CN204008261U - The height sample stage that verts varies base - Google Patents
The height sample stage that verts varies base Download PDFInfo
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- CN204008261U CN204008261U CN201420353242.4U CN201420353242U CN204008261U CN 204008261 U CN204008261 U CN 204008261U CN 201420353242 U CN201420353242 U CN 201420353242U CN 204008261 U CN204008261 U CN 204008261U
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- 230000005540 biological transmission Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000004627 transmission electron microscopy Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000002003 electron diffraction Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Abstract
本实用新型公开了一种高倾转样品台换样底座,包括底座、样品台,底座的一端为型腔端,型腔端的端平面设置有型腔,所述样品台装入所述型腔,底座的另一端为握持端,所述握持端的外周设置有凸出部件,该高倾转样品台换样底座在满足大角度倾转样品所需要小尺寸样品台的同时,很好地解决了小尺寸样品台在更换样品时不易操作的问题。
The utility model discloses a sample changing base of a high-tilt sample table, which comprises a base and a sample table. One end of the base is a cavity end, and a cavity is arranged on the end plane of the cavity end, and the sample table is loaded into the cavity. , the other end of the base is the gripping end, and the outer periphery of the gripping end is provided with a protruding part. The sample changing base of the high-tilt sample stage satisfies the small-sized sample stage required by the large-angle tilting sample, and at the same time, it is well Solved the problem that the small size sample stage is not easy to operate when changing samples.
Description
技术领域 technical field
本实用新型涉及一种透射电子显微镜用样品台附件,特别是涉及可以满足大角度倾转样品的高倾转样品台换样底座。 The utility model relates to a sample stage accessory for a transmission electron microscope, in particular to a high-tilt sample stage changing base capable of tilting samples at a large angle.
背景技术 Background technique
透射电子显微镜采用电子束作为光源从而得到极高的细节分辨能力,使其成为可以直观的检测到晶体材料的原子结构信息的重要工具。通过透射电子显微镜不仅可以获得带有晶体结构信息的高分辨照片,也可以给出纳米尺度选区的电子衍射。透射电子显微镜主要由电子源、电磁透镜系统、样品台以及成像系统等部分组成。 Transmission electron microscopy uses electron beams as light sources to obtain extremely high detail resolution capabilities, making it an important tool for intuitively detecting atomic structure information of crystal materials. Through transmission electron microscopy, not only high-resolution photos with crystal structure information can be obtained, but also electron diffraction of nanoscale selected areas can be given. A transmission electron microscope is mainly composed of an electron source, an electromagnetic lens system, a sample stage, and an imaging system.
物镜是透射电子显微镜多种电磁透镜中距离试样最近的透镜。物镜的基本构造包括上极靴和下极靴两部分,分别位于紧邻试样的上方和下方。现有技术设计的单倾样品台在透射电子显微镜内的的旋转角度受样品台尺寸和上极靴和下极靴的之间的间距限制。因此在需要大角度倾转样品时需要使用特殊的小尺寸样品台。然而在现有技术条件下,小尺寸样品台在更换样品时,不易操作。 The objective lens is the closest lens to the sample among the various electromagnetic lenses of the transmission electron microscope. The basic structure of the objective lens includes two parts, the upper pole piece and the lower pole piece, which are respectively located above and below the sample. The rotation angle of the single-tilt sample stage designed in the prior art in the transmission electron microscope is limited by the size of the sample stage and the distance between the upper pole piece and the lower pole piece. Therefore, it is necessary to use a special small-sized sample stage when the sample needs to be tilted at a large angle. However, under the current technical conditions, the small-sized sample stage is not easy to operate when changing samples.
本实用新型所设计的高倾转样品台换样底座能很好地实现小尺寸样品台在更换样品时的操作问题,且不易损坏样品台及相关夹捏工具,使得该换样操作方便易行,提高了换样环节的安全与高效。 The high-tilt sample table changing base designed by the utility model can well realize the operation problem of the small-sized sample table when changing samples, and is not easy to damage the sample table and related pinching tools, making the sample changing operation convenient and easy , which improves the safety and efficiency of the sample change process.
发明内容 Contents of the invention
为了实现上述目的,本实用新型提供了一种结构简单,使用方便的高倾转样品台换样底座。 In order to achieve the above purpose, the utility model provides a sample changing base of a high-tilt sample stage with a simple structure and convenient use.
