locking member on pedestal, it is equipped between the base lid and pedestal and disengages elastic component.Manual chip test base provided by the utility model, convenient test are efficient.

Description

Manual chip test base
Technical field
The utility model is related to chip testing technology fields, specifically, are related to a kind of manual chip test base.
Background technology
In existing chip testing industry, the test of chip various functions is typically carried out with wafer prober. In the production test procedure of chip, each pin of each tested chip is realized simple, fast with test equipment for convenience It is prompt, accurately and efficiently connect, it usually needs by the use of test bench as connecting medium;Such mode realizes tester and tested core The connection of piece not only improves production efficiency, also improves measuring accuracy.
Since the automation chip test base cost for adapting to produce in enormous quantities is higher, in detection scale is smaller or enterprise is reduced Industry needs to use manual test seat when investing.
Chinese patent literature CN202471762U discloses a kind of manual chip test base, including pedestal and upper cover, top cap It is connected on pedestal, pedestal is equipped with cavity, and cavity bottom is equipped with the lower needle mould being connected with circuit board, and lower needle mould is used equipped with pin hole Be equipped with upper needle mould above installation spring probe, lower needle mould, upper needle mould is equipped with pin hole for installing spring probe, upper needle mould and Equipped with dual head spring probe between lower needle mould, by pushing upper cover so that the chip to be measured being positioned in pedestal kickboard declines, pressure Contracting spring probe so that the pin of chip to be measured is in contact with the probe of pedestal needle mould, realizes chip pin and circuit board testing Good electric performance conducting between disk realizes the manual test of chip.Upper cover with respect to base turning for chip placement and It compresses, operation shows slightly inconvenience, it is necessary to further improve its testing efficiency.
Utility model content
The purpose of this utility model is to provide a kind of manual chip test base, there is convenient test, efficient.
Technical solution is used by manual chip test base disclosed in the utility model:A kind of manual chip test base, Including testing lid and bottom seat, the test lid includes base lid and hook, and the base lid side is equipped with counterbore, is equipped in the counterbore Elastic component is linked up with, the hook is articulated with base lid side, and the hook elastic component props up hook one end, and the hook other end is set There is hook portion, the pedestal includes float plate and pedestal, and the pedestal is equipped with sliding groove, and the float plate is arranged in sliding groove, institute Pedestal side is stated equipped with card slot, the card slot is corresponding with the hook portion linked up with, and the base lid is arranged on by locking member on pedestal, described It is equipped between base lid and pedestal and disengages elastic component.
Preferably, the pedestal includes protection board, bottom plate, substrate, the first floating slide track and the second floating slide track, The bottom plate and substrate are arranged on protection board, and the bottom plate is arranged between substrate and protection board, and the substrate is equipped with several pins Hole, the pin hole is interior to be equipped with probe, and one end of the probe props up bottom plate, and the sliding groove is arranged on substrate, and described first is floating Dynamic slide and the second floating slide track are respectively arranged on sliding groove both sides on substrate.
Preferably, the substrate is equipped with the first floating elastic part hole and the second floating elastic part hole, and described the One floating elastic part hole is equipped with the first floating elastic part, and the second floating elastic part, institute are equipped in the second floating elastic part hole The one end for stating the first floating elastic part props up the first floating slide track, and one end of the second floating elastic part props up the second floating cunning Rail.
Preferably, the protection board is fixed on substrate, and the substrate is connected by locking member with base lid.
Preferably, the disengagement elastic component is spring, and the spring pocket is arranged on locking member.
Preferably, the base lid includes cover board, the first support base, the second support base and pressure head, and the counterbore is set In cover board side, first support base and the second support base are fixed on cover board, and the pressure head is arranged on the first support base and the Between two support bases, and above float plate.
Preferably, the first support base upper surface is equipped with the first supported hole, is equipped in first supported hole Elastic component is supported, the second support base upper surface is equipped with the second supported hole, support elastic component is equipped in second supported hole, The upper surface of first support base and the upper surface of the second support base are secured by bolts on cover board.
The advantageous effect of manual chip test base is disclosed in the utility model:Base lid side is equipped with counterbore, is set in counterbore There is hook elastic component, hook is articulated with base lid side, and pedestal is equipped with sliding groove, and float plate is arranged in sliding groove, and pedestal side is set There is card slot, the card slot is corresponding with the hook portion linked up with, and base lid is arranged on by locking member on pedestal, is equipped between base lid and pedestal de- Elastic component is opened, pins hook, base lid moves up under the action of elastic component is disengaged, and pull float plate places chip to be tested, pushes Base lid is linked up under the action of elastic component is linked up with, and the hook portion for linking up with the other end hooks card slot, and base lid compresses chip to be measured, effect Rate higher, test are more convenient.
