CN204964934U - Lighting tool - Google Patents

Lighting tool Download PDF

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Publication number
CN204964934U
CN204964934U CN201520678795.1U CN201520678795U CN204964934U CN 204964934 U CN204964934 U CN 204964934U CN 201520678795 U CN201520678795 U CN 201520678795U CN 204964934 U CN204964934 U CN 204964934U
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probe
lighting jig
sheet metal
lighting
jig
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马铁军
李森龙
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InfoVision Optoelectronics Kunshan Co Ltd
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InfoVision Optoelectronics Kunshan Co Ltd
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Abstract

The utility model provides a lighting tool, lighting tool includes the tool base, is located the probe structure of tool base top, the probe structure includes the metal sheet, is located the support of metal sheet top and running through the metal sheet with a plurality of probe pipes of support, probe guan zhongjun has plugged in a probe, be provided with tree fork probe on the probe, the spring structure is set to some of probe, the spring structure is located the top of tree fork probe, metal sheet ground connection when lighting tool is in not operating condition, tree fork probe with the metal sheet contact. The utility model provides a lighting tool can effectively reduce electrostatic discharge's emergence and measure the convenience.

Description

点灯治具Lighting fixture

技术领域technical field

本实用新型涉及一种点灯治具,特别是涉及一种防静电且易测量的点灯治具。The utility model relates to a lighting fixture, in particular to an antistatic and easy-to-measure lighting fixture.

背景技术Background technique

现有的平面显示器,如液晶显示器(LiquidCrystalDisplay,LCD)的显示面板在制作完成后,需要进行点灯测试。通过点灯治具提供测试信号给显示面板,显示面板会按照输入的测试信号显示不同的画面,通过不同画面的显示效果,便可判断显示面板存在的不良。在显示面板出现不良的时候要对显示面板进行分析,在分析的过程中同样需要使用点灯治具对显示面板进行点灯测试,即通过点灯治具加载测试信号来进行确认。点灯治具内置探针主要应用于测试各种显示面板,在测试时探针与显示面板的对应引脚接触,以提供测试信号给显示面板。Existing flat-panel displays, such as liquid crystal displays (Liquid Crystal Display, LCD) display panels, need to be tested for lighting after the production is completed. The test signal is provided to the display panel through the lighting fixture, and the display panel will display different pictures according to the input test signal. Through the display effect of different pictures, it is possible to judge the defect of the display panel. When the display panel is defective, it is necessary to analyze the display panel. During the analysis process, it is also necessary to use the lighting fixture to perform a lighting test on the display panel, that is, to confirm by loading the test signal through the lighting fixture. The built-in probes of the lighting fixture are mainly used to test various display panels. During the test, the probes are in contact with the corresponding pins of the display panel to provide test signals to the display panel.

目前,静电放电(Electro-StaticDischarge,ESD)已成为电子产品和设备的一种危害,造成电子产品和设备的功能紊乱甚至部件损坏。点灯治具的探针上也容易产生静电,发生静电放电的现象,在进行点灯测试时极易造成显示面板上的栅极线或数据线的断路或短路。另外,由于每根探针仅连接一根探针连接线,不易分辨每根探针连接线的功能,针对GIA(GateInArray,即将栅极驱动器集成在阵列基板上)型的显示面板,在进行相关信号的波形的设计验证测试(DesignVerificationTest,DVT)时,需要反复扎针测试,费时费力,给测试带来不便。Currently, electrostatic discharge (Electro-Static Discharge, ESD) has become a hazard to electronic products and equipment, causing dysfunction and even damage to electronic products and equipment. Static electricity is also likely to be generated on the probes of the lighting fixture, and electrostatic discharge occurs, and it is very easy to cause open circuit or short circuit of the grid line or data line on the display panel during the lighting test. In addition, since each probe is only connected to one probe connection line, it is not easy to distinguish the function of each probe connection line. For the GIA (GateInArray, that is, the gate driver is integrated on the array substrate) type display panel, the correlation During the design verification test (DesignVerificationTest, DVT) of the waveform of the signal, it is necessary to repeat the needle sticking test, which is time-consuming and laborious, and brings inconvenience to the test.

实用新型内容Utility model content

本实用新型的目的包括提供一种点灯治具,可减少静电放电的发生以及方便测试,从而解决现有技术中的静电放电和测试不方便的问题。The purpose of the utility model includes providing a lighting fixture, which can reduce the occurrence of electrostatic discharge and facilitate testing, thereby solving the problems of electrostatic discharge and inconvenient testing in the prior art.

具体地,本实用新型的实施例提供一种点灯治具,所述点灯治具包括治具底座、位于所述治具底座上方的探针结构,所述探针结构包括金属板、位于所述金属板上方的支架以及贯穿所述金属板和所述支架的多个探针管,所述探针管中均插有一根探针,所述探针上设置有树叉探针,所述探针的一部分设置成弹簧结构,所述弹簧结构位于所述树叉探针的上方,所述金属板接地,在所述点灯治具处于未工作状态时,所述树叉探针与所述金属板接触。Specifically, an embodiment of the present utility model provides a lighting fixture, the lighting fixture includes a fixture base, a probe structure located above the fixture base, the probe structure includes a metal plate, located on the The bracket above the metal plate and a plurality of probe tubes passing through the metal plate and the bracket, a probe is inserted in each of the probe tubes, a tree fork probe is arranged on the probe, and the probe A part of the needle is set as a spring structure, and the spring structure is located above the tree fork probe, and the metal plate is grounded. When the lighting fixture is in a non-working state, the tree fork probe and the metal plate board contact.

优选地,所述探针管还设置有卡槽,所述卡槽容纳所述树叉探针,所述卡槽的开口方向与所述树叉探针的延伸方向一致。Preferably, the probe tube is further provided with a draw slot, the draw slot accommodates the tree-fork probe, and the opening direction of the draw-in slot is consistent with the extension direction of the tree-fork probe.

优选地,所述弹簧结构位于所述支架和所述金属板之间。Preferably, the spring structure is located between the bracket and the metal plate.

优选地,所述金属板上设置有n个孔洞,其中,n为自然数且大于1,所述孔洞与所述探针管一一对应,一个探针管穿过一个孔洞。Preferably, n holes are provided on the metal plate, wherein n is a natural number greater than 1, the holes correspond to the probe tubes one by one, and one probe tube passes through one hole.

优选地,所述树叉探针的长度大于所述孔洞的半径。Preferably, the length of the tree fork probe is greater than the radius of the hole.

优选地,所述树叉探针与所述探针的夹角小于或者等于90度。Preferably, the included angle between the tree branch probe and the probe is less than or equal to 90 degrees.

优选地,所述金属板通过螺丝固定于所述支架的底部。Preferably, the metal plate is fixed to the bottom of the bracket by screws.

优选地,所述探针的上端部还设置有探针连接线,所述探针连接线包括第一连接线和第二连接线,所述第一连接线和所述第二连接线均连接在所述探针的上端部。Preferably, the upper end of the probe is also provided with a probe connection line, the probe connection line includes a first connection line and a second connection line, and the first connection line and the second connection line are both connected to at the upper end of the probe.

优选地,所述支架的下表面还设置有触发开关,所述治具底座的上表面设置有电源开关,所述触发开关与电源开关处于同一个垂直面上。Preferably, a trigger switch is provided on the lower surface of the bracket, and a power switch is provided on the upper surface of the jig base, and the trigger switch and the power switch are on the same vertical plane.

优选地,所述触发开关的长度小于所述探针管的长度。Preferably, the length of the trigger switch is less than the length of the probe tube.

由于本实用新型实施例所提供的点灯治具的探针结构可通过树叉探针与接地金属板的接触,释放掉滞留在探针上的静电,因此可减少静电放电的发生。并且该点灯治具结构简单,可连续进行点灯检测,提高了工作效率。Since the probe structure of the lighting fixture provided by the embodiment of the present invention can release the static electricity retained on the probe through the contact between the tree fork probe and the grounded metal plate, the occurrence of electrostatic discharge can be reduced. Moreover, the lighting fixture has a simple structure, can continuously perform lighting detection, and improves work efficiency.

上述说明仅是本实用新型技术方案的概述,为了能够更清楚了解本实用新型的技术手段,而可依照说明书的内容予以实施,并且为了让本实用新型的上述和其他目的、特征和优点能够更明显易懂,以下特举较佳实施例,并配合附图,详细说明如下。The above description is only an overview of the technical solutions of the present utility model. In order to better understand the technical means of the present utility model, it can be implemented according to the contents of the description, and in order to make the above-mentioned and other purposes, features and advantages of the present utility model better It is obvious and easy to understand. The preferred embodiments are specifically cited below, together with the accompanying drawings, and detailed descriptions are as follows.

附图说明Description of drawings

图1为本实用新型一实施例所提供的一种点灯治具的结构示意图。Fig. 1 is a schematic structural diagram of a lighting fixture provided by an embodiment of the present invention.

图2为图1所示的点灯治具的局部放大结构示意图。FIG. 2 is a partially enlarged structural schematic diagram of the lighting fixture shown in FIG. 1 .

图3a为图1所示的点灯治具的一探针在测试前的状态示意图;Fig. 3a is a schematic diagram of the state of a probe of the lighting fixture shown in Fig. 1 before testing;

图3b为图1所示的点灯治具的一探针在测试中的状态示意图;Fig. 3b is a schematic diagram of a state of a probe of the lighting fixture shown in Fig. 1 during testing;

图3c为图1所示的点灯治具的一探针在测试后的状态示意图。FIG. 3 c is a schematic diagram of a probe of the lighting fixture shown in FIG. 1 after testing.

具体实施方式detailed description

为更进一步阐述本实用新型为达成预定实用新型目的所采取的技术手段及功效,以下结合附图及较佳实施例,对依据本实用新型提出的点灯治具及其具体实施方式、方法、步骤、结构、特征及功效,详细说明如后。In order to further explain the technical means and effects of the utility model to achieve the intended purpose of the utility model, the lighting fixture proposed according to the utility model and its specific implementation methods, methods and steps will be described below in conjunction with the accompanying drawings and preferred embodiments. , structure, feature and effect, detailed description is as follows.

有关本实用新型的前述及其他技术内容、特点与功效,在以下配合参考图式的较佳实施例的详细说明中将可清楚的呈现。通过具体实施方式的说明,当可对本实用新型为达成预定目的所采取的技术手段及功效得以更加深入且具体的了解,然而所附图式仅是提供参考与说明之用,并非用来对本实用新型加以限制。The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of preferred embodiments with reference to the drawings. Through the description of the specific implementation mode, the technical means and effects of the utility model to achieve the predetermined purpose can be understood more deeply and specifically, but the attached drawings are only for reference and description, and are not used to explain the utility model. new restrictions.

请一并参考图1和图2,其中,图1为本实用新型一实施例所提供的一种点灯治具的结构示意图,图2为图1所示的点灯治具的局部放大结构示意图。如图1和图2所示,该点灯治具包括治具底座10和位于治具底座10上方的探针结构20。该治具底座10的上表面设置有电源开关111。该探针结构20包括金属板21、金属板21上方的支架23以及贯穿该金属板21和支架23的多个探针管22。优选地,该支架23的材料为塑料。该金属板21接地,金属板21通过螺丝211固定于支架23的下方,金属板21上设置有n个孔洞212,其中,n为自然数且大于1,该孔洞212与探针管22一一对应,一个探针管22穿过一个孔洞212。该支架23的下表面设置有触发开关231,该触发开关231与电源开关111在同一个垂直面上,当探针结构20向下移动进行测试时,触发开关231与电源开关111接触,则接通点灯治具与待测面板,进入检测状态。在本实施例中,该触发开关231的长度小于探针管22的长度。Please refer to FIG. 1 and FIG. 2 together, wherein FIG. 1 is a schematic structural diagram of a lighting fixture provided by an embodiment of the present invention, and FIG. 2 is a partially enlarged structural schematic diagram of the lighting fixture shown in FIG. 1 . As shown in FIGS. 1 and 2 , the lighting fixture includes a fixture base 10 and a probe structure 20 located above the fixture base 10 . A power switch 111 is disposed on the upper surface of the jig base 10 . The probe structure 20 includes a metal plate 21 , a bracket 23 above the metal plate 21 , and a plurality of probe tubes 22 passing through the metal plate 21 and the bracket 23 . Preferably, the bracket 23 is made of plastic. The metal plate 21 is grounded, and the metal plate 21 is fixed below the bracket 23 by screws 211. The metal plate 21 is provided with n holes 212, wherein n is a natural number and greater than 1. The holes 212 correspond to the probe tubes 22 one by one. , a probe tube 22 passes through a hole 212 . The lower surface of the support 23 is provided with a trigger switch 231, which is on the same vertical plane as the power switch 111. Pass the lighting fixture and the panel to be tested to enter the detection state. In this embodiment, the length of the trigger switch 231 is less than the length of the probe tube 22 .

