CN201909917U - Test fixture - Google Patents

Test fixture Download PDF

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Publication number
CN201909917U
CN201909917U CN2010206884198U CN201020688419U CN201909917U CN 201909917 U CN201909917 U CN 201909917U CN 2010206884198 U CN2010206884198 U CN 2010206884198U CN 201020688419 U CN201020688419 U CN 201020688419U CN 201909917 U CN201909917 U CN 201909917U
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CN
China
Prior art keywords
microscope carrier
polaroid
measurement jig
erecting frame
shaft bearing
Prior art date
Application number
CN2010206884198U
Other languages
Chinese (zh)
Inventor
李剑
覃钰
Original Assignee
京东方科技集团股份有限公司
京东方(河北)移动显示技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 京东方科技集团股份有限公司, 京东方(河北)移动显示技术有限公司 filed Critical 京东方科技集团股份有限公司
Priority to CN2010206884198U priority Critical patent/CN201909917U/en
Application granted granted Critical
Publication of CN201909917U publication Critical patent/CN201909917U/en

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Abstract

An embodiment of the utility model discloses a test fixture, which relates to the field of LCD (liquid crystal display) tests and is used for improving liquid crystal display panel testing efficiency. The test fixture comprises a base, a carrier, a mounting frame and a signal input module, the base is used for bearing the carrier and the signal input module, the carrier is used for bearing a liquid crystal display panel to be tested, the signal input module is used for contacting with the liquid crystal display panel to be tested via a probe and providing testing signals to the liquid crystal display panel, guide rails are arranged on the carrier and particularly disposed on two opposite sides of the carrier, and the mounting frame is slidably arranged on the guide rails. The test fixture in the technical scheme is applicable to testing small-sized LCDs.

Description

Measurement jig
Technical field
The utility model relates to LCD (LCD) field tests, relates in particular to a kind of measurement jig.
Background technology
(Liquid Crystal Display LCD) has characteristics such as volume is little, low in energy consumption, radiationless, manufacturing cost is relatively low to LCD, has occupied leading position in current flat panel display market.
In production process of liquid crystal displays, need test with the go-on-go defective products the display panels of finishing behind the cutting step; Just need provide some aid for display panels to be tested this moment, and for example measurement jig comes to change passage over to for described display panels provides test platform and test signal.
Figure 1 shows that the simplified model synoptic diagram of existing LCD measurement jig.LCD measurement jig commonly used comprises pedestal 1 at least, be arranged on the microscope carrier 2 on this pedestal 1, last polaroid (Polarizer) erecting frame 4 that can rotate around the rotating shaft 3 that is arranged on the described microscope carrier 2, and import module 5 for display panels provides the signal of test signal.Wherein, microscope carrier 2 is used to carry display panels to be tested, and is equipped with backlight drive module, module backlight and following polaroid in microscope carrier 2; On the last polaroid erecting frame 4 polaroid is installed.
Like this, when display panels is carried out lighting test, polaroid erecting frame 4 makes it parallel with microscope carrier 2 in the rotation, thereby make described last polaroid on the polaroid erecting frame 4 and the display panels keeping parallelism to be tested on the described microscope carrier 2 gone up, then described display panels to be tested is carried out the contraposition adjustment, can simulate the LCD that finishes of assembling afterwards to finish the test of display panels.
In the process of utilizing above-mentioned LCD measurement jig realization lighting test, the inventor finds that there are the following problems at least in the prior art:
Above-mentioned on polaroid erecting frame 4 rotate, and drive the described polaroid of going up and rotate to display panels to be tested to become in the process of parastate, the spatial extent of described upward polaroid erecting frame 4 is bigger, its position adjustment needs spended time longer, and then it is lower to have influence on the efficient of display panels test process.
The utility model content
Embodiment of the present utility model provides a kind of measurement jig, in order to improve the testing efficiency of display panels.
For achieving the above object, embodiment of the present utility model adopts following technical scheme:
A kind of measurement jig comprises pedestal, microscope carrier, erecting frame and signal input module;
Described pedestal is used to carry described microscope carrier and described signal input module;
Described microscope carrier is used to carry display panels to be tested;
Described signal input module is used for contacting with described display panels to be tested and providing test signal for described display panels to be tested by probe;
And described microscope carrier is provided with guide rail, and described guide rail is positioned at the two opposite sides of described microscope carrier, and described erecting frame is slidably disposed on the described guide rail.
