CN206114119U - A infrared temperature measuring device for optical lens face - Google Patents

A infrared temperature measuring device for optical lens face Download PDF

Info

Publication number
CN206114119U
CN206114119U CN201621171430.0U CN201621171430U CN206114119U CN 206114119 U CN206114119 U CN 206114119U CN 201621171430 U CN201621171430 U CN 201621171430U CN 206114119 U CN206114119 U CN 206114119U
Authority
CN
China
Prior art keywords
radiation
poly
case
lens
seat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201621171430.0U
Other languages
Chinese (zh)
Inventor
黄善杰
许方宇
李正刚
袁沭
张涛
柳光乾
付玉
张卫锋
胡志斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yunnan Astronomical Observatory of CAS
Original Assignee
Yunnan Astronomical Observatory of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yunnan Astronomical Observatory of CAS filed Critical Yunnan Astronomical Observatory of CAS
Priority to CN201621171430.0U priority Critical patent/CN206114119U/en
Application granted granted Critical
Publication of CN206114119U publication Critical patent/CN206114119U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Radiation Pyrometers (AREA)

Abstract

The utility model discloses an infrared temperature measuring device for optical lens face has solved the difficult problem that current infrared temperature measuring instrument can not the optical lens face temperature that accurate measurement infrared band emissivity is low, the reflectivity is high. This infrared temperature measuring device is including surveying the module, gather the radiation lens, gather the radiation housing and be used for the connection to survey the module and gather the housing seat that radiates the housing, the housing stationary ladle is drawn together to connect and is fixed in the connecting plate of surveying the module tip, is located connecting plate one side, the connecting seat integrative with the connecting plate, gather the radiation housing and be frustum shape, annular portion that the less one end setting of its diameter and connecting seat are connected, it installs in gathering the radiation housing to gather the radiation lens, the center of housing seat has and surveys the through -hole that the probe shape is corresponding of module, and the probe of surveying the module stretches into in the through -hole of connecting seat, the light incidence end of probe and the bottom surface parallel and level of connecting seat internal surface. The utility model discloses can effectively put forward mirror surface temperature measurement's precision.

