CN201681124U - Multi-channel test device for measuring high-voltage dielectric loss - Google Patents

Abstract

The multi-channel test device for measuring high-voltage dielectric loss relates to a test device, which includes: a power supply with a built-in bridge; an excitation transformer connected with the power supply with the built-in bridge; a reactor connected in series with the excitation transformer; connected with the power supply with the built-in bridge The high-voltage standard capacitor connected in parallel with the excitation transformer and reactor at the same time; the high-voltage standard capacitor is connected in parallel with the excitation transformer and reactor in series and then connected in series to the tested product at the same time. The power supply of the electric bridge is connected to the first channel (1) and the second channel (2) of the tested product. After the first channel (1) is connected to the tested product, the excitation transformer and the reactor are connected in parallel with the high-voltage standard capacitor. At the same time, the circuit connected in series to the tested product forms the first test channel (1) for testing the tested product, and the second channel (2) is connected to the tested product and connected in parallel with the high-voltage standard capacitor and the excitation transformer and reactor. At the same time, the circuit connected in series to the tested product forms a second test channel (2) for testing the tested product. The device can realize the simultaneous measurement of several test objects with multiple channels, improve the test speed, and have flexible wiring methods.

Description

Multi-channel test device for measuring high-voltage dielectric loss

【Technical field】

The utility model relates to a test device, in particular to a test device for measuring high-voltage dielectric loss of electric equipment.

【Background technique】

In order to check the operation status and installation quality of power equipment and ensure the safe and normal operation of power equipment, the measurement of high-voltage dielectric loss must be carried out during the handover test, preventive test and maintenance process of the project, so the high-voltage dielectric loss test is a guarantee. Important measures for the quality and safe operation of power equipment transportation, installation, and maintenance.

Because the equivalence and defect detection sensitivity of high-voltage dielectric loss test is better than that of conventional 10kV dielectric loss, it can truly reflect the insulation status of power equipment under operating conditions, so it has been paid more and more attention by various units. However, it is difficult to carry out high-voltage dielectric loss in the field, especially the pre-test work site, mainly because the existing high-voltage dielectric loss equipment is heavy and poor in anti-interference, which is not convenient for on-site use. Therefore, the current high-voltage dielectric loss is mainly used in laboratories and some handovers. The test site cannot meet the needs.

Therefore, it is necessary to invent a new test device for testing high-voltage dielectric loss to overcome the above-mentioned defects.

【Content of utility model】

The purpose of the utility model is to provide a multi-channel testing device for measuring high-voltage medium loss which is portable, good in anti-interference and convenient for on-site use.

In order to achieve the above object, the technical solution of the present utility model is: a multi-channel test device for measuring high-voltage dielectric loss, which includes: a power supply with a built-in bridge; an excitation transformer connected with the power supply of the built-in bridge; A reactor connected in series with the excitation transformer; a high-voltage standard capacitor connected to the power supply of the built-in bridge and simultaneously connected in parallel with the excitation transformer and the reactor; the high-voltage standard capacitor connected in series with the excitation transformer and After the reactors are connected in parallel, they are connected in series to the tested product at the same time. The multi-channel test device for measuring high-voltage dielectric loss is also provided with the first channel (1) and the second channel (2) connecting the power supply of the built-in bridge and the tested product respectively. ), after the first channel (1) is connected to the tested product, it is connected in series with the circuit of the tested product to form the first test channel for testing the tested product after connecting the excitation transformer and the reactor in parallel with the high-voltage standard capacitor (1), after the second channel (2) is connected to the tested product, it is connected in series with the circuit of the tested product to form a second circuit for testing the tested product after being connected in parallel with the high-voltage standard capacitor to the excitation transformer and the reactor. Test channel (2).

Wherein the high-voltage standard capacitor has a built-in sampling resistor.

The power supply is a sine wave output power supply with continuously adjustable frequency, and the frequency adjustment fineness of the power supply is 0.1 Hz.

The output voltage of the multi-channel test device for measuring high-voltage dielectric loss is not greater than 170kV.

The capacity of the multi-channel test device for measuring high-voltage dielectric loss is 5kVA.

Due to the adoption of the above structure, the multi-channel test device for measuring high-voltage dielectric loss of the utility model has the following beneficial effects:

1. The multi-channel test device for measuring high-voltage dielectric loss of the present invention has two test channels, which can realize the simultaneous measurement of several test objects in multiple channels and improve the test speed.

2. The multi-channel test device for measuring high-voltage dielectric loss of the utility model has a high-voltage standard capacitor as a built-in sampling resistor, so the wiring method is flexible, and the test method of reverse wiring for high-voltage dielectric loss test can be realized to meet the needs of the site.

3. The multi-channel test device for measuring high-voltage dielectric loss of the present utility model has manual and automatic boost measurement functions. When using automatic boost, it can set the test voltage point combination scheme of various equipment within the test voltage range; One step-up bridge can automatically find the resonance point, automatically raise and lower the voltage to complete the test of all the set test voltage points, and print out or save the measured values of each point, and can draw the voltage-dielectric loss change curve.

4. The power supply frequency of the multi-channel test device for measuring high-voltage dielectric loss of the utility model is continuously adjustable, and can resonate at any frequency (non-traditional frequency conversion measurement at fixed frequencies of 45/55Hz and 47.5/52.5Hz).

5. The multi-channel test device for measuring high-voltage dielectric loss of this utility model is used for the measurement of high-voltage dielectric loss and capacitance of electrical equipment with a voltage level of 170kV and below. The weight of a single component in the device does not exceed 40kg, which is convenient for assembly and connection.

6. The multi-channel test device for measuring high-voltage dielectric loss of the utility model has reliable overload and discharge protection functions.

【Description of drawings】

Fig. 1 is a schematic diagram of the test system of the multi-channel test device for measuring high-voltage dielectric loss of the present invention.

【Detailed ways】

The multi-channel test device for measuring high-voltage dielectric loss of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

Please refer to shown in Fig. 1, the test device of the multi-channel measurement high-voltage dielectric loss of the present invention comprises: the power supply of a built-in electric bridge; One is connected with the power supply of described built-in electric bridge Exciting transformer; One is connected in series with described exciting transformer Reactor; a high-voltage standard capacitor connected to the power supply of the built-in electric bridge and simultaneously connected in parallel with the excitation transformer and the reactor. The high-voltage standard capacitor is connected in parallel with the excitation transformer and reactor connected in series and then connected in series to the tested product at the same time. The multi-channel test device for measuring high-voltage dielectric loss is also equipped with a power supply connected to a built-in bridge and the tested product respectively. The first channel 1 and the second channel 2, the first channel 1 is connected to the tested product 1 and then connected in parallel with the high-voltage standard capacitor to the excitation transformer and reactor, and then connected in series to the tested product 1 to form a circuit Test the first test channel 1 of the tested product 1 or called the test channel 1, the second channel 2 is connected to the tested product 2 and then connected in parallel with the high-voltage standard capacitor and then connected in series to the excitation transformer and reactor at the same time The circuit of the object under test 2 forms a second test channel 2 or called a test channel 2 for testing the object under test 2 , as shown in the figure.

The power supply is a sine wave output power supply with continuously adjustable frequency. The frequency adjustment fineness of the power supply is 0.1Hz, which can realize resonance at any frequency (non-traditional 45/55Hz, 47.5/52.5Hz fixed frequency frequency conversion measurement), multi-channel The output voltage of the test device for measuring high-voltage dielectric loss is not greater than 170kV, so that most of the samples can be tested for dielectric loss at rated voltage, and the Ahai weight capacitor can also meet the requirements of more than 50% of the rated voltage. According to 170kV, the test product capacity is 6000pF, and the power supply capacity of the series harmonic method is only 2kVA to meet the requirements. Considering the margin, choose 5kVA. The power supply adopts the built-in method of the bridge body, which can not only boost the voltage manually, but also automatically boost the measurement by setting the test point, and the test method is flexible; the sampling frequency is directly transmitted by the power supply, without additional frequency tracking function, which reduces the error; The number of pieces of the whole device is reduced, the device is easier to use and easier to protect.

The high-voltage standard capacitor is a special high-voltage standard capacitor with a built-in sampling resistor. The high-voltage standard capacitor is not only used as a standard arm, but also can be sampled to measure the test voltage, eliminating the influence of the capacitance-acoustic effect, and the measured voltage is accurate; adding a sampling resistor, and transmitting the signal to the instrument through an optical fiber, can realize the method of reverse wiring test, field wiring The way is more flexible. When the wiring is reversed, the high-voltage end of the high-voltage standard capacitor side is connected to the test object through a sampling resistor, the signal collected by the sampling resistor is transmitted through the optical fiber, and the terminal is connected to the bridge from the bottom of the high-voltage standard capacitor. In this way, we can realize Reverse wiring high voltage dielectric loss test. At the same time, it is equipped with the first test channel 1 and the second test channel 2 for multi-channel measurement, which not only increases the capacity of the sample, reduces the inductance, but also can measure more than 2 samples at the same time, and the test speed is fast.

Claims (5)

1. A test device for multi-channel measurement of high voltage dielectric loss, characterized in that it comprises: a power supply with a built-in bridge; an excitation transformer connected to the power supply of the built-in bridge; a reactor connected in series with said excitation transformer; A high-voltage standard capacitor connected to the power supply of the built-in electric bridge and simultaneously connected in parallel with the excitation transformer and reactor; The high-voltage standard capacitor is connected in parallel with the excitation transformer and reactor connected in series and then connected in series to the tested product at the same time. The multi-channel test device for measuring high-voltage dielectric loss is also equipped with a power supply connected to a built-in bridge and the tested product respectively. The first channel (1) and the second channel (2), the first channel (1) is connected to the tested product and connected in parallel with the high-voltage standard capacitor to the excitation transformer and reactor, and then connected to the tested product in series The circuit of the product forms the first test channel (1) for testing the tested product, and the second channel (2) is connected to the tested product in parallel with the high-voltage standard capacitor and then connected in series to the excitation transformer and reactor at the same time. The circuit of the object under test forms a second test channel (2) for testing the object under test. 2. The multi-channel testing device for measuring high-voltage dielectric loss according to claim 1, characterized in that: said high-voltage standard capacitor has a built-in sampling resistor. 3. The multi-channel test device for measuring high-voltage dielectric loss according to claim 1, wherein the power supply is a sine wave output power supply with continuously adjustable frequency, and the frequency adjustment fineness of the power supply is 0.1 Hz. 4. The multi-channel test device for measuring high-voltage dielectric loss according to claim 1, wherein the output voltage of the multi-channel test device for measuring high-voltage dielectric loss is not greater than 170kV. 5. The multi-channel testing device for measuring high-voltage dielectric loss according to claim 1, characterized in that: the multi-channel testing device for measuring high-voltage dielectric loss has a capacity of 5kVA. the

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