CN203519778U - Chip finished product testing machine - Google Patents

Chip finished product testing machine Download PDF

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Publication number
CN203519778U
CN203519778U CN201320562116.5U CN201320562116U CN203519778U CN 203519778 U CN203519778 U CN 203519778U CN 201320562116 U CN201320562116 U CN 201320562116U CN 203519778 U CN203519778 U CN 203519778U
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CN
China
Prior art keywords
chip
pick
inspection
cartridges
testing machine
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
CN201320562116.5U
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Chinese (zh)
Inventor
朱玉萍
朱国璋
岑刚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiaxing Jingyan Intelligent Equipment Technology Co Ltd
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Jiaxing Jingyan Intelligent Equipment Technology Co Ltd
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Application filed by Jiaxing Jingyan Intelligent Equipment Technology Co Ltd filed Critical Jiaxing Jingyan Intelligent Equipment Technology Co Ltd
Priority to CN201320562116.5U priority Critical patent/CN203519778U/en
Application granted granted Critical
Publication of CN203519778U publication Critical patent/CN203519778U/en
Anticipated expiration legal-status Critical
Withdrawn - After Issue legal-status Critical Current

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Abstract

The utility model relates to the technical field of integrated circuit chip processing and discloses a chip finished product testing machine. A first side of a pedestal is provided with a chip conveyer and an inspection device is arranged on a second side of the pedestal. Both of the chip conveyer and the inspection device are provided with longitudinal guide rails extending along the side edges of the pedestal. A transverse guide rail is arranged over the two longitudinal guide rails on the pedestal. The transverse guide rail is provided with an angle picking device. A picking arm of the angle picking device is disposed on the left side of the transverse guide rail. A first camera detecting device is arranged on the left side of the transverse guide rail on the pedestal. A displacement picking device is arranged on the transverse guide rail. A picking arm of the displacement picking device is disposed on the right side of the transverse guide rail. A second camera detecting device, a cover opening/closing device, an air cylinder turning device and a final angle positioning device are arranged on the right side of the transverse guide rail on the pedestal. The chip finished product testing machine provided by the utility model realizes automation of step-by-step detection of chips. The detection efficiency is high and adverse factors due to manual intervention are reduced.