Description

A kind of infrared temperature measurement apparatus for optical mirror plane
Technical field
This utility model is related to infrared temperature-test technology field, more particularly to a kind of infrared measurement of temperature for optical mirror plane is filled Put.
Background technology
Temperature is one of key factor of impact optical device image quality, and the impact as matter is mainly included:Optical frames The temperature difference of face and air rises and falls up can form one layer of turbulent flow in air, produce minute surface seeing(mirror seeing);Light Thermal deformation and variations in refractive index that mirror body temperature change causes are learned, makes reflection or the corrugated after transmission deviate from preferable corrugated, produced Heat causes aberration;The change of the optical element other performance parameter that temperature causes.Temperature is studied and eliminated to optical imaging apparatus Impact, it is the ring that can not be lacked that optical mirror is particularly the temperature accurate measurement of optical mirror plane.Current optical mirror plane temperature Measurement method has two kinds of contact thermography and indirect thermometric, but both has certain limitation:Contact thermography in minute surface by arranging Temperature probe obtains temperature.In actual thermal environment, mirror temperature distribution is more complicated, it is necessary to have enough thermometric points ability anti- Reflect Temperature Distribution.Because the superelevation of optical mirror plane film layer and surface figure accuracy is required, it is impossible to arrange many temperature probes in minute surface.Between It is, based on minute surface back contact thermometric, by numerical computations mirror temperature to be reflected indirectly to connect thermometric.The thermal environment parameter of mirror body is difficult To survey, including the complicated conduction of heat of mirror body and supporting construction, convection current complicated and changeable and radiation heat transfer etc., cause what is calculated Mirror temperature is inaccurate.
Non-contact temperature measuring does not interfere with minute surface film layer dough-making powder shape, there is obvious advantage compared with contact thermography.Noncontact is surveyed Temperature technique species is various, mainly includes being applied to near-infrared thermometric, color comparison temperature measurement, brightness thermometric and the multispectral spoke of high temp objects Penetrate thermometric etc., the laser interference thermometric based on distortion measurement and holographic interference thermometry etc..The optical mirror plane of imaging device Temperature more be in room temperature scope, be adapted to room temperature object non-contact temperature measuring instrument be in, LONG WAVE INFRARED temperature measuring equipment.Optical mirror plane is plated There are the various film layers for improving reflection or transmission capacity, the infrared band reflectance height of minute surface and thermal emissivity very little, periphery Environment has a strong reflected radiation in minute surface, severe jamming temperature measurement accuracy.At present infrared temperature-test technology can be to overflowing emitter(It is bright Primary body)Accurate thermometric is carried out, is inaccurate to the infrared measurement of temperature of the high reflectivity surface such as optical mirror plane.Traditional medium wave, long wave Infrared measurement of temperature equipment and temp measuring method are difficult to the reason for accurately measuring mirror temperature and are mainly reflected in three below aspect:
1)Environmental radiation of optical mirror plane itself heat radiation less than its reflection.The high room temperature minute surface of infrared band reflectance, Its own heat radiation is less than surrounding enviroment even reflection of the Downward atmospheric long-wave radiation in minute surface.Traditional infrared temperature measuring equipment carries out minute surface During thermometric, the infra-red radiation that Infrared Detectorss receive is mainly the environmental radiation and non-specular surface itself heat radiation for reflecting.
2)Optical mirror plane thermal emissivity is low, and itself heat radiation of room temperature minute surface is weak, part ultra-high reflectivity minute surface itself Heat radiation is less than the actinometry lower limit that traditional infrared temperature measuring equipment is demarcated.
3)Traditional infrared temperature measuring equipment, can only collect minute surface itself heat radiation into little angle with mirror normal, with normal Minute surface in little angle orientation thermal emissivity is less, less than its mitre orientation thermal emissivity.The minute surface that infrared radiation thermometer is collected Heat radiation only accounts for the total thermal-radiating sub-fraction of minute surface.
In order to improve the precision of infrared measurement of temperature, German National metering institute(PTB)C.Monte, B.Gutschwager, J.Hollandt and full Russia's optical physics academy(VNIIOFI)S.P.Morozova co-design one kind possess high accuracy The equipment of infrared measurement of temperature and emissivity measurement, represents the forward position level of current infrared measurement of temperature.In order to eliminate the anti-of surrounding enviroment Radiation interference is penetrated, equipment key component and light path have all carried out liquid nitrogen cooling, and light path and chamber are in vacuum environment.The equipment is made Valency is extremely expensive and can only carry out thermometric to the minute surface for being positioned over measurement intracavity, can not be to the minute surface temperature under measurement running status Degree.The vacuum infrared temperature standard equipment that China National Measuring Science Research Inst. develops(VRTSF), succeeded in developing in 2015.Equipment Inside is built-in with Fourier's red-light spectrum instrument using liquid nitrogen refrigerating and vacuum design(BrukerVERTEX80V).VRTSF is represented The forward position level of domestic infrared radiation measurement, but the mirror temperature for being positioned over its measurement intracavity can only be measured, be unsatisfactory for operation Minute surface thermometric under state is required.The low-launch-rates such as optical mirror plane, high reflectance body surface are always treated as conventional red exterior measuring Blind area in warm field, not yet finds precisely to survey the mirror temperature of room temperature scope under running status on current open source literature Quantifier elimination is reported.
Utility model content
This utility model overcomes shortcoming of the existing infrared temperature-test technology in minute surface thermometric, there is provided a kind of high-precision For the infrared temperature measurement apparatus of optical mirror plane.
In order to solve the problems, such as that this utility model is by the following technical programs during traditional infrared temperature measuring equipment minute surface thermometric Realize:
A kind of infrared temperature measurement apparatus for optical mirror plane, including detecting module, poly- radiation lens, poly- radiation case and use In connection detecting module and the case seat of poly- radiation case;The case seat includes being connected and fixed on the connection of detecting module end Plate, positioned at connecting plate side and the connecting seat of connecting plate one;The poly- radiation case is in taper type, the less one end of its diameter The ring part that setting is connected with connecting seat;The poly- radiation lens are installed in poly- radiation case, the center tool of the case seat The probe for having through hole corresponding with the probe shape of detecting module, detecting module is stretched in the through hole of connecting seat;The probe Light incidence end is concordant with the bottom surface for being connected base inner surface.