请再参考图2,如图2所示,每一探针管22上均设置有卡槽222,每个探针管22中均插有一根探针24,每个探针24上均设置有一树叉探针242(请一并参考图3a-3c),该卡槽222容纳该树叉探针242,该卡槽222的开口方向与树叉探针242的延伸方向一致,树叉探针242可在卡槽222内上下运动,也就是说,该卡槽222是为了该树叉探针242而设置。优选地,树叉探针242的长度大于金属板21上的孔洞212的半径,树叉探针242与探针24的夹角小于或等于90度,在该点灯治具处于未工作状态时,该树叉探针242与该金属板21接触。本实施例中,探针24的一部分设置成弹簧结构244,该弹簧结构244位于树叉探针242上方。Please refer to FIG. 2 again. As shown in FIG. 2, each probe tube 22 is provided with a slot 222, and each probe tube 22 is inserted with a probe 24, and each probe 24 is provided with a Tree fork probe 242 (please refer to Figs. 3a-3c together), the card slot 222 accommodates the tree fork probe 242, the opening direction of the card slot 222 is consistent with the extension direction of the tree fork probe 242, the tree fork probe 242 can move up and down in the slot 222 , that is to say, the slot 222 is provided for the tree fork probe 242 . Preferably, the length of the tree fork probe 242 is greater than the radius of the hole 212 on the metal plate 21, and the angle between the tree fork probe 242 and the probe 24 is less than or equal to 90 degrees. When the lighting fixture is in a non-working state, The tree fork probe 242 is in contact with the metal plate 21 . In this embodiment, a part of the probe 24 is configured as a spring structure 244 , and the spring structure 244 is located above the tree fork probe 242 .

该支架23上还设置有塞子224,该塞子224内嵌于支架23的上表面并与探针管22的上端部连接,同时,探针24贯穿塞子224,该探针24的上端部还连接有探针连接线226,探针连接线226包括第一连接线2262和第二连接线2264,该第一连接线2262和该第二连接线2264均连接在探针24的上端部。其中,第一连接线2262用于提供相应的信号给与该第一连接线2262连接的探针24,该第二连接线2264用来标明第一连接线2262的功能。The bracket 23 is also provided with a plug 224, the plug 224 is embedded in the upper surface of the bracket 23 and connected with the upper end of the probe tube 22, meanwhile, the probe 24 runs through the plug 224, and the upper end of the probe 24 is also connected There is a probe connecting wire 226 , and the probe connecting wire 226 includes a first connecting wire 2262 and a second connecting wire 2264 , both of which are connected to the upper end of the probe 24 . Wherein, the first connection line 2262 is used to provide corresponding signals to the probe 24 connected to the first connection line 2262 , and the second connection line 2264 is used to indicate the function of the first connection line 2262 .

请一并参考图3a、图3b和图3c,其中,图3a为图1所示的点灯治具的一探针在扎针前的状态示意图,图3b为图1所示的点灯治具的一探针在扎针中的状态示意图,图3c为图1所示的点灯治具的一探针在扎针后的状态示意图。如图3a、图3b和图3c所示,探针24上的树叉探针242可通过金属板21上的孔洞212穿过金属板21,探针24在位于金属板21与支架23之间的位置上设置有弹簧结构244。测试前,未施加任何压力,探针24与面板30不接触,树叉探针242与金属板21接触;测试中,由于支架23与金属板21由于螺丝211固定在一起,施加压力后,支架23与金属板21整体下移,使得探针24下移并与面板30接触,由于探针24与面板30接触,探针24受到面板30的反作用力,使弹簧结构244被压缩而产生形变,树叉探针242与金属板21分离,同时,请一并参考图1,触发开关231下移并与电源开关111接触,接通电源进行测试;测试后,撤去压力,并使支架23与金属板21整体上移,使得探针24上移并与面板30分离,弹簧结构244恢复原状,树叉探针242与金属板21接触,同时,请一并参考图1,触发开关231上移与电源开关111分离,关闭电源,测试完毕。Please refer to Fig. 3a, Fig. 3b and Fig. 3c together, wherein, Fig. 3a is a schematic diagram of the status of a probe of the lighting fixture shown in Fig. A schematic diagram of the state of the probe in the needle insertion. FIG. 3c is a schematic diagram of the state of a probe of the lighting fixture shown in FIG. 1 after the needle is inserted. As shown in Figure 3a, Figure 3b and Figure 3c, the tree fork probe 242 on the probe 24 can pass through the metal plate 21 through the hole 212 on the metal plate 21, and the probe 24 is located between the metal plate 21 and the bracket 23 A spring structure 244 is provided at the position. Before the test, no pressure is applied, the probe 24 does not contact the panel 30, and the tree fork probe 242 contacts the metal plate 21; during the test, because the bracket 23 and the metal plate 21 are fixed together by the screw 211, after applying pressure, the bracket 23 and the metal plate 21 move down as a whole, so that the probe 24 moves down and contacts the panel 30. Since the probe 24 is in contact with the panel 30, the probe 24 is subjected to the reaction force of the panel 30, causing the spring structure 244 to be compressed and deformed. The tree fork probe 242 is separated from the metal plate 21. At the same time, please refer to FIG. 1, the trigger switch 231 moves down and contacts the power switch 111, and the power is turned on for testing; after the test, the pressure is removed, and the bracket 23 and the metal The board 21 moves up as a whole, so that the probe 24 moves up and separates from the panel 30, the spring structure 244 returns to its original state, and the tree fork probe 242 contacts the metal plate 21. At the same time, please refer to FIG. 1, the trigger switch 231 moves up and The power switch 111 is separated, the power is turned off, and the test is completed.

其中,在测试过程中,探针24与面板30接触会产生静电,静电会滞留在探针24上,测试结束,探针24上移并与面板分离,树叉探针242与金属板21接触,由于该金属板21接地,从而可以使探针24上滞留的静电可通过树叉探针242和金属板21得到充分释放,因此可减少静电放电的发生。并且该点灯治具结构简单,可连续进行点灯检测,提高了工作效率。另外,由于第二连接线2264标明了第一连接线2262的功能,针对GIA(GateInArray,即将栅极驱动器集成在阵列基板上)型的显示面板,在进行相关信号的波形的设计验证测试(DesignVerificationTest,DVT)时,就可以利用这些第二连接线2264来分辨测试信号的类型,无需反复扎针测试,进一步提高工作效率。Wherein, in the testing process, the contact between the probe 24 and the panel 30 will generate static electricity, and the static electricity will stay on the probe 24. After the test is over, the probe 24 moves up and separates from the panel, and the tree fork probe 242 contacts the metal plate 21. Since the metal plate 21 is grounded, the static electricity accumulated on the probe 24 can be fully released through the tree fork probe 242 and the metal plate 21, thereby reducing the occurrence of electrostatic discharge. Moreover, the lighting fixture has a simple structure, can continuously perform lighting detection, and improves work efficiency. In addition, since the second connection line 2264 indicates the function of the first connection line 2262, for a GIA (GateInArray, that is, the gate driver is integrated on the array substrate) type display panel, the design verification test (DesignVerificationTest) of the waveform of the relevant signal is carried out. , DVT), these second connection lines 2264 can be used to distinguish the type of the test signal, without repeated needle sticking test, further improving work efficiency.

以上所述仅为本实用新型的较佳实施例而已,并不用以限制本实用新型,任何熟悉本专业的技术人员,在不脱离本实用新型技术方案范围内,当可利用上述所揭示的技术内容作出些许变更或修饰等,凡在本实用新型的精神和原则之内所作的任何修改、等同替换或改进等,均应包含在本实用新型的保护范围之内。The above descriptions are only preferred embodiments of the present utility model, and are not intended to limit the present utility model. Any skilled person who is familiar with the profession can use the technology disclosed above without departing from the scope of the technical solution of the present utility model. Some changes or modifications are made in the content, and any modification, equivalent replacement or improvement made within the spirit and principles of the present utility model shall be included in the protection scope of the present utility model.

Claims (10)

1. a lighting jig, it is characterized in that, described lighting jig comprises jig base, be positioned at the probe structure above described jig base, described probe structure comprises sheet metal, be positioned at the support above described sheet metal and run through multiple probe tubes of described sheet metal and described support, a probe is all inserted with in described probe tube, described probe is provided with tree fork probe, a part for described probe is arranged to spring structure, described spring structure is positioned at the top of described tree fork probe, described sheet metal ground connection, when described lighting jig is in non-duty, described tree fork probe contacts with described sheet metal.
2. lighting jig as claimed in claim 1, it is characterized in that, described probe tube is also provided with draw-in groove, and described draw-in groove holds described tree and pitches probe, and the opening direction of described draw-in groove is with described to set the bearing of trend pitching probe consistent.
3. lighting jig as claimed in claim 1, it is characterized in that, described spring structure is between described support and described sheet metal.
4. lighting jig as claimed in claim 1, it is characterized in that, described sheet metal is provided with n hole, wherein, n is natural number and is greater than 1, described hole and described probe tube one_to_one corresponding, and a probe tube is through a hole.
5. lighting jig as claimed in claim 4, is characterized in that, the length of described tree fork probe is greater than the radius of described hole.
6. lighting jig as claimed in claim 1, is characterized in that, the angle of described tree fork probe and described probe is less than or equal to 90 degree.
7. lighting jig as claimed in claim 1, it is characterized in that, described sheet metal is screwed the bottom in described support.
8. lighting jig as claimed in claim 1, it is characterized in that, the upper end of described probe is also provided with probe connecting line, and described probe connecting line comprises the first connecting line and the second connecting line, and described first connecting line and described second connecting line are all connected to the upper end of described probe.
9. lighting jig as claimed in claim 1, it is characterized in that, the lower surface of described support is also provided with trigger switch, and the upper surface of described jig base is provided with power switch, and described trigger switch and power switch are on same vertical plane.
10. lighting jig as claimed in claim 9, it is characterized in that, the length of described trigger switch is less than the length of described probe tube.
CN201520678795.1U 2015-09-02 2015-09-02 Lighting tool Expired - Lifetime CN204964934U (en)

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108731950A (en) * 2018-04-08 2018-11-02 安徽江淮汽车集团股份有限公司 A kind of tire wear measurement rack
WO2019056624A1 (en) * 2017-09-25 2019-03-28 惠科股份有限公司 Probe device
CN110208972A (en) * 2019-05-27 2019-09-06 武汉华星光电技术有限公司 A kind of lighting jig and its application method
CN110780470A (en) * 2018-07-31 2020-02-11 日本电产三协株式会社 conveying system
WO2020056894A1 (en) * 2018-09-21 2020-03-26 惠科股份有限公司 Test device
CN115542033A (en) * 2021-06-30 2022-12-30 北京沃华慧通测控技术有限公司 Electrostatic discharge test system and test method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019056624A1 (en) * 2017-09-25 2019-03-28 惠科股份有限公司 Probe device
US11067599B2 (en) 2017-09-25 2021-07-20 HKC Corporation Limited Probe device
CN108731950A (en) * 2018-04-08 2018-11-02 安徽江淮汽车集团股份有限公司 A kind of tire wear measurement rack
CN110780470A (en) * 2018-07-31 2020-02-11 日本电产三协株式会社 conveying system
WO2020056894A1 (en) * 2018-09-21 2020-03-26 惠科股份有限公司 Test device
US10908181B2 (en) 2018-09-21 2021-02-02 HKC Corporation Limited Test device
CN110208972A (en) * 2019-05-27 2019-09-06 武汉华星光电技术有限公司 A kind of lighting jig and its application method
CN115542033A (en) * 2021-06-30 2022-12-30 北京沃华慧通测控技术有限公司 Electrostatic discharge test system and test method
CN115542033B (en) * 2021-06-30 2024-02-09 北京沃华慧通测控技术有限公司 Electrostatic discharge test system and test method

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