CN203438103U - Universal testing clamp for detecting microscopic infrared junction temperature of microwave power device - Google Patents
Universal testing clamp for detecting microscopic infrared junction temperature of microwave power device Download PDFInfo
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- CN203438103U CN203438103U CN201320440371.2U CN201320440371U CN203438103U CN 203438103 U CN203438103 U CN 203438103U CN 201320440371 U CN201320440371 U CN 201320440371U CN 203438103 U CN203438103 U CN 203438103U
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Abstract
The utility model discloses a universal testing clamp for detecting the microscopic infrared junction temperature of a microwave power device and belongs to the technical field of infrared temperature measurement. The structure of the universal testing clamp is a split type structure and mainly comprises three parts, i.e., a base, a middle carrier and two circuit carriers, wherein the base is provided with the two circuit carriers and one middle carrier; the two circuit carriers are arranged in parallel and are positioned at the same plane; the middle carrier is arranged between the two circuit carriers; a gap is left between each circuit carrier and the middle carrier respectively; the circuit carriers are provided with testing circuit boards which are communicated by a pipe leg of a tested device; and the tested device is fixed on the middle carrier. The universal testing clamp disclosed by the utility model has the advantages that the universality and the operability are higher, the detection efficiency is greatly improved, the labor cost and the material cost are reduced and the product development period is shortened.
Description
Technical field
The utility model relates to infrared temperature-test technology field, especially a kind of Universal test clamping apparatus that is applicable to infrared microscopy junction temperature detection under various microwave power device DC condition.
Background technology
It is the requisite important step that the performance of device and life-span are assessed that microwave power device is carried out to temperature detection.In the whole bag of tricks and equipment of existing microwave power device temperature detection, thermal microscope is accepted extensively by industry with its higher spatial resolution, higher temperature control, the higher advantages such as sampling rate.Real-time, the accurate Temperature Distribution of utilizing the method can realize for DC operation condition microwave power device temperature detects.This all has great significance for fields such as microwave power device design, production, detection, failure analyses.
But, microwave power device being carried out to infrared microscopy temperature detection, device need to be fixed on special-purpose test fixture.Domestic general way is at present, adopts microwave test fixture to carry out infrared temperature detection, and this has saved cost to a certain extent.But because microwave power device is of a great variety, different components size, different, causes the versatility of fixture poor, often need to change fixture in testing process, this has wasted a large amount of time virtually, has reduced detection efficiency; In addition, some microwave test fixture is due to frame for movement or circuit design and be not suitable for and carry out infrared microscopy temperature detection, utilizes the temperature detection result that these fixtures obtain can have larger error.
In order to strengthen versatility, the raising detection efficiency of test fixture, and get rid of impact testing result is caused because clamp structure is unreasonable, the accuracy that ensures microwave power device infrared microscopy junction temperature testing result, designs a fixture that is applicable to infrared microscopy temperature detection under various microwave power device DC condition and is necessary.This fixture will provide strong temperature detection guarantee for improving microwave power device production cycle, test analysis ability and the ability of designing and developing.
What the existing test fixture for microwave power device infrared microscopy temperature detection adopted is the microwave test fixture of device special use, and its advantage has:
1) for device of the same race, all adopt same class fixture to carry out the test of various parameters, clamp structure is fixed, size is fixed, and can guarantee to greatest extent the uniformity of device duty.
2) fixture, through special design and processing, can be eliminated as uncertain factors such as device self-excitations.
Its shortcoming is mainly reflected in:
1) versatility is poor, complicated operation, device for different model, need to design different fixtures, different fixture size, connect electric mode and be all not quite similar, when measured device model changes, often need to change fixture, rewiring, this is very inconvenient for infrared microscopy temperature detection, can reduce to a great extent the efficiency of mass detection; In addition, existing test fixture generally all takes the fixing mode of screw to guarantee the thermo-contact of device, and changing a device often needs to dismantle more than four screws, and this has had a strong impact on the speed detecting especially.
