CN206420432U - A kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers - Google Patents
A kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers Download PDFInfo
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- CN206420432U CN206420432U CN201720007212.1U CN201720007212U CN206420432U CN 206420432 U CN206420432 U CN 206420432U CN 201720007212 U CN201720007212 U CN 201720007212U CN 206420432 U CN206420432 U CN 206420432U
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- module
- signal
- protective layer
- resistance
- layer thickness
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Abstract
The utility model discloses a kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers, including signal generating module, probe coil, Signal-regulated kinase, one-chip computer module, display module, A/D modular converters, signal triggering collection module；The signal generating module, probe coil, Signal-regulated kinase and one-chip computer module are sequentially connected, and the signal triggering collection module is connected by A/D modular converters with one-chip computer module, and the display module is connected with one-chip computer module.The utility model sends excitation signal by signal generating module; pass through probe coil and signal triggering collection modules acquiring data again; then the thickness of reinforced concrete protective layer can be drawn by single-chip microcomputer analysis; the device need not destroy reinforced concrete protective layer and can detect, and entirety has the advantages that simple in construction and easy to detect.
Description
Technical field
The utility model is related to detecting instrument technical field, more specifically, more particularly to a kind of to be based on C8051 single-chip microcomputers
Protective layer thickness nondestructive testing instrument.
Background technology
In the prior art, the detection of Minimum Concrete Protective Coating Thickness first destroys steel generally by detection is damaged
Reinforced concrete protective layer, then could be detected by instrument, it has impact on the structure of reinforced concrete protective layer, add safety
Hidden danger.
With electromagnetic theory and its experiment continue to develop with it is perfect, promoted the Non-Destructive Testings such as EDDY CURRENT with assessing skill
Art is continued to develop.Pulsed Eddy Current Nondestructive Testing Technology is a kind of new technology of current Non-Destructive Testing.It is vortexed with traditional single-frequency
Technology is compared, and the pulse signal of broadband, which is encouraged in the signal that meets with a response, contains abundant information.Therefore, how to combine this
The nondestructive testing instrument that technical research goes out a protective layer thickness based on C8051 single-chip microcomputers is necessary.
Utility model content
The purpose of this utility model is to provide a kind of protection simple in construction, easy to detect based on C8051 single-chip microcomputers
The nondestructive testing instrument of thickness degree.
In order to achieve the above object, the technical solution adopted in the utility model is as follows：
A kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers, including signal generating module, probe wire
Circle, Signal-regulated kinase, one-chip computer module, display module, A/D modular converters, signal triggering collection module；The signal occurs
Module, probe coil, Signal-regulated kinase and one-chip computer module are sequentially connected, and the signal triggering collection module is turned by A/D
Mold changing block is connected with one-chip computer module, and the display module is connected with one-chip computer module.
Further, the signal generating module includes the excitation trigger module and power module being connected with each other.
Further, the signal triggering collection module includes resistance R1, resistance R2, resistance R3, resistance R4, triode
Q1, diode VD and metal-oxide-semiconductor, described resistance R4 one end are connected with one-chip computer module, and the other end is connected with metal-oxide-semiconductor source electrode, described
The grounded-grid in metal-oxide-semiconductor source, the drain electrode of metal-oxide-semiconductor is connected by resistance R2 with triode Q1 base stage, triode Q1 emitter stage
It is connected by resistance R3 with+10V power supplys, triode Q1 colelctor electrode is connected with diode VD negative electrode, diode VD anode
It is grounded by resistance R1, one end of the probe coil is connected with triode Q1 colelctor electrode, other end ground connection.
Further, the model C8051F350 of the one-chip computer module.
Further, the excitation trigger module is square-wave pulse generator circuit, the square-wave pulse generator circuit bag
Include the astatic multivibrator and monostable flipflop of interconnection.
Further, the signal conditioning circuit includes voltage follower circuit, area integral circuit, the subtraction being sequentially connected
Computing circuit and filter circuit.
