CN203894330U - Multi-resistor testing device - Google Patents
Multi-resistor testing device Download PDFInfo
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- CN203894330U CN203894330U CN201420325525.8U CN201420325525U CN203894330U CN 203894330 U CN203894330 U CN 203894330U CN 201420325525 U CN201420325525 U CN 201420325525U CN 203894330 U CN203894330 U CN 203894330U
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- resistance
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- detecting unit
- probe
- testing devices
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Abstract
A multi-resistor testing device is provided with a horizontal objective table, a vertical support, a detection unit, a sliding guide rail and a vertical driving mechanism, wherein the horizontal objective table is arranged vertical to the vertical support, the detection unit is arranged over the horizontal objective table, one end of the sliding guide rail is fixed to the horizontal objective table, the sliding guide rail penetrates through the detection unit and is movably assembled in the detection unit, and the vertical driving mechanism is fixed to the vertical support and drives the detection unit to move vertically. The detection unit is provided with a substrate and multiple probes assembled on the substrate, the end, exposed out of the substrate, of each substrate makes contact with a resistor of a substrate to be tested, and the other end of the probe is connected with the input end of a detection circuit. The multi-resistor testing device can simultaneously detect multiple resistors via the probes, and is characterized by simple structure, convenient detection, high detection efficiency and accurate results.
Description
Technical field
The utility model relates to electronic product detection technique field, particularly relates to a kind of many resistance testing devices.
Background technology
Resistance is one of widely used components and parts of electronic product, and the degree of accuracy of resistance is the effectively important leverages of work of numerous devices.In prior art, to thick-film resistor, test normally detects one by one by multimeter, and not only efficiency is low, and situation about easily going wrong.
Therefore, not enough for prior art, provide a kind of many resistance testing devices simple in structure, that can once carry out a plurality of resistance detection very necessary to overcome prior art deficiency.
Summary of the invention
The purpose of this utility model is to avoid the deficiencies in the prior art part and a kind of many resistance testing devices is provided, and has testing result accurate, the feature that applicability is strong.
Above-mentioned purpose of the present utility model realizes by following technological means.
Many resistance testing devices, are provided with horizontal material carrier platform, longitudinal carrier, detecting unit, rail plate and longitudinal driving mechanism;
Described horizontal material carrier platform and described longitudinal carrier are vertical setting, described detecting unit is arranged at described horizontal material carrier platform top, described horizontal material carrier platform is fixed in described rail plate one end, and described rail plate is arranged in described detecting unit and activity is assemblied in described detecting unit, described longitudinal driving mechanism is fixed on described longitudinal carrier, and described longitudinal driving mechanism drives described detecting unit to vertically move;
A plurality of probes that described detecting unit is provided with substrate and is assemblied in substrate, described probe is fixedly assemblied in described substrate, described probe exposes one end of described substrate for contacting with the resistance on substrate to be measured, and described probe exposes the other end of described substrate and the input end of testing circuit is connected.
Aforesaid substrate is provided with pilot hole, and described probe is assemblied in described pilot hole.
Above-mentioned detecting unit is also provided with cover plate, and described plate cover is located at described probe top and is fixed on described substrate, and described longitudinal driving mechanism is fixedly connected with described cover plate.
Preferably, above-mentioned cover plate and described substrate are set to integrated formed structure.
One end that above-mentioned probe exposes described substrate is one end that probe has elastic construction.
Above-mentioned rail plate is arranged with bearing.
Preferably, above-mentioned many resistance testing devices are also provided with buffer spring, and described buffer spring is sheathed on described rail plate and described buffer spring between described substrate and described horizontal material carrier platform.
Above-mentioned longitudinal driving mechanism is provided with connecting rod, holder, test handle and engaging lug, and described holder is fixedly installed on described longitudinal carrier, and described holder is provided with link and lower link;
One end of described connecting rod is fixedly connected with described cover plate, described connecting rod passes the lower link of described holder and is coupling with one end of described engaging lug, the middle part of the other end of described engaging lug and described test handle is coupling, and the upper link of the stiff end of described test handle and described holder is coupling.
Preferably, above-mentioned many resistance testing devices are also provided with base, and described horizontal material carrier platform is fixedly installed on described base.
Preferably, above-mentioned many resistance testing devices are also provided with display screen, and the output terminal of described testing circuit is connected with described display screen.
Many resistance testing devices of the present utility model, are provided with horizontal material carrier platform, longitudinal carrier, detecting unit, rail plate and longitudinal driving mechanism; Described horizontal material carrier platform and described longitudinal carrier are vertical setting, described detecting unit is arranged at described horizontal material carrier platform top, described horizontal material carrier platform is fixed in described rail plate one end, and described rail plate is arranged in described detecting unit and activity is assemblied in described detecting unit, described longitudinal driving mechanism is fixed on described longitudinal carrier, and described longitudinal driving mechanism drives described detecting unit to vertically move; A plurality of probes that described detecting unit is provided with substrate and is assemblied in substrate, described probe is fixedly assemblied in described substrate, described probe exposes one end of described substrate for contacting with the resistance on substrate to be measured, and described probe exposes the other end of described substrate and the input end of testing circuit is connected.These many resistance testing devices can be organized resistance by probe one-time detection more, not only simple in structure, and have easy to detect, detection efficiency is high, the accurate feature of result.
Accompanying drawing explanation
Utilize accompanying drawing to be further described the utility model, but content in accompanying drawing does not form any restriction of the present utility model.
Fig. 1 is the structural representation of a kind of many resistance testing devices of the utility model.
Fig. 2 is the circuit diagram of the Check processing unit of a kind of many resistance testing devices of the utility model.
In Fig. 1, Fig. 2, comprising:
Horizontal material carrier platform 100,
Longitudinal carrier 200,
Detecting unit 300,
Substrate 310,
Probe 320,
Cover plate 330,
Rail plate 400, bearing 410,
Longitudinal driving mechanism,
Connecting rod 510,
Holder 520,
Upper link 521, lower link 522,
Test handle 530,
The stiff end 531 of test handle,
Engaging lug 540,
Base 600,
Detection sample 700,
Digital demonstration 10,
Charactron circuit 11, section current-limiting circuit 12, driving circuit 13,
Alarm unit 20, signal gathering unit 30, filter unit 40,
Power supply decoupling unit 50, microprocessor 60,
Trigger switch unit 70, reset unit 80, indicating member 90.
Embodiment
With the following Examples the utility model is further described.
embodiment 1.
Many resistance testing devices, as shown in Figure 1, are provided with horizontal material carrier platform 100, longitudinal carrier 200, detecting unit 300, rail plate 400 and longitudinal driving mechanism.These many resistance testing devices are also provided with base 600, and horizontal material carrier platform 100 is fixedly installed on base 600.
Horizontal material carrier platform 100 is for carrying a plurality of resistance units to be detected, and longitudinal carrier 200 provides the support that vertical structure is installed, and detecting unit 300 carries out electrical property detection for the sample to be detected.
Concrete, horizontal material carrier platform 100 is vertical setting with longitudinal carrier 200, detecting unit 300 is arranged at horizontal material carrier platform 100 tops, horizontal material carrier platform 100 is fixed in rail plate 400 one end, and rail plate 400 is arranged in detecting unit 300 and activity is assemblied in detecting unit 300, longitudinal driving mechanism is fixed on longitudinal carrier 200, and longitudinal driving mechanism drives detecting unit 300 to vertically move.By longitudinal driving mechanism, drive detecting unit 300 to vertically move, can adjust the resistance on detecting unit 300 substrate close or that detect away from band, to effectively control testing process.Rail plate 400 provides under longitudinal driving mechanism drives, and the track that detecting unit 300 moves, can move up and down along rail plate 400 detecting unit 300, thus realize detecting unit 300 near or away from horizontal material carrier platform 100.
A plurality of probes 320 that detecting unit 300 is provided with substrate 310 and is assemblied in substrate 310, probe 320 is fixedly assemblied in substrate 310, probe 320 exposes one end of substrate 310 for contacting with substrate 310 bands to be measured, and probe 320 exposes the other end of described substrate 310 and the input end of testing circuit is connected.One end that probe 320 exposes substrate 310 is one end that probe 320 has elastic construction.As general knowledge known in this field, for fear of probe 320, in the process of contact detection sample, there are probe 320 collsion damages, one end of probe 320 contact detection samples is traditionally arranged to be elastic construction, and the concrete structure of probe 320 does not repeat them here.
Concrete, substrate 310 is provided with pilot hole, and probe 320 is assemblied in pilot hole.
Detecting unit 300 is also provided with cover plate 330, and cover plate 330 covers at probe 320 tops and is fixed on substrate 310, and longitudinal driving mechanism is fixedly connected with cover plate 330.Cover plate 330 and substrate 310 can be set to integrated formed structure, there is feature simple in structure, easy to prepare.
When detecting unit 300 is during near detection sample on horizontal material carrier platform 100, probe 320 exposes one end of substrate 310 gradually near detecting sample and finally effectively contacting with detection sample, another extremity piece of probe 320 detects information conveyance to testing circuit, and the electric signal that testing circuit is carried according to probe 320 calculates the parameter of the trying to achieve detected sample corresponding site line output of going forward side by side.Display screen can be set, the output terminal of testing circuit is connected with display screen, realize the visualize of testing result.
Rail plate 400 is arranged with bearing 410.For protection equipment; guarantee stablizing in detecting unit 300 moving process; these many resistor detecting devices are also provided with buffer spring; buffer spring is sheathed on rail plate and buffer spring between substrate 310 and horizontal material carrier platform 100, to cushion detecting unit 300, in rail plate 400 moving process, can steadily locate.It should be noted that, the structure that realizes pooling feature is a lot, is not limited to the buffer spring structure of the present embodiment.Also can on horizontal material carrier platform 100, fix separately some springs or realize buffering effect by alternate manner.
Longitudinal driving mechanism is provided with connecting rod 510, holder 520, test handle 530 and engaging lug 540, and holder is fixedly installed on longitudinal carrier 200, and holder 520 is provided with link 521 and lower link 522.
One end of connecting rod 510 is fixedly connected with cover plate 330, connecting rod 510 passes the lower link 522 of holder 520 and is coupling with one end of engaging lug 540, the other end of engaging lug 540 is coupling with the middle part of test handle 530, and the stiff end 531 of test handle 530 is coupling with the upper link 521 of holder 520.
Longitudinal driving mechanism provides the driving force that detecting unit 300 is vertically moved, after detection, when test handle 530 is raised, the fixing link along holder of test handle 530 rotates up, the middle part of test handle 530 drives engaging lug 540 to be moved upward, engaging lug 540 drivening rods 510 also move up, and connecting rod 510 drives cover plate 330 also to move upward, thereby drive substrate 310 and probe 320 along rail plate 400, to move up together.Now, detecting unit 300 is separated with the detection sample 700 on horizontal material carrier platform 100.When detecting, test handle 530 is pushed, the stiff end 531 of test handle 530 is rotated down along the link of holder, the middle part of test handle 530 drives engaging lug 540 to move downwards, engaging lug 540 drivening rods 510 also move up and down, connecting rod 510 drives cover plate 330 also to move downward, thereby drives substrate 310 and probe 320 along rail plate 400, to move down together.Now, probe 320 contacts with the detection sample on horizontal material carrier platform 100, carries out electrical property detection.This longitudinal driving mechanism simple in structure, easy to prepare, simple operation.
It should be noted that, the structure of longitudinal driving mechanism is not limited to the situation of the present embodiment, if can realize by detecting unit 300 along the longitudinal mobile drives structure all meet the requirements.As driven cover plate 330 to move by cylinder, also can move by motor driving cover plate 330, or other is as structures such as gear drive.
These many resistance testing devices can arrange different probe 320 according to position feature between different resistance and arrange, and by probe one-time detection, organize resistance more, not only simple in structure, and have easy to detect, detection efficiency is high, the accurate feature of result.
Fig. 2 is the circuit diagram of a kind of Check processing unit of these many resistance testing devices uses, as shown in Figure 2, is provided with signal gathering unit 30, filter unit 40, digital display unit 10, reset unit 80, trigger switch unit 70 and microprocessor 60.
Microprocessor 60 is the chip of model STC12C5404AD.The output terminal of signal gathering unit 30 is connected with the input end of filter unit 40, and the output terminal of filter unit 40, digital display unit 10, reset unit 80, trigger switch unit 70 are connected with microprocessor 60 respectively.
Trigger switch unit 70 is provided with switch S 1 and switch S 2, one end ground connection of one end of switch S 1, switch S 2, and the other end of switch S 1 is connected with the pin 8 of described microprocessor 60, and the other end of switch S 2 is connected with the pin 9 of microprocessor 60.Trigger switch S1 is used for the calibration of control system, Closing Switch S1, and system is calibrated, and guarantees the accuracy of check result.Trigger switch is used for controlling Presentation Function, and after Closing Switch S2, display unit can show corresponding check result.
Reset unit 80 is provided with capacitor C 1 and resistance R 1, and one end of capacitor C 1 is connected with VCC, and the other end of capacitor C 1, resistance R 1 one end are connected with the pin 13 of microprocessor 60, resistance R 1 other end ground connection.Reset unit 80, for keeping microcontroller reset mode, is guaranteed microcontroller steady operation.
Signals collecting sets up and is equipped with resistance R 4, resistance R 5, resistance R 6, resistance R 7, resistance R 8 and resistance R 9.
Filtering circuit is provided with resistance R 41, resistance R 42, resistance R 43, resistance R 44, resistance R 45, resistance R 46, capacitor C 41, capacitor C 42, capacitor C 43, capacitor C 44, capacitor C 45 and capacitor C 46.
One end of resistance R 4 is connected with resistance R 46 one end, resistance R 46 other ends and capacitor C 46, the pin 20 of microprocessor 60 connects, and one end of resistance R 5 is connected with resistance R 45 one end, resistance R 45 other ends and capacitor C 45, the pin 21 of microprocessor 60 connects, and one end of resistance R 6 is connected with resistance R 44 one end, resistance R 44 other ends and capacitor C 44, the pin 22 of microprocessor 60 connects, and one end of resistance R 7 is connected with resistance R 43 one end, resistance R 43 other ends and capacitor C 43, the pin 23 of microprocessor 60 connects, and one end of resistance R 8 is connected with resistance R 42 one end, resistance R 42 other ends and capacitor C 42, the pin 24 of microprocessor 60 connects, and one end of described resistance R 9 is connected with resistance R 41 one end, resistance R 41 other ends and capacitor C 43, the pin 25 of microprocessor 60 connects, resistance R 4, resistance R 45, resistance R 6, resistance R 7, the equal ground connection of the other end of resistance R 8 and resistance R 9, capacitor C 41, capacitor C 42, capacitor C 43, capacitor C 44, the equal ground connection of the other end of capacitor C 45 and capacitor C 46.
Collecting unit is connected image data by resistance R 4, resistance R 5, resistance R 6, resistance R 7, resistance R 8 with one end of resistance R 9, and the data that gather are delivered to microprocessor 60 after unit 40 filtering after filtering.60 pairs of data that gather of microprocessor are carried out A/D conversion, and calculate judgement, and control other cell operation.
Digital display unit 10 is provided with charactron circuit 11, section current-limiting circuit 12 and driving circuit 13.
Charactron circuit 11 comprises four groups of eight sections of common cathode charactrons; Section current-limiting circuit 12 is provided with resistance R 14, resistance R 15, resistance R 16, resistance R 17, resistance R 18, resistance R 19, resistance R 20 and resistance R 21; Driving circuit 13 is provided with resistance R 11, resistance R 12, resistance R 13, resistance R 24, triode Q2, triode Q3, triode Q4 and triode Q5.