The detecting module is the detecting module of refrigeration mode thermal infrared imager.
The poly- radiation lens are the single element lens with infra-red radiation aggregate capabilities or lens group;The poly- radiation lens It is mounted in poly- radiation case by lens locating ring and trim ring;The poly- radiation lens plated surface anti-reflection film.
The material of the poly- radiation case, case seat, lens locating ring and trim ring is the metal material with high thermal conductivity coefficient Matter, poly- radiation case inner surface, the bottom surface of connection base inner surface, lens locating ring and trim ring surface are coated with to infrared band The high film layer of radiant reflectance.
The lens locating ring is processed with poly- radiation case using integrated design.
The gap filling that the trim ring, poly- radiation case are formed with poly- radiation lens three has heat conductive silica gel.
The outer surface of the poly- radiation case and connecting seat is provided with based on the temperature control layer of semiconductor temperature technology.
This utility model does not have the optical imaging lens of traditional infrared temperature measuring equipment, by poly- radiation case reflection during measurement Minute surface radiation is collected, by poly- radiation lens converging lenses surface radiation is reflected.Compared with prior art, this utility model has as follows Advantage:
(1)This utility model can improve minute surface radiation collection ability.Traditional infrared temperature measuring equipment is collected and directly fallen in visual field Radiate in the minute surface of camera lens, as shown in fig. 7, equipment collects subtended angle at field of view center radiating for the minute surface of ψ.Traditional infrared thermometric sets In standby light path after the poly- radiation case of addition, by case secondary reflection, the minute surface that former center subtended angle is θ can be collected and radiated, such as Shown in Fig. 8, θ is more than ψ, and minute surface radiation subtended angle also has similar increase at the other positions of collection.This utility model is in conventional red In outer thermometric equipment Foundations, optical imaging lens are replaced with poly- radiation case and poly- radiation lens, as shown in Figure 1.The device can Collection Jing gathers the reflection of radiation case inner surface and lens reflect convergence into the minute surface radiation of the more large angle of detector.Measurement dress Put using the convergence radianting capacity of lens, do not consider the temperature space resolution of tested mirror sections, can select and converge radioactivity Good short focus lens.Due to there is poly- radiation case between lens and probe, even if the aberration of poly- radiation lens is very big, through lens Radiate with minute surface of the optical axis in mitre afterwards, also can reflected entrance detector.Minute surface radiation collection ability of the present utility model Much larger than traditional infrared temperature measuring equipment.Illustrate, it is a that the F numbers that FLIR companies of the U.S. produce are 1 photo640 movements Short focus thermal infrared imager movement, is to collect one of most strong model of testee surface emissivity ability in photo series movements.Meter Calculate and show, the device is that 0.5, germainium lens are in the transmitance of photo640 service bands from the F numbers of poly- radiation germainium lens 99%, the infrared band reflectance of poly- radiation case inner surface film layer is the 95%, port surface on poly- radiation case top and probe light When the distance of line incidence end is equal to photo640 movements minimum focusing distance, the minute surface radiation collection ability of temperature measuring equipment is about 16.1 times of photo640.
(2)This utility model has the ability of cancellation element itself heat radiation interference of stray light.In the device thermometric light path Heat radiation veiling glare be mainly derived from poly- radiation encloser inner wall, the bottom surface of connection base inner surface, lens locating ring and trim ring, heat Radiation dispersion light directly incident or reflected entrance detector and can affect minute surface thermometric.To weaken heat radiation veiling glare, poly- spoke Penetrate case inner surface, the bottom surface of connection base inner surface, locating ring and trim ring and be coated with the film layer high to infrared band radiant reflectance, The thermal emissivity of film layer is very low, and film layer heat radiation is less than original case inner surface, connection base inner surface, locating ring and trim ring table The heat radiation in face.Optical mirror plane is particularly reflective optic minute surface more and is coated with the film layers such as gold, silver, aluminum, minute surface thermal emissivity and poly- The thermal emissivity of institute's film plating layers such as radiation case is more or less the same, and the heat radiation of institute's plated film layer surface can not be ignored.In order to eliminate film Layer itself heat radiation interference, temperature control is carried out using semiconductor temperature technology to the outer surface for gathering radiation case and connecting seat.Lens Locating ring, trim ring and poly- radiation case are high thermal conductivity coefficient metal material, and locating ring is set with poly- radiation case using integrated Meter processing.Gap filling between trim ring, poly- radiation case, poly- radiation lens has heat conductive silica gel, to reduce trim ring and poly- radiation Thermal contact resistance between case.Poly- radiation case and connecting seat by after temperature control, the temperature of case inner surface film layer and locating ring with Temperature control value is of substantially equal and stablizes constant, and lens trim ring temperature is also basicly stable, the caloradiance and spatial distribution base of film layer This is stable.Plating anti-reflection film after, germainium lens detecting module service band transmitance up to more than 99%, germainium lens are from fever of the body spoke Penetrate level little, its heat radiation fluctuations is extremely faint.The heat radiation veiling glare that temperature measuring equipment detector is collected(Including the hot spoke of film layer Penetrate and lens heat radiation)It is basicly stable constant, it is a constant, the minute surface radiation of collection then becomes with mirror temperature.One often Number, a parameter, allow this utility model temperature measuring equipment to be provided with the ability for eliminating heat radiation interference of stray light.Using following surveys Warm calibrating method, can eliminate impact of the heat radiation veiling glare to minute surface thermometric:
Step 1, the sample mirror calibration of measurement apparatus
The upper surface of cylinder sample mirror and the optical mirror plane for treating thermometric be coated with film layer, the thickness of sample mirror is less than diameter 1/50 , Jing Pei materials be high thermal conductivity metal;Sample mirror post side and bottom surface are provided with high accurately temperature control equipment, for controlling Sample preparation mirror temperature.Temperature control equipment has rational temperature control scope, and temperature control scope covers the temperature change of optical mirror plane to be measured Scope;
Before the calibration of sample mirror, the temperature control value of the temperature control of the poly- radiation case and connecting seat of measurement apparatus is T_s, T_s Can freely arrange, for the ease of temperature control, T_s may be configured as the operating ambient temperature average of optical mirror plane to be measured;Measurement apparatus Poly- radiation case and sample mirror minute surface between distance be set to constant space H_s, on the premise of touchless minute surface risk is ensured, H_ S should be as little as possible, e.g., less than the 1/50 of case opening surface diameter;
When sample mirror is calibrated, sample mirror temperature control value is adjusted with fixed temperature variation T and to record detection device corresponding fixed Mapping value;The detector of detection device is infrared focal plane array seeker, and the calibration measured value is infrared focus plane battle array The meansigma methodss of each pixel output valve of row detector;Set up the calibration data storehouse based on sample mirror temperature and calibration measured value, data base In each sample mirror temperature value T(i)One calibration measured value Y of correspondence(i);
Step 2:Measurement apparatus survey optics of telescope minute surface
The tested region of optical mirror plane is chosen, near the mirror sections, spacing is H_s to the poly- radiation case of measurement apparatus; The temperature control of poly- radiation case and connecting seat is T_s;After poly- radiation case and connecting seat constant temperature, measurement apparatus start to measure mirror Face temperature, obtains measured value;According to measured value and calibration data storehouse, corresponding mirror temperature value T is obtained(i);Measured value is located at When between two calibration measured values of data base, using linear interpolation method corresponding temperature value is obtained.
(3)This utility model eliminates the reflection interference of the environment infra-red radiation in minute surface of minute surface periphery.It adopts poly- spoke The thermometric design that case presses close to minute surface is penetrated, environment heat radiation can be effectively shielded.During thermometric, the poly- radiation case of device presses close to tested Minute surface, on the premise of minute surface is not touched, gap between the two should be as little as possible, e.g., less than gathers radiation case top end opening The 1/50 of face diameter.Most environment heat radiations are shielded in outside poly- radiation case, and small part environmental radiation is by poly- Gap between radiation case and minute surface enters poly- radiation case, is absorbed by poly- radiation case Jing after multiple reflections.
Description of the drawings
In order to be illustrated more clearly that this utility model embodiment or technical scheme of the prior art, below will be to embodiment Or the accompanying drawing to be used needed for description of the prior art is briefly described, it should be apparent that, drawings in the following description are only It is some embodiments of the present utility model, for those of ordinary skill in the art, in the premise for not paying creative work Under, can be with according to these other accompanying drawings of accompanying drawings acquisition.
Fig. 1 is structural representation of the present utility model.
Fig. 2 is the structural representation of case seat in Fig. 1.
Fig. 3 is the structural representation of detecting module in Fig. 1.
Fig. 4 is the structural representation for gathering radiation case in Fig. 1.
Fig. 5 is the enlarged drawing of part A in Fig. 4.
Fig. 6 is the sectional schematic diagram of poly- radiation case, and the sectional drawing of connecting seat is same.
Fig. 7 is the principle schematic that traditional temperature measuring equipment collects minute surface radiation.
Fig. 8 is that traditional temperature measuring equipment installs the principle schematic that minute surface radiation is collected after poly- radiation case additional.
Specific embodiment
Below in conjunction with the accompanying drawing in this utility model embodiment, the technical scheme in this utility model embodiment is carried out Clearly and completely describe, it is clear that described embodiment is only a part of embodiment of this utility model, rather than whole Embodiment.Based on the embodiment in this utility model, those of ordinary skill in the art are not under the premise of creative work is paid The every other embodiment for being obtained, belongs to the scope of this utility model protection.
For the infrared temperature measurement apparatus of optical mirror plane shown in Fig. 1-6, including detecting module 1, poly- radiation lens 3, poly- radiation Case 2 and the case seat 4 for connecting detecting module 1 and poly- radiation case 2;The case seat 2 includes being connected and fixed on detection The connecting plate 5 of the end of module 1, positioned at the side of connecting plate 5 and the connecting seat 6 of the one of connecting plate 5;The poly- radiation case 2 is in cone Platform shape, less one end of its diameter arranges the ring part 8 being connected with connecting seat 6;The poly- radiation lens 3 are installed on poly- radiation case In 2, the center of the case seat 4 has through hole corresponding with the shape of probe 7 of detecting module 1, and the probe 7 of detecting module 1 is stretched Enter in the through hole of connecting seat, the light incidence end 11 of the probe 7 is concordant with the bottom surface of the inner surface of connecting seat(Connecting seat direction One end of poly- radiation case is referred to as bottom surface).
The outer wall of the probe is not more than 0.05 ㎜ with the gap for being connected block hole, it is to avoid the through-hole inner surface of connecting seat 6 Itself heat radiation is entered in probe 7, disturbs minute surface infrared measurement of temperature.
The detecting module is the detecting module of refrigeration mode thermal infrared imager.Refrigeration mode infrared radiation thermometer is a kind of ripe Industrial products, the detecting module 1 refer in refrigeration mode infrared radiation thermometer deduct optical imaging lens remainder, mainly by Infrared Detectorss, control circuit, imaging circuit, reading circuit, refrigeration machine etc. are constituted.
The poly- radiation lens are the single element lens with infra-red radiation aggregate capabilities or lens group, by lens locating ring 12 and trim ring 13 be installed in poly- radiation case.
The lens locating ring and poly- radiation case are using integrated fabrication design.
The gap filling that the trim ring, poly- radiation case are formed with poly- radiation lens three has heat conductive silica gel.
The poly- radiation lens plate anti-reflection film to improve infrared radiation transmissivity.
The wave band of the infra-red radiation is the service band of detecting module 1.
The poly- radiation case, case seat material and lens support structure are the metal material with high thermal conductivity coefficient, are gathered Radiation case inner surface, the bottom surface of connection base inner surface, lens locating ring and trim ring are coated with high to infra-red radiation reflectance Film layer 10, such as golden film, silverskin.
The outer surface of the poly- radiation case and connecting seat is provided with based on the temperature control layer 9 of semiconductor temperature technology.According to The overall dimensions customization semiconductor temperature layer of poly- radiation case 2 and connecting seat 4.
Preferred embodiment of the present utility model is the foregoing is only, it is all at this not to limit this utility model Within the spirit and principle of utility model, any modification, equivalent substitution and improvements made etc. should be included in this utility model Protection domain within.

Claims (5)

1. a kind of infrared temperature measurement apparatus for optical mirror plane, it is characterised in that:Including detecting module, poly- radiation lens, poly- spoke Penetrate case and the case seat for connecting detecting module and poly- radiation case;The case seat includes being connected and fixed on detecting module The connecting plate of end, positioned at connecting plate side and the connecting seat of connecting plate one;The poly- radiation case is in taper type, and its is straight The less one end in footpath arranges the ring part being connected with connecting seat;The poly- radiation lens are installed in poly- radiation case;The case The center of seat has through hole corresponding with the probe shape of detecting module, and the probe of detecting module is stretched in the through hole of connecting seat; The light incidence end of the probe is concordant with the bottom surface for being connected base inner surface.
2. the infrared temperature measurement apparatus of optical mirror plane are used for according to claim 1, it is characterised in that:The detecting module is system The detecting module of cold mould thermal infrared imager.
3. infrared temperature measurement apparatus for optical mirror plane according to claim 1 or claim 2, it is characterised in that:The poly- radiation is saturating Mirror is the single element lens with infra-red radiation aggregate capabilities or lens group;The poly- radiation lens are by lens locating ring and trim ring It is mounted in poly- radiation case;The poly- radiation lens plated surface anti-reflection film.
4. the infrared temperature measurement apparatus of optical mirror plane are used for according to claim 3, it is characterised in that:The poly- radiation case, The material of case seat, lens locating ring and trim ring is the metal material with high thermal conductivity coefficient, gathers radiation case inner surface, connects The bottom surface of joint chair inner surface, lens locating ring and trim ring surface are coated with the film layer high to infrared band radiant reflectance.
5. infrared temperature measurement apparatus for optical mirror plane according to claim 1 or claim 2, it is characterised in that:The poly- radiation shield The outer surface of shell and connecting seat is provided with based on the temperature control layer of semiconductor temperature technology.
CN201621171430.0U 2016-10-26 2016-10-26 A infrared temperature measuring device for optical lens face Active CN206114119U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201621171430.0U CN206114119U (en) 2016-10-26 2016-10-26 A infrared temperature measuring device for optical lens face

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201621171430.0U CN206114119U (en) 2016-10-26 2016-10-26 A infrared temperature measuring device for optical lens face

Publications (1)

Publication Number Publication Date
CN206114119U true CN206114119U (en) 2017-04-19

Family

ID=58524716

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201621171430.0U Active CN206114119U (en) 2016-10-26 2016-10-26 A infrared temperature measuring device for optical lens face

Country Status (1)

Country Link
CN (1) CN206114119U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106289536A (en) * 2016-10-26 2017-01-04 中国科学院云南天文台 A kind of infrared temperature measurement apparatus for optical mirror plane
CN108572031A (en) * 2018-04-27 2018-09-25 南通航运职业技术学院 A kind of heat radiation type temperature transducer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106289536A (en) * 2016-10-26 2017-01-04 中国科学院云南天文台 A kind of infrared temperature measurement apparatus for optical mirror plane
CN108572031A (en) * 2018-04-27 2018-09-25 南通航运职业技术学院 A kind of heat radiation type temperature transducer
CN108572031B (en) * 2018-04-27 2019-11-12 南通航运职业技术学院 A kind of heat radiation type temperature transducer

Similar Documents

Publication Publication Date Title
CN107907222B (en) A kind of thermal infrared imaging electric power facility fault locator and detection method
CN112050948A (en) Non-barrier infrared temperature measurement method based on detector temperature drift model
CN110487842A (en) The apparatus and method of thermal conductivity and infrared emittance in pellicular front are measured simultaneously
Krenzinger et al. Accurate outdoor glass thermographic thermometry applied to solar energy devices
CN113074819B (en) High-precision infrared temperature measurement system and method
CN206114119U (en) A infrared temperature measuring device for optical lens face
CN105509900B (en) Infrared radiometer response curve caliberating device and method
CN104458013A (en) Engine thermal protection structure temperature field multi-mode measuring system
CN106525249B (en) Mirror surface infrared temperature measuring device and method
CN109959454B (en) Infrared temperature measuring device for strong light irradiation surface, temperature measuring method and application
Pfänder et al. Infrared temperature measurements on solar trough absorber tubes
CN104634765B (en) The apparatus and method that atmospheric transmittance is measured based on optical radiation measuring instrument
CN108168709A (en) A kind of Tokamak divertor target plate temperature accurate measurement method
CN105136310A (en) Ultraviolet temperature measuring method and apparatus for MOCVD epitaxial wafer surface temperature measurement
Wei et al. The research on compensation algorithm of infrared temperature measurement based on intelligent sensors
CN105973468A (en) Visible near-infrared band high precision solar irradiance meter
CN206114120U (en) Infrared temperature measuring device of mirror surface
CN110595622A (en) Infrared temperature measurement method and heating equipment
CN212030747U (en) Detection system of infrared thermal imaging equipment
CN106289536A (en) A kind of infrared temperature measurement apparatus for optical mirror plane
CN212133888U (en) Color CCD self-calibration temperature measuring device based on radiation spectrum
US3694654A (en) Long wavelength infrared test set
CN206556768U (en) The infrared temperature measurement apparatus of optical mirror plane
CN109387283A (en) Method of the near ultraviolet near infrared spectrum radiometer and its calibrating method and measurement integrating sphere light source spectral radiance
CN205642633U (en) Temperature measurement equipment and system based on ray radiation

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant