CN201126812Y - Scan cleaning device - Google Patents
Scan cleaning device Download PDFInfo
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- CN201126812Y CN201126812Y CNU2007200159418U CN200720015941U CN201126812Y CN 201126812 Y CN201126812 Y CN 201126812Y CN U2007200159418 U CNU2007200159418 U CN U2007200159418U CN 200720015941 U CN200720015941 U CN 200720015941U CN 201126812 Y CN201126812 Y CN 201126812Y
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- 238000004140 cleaning Methods 0.000 title claims abstract description 47
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 19
- 238000005096 rolling process Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 11
- 239000002245 particle Substances 0.000 abstract description 7
- 239000004065 semiconductor Substances 0.000 abstract description 3
- 238000005507 spraying Methods 0.000 abstract description 3
- 238000005516 engineering process Methods 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 abstract 9
- 239000007788 liquid Substances 0.000 description 4
- 239000007921 spray Substances 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 230000003749 cleanliness Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229920003023 plastic Polymers 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 238000009991 scouring Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Cleaning Or Drying Semiconductors (AREA)
Abstract
本实用新型涉及半导体晶片加工过程中对晶片清洗的技术,具体地说是一种实现对晶片表面进行清洗的扫描清洗装置,可解决传统的清洗结构喷射角度、位置固定而容易产生死角等问题。该装置设有喷嘴马达、主轴马达、承片台、喷嘴、喷嘴轴、喷嘴臂,喷嘴臂一端安装于喷嘴马达的喷嘴轴上,喷嘴臂另一端连有喷嘴,主轴马达的主轴上安装有承片台,喷嘴与承片台上的晶片相对应。本实用新型通过在清洗过程中对喷头位置的控制以及晶片旋转的特点,采用喷水旋转扫描清洗的方式,可以最大限度的满足清洗需要,实现对晶片表面做有效清洗的目的,即将晶片表面的微粒全部清除。
The utility model relates to a technology for cleaning wafers during semiconductor wafer processing, in particular to a scanning cleaning device for cleaning the surface of wafers, which can solve the problems of traditional cleaning structures such as fixed spraying angles and positions that tend to produce dead angles. The device is equipped with a nozzle motor, a spindle motor, a chip holder, a nozzle, a nozzle shaft, and a nozzle arm. One end of the nozzle arm is installed on the nozzle shaft of the nozzle motor, and the other end of the nozzle arm is connected to a nozzle. A bearing is installed on the spindle of the spindle motor. The wafer stage, the nozzle corresponds to the wafer on the wafer stage. In the cleaning process, the utility model controls the position of the nozzle and the characteristics of the wafer rotation, and adopts the mode of water spraying and rotating scanning cleaning, which can meet the cleaning needs to the greatest extent and realize the purpose of effectively cleaning the wafer surface, that is, the surface of the wafer Particles are all removed.
Description
技术领域technical field
本实用新型涉及半导体晶片加工过程中对晶片清洗的技术,具体地说是一种实现对晶片表面进行清洗的扫描清洗装置。The utility model relates to the technology for cleaning the wafer during the processing of the semiconductor wafer, in particular to a scanning and cleaning device for cleaning the surface of the wafer.
背景技术Background technique
众所周知,在半导体晶片加工过程中需要一个高度清洁的环境以减少不必要微粒对工艺的影响。但随着精密度的不断提高,线宽的不断缩小以及洁净度的要求不断提高。不仅需要一个高洁净度的净化环境,在很多情况下还需要对晶片表面进行清洗,以满足对被处理晶片表面清洁度的要求。As we all know, semiconductor wafer processing requires a highly clean environment to reduce the impact of unwanted particles on the process. However, with the continuous improvement of precision, the continuous reduction of line width and the continuous improvement of cleanliness requirements. Not only a high cleanliness purification environment is required, but in many cases, the surface of the wafer needs to be cleaned to meet the requirements for the cleanliness of the surface of the processed wafer.