The a pin of charactron circuit 11 is connected with resistance R 14 one end, resistance R 14 other ends are connected with the pin 16 of microprocessor 60, the b pin of charactron circuit 11 is connected with resistance R 15 one end, resistance R 15 other ends are connected with the pin 15 of microprocessor 60, the c pin of charactron circuit 11 is connected with resistance R 16 one end, resistance R 16 other ends are connected with the pin 13 of microprocessor 60, the d pin of charactron circuit 11 is connected with resistance R 17 one end, resistance R 17 other ends are connected with the pin 12 of microprocessor 60, the e pin of charactron circuit 11 is connected with resistance R 18 one end, resistance R 18 other ends are connected with the pin 2 of microprocessor 60, the f pin of charactron circuit 11 is connected with resistance R 19 one end, resistance R 19 other ends are connected with the pin 1 of microprocessor 60, the g pin of charactron circuit 11 is connected with resistance R 20 one end, resistance R 20 other ends are connected with the pin 27 of microprocessor 60, the dp pin of charactron circuit 11 is connected with resistance R 21 one end, resistance R 21 other ends are connected with the pin 26 of microprocessor 60.
The emitter-base bandgap grading of triode Q5 is connected with the com1 pin of charactron circuit 11, the base stage of penetrating of triode Q5 is connected with resistance R 24 one end, resistance R 24 other ends are connected with the pin 18 of described microprocessor 60, the emitter-base bandgap grading of triode Q4 is connected with the com2 pin of charactron circuit 11, the base stage of penetrating of triode Q4 is connected with resistance R 13 one end, resistance R 13 other ends are connected with the pin 17 of microprocessor 60, the emitter-base bandgap grading of triode Q3 is connected with the com3 pin of charactron circuit 11, the base stage of penetrating of triode Q3 is connected with resistance R 12 one end, resistance R 12 other ends are connected with the pin 11 of described microprocessor 60, the emitter-base bandgap grading of triode Q2 is connected with the com4 pin of charactron circuit 11, the base stage of penetrating of triode Q2 is connected with resistance R 11 one end, resistance R 11 other ends are connected with the pin 10 of described microprocessor 60, the collector of triode Q5, the collector of triode Q4, the equal ground connection of collector of the collector of triode Q3 and triode Q2.
Check processing circuit is also provided with alarm unit 20, alarm unit 20 is provided with resistance R 22, triode Q6 and alarm bell BUZZER, resistance R 22 one end are connected with the pin 19 of described microprocessor 60, the R22 other end is connected with the base stage of triode Q6, the grounded collector of triode Q6, the emitter of triode Q6 is connected with alarm bell BUZZER.
This Check processing circuit is also provided with power supply decoupling unit 50, power supply decoupling unit 50 is provided with capacitor C 2 and capacitor C 3, the pin 28 of one end of one end of described capacitor C 2, capacitor C 3, microprocessor 60 all meets VCC, the other end ground connection of the other end of capacitor C 2, capacitor C 3.There are strong minimizing noise, stabilized power source value in power supply decoupling unit 50.
This Check processing circuit is also provided with indicating member 90, and indicating member 90 is set to light emitting diode D1, and the positive pole of diode D1 is connected with the pin 4 of microprocessor 60, the minus earth of diode D1.Indicating member 90 is used to indicate the qualified information of resistance value to be detected.
Its device can adopt following parameter, and the model of triode Q56, Q5, Q4, Q3 and triode Q2 is 8550, and resistance R 11, resistance R 12, resistance R 13 and resistance R 24 are 1 kilo-ohm; Resistance R 14, resistance R 15, resistance R 16, resistance R 17, resistance R 18, resistance R 19, resistance R 20 and resistance R 21 are 510 Europe.Capacitor C 1 is 10 microfarads, and resistance R 1 is 10 kilo-ohms.Capacitor C 2 is that 10 microfarads and capacitor C 3 are 0.1 microfarad.Resistance R 22 is 1 kilo-ohm.
These many resistance testing devices can arrange different probe 320 and arrange according to different resistor chain Bu Tezheng, by probe one-time detection, organize resistance more, and carry out the computational analysis of many group testing results by resistance detection treatment circuit, can once carry out many group resistance electrical properties detects, easy to detect, detection efficiency is high, and result is accurate.
Finally should be noted that; above embodiment is the restriction in order to the technical solution of the utility model to be described but not to the utility model protection domain only; although the utility model is explained in detail with reference to preferred embodiment; those of ordinary skill in the art is to be understood that; can modify or be equal to replacement the technical solution of the utility model, and not depart from essence and the scope of technical solutions of the utility model.