Further, the display module is SYB240128AZK Liquid Crystal Modules.
Compared with prior art, the utility model has the advantage of：The utility model sends sharp by signal generating module
Signal, then by probe coil and signal triggering collection modules acquiring data, must can then be tapped by single-chip microcomputer analysis
The thickness of reinforced concrete protective layer, the device need not destroy reinforced concrete protective layer and can detect, overall with simple in construction
With advantage easy to detect.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the accompanying drawing used required in description of the prior art is briefly described, it should be apparent that, drawings in the following description are only
It is some embodiments of the present utility model, for those of ordinary skill in the art, is not paying the premise of creative work
Under, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is the frame diagram of the nondestructive testing instrument of the protective layer thickness described in the utility model based on C8051 single-chip microcomputers.
Fig. 2 is the circuit diagram of excitation trigger module in the utility model.
Fig. 3 is the circuit diagram of signal triggering collection module in the utility model.
Fig. 4 is the circuit diagram of voltage follower circuit and area integral circuit in the utility model.
Fig. 5 is the circuit diagram of subtraction circuit and filter circuit in the utility model.
Fig. 6 is the circuit diagram that display module is connected with one-chip computer module in the utility model.
Embodiment
Preferred embodiment of the present utility model is described in detail below in conjunction with the accompanying drawings, so that advantage of the present utility model
It can be easier to be readily appreciated by one skilled in the art with feature, so as to make protection domain of the present utility model apparent clear and definite
Define.
As shown in fig.1, the utility model provides a kind of Non-Destructive Testing of the protective layer thickness based on C8051 single-chip microcomputers
Instrument, including signal generating module, probe coil, Signal-regulated kinase, one-chip computer module, display module, A/D modular converters, letter
Number triggering collection module；The signal generating module, probe coil, Signal-regulated kinase and one-chip computer module are sequentially connected, institute
State signal triggering collection module to be connected with one-chip computer module by A/D modular converters, the display module connects with one-chip computer module
Connect.
As shown in fig.2, the signal generating module includes the excitation trigger module and power module being connected with each other.
It is described excitation trigger module be based on 555 time base circuits design dutycycle and frequency can Independent adjustable square wave
Pulse-generator circuit, the square-wave pulse generator circuit includes the astatic multivibrator A1 and monostable trigger being connected with each other
Device A2.
As shown in fig.3, the signal triggering collection module includes resistance R1, resistance R2, resistance R3, resistance R4, three poles
Pipe Q1, diode VD and metal-oxide-semiconductor, described resistance R4 one end are connected with one-chip computer module, and the other end is connected with metal-oxide-semiconductor source electrode, institute
The grounded-grid in metal-oxide-semiconductor source is stated, the drain electrode of metal-oxide-semiconductor is connected by resistance R2 with triode Q1 base stage, triode Q1 transmitting
Pole is connected by resistance R3 with+10V power supplys, and triode Q1 colelctor electrode is connected with diode VD negative electrode, diode VD sun
Pole is grounded by resistance R1, and one end of the probe coil is connected with triode Q1 colelctor electrode, other end ground connection.
The signal generating module is used to produce driving pulse, and this driving pulse is usually the certain square wave of dutycycle.Letter
Number generation circuit requires to produce frequency and the adjustable square-wave signal of dutycycle, and it is lower jump along will be enough it is steep with comprising enough
Frequency content.The vortex field produced in moment test specimen of the lower jump of pulse along i.e. pulse disappearance is typically chosen in as detection
Object.Theoretically, frequency is decreased sufficiently, dutycycle set it is sufficiently large, excitation electromagnetic field can just penetrate metal
Conductor reaches stable state until vortex field.But in view of power consumption and coil heating and measurement efficiency the problem of, frequency is not
More low better, similarly dutycycle is nor be the bigger the better.The characteristic quantity of this apparatus measures is induced voltage, i.e. sensing in coil
Electric current.When pulse signal is high level, MOSFET is open-minded, the base stage of PNP type triode is produced current lead-through, coil is through three
Pole pipe is started to charge up, and service time must ensure that coil is fully charged, due to diode VD reverse cut-off, electric current is not flowed
Cross resistance R1.When pulse signal becomes low level, MOSFET shut-offs, due to diode VD forward conduction, lead to coil
Cross R1 electric discharges.And the voltage at charging stage coil two ends is the characteristic quantity of the system measurement, the reacting condition of this voltage line
Faradic change in circle.
