CN1696726A - Automated testing system and method for light emitting diode - Google Patents
Automated testing system and method for light emitting diode Download PDFInfo
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- CN1696726A CN1696726A CN 200510034935 CN200510034935A CN1696726A CN 1696726 A CN1696726 A CN 1696726A CN 200510034935 CN200510034935 CN 200510034935 CN 200510034935 A CN200510034935 A CN 200510034935A CN 1696726 A CN1696726 A CN 1696726A
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Abstract
An automatic test system of LED comprises operation control desk, PLC and system host including LED test device, data processing device and communication interface. The said LED test device is featured as using parameter test device of electrical property to test LED current and voltage, using brake current device to test diode brake current and using light spectrum device to test LED optical parameters.
Description
Technical field
The present invention relates to the electrical and optic test field of light emitting diode, relate in particular to a kind of automatization test system and method for light emitting diode.
Background technology
Light emitting diode after encapsulation is finished, must be after tested its electrically or optical parametric to guarantee its yield or its usability, the method for its test then must utilize special-purpose LED test instrument to detect.Higher and the comparatively reliable light emitting diode detecting instrument of measuring accuracy of automaticity had appearred in recent years.
Have the test macro of the light emitting diode of some types on the current market, compared with former artificial beam split, they exist many advantages, and are fast such as speed, and the beam split ratio of precision is manually higher, and the electrical parameter precision is higher.But also exist some defectives, such as forward voltage, the time owing to test, the electric current that applies is moment, and the forward voltage of LED can decrease along with the prolongation of application time, drops to a certain degree just can stablize, and can cause the forward voltage test value of LED higher like this; For the white light LEDs test, all LED automatic testing and sorting machines on the market all are to adopt the CIE1931 standard now, promptly measure chromaticity coordinate xy.But, a lot of limitation is arranged because the CIE1931 standard is a very old standard.Such as, the irregular colour of xy chrominance space is even, does not have parameter to characterize brightness, or the like.When carrying out the white light classification, the size and the shape of stepped zone are inhomogeneous.
Therefore, the test macro of more existing light emitting diodes and method of testing even can't satisfy people's needs in precision and function aspects, await improving and improving.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, a kind of automatization test system and method that can improve test light emitting diode precision is provided.
The present invention is achieved by the following technical solutions:
A kind of automatization test system of light emitting diode, comprise system host, operating console, PLC, system host comprises the test light emitting diode electrically and the LED proving installation of optical parametric, the data processing equipment that the data of test light emitting diode are handled and the interface of realizing data processing equipment and the mutual communication of PLC, and described LED proving installation comprises the electric parameter detecting device of testing led current voltage, test lock current test device that the light-emitting diodes pipe closer flows and the spectrum test device of testing the light emitting diode (LED) light parameter.Described data processing equipment comprises electrical parameter treating apparatus that the current and voltage data of measured light emitting diode is handled, the lock current processing device that the lock flow data is handled and the spectral manipulation device that its measured optical parametric data are handled.Described optical parametric comprises predominant wavelength, peak wavelength, purity, colour temperature, half-wave are wide or the like relatively.Described electrical parameter comprises the positive voltage of light emitting diode of surveying, reverse voltage, forward current, inverse current etc.Described operating console setting is touch-screen preferably, also can be that other shows input equipment.
Described spectral manipulation device comprises CIE1931 treating apparatus, CIE1960 treating apparatus, the CIE1976 treating apparatus of by CIE1931 standard, CIE1960 standard, CIE1976 standard the optical parametric data of light emitting diode being handled respectively.The user can adopt wherein any one treating apparatus that the light emitting diode (LED) light parameter is tested as required.
Described spectral manipulation device links to each other with a timing device, the daylighting time of this timing device control spectral manipulation device.
Described LED proving installation also comprises the detector of test light emitting diode light intensity.
Described data processing equipment comprises that also the current and voltage data to measured light emitting diode carries out the V-I figure treating apparatus of graphic plotting and the I-IV figure treating apparatus that electric current brightness is carried out graphic plotting.By the voltage-current characteristic of V-I figure observation LED, observe the lock properties of flow of LED intuitively, i.e. negative resistance effect.Can observe relation between LED electric current and the light intensity by I-IV figure.