Claims (10)
1. a resistance testing device more than, is characterized in that: be provided with horizontal material carrier platform, longitudinal carrier, detecting unit, rail plate and longitudinal driving mechanism;
Described horizontal material carrier platform and described longitudinal carrier are vertical setting, described detecting unit is arranged at described horizontal material carrier platform top, described horizontal material carrier platform is fixed in described rail plate one end, and described rail plate is arranged in described detecting unit and activity is assemblied in described detecting unit, described longitudinal driving mechanism is fixed on described longitudinal carrier, and described longitudinal driving mechanism drives described detecting unit to vertically move;
A plurality of probes that described detecting unit is provided with substrate and is assemblied in substrate, described probe is fixedly assemblied in described substrate, described probe exposes one end of described substrate for contacting with the resistance on substrate to be measured, and described probe exposes the other end of described substrate and the input end of testing circuit is connected.
2. many resistance testing devices according to claim 1, is characterized in that: described substrate is provided with pilot hole, and described probe is assemblied in described pilot hole.
3. many resistance testing devices according to claim 1 and 2, is characterized in that: described detecting unit is also provided with cover plate, and described plate cover is located at described probe top and is fixed on described substrate, and described longitudinal driving mechanism is fixedly connected with described cover plate.
4. many resistance testing devices according to claim 3, is characterized in that: described cover plate and described substrate are set to integrated formed structure.
5. many resistance testing devices according to claim 1, is characterized in that: one end that described probe exposes described substrate is one end that probe has elastic construction.
6. many resistance testing devices according to claim 1, is characterized in that: described rail plate is arranged with bearing.
7. many resistance testing devices according to claim 1, is characterized in that: be provided with buffer spring, described buffer spring is sheathed on described rail plate and described buffer spring between described substrate and described horizontal material carrier platform.
8. many resistance testing devices according to claim 3, it is characterized in that: described longitudinal driving mechanism is provided with connecting rod, holder, test handle and engaging lug, described holder is fixedly installed on described longitudinal carrier, and described holder is provided with link and lower link;
One end of described connecting rod is fixedly connected with described cover plate, described connecting rod passes the lower link of described holder and is coupling with one end of described engaging lug, the middle part of the other end of described engaging lug and described test handle is coupling, and the upper link of the stiff end of described test handle and described holder is coupling.
9. many resistance testing devices according to claim 1, is characterized in that: be also provided with base, described horizontal material carrier platform is fixedly installed on described base.
10. many resistance testing devices according to claim 1, is characterized in that: be also provided with display screen, the output terminal of described testing circuit is connected with described display screen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420325525.8U CN203894330U (en) | 2014-06-18 | 2014-06-18 | Multi-resistor testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420325525.8U CN203894330U (en) | 2014-06-18 | 2014-06-18 | Multi-resistor testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203894330U true CN203894330U (en) | 2014-10-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420325525.8U Expired - Fee Related CN203894330U (en) | 2014-06-18 | 2014-06-18 | Multi-resistor testing device |
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| CN (1) | CN203894330U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597248A (en) * | 2015-10-16 | 2017-04-26 | 惠州Tcl移动通信有限公司 | Spliced plate detection device |
| CN107563100A (en) * | 2017-09-30 | 2018-01-09 | 淮阴工学院 | Method based on black-box theory analysis contact resistance variation rule |
-
2014
- 2014-06-18 CN CN201420325525.8U patent/CN203894330U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597248A (en) * | 2015-10-16 | 2017-04-26 | 惠州Tcl移动通信有限公司 | Spliced plate detection device |
| CN106597248B (en) * | 2015-10-16 | 2019-11-29 | 惠州Tcl移动通信有限公司 | A kind of jigsaw detection device |
| CN107563100A (en) * | 2017-09-30 | 2018-01-09 | 淮阴工学院 | Method based on black-box theory analysis contact resistance variation rule |
| CN107563100B (en) * | 2017-09-30 | 2020-06-05 | 淮阴工学院 | Method for analyzing contact resistance change rule based on black box theory |
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| C14 | Grant of patent or utility model | ||
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141022 Termination date: 20170618 |
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| CF01 | Termination of patent right due to non-payment of annual fee |