CN201194226Y - Highly reliable diode device applying lead wire pre-welding construction - Google Patents

Highly reliable diode device applying lead wire pre-welding construction Download PDF

Info

Publication number
CN201194226Y
CN201194226Y CNU2008200349027U CN200820034902U CN201194226Y CN 201194226 Y CN201194226 Y CN 201194226Y CN U2008200349027 U CNU2008200349027 U CN U2008200349027U CN 200820034902 U CN200820034902 U CN 200820034902U CN 201194226 Y CN201194226 Y CN 201194226Y
Authority
CN
China
Prior art keywords
welding
diode
solder
lead
packet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2008200349027U
Other languages
Chinese (zh)
Inventor
吴志新
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Good Ark Electronics Co Ltd
Original Assignee
Suzhou Good Ark Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Good Ark Electronics Co Ltd filed Critical Suzhou Good Ark Electronics Co Ltd
Priority to CNU2008200349027U priority Critical patent/CN201194226Y/en
Application granted granted Critical
Publication of CN201194226Y publication Critical patent/CN201194226Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

A diode device with high reliability adopting a lead wire pre-welding structure is characterized in that, in an axial epoxy packaging body of the diode, a diode grain is used as a center; pre-welding lead wires are symmetrically arranged on two extremities of the grains, wherein the pre-welding lead wires are composed of a lead wire, a nail head and a solder packet; the nail head is arranged near one end of the grain, and integrated with the lead wires; a head part of the nail head is provided with a table-board, and the solder packet is fixed on the table-board; two pre-welding wires are respectively welded with welding areas on the two extremities of the grains through the solder packet on the nail head. Due to the solder packet prewelded on the table-board of the nail head, contraposition accuracy of the solder packet and the grain welding area are ensured in the next welding packet, thereby solving the problems of the damage of the grain oxidation protective film and tin-hung and tin-overflow and the like caused by welding deflection, increasing rate of good product of the diode and ensuring reliability of the diode.

Description

Adopt the high reliability diode component of the pre-welding structure of lead-in wire
Technical field
The utility model relates to axialmode encapsulated semiconductor diode, particularly a kind of high reliability diode component that adopts the pre-welding structure of lead-in wire.This diode component has been owing to adopted the structural design of lead-in wire prewelding, thereby improved the reliability of diode and the yields of encapsulation.
Background technology
The axialmode encapsulation is a kind of typical package form at semiconductor diode crystal grain.Its encapsulating structure is the center with a crystal grain that contains PN junction; in the two end axles of this crystal grain to respectively by sheet weld tabs and lead-in wire head welding (seeing shown in Figure 3), with epoxy resin the lead-in wire head integral body at crystal grain and two ends thereof is wrapped up the realization packaging protection then.At present, adopt a welding encapsulation technology mostly for axialmode encapsulated semiconductor diode production producer, specific practice is: the first step is seated in a crystal grain, two weld tabs and two lead-in wires on the graphite boat by axial assembly structure requirement and (generally adopts the graphite boat of 1200 holes/boat); In second step, integral body is put into the high temperature furnace heating and once is welded into integral body (heating-up temperature generally is not higher than 360 degree) after will loading; In the 3rd step, annotate the epoxy encapsulation moulding.
Following problem appears in the above-mentioned welding procedure easily: 1) owing to the area of weld tabs area greater than the crystal grain weld zone, part scolding tin can cover the protective oxide layer at edge, crystal grain weld zone when scolding tin melted, though final most of scolding tin can be contracted in the weld zone of crystal grain, but always there is the scolding tin of trace to remain on the protective oxide layer, protective oxide layer to crystal grain plays destruction, causes the reliability decrease of diode; 2) because there is radial clearance in the filling hole on weld tabs and the graphite boat, and off normal appears in the relative crystal grain of weld tabs weld zone easily, tining, excessive tin when causing welding, cause electrically bad, even problem such as short circuit inefficacy.Therefore, how to solve these problems that exist in the prior art, just become the problem of the utility model research.
Summary of the invention
The utility model provides a kind of high reliability diode component that adopts the pre-welding structure of lead-in wire; its objective is and to solve in the axialmode encapsulation diode welding encapsulation; by problems such as the welding damage grain oxidation diaphragm that causes of off normal and tining, the tin that overflows; to improve the yields of diode, guarantee the reliability of diode.
For achieving the above object, the technical solution adopted in the utility model is: a kind of high reliability diode component that adopts the pre-welding structure of lead-in wire, in the axialmode epoxy packages body of diode, be the center with the diode crystal particle, extremely axially be arranged with a pre-solder taul at two of this crystal grain; This pre-solder taul is made up of lead-in wire, ailhead and scolding tin bag three parts, and wherein, ailhead is positioned at lead-in wire near an end of crystal grain, and with the lead-in wire structure that is formed in one, the head of ailhead has a table top, scolding tin bag prewelding is fixed on this table top; Two pre-solder tauls are respectively through two weld zone welding on extreme of scolding tin bag on the ailhead separately and crystal grain.
Related content in the technique scheme is explained as follows:
1, in the such scheme, described " diode crystal particle " comprises various situations such as PN junction type diode crystal particle, the special based diode crystal grain of metal barrier heterojunction type nitre.Described " two is extreme " is meant the positive ends and the negative polarity end of diode.Be welded with the structure of scolding tin bag on the table top that described " pre-solder taul " is the index wire ailhead in advance, the shape of this scolding tin bag is similar to " yurt " shape.
2, in the such scheme, described pre-solder taul divides by its profile generally following four kinds:
(1) " T " font structure is seen shown in Figure 4;
(2) " do " the font structure, see shown in Figure 5;
(3) " list bullet " shape structure is seen shown in Figure 6;
(4) " Shuangzi bullet " shape structure is seen shown in Figure 7.
Because pre-solder taul of the present utility model is welded with the scolding tin bag in advance on the ailhead table top; in ensuing welding encapsulation, can guarantee the contraposition accuracy of scolding tin bag and crystal grain weld zone; therefore problems such as damage grain oxidation diaphragm and the tining that causes by the welding off normal, the tin that overflows have been solved; thereby improved the yields of diode, guaranteed the reliability of diode.
The utility model contrasts as follows with existing electrical yield and reliability of once welding encapsulating products after tested:
The former electrical yield of the electrical yield the utility model of welding product product of crystal grain lot number
Product 1 97.1% 99.1%
Product 2 97.8% 99.2%
Product 3 98% 99.5%
Description of drawings
Accompanying drawing 1 is the utility model example structure cutaway view;
Accompanying drawing 2 is a crystal grain and pre-solder taul exploded view among the utility model embodiment;
Accompanying drawing 3 once welds diode crystal particle, weld tabs, the lead-in wire exploded view of encapsulation for existing axialmode;
Accompanying drawing 4 is the utility model " T " font prewelding pin configuration schematic diagram;
Accompanying drawing 5 is that the utility model " is done " font prewelding pin configuration schematic diagram;
Accompanying drawing 6 is the utility model " list bullet " shape prewelding pin configuration schematic diagram;
Accompanying drawing 7 is the utility model " Shuangzi bullet " shape prewelding pin configuration schematic diagram.
In the above accompanying drawing: 1, epoxy packages body; 2, lead-in wire; 3, ailhead; 4, scolding tin bag; 5, crystal grain; 6, weld tabs.
Embodiment
Below in conjunction with drawings and Examples the utility model is further described:
Embodiment: a kind of high reliability diode component that adopts the pre-welding structure of lead-in wire,
As depicted in figs. 1 and 2, in the axialmode epoxy packages body 1 of diode, be the center with a crystal grain 5 that contains PN junction, extremely axially be arranged with a pre-solder taul at two of this crystal grain 5.This pre-solder taul is made up of lead-in wire 2, ailhead 3 and scolding tin bag 4 three parts, and wherein, ailhead 3 is positioned at the ends of lead-in wire 2 near crystal grain 5, and with 2 structures that are formed in one that go between; The head of ailhead 3 has a table top, and scolding tin bag 4 preweldings are fixed on this table top.Two pre-solder tauls through two weld zone welding on extreme of the scolding tin bag 4 on the ailhead 3 separately and crystal grain 5, constitute a kind of semiconductor diode structure of axialmode encapsulation with this respectively.
The prewelding lead format that adopts in the present embodiment is " list bullet " shape structure, sees shown in Figure 6.In the product encapsulation; to form the scolding tin bag at the table top of the lead-in wire ailhead weld tabs of burn-oning earlier; again with the welding of pre-solder taul isomorphous grain, thereby scolding tin can mobile off normal when guaranteeing next step with the crystal grain welding, has avoided scolding tin to pollute problems such as grain oxidation diaphragm and tining, excessive tin.
Present embodiment can be applied to the SKY (the special based diode of nitre) and the plane wafer type GPP product of axialmode encapsulating structure.
Fig. 4, Fig. 5 and Fig. 7 are respectively the pre-solder taul of " T " font, the pre-solder taul of " doing " font and the pre-solder taul of " Shuangzi bullet " shape.These pre-solder tauls can be used for being equal to the pre-solder taul of replacing in the present embodiment of " list bullet " shape, thereby constitute new embodiment.
The foregoing description only is explanation technical conceive of the present utility model and characteristics, and its purpose is to allow the personage who is familiar with this technology can understand content of the present utility model and enforcement according to this, can not limit protection range of the present utility model with this.All equivalences of being done according to the utility model spirit change or modify, and all should be encompassed within the protection range of the present utility model.

Claims (5)

1. a high reliability diode component that adopts the pre-welding structure of lead-in wire is characterized in that: in the axialmode epoxy packages body (1) of diode, be the center with a diode crystal particle (5), extremely axially be arranged with a pre-solder taul at two of this crystal grain (5); This pre-solder taul is made up of lead-in wire (2), ailhead (3) and scolding tin bag (4) three parts, wherein, ailhead (3) is positioned at lead-in wire (2) near an end of crystal grain (5), and with lead-in wire (2) structure that is formed in one, the head of ailhead (3) has a table top, and scolding tin bag (4) prewelding is fixed on this table top; Two pre-solder tauls are respectively through two weld zone welding on extreme of the scolding tin bag (4) on the ailhead (3) separately and crystal grain (5).
2. high reliability diode component according to claim 1 is characterized in that: described pre-solder taul be shaped as " T " font structure.
3. high reliability diode component according to claim 1 is characterized in that: described pre-solder taul be shaped as " doing " font structure.
4. high reliability diode component according to claim 1 is characterized in that: described pre-solder taul be shaped as " list bullet " shape structure.
5. high reliability diode component according to claim 1 is characterized in that: described pre-solder taul be shaped as " Shuangzi bullet " shape structure.
CNU2008200349027U 2008-04-03 2008-04-03 Highly reliable diode device applying lead wire pre-welding construction Expired - Fee Related CN201194226Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2008200349027U CN201194226Y (en) 2008-04-03 2008-04-03 Highly reliable diode device applying lead wire pre-welding construction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2008200349027U CN201194226Y (en) 2008-04-03 2008-04-03 Highly reliable diode device applying lead wire pre-welding construction

Publications (1)

Publication Number Publication Date
CN201194226Y true CN201194226Y (en) 2009-02-11

Family

ID=40393758

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2008200349027U Expired - Fee Related CN201194226Y (en) 2008-04-03 2008-04-03 Highly reliable diode device applying lead wire pre-welding construction

Country Status (1)

Country Link
CN (1) CN201194226Y (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102034705A (en) * 2010-10-18 2011-04-27 重庆平伟实业股份有限公司 Processing technology for reducing large-current diode stress
CN102740611A (en) * 2012-07-07 2012-10-17 上海鼎虹电子有限公司 Bracket for welding electronic element
CN110190001A (en) * 2019-06-05 2019-08-30 扬州扬杰电子科技股份有限公司 A kind of processing technology of axial diode
CN110854080A (en) * 2019-11-26 2020-02-28 合肥圣达电子科技实业有限公司 Multi-lead ceramic component packaging shell and processing method thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102034705A (en) * 2010-10-18 2011-04-27 重庆平伟实业股份有限公司 Processing technology for reducing large-current diode stress
CN102034705B (en) * 2010-10-18 2012-12-12 重庆平伟实业股份有限公司 Processing technology for reducing large-current diode stress
CN102740611A (en) * 2012-07-07 2012-10-17 上海鼎虹电子有限公司 Bracket for welding electronic element
CN110190001A (en) * 2019-06-05 2019-08-30 扬州扬杰电子科技股份有限公司 A kind of processing technology of axial diode
CN110854080A (en) * 2019-11-26 2020-02-28 合肥圣达电子科技实业有限公司 Multi-lead ceramic component packaging shell and processing method thereof

Similar Documents

Publication Publication Date Title
CN105826458B (en) A kind of DPC ceramic substrate preparation methods with metal box dam
CN201194226Y (en) Highly reliable diode device applying lead wire pre-welding construction
US9589873B2 (en) Leadless chip carrier
CN108461459A (en) A kind of cathode docking biphase rectification diode and its manufacturing process
CN203536467U (en) LED device having transition substrate
CN208796987U (en) A kind of lead frame and its ultrathin small shape flip-chip packaged part
CN202240181U (en) Three-layer metal composite soldering tag
CN106783762A (en) The diode encapsulating structure and manufacture method of a kind of vertical parallel way of dual chip
CN104518066B (en) A kind of LED component and its method for packing with transition substrate
CN201156541Y (en) Novel lead wire of electrode of semiconductor diode
CN204497239U (en) Metallic packaging big current, high voltage, fast recovery diode
CN214588813U (en) Packaging structure of reverse-bending internal insulation product
CN216872012U (en) Non-magnetic ceramic packaging body
CN110323198B (en) Non-contact type upper and lower chip packaging structure and packaging method thereof
CN206505909U (en) A kind of diode encapsulating structure of the vertical parallel way of dual chip
CN201112375Y (en) Semiconductor device seal packaging metal foundation
CN112908962B (en) Vehicle-mounted diode packaging structure and method
CN210245488U (en) Non-contact type upper and lower chip packaging structure
CN208835051U (en) Low-stress semiconductor chip fixing structure and semiconductor device
CN207265046U (en) A kind of DIP encapsulating structures with embedded PIN needle
CN209785910U (en) Large-current semiconductor power device
CN203312622U (en) TO pedestal
CN201812815U (en) Rectifier for preventing crystal grains from drifting
CN202259312U (en) Electronic diode
CN201758121U (en) Low bump chip size packaging structure

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090211

Termination date: 20170403

CF01 Termination of patent right due to non-payment of annual fee