A kind of automated testing method of light emitting diode comprises step:
The user proposes test request, and when interface detected commencing signal, the LED proving installation was promptly tested light emitting diode;
When test was finished, system host transmitted an end signal to PLC by interface;
Data processing equipment carries out data processing to the test result of LED proving installation, and determines the affiliated grade of institute's light emitting diode of surveying;
Data processing equipment reaches PLC with the grade of this light emitting diode by interface;
PLC controls this light emitting diode and is put under determined grade.
Before the test positive voltage of light emitting diode, earlier light emitting diode is carried out preheating.
Described preheating method is the electric current that light emitting diode is passed to certain hour.
Further be included in before the test earlier the step that the light emitting diode to some tries to survey, survey the result according to examination and determine stepped zone and number of degrees.
From top description as can be seen, advantage of the present invention is:
To the test of light emitting diode forward voltage, we have adopted the mode of preheating to reduce error.Our test macro adopts CIE1976 standard, CIE1960UCS standard and CIE1931 standard, and the color space of CIE1976 standard, these two kinds of standards of CIE1960UCS standard is much even with respect to CIE1931.CIE1976 particularly, the color space of this standard is a solid space, adopts three values (L, a, b) to characterize color, and wherein, L represents brightness, and+a represents redness, and-a represents green, and+b represents yellow, and-b represents blueness.So in CIE1976, can adopt the square of standard to come white light is carried out classification, add L, just can carry out classification to brightness.
But consider that people use the CIE1931 standard to make and use for a long time, be accustomed to x, y are carried out progressive operation, so in our test macro, test and classifying capability have still been kept to x, y, but we improve the hierarchical approaches of xy, more convenient operator's use.The user can select in these three kinds of standards any one to test according to the needs of oneself.
This shows that light emitting diode automatization test system of the present invention and method are higher to the measuring accuracy of forward voltage, optical parametric, classification is more accurate, and has increased the test to light-emitting diode luminance.
Description of drawings
Fig. 1 is the structured flowchart of light emitting diode automatization test system of the present invention;
Fig. 2 is the synoptic diagram of LED proving installation shown in Figure 1;
Fig. 3 is the synoptic diagram of data processing equipment shown in Figure 1;
Fig. 4 is a spectral manipulation schematic representation of apparatus shown in Figure 3;
Fig. 5 is the process flow diagram of light emitting diode automated testing method of the present invention;
Fig. 6 is the process flow diagram that the voltage of light emitting diode is carried out classification;
Fig. 7 is the Lab system of employing CIE1976 standard carries out classification to light emitting diode a process flow diagram;
Embodiment
The present invention is described in further detail below in conjunction with the drawings and specific embodiments.
Embodiment
See also Fig. 1, a kind of automatization test system of light emitting diode, comprise system host 10, touch-screen 30, PLC20, system host 10 comprises that the test light emitting diode electrically and the LED proving installation 11 of optical parametric, the data processing equipment 12 that the data of test light emitting diode are handled and the interface 13 of realization data processing equipment 12 and the mutual communication of PLC20; And the touch-screen 30 that links to each other with PLC20.
See also Fig. 2, described LED proving installation 11 comprises the electric parameter detecting device 112 of data storage cell 111, test led current voltage, the lock current test device 113 of test light-emitting diodes pipe closer stream, the spectrum test device 114 of test light emitting diode (LED) light parameter and the detector 115 of test light emitting diode light intensity.See also Fig. 3, the lock current processing device 123 that described data processing equipment 12 comprises electrical parameter treating apparatus 122 that the current and voltage data of measured light emitting diode is handled, handle the lock flow data, spectral manipulation device 124 and data processing unit 121 that its measured optical parametric data are handled.Described optical parametric comprises predominant wavelength, peak wavelength, purity, wide, the chromaticity coordinate of colour temperature, half-wave, light intensity relatively.Described electrical parameter comprises the positive voltage of light emitting diode of surveying, reverse voltage, forward current, inverse current, lock stream.Described data processing equipment 12 comprises that also the current and voltage data to measured light emitting diode carries out the V-I figure treating apparatus 125 of graphic plotting and the I-IV figure treating apparatus 126 that electric current brightness is carried out graphic plotting.By the voltage-current characteristic of V-I figure observation LED, observe the lock properties of flow of LED intuitively, i.e. negative resistance effect.