2) be difficult to guarantee the thermo-contact of device and fixture; The bad detected temperatures result that must cause of thermo-contact is higher, and the thermal resistance value of calculating is higher, for the performance of device, causes erroneous judgement.Because microwave test fixture carries out circuit and structural design mainly for its microwave property, aspect thermal design, the method for generally reinforcing and smearing thermal grease conduction by a plurality of screws guarantees between device and fixture, to possess good thermo-contact.But smearing thermal grease conduction while detecting for product class device likely can stained device; And only depend on screw to fix, and can not effectively guarantee thermo-contact, fact proved, the degree of tightness of screw can cause very large impact to testing result.
3) some microwave power device test fixture is for the special briquetting that guaranteed electrical contact design that device is good.Experiment discovery, briquette structure can cause infrared microscopy temperature detection result on the low side.
Utility model content
The technical problems to be solved in the utility model is to provide a kind of Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature, this fixture can improve the efficiency that the infrared junction temperature of microwave power device detects, guarantee testing result accurately and reliably, and this fixture has versatility.
For solving the problems of the technologies described above, technical solution adopted in the utility model is: a kind of Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature, it is characterized in that comprising square base, two circuit carriers and an intermediate carrier are set on described base, two circuit carriers be arranged in parallel, and in same plane, between two circuit carriers, be provided with intermediate carrier, between circuit carrier and intermediate carrier, all leave gap, on circuit carrier, be provided with testing circuit board, testing circuit board on two circuit carriers is communicated with by the pipe leg of measured device, described measured device is fixed on intermediate carrier.
Said structure is done further to supplement, and the adjacent side of described intermediate carrier upper surface and two circuit carriers surrounds the chamber, the end of placing measured device, and described measured device is fixed on intermediate carrier by staple.
Said structure is done further to supplement, and described circuit carrier is provided with the slide opening of horizontal direction, and in described slide opening, through screw, the end of screw coordinates with the screw on base.In the utility model, screw passes circuit carrier and is fixed on the screw on base, by tightening screw, can make circuit carrier be fixed on base.Circuit carrier regulates at horizontal level, by push-pull circuit carrier in horizontal direction, circuit carrier horizontal level is changed, and reaches the object of distance between regulating circuit carrier and intermediate carrier.
Said structure is done further to supplement, and described slide opening is set to two, and two slide openings be arranged in parallel, and are positioned at the diagonal angle of circuit carrier, in two slide openings, are equipped with the screw being mated.Two parallel slide openings are set in the utility model, and the width of slide opening coordinates with the screw diameter of axle, guarantee that integral body do not rotate when moving horizontally, testing circuit board coordinates completely with the pipe leg of measured device, guarantees test accuracy.
Said structure is done further to supplement, on described screw, be socketed with spring, spring is between circuit carrier and base, and in compressive state.In the utility model, by the elasticity of spring, carry out the height of control circuit carrier, when needs are heightened, loosening screw, otherwise, tighten screw.Spring on screw is can holding circuit carrier height constant.
Said structure is done further to supplement, and the upper surface of described intermediate carrier is coated with one deck indium sheet.The utility model, in order to get rid of the bad phenomenon of thermo-contact causing due to the fastening degree of staple, takes screw fastening and pad to cover the method for indium sheet, fully guarantees thermo-contact good between measured device and intermediate carrier.
Said structure is done further to supplement, also comprise two symmetrically arranged briquettings, described briquetting is located at 2 above circuit carrier, and compresses the pipe leg of measured device.Briquetting in the utility model is to guarantee that pipe leg and testing circuit board power up the good contact of microstrip line, the appearance of cavity in traditional briquette structure with holes has been avoided in the setting of two side pressing blocks, improve the degree of accuracy of testing result, get rid of fixture cavity body structure for the impact detecting.
The beneficial effect that adopts technique scheme to produce is: the utility model has designed special-purpose frame for movement and circuit structure, adopt the combination of base, circuit carrier and intermediate carrier, realize circuit carrier in the horizontal direction with vertical direction on adjusting, can meet the needs that various microwave power device infrared microscopy junction temperatures detect, there is higher versatility; Intermediate carrier carrying measured device in the utility model, the good thermo-contact of device and carrier is to guarantee one of key factor of the testing result degree of accuracy, takes to cover indium sheet on intermediate carrier in structure, the mode that adds screw in compression guarantees thermo-contact; Briquetting form in the utility model has been avoided the formation of cavity, and can meet the testing requirement of different size device, guarantees the degree of accuracy of testing result; The utility model is simple in structure, and operating aspect has been saved in test the clamp-replacing time, has improved detection efficiency.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, the utility model is described in further detail.
Fig. 1 is general structure front view of the present utility model;
Fig. 2 is the utility model horizontal level adjusting device schematic diagram;
Fig. 3 is the schematic diagram removing in Fig. 2 after screw;
Fig. 4 is measured device thermo-contact structural representation;
Fig. 5 is the top view of the utility model in test;
Fig. 6 is the infrared detection figure of the utility model in test process;
Fig. 7 is the result that adopts traditional microwave test fixture to detect a certain model device, and maximum temperature is 133;
Fig. 8 is for adopting the utility model same device to be carried out under identical power consumption condition to the result of temperature detection, and maximum temperature is 154 ℃;
Wherein: 1, circuit carrier, 2, base, 3, pipe leg, 4, intermediate carrier, 5, chamber, the end, 6, slide opening, 7, screw, 8, testing circuit board, 9, screw, 10, measured device, 11, indium sheet, 12, staple, 13, briquetting.
The specific embodiment
The utility model is specifically related to a kind of Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature, for the high accuracy infrared microscopy temperature detection under various microwave power device DC condition.
1 is known with reference to the accompanying drawings, the utility model is split-type structural, mainly by base 2, intermediate carrier 4 and 1 three parts of two circuit carriers form, two circuit carriers 1 and an intermediate carrier 4 are set on base 2, two circuit carriers 1 be arranged in parallel, and in same plane, between two circuit carriers 1, be provided with intermediate carrier 4, between circuit carrier 1 and intermediate carrier 4, all leave gap, on circuit carrier 1, be provided with testing circuit board 8, testing circuit board 8 on two circuit carriers 1 is communicated with by the pipe leg 3 of measured device 10, measured device 10 is fixed on intermediate carrier 4.Adjacent side by intermediate carrier 1 upper surface and two circuit carriers 1 surrounds the chamber, the end 5 of placing measured device 10, and measured device 10 is fixed on intermediate carrier 4 by staple 12.Testing circuit board 8 is fixed by welding on both sides circuit carrier 1, forms test module.On intermediate carrier 4, place measured device 10, measured device 10 is fixed on intermediate carrier 4 by screw, measured device 10 is managed leg 3 by the left and right sides and is connected with test module circuit, and chamber, the end 5 and the both sides circuit carrier 1 of measured device 10 are adjacent to, for 10 liang of side pipe legs 3 of measured device provide support.
The utility model is for different measured device 10, end chamber 5 sizes corresponding due to different components are different, only have by regulating circuit carrier 1 and the distance of intermediate carrier 4 and could meet different size requirement on devices, therefore the spacing of both sides circuit carrier 1 and be highly can be freely regulated according to the size of measured device 10, but both sides carrier should directly not contact with intermediate carrier 4.Under original state, the height of intermediate carrier 4, higher than the circuit carrier 1 of both sides, when using, need to be heightened the circuit carrier 1 of both sides, guarantees that pipe leg 3 contacts with testing circuit board 8.Because the thickness of measured device 10 is different, also can, according to the thickness of measured device 10, intermediate carrier 4 be changed, to adapt to different test case.
In accompanying drawing 2 and accompanying drawing 3, can find out that circuit carrier 1 is provided with the slide opening 6 of horizontal direction, in slide opening 6, through screw 7, the end of screw 7 coordinates with the screw 9 on base 2.Slide opening 6 is set to two, and two slide openings 6 be arranged in parallel, and is positioned at the diagonal angle of circuit carrier 1, is equipped with the screw 7 being mated in two slide openings 6.
The realization that horizontal level regulates: between circuit carrier 1 and intermediate carrier 4, distance is adjustable, and slide opening 6 is positioned on circuit carrier 1, and its screwing 7 is corresponding with screw 9 on intermediate carrier 4.Screw 7 is fixed on screw 9, by tightening screw 7, can make circuit carrier 1 be fixed on intermediate carrier 4.By unscrewing screw 7, can make circuit carrier 1 along continuous straight runs on intermediate carrier 4 move around, reach the object of distance between regulating circuit carrier 1 and intermediate carrier 4.
The realization that upright position regulates: screw 7 is rear through a spring by testing circuit board 8, access again the screw 9 of two wing bases 2, spring, between circuit carrier and base, and in compressive state, just can be realized the adjusting of circuit board upright position by slack adjuster like this.
Microwave power device infrared microscopy junction temperature detects two crucial aspects and is thermo-contacts and electrically contacts, and in order to guarantee good thermo-contact and to electrically contact, has designed device fixed structure.
Base in the utility model and carrier all adopt the brass material that thermal conductivity is good, intensity is high.In addition, in order to guarantee the realization of good thermo-contact, in accompanying drawing 4, can find out, the upper surface of intermediate carrier 4 is coated with one deck indium sheet 11.Indium is the very good and soft metal material of quality of a kind of thermal conductivity, and this material can fully fill up the air gap between device and carrier after device pressing, thereby greatly reduces thermal resistance between device and carrier to guarantee thermo-contact characteristic.In order to get rid of the bad phenomenon of thermo-contact causing due to screw tightening degree, take screw fastening and pad to cover the method for indium sheet 11, fully guarantee thermo-contact good between measured device 10 and intermediate carrier 4.
In order to guarantee the good realization electrically contacting, traditional microwave test fixture adopts briquette structure with holes to guarantee that pipe leg and circuit board power up the good contact of microstrip line.But the briquette structure here can form a cavity, the size of cavity can cause larger impact to infrared microscopy junction temperature testing result.Two briquettings 13 symmetrical, that consist of polytetrafluoroethylmaterial material are set here on circuit carrier 1, with the fixing pipe leg 3 of measured device 10, as shown in Figure 5, have avoided the formation of cavity and can meet the testing requirement of different size device.Two topmost effects of side pressing block are the degrees of accuracy that improve testing result, get rid of fixture cavity body structure for the impact detecting.
For advantage of the present utility model place is described, for the test process of each 20 devices of two models, be that example describes.Adopt the situation of common microwave test fixture as follows:
For the electrical lead that adds of 2 kinds of microwave test fixtures and correspondence, concrete testing procedure is as follows:
1,, according to the suitable intermediate carrier 4 of measured device 10 size Selection, guarantee that measured device 10 nail 12 that can be fixed is fixed on intermediate carrier 4;
2, according to the condition that powers up of measured device 10, power supply output line is connected on circuit carrier 1 and intermediate carrier 4;
3, adjustment screw 7, make feed line good contact in the pipe leg 3 of measured device and the testing circuit board 8 of circuit carrier 1;
4, the utility model is placed on thermal infrared imager heating platform;
5, pressing two side pressing blocks 13;
6, power up and test;
7, open two side pressing blocks 13, unscrew the staple 12 of intermediate carrier 4, change measured device;
8, pressing two side pressing blocks 13, add electrical testing;
If the model of 9 measured devices changes, only need to change intermediate carrier 4, and micrometer adjusting screw 7 can repeat to measure by above-mentioned steps.
In test process, the temperature value gathering is the temperature on the measured device middle part horizontal line shown in Fig. 6, wherein along horizontal line temperature value from left to right, can have Fig. 7 and Fig. 8 to find out.
Test result is as follows:
The overall test time is 4 hours, and wherein the clamp-replacing time is 10 minutes, and the device lay day has accounted for 2 and a half hours, and maximum temperature is 133 ℃, as shown in Figure 7.
Adopt the situation of this patent Universal test clamping apparatus as follows:
Standby Universal test clamping apparatus and to add electrical lead a set of;
The overall test time is 3 hours, has saved the clamp-replacing time, and total lay day of device is 1 hour, and maximum temperature is 154 ℃, as shown in Figure 8.
Therefore the utility model can meet the needs that various microwave power device infrared microscopy junction temperatures detect, and has improved detection efficiency, and has guaranteed the degree of accuracy of testing result.
Claims (7)
1. the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature, it is characterized in that comprising square base (2), two circuit carriers (1) and an intermediate carrier (4) are set on described base (2), two circuit carriers (1) be arranged in parallel, and in same plane, between two circuit carriers (1), be provided with intermediate carrier (4), between circuit carrier (1) and intermediate carrier (4), all leave gap, on circuit carrier (1), be provided with testing circuit board (8), testing circuit board (8) on two circuit carriers (1) is communicated with by the pipe leg (3) of measured device (10), described measured device (10) is fixed on intermediate carrier (4).
2. the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature according to claim 1, the adjacent side that it is characterized in that described intermediate carrier (1) upper surface and two circuit carriers (1) surrounds the chamber, the end (5) of placing measured device (10), and described measured device (10) is fixed on intermediate carrier (4) by staple (12).
3. the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature according to claim 1, it is characterized in that described circuit carrier (1) is provided with the slide opening (6) of horizontal direction, in described slide opening (6), through screw (7), the end of screw (7) coordinates with the screw (9) on base (2).
4. the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature according to claim 3, it is characterized in that described slide opening (6) is set to two, article two, slide opening (6) be arranged in parallel, and be positioned at the diagonal angle of circuit carrier (1), in two slide openings (6), be equipped with the screw (7) being mated.
5. according to the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature described in claim 3 or 4, it is characterized in that being socketed with spring on described screw (7), spring is positioned between circuit carrier (1) and base (2), and in compressive state.
6. the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature according to claim 2, is characterized in that the upper surface of described intermediate carrier (4) is coated with one deck indium sheet (11).
7. the Universal test clamping apparatus detecting for microwave power device infrared microscopy junction temperature according to claim 1, characterized by further comprising two symmetrically arranged briquettings (13), described briquetting (13) is located at 2 circuit carriers (1) above, and compresses the pipe leg (3) of measured device (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320440371.2U CN203438103U (en) | 2013-07-23 | 2013-07-23 | Universal testing clamp for detecting microscopic infrared junction temperature of microwave power device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320440371.2U CN203438103U (en) | 2013-07-23 | 2013-07-23 | Universal testing clamp for detecting microscopic infrared junction temperature of microwave power device |
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| Publication Number | Publication Date |
|---|---|
| CN203438103U true CN203438103U (en) | 2014-02-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320440371.2U Withdrawn - After Issue CN203438103U (en) | 2013-07-23 | 2013-07-23 | Universal testing clamp for detecting microscopic infrared junction temperature of microwave power device |
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| Country | Link |
|---|---|
| CN (1) | CN203438103U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103372826A (en) * | 2013-07-23 | 2013-10-30 | 中国电子科技集团公司第十三研究所 | Universal testing clamp used for microscopic-infrared junction temperature detection of microwave power device |
| CN104440765A (en) * | 2014-11-17 | 2015-03-25 | 中国电子科技集团公司第十三研究所 | Vertical pressure type microwave insulator pressing fit machine |
-
2013
- 2013-07-23 CN CN201320440371.2U patent/CN203438103U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103372826A (en) * | 2013-07-23 | 2013-10-30 | 中国电子科技集团公司第十三研究所 | Universal testing clamp used for microscopic-infrared junction temperature detection of microwave power device |
| CN104440765A (en) * | 2014-11-17 | 2015-03-25 | 中国电子科技集团公司第十三研究所 | Vertical pressure type microwave insulator pressing fit machine |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20140219 Effective date of abandoning: 20150909 |
|
| RGAV | Abandon patent right to avoid regrant |