原来的晶片清洗方式是将晶片通过真空吸附的方式固定在承片台上,然后启动清洗设备,使承片台带着晶片旋转。由于晶片的微粒都藏于晶片的沟槽内,顾一般都采用去离子水直接冲洗的办法对镜片表面进行清洗。这样依靠承片台带动晶片旋转时的离心力,再加上离子水的冲刷力将晶片上的微粒清除以达到清洗的目的。但是,这种方法所采用的离子水由于喷射角度、位置固定而容易产生死角。这样,无论如何变动承片台转速以及增加清洗时间,都不能完全有效的将晶片表面的微粒完全冲洗掉。The original wafer cleaning method is to fix the wafer on the wafer stage by vacuum adsorption, and then start the cleaning equipment to make the wafer table rotate with the wafer. Since the particles of the wafer are hidden in the grooves of the wafer, Gu generally uses deionized water to directly rinse the surface of the lens to clean it. In this way, relying on the centrifugal force when the wafer is rotated by the wafer table, coupled with the scouring force of ionized water, the particles on the wafer are removed to achieve the purpose of cleaning. However, the ionized water used in this method is prone to dead angles due to the fixed spray angle and position. In this way, no matter how the rotating speed of the wafer stage is changed or the cleaning time is increased, the particles on the surface of the wafer cannot be completely and effectively washed away.
实用新型内容Utility model content
本实用新型的目的在于提供一种扫描清洗装置,解决传统的清洗结构喷射角度、位置固定而容易产生死角等问题,采用喷水旋转扫描清洗的方式,以实现对晶片表面做有效清洗的目的。The purpose of this utility model is to provide a scanning cleaning device, which solves the problems of traditional cleaning structure, such as fixed spray angle and position, which are easy to produce dead angles, etc., and adopts the method of water spraying and rotating scanning cleaning, so as to realize the purpose of effectively cleaning the wafer surface.
本实用新型的技术方案是:The technical scheme of the utility model is:
一种扫描清洗装置,该装置设有喷嘴马达、主轴马达、承片台、喷嘴、喷嘴轴、喷嘴臂,喷嘴臂一端安装于喷嘴马达的喷嘴轴上,喷嘴臂另一端连有喷嘴,主轴马达的主轴上安装有承片台,喷嘴与承片台上的晶片相对应。A scanning and cleaning device, the device is provided with a nozzle motor, a spindle motor, a chip holder, a nozzle, a nozzle shaft, and a nozzle arm, one end of the nozzle arm is installed on the nozzle shaft of the nozzle motor, the other end of the nozzle arm is connected with a nozzle, and the spindle motor A wafer stage is installed on the main shaft, and the nozzle corresponds to the wafer on the wafer stage.
所述的扫描清洗装置,在喷嘴轴上安装有喷嘴轴防水套,喷嘴轴防水套与喷嘴轴之间为过盈配合。In the scanning cleaning device, a nozzle shaft waterproof sleeve is installed on the nozzle shaft, and the nozzle shaft waterproof sleeve and the nozzle shaft are in an interference fit.
所述的扫描清洗装置,被处理成螺旋状的高压水管围绕着喷嘴轴安装,高压水管螺旋上绕后沿喷嘴臂与喷嘴连接。In the scanning cleaning device, the high-pressure water pipe processed into a spiral shape is installed around the nozzle shaft, and the high-pressure water pipe is wound up in a spiral and then connected to the nozzle along the nozzle arm.
所述的扫描清洗装置,该装置设于壳体内,壳体为上下两层的上壳体和下壳体构成,上下两层在连接处互相啮合。The scanning and cleaning device described above is arranged in a casing, and the casing is composed of an upper casing and a lower casing with upper and lower layers, and the upper and lower layers mesh with each other at the joint.
所述的扫描清洗装置,在主轴马达的主轴与下壳体之间装有可伸缩的主轴防水套,主轴防水套与主轴及下壳体分别固定。In the scanning cleaning device, a retractable main shaft waterproof cover is installed between the main shaft of the main shaft motor and the lower casing, and the main shaft waterproof cover is fixed to the main shaft and the lower casing respectively.
所述的扫描清洗装置,喷嘴轴通过滚动轴承与安装于下壳体上。In the scanning and cleaning device described above, the nozzle shaft is mounted on the lower casing through rolling bearings.
本实用新型的有益效果是:The beneficial effects of the utility model are:
1、本实用新型所提供的清洗装置包括两个马达、一个承片台、一个喷头以及控制单元。通过在清洗过程中对喷头位置的控制以及晶片旋转的特点可以最大限度的满足清洗需要,实现清洗的目的,即将晶片表面的微粒全部清除。1. The cleaning device provided by the utility model includes two motors, a wafer holder, a spray head and a control unit. Through the control of the position of the nozzle and the characteristics of the wafer rotation during the cleaning process, the cleaning needs can be met to the greatest extent, and the purpose of cleaning can be achieved, that is, all the particles on the surface of the wafer can be removed.
2、在本实用新型清洗装置中,用于清洗的水是高压水。这样,为保证在作业过程中绝对安全,特将所有装置都安装在一个方形“迷宫”壳体内。由控制单元控制,当一种马达带动承片台及晶片旋转时,另一个马达则带动喷嘴臂旋转使得喷嘴在喷嘴臂的带动下做圆周运动,也就是扫描。而喷嘴摆动的角度及速度均可根据不同工艺需要做出任意调整。2. In the cleaning device of the present invention, the water used for cleaning is high-pressure water. In this way, in order to ensure absolute safety during operation, all devices are installed in a square "labyrinth" housing. Controlled by the control unit, when one motor drives the wafer stage and the wafer to rotate, the other motor drives the nozzle arm to rotate so that the nozzle moves in a circular motion driven by the nozzle arm, that is, scanning. The angle and speed of nozzle swing can be adjusted arbitrarily according to different process needs.
3、同时,喷嘴旋转轴以及承片台旋转轴上都装有防水套,以防止液体向下泄漏造成马达损坏引发事故。在该装置中,壳体用塑料加工而成。其余零件均采用不锈钢材料,这样可保证不会再有颗粒生成而造成晶片二次污染。3. At the same time, waterproof sleeves are installed on the rotating shaft of the nozzle and the rotating shaft of the bearing table to prevent the liquid from leaking downwards and causing damage to the motor and causing accidents. In this device, the housing is machined from plastic. The rest of the parts are made of stainless steel, which can ensure that no particles will be generated to cause secondary pollution of the wafer.
4、另外,由于有时所用清洗液压力较高,所以必须采用不锈钢管这样的材料才能保证其耐压型。不锈钢管刚度较强,不宜反复折弯,但喷嘴又要反复旋转,所以又特别的将不锈钢管做成螺旋形,这样便可在保证其耐压型的同时满足喷嘴旋转的功能。4. In addition, due to the high pressure of the cleaning fluid sometimes used, it is necessary to use materials such as stainless steel pipes to ensure its pressure resistance. The stainless steel tube has strong rigidity and is not suitable for repeated bending, but the nozzle has to rotate repeatedly, so the stainless steel tube is specially made into a spiral shape, so that the function of nozzle rotation can be satisfied while ensuring its pressure resistance.
附图说明Description of drawings
图1和图2是本实用新型的结构示意简图。其中,图1为主视图;图2为俯视图。Fig. 1 and Fig. 2 are the schematic structural diagrams of the utility model. Among them, Fig. 1 is a front view; Fig. 2 is a top view.
图3是被处理成螺旋状的高压水管。Figure 3 is a high-pressure water pipe processed into a spiral.
图4为上、下壳体结合处截面放大示意图。Fig. 4 is an enlarged cross-sectional schematic view of the junction of the upper and lower housings.
图中,1-喷嘴马达;2-主轴马达;3-承片台;4-下壳体;5-主轴防水套;6-喷嘴轴防水套;7-喷嘴;8、9-滚动轴承;10-喷嘴轴;11-喷嘴臂;12-晶片;13-上壳体;14-高压水管;15-主轴。In the figure, 1-nozzle motor; 2-spindle motor; 3-supporting piece table; 4-lower shell; 5-spindle waterproof cover; 6-nozzle shaft waterproof cover; 7-nozzle; Nozzle shaft; 11-nozzle arm; 12-wafer; 13-upper casing; 14-high-pressure water pipe; 15-main shaft.
具体实施方式Detailed ways
如图1-2所示,本实用新型扫描清洗装置具有喷嘴马达1、主轴马达2、承片台3、壳体、主轴防水套5、喷嘴轴防水套6、喷嘴7、滚动轴承8、9、喷嘴轴10、喷嘴臂11、晶片12等;喷嘴臂11一端安装于喷嘴马达1的喷嘴轴10上,喷嘴臂11另一端连有喷嘴7,主轴马达2的主轴15上安装有承片台3,喷嘴7与承片台3上的晶片12相对应;在喷嘴轴10上安装有喷嘴轴防水套6,喷嘴轴防水套6与喷嘴轴10之间为过盈配合;该装置设于壳体内,壳体为上下两层(即上壳体13和下壳体4)构成,上壳体13和下壳体4在连接处互相插接啮合,形成类似于迷宫结构;壳体采用这样的迷宫型结构(图4),液体很难再从壳体的连接外泄,同时可节省加工材料。在主轴马达2的主轴15与下壳体4之间还装有可伸缩的主轴防水套5,主轴防水套5与主轴15及下壳体4分别固定;喷嘴轴10通过滚动轴承8、9与安装于下壳体4上。As shown in Figure 1-2, the scanning cleaning device of the present invention has a
如图2所示,喷嘴7以喷嘴轴10为圆心、以喷嘴臂11为半径旋转,可实现旋转清洗,且其高度、转动角度及半径均可调。As shown in FIG. 2 , the
如图3所示,被处理成螺旋状的高压水管14围绕着喷嘴轴10安装,高压水管14从下面穿上来以后,被加工成螺旋形,螺旋上绕后沿喷嘴臂11与喷嘴7连接,高压水管摆动时不会产生较大扭矩,可保证其耐压性及减轻负载扭矩。As shown in Figure 3, the high-
启动清洗装置以后,首先是主轴马达2旋转,从而带动与其直连的承片台3旋转。这样,通过真空吸附的方式而被固定在承片台3上的晶片12也跟着旋转起来,其旋转速度及其加速度可调。此时,喷嘴马达1旋转,带动与之连接的喷嘴轴10旋转,喷嘴臂11、喷嘴7随之旋转,其运动轨迹如图2箭头所示。旋转即清洗的角度及速度可根据需要控制喷嘴马达1调整。当喷嘴7旋转到指定位置时,自动返回原位。在此摆臂清洗过程中,因为与喷嘴7连通的高压水管14(如:钢管)已经被处理成螺旋型,故加在旋转喷嘴马达1上的负载已经不是很大,可以轻松随喷嘴7旋转,同时又保证了高压水管14的耐压特性。这样便不会出现旋转喷嘴马达1因负载扭矩太大而烧坏,也不会造成因高压水管耐压能力不足而造成破裂的危险。After starting the cleaning device, first the spindle motor 2 rotates, thereby driving the wafer holder 3 directly connected to it to rotate. In this way, the
因为在清洗过程中,可能需要对喷嘴7相对于晶片12的中心位置进行一些微小的调整,也可能需要对晶片12进行特定角度以及特定范围的特别清洗,所以喷嘴轴10、喷嘴臂11以及喷嘴7之间的连接都被设计成可调整的,都采用螺钉锁死。在需要调整的时候可将螺钉松开,利用轴与孔的间隙窜动喷嘴7和喷嘴臂11的位置,当位置合适的时候,再拧紧螺钉,固定。这样,可以同时调整喷嘴7的喷射半径及高度,以满足要求。Because in the cleaning process, it may be necessary to carry out some minor adjustments to the central position of the
为了能够确保喷嘴7在旋转扫描清洗过程中没有液体泄露,在喷嘴轴10的中上部固定有喷嘴轴防水套6。该喷嘴轴防水套6与喷嘴轴10之间为过盈配合,并用顶丝将其固定在喷嘴轴10之上。这样,既可保证喷嘴7在往复旋转的情况下,喷嘴轴防水套6不仅能够很好的实现其防水的功能,而且也不会脱落。另外,为避免液体从中间主轴15处泄露,在主轴马达2的主轴15与下壳体4之间安装一个可以伸缩的主轴防水套5,主轴防水套5做成可伸缩型是因为有时承片台需要升起,主轴防水套5是一种可伸缩的塑料管,材料就是普通塑料,蝶形、可伸缩。主轴防水套5与下壳体4固定,这样可在不影响承片台3升降时防止泄露。In order to ensure that the
Claims (6)
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102319686A (en) * | 2011-08-26 | 2012-01-18 | 上海宏力半导体制造有限公司 | Wafer cleaning device and wafer cleaning method |
CN103182392A (en) * | 2011-12-31 | 2013-07-03 | 中芯国际集成电路制造(上海)有限公司 | Wafer cleaning method |
-
2007
- 2007-11-16 CN CNU2007200159418U patent/CN201126812Y/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102319686A (en) * | 2011-08-26 | 2012-01-18 | 上海宏力半导体制造有限公司 | Wafer cleaning device and wafer cleaning method |
CN102319686B (en) * | 2011-08-26 | 2015-04-08 | 上海华虹宏力半导体制造有限公司 | Wafer cleaning device and wafer cleaning method |
CN103182392A (en) * | 2011-12-31 | 2013-07-03 | 中芯国际集成电路制造(上海)有限公司 | Wafer cleaning method |
CN103182392B (en) * | 2011-12-31 | 2015-11-25 | 中芯国际集成电路制造(上海)有限公司 | Method for cleaning wafer |
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