The measurement jig that the utility model embodiment provides utilizes the guide effect of the guide rail on the described microscope carrier, makes the erecting frame described guide rail slip in upper edge in the horizontal direction that is arranged on this guide rail.In the scheme that the utility model embodiment provides, described erecting frame only need be done plug-type to-and-fro movement in the horizontal direction, and because the point-to-point speed of erecting frame is greater than the speed of swaying, therefore the time that described erecting frame is carried out the position adjustment also can correspondingly shorten, and helps to improve the testing efficiency of display panels.
Description of drawings
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, the accompanying drawing of required use is done to introduce simply in will describing embodiment below, apparently, accompanying drawing in describing below only is embodiment more of the present utility model, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the simplified model synoptic diagram of existing LCD measurement jig;
Fig. 2 is the schematic perspective view of the measurement jig among the utility model embodiment;
Fig. 3 is the planar structure synoptic diagram of the measurement jig among Fig. 2;
Fig. 4 is that measurement jig among Fig. 2 is along the structural representation of the profile of A-A line;
Fig. 5 is the schematic perspective view of the last polaroid erecting frame among Fig. 2;
Fig. 6 is the planar structure synoptic diagram of the last polaroid erecting frame among Fig. 5;
Fig. 7 is the side view of the last polaroid erecting frame among Fig. 5;
Fig. 8 is the side sectional view that the signal among Fig. 2 is imported module and eccentric stiffener;
Fig. 9 is the planar structure synoptic diagram of the probe base among Fig. 8;
Figure 10 is the side view of the probe base among Fig. 8;
Figure 11 is the planar structure synoptic diagram of the microscope carrier among Fig. 2;
Figure 12 is the structural representation that the Y direction among Figure 11 is regulated microscope carrier;
Figure 13 is the structural representation of the operation microscope carrier among Figure 11;
Reference numeral: 1-pedestal; The 2-microscope carrier; The 3-rotating shaft; The last polaroid erecting frame of 4-; 5-signal input module;
The 10-pedestal; The 11-side plate; The 12-position block; The 13-axis of guide; The 14-back-moving spring; The 20-microscope carrier; 21-master's microscope carrier; 22-moves microscope carrier; The 23-guide rail; The 24-X direction is regulated microscope carrier; The 25-Y direction is regulated microscope carrier; 26-operation microscope carrier; 27-magnet; The 28-register pin; The 29-dowel hole; The last polaroid erecting frame of 30-; The 31-slide block; The 32-cushion block; The last polaroid installing plate of 33-; The last polaroid cover plate of 34-; 35-magnet; 36-push-and-pull portion; 40-signal input module; The 41-probe; The 42-probe base; The 43-shaft bearing plate; The 44-flange bearing; The 45-register pin; The 46-spring; 47-signal converting circuit board; The 51-rotating shaft; The 52-eccentric block; The eccentric rolling bearing of 53-; The 54-handle; The eccentric locating piece of 55-.
Embodiment
Below in conjunction with the accompanying drawing among the utility model embodiment, the technical scheme among the utility model embodiment is clearly and completely described, obviously, described embodiment only is the utility model part embodiment, rather than whole embodiment.Based on the embodiment in the utility model, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the utility model protection.
In order to improve the testing efficiency of display panels, the measurement jig that provides among the utility model embodiment comprises pedestal, microscope carrier, erecting frame and signal input module;
Described pedestal is used to carry described microscope carrier and described signal input module;
Described microscope carrier is used to carry display panels to be tested;
Described signal input module is used for contacting with described display panels to be tested and providing test signal for described display panels to be tested by probe;
And described microscope carrier is provided with guide rail, and described guide rail is positioned at the two opposite sides of described microscope carrier, and described erecting frame is slidably disposed on the described guide rail.
In the utility model embodiment, be example with the LCD measurement jig, then described erecting frame is the polaroid erecting frame, preferably can be to go up the polaroid erecting frame.
Polaroid all refers to the polaroid of color membrane substrates side on occurring in the utility model embodiment, and the following polaroid of follow-up appearance then refers to the polaroid of array base palte side.
Utilize the guide effect of the guide rail on the main microscope carrier in the above-mentioned measurement jig, make the last polaroid erecting frame described guide rail slip in upper edge in the horizontal direction that is arranged on this guide rail; Like this, the described polaroid erecting frame of going up only need be done plug-type to-and-fro movement in the horizontal direction, and the point-to-point speed that goes up the polaroid erecting frame is greater than the speed of swaying, therefore the time that described upward polaroid erecting frame is carried out the position adjustment also can correspondingly shorten, and helps to improve the testing efficiency of display panels.
To be that last polaroid erecting frame is an example with described erecting frame below, and in conjunction with a series of accompanying drawings, above-mentioned measurement jig be done being described in further detail.
As Fig. 2, Fig. 3 and shown in Figure 4, the measurement jig that provides among the utility model embodiment mainly comprises: pedestal 10, microscope carrier 20, last polaroid erecting frame 30 and signal input module 40;
Pedestal 10 is used to carry described microscope carrier 20 and signal input module 40;
Microscope carrier 20 comprises main microscope carrier 21 and is arranged on mobile microscope carrier 22 on this main microscope carrier 21 that described mobile microscope carrier 22 is used to carry display panels to be tested;
Signal input module 40 comprises probe 41, probe base 42 and can drive the shaft bearing plate 43 that described probe base 42 moves up and down; Signal input module 40 is used for contacting with described display panels to be tested and providing test signal for described display panels to be tested by probe 41;
Compare with the LCD measurement jig shown in Fig. 1, the utility model is mainly adjusted the structure of last polaroid erecting frame; As shown in Figure 3, main microscope carrier 21 is provided with guide rail 23, and this guide rail 23 is positioned at the two opposite sides of mobile microscope carrier 22, and the last polaroid erecting frame 30 in the present embodiment is slidably disposed on the guide rail 23.
In conjunction with Fig. 5, Figure 6 and Figure 7, last polaroid erecting frame 30 specifically comprises: the slide block 31 that can slide along described guide rail 23, the last polaroid installing plate 33 that is used to place polaroid, and between slide block 31 and the last polaroid installing plate 33, be used for cushion block 32 highly between adjusting slider 31 and the last polaroid installing plate 33.When the height that needs between adjusting slider 31 and the last polaroid installing plate 33, can select the cushion block 32 of proper height, and utilize screw to be fixed between slide block 31 and the last polaroid installing plate 33.
As shown in Figure 5 and Figure 6, also be provided with polaroid cover plate 34 on the last polaroid erecting frame 30, polaroid cover plate 34 takes the shape of the letter U on this, is adsorbed onto on the polaroid installing plate 33 by magnetic material, is used for fixing polaroid; Described magnetic material can preferably adopt magnet, such as the magnet 35 shown in Fig. 5 and Fig. 6.Like this, when installing polaroid, just can utilize the absorption affinity of magnet 35, will go up polaroid and be clamped between last polaroid installing plate 33 and the last polaroid cover plate 34.The described polaroid cover plate 34 of going up can be to be made by cast iron, further can also be provided with on the last polaroid cover plate 34 with last polaroid installing plate 33 on magnet 35 mutually the magnet of contraposition with the enhancing absorption affinity.
In addition, also be provided with push-and-pull portion 36 in a side of last polaroid installing plate 34, this push-and-pull portion 36 is used for promoting easily polaroid erecting frame 30 and slides on guide rail 23.
The above-mentioned polaroid motion of going up adopts guide rail, slide block, cushion block, goes up respective outer side edges installations such as polaroid installing plate and last polaroid cover plate, utilizes the guide effect of guide rail and slide block, makes the polaroid can to-and-fro movement in surface level at test process.The use of guide rail and slide block makes and can carry out picking and placeing of display panels to be tested easily in the operation process; And plug-type mode of motion makes the movement velocity that goes up the polaroid erecting frame in the operation process faster, and stability is also stronger, improves operating efficiency.In addition, the fixed form of last polaroid adopts last polaroid installing plate installation magnetic material and last polaroid cover plate to inhale formation suction mutually and fixes, improve original adhesive tape fixed form, strengthen the aesthetics and the degree easy to maintenance of tool, be easy to dismantle and then be convenient to the cleaning of measurement jig simultaneously.