为了解决上述现有问题,本实用新型所采取的技术方案是:一种高倾转样品台换样底座,包括底座、样品台,底座的一端为型腔端,型腔端的端平面设置有型腔,所述样品台装入所述型腔,底座的另一端为握持端,所述握持端的外周设置有凸出部件,所述突出部件与底座端固定连接。样品台放置到型腔后,操作者可以通过持握握持端将样品台安装到显微镜的相关部分。 In order to solve the above-mentioned existing problems, the technical solution adopted by the utility model is: a high-tilt sample table changing base, including a base and a sample table, one end of the base is the cavity end, and the end plane of the cavity end is provided with a cavity, the sample stage is loaded into the cavity, the other end of the base is a holding end, and a protruding part is arranged on the outer periphery of the holding end, and the protruding part is fixedly connected with the base end. After the sample stage is placed in the cavity, the operator can install the sample stage to the relevant part of the microscope by holding the grip end.
作为优选,所述型腔包括固定部件,所述固定部件位于样品台固定腔内部,与底座固定连接。所述样品台固定腔的尺寸与样品台的尺寸相一致,确保样品台能很好地放置到样品台固定腔中,所述固定部件能进一步固定样品台。 Preferably, the mold cavity includes a fixing part, and the fixing part is located inside the fixing cavity of the sample stage and fixedly connected with the base. The size of the sample stage fixing cavity is consistent with the size of the sample stage to ensure that the sample stage can be well placed in the sample stage fixing cavity, and the fixing part can further fix the sample stage.
作为优选,所述型腔底端面方设置有凹槽,所述凹槽的一端延伸至型腔端的外周,所述样品台固定腔设置有圆角。所述凹槽的设置可以便于夹捏工具取出和放置样品台,所述圆角有利于样品台更容易放置到底座型腔中。 Preferably, a groove is provided on the bottom surface of the cavity, one end of the groove extends to the outer periphery of the cavity end, and the sample stage fixing cavity is provided with rounded corners. The setting of the groove can facilitate the pinch tool to take out and place the sample stage, and the rounded corners are beneficial for the sample stage to be placed in the cavity of the base more easily.
作为优选,所述固定部件为圆柱形固定桩。所述样品台通过固定桩与高倾转样品台换样底座相连接。 Preferably, the fixing component is a cylindrical fixing pile. The sample stage is connected with the sample changing base of the high-tilt sample stage through fixed piles.
作为优选,所述凸出部件沿握持端向外周向凸出,所述凸出部件包括棱边。周向凸出的凸出部件保证了操作者可以牢固地握持住底座,安全地实现换样操作。 Preferably, the protruding part protrudes outward along the handle end, and the protruding part includes an edge. The protruding parts protruding in the circumferential direction ensure that the operator can hold the base firmly and realize the sample changing operation safely.
作为优选,所述样品台的底面与所述型腔底面相贴合。保证样品台正确、合适的放置到型腔底座中。 Preferably, the bottom surface of the sample stage is attached to the bottom surface of the cavity. Ensure that the sample stage is correctly and properly placed in the cavity base.
与现有技术相比,本实用新型的有益效果是:在满足大角度倾转样品所需要小尺寸样品台的同时,样品台固定腔的设置能很好地将样品台水平地固定在高倾转样品台换样底座上,样品台通过固定桩与高倾转样品台换样底座固定相连,紧密牢靠固定样品台于底座上,保证了换样时样品台不会发生移动或者转动;握持端突出部件的设置能使换样操作者牢固地握持住底座。高倾转样品台换样底座能安全、方便地实现在样品台上换样,及换样前后样品台装换到显微镜上这一些列换样操作。 Compared with the prior art, the beneficial effect of the utility model is: while satisfying the small-sized sample stage required by the large-angle tilting sample, the setting of the sample stage fixing cavity can well fix the sample stage horizontally at a high tilting angle. The sample table is fixedly connected to the high-tilt sample table changing base through fixed piles, and the sample table is tightly and firmly fixed on the base to ensure that the sample table will not move or rotate when changing samples; The setting of the protruding part at the end enables the operator to firmly hold the base when changing the sample. The high-tilt sample stage change base can safely and conveniently realize sample change on the sample stage, and a series of sample change operations such as changing the sample stage to the microscope before and after sample change.