Description

Chip finished-product testing machine
Technical field
The utility model relates to integrated circuit (IC) chip processing technology field, particularly a kind of chip finished-product testing machine.
Background technology
MEMS chip finished product will detect chip after producing, and Detection of content comprises physical imperfection detection, magnetic induction measurement etc., and the qualified chip after detection will encapsulate, and defective chip will reclaim.In existing operating process, this series of actions is all by manually completing, and indivedual work steps are realized by automation mechanized operation, but on the whole, manual intervention is large, and efficiency is low, and the pollution causing to chip is large.
Utility model content
The purpose of this utility model is in order to solve the problems of the technologies described above, and a kind of chip finished-product testing machine is provided, and by full-automatic flow process, realizes the fast detecting examination of chip.
The technical scheme that the utility model is taked is:
A kind of chip finished-product testing machine, it is characterized in that, comprise base, the first side at described base arranges chip transfer apparatus, the second side at described base arranges feeding device for inspection, described chip transfer apparatus and feeding device for inspection all have the longitudinal rail along chassis side, on described base, be positioned at two longitudinal rails above across establishing a cross slide way, angle pick device is set on described cross slide way, the pick-up arm of described angle pick device is positioned at the left side of described cross slide way, the left side that is positioned at described cross slide way on described base arranges first camera pick-up unit, displacement pick device is set on described cross slide way, the pick-up arm of described displacement pick device is positioned at the right side of described cross slide way, the right side that is positioned at described cross slide way on described base arranges second camera pick-up unit, take off and cover lid arrangement, cylinder turning device and final angle locating device, described chip transfer apparatus is sent to predeterminated position by chip, described angle pick device carries out angular setting by chip pickup and after described first camera pick-up unit detects, and chip-stacked after adjusting entered to chip cartridges, described chip cartridges is placed in described feeding device for inspection, through described in take off and cover lid arrangement described chip cartridges is carried out to capping, chip cartridges after capping is transported to cylinder turning device through feeding device for inspection, described cylinder turning device is by described chip cartridges upset predetermined angle, described feeding device for inspection is sent described chip cartridges into described final angle locating device, making described chip cartridges be placed in a magnetic field tests, after having tested, described chip cartridges turn to horizontality by described cylinder turning device, described feeding device for inspection is taken off hamper lid arrangement position described in described chip cartridges is delivered to, described taking off covers lid arrangement by the cover lifting of described chip cartridges, described feeding device for inspection is delivered to described displacement pick device position by described chip cartridges, the chip that described displacement pick device picks up in described chip cartridges detects by described second camera pick-up unit.
Further, described chip finished-product testing machine also comprises retracting device and belt-braiding device, described retracting device is arranged on a side of described second camera pick-up unit, described belt-braiding device is arranged on a side of close described chip transfer apparatus on described transverse axis, after described second camera pick-up unit completes described chip detection, described displacement pick device is positioned over defective chip in described retracting device, and qualified chip is encapsulated by described belt-braiding device.
Further, described chip finished-product testing machine also comprises retracting device and chip disk, described retracting device is arranged on a side of described second camera pick-up unit, described belt-braiding device is arranged on a side of close described chip transfer apparatus on described transverse axis, after described second camera pick-up unit completes described chip detection, described displacement pick device is positioned over defective chip in described retracting device, and qualified chip is exported by described chip disk.
Further, the chip cartridges on described feeding device for inspection is two, and the empty chip cartridges on feeding device for inspection is loaded for chip, and the chip cartridges of filling chip on feeding device for inspection is for detection below.
Further, described feeding device for inspection comprises a plurality of manual feeding device for inspection, and when described each manual feeding device for inspection all has chip cartridges, described angle pick device stacks gradually the chip on described chip transfer apparatus to described each manual detection device.
A kind of chip finished-product testing machine, it is characterized in that, comprise base, chip transfer apparatus is set on described base, described chip transfer apparatus has along the longitudinal rail of chassis side direction, on described base, be positioned at described chip transfer apparatus above across establishing a cross slide way, displacement pick device is set on described cross slide way, one end at described transverse axis arranges belt-braiding device, and the chip pickup that described displacement pick device sends described chip transfer apparatus is carried to described belt-braiding device and encapsulates.
The beneficial effects of the utility model are:
(1) realized the robotization that the substep of chip is detected;
(2) detection efficiency is high, has reduced the unfavorable factor that manual intervention brings;
(3), after simplified structure, form a kind of chip package machine.
Accompanying drawing explanation
Accompanying drawing 1 is the vertical view of chip finished-product testing machine;
Accompanying drawing 2 is the stereographic map at a visual angle of chip finished-product testing machine;
Accompanying drawing 3 is the stereographic map at another visual angle of chip finished-product testing machine.
Mark in accompanying drawing is respectively:
1. base; 2. chip transfer apparatus;
3. feeding device for inspection; 4. cross slide way;
5. angle pick device; 6. first camera pick-up unit;
7. displacement pick device; 8. second camera pick-up unit;
9. take off and cover lid arrangement; 10. cylinder turning device;
11. final angle locating devices; 12. retracting devices;
13. belt-braiding devices.
Embodiment
Below in conjunction with accompanying drawing, the embodiment of the utility model chip finished-product testing machine is elaborated.
In order to allow the utility model easy to understand, some directivity terms in this instructions, have been used.It should be noted that, the directivity term of mentioning in this instructions, such as " on ", D score, " left side ", " right side ", 'fornt', 'back' etc., be the direction with reference to accompanying drawing, with the XYZ coordinate in accompanying drawing, be reference, Z axis positive dirction be made as " on ", Z axis negative direction is made as D score, and X-axis positive dirction is made as " front ", and X-axis negative direction is made as " afterwards ", Y-axis positive dirction is made as " left side ", and Y-axis negative direction is made as " right side ".The directivity term using is in order to illustrate and to understand the utility model, but not in order to limit protection domain of the present utility model.
Referring to accompanying drawing 1 to 3, the base 1 of chip finished-product testing machine is square, and it comprises the double-decker that a plurality of bracket leg are propped up, and upper strata is used for installing various devices, and lower floor is honeycomb Openworks shape.The first side on the upper strata of base 1, be that front side arranges chip transfer apparatus 2, in second side on the upper strata of base 1, rear side arranges feeding device for inspection 3, chip transfer apparatus 2 has along the longitudinal rail of base upper strata front side edge, and the drive disk assembly of this longitudinal rail is arranged between the levels of base 1.Equally, feeding device for inspection 3 also has along the longitudinal rail of base upper strata back side edge, and the drive disk assembly of this longitudinal rail is arranged between the levels of base 1.On the upper strata of base 1, be positioned at the top of above-mentioned two longitudinal rails across establishing a cross slide way 4, angle pick device 5 is set on cross slide way 4, the pick-up arm of angle pick device 5 is positioned at the left side of cross slide way 4, the left side that is positioned at cross slide way 4 on base 1 arranges first camera pick-up unit 6, displacement pick device 7 is also set on cross slide way 4, the pick-up arm of displacement pick device 7 is positioned at the right side of cross slide way 4, the right side that is positioned at cross slide way 4 on base 1 arranges second camera pick-up unit 8, take off and cover lid arrangement 9, cylinder turning device 10 and final angle locating device 11.In the same side of second camera pick-up unit 8, retracting device 12 and belt-braiding device 13 are set.Above-mentioned each device is controlled by the control module of chip finished-product testing machine, achieves the test of finished chip.
The course of work of chip finished-product testing machine is as follows, finished chip is sent to predeterminated position through chip transfer apparatus, angle pick device carries out angular setting by chip pickup and after first camera pick-up unit detects, and by the chip-stacked chip cartridges of putting into after adjusting, chip cartridges is placed on feeding device for inspection, through taking off, cover lid arrangement chip cartridges is carried out to capping, chip cartridges after capping is transported to cylinder turning device through feeding device for inspection, cylinder turning device is by the chip cartridges predetermined angle of overturning, feeding device for inspection is sent chip cartridges into final angle locating device, the magnetic field that makes chip cartridges be placed in setting is tested, after having tested, chip cartridges turn to horizontality by cylinder turning device, feeding device for inspection is delivered to chip cartridges to take off hamper lid arrangement position, take off and cover lid arrangement by the cover lifting of chip cartridges, feeding device for inspection is delivered to displacement pick device position by chip cartridges, chip in displacement pick device pick-up chip box detects by second camera pick-up unit.After second camera pick-up unit completes chip detection, displacement pick device is positioned over defective chip in retracting device, and qualified chip is encapsulated by belt-braiding device.
Belt-braiding device for chip is encapsulated, is not needing on the production line of packaged chip, and belt-braiding device used chip dish replaces, when qualified chip is moved to chip disk by displacement pick device, chip disk fill after by conveyer or manually output.
Chip cartridges on feeding device for inspection is two, for chip, load for one, be that angle pick device is put into chip cartridges by chip, the chip cartridges of filling chip is transmitted toward later process, simultaneously, displacement pick device is carried to feeding device for inspection by the hollow film magazine that takes out chip, exchanges with the chip cartridges of filling chip, realizes cycle operation.
Feeding device for inspection can comprise a plurality of manual feeding device for inspection, and feeding device for inspection is by manually substituting, manually during censorship, and configurable a plurality of chip cartridges, each chip cartridges is corresponding to an artificial check point.Angle pick device stacks gradually the chip on chip transfer apparatus to the chip cartridges of each manual check point.
Above-mentioned chip finished-product testing machine, except detecting encapsulation operation, can also carry out function simplification, the displacement pick device arranging on chip transfer apparatus and cross slide way is only set on its base, and in one end of transverse axis, belt-braiding device is set, cancel the device of many test sections such as two camera apparatus, angle pick device, cylinder turning device.The chip that chip transfer apparatus sends is carried to belt-braiding device by displacement pick device and encapsulates.Its work completing is directly chip to be transmitted to encapsulation, is applicable to the fast packing of qualified chip.
The above is only preferred implementation of the present utility model; it should be pointed out that for those skilled in the art, do not departing under the prerequisite of the utility model principle; can also make some improvements and modifications, these improvements and modifications also should be considered as protection domain of the present utility model.

Claims (6)

1. a chip finished-product testing machine, it is characterized in that: comprise base, the first side at described base arranges chip transfer apparatus, the second side at described base arranges feeding device for inspection, described chip transfer apparatus and feeding device for inspection all have the longitudinal rail along chassis side, on described base, be positioned at two longitudinal rails above across establishing a cross slide way, angle pick device is set on described cross slide way, the pick-up arm of described angle pick device is positioned at the left side of described cross slide way, the left side that is positioned at described cross slide way on described base arranges first camera pick-up unit, displacement pick device is set on described cross slide way, the pick-up arm of described displacement pick device is positioned at the right side of described cross slide way, the right side that is positioned at described cross slide way on described base arranges second camera pick-up unit, take off and cover lid arrangement, cylinder turning device and final angle locating device, described chip transfer apparatus is sent to predeterminated position by chip, described angle pick device carries out angular setting by chip pickup and after described first camera pick-up unit detects, and chip-stacked after adjusting entered to chip cartridges, described chip cartridges is placed in described feeding device for inspection, through described in take off and cover lid arrangement described chip cartridges is carried out to capping, chip cartridges after capping is transported to cylinder turning device through feeding device for inspection, described cylinder turning device is by described chip cartridges upset predetermined angle, described feeding device for inspection is sent described chip cartridges into described final angle locating device, making described chip cartridges be placed in a magnetic field tests, after having tested, described chip cartridges turn to horizontality by described cylinder turning device, described feeding device for inspection is taken off hamper lid arrangement position described in described chip cartridges is delivered to, described taking off covers lid arrangement by the cover lifting of described chip cartridges, described feeding device for inspection is delivered to described displacement pick device position by described chip cartridges, the chip that described displacement pick device picks up in described chip cartridges detects by described second camera pick-up unit.
2. chip finished-product testing machine according to claim 1, it is characterized in that: described chip finished-product testing machine also comprises retracting device and belt-braiding device, described retracting device is arranged on a side of described second camera pick-up unit, described belt-braiding device is arranged on a side of close described chip transfer apparatus on described transverse axis, after described second camera pick-up unit completes described chip detection, described displacement pick device is positioned over defective chip in described retracting device, and qualified chip is encapsulated by described belt-braiding device.
3. chip finished-product testing machine according to claim 1, it is characterized in that: described chip finished-product testing machine also comprises retracting device and chip disk, described retracting device is arranged on a side of described second camera pick-up unit, described belt-braiding device is arranged on a side of close described chip transfer apparatus on described transverse axis, after described second camera pick-up unit completes described chip detection, described displacement pick device is positioned over defective chip in described retracting device, and qualified chip is exported by described chip disk.
4. chip finished-product testing machine according to claim 1, is characterized in that: the chip cartridges on described feeding device for inspection is two, and the empty chip cartridges on feeding device for inspection is loaded for chip, and the chip cartridges of filling chip on feeding device for inspection is for detection below.
5. chip finished-product testing machine according to claim 1, it is characterized in that: described feeding device for inspection comprises a plurality of manual feeding device for inspection, when described each manual feeding device for inspection all has chip cartridges, described angle pick device stacks gradually the chip on described chip transfer apparatus to described each manual detection device.
6. a chip finished-product testing machine, it is characterized in that: comprise base, chip transfer apparatus is set on described base, described chip transfer apparatus has along the longitudinal rail of chassis side direction, on described base, be positioned at described chip transfer apparatus above across establishing a cross slide way, displacement pick device is set on described cross slide way, one end at described transverse axis arranges belt-braiding device, and the chip pickup that described displacement pick device sends described chip transfer apparatus is carried to described belt-braiding device and encapsulates.
CN201320562116.5U 2013-09-10 2013-09-10 Chip finished product testing machine Withdrawn - After Issue CN203519778U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201320562116.5U CN203519778U (en) 2013-09-10 2013-09-10 Chip finished product testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201320562116.5U CN203519778U (en) 2013-09-10 2013-09-10 Chip finished product testing machine

Publications (1)

Publication Number Publication Date
CN203519778U true CN203519778U (en) 2014-04-02

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201320562116.5U Withdrawn - After Issue CN203519778U (en) 2013-09-10 2013-09-10 Chip finished product testing machine

Country Status (1)

Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103454576A (en) * 2013-09-10 2013-12-18 嘉兴景焱智能装备技术有限公司 Test machine for finished chips
CN105719985A (en) * 2016-04-20 2016-06-29 湖州国信物资有限公司 Detection system of BGA chip

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103454576A (en) * 2013-09-10 2013-12-18 嘉兴景焱智能装备技术有限公司 Test machine for finished chips
CN103454576B (en) * 2013-09-10 2015-08-26 嘉兴景焱智能装备技术有限公司 Chip finished-product testing machine
CN105719985A (en) * 2016-04-20 2016-06-29 湖州国信物资有限公司 Detection system of BGA chip
CN105719985B (en) * 2016-04-20 2018-06-26 深圳市比亚泰科技有限公司 A kind of detecting system of bga chip

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C14 Grant of patent or utility model
GR01 Patent grant
AV01 Patent right actively abandoned

Granted publication date: 20140402

Effective date of abandoning: 20150826

RGAV Abandon patent right to avoid regrant