CN1388381A - Energy shock measuring system and method for electronic elements - Google Patents
Energy shock measuring system and method for electronic elements Download PDFInfo
- Publication number
- CN1388381A CN1388381A CN 01116199 CN01116199A CN1388381A CN 1388381 A CN1388381 A CN 1388381A CN 01116199 CN01116199 CN 01116199 CN 01116199 A CN01116199 A CN 01116199A CN 1388381 A CN1388381 A CN 1388381A
- Authority
- CN
- China
- Prior art keywords
- test
- energy shock
- destructive
- shock measuring
- electronic component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The energy shock measuring system for electronic elements includes one non-destructive electronic element testing mode, one destructive electronic element testing mode and one program control structure to integrate the two said testing modes into one test system. The non-destructive electronic element testing mode is used in structural quality test of products for raising the reliability of products, while the destructive electronic element testing mode is used to shorten test time of energy shock test. The present invention is suitable for shock resistance test, simulated continuous or instantaneous shock test and structural quality detection and analysis of electronic elements.
Description
The present invention relates to the test of electronic component, especially a kind of electronic component energy shock measuring system and method, this system has the test macro of destructiveness and non-destructive electronic components test pattern, is applicable to that the structural quality detection and the product of electronic component is anti-towards the aptitude tests analysis comprehensively.
The electronic components test system of prior art, as announcing " resistive load mechanism for testing " novel patent case No. 361627 in the TaiWan, China patent gazette of TaiWan, China bulletin on June 11st, 88, this mechanism comprises a base, is rectangular pattern; Two battery lead plates are for being fixed on the base, and it is to extend horizontally to the length that is at least base, and are upright sheet pattern and connect extraneous power supply, and the end face of two battery lead plates slips over for the stopband of can powering; One loam cake can be for being combined in the base top, and inner bottom surface forms the roll extrusion belt of belt pulley and suitable length, and this roll extrusion belt is the lead foot place, both sides corresponding to each resistance of resistive band; When passing zone that loam cake and base define and carry by resistive band, the roll extrusion belt by loam cake positively contacts each resistance lead foot of resistive band with two battery lead plates, with the test of switching on continuously.Yet No. 361627 mechanism for testing only has single test pattern, and it can't utilize same mechanism to carry out different test patterns such as destructiveness and non-destructive electronic components test pattern respectively.Therefore, in single mechanism for testing, need suitably to integrate different test patterns to solve aforementioned technical problem.In addition, the product structure Quality Detection product that only utilizes sample procuratorial organ formula to get some detects traditionally, and can't carry out comprehensive product structure Quality Detection.
For overcoming the above-mentioned shortcoming of prior art, the invention provides a kind of electronic component energy shock measuring system and method, the structural quality detection and the product that can carry out electronic component are anti-towards the aptitude tests analysis comprehensively.
This electronic component energy shock measuring system comprises: a pair of element under test simulate continuous transient energy shock-testing till its structural collapse so that test the destructive electronic components test pattern of this element under test structural quality; A pair of element under test is simulated a transient energy shock-testing so that test the anti-non-destructive electronic components test pattern towards ability of this element under test energy; One in order to control the program control structure of this destructiveness electronic components test pattern and non-destructive electronic components test pattern.
This electronic component energy shock measuring method comprises differentiation and whether carries out the testing procedure that destructive single-point energy impacts;
If when select carrying out destructive energy shock measuring, then carry out test parameter and set step, be written into the test procedure step, test capacitors begins charge step, element under test is carried out transient energy impact shock-resistant number of times counting step; After carrying out counting step, carry out to differentiate whether receive the collapse signal; If when not receiving the collapse signal, repeat and be written into the test procedure step always; If when receiving the collapse signal, carry out and finish the energy impact step, get back to energy shock measuring system;
If when not selecting to carry out destructive multiple spot energy shock measuring, then carrying out test parameter sets step, is written into non-destructive multiple spot energy shock measuring program step, differentiate and whether carry out the negative tempperature coefficient thermistor charging, if not during charging, get back to energy shock measuring system, if during charging, element to be tested enters the test section and carries out position and lock; Whether differentiate detecting phase at 90 degree, if phase place not when 90 spend, repeat always differentiation until phase place till 90 degree, if phase place when 90 spend, is carried out and started first group of switch arrays and carry out multiple spot energy shock measuring in proper order; Carry out to start second group of switch arrays and carry out the test capacitors discharge, the voltage that makes test capacitors is zero, and repeats differentiation always and whether carry out the negative tempperature coefficient thermistor charging, when charging not, gets back to energy shock measuring system.
The invention has the beneficial effects as follows: different test patterns are integrated in a test macro because of it utilizes the shared routine control structure, element under test is carried out the test of energy shock measuring and continuous analog moment impact, so have robotization control mode and integrate the effect of multiple test pattern in proper order; In addition, its shortened the energy shock measuring time and can be comprehensively product examine test continuously, the present invention is had promote the effect that testing precision and product can degree of relying.
Below be accompanying drawing of the present invention:
Fig. 1: the process flow diagram of preferred embodiment electronic component energy shock measuring method of the present invention;
Fig. 2: the synoptic diagram of the destructive single-spot testing structure of preferred embodiment electronic component energy shock measuring system of the present invention;
Fig. 3: the control circuit figure of the destructive single-spot testing structure of preferred embodiment electronic component energy shock measuring system of the present invention;
Fig. 4: the collapse sensing circuit figure of the destructive single-spot testing structure of preferred embodiment electronic component energy shock measuring system of the present invention;
Fig. 5: the non-destructive multi-point sampler structure of preferred embodiment electronic component energy shock measuring system of the present invention and testing circuit figure.
Below in conjunction with accompanying drawing the present invention is further described:
Electronic component energy shock measuring system of the present invention, its nondestructive testing pattern and destructive testing pattern are write with program language such as Visual Basic, C language, compositional language etc., but utilize master control computer and program card complete, accurate continuous analog moment impact electric current and energy impact function are provided, are used in the shock-resistant aptitude tests and the structural quality check and analysis of element to be tested.
The electronic component energy shock measuring system of preferred embodiment of the present invention is used in the test of negative tempperature coefficient thermistor for example.This negative tempperature coefficient thermistor is as the straining element that shoves.The principal element that causing in circuit shoves produces is when power source circuit switch moment startup, because filtering circuit moment is caused short circuit phenomenon, thereby the very big immediate current late-class circuit of flowing through arranged, when if this moment, inrush current can't suppress immediately, may cause the destruction of electronic component on every side and lower product serviceable life.Therefore this negative tempperature coefficient thermistor is applied to suppress in the circuit inrush current.This negative tempperature coefficient thermistor must have effectively to suppress to shove a cool time after suppressing to finish to shoving next time.General AC power is 110V/60Hz or 220V/60Hz, and its switch moment when 1/4 cycle starts and produces the maximum instantaneous dash current, therefore must the short attack time of analogous pole, produce maximum impact electric current and resistance cool time.In order further to analyze the structural quality of this negative tempperature coefficient thermistor, must simulate a continuity and produce the stabilizer pole maximum current this negative tempperature coefficient thermistor is done the shock-testing of continuity destruction till this resistance collapse, this pattern is destructive single-spot testing pattern.For further check and analysis product structure quality, its structure is efficient carries out energy shock measuring to many electronic components simultaneously.Fig. 1 of the present invention discloses the process flow diagram of preferred embodiment electronic component energy shock measuring method, and this flow process comprises nondestructive testing pattern and destructive testing pattern in regular turn.Fig. 2 of the present invention discloses the synoptic diagram of the destructive single-spot testing structure of preferred embodiment.Fig. 3 of the present invention discloses the control circuit figure of the destructive single-spot testing structure of preferred embodiment.Fig. 4 of the present invention discloses the collapse sensing circuit figure of the destructive single-spot testing structure of preferred embodiment.Fig. 5 of the present invention discloses preferred embodiment non-destructive multi-point sampler structure and testing circuit figure.
Please refer to shown in Figure 1ly, preferred embodiment electronic component energy shock measuring system of the present invention at first differentiates whether carry out destructive single-point energy shock-testing step.If when select carrying out destructive single-point energy shock-testing, carry out test parameter and set step, it comprises: but 1 program card initial setting, 2, destructive single-point energy shock-testing parameter setting, 3, set the attack time, 4, set cool time.Carry out then and be written into the test procedure step, test capacitors begins charge step; Negative tempperature coefficient thermistor to be measured is carried out transient energy to be impacted; Shock-resistant number of times counting step.After carrying out counting step, differentiate whether receive the collapse signal, if do not receive when collapsing signal, repeat always and be written into the test procedure step; If when receiving the collapse signal, carry out and finish the energy impact step, get back to energy shock measuring system.When if this system does not carry out destructive single-point energy shock-testing, change and carry out non-destructive multiple spot energy shock measuring, when selecting to carry out non-destructive multiple spot energy shock measuring, carry out test parameter and set step, it comprises: but 1 program card initial setting, 2, non-destructive multiple spot energy shock measuring parameter setting, 3, positioning correcting.Then carry out and be written into the test procedure step, differentiate and whether carry out the negative tempperature coefficient thermistor charging; If during charging, do not get back to energy shock measuring system.If during charging, negative tempperature coefficient thermistor enters the multi-point sampler district and carries out position and lock.Whether differentiate detecting phase at 90 degree, if phase place does not repeat differentiation when 90 spend always, until phase place till 90 degree; If when 90 spend, carrying out first group of switch arrays of startup, phase place carries out multiple spot energy shock measuring in proper order; Carry out to start second group of switch arrays and carry out the test capacitors discharge, the voltage that makes test capacitors is zero, and repeats differentiation always and whether carry out the negative tempperature coefficient thermistor charging, when charging not, gets back to energy shock measuring system.
Please refer to shown in Figure 2, but destructive single-spot testing structure comprises a master control computer, a program card, a test pedestal, a control circuit, an adjustable DC power supply, a collapse sensing circuit.
Please refer to shown in Figure 3ly, the control circuit of this destructiveness single-spot testing structure comprises a switch module, two switch driving circuits and two power circuits.This switch module system is made up of two thyristor SW1 and SW2, but it is to spend the ON/OFF switching time that program card drove and controlled this switch module by the master control computer expert, wherein whether this SW1 controls an adjustable power supply unit and test capacitors is charged, whether this SW2 then controls this test capacitors to negative tempperature coefficient thermistor abrupt release energy to be measured, and this capacitor charge time equals the cool time of this negative tempperature coefficient thermistor to be measured.
Please refer to shown in Figure 3ly, the collapse circuit of this destructiveness single-spot testing structure comprises a mercury vibration switch, two optical sensors and three signaling conversion circuits.After the successive shock-testing of being damaged property of negative tempperature coefficient thermistor to be measured, its crystalline texture is destroyed and cause blowing and produce vibrations and spark, detect vibrations and after OPTICAL SENSORS detects flame through the mercury vibration switch, but send digital signal to program card and master control computer by signaling conversion circuit, so that import negative tempperature coefficient thermistor collapse signal to be measured, this electronic component energy shock measuring system stopped shock-testing immediately and showed shock-resistant number of times this moment.The successive shock-testing mode of this destructiveness single-spot testing structure utilization shortens the test duration, and it has the effect that promotes the structural quality detection efficiency.
Referring again to shown in Figure 2, the adjustable DC power supply output variable voltage of destructive single-spot testing structure, it is decided according to the specification of negative tempperature coefficient thermistor to be measured.The general test condition be 220V/60Hz input voltage (Vr) in the position of its crest voltage (Vp), when switch moment starts, produce the maximum impact electric current.Therefore the output voltage of adjustable DC power supply is set at Vp.Rs is a current-limiting resistance, and it prevents that test capacitors from causing its body temperature too high because of trickle charge energy storage action, or surpasses its maximum permissible temperature.Test capacitors is selected testing capacitor value C according to the specification of negative tempperature coefficient thermistor to be measured, and the stored energy of this capacitor is the energy that is born negative tempperature coefficient thermistor to be measured moment, this ENERGY E=1/2*C*Vp
2Joule.Rc is the mimic channel initial resistance, selects to set according to different test conditions, therefore adjusts the output valve that Rc changes the maximum impact electric current, and the general circuit initial resistance is 1.1Q.This electronic component energy shock measuring system output maximum instantaneous dash current is Vp/ (a Rc+ negative tempperature coefficient thermistor value to be measured).This negative tempperature coefficient thermistor transient absorption dash current to be measured, therefore its resistance value moment reduces to extremely low, be subjected under the bump, its resistance value levels off to zero, so this system's output maximum instantaneous dash current is Vp/Rc, because this Vp and Rc are all definite value, so its maximum instantaneous dash current also is a definite value.
Referring again to shown in Figure 2, but the borrower is controlled the test procedure control of computer and program card, can simulate continuous and stable maximum impact electric current negative tempperature coefficient thermistor is done continuous damaging impact test till its collapse, it can efficiently reach the anti-quality towards ability and structural quality that accurately measures negative tempperature coefficient thermistor.
Please refer to shown in Figure 5, non-destructive multi-point sampler structure comprises several testing circuit groups, this testing circuit group comprises a bridge rectifier, a test pedestal, two switches, a testing capacitor, a discharge resistance, a phase detecting circuit and a location sensing circuit, and this testing circuit group inside comprises OPTICAL SENSORS and signaling conversion circuit.Two switches of these several testing circuit groups are formed two switch arrays groups.Under the nondestructive testing pattern, but cross programmed control card control two switch arrays groups with the master control computer expert fully, whether the control of the first switch arrays group carries out energy impact to negative tempperature coefficient thermistor to be measured, whether second switch array group control testing capacitor discharges, the capacitance of this testing capacitor is selected according to the specification of this negative tempperature coefficient thermistor to be measured to set, efficient and the accurate maximum impact energy that when the maximum peak voltage of AC power, produces of this non-destructive multi-point sampler structure, and with robotization in proper order control mode negative tempperature coefficient thermistor to be measured is carried out anti-energy shock measuring.
Referring again to shown in Figure 1, if when carrying out non-destructive multiple spot energy shock measuring, in case the structural collapse of negative tempperature coefficient thermistor takes place, utilize this moment OPTICAL SENSORS and signaling conversion circuit output collapse aspect to show and collapsed negative tempperature coefficient thermistor, it is same as the execution output collapse aspect of destructive single-point energy shock-testing, incorporates into reference to giving unnecessary details in this.
When selecting non-destructive multi-point sampler structure, this electronic component energy shock measuring system automatically from destructive single-point energy shock-testing mode switch to non-destructive multiple spot energy shock measuring pattern.This multiple spot energy shock measuring pattern is carried out primary energy to every negative tempperature coefficient thermistor to be measured automatically and is impacted, its objective is in order to inspect this negative tempperature coefficient thermistor whether to bear the transient energy impact, its full-automation has the effect of saving human cost and promoting detection efficiency.Therefore, this non-destructive multi-point sampler structure is applicable to the comprehensive Quality Detection of anti-energy impact of large batch of negative tempperature coefficient thermistor.
Though the present invention discloses as above with preferred embodiment; right its is not that any personage who knows this technology is in without departing from the spirit or scope of the invention in order to qualification the present invention; change and retouching when doing, so protection scope of the present invention is when being as the criterion with claims.
Claims (17)
1, a kind of electronic component energy shock measuring system, it is characterized in that: this test macro comprises: a pair of element under test simulate continuous transient energy shock-testing till its structural collapse so that test the destructive electronic components test pattern of this element under test structural quality; A pair of element under test is simulated a transient energy shock-testing so that test the anti-non-destructive electronic components test pattern towards ability of this element under test energy; One in order to control the program control structure of this destructiveness electronic components test pattern and non-destructive electronic components test pattern.
2, electronic component energy shock measuring system as claimed in claim 1 is characterized in that: but wherein this program control structure comprise may command should destructiveness electronic components test pattern and a master control computer and a program card of non-destructive electronic components test pattern.
3, electronic component energy shock measuring system as claimed in claim 1 is characterized in that: wherein comprise the structural collapse of a collapse sensing circuit for sensing element to be tested in addition.
4, electronic component energy shock measuring system as claimed in claim 3 is characterized in that: wherein this collapse sensing circuit comprises a mercury vibration switch, an OPTICAL SENSORS and a signaling conversion circuit at least.
5, electronic component energy shock measuring system as claimed in claim 1 is characterized in that: wherein should the destructive single-spot testing structure of destructiveness electronic components test type genus.
6, electronic component energy shock measuring system as claimed in claim 5 is characterized in that: but wherein should destructiveness single-spot testing structure comprise a master control computer, a program card, a test pedestal, a control circuit, an adjustable DC power supply, a collapse sensing circuit.
7, electronic component energy shock measuring system as claimed in claim 6 is characterized in that: wherein this control circuit comprises a switch module, two switch driving circuits and two power circuits.
8, electronic component energy shock measuring system as claimed in claim 7 is characterized in that: wherein this switch module is made up of two thyristors.
9, electronic component energy shock measuring system as claimed in claim 1 is characterized in that: this non-destructive electronic components test type genus non-destructive multi-point sampler structure wherein.
10, electronic component energy shock measuring system as claimed in claim 9, it is characterized in that: wherein this non-destructive multi-point sampler structure comprises several testing circuit groups, and this testing circuit group comprises a bridge rectifier, a test pedestal, two switches, a testing capacitor, a discharge resistance, a phase detecting circuit and a location sensing circuit.
11, electronic component energy shock measuring system as claimed in claim 10 is characterized in that: wherein this testing circuit group comprises OPTICAL SENSORS and signaling conversion circuit in addition.
12, a kind of electronic component energy shock measuring method is characterized in that: wherein this method of testing comprises the testing procedure whether differentiation carries out destructive single-point energy impact.
13, electronic component energy shock measuring method as claimed in claim 12, it is characterized in that: wherein if when select carrying out destructive energy shock measuring, then carry out test parameter and set step, be written into the test procedure step, test capacitors begins charge step, element under test is carried out transient energy impact shock-resistant number of times counting step; After carrying out counting step, carry out to differentiate whether receive the collapse signal; If when not receiving the collapse signal, repeat and be written into the test procedure step always; If when receiving the collapse signal, carry out and finish the energy impact step, get back to energy shock measuring system.
14, electronic component energy shock measuring method as claimed in claim 13 is characterized in that: but wherein this test parameter setting step comprises program card initial setting, destructive single-point energy shock-testing parameter setting, sets the attack time and sets cool time.
15, electronic component energy shock measuring method as claimed in claim 12, it is characterized in that: wherein when selecting to carry out non-destructive multiple spot energy shock measuring, then carrying out test parameter sets step, is written into non-destructive multiple spot energy shock measuring program step, differentiate and whether carry out the negative tempperature coefficient thermistor charging, if not during charging, get back to energy shock measuring system, during as if charging, element to be tested enters the test section and carries out position and lock; Whether differentiate detecting phase at 90 degree, if phase place not when 90 spend, repeat always differentiation until phase place till 90 degree, if phase place when 90 spend, is carried out and started first group of switch arrays and carry out multiple spot energy shock measuring in proper order; Carry out to start second group of switch arrays and carry out the test capacitors discharge, the voltage that makes test capacitors is zero, and repeats differentiation always and whether carry out the negative tempperature coefficient thermistor charging, when charging not, gets back to energy shock measuring system.
16, electronic component energy shock measuring method as claimed in claim 15 is characterized in that: but wherein this test parameter setting step comprises program card initial setting, non-destructive multiple spot energy shock measuring parameter setting, reaches positioning correcting.
17, electronic component energy shock measuring method as claimed in claim 12 is characterized in that: wherein should destructiveness electronic components test pattern and non-destructive electronic components test pattern be applicable to negative tempperature coefficient thermistor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01116199 CN1388381A (en) | 2001-05-30 | 2001-05-30 | Energy shock measuring system and method for electronic elements |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01116199 CN1388381A (en) | 2001-05-30 | 2001-05-30 | Energy shock measuring system and method for electronic elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1388381A true CN1388381A (en) | 2003-01-01 |
Family
ID=4662442
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 01116199 Pending CN1388381A (en) | 2001-05-30 | 2001-05-30 | Energy shock measuring system and method for electronic elements |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1388381A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103326393A (en) * | 2012-03-22 | 2013-09-25 | 张家港智电柔性输配电技术研究所有限公司 | Redundant power supply of H-bridge cascading converter |
| CN103559113A (en) * | 2013-11-06 | 2014-02-05 | 北京安兔兔科技有限公司 | System operation performance testing method and device |
| CN103823131A (en) * | 2012-11-19 | 2014-05-28 | 浙江海得新能源有限公司 | Simulation circuit and test method for resistor impact endurance test |
-
2001
- 2001-05-30 CN CN 01116199 patent/CN1388381A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103326393A (en) * | 2012-03-22 | 2013-09-25 | 张家港智电柔性输配电技术研究所有限公司 | Redundant power supply of H-bridge cascading converter |
| CN103326393B (en) * | 2012-03-22 | 2016-03-30 | 张家港智电柔性输配电技术研究所有限公司 | A kind of redundant power supply power supply of H bridge cascade converter |
| CN103823131A (en) * | 2012-11-19 | 2014-05-28 | 浙江海得新能源有限公司 | Simulation circuit and test method for resistor impact endurance test |
| CN103559113A (en) * | 2013-11-06 | 2014-02-05 | 北京安兔兔科技有限公司 | System operation performance testing method and device |
| CN103559113B (en) * | 2013-11-06 | 2015-07-15 | 北京安兔兔科技有限公司 | System operation performance testing method and device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5687484B2 (en) | Insulation state detection unit flying capacitor fault detection device | |
| EP1046923B1 (en) | Apparatus for inspecting electric component for inverter circuit | |
| JPS6078359A (en) | Static leonard device | |
| CN101918852A (en) | Method for monitoring the condition of the capacitors of a DