CN203534521U - A processing table for convenient transfer of semiconductor products - Google Patents

A processing table for convenient transfer of semiconductor products Download PDF

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Publication number
CN203534521U
CN203534521U CN201320561118.2U CN201320561118U CN203534521U CN 203534521 U CN203534521 U CN 203534521U CN 201320561118 U CN201320561118 U CN 201320561118U CN 203534521 U CN203534521 U CN 203534521U
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processing table
adapter
plate
utility
model
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敖利波
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Great Team Backend Foundry Dongguan Co Ltd
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Great Team Backend Foundry Dongguan Co Ltd
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Abstract

本实用新型公开一种方便半导体产品转移的加工台面,包括加工台面,所述加工台面包括一检查治具,所述检查治具包括一显微镜、一平行滑轨,所述平行滑轨的一端连接有一转接头,所述转接头的一侧连接有料管,所述显微镜的下方设有一磁铁,所述转接头包括A板与B板,所述A板与所述B板间留有一腔体,所述料管套接于所述转接头的一侧。本实用新型提供的一种方便半导体产品转移的加工台面,提升了检测半导体产品外观的效率,节约了企业的生产成本。

Figure 201320561118

The utility model discloses a processing table for convenient transfer of semiconductor products, including a processing table, the processing table including an inspection fixture, the inspection fixture including a microscope and a parallel slide rail, one end of the parallel slide rail is connected to an adapter, one side of the adapter is connected to a material tube, a magnet is provided below the microscope, the adapter includes an A plate and a B plate, a cavity is left between the A plate and the B plate, and the material tube is sleeved on one side of the adapter. The utility model provides a processing table for convenient transfer of semiconductor products, improves the efficiency of detecting the appearance of semiconductor products, and saves the production cost of enterprises.

Figure 201320561118

Description

一种方便半导体产品转移的加工台面A processing table for convenient transfer of semiconductor products

技术领域 technical field

本实用新型涉及半导体产品,具体涉及一种方便半导体产品转移的加工台面。 The utility model relates to semiconductor products, in particular to a processing table which facilitates the transfer of semiconductor products.

背景技术 Background technique

半导体产品完成切脚成型后会自动装入料管中,此时需要对产品的外观进行检查,现有的方法为手工单个逐次将产品从料管中倒出放在显微镜下检查,这样浪费了大量的劳动力,大大提升了企业的生产成本。 Semiconductor products will be automatically loaded into the material tube after cutting and forming. At this time, the appearance of the product needs to be inspected. The existing method is to manually pour the products out of the material tube one by one and check them under the microscope, which is a waste of time. A large amount of labor has greatly increased the production cost of the enterprise.

申请号为201220604562.3的中国专利公开了名称为“配合摄像头进行尺寸检查装置”,其包括一产品滑块治具、直边滑道板,所述的产品滑块治具与下面直边滑道板实现平行滑动,实现尺寸管控的基准线功能,其专利存在的缺点在于产品滑动缺乏灵活性,其只能在直线上作业,而产品送料可能从多个方向送料,此时又需人工将其产品放入直线滑轨上,这无疑又增加了工序。 The Chinese patent with the application number 201220604562.3 discloses the name "dimension inspection device with camera", which includes a product slider fixture and a straight-sided slideway plate, and the product slider fixture and the straight-edge slideway plate below Realize parallel sliding and achieve the baseline function of size control. The disadvantage of its patent is that the product sliding lacks flexibility, it can only work in a straight line, and the product feeding may be fed from multiple directions. At this time, the product needs to be manually moved. Putting it on the linear slide rail will undoubtedly increase the process.

实用新型内容 Utility model content

本实用新型的目的在于提供一种方便半导体产品转移的加工台面,提升了检测半导体产品外观的效率,节约企业的生产成本。 The purpose of the utility model is to provide a processing table that facilitates the transfer of semiconductor products, improves the efficiency of detecting the appearance of semiconductor products, and saves production costs of enterprises.

为了实现以上目的,本实用新型提供一种方便半导体产品转移的加工台面,包括加工台面,所述加工台面包括一检查治具,本实用新型的改进之处在于,所述检查治具包括一显微镜、一平行滑轨,所述平行滑轨的一端连接有一转接头,所述转接头的一侧连接有料管。 In order to achieve the above purpose, the utility model provides a processing table that facilitates the transfer of semiconductor products, including a processing table, the processing table includes an inspection fixture, the improvement of the utility model is that the inspection fixture includes a microscope 1. A parallel slide rail, one end of the parallel slide rail is connected with an adapter, and one side of the adapter is connected with a material pipe.

进一步的,所述显微镜的下方设有一磁铁。 Further, a magnet is provided under the microscope.

进一步的,所述转接头包括A板与B板,所述A板与所述B板间留有一腔体。 Further, the adapter includes an A plate and a B plate, and a cavity is left between the A plate and the B plate.

进一步的, 所述料管套接于所述转接头的一侧。 Further, the material tube is sleeved on one side of the adapter.

本实用新型提供的一种方便半导体产品转移的加工台面,采用滑道可一次检测多个半导体产品的外观,代替了现有人工一次检测一个半导体产品,提升了其检测效率,节约了企业的生产成本,同时采用转接头连接轨道的一侧,方便于料管中产品顺利的进入检查治具中,节约了检测时间。 The utility model provides a processing table that facilitates the transfer of semiconductor products. The slideway can be used to detect the appearance of multiple semiconductor products at one time, which replaces the existing manual detection of one semiconductor product at a time, improves its detection efficiency, and saves the production of enterprises. At the same time, an adapter is used to connect one side of the track, which is convenient for the product in the material tube to enter the inspection fixture smoothly, saving inspection time.

附图说明 Description of drawings

为了更清楚地说明本实用新型实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本实用新型的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。 In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are only some embodiments of the utility model, and those skilled in the art can also obtain other drawings based on these drawings without creative work.

图1为本实用新型提供的一种方便半导体产品转移的加工台面的结构示意图; Fig. 1 is a structural schematic diagram of a processing table that facilitates the transfer of semiconductor products provided by the utility model;

图2为本实用新型提供的转接头的侧视示意图; Fig. 2 is a schematic side view of the adapter provided by the present invention;

图3为本实用新型提供的料管的侧视示意图。 Fig. 3 is a schematic side view of the material tube provided by the utility model.

具体实施方式 Detailed ways

本实用新型提供一种方便半导体产品转移的加工台面,提升了检测半导体产品外观的效率,节约企业的生产成本。 The utility model provides a processing table which facilitates the transfer of semiconductor products, improves the efficiency of detecting the appearance of semiconductor products, and saves production costs of enterprises.

下面将结合本实用新型中的附图,对本实用新型中的技术方案进行清楚、完整地描述,显然,所描述的仅仅是本实用新型一部分实施例,而不是全部的实施例。基于本实用新型中的实施例,本领域普通技术人员在没有作出创造性劳动的前提下所获得的所有其他实施例,都属于本实用新型保护的范围。 The technical solution in the utility model will be clearly and completely described below in conjunction with the accompanying drawings in the utility model. Obviously, what is described is only a part of the embodiments of the utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present utility model.

参见图1、图2、图3分别为本实用新型提供的一种方便半导体产品转移的加工台面的结构示意图、本实用新型提供的转接头的侧视示意图、本实用新型提供的料管的侧视示意图。本实用新型提供的一种方便半导体产品转移的加工台面,包括加工台面,所述加工台面包括一检查治具,所述检查治具包括一显微镜1、一平行滑轨2,所述平行滑轨2的一端连接有一转接头3,所述转接头3的一侧连接有料管4,所述显微镜的下方设有一磁铁11,所述转接头3包括A板31与B板32,所述A板31与所述B板32间留有一腔体,固定半导体产品100, 所述料管4套接于所述转接头3的一侧,方便于料管中半导体产品顺利的进入检查治具中,节约了检测时间。 Referring to Fig. 1, Fig. 2 and Fig. 3 are respectively a schematic structural view of a processing table provided by the utility model to facilitate the transfer of semiconductor products, a schematic side view of the adapter provided by the utility model, and a side view of the material tube provided by the utility model. View schematic diagram. The utility model provides a processing table that facilitates the transfer of semiconductor products. One end of 2 is connected with an adapter 3, one side of the adapter 3 is connected with a material tube 4, a magnet 11 is arranged below the microscope, the adapter 3 includes an A plate 31 and a B plate 32, and the A plate There is a cavity between 31 and the B board 32 to fix the semiconductor product 100. The material tube 4 is socketed on one side of the adapter 3, so that the semiconductor product in the material tube can smoothly enter the inspection fixture. The detection time is saved.

通过以上描述可知,本实用新型提供的一种方便半导体产品转移的加工台面,采用滑道可一次检测多个半导体产品的外观,代替了现有人工一次检测一个半导体产品,提升了其检测效率,节约了企业的生产成本,同时采用转接头连接轨道的一侧,方便于料管中产品顺利的进入检查治具中,节约了检测时间。 From the above description, it can be seen that the utility model provides a processing table that facilitates the transfer of semiconductor products. The slideway can be used to detect the appearance of multiple semiconductor products at one time, which replaces the existing manual detection of one semiconductor product at a time, and improves its detection efficiency. The production cost of the enterprise is saved. At the same time, the adapter is used to connect one side of the track, which is convenient for the products in the material pipe to enter the inspection fixture smoothly, and saves the inspection time.

以上内容是结合具体的优选实施方式对本实用新型所作的进一步详细说明,不能认定本实用新型的具体实施只局限于这些说明。对于本实用新型所属技术领域的普通技术人员来说,在不脱离本实用新型构思的前提下,还可以做出若干简单推演或替换,都应当视为属于本实用新型的保护范围。 The above content is a further detailed description of the utility model in combination with specific preferred embodiments, and it cannot be assumed that the specific implementation of the utility model is only limited to these descriptions. For a person of ordinary skill in the technical field to which the utility model belongs, without departing from the concept of the utility model, some simple deduction or substitutions can also be made, which should be regarded as belonging to the protection scope of the utility model.

Claims (4)

1. a processing table top that facilitates semiconductor product to shift, comprise processing table top, described machine table face comprises an inspection tool, it is characterized in that, described inspection tool comprises a microscope, a parallel sliding track, one end of described parallel sliding track is connected with an adapter, and a side of described adapter is connected with material pipe.
2. a kind of processing table top that facilitates semiconductor product to shift according to claim 1, is characterized in that, described microscopical below is provided with a magnet.
3. a kind of processing table top that facilitates semiconductor product to shift according to claim 1, is characterized in that, described adapter comprises A plate and B plate, between described A plate and described B plate, leaves a cavity.
4. a kind of processing table top that facilitates semiconductor product to shift according to claim 1, is characterized in that, described material pipe box is connected to a side of described adapter.
CN201320561118.2U 2013-09-11 2013-09-11 A processing table for convenient transfer of semiconductor products Expired - Fee Related CN203534521U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115494081A (en) * 2022-09-27 2022-12-20 珠海格力新元电子有限公司 A semiconductor appearance inspection jig

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115494081A (en) * 2022-09-27 2022-12-20 珠海格力新元电子有限公司 A semiconductor appearance inspection jig

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Granted publication date: 20140409

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