CN203881802U - Testing and fixing device and testing system containing testing and fixing device - Google Patents
Testing and fixing device and testing system containing testing and fixing device Download PDFInfo
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- CN203881802U CN203881802U CN201420160625.XU CN201420160625U CN203881802U CN 203881802 U CN203881802 U CN 203881802U CN 201420160625 U CN201420160625 U CN 201420160625U CN 203881802 U CN203881802 U CN 203881802U
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Abstract
The utility model relates to a testing and fixing device comprising a substrate, a pressure bar and a support member, the substrate is provided with a first conducting circuit and a second conducting circuit, the first conducting circuit is provided with a first testing terminal and a first connecting terminal, and the first testing terminal is electrically connected with the first connecting terminal, the second conducting circuit is provided with a second testing terminal and a second connecting terminal, and the second testing terminal is electrically connected with the second connecting terminal, and the first testing terminal and the second testing terminal are arranged in an opposite manner, and are respectively connected with two external electrodes of a capacitor to be tested. By employing the testing and fixing device, when direct current bias characteristics of the capacitor to be tested is tested, lead wires do not need to be welded on the two external electrodes of the capacitor to be tested, the capacitor to be tested is directly and electrically connected with a test fixture by means of the testing and fixing device, the multilayer ceramic capacitor is prevented from being damaged due to welding heat shock, test results can truly reflect the direct current bias characteristics of the capacitor, and the testing and fixing device is high in testing precision and simple to operate. In addition, the utility model also relates to a testing system containing the testing and fixing device.
Description
Technical field
The utility model relates to a kind of for testing the test fixing device of direct current (DC) bias characteristic of multilayer ceramic capacitor and the test macro that contains this test fixing device.
Background technology
The direct current (DC) bias characteristic of traditional test multilayer ceramic capacitor, on two external electrodes of the multilayer ceramic capacitor that two lead-in wires need to be welded to respectively, respectively one end away from multilayer ceramic capacitor of lead-in wire is inserted in two slots of test fixture (as the 16065A of Agilent company) again, test fixture is connected with testing tool (as the HP4278A of Agilent company), with D.C. regulated power supply by DC voltage input test fixture and load on multilayer ceramic capacitor two ends, static capacity value while measuring multilayer ceramic capacitor loading direct current (DC) bias by testing tool.
For SMD multilayer ceramic capacitor, according to aforesaid operations test direct current (DC) bias characteristic, need to be on two of a multilayer ceramic capacitor external electrode welding lead, to realize being electrically connected of multilayer ceramic capacitor and test fixture.Thermal shock in welding process may cause damage to multilayer ceramic capacitor, as makes ceramic body produce micro-crack etc., thereby test result can not reflect the direct current (DC) bias characteristic of capacitor truly.
Utility model content
Based on this, be necessary to provide test result accurately and the test macro that product is damaged little test fixing device and contains this test fixing device.
A kind of test fixing device, for fixing testing capacitor and being electrically connected respectively with two external electrodes of testing capacitor, is characterized in that, described test fixing device comprises:
Substrate, which is provided with the first conducting wire and the second conducting wire, described the first conducting wire has the first test side and first link of electrical connection, described the second conducting wire has the second test side and second link of electrical connection, described the first test side is oppositely arranged for being electrically connected respectively with two described external electrodes with described the second test side, and described the first link and described the second link are for being electrically connected respectively with two external electrode lead-in wires;
Depression bar, is located at the top of gap between described the first test side and described the second test side, for being pressed between described the first test side and described the second test side spacing testing capacitor; And
Support member, is located on described substrate, for supporting described depression bar.
Therein in an embodiment, described the first conducting wire and described the second conducting wire are symmetrical arranged, described the first test side and described the second test side are located at the medium position of described substrate, and described the first link and described the second link are located on the side of described substrate.
In an embodiment, described the first conducting wire and described the second conducting wire be rectangular polyline shaped all therein.
In an embodiment, described depression bar comprises main part and is positioned at Handheld Division and the pressure head portion at described main part two ends therein; On the cross section perpendicular to described main part axis, the sectional area of described Handheld Division is greater than the sectional area of described main part, and the sectional area of described pressure head portion is with reducing gradually away from described main part.
In an embodiment, described main part and described Handheld Division are cylindrical structural therein, and described pressure head portion is conical, and described main part, the coaxial setting in described Handheld Division and described pressure head portion.
Therein in an embodiment, described pressure head portion can insert gap and the described substrate contacts between described the first test side and described the second test side, in the time of described pressure head portion and described substrate contacts, the medium position of the axis of described depression bar gap between described the first test side and described the second test side.
Therein in an embodiment, described support member comprises and is located at the suspension column on described substrate and is fixed on the back up pad on described suspension column, described back up pad middle part offers through hole, described main part and described pressure head portion can contact through described through hole and the periphery wall of described main part and the inwall of described through hole, and the size of described Handheld Division is greater than the size of described through hole.
A kind of test macro, comprises the test fixing device described in above-mentioned arbitrary embodiment.
Therein in an embodiment, described test macro also comprises test fixture, testing tool and D.C. regulated power supply, described test fixture is provided with two contact conductors and two electrode slots, two described contact conductors are electrically connected with described the first link and described the second link respectively, and two described contact conductors are inserted in respectively in described electrode slot, described testing tool coordinates electrical connection with described electrode slot and described D.C. regulated power supply, for described testing capacitor is carried out to direct current (DC) bias characteristic test.
By using above-mentioned test fixing device, in the time of the direct current (DC) bias characteristic of test multilayer ceramic capacitor, need to be on two of a multilayer ceramic capacitor external electrode welding lead, but can directly realize by this test fixing device the electrical connection of multilayer ceramic capacitor and test fixture, having avoided sweating heat to impact damages multilayer ceramic capacitor, make test result can reflect truly the direct current (DC) bias characteristic of capacitor, measuring accuracy is high, and has simplified operation.
Brief description of the drawings
Fig. 1 is the structural representation of the test macro of an embodiment of the present invention;
Fig. 2 is the structural representation of test fixing device in Fig. 1.
Embodiment
For the ease of understanding the utility model, below with reference to relevant drawings, the utility model is described more fully.In accompanying drawing, provide preferred embodiment of the present utility model.But the utility model can be realized in many different forms, be not limited to embodiment described herein.On the contrary, providing the object of these embodiment is to make to the understanding of disclosure of the present utility model more thoroughly comprehensively.
It should be noted that, when element is called as " being fixed on " another element, it can be directly on another element or also can have an element placed in the middle.When an element is considered to " connection " another element, it can be directly connected to another element or may have centering elements simultaneously.
Unless otherwise defined, all technology that use are herein identical with the implication that belongs to the common understanding of those skilled in the art of the present utility model with scientific terminology.The term using in instructions of the present utility model herein, just in order to describe the object of specific embodiment, is not intended to be restriction the utility model.Term as used herein " and/or " comprise one or more relevant Listed Items arbitrarily with all combinations.
As shown in Figure 1, the test macro 10 of an embodiment comprises test fixing device 100, test fixture 200, testing tool (not shown) and D.C. regulated power supply (not shown).Test fixing device 100 is for fixing testing capacitor 500, and is electrically connected with two external electrodes of testing capacitor 500.Test fixture 200, testing tool and D.C. regulated power supply cooperation are carried out direct current (DC) bias characteristic test to testing capacitor 500.Testing capacitor 500 can be multilayer ceramic capacitor in one embodiment.
Incorporated by reference to Fig. 1 and Fig. 2, in the present embodiment, test fixing device 100 comprises substrate 110, depression bar 120 and support member 130.
The substrate 110 of present embodiment is rectangular shape, which is provided with the first conducting wire 112 and the second conducting wire plate 114.The first conducting wire 112 and the second conducting wire 114 are right angle folding shape, wherein, the first conducting wire 112 has the first test side 1122 of electrical connection and the first link 1124, the second conducting wires 114 and has the second test side 1142 and second link 1144 of electrical connection.The first test side 1122 and the second test side 1142 are oppositely arranged on the medium position of substrate 110.And between the first test side 1122 and the second test side 1142, form can accommodating testing capacitor 500 space.In the time that testing capacitor 500 is placed between the first test side 1122 and the second test side 1142, two external electrodes of testing capacitor 500 can contact respectively and form electrical connection with the first test side 1122 and the second test side 1142.The first link 1124 and the second link 1144 are located on a long limit of substrate 110 of rectangular shape, for being electrically connected with external lead wire.
Can understand, in other embodiments, the shape of substrate 110 is not limited to above-mentioned rectangular shape, as being other regular figure shapes such as circle, ellipse, regular hexagon; And the first conducting wire 112 and the second conducting wire 114 are also not limited to above-mentioned right angle folding shape; And described in the position of the position of the first test side 1122 and the second test side 1142, the first link 1124 and the second link 1144 is also not limited to above, as long as the first test side 1122 and the second test side 1142 are symmetrical arranged.
Depression bar 120 is located at the top of gap between the first test side 1122 and the second test side 1142, for being pressed between the first test side 1122 and the second test side 1142 spacing testing capacitor 500.In the present embodiment, depression bar 120 comprises main part 122, Handheld Division 124 and pressure head portion 126.Handheld Division 124 and pressure head portion 126 lay respectively at the two ends of main part 122.In the present embodiment, main part 122 and Handheld Division 124 are cylindrical shape, and the external diameter of Handheld Division 124 is greater than the external diameter of main part 122.Pressure head portion 126 is conical, with reducing gradually away from main part 122 external diameters.Main part 122, the coaxial setting in Handheld Division 124 and pressure head portion 126.Pressure head portion 126 can insert the gap between the first test side 1122 and the second test side 1142 and contact with substrate 110, because the distance between the first test side 1122 and the second test side 1142 is less, in the time that pressure head portion 126 contacts with substrate 110, the medium position of the axis of pressure head portion 126 gap between the first test side 1122 and the second test side 1142.
Can understand, in other embodiments, described in the shape of depression bar 120 is not limited to above, if main part 122 can also be the cylinder body shape such as quadrangular, six prisms, as long as on the cross section perpendicular to main part 122 axis, the sectional area of Handheld Division 124 is greater than the sectional area of main part 122, make the end of Handheld Division 124 stressing main portions 122, and the sectional area of pressure head portion 126 is with reducing gradually away from main part 122.
Support member 130 comprises suspension column 132 and back up pad 134.Suspension column 132 is located on substrate 110, and the both sides that are positioned at the first test side 1122 and the second test side 1142 arrange.Back up pad 134 is fixed on suspension column 132.In the present embodiment, back up pad 134 middle parts offer through hole (not shown).Through hole is above gap between the first test side 1122 and the second test side 1142.Main part 122 and pressure head portion 126 can pass through hole and the periphery wall of main part 122 and the inwall of through hole and contact, and the size of Handheld Division 124 is greater than the size of through hole, and this through hole can not be passed in Handheld Division 124.
Test fixture 200 is provided with two contact conductors 210 and two electrode slots 220.One end of two contact conductors 210 is inserted in respectively in different electrode slot 220 and the other end of two contact conductors 210 is welded on respectively the first link 1124 and the second link 1144 and forms respectively electrical connection.Testing tool coordinates electrical connection with electrode slot 220 and D.C. regulated power supply, for testing capacitor 500 is carried out to direct current (DC) bias characteristic test.
Above-mentioned test macro 10, in the time of the direct current (DC) bias characteristic of test testing capacitor 500, can be carried out by following operation: test fixing device 100 is positioned on test fixture 200, pinch the Handheld Division 126 of depression bar 120 and upwards mention depression bar 120, then testing capacitor 500 is positioned in the gapping interval between the first test side 1122 and the second test side 1142 on substrate 110, and two external electrodes of testing capacitor 500 are contacted respectively with the first test side 1122 and the second test side 1142, putting down depression bar 120 pushes down testing capacitor 500 and makes it form and be electrically connected reliably with the first test side 1122 and the second test side 1142, respectively after the first link 1124 and second link 1144 each welding one electrical leads 210, again the contact conductor of welding 210 is inserted respectively in two electrode slots 220 of test fixture 200, so just realize the electrical connection of testing capacitor 500 and test fixture 200, again test fixture 200 is connected with testing tool (as the HP4278A of Agilent company), again with D.C. regulated power supply by DC voltage input test fixture 200 and load on testing capacitor 500 two ends, the static capacity value when measuring testing capacitor 500 and load direct current (DC) bias by testing tool.Above-mentioned test process can be avoided the destruction that directly welding lead may cause testing capacitor 500 on testing capacitor 500, thereby the result of testing gained can reflect the direct current (DC) bias characteristic of testing capacitor 500 truly, and the operation of welding electrode lead-in wire 210 is greatly simplified than the operation of welding lead on testing capacitor 500 on test fixing device 100.
The above embodiment has only expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the utility model the scope of the claims.It should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise utility, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.
Claims (9)
1. a test fixing device, for fixing testing capacitor and being electrically connected respectively with two external electrodes of testing capacitor, is characterized in that, described test fixing device comprises:
Substrate, which is provided with the first conducting wire and the second conducting wire, described the first conducting wire has the first test side and first link of electrical connection, described the second conducting wire has the second test side and second link of electrical connection, described the first test side is oppositely arranged for being electrically connected respectively with two described external electrodes with described the second test side, and described the first link and described the second link are for being electrically connected respectively with two external electrode lead-in wires;
Depression bar, is located at the top of gap between described the first test side and described the second test side, for being pressed between described the first test side and described the second test side spacing testing capacitor; And
Support member, is located on described substrate, for supporting described depression bar.
2. test fixing device as claimed in claim 1, it is characterized in that, described the first conducting wire and described the second conducting wire are symmetrical arranged, described the first test side and described the second test side are located at the medium position of described substrate, and described the first link and described the second link are located on the side of described substrate.
3. test fixing device as claimed in claim 1, is characterized in that, described the first conducting wire and described the second conducting wire be rectangular polyline shaped all.
4. test fixing device as claimed in claim 1, is characterized in that, described depression bar comprises main part and is positioned at Handheld Division and the pressure head portion at described main part two ends; On the cross section perpendicular to described main part axis, the sectional area of described Handheld Division is greater than the sectional area of described main part, and the sectional area of described pressure head portion is with reducing gradually away from described main part.
5. test fixing device as claimed in claim 4, is characterized in that, described main part and described Handheld Division are cylindrical structural, and described pressure head portion is conical, and described main part, the coaxial setting in described Handheld Division and described pressure head portion.
6. test fixing device as claimed in claim 5, it is characterized in that, described pressure head portion can insert gap and the described substrate contacts between described the first test side and described the second test side, in the time of described pressure head portion and described substrate contacts, the medium position of the axis of described depression bar gap between described the first test side and described the second test side.
7. test fixing device as claimed in claim 4, it is characterized in that, described support member comprises and is located at the suspension column on described substrate and is fixed on the back up pad on described suspension column, described back up pad middle part offers through hole, described main part and described pressure head portion can contact through described through hole and the periphery wall of described main part and the inwall of described through hole, and the size of described Handheld Division is greater than the size of described through hole.
8. a test macro, is characterized in that, comprises the test fixing device as described in any one in claim 1～7.
9. test macro as claimed in claim 8, it is characterized in that, also comprise test fixture, testing tool and D.C. regulated power supply, described test fixture is provided with two contact conductors and two electrode slots, two described contact conductors are electrically connected with described the first link and described the second link respectively, and two described contact conductors are inserted in respectively in described electrode slot, described testing tool coordinates electrical connection with described electrode slot and described D.C. regulated power supply, for described testing capacitor is carried out to direct current (DC) bias characteristic test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420160625.XU CN203881802U (en) | 2014-04-02 | 2014-04-02 | Testing and fixing device and testing system containing testing and fixing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420160625.XU CN203881802U (en) | 2014-04-02 | 2014-04-02 | Testing and fixing device and testing system containing testing and fixing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203881802U true CN203881802U (en) | 2014-10-15 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420160625.XU Expired - Fee Related CN203881802U (en) | 2014-04-02 | 2014-04-02 | Testing and fixing device and testing system containing testing and fixing device |
Country Status (1)
| Country | Link |
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| CN (1) | CN203881802U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104614560A (en) * | 2015-01-18 | 2015-05-13 | 北京工业大学 | Fixing device for measuring thermal resistance of semiconductor device |
| CN109714695A (en) * | 2019-01-23 | 2019-05-03 | 梧州恒声电子科技有限公司 | A kind of loudspeaker simple tone survey pole error-proofing clamp |
-
2014
- 2014-04-02 CN CN201420160625.XU patent/CN203881802U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104614560A (en) * | 2015-01-18 | 2015-05-13 | 北京工业大学 | Fixing device for measuring thermal resistance of semiconductor device |
| CN109714695A (en) * | 2019-01-23 | 2019-05-03 | 梧州恒声电子科技有限公司 | A kind of loudspeaker simple tone survey pole error-proofing clamp |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141015 Termination date: 20200402 |
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| CF01 | Termination of patent right due to non-payment of annual fee |