Description of the drawings
Fig. 1 is the structure diagram of the manual chip test base of the utility model;
Fig. 2 is the exploded perspective view of the manual chip test base of the utility model;
Fig. 3 is the exploded perspective view that lid is tested in the manual chip test base of the utility model;
Fig. 4 is the exploded perspective view of pedestal in the manual chip test base of the utility model.
Specific embodiment
The utility model is further elaborated and illustrated with reference to specific embodiment and Figure of description:It refer to figure 1 and Fig. 2, a kind of manual chip test base, including test lid 10 and pedestal 20, the test lid 10 is arranged on bottom by locking member 30 On seat 20, it is equipped between the test lid 10 and pedestal 20 and disengages elastic component 40.The disengagement elastic component 40 is spring, is sheathed on On locking member 30.
It please refers to Fig.3, the test lid 10 includes base lid and hook 15, and the base lid includes cover board 11, the first support base 12nd, the second support base 13 and pressure head 14,12 upper surface of the first support base is equipped with the first supported hole, in first supported hole Equipped with support elastic component, 13 upper surface of the second support base is equipped with the second supported hole 131, is set in second supported hole 131 Have and support elastic component 132, the upper surface of the upper surface of first support base 12 and the second support base 13 is secured by bolts in On cover board 11, then the first support base 12 and the second support base 13 can opposing cover plates 11 move up and down, play cushioning effect, the pressure First 14 are arranged between the first support base 12 and the second support base 13, and the pressure head 14 passes through bolt 171 and nut 172 and first 12 and second support base 13 of support base is fixed, then pressure head 14 can elastic compression chip to be measured, the side of the cover board 11 is equipped with heavy Hole, the hook 15 are equipped with hook elastic component hole 152 and through hole 151, hook elasticity are equipped in the hook elastic component hole 152 Part 153, the hook elastic component 153 are arranged in the counterbore and hook elastic component hole 152 of cover board 11, and the side of the cover board 11 is set Fluted and hinged axis hole, the hinged axis hole cross groove, the hook 15 by pass through the hinged axis hole on cover board 11 with And the articulated shaft 161 of the through hole 151 on hook 15 is articulated on cover board 11, the both ends of the articulated shaft 161 are equipped with axle sleeve 162, Prevent articulated shaft from coming off, the hook elastic component 153 props up 15 one end of hook, and 15 other ends of the hook are equipped with hook portion.
It please refers to Fig.3, the pedestal 20 includes float plate 24 and pedestal, and the pedestal includes protection board 21, bottom plate 23, base Plate 22, the first floating slide track 25 and the second floating slide track 26, the bottom plate 23 and substrate 22 are arranged on protection board 21, the bottom plate 23 are arranged between substrate 22 and protection board 21, and the substrate 22 is equipped with several pin holes, and probe, the spy are equipped in the pin hole One end of pin props up bottom plate 23, and the substrate 22 is equipped with sliding groove, 25 and second floating slide track 26 of the first floating slide track Sliding groove both sides on substrate 22 are respectively arranged on, first floating slide track 25 is equipped with first side slot 251, and described second, which floats, slides Rail 26 is equipped with second side slot, and the float plate 24 is slided in the sliding groove between first side slot 251 and second side slot, The substrate 22 is equipped with the first floating elastic part hole and the second floating elastic part hole, and the first floating elastic part hole is equipped with the One floating elastic part 222 is equipped with the second floating elastic part 221, first floating elastic in the second floating elastic part hole One end of part 222 props up the first floating slide track 25, and one end of the second floating elastic part 221 props up the second floating slide track 26, The protection board 21 is fixed on substrate 22, and the side of the substrate 22 is equipped with card slot, the hook portion pair of the card slot and hook 15 Should, the substrate 22 is connected by locking member 30 with cover board 11.
Base lid side is equipped with counterbore, and hook elastic component is equipped in counterbore, and hook is articulated with base lid side, and pedestal, which is equipped with, to be slided Slot, float plate are arranged in sliding groove, and pedestal side is equipped with card slot, and the card slot is corresponding with the hook portion linked up with, and base lid passes through locking Part is arranged on pedestal, is equipped between base lid and pedestal and is disengaged elastic component, pins hook, base lid under the action of elastic component is disengaged on It moves, pull float plate, places chip to be tested, push base lid, link up under the action of elastic component is linked up with, link up with the hook of the other end Card slot is hooked in portion, and base lid compresses chip to be measured, more efficient, and test is more convenient, makes test lid and bottom due to disengaging elastic component Seat Relative Floating, the first support base, the second support base and pressure head opposing cover plates float, and can effectively protect probe avoids probe from damaging Bad influence accuracy in detection extends the service life of probe.
Finally it should be noted that above example is only to illustrate the technical solution of the utility model rather than to this reality With the limitation of novel protected scope, although being explained in detail with reference to preferred embodiment to the utility model, this field it is general Lead to it will be appreciated by the skilled person that can be modified or replaced equivalently to the technical solution of the utility model, without departing from this The spirit and scope of utility model technical solution.