Signal triggering collection module functions as one and allows data acquisition module or display device and pumping signal
Synchronous gating circuit, its main function is to provide trigger signal for single-chip data acquisition display module.As requested, believe
Number triggering collection module is required to provide triggering letter at the time of each ADC is converted and signal is more stable
Number, the result that at this moment can be currently gathered in liquid crystal screen display, and keep current result constant until triggering next time.
Preferably, the model C8051F350 of the one-chip computer module, the single-chip microcomputer is changed comprising high-precision A/D
Module.
Refering to shown in Fig. 4 and Fig. 5, the signal conditioning circuit includes voltage follower circuit A, the area integral being sequentially connected
Circuit B, subtraction circuit C and filter circuit D.There are many harmonic noises in the signal collected, because collecting
Signal amplitude change it is very low, be mV even uV grades.In order to farthest improve signal to noise ratio, one is to need suitable circuit cloth
Office, it is to avoid interfered between analog signal and data signal；Two are put from the sufficiently high operational amplifier of common-mode rejection ratio
Big small-signal, and reduce drift；Three are the suitable low-pass filter circuits of selection to reduce or eliminate high-frequency harmonic noise pair
The interference of signal；Four be, to each chip power supply, Switching Power Supply had better not to be used, because opening from linear power supply of good performance
There is not eliminable switching noise in powered-down source；Five be to coordinate single-chip microcomputer collection signal mentioned later many in the progress of same position
Secondary measurement, the data to collection carry out average value processing.
What is mainly used in the signal conditioning circuit is that low-noise accurate operational amplifier OP27 and accurate amplifier are put
Big device two kinds of amplifier chips of TLC277.
As shown in fig.6, the display module major function is exactly the various results of display collection conversion.The utility model is adopted
Completed with 240 × 128 LCD MODULE.The communication mode parallel communications of general LCD MODULE and serial communication
Two kinds, the speed of parallel communications transmission data is fast, has the disadvantage that the resource for occupying chip is more；Serial communication contrast, transmits number
According to speed it is slow, but it is few to occupy the resource of chip.Consideration based on picking rate and data transmission bauds, this instrument is using parallel
Communication.Display circuit uses SYB240128AZK Liquid Crystal Modules, and SYB240128AZK is a kind of graphic dot matrix liquid crystal display.It
It is main using dynamic driving principle by going driving-controller and row driver two parts constitute 240 (row) × 128 (OK)
Full Dot-Matric LCD Display.This display has included word storehouse of the hardware, and programming mode succinctly facilitates, and this display employs the hard of SMT
Packaged type, connects LCD, service life is long, firm and reliable connection by conductive rubber and press box.
The connected mode of the display module and one-chip computer module is, the P1 mouthfuls of data ports as liquid crystal display of single-chip microcomputer, P0
Mouthful Gao Siwei as liquid crystal display control mouth.
The utility model sends excitation signal by signal generating module, then passes through probe coil and signal triggering collection mould
Block gathered data, then can draw the thickness of reinforced concrete protective layer, the device need not destroy steel by single-chip microcomputer analysis
Reinforced concrete protective layer is that can detect, and entirety has the advantages that simple in construction and easy to detect.
Although being described in conjunction with the accompanying embodiment of the present utility model, patent owner can want in appended right
Various deformations or amendments are made within the scope of asking, as long as no more than the protection model described by claim of the present utility model
Enclose, all should be within protection domain of the present utility model.
Claims (7)
1. a kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers, it is characterised in that：Occurs mould including signal
Block, probe coil, Signal-regulated kinase, one-chip computer module, display module, A/D modular converters, signal triggering collection module；Institute
State signal generating module, probe coil, Signal-regulated kinase and one-chip computer module to be sequentially connected, the signal triggering collection module
It is connected by A/D modular converters with one-chip computer module, the display module is connected with one-chip computer module.
2. the nondestructive testing instrument of the protective layer thickness according to claim 1 based on C8051 single-chip microcomputers, it is characterised in that：
The signal generating module includes the excitation trigger module and power module being connected with each other.
3. the nondestructive testing instrument of the protective layer thickness according to claim 1 based on C8051 single-chip microcomputers, it is characterised in that：
The signal triggering collection module includes resistance R1, resistance R2, resistance R3, resistance R4, triode Q1, diode VD and metal-oxide-semiconductor,
Described resistance R4 one end is connected with one-chip computer module, and the other end is connected with metal-oxide-semiconductor source electrode, the grounded-grid in the metal-oxide-semiconductor source,
The drain electrode of metal-oxide-semiconductor is connected by resistance R2 with triode Q1 base stage, and triode Q1 emitter stage passes through resistance R3 and+10V electricity
Source is connected, and triode Q1 colelctor electrode is connected with diode VD negative electrode, and diode VD anode is grounded by resistance R1, described
One end of probe coil is connected with triode Q1 colelctor electrode, other end ground connection.
4. the nondestructive testing instrument of the protective layer thickness according to claim 1 based on C8051 single-chip microcomputers, it is characterised in that：
The model C8051F350 of the one-chip computer module.
5. the nondestructive testing instrument of the protective layer thickness according to claim 2 based on C8051 single-chip microcomputers, it is characterised in that：
The excitation trigger module is square-wave pulse generator circuit, and the self-excitation that the square-wave pulse generator circuit includes being connected with each other is more
Harmonic oscillator and monostable flipflop.
6. the nondestructive testing instrument of the protective layer thickness according to claim 1 based on C8051 single-chip microcomputers, it is characterised in that：
The signal conditioning circuit includes voltage follower circuit, area integral circuit, subtraction circuit and the filtered electrical being sequentially connected
Road.
7. the nondestructive testing instrument of the protective layer thickness according to claim 1 based on C8051 single-chip microcomputers, it is characterised in that：
The display module is SYB240128AZK Liquid Crystal Modules.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720007212.1U CN206420432U (en) | 2017-01-04 | 2017-01-04 | A kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720007212.1U CN206420432U (en) | 2017-01-04 | 2017-01-04 | A kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206420432U true CN206420432U (en) | 2017-08-18 |
Family
ID=59574163
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720007212.1U Expired - Fee Related CN206420432U (en) | 2017-01-04 | 2017-01-04 | A kind of nondestructive testing instrument of the protective layer thickness based on C8051 single-chip microcomputers |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206420432U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107402256A (en) * | 2017-08-22 | 2017-11-28 | 姚静洁 | A kind of ultrasonic flaw detector |
| CN110230975A (en) * | 2019-06-20 | 2019-09-13 | 武汉钢铁有限公司 | A kind of steel slag thickness measuring device |
-
2017
- 2017-01-04 CN CN201720007212.1U patent/CN206420432U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107402256A (en) * | 2017-08-22 | 2017-11-28 | 姚静洁 | A kind of ultrasonic flaw detector |
| CN110230975A (en) * | 2019-06-20 | 2019-09-13 | 武汉钢铁有限公司 | A kind of steel slag thickness measuring device |
| CN110230975B (en) * | 2019-06-20 | 2021-01-12 | 武汉钢铁有限公司 | Steel slag layer thickness measuring device |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170818 Termination date: 20190104 |
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| CF01 | Termination of patent right due to non-payment of annual fee |