附图说明 Description of drawings
图1是样品台的结构示意图; Fig. 1 is the structural representation of sample stage;
图2是本实用新型底座的结构示意图。 Fig. 2 is a structural schematic diagram of the base of the utility model.
1、底座;2、样品台固定腔; 3、固定桩;4、凹槽;5、圆角;6、凸出部件;7、棱边。 1. Base; 2. Sample stage fixing cavity; 3. Fixing pile; 4. Groove; 5. Fillet; 6. Protruding part; 7. Edge.
具体实施方式 Detailed ways
以下结合附图及实施例对本实用新型作进一步说明。 Below in conjunction with accompanying drawing and embodiment the utility model is described further.
高倾转样品台换样底座(见附图1),包括底座1,样品台,底座型腔端的端平面设置有型腔,所述型腔与样品台贴合,所述型腔包括样品台固定腔2、固定桩3,所述样品台固定腔2位于型腔的最上方,所述固定桩3位于样品台固定腔2内部,与底座1固定连接,所述样品台固定腔2下方设置有凹槽4,所述样品台固定腔2设置有圆角5,底座1的另一端为握持端,握持端的外周设置有凸台6,所述凸台6突出部件包括棱边7,所述突出部件6与底座1固定连接。 High-tilt sample table change base (see attached drawing 1), including base 1, sample table, the end plane of the cavity end of the base is provided with a cavity, the cavity fits the sample table, and the cavity includes the sample table Fixed cavity 2, fixed pile 3, the fixed cavity 2 of the sample stage is located at the top of the cavity, the fixed pile 3 is located inside the fixed cavity 2 of the sample stage, and is fixedly connected with the base 1, and the fixed cavity 2 of the sample stage is arranged below There is a groove 4, the sample stage fixing cavity 2 is provided with rounded corners 5, the other end of the base 1 is a holding end, and the outer periphery of the holding end is provided with a boss 6, and the protruding part of the boss 6 includes an edge 7, The protruding part 6 is fixedly connected with the base 1 .
本实用新型是针对小尺寸样品台在更换样品时不易操作这一问题所设计的,在使用时,先将样品台用镊子放置到样品台固定腔中,样品台通过固定桩与底座连接,确保样品台紧密固定在底座上;然后可以手持高倾转样品台换样底座上的凸出部件移向显微镜上需安放样品台的地方,将样品台安装到显微镜上。 The utility model is designed for the problem that the small-sized sample table is not easy to operate when changing samples. When in use, the sample table is first placed in the sample table fixed cavity with tweezers, and the sample table is connected to the base through the fixed pile to ensure The sample stage is tightly fixed on the base; then the protruding part on the sample change base of the high-tilt sample stage can be held and moved to the place where the sample stage needs to be placed on the microscope, and the sample stage is installed on the microscope.
上述具体实施方式用来解释说明本实用新型,而不是对本实用新型进行限制,在本实用新型的精神和权利要求的保护范围内,对本实用新型做出的任何修改和改变,都落入本实用新型的保护范围。 The above-mentioned specific embodiments are used to explain the utility model, rather than to limit the utility model. Within the spirit of the utility model and the protection scope of the claims, any modifications and changes made to the utility model all fall into the scope of the utility model. A new type of protection.
Claims (6)
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| Application Number | Priority Date | Filing Date | Title |
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| CN201420353242.4U CN204008261U (en) | 2014-06-27 | 2014-06-27 | The height sample stage that verts varies base |
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| CN201420353242.4U CN204008261U (en) | 2014-06-27 | 2014-06-27 | The height sample stage that verts varies base |
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| Publication Number | Publication Date |
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| CN204008261U true CN204008261U (en) | 2014-12-10 |
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| CN201420353242.4U Expired - Lifetime CN204008261U (en) | 2014-06-27 | 2014-06-27 | The height sample stage that verts varies base |
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2014
- 2014-06-27 CN CN201420353242.4U patent/CN204008261U/en not_active Expired - Lifetime
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Granted publication date: 20141210 |
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| CX01 | Expiry of patent term |