CN204052204U - Test handler - Google Patents
Test handler Download PDFInfo
- Publication number
- CN204052204U CN204052204U CN201420358590.0U CN201420358590U CN204052204U CN 204052204 U CN204052204 U CN 204052204U CN 201420358590 U CN201420358590 U CN 201420358590U CN 204052204 U CN204052204 U CN 204052204U
- Authority
- CN
- China
- Prior art keywords
- sorting
- operating desk
- testing
- automatic
- guide rail
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
The utility model provides a kind of Test handler, comprises frame, is installed on the automatic feeding mechanism in frame, mechanism for testing, sorting mechanism and automatic withdrawing mechanism successively; Described frame is provided with pan feeding operating desk and sorting operating desk, and described sorting operating desk is arranged from top to bottom, and automatic feeding mechanism is fixed on pan feeding operating desk by cushion blocking; Described mechanism for testing is installed on described sorting operating desk, comprises guide rail, separator, testing sensor, measuring head, and described guide rail is connected with automatic withdrawing mechanism with automatic feeding mechanism, and described separator is located at above measuring head; Described sorting mechanism is installed on described sorting operating desk, comprise sorting sub-material shuttle, material blanking tube, sorting sensor, defective products device, described defective products device is arranged away from guide rail, is connected with described sub-material shuttle by material blanking tube, and the top of described defective products device is located at by described sorting sensor; Described mechanism for testing comprises marking device, and described marking device is located at below described measuring head.
Description
Technical field
The utility model relates to field of semiconductor package, particularly relates to a kind of Test handler.
Background technology
The technological process of producing the semiconductor devices such as IC and two, triode comprises: bonding die, and---------aging---------surface treatment---is separated---test---braid---packaging---warehouse-in to floating screed to plastic packaging to bonding wire in printing.
At present, Test handler is the important checkout equipment of transistor, can realize the work of transistor multinomial technical indicator test and good and bad classification, but the Test handler of prior art, because structural design is reasonable not, cause complex structure volume large, the speed of service is slow, and automaticity is not high, work not smooth, production efficiency is low, and power consumption is higher, and the production cycle is longer.
Summary of the invention
The object of the present invention is to provide a kind of automaticity high, with short production cycle, the Test handler that test and classify precision is high.
For achieving the above object, the utility model provides a kind of Test handler, comprises frame, is installed on the automatic feeding mechanism in frame, mechanism for testing, sorting mechanism and automatic withdrawing mechanism successively; Described frame is provided with pan feeding operating desk and sorting operating desk, and described sorting operating desk is arranged from top to bottom, and automatic feeding mechanism is fixed on pan feeding operating desk by cushion blocking; Described mechanism for testing is installed on described sorting operating desk, comprises guide rail, separator, testing sensor, measuring head, and described guide rail is connected with automatic withdrawing mechanism with automatic feeding mechanism, and described separator is located at above measuring head; Described sorting mechanism is installed on described sorting operating desk, comprise sorting sub-material shuttle, material blanking tube, sorting sensor, defective products device, described defective products device is arranged away from guide rail, is connected with described sub-material shuttle by material blanking tube, and the top of described defective products device is located at by described sorting sensor.
Preferably, described mechanism for testing comprises marking device, and described marking device is located at below described measuring head.
Preferably, also comprise the touch-screen control device being installed on frame, the touch-screen that described touch-screen control device comprises circuit board and is electrically connected with circuit board, described circuit board and described feeding mechanism, mechanism for testing, sorting mechanism and automatic withdrawing mechanism are electrically connected.
Preferred, be also provided with and be installed on pan feeding operating desk and be electrically connected at the warning device of described circuit board.
Beneficial effect of the present invention: Test handler of the present utility model replaces with tremie pipe automatically, save cost of labor, reduce loaded down with trivial details manual operation, high precision measurement stepping, meet different clients, test mark one system, adjusts flexibly according to Production requirement and can test separately or mark separately, the compression production cycle, point lectotype at a high speed, according to production technology, simple to operation, the speed different according to different product adjustable.
In order to further understand feature of the present invention and technology contents, refer to following detailed description for the present invention and accompanying drawing, but accompanying drawing only provides reference and explanation use, is not used for being limited the present invention.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, by the specific embodiment of the present invention describe in detail, will make technical scheme of the present invention and other beneficial effect apparent.
In accompanying drawing,
Fig. 1 is the right view of the utility model Test handler;
Fig. 2 is the front view of the utility model Test handler.
Detailed description of the invention
For further setting forth the technological means and effect thereof that the present invention takes, be described in detail below in conjunction with the preferred embodiments of the present invention and accompanying drawing thereof.
Refer to Fig. 1 and 2, the utility model provides a kind of Test handler, comprises frame 10, is installed on the automatic feeding mechanism 20 in frame 10, mechanism for testing 30, sorting mechanism 40 and automatic withdrawing mechanism 50 successively; Described frame 10 is provided with pan feeding operating desk 12 and sorting operating desk 14, and described sorting operating desk 14 is arranged from top to bottom, and automatic feeding mechanism 20 is fixed on pan feeding operating desk 12 by cushion blocking (not shown); Described mechanism for testing 30 is installed on described sorting operating desk 14, comprise guide rail 32, separator 34, testing sensor (not shown), measuring head 36, described guide rail 32 is connected with automatic withdrawing mechanism 50 with automatic feeding mechanism 20, and described separator 34 is located at above measuring head 36; Described sorting mechanism 40 is installed on described sorting operating desk 14, comprise sorting sub-material shuttle 42, material blanking tube (not shown), sorting sensor (not shown), defective products device 44, described defective products device 44 is arranged away from guide rail 32, be connected with described sub-material shuttle 42 by material blanking tube, described sorting sensor (not shown) is located at the top of described defective products device 44, and described mechanism for testing 30 is electrically connected with described sorting mechanism 40.