Claims (7)

1. a kind of manual chip test base, including testing lid and bottom seat, the test lid includes base lid and hook, the base lid side Face is equipped with counterbore, and hook elastic component is equipped in the counterbore, and the hook is articulated with base lid side, and the hook elastic component props up One end is linked up with, the hook other end is equipped with hook portion, which is characterized in that the pedestal includes float plate and pedestal, the pedestal Equipped with sliding groove, the float plate is arranged in sliding groove, and the pedestal side is equipped with card slot, the hook portion pair of the card slot and hook Should, the base lid is arranged on by locking member on pedestal, is equipped between the base lid and pedestal and is disengaged elastic component.
2. manual chip test base as described in claim 1, which is characterized in that the pedestal includes protection board, bottom plate, base Plate, the first floating slide track and the second floating slide track, the bottom plate and substrate are arranged on protection board, and the bottom plate is arranged on substrate and guarantor Between backplate, the substrate is equipped with several pin holes, is equipped with probe in the pin hole, one end of the probe props up bottom plate, institute Sliding groove is stated on substrate, first floating slide track and the second floating slide track are respectively arranged on sliding groove both sides on substrate.
3. manual chip test base as claimed in claim 2, which is characterized in that the substrate is equipped with the first floating elastic part Hole and the second floating elastic part hole, the first floating elastic part hole are equipped with the first floating elastic part, second floating elastic The second floating elastic part is equipped in part hole, one end of the first floating elastic part props up the first floating slide track, and described second is floating One end of dynamic elasticity part props up the second floating slide track.
4. manual chip test base as claimed in claim 3, which is characterized in that the protection board is fixed on substrate, described Substrate is connected by locking member with base lid.
5. manual chip test base as claimed in claim 4, which is characterized in that the elastic component that disengages is spring, the bullet Spring is sheathed on locking member.
6. such as the 1 or 5 manual chip test base of any one of them of claim, which is characterized in that the base lid includes cover board, the One support base, the second support base and pressure head, the counterbore are arranged on cover board side, and first support base and the second support base are fixed In on cover board, the pressure head is arranged between the first support base and the second support base, and above float plate.
7. manual chip test base as claimed in claim 6, which is characterized in that the first support base upper surface is equipped with first Supported hole, first supported hole is interior to be equipped with support elastic component, and the second support base upper surface is equipped with the second supported hole, described Support elastic component is equipped in second supported hole, the upper surface of first support base and the upper surface of the second support base pass through bolt It is fixed on cover board.
CN201721358158.1U 2017-10-20 2017-10-20 Manual chip test base Active CN207457284U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201721358158.1U CN207457284U (en) 2017-10-20 2017-10-20 Manual chip test base

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201721358158.1U CN207457284U (en) 2017-10-20 2017-10-20 Manual chip test base

Publications (1)

Publication Number Publication Date
CN207457284U true CN207457284U (en) 2018-06-05

Family

ID=62280949

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201721358158.1U Active CN207457284U (en) 2017-10-20 2017-10-20 Manual chip test base

Country Status (1)

Country Link
CN (1) CN207457284U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110703073A (en) * 2019-08-29 2020-01-17 国营芜湖机械厂 Relay test tool
CN112798941A (en) * 2021-04-13 2021-05-14 天津金海通半导体设备股份有限公司 Two-stage floating suction head device suitable for multi-stage adjustment of different use temperatures and pressures

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110703073A (en) * 2019-08-29 2020-01-17 国营芜湖机械厂 Relay test tool
CN112798941A (en) * 2021-04-13 2021-05-14 天津金海通半导体设备股份有限公司 Two-stage floating suction head device suitable for multi-stage adjustment of different use temperatures and pressures

Similar Documents

Publication Publication Date Title
CN207457284U (en) Manual chip test base
US6900648B2 (en) Tester for printed circuit boards
CN202471762U (en) Manual test base of chip
CN203012063U (en) Test board for batched electronic component testing
CN201637370U (en) Pin height check tool
CN105093000A (en) Test device
CN102236031A (en) Test fixture for printed circuit board
US20120299614A1 (en) Test socket with a rapidly detachable electrical connection module
US20050001647A1 (en) Semiconductor test system and method
CN105004895B (en) A kind of surface mount packages microwave device test device
CN206618832U (en) A kind of floating type circuit board testing jig
CN205067627U (en) Probe testing apparatus
CN207992338U (en) Fingerprint module test fixture
WO2019000975A1 (en) Electrical test jig
CN104614618A (en) Semi-automatic interchange equipment for testing electrical performance and testing method thereof
CN208256153U (en) Digital circuit computer test device
CN201348646Y (en) Contact type function testing device
CN206618833U (en) A kind of Rigid Flex measurement jig
CN205484693U (en) A smelting tool for circuit board detects
CN205562594U (en) Balanced test fixture structure that pushes down
CN205091435U (en) PCB testing arrangement
CN205608336U (en) TFT testing jig
CN202533465U (en) Non-socket testing pin bed
CN208860288U (en) A kind of notebook foot pad flatness checking device
CN203490942U (en) Device for detecting flexible cable of magnetic head

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant