CN205175359U - Off -line glass substrate warpage detection device - Google Patents

Off -line glass substrate warpage detection device Download PDF

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Publication number
CN205175359U
CN205175359U CN201520799378.2U CN201520799378U CN205175359U CN 205175359 U CN205175359 U CN 205175359U CN 201520799378 U CN201520799378 U CN 201520799378U CN 205175359 U CN205175359 U CN 205175359U
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glass substrate
guide rail
detection platform
displacement guide
direction displacement
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Expired - Lifetime
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CN201520799378.2U
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Chinese (zh)
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任四民
尹玺铭
祁新
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Dong Xu (yingkou) Photoelectric Display Co Ltd
Tunghsu Technology Group Co Ltd
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Dong Xu (yingkou) Photoelectric Display Co Ltd
Tunghsu Technology Group Co Ltd
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Abstract

一种离线玻璃基板翘曲检测装置,属于玻璃基板精密测量设备领域,结构中包括检测平台以及借助于位移机构设置在检测平台上方的检测机构,其关键在于:所述检测平台的材质为大理石、其上端面设有待检玻璃基板的放置槽,在放置槽内均匀排列有与放置槽深度等高的凸台。通过对检测平台的放置面进行改进,解决了待检玻璃基板下端面与检测平台上端面之间夹持空气的问题,提高了装置的测量精度。

An off-line glass substrate warpage detection device belongs to the field of precision measurement equipment for glass substrates. The structure includes a detection platform and a detection mechanism arranged above the detection platform by means of a displacement mechanism. The key lies in: the material of the detection platform is marble, The upper end surface is provided with a placement groove for the glass substrate to be inspected, and bosses with a height equal to the depth of the placement groove are evenly arranged in the placement groove. By improving the placement surface of the detection platform, the problem of air clamping between the lower end surface of the glass substrate to be inspected and the upper end surface of the detection platform is solved, and the measurement accuracy of the device is improved.

Description

一种离线玻璃基板翘曲检测装置An off-line glass substrate warpage detection device

技术领域 technical field

本实用新型属于玻璃基板精密测量设备领域,具体涉及一种离线玻璃基板翘曲检测装置。 The utility model belongs to the field of precision measuring equipment for glass substrates, in particular to an off-line glass substrate warpage detection device.

背景技术 Background technique

在液晶玻璃基板下拉法成型过程中,有专用的辊子将玻璃基板拉成所需要的厚度,在此拉制过程中玻璃基板表面会产生凸凹不平翘曲现象,基于玻璃基板产品品质规格要求,需要通过翘曲测量设备检测玻璃基板的翘曲数据。测量原理就是测定玻璃基板上各待测点的相对高度,然后计算最高点与最低点之间的差值,差值的大小反应出整板翘曲大小。 During the down-draw forming process of liquid crystal glass substrates, there are special rollers to pull the glass substrates to the required thickness. During the drawing process, the surface of the glass substrates will produce uneven and warped phenomena. Based on the quality specifications of the glass substrate products, it is necessary to The warpage data of the glass substrate is detected by warpage measurement equipment. The measurement principle is to measure the relative height of each point to be measured on the glass substrate, and then calculate the difference between the highest point and the lowest point, which reflects the warpage of the entire board.

现有玻璃基板翘曲检测装置,其结构包括花岗石检测平台、激光探针、XYZ向位移机构。由于生产出的玻璃基板表面并不是绝对平整,当放置在花岗石检测平台上时会使玻璃基板下端面与检测平台上端面之间夹持一定量的空气,在激光探针检测玻璃基板翘曲度时造成测量误差。 The existing glass substrate warpage detection device has a structure including a granite detection platform, a laser probe, and an XYZ displacement mechanism. Since the surface of the produced glass substrate is not absolutely flat, when it is placed on the granite inspection platform, a certain amount of air will be clamped between the lower end surface of the glass substrate and the upper end surface of the inspection platform. measurement error due to curvature.

发明内容 Contents of the invention

本实用新型要解决的技术问题是提供一种离线玻璃基板翘曲检测装置,通过对检测平台的放置面进行改进,解决了待检玻璃基板下端面与检测平台上端面之间夹持空气的问题,提高了装置的测量精度。 The technical problem to be solved by the utility model is to provide an off-line glass substrate warpage detection device. By improving the placement surface of the detection platform, the problem of clamping air between the lower end surface of the glass substrate to be inspected and the upper end surface of the detection platform is solved. , improving the measurement accuracy of the device.

本实用新型采用的技术方案:一种离线玻璃基板翘曲检测装置,结构中包括检测平台以及借助于位移机构设置在检测平台上方的检测机构,其关键在于:所述检测平台的材质为大理石、其上端面设有待检玻璃基板的放置槽,在放置槽内均匀排列有与放置槽深度等高的凸台。 The technical scheme adopted by the utility model: an off-line glass substrate warpage detection device, the structure includes a detection platform and a detection mechanism arranged above the detection platform by means of a displacement mechanism, the key lies in: the material of the detection platform is marble, The upper end surface is provided with a placement groove for the glass substrate to be inspected, and bosses with a height equal to the depth of the placement groove are evenly arranged in the placement groove.

放置槽的长度和宽度均大于待检玻璃基板。 Both the length and the width of the placement groove are larger than the glass substrate to be inspected.

凸台水平截面的形状为方形,或圆形,或三角形。 The shape of the horizontal section of the boss is square, or circular, or triangular.

凸台上端面的表面粗糙度等级为00级。 The surface roughness grade of the upper end face of the boss is 00 grade.

位移机构包括支架、设置在支架上的X向位移导轨、设置在X向位移导轨上的Z向位移导轨以及设置在Z向位移导轨上的Y向位移导轨,所述检测机构设置在Y向位移导轨上。 The displacement mechanism includes a bracket, an X-direction displacement guide rail arranged on the bracket, a Z-direction displacement guide rail arranged on the X-direction displacement guide rail, and a Y-direction displacement guide rail arranged on the Z-direction displacement guide rail. The detection mechanism is arranged on the Y-direction displacement guide rail. rails.

检测机构为激光探针,激光探针的输出端与控制系统的显示装置的输出端连接。 The detection mechanism is a laser probe, and the output end of the laser probe is connected with the output end of the display device of the control system.

采用本实用新型产生的有益效果:本实用新型通过在检测平台上设置放置槽以及在放置槽内均匀排列设置凸台,这两项技术改进,解决了待检玻璃基板下端面与检测平台上端面之间夹持空气的问题,提高了装置的测量精度。 Beneficial effects produced by adopting the utility model: the utility model solves the problems between the lower end surface of the glass substrate to be inspected and the upper end surface of the detection platform by setting a placement groove on the detection platform and evenly arranging bosses in the placement groove. The problem of clamping air between them improves the measurement accuracy of the device.

附图说明 Description of drawings

图1是本实用新型的结构示意图; Fig. 1 is a structural representation of the utility model;

图2是待检玻璃基板在检测平台上放置的剖视示意图; Fig. 2 is a schematic cross-sectional view of placing a glass substrate to be inspected on a detection platform;

附图中:1是检测平台,1-1是放置槽,1-2是凸台,2是待检玻璃基板,3-1是支架,3-2是X向位移导轨,3-3是Z向位移导轨,3-4是Y向位移导轨,4是检测机构。 In the attached drawings: 1 is the detection platform, 1-1 is the placement slot, 1-2 is the boss, 2 is the glass substrate to be inspected, 3-1 is the bracket, 3-2 is the X-direction displacement guide rail, 3-3 is the Z to the displacement guide rail, 3-4 is the Y direction displacement guide rail, and 4 is the detection mechanism.

具体实施方式 detailed description

参看附图1-2,一种离线玻璃基板翘曲检测装置,结构中包括检测平台1以及借助于位移机构设置在检测平台1上方的检测机构4,其关键在于:所述检测平台1的材质为大理石、其上端面设有待检玻璃基板2的放置槽1-1,在放置槽1-1内均匀排列有与放置槽1-1深度等高的凸台1-2。放置槽1-1的长度和宽度均大于待检玻璃基板2;凸台1-2水平截面的形状为方形,或圆形,或三角形;凸台1-2上端面的表面粗糙度等级为00级。当待检玻璃基板2放置在检测平台1上的放置槽1-1内时,待检玻璃基板2的下端面与凸台1-2的上端面接触,由于待检玻璃基板2自重,待检玻璃基板2的下端面与凸台1-2的上端面之间的空气从凸台1-2间的间隙排出,使凸台1-2的上端面与待检玻璃基板2的下端面完全贴合,保证了检测机构4检测待检玻璃基板2翘曲度的准确性,测得相对真实、准确的参数值;并且借助于凸台1-2的设置,降低了待检玻璃基板2与检测平台1之间的摩擦系数,防止待检玻璃基板2与检测平台1之间产生吸附现象,影响待检玻璃基板2真实翘曲度。 Referring to accompanying drawings 1-2, an off-line glass substrate warpage detection device, the structure includes a detection platform 1 and a detection mechanism 4 arranged above the detection platform 1 by means of a displacement mechanism. The key lies in: the material of the detection platform 1 It is marble, and its upper end surface is provided with a placement groove 1-1 for the glass substrate 2 to be inspected. In the placement groove 1-1, there are evenly arranged bosses 1-2 with the same height as the placement groove 1-1. The length and width of the placement groove 1-1 are larger than the glass substrate 2 to be inspected; the shape of the horizontal section of the boss 1-2 is square, or circular, or triangular; the surface roughness grade of the upper end surface of the boss 1-2 is 00 class. When the glass substrate 2 to be inspected is placed in the placement groove 1-1 on the detection platform 1, the lower end surface of the glass substrate 2 to be inspected is in contact with the upper end surface of the boss 1-2. The air between the lower end surface of the glass substrate 2 and the upper end surface of the boss 1-2 is discharged from the gap between the bosses 1-2, so that the upper end surface of the boss 1-2 is completely attached to the lower end surface of the glass substrate 2 to be tested. combined to ensure the accuracy of the detection mechanism 4 in detecting the warpage of the glass substrate 2 to be inspected, and to measure relatively true and accurate parameter values; The coefficient of friction between the platforms 1 prevents the phenomenon of adsorption between the glass substrate 2 to be inspected and the detection platform 1, which affects the true warpage of the glass substrate 2 to be inspected.

位移机构3包括支架3-1、设置在支架3-1上的X向位移导轨3-2、设置在X向位移导轨3-2上的Z向位移导轨3-3以及设置在Z向位移导轨3-3上的Y向位移导轨3-4,所述检测机构4设置在Y向位移导轨3-4上。支架3-1设置在检测平台1的四周,X向位移导轨3-2设置在支架3-1上、并位于检测平台1的两侧;X向位移导轨3-2、Z向位移导轨3-3和Y向位移导轨3-4为滑轨与滑块构成的导向轨或滚珠丝杠。 The displacement mechanism 3 comprises a support 3-1, an X direction displacement guide rail 3-2 arranged on the support 3-1, a Z direction displacement guide rail 3-3 arranged on the X direction displacement guide rail 3-2, and a Z direction displacement guide rail arranged on the Z direction displacement guide rail. 3-3 on the Y-direction displacement guide rail 3-4, and the detection mechanism 4 is arranged on the Y-direction displacement guide rail 3-4. The bracket 3-1 is arranged around the detection platform 1, the X-direction displacement guide rail 3-2 is arranged on the support 3-1, and is located on both sides of the detection platform 1; the X-direction displacement guide rail 3-2, the Z-direction displacement guide rail 3- 3 and Y direction displacement guide rail 3-4 are guide rails or ball screws formed by slide rails and sliders.

检测机构4为激光探针,激光探针的输出端与控制系统的显示装置的输出端连接。 The detection mechanism 4 is a laser probe, and the output end of the laser probe is connected with the output end of the display device of the control system.

在具体实施时,在待检玻璃基板2翘曲检测过程中,待检玻璃基板2被放置在检测平台1上的放置槽1-1内时,待检玻璃基板2的下端面与凸台1-2的上端面完全贴合接触;借助于X向位移导轨3-2、Z向位移导轨3-3和Y向位移导轨3-4,检测机构4按等距离检测放置在检测平台1上的待检玻璃基板2各个部位的翘曲度,进而可根据测得相对准确的参数值对生产的玻璃基板进行把控。 In specific implementation, during the warpage detection process of the glass substrate 2 to be inspected, when the glass substrate 2 to be inspected is placed in the placement groove 1-1 on the inspection platform 1, the lower end surface of the glass substrate to be inspected 2 and the boss 1 The upper end surface of -2 is completely in contact with; by means of the X-direction displacement guide rail 3-2, the Z-direction displacement guide rail 3-3 and the Y-direction displacement guide rail 3-4, the detection mechanism 4 detects the objects placed on the detection platform 1 at equal distances. The warpage of each part of the glass substrate 2 to be inspected can then be used to control the produced glass substrate according to relatively accurate parameter values measured.

Claims (6)

1. an off-line glass substrate wrapping pick-up unit, structure comprises detection platform (1) and is arranged on the testing agency (4) of detection platform (1) top by means of displacement mechanism, it is characterized in that: the standing groove (1-1) that the material of described detection platform (1) is marble, its upper surface is provided with glass substrate to be checked (2), evenly distributed in standing groove (1-1) have the boss (1-2) contour with standing groove (1-1) degree of depth.
2. off-line glass substrate wrapping pick-up unit according to claim 1, is characterized in that: the length of described standing groove (1-1) and width are all greater than glass substrate to be checked (2).
3. off-line glass substrate wrapping pick-up unit according to claim 1, is characterized in that: the shape of described boss (1-2) horizontal section is square, or circular, or triangle.
4. the off-line glass substrate wrapping pick-up unit according to claim 1 or 3, is characterized in that: the roughness grade of described boss (1-2) upper surface is 00 grade.
5. off-line glass substrate wrapping pick-up unit according to claim 1, it is characterized in that: institute's displacement mechanism comprises support (3-1), be arranged on X on support (3-1) to displacement guide rail (3-2), be arranged on X to the Z-direction displacement guide rail (3-3) on displacement guide rail (3-2) and the Y-direction displacement guide rail (3-4) that is arranged on Z-direction displacement guide rail (3-3), described testing agency (4) is arranged on Y-direction displacement guide rail (3-4).
6. off-line glass substrate wrapping pick-up unit according to claim 1 or 5, is characterized in that: described testing agency (4) is laser probe, and the output terminal of laser probe is connected with the output terminal of the display device of control system.
CN201520799378.2U 2015-10-16 2015-10-16 Off -line glass substrate warpage detection device Expired - Lifetime CN205175359U (en)

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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107063846A (en) * 2017-04-12 2017-08-18 东旭科技集团有限公司 A kind of method for the creep rate for measuring front arch
CN109387154A (en) * 2018-11-29 2019-02-26 中国建筑材料科学研究总院有限公司 Hot procedure on-line measurement system and transparent material dynamic deformation measurement method
CN109443222A (en) * 2018-10-23 2019-03-08 彩虹(合肥)液晶玻璃有限公司 A kind of glass substrate test platform and system
CN109443223A (en) * 2018-10-25 2019-03-08 彩虹(合肥)液晶玻璃有限公司 A kind of glass substrate wrapping degree measurement base station and device
CN110672042A (en) * 2019-09-25 2020-01-10 深圳市铭辉源科技有限公司 Warping degree tester
CN112461164A (en) * 2020-12-09 2021-03-09 蚌埠中光电科技有限公司 Advanced generation TFT-LCD glass substrate air supporting device
CN113155023A (en) * 2021-04-02 2021-07-23 甘肃旭盛显示科技有限公司 Method and system for measuring glass warping degree of liquid crystal substrate
CN113340224A (en) * 2021-06-08 2021-09-03 彩虹(合肥)液晶玻璃有限公司 Panel warpage deformation on-line measuring device based on vertical scanning
CN113945166A (en) * 2021-11-17 2022-01-18 阿姆斯壮地面材料(中国)有限公司 Equipment and method for accurately measuring warping of PVC (polyvinyl chloride) floor
CN114427837A (en) * 2022-01-13 2022-05-03 山西光兴光电科技有限公司 Glass warpage degree detection device
CN115451855A (en) * 2022-09-23 2022-12-09 达濠科技(东莞)有限公司 Warping degree detection equipment for glass cover plate processing
CN116499363A (en) * 2023-06-28 2023-07-28 光测工业智能装备(南京)有限公司 Full-automatic intelligent measurement system of non-contact liquid crystal glazing
CN120684983A (en) * 2025-08-22 2025-09-23 智翼博智能科技(苏州)有限公司 Method, device, equipment and medium for measuring the size and warpage of ceramic substrates used for heat dissipation of high-power power electronic modules

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107063846A (en) * 2017-04-12 2017-08-18 东旭科技集团有限公司 A kind of method for the creep rate for measuring front arch
CN109443222A (en) * 2018-10-23 2019-03-08 彩虹(合肥)液晶玻璃有限公司 A kind of glass substrate test platform and system
CN109443223A (en) * 2018-10-25 2019-03-08 彩虹(合肥)液晶玻璃有限公司 A kind of glass substrate wrapping degree measurement base station and device
CN109387154A (en) * 2018-11-29 2019-02-26 中国建筑材料科学研究总院有限公司 Hot procedure on-line measurement system and transparent material dynamic deformation measurement method
CN110672042A (en) * 2019-09-25 2020-01-10 深圳市铭辉源科技有限公司 Warping degree tester
CN112461164A (en) * 2020-12-09 2021-03-09 蚌埠中光电科技有限公司 Advanced generation TFT-LCD glass substrate air supporting device
CN113155023A (en) * 2021-04-02 2021-07-23 甘肃旭盛显示科技有限公司 Method and system for measuring glass warping degree of liquid crystal substrate
CN113340224A (en) * 2021-06-08 2021-09-03 彩虹(合肥)液晶玻璃有限公司 Panel warpage deformation on-line measuring device based on vertical scanning
CN113340224B (en) * 2021-06-08 2023-01-03 彩虹(合肥)液晶玻璃有限公司 Panel warpage deformation on-line measuring device based on vertical scanning
CN113945166A (en) * 2021-11-17 2022-01-18 阿姆斯壮地面材料(中国)有限公司 Equipment and method for accurately measuring warping of PVC (polyvinyl chloride) floor
CN114427837A (en) * 2022-01-13 2022-05-03 山西光兴光电科技有限公司 Glass warpage degree detection device
CN115451855A (en) * 2022-09-23 2022-12-09 达濠科技(东莞)有限公司 Warping degree detection equipment for glass cover plate processing
CN116499363A (en) * 2023-06-28 2023-07-28 光测工业智能装备(南京)有限公司 Full-automatic intelligent measurement system of non-contact liquid crystal glazing
CN116499363B (en) * 2023-06-28 2023-09-08 光测工业智能装备(南京)有限公司 Full-automatic intelligent measurement system of non-contact liquid crystal glazing
CN120684983A (en) * 2025-08-22 2025-09-23 智翼博智能科技(苏州)有限公司 Method, device, equipment and medium for measuring the size and warpage of ceramic substrates used for heat dissipation of high-power power electronic modules

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Denomination of utility model: Off -line glass substrate warpage detection device

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Granted publication date: 20160420