See also Fig. 4, described spectral manipulation device 124 comprises CIE1931 treating apparatus 1242, CIE1960 treating apparatus 1243, CIE1976 treating apparatus 1244 and the spectral manipulation unit of by CIE1931 standard, CIE1960 standard, CIE1976 standard the optical parametric data of light emitting diode being handled respectively 1241.
Described spectrum test device 114 links to each other with a timing device 116, the daylighting time of these timing device 116 control spectral manipulation devices.
See also Fig. 5, a kind of automated testing method of light emitting diode, comprise the steps: the step 501 of user by PLC20 proposition test request, interface 13 detects the step 502 of commencing signal, 11 pairs of steps 503 that light emitting diode is tested of LED proving installation; When a LED test was finished, data processing equipment 12 transmitted the step 504 that an end signal is given interface 13, and interface 13 is delivered to this end signal the step 505 of PLC20; The test result of 12 pairs of LED proving installations 11 of data processing equipment is carried out data processing, and determines the step 506 of the affiliated grade of this light emitting diode; Data processing equipment 12 reaches the grade of this light emitting diode the step 507 of PLC20 by interface; PLC20 controls this light emitting diode is determined grade by putting under step 508.
See also Fig. 6, when the user tests positive voltage of light emitting diode, may further comprise the steps: the step 601 of user's input test request, light emitting diode is passed to the step 602 that the certain hour electric current carries out preheating, PLC20 sends the step 602 of beginning test signal to interface 13, interface detects the step 603 of commencing signal, the beginning preheating, preheating finishes, 112 pairs of steps 604 that light emitting diode is tested of electric parameter detecting device, detect and finish, data processing equipment 12 transmits the step 605 that an end signal is given interface 13, interface 13 is delivered to the step 606 of PLC20 with this end signal, and the test result of 122 pairs of electric parameter detecting devices 112 of electrical parameter treating apparatus is carried out data processing, and determines the step 607 of grade under this light emitting diode; Data processing equipment 12 reaches the grade of this light emitting diode the step 608 of PLC20 by interface; PLC20 controls this light emitting diode is determined grade by putting under step 609.
See also Fig. 7, when the user adopts the Lab system of CIE1976 standard that light emitting diode is carried out classification, may further comprise the steps: the user accesses the step 701 of CIE1976 coordinate system, the step 702 of draw samples from required test light emitting diode, institute's draw samples tried the step 703 surveyed, determine stepped zone and the step 704 of dividing progression according to result of a sample test, the test beginning, PLC20 sends the step 705 of beginning test signal to interface 13, interface detects the step 706 of commencing signal, 114 pairs of steps 707 that light emitting diode is tested of spectrum test device, when this light emitting diode is detected end, data processing equipment 12 transmits the step 708 that an end signal is given interface 13, interface 13 is delivered to this end signal the step 709 of PLC20, CIE1976 treating apparatus in the spectral manipulation device 124 carries out data processing to the test result of spectrum test device 114, and determines the step 710 of the affiliated grade of this light emitting diode; Data processing equipment 12 reaches the grade of this light emitting diode the step 711 of PLC20 by interface 13; PLC20 controls this light emitting diode is determined grade by putting under step 712.
Although the present invention has done detailed explanation and has quoted instantiation as proof; but for those skilled in the art; only otherwise leave that the spirit and scope of the present invention can be done various variations or correction is obvious, all should be included within the protection domain of claim of the present invention.
Claims (11)
1. the automatization test system of a light emitting diode, comprise system host, operating console, PLC, system host comprises that the test light emitting diode electrically and the LED proving installation of optical parametric, the data processing equipment that the data of test light emitting diode are handled, and the interface of realizing data processing equipment and the mutual communication of PLC, it is characterized in that: described LED proving installation comprises the electric parameter detecting device of test led current voltage, the lock current test device of test light-emitting diodes pipe closer stream, and the spectrum test device of test light emitting diode (LED) light parameter.
2. automatization test system according to claim 1 is characterized in that: described data processing equipment comprises electrical parameter treating apparatus that the current and voltage data of measured light emitting diode is handled, the lock current processing device that the lock flow data is handled and the spectral manipulation device that its measured optical parametric data are handled.
3. automatization test system according to claim 2 is characterized in that: described spectral manipulation device comprises CIE1931 treating apparatus, CIE1960 treating apparatus, the CIE1976 treating apparatus of by CIE1931 standard, CIE1960 standard, CIE1976 standard the optical parametric data of light emitting diode being handled respectively.
4. automatization test system according to claim 2 is characterized in that: described spectral manipulation device device when certain links to each other, the daylighting time of this timing device control spectral manipulation device.
5. automatization test system according to claim 1 is characterized in that: described LED proving installation also comprises the detector of test light emitting diode light intensity.
6. automatization test system according to claim 2 is characterized in that: described data processing equipment comprises that also the current and voltage data to measured light emitting diode carries out the V-I figure treating apparatus of graphic plotting and the I-IV figure treating apparatus that electric current brightness is carried out graphic plotting.
7. according to the described automatization test system of claim 1-6, it is characterized in that: described operating console is a touch-screen.
8. the method for testing of a light emitting diode comprises step:
The user proposes test request, and when interface detected commencing signal, the LED proving installation was promptly tested light emitting diode;
When test was finished, system host transmitted an end signal to PLC by interface;
Data processing equipment carries out data processing to the test result of LED proving installation, and determines the affiliated grade of institute's light emitting diode of surveying;
Data processing equipment reaches PLC with the grade of this light emitting diode by interface;
PLC controls this light emitting diode and is put under determined grade.
9. the method for testing of a kind of light emitting diode according to claim 8 is characterized in that: before the test positive voltage of light emitting diode, earlier light emitting diode is carried out preheating.
10. the method for testing of a kind of light emitting diode according to claim 9, it is characterized in that: described preheating method is the electric current that light emitting diode is passed to certain hour.
11. the method for testing of a kind of light emitting diode according to claim 8 is characterized in that: further be included in before the test earlier the step that the light emitting diode to some tries to survey, survey the result according to examination and determine stepped zone and number of degrees.
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| CN101846581A (en) * | 2010-04-20 | 2010-09-29 | 华东交通大学 | LED light source stability detector based on PLC control and detection method thereof |
| CN101344430B (en) * | 2007-07-09 | 2011-06-01 | 中茂电子(深圳)有限公司 | High-speed optical sensing apparatus and system capable of simultaneously sensing luminous intensity and chroma |
| CN102096035A (en) * | 2010-11-22 | 2011-06-15 | 金天 | Thermal cycling load test system for diode |
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| CN101846581A (en) * | 2010-04-20 | 2010-09-29 | 华东交通大学 | LED light source stability detector based on PLC control and detection method thereof |
| CN101846581B (en) * | 2010-04-20 | 2011-11-09 | 华东交通大学 | LED light source stability detector based on PLC control and detection method thereof |
| CN102096035A (en) * | 2010-11-22 | 2011-06-15 | 金天 | Thermal cycling load test system for diode |
| CN102096035B (en) * | 2010-11-22 | 2012-08-08 | 金天 | Thermal cycling load test system for diode |
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| CN102393500B (en) * | 2011-10-08 | 2014-05-28 | 赵振华 | Test method for diode pair with common-cathode or common-anode packaging mode |
| CN103185663A (en) * | 2011-12-28 | 2013-07-03 | 英业达股份有限公司 | Light-emitting diode detection method by utilizing digital image |
| CN103185663B (en) * | 2011-12-28 | 2015-11-25 | 英业达股份有限公司 | Utilize digitized video to the detection method of light emitting diode |
| CN102623281A (en) * | 2012-04-06 | 2012-08-01 | 合肥普天节能技术有限公司 | Online detection system for single-capped electrodeless fluorescent lamps |
| CN102623281B (en) * | 2012-04-06 | 2015-03-11 | 季晓东 | Online detection system for single-capped electrodeless fluorescent lamps |
| CN102706454A (en) * | 2012-06-21 | 2012-10-03 | 伟创力电子技术(苏州)有限公司 | USBTMC (Universal Serial Bus Traffic Message Channel) protocol specification based detection equipment of LED color and brightness |
| CN102999005A (en) * | 2012-10-25 | 2013-03-27 | 南通康比电子有限公司 | Steering magnet control system for diode measurement |
| CN104457994A (en) * | 2014-12-09 | 2015-03-25 | 苏州科利亚照明科技有限公司 | Light analyzer |
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