As can see from Figure 2, pedestal 10 comprises two side plates that be arranged in parallel 11, is provided with eccentric stiffener between these two side plates 11, and this eccentric stiffener moves up and down in order to control described shaft bearing plate.Particularly, described eccentric stiffener comprises: between described two side plates and perpendicular to the rotating shaft 51 of described side plate, being serially connected in can be with the eccentric block 52 of rotating shaft 51 rotations in the rotating shaft 51, and the end away from rotating shaft 51 at eccentric block 52 is provided with eccentric rolling bearing 53, and these off-centre rolling bearing 53 contacts are also replaced on shaft bearing plate 43.
One end of described rotating shaft 51 extends to the outside of side plate 11 and is bent to form a handle 54 that can supply the technician to control, and the other end is provided with an eccentric locating piece 55.With this off-centre locating piece 55 accordingly, side plate 11 is provided with position block 12.As shown in Figure 8, utilize eccentric locating piece 55 to be used, eccentric block 52 is positioned, promptly described eccentric stiffener is positioned, thereby come the position of shaft bearing plate 43 is fixed by the eccentric rolling bearing 53 in this eccentric structure with position block 12.
In addition, in the utility model embodiment, also the length of eccentric block 52 is adjusted; Particularly, eccentric block 52 is modified into 30mm~80mm along the length on the axis direction of rotating shaft 51 by original 10mm, just eccentric block 52 is 30mm~80mm with rotating shaft 51 contacted zone lengths, thereby makes eccentric block 52 and rotating shaft 51 interlocks more abundant, strengthens eccentric stiffener stability.Preferably, eccentric block 52 is improved to 50mm along the length on the axis direction of rotating shaft 51, so both has been convenient to install, can make eccentric block 52 and rotating shaft 51 interlocks abundant again.In addition, contacting by rolling bearing between eccentric stiffener and the shaft bearing plate 43 realizes, because the motion process of shaft bearing plate 43 is to have utilized the rolling transmission, therefore can reduce the friction factor between shaft bearing plate 43 and the eccentric stiffener, increases the wearing quality of surface of contact.
Further, can also see that from Fig. 2 shaft bearing plate 43 is provided with 4 pilot holes, with these 4 pilot holes accordingly, on pedestal 10, be provided with 4 axis of guides 13 (the wherein axis of guide that in Fig. 2, only schematically drawn, other three axis of guides are not shown) that vertically are provided with; By cooperating of pilot hole and the axis of guide 13, can Control Shaft board 43 moving up and down at vertical direction.
Compare with existing LCD measurement jig, the utility model embodiment also improves the quantity of pilot hole in the measurement jig: from 2 original even numbers that are improved to greater than 2, preferably the quantity of described pilot hole can be 4, thereby avoid shaft bearing plate 43 rocking in the process of moving up and down, improve the stability of shaft bearing plate 43.
In conjunction with shown in Figure 8, in the utility model embodiment, on shaft bearing plate 43, be provided with flange bearing 44, this flange bearing 44 be positioned at shaft bearing plate 43 the below and with the corresponding position of described pilot hole on; On shaft bearing plate 43, use flange bearing, can overcome plain bearing in the long-time defective of using the back from pilot hole, to come off easily.The use of flange bearing can be simplified installation method, strengthens the stability of guiding movement simultaneously.
Be arranged with the Flexible Reset thing on the axis of guide 13, this Flexible Reset thing can be the back-moving spring 14 shown in Fig. 8; One end of this back-moving spring 14 is fixed on the pedestal 10, and the other end links to each other with described flange bearing 44.
In the utility model embodiment, by mounting flange bearing on shaft bearing plate, match with the axis of guide, the power that moves downward that eccentric stiffener is produced passes to shaft bearing plate, and then is moved downward by shaft bearing plate drive test probe; And, back-moving spring is installed below shaft bearing plate, make when eccentric stiffener is got back to initial position after the end of test (EOT), utilize the elastic force impeller-hub board of back-moving spring to move upward.
Utilize the cooperation of parts such as eccentric block, eccentric rolling bearing, handle and back-moving spring, handle is rotatablely moved be converted into the vertical up-or-down movement of shaft bearing plate, with form the required probe base of test process move downward and test with shaft bearing plate finish after the reciprocal process that moves upward with shaft bearing plate of probe base.
Further, among the utility model embodiment also the probe base to probe in the above-mentioned measurement jig and stationary probe partly improve.Particularly, in conjunction with Fig. 8, Fig. 9 and shown in Figure 10, probe base 42 is fixed on the below of shaft bearing plate 43 by securing member, and described securing member can be a screw; On probe base 42, be provided with register pin 45, on shaft bearing plate 43, be provided with pilot hole accordingly.In the installation process of probe base,, come probe base is positioned to guarantee its perpendicularity by being used of described pilot hole and register pin 45.
In addition, between probe base 42 and shaft bearing plate 43, also be provided with the elasticity thing, for example the spring among Figure 10 46.The lower surface at the upper surface of probe base 42 and shaft bearing plate 43 is replaced at the two ends of this spring 46 respectively, and probe base 42 is produced a thrust that moves downward; In follow-up test process, can finely tune probe base 42 residing position height by the elasticity of adjusting screw, and then realize the fine adjustment of distance between probe base 42 or probe 41 and the liquid crystal panel to be tested.
In the utility model embodiment, the probe 41 that is installed on the probe base 42 is double ended probes, and the main part of this double ended probes (being represented by dotted lines in Figure 10) is fixed in the probe base 42; The probe of described double ended probes one end is pressed on the signal converting circuit board 47 in the signal input module, and the probe of the other end exposes the lower surface of probe base 42, can contact with display panels to be tested.
The combination of above-mentioned probe and probe base, adopt double ended probes to cooperate installation with signal converting PCB, wherein the two ends probe of double ended probes all has retractility, short probe contacts compression with signal converting PCB, and the long probe head is used for contacting with signal testing point on the display panels to be tested at test process.Utilize double ended probes to have stability preferably, and durability is strong; Owing to need not probe to be connected with signal converting PCB, so the making of probe base is also more convenient, in use is easy to replacing, easy to maintenance by lead-in wire.
Further,, make its test process that goes for the LCD of different model, also microscope carrier is partly improved among the utility model embodiment in order to increase the versatility of above-mentioned measurement jig.
As shown in figure 11, microscope carrier 20 comprises: main microscope carrier 21 and mobile microscope carrier 22, this moves microscope carrier 22 and further comprises again: directions X is regulated microscope carrier 24, the Y direction is regulated microscope carrier 25 and operation microscope carrier 26.Wherein,
Directions X is regulated microscope carrier 24, can drive the Y direction that is positioned at its top and regulate microscope carrier 25 and operation microscope carrier 26 in the enterprising line position adjustment of directions X;
The Y direction is regulated microscope carrier 25, can drive the operation microscope carrier 26 that is positioned at its top with the perpendicular enterprising line position adjustment of Y direction of directions X; And, regulate structures such as being equipped with backlight drive module, module backlight and following polaroid in the microscope carrier 25 in the Y direction;
Operation microscope carrier 26 is used to carry display panels to be tested.
The material of main part of above-mentioned microscope carrier adopts electric bakelite, can effectively prevent the injury of static to electronic product.
In conjunction with Figure 12 and shown in Figure 13, on Y direction adjusting microscope carrier 25 and operation microscope carrier 26, be provided with magnetic material, described magnetic material preferably adopts magnet 27, and on Y direction adjusting microscope carrier 25 and operation microscope carrier 26 register pin 28 and dowel hole 29 is set accordingly.The cooperation of register pin 28 and dowel hole 29 can be carried out stationkeeping to the operation microscope carrier in the test process.And the magnet 27 on the Y direction adjusting microscope carrier 25 also is corresponding on the position with the magnet 27 on the operation microscope carrier 26, so just can make operation microscope carrier 26 be attached to the Y direction by the absorption affinity between magnet and regulate on the microscope carrier 25.
Above-mentioned microscope carrier structure adopts X, Y direction to regulate microscope carrier and operation microscope carrier separated structures, and on Y direction adjusting microscope carrier register pin and magnet is set, with dowel hole and the magnet generation mating reaction on the operation microscope carrier; The register pin location, magnet attracts each other, and produces suction with the fixed operation microscope carrier.In the utility model embodiment, utilize the fit structure of magnet and register pin, improve original Y direction and regulate between microscope carrier and the operation microscope carrier by the fixing mode of screw, the installation of convenient working microscope carrier and replacing; And the modularization isolating construction of microscope carrier also makes the daily servicing process, need not regulate microscope carrier to the Y direction after cleaning or the maintain internal polaroid backlight etc. and carry out secondary contraposition and regulate, and simplifies maintaining method, is convenient to safeguard.
In addition, because operation microscope carrier and probe base all are the independent structures unit, therefore when the LCD to different model tested, the operation microscope carrier and the probe base that only need to change corresponding model got final product, and have strengthened the versatility of above-mentioned measurement jig.
Measurement jig described in the utility model embodiment is applicable to but is not limited to small size LCD is carried out lighting test; Described measurement jig preferably is applicable to the test process of the display panel of the LCD below 3.5 cun.
With respect to existing LCD measurement jig, the measurement jig that provides among the utility model embodiment has improved stability, the ease for operation of auxiliary fixture owing to adopt the modularization standardized designs; Reduce subassembly quantity, simplify making step; Adopt daily servicing article standardization and installed moduleization, reduce daily servicing difficulty and daily servicing expense, and strengthened the versatility of measurement jig at different model LCD.
The above; it only is embodiment of the present utility model; but protection domain of the present utility model is not limited thereto; anyly be familiar with those skilled in the art in the technical scope that the utility model discloses; the variation that can expect easily or replacement all should be encompassed within the protection domain of the present utility model.Therefore, protection domain of the present utility model should be as the criterion with the protection domain of claim.

Claims (21)

1. a measurement jig comprises pedestal, microscope carrier, erecting frame and signal input module;
Described pedestal is used to carry described microscope carrier and described signal input module;
Described microscope carrier is used to carry display panels to be tested;
Described signal input module is used for contacting with described display panels to be tested and providing test signal for described display panels to be tested by probe;
It is characterized in that described microscope carrier is provided with guide rail, described guide rail is positioned at the two opposite sides of described microscope carrier, and described erecting frame is slidably disposed on the described guide rail.
2. measurement jig according to claim 1 is characterized in that, described erecting frame is the polaroid erecting frame.
3. measurement jig according to claim 2, it is characterized in that, described polaroid erecting frame comprises: the slide block that can slide along described guide rail, be used to place the polaroid installing plate of polaroid, and the cushion block that is used to regulate height between described slide block and the described polaroid installing plate.
4. measurement jig according to claim 3 is characterized in that, also is provided with the polaroid cover plate on the described polaroid erecting frame, and this polaroid cover plate is adsorbed onto on the described polaroid installing plate by magnetic material, is used for fixing described polaroid.
5. measurement jig according to claim 4 is characterized in that, described magnetic material is a magnet.
6. measurement jig according to claim 3 is characterized in that, is provided with push-and-pull portion in a side of described polaroid installing plate, and this push-and-pull portion is used to promote described polaroid erecting frame and slides on described guide rail.
7. according to each described measurement jig in the claim 2 to 6, it is characterized in that described polaroid erecting frame is last polaroid erecting frame.
8. measurement jig according to claim 1 is characterized in that, described signal input module comprises probe, probe base and can drive the shaft bearing plate that described probe base moves up and down.
9. measurement jig according to claim 8 is characterized in that, described probe is a double ended probes, and an end of this double ended probes contacts with the signal converting circuit board that described signal is imported in the module, and the other end contacts with described display panels to be tested.
10. measurement jig according to claim 8 is characterized in that, described probe base is fixed on the below of described shaft bearing plate by securing member, is provided with register pin and dowel hole accordingly on described probe base and described shaft bearing plate.
11. measurement jig according to claim 10 is characterized in that, also is provided with the elasticity thing between described probe base and described shaft bearing plate.
12. measurement jig according to claim 8 is characterized in that, described shaft bearing plate is provided with pilot hole, is provided with flange bearing below this shaft bearing plate and corresponding to the position of described pilot hole; Described pilot hole matches with the vertical axis of guide that is provided with on the described pedestal, is used to control the direction of motion of described shaft bearing plate;
Be arranged with the Flexible Reset thing on the described axis of guide, an end of described Flexible Reset thing is fixed on the described pedestal, and the other end links to each other with described flange bearing.
13. measurement jig according to claim 12 is characterized in that, the quantity of described pilot hole is the even number greater than two.
14. measurement jig according to claim 13 is characterized in that, the quantity of described pilot hole is four.
15. measurement jig according to claim 8 is characterized in that, described pedestal comprises two side plates that be arranged in parallel, is provided with eccentric stiffener between described two side plates, and this eccentric stiffener moves up and down in order to control described shaft bearing plate;
A side plate in described two side plates is provided with position block, is used for described eccentric stiffener is positioned.
16. measurement jig according to claim 15 is characterized in that, described eccentric stiffener comprises between described two side plates and perpendicular to the rotating shaft of described side plate, and is serially connected in the eccentric block in this rotating shaft; The length of described eccentric block on the axis direction of described rotating shaft is 30mm~80mm.
17. measurement jig according to claim 16 is characterized in that, the length of described eccentric block on the axis direction of described rotating shaft is 50mm.
18., it is characterized in that described eccentric stiffener is provided with eccentric rolling bearing at the end away from rotating shaft of described eccentric block according to claim 16 or 17 described measurement jigs, this off-centre rolling bearing contact is also replaced on described shaft bearing plate.
19. measurement jig according to claim 1 is characterized in that, described microscope carrier comprises main microscope carrier and is arranged on mobile microscope carrier on this main microscope carrier that described mobile microscope carrier is used to carry display panels to be tested.
20. measurement jig according to claim 19 is characterized in that, described mobile microscope carrier comprises that directions X is regulated microscope carrier, the Y direction is regulated microscope carrier and operation microscope carrier; Described operation microscope carrier is adsorbed on described Y direction by magnetic material and regulates on the microscope carrier.
21. measurement jig according to claim 20 is characterized in that, described magnetic material is a magnet.
CN2010206884198U 2010-12-29 2010-12-29 Test fixture CN201909917U (en)

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103645035A (en) * 2013-12-12 2014-03-19 京东方科技集团股份有限公司 Lighting fixture
CN104516132A (en) * 2014-11-21 2015-04-15 京东方科技集团股份有限公司 Testing fixture
CN105093574A (en) * 2015-06-05 2015-11-25 京东方科技集团股份有限公司 Display panel test bench
WO2016058206A1 (en) * 2014-10-14 2016-04-21 深圳市华星光电技术有限公司 One-time lighting apparatus for liquid crystal cell
WO2016078279A1 (en) * 2014-11-21 2016-05-26 京东方科技集团股份有限公司 Test fixture
CN106841990A (en) * 2017-02-16 2017-06-13 京东方科技集团股份有限公司 Display screen detection means

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103645035A (en) * 2013-12-12 2014-03-19 京东方科技集团股份有限公司 Lighting fixture
CN103645035B (en) * 2013-12-12 2016-03-02 京东方科技集团股份有限公司 A kind of lighting jig
WO2016058206A1 (en) * 2014-10-14 2016-04-21 深圳市华星光电技术有限公司 One-time lighting apparatus for liquid crystal cell
CN104516132A (en) * 2014-11-21 2015-04-15 京东方科技集团股份有限公司 Testing fixture
CN104516132B (en) * 2014-11-21 2018-02-06 京东方科技集团股份有限公司 A kind of measurement jig
WO2016078279A1 (en) * 2014-11-21 2016-05-26 京东方科技集团股份有限公司 Test fixture
US9880407B2 (en) 2014-11-21 2018-01-30 Boe Technology Group Co., Ltd. Test fixture for electrical function test of product to be tested
CN105093574A (en) * 2015-06-05 2015-11-25 京东方科技集团股份有限公司 Display panel test bench
CN105093574B (en) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 Display panel monitor station
CN106841990A (en) * 2017-02-16 2017-06-13 京东方科技集团股份有限公司 Display screen detection means
CN106841990B (en) * 2017-02-16 2019-06-11 京东方科技集团股份有限公司 Display screen detection device

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