Transistor is by the vibration mode of automatic feeding mechanism 20 material loading enter guide rail 32 according to a certain direction, when transistor is separated through separator 34, when slipping down to the position of measuring head 36 by the testing sensor in guide rail 32, by testing sensor to measuring head 36 1 signals, measuring head 36 carries out electrical parameters detection to the transistor at test position at once, after drawing testing result, described transistor arrives a point bit selecting, described sorting sensor is started working to sub-material shuttle 42 1 signals, the testing result that sub-material shuttle 42 transmits according to described mechanism for testing 30 carries out sorting, described underproof transistor falls into defective products device 44 by material blanking tube, the transistor of test passes continues to transmit along guide rail 32 to arrive automatic withdrawing mechanism 50, carry out automatic material receiving.Due to the setting of automatic feeding mechanism 20 and automatic withdrawing mechanism 50, pan feeding and rewinding can be carried out automatically.
If necessary, can also arrange marking device (not shown) at described mechanism for testing 30, it is located at below described measuring head 36, and marking device according to test result to transistor stepping, and can carry out mark according to stepping to transistor.Test separately or mark separately can be selected as requested simultaneously.
Touch-screen control device 60 can also be comprised, the touch-screen 62 comprising circuit board (not shown) and be electrically connected with circuit board, described circuit board and described feeding mechanism 20, mechanism for testing 30, sorting mechanism 40 and automatic withdrawing mechanism 50 are electrically connected, and are controlled the ruuning situation of each mechanism by described touch-screen 62.Described touch-screen 62 control device can be realized by prior art, repeats no more herein.
For the sake of security, be also provided with in the present embodiment and be installed on pan feeding operating desk and be electrically connected at the warning device 70 of described circuit board, it is reported to the police for the special status run each mechanism.
In sum, Test handler of the present utility model replaces with tremie pipe automatically, saves cost of labor, reduce loaded down with trivial details manual operation, high precision measurement stepping, meets different clients, test mark one system, adjust flexibly according to Production requirement and can test separately or mark separately, compression production cycle, at a high speed point lectotype, according to production technology, simple to operation, the speed different according to different product adjustable.
The above, for the person of ordinary skill of the art, can make other various corresponding change and distortion according to technical scheme of the present invention and technical conceive, and all these change and be out of shape the protection domain that all should belong to the claims in the present invention.
Claims (4)
1. a Test handler, is characterized in that, comprises frame, is installed on the automatic feeding mechanism in frame, mechanism for testing, sorting mechanism and automatic withdrawing mechanism successively; Described frame is provided with pan feeding operating desk and sorting operating desk, and described sorting operating desk is arranged from top to bottom, and automatic feeding mechanism is fixed on pan feeding operating desk by cushion blocking; Described mechanism for testing is installed on described sorting operating desk, comprises guide rail, separator, testing sensor, measuring head, and described guide rail is connected with automatic withdrawing mechanism with automatic feeding mechanism, and described separator is located at above measuring head; Described sorting mechanism is installed on described sorting operating desk, comprise sorting sub-material shuttle, material blanking tube, sorting sensor, defective products device, described defective products device is arranged away from guide rail, is connected with described sub-material shuttle by material blanking tube, and the top of described defective products device is located at by described sorting sensor.
2. Test handler as claimed in claim 1, it is characterized in that, described mechanism for testing comprises marking device, and described marking device is located at below described measuring head.
3. Test handler as claimed in claim 1, it is characterized in that, also comprise the touch-screen control device being installed on frame, the touch-screen that described touch-screen control device comprises circuit board and is electrically connected with circuit board, described circuit board and described feeding mechanism, mechanism for testing, sorting mechanism and automatic withdrawing mechanism are electrically connected.
4. Test handler as claimed in claim 3, is characterized in that, is also provided with and is installed on pan feeding operating desk and is electrically connected at the warning device of described circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420358590.0U CN204052204U (en) | 2014-06-30 | 2014-06-30 | Test handler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420358590.0U CN204052204U (en) | 2014-06-30 | 2014-06-30 | Test handler |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204052204U true CN204052204U (en) | 2014-12-31 |
Family
ID=52193796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420358590.0U Expired - Fee Related CN204052204U (en) | 2014-06-30 | 2014-06-30 | Test handler |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204052204U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105817429A (en) * | 2016-05-10 | 2016-08-03 | 耒阳市亚湘电子科技有限公司 | Network transformer pin arrangement and detection integrated machine |
-
2014
- 2014-06-30 CN CN201420358590.0U patent/CN204052204U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105817429A (en) * | 2016-05-10 | 2016-08-03 | 耒阳市亚湘电子科技有限公司 | Network transformer pin arrangement and detection integrated machine |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141231 Termination date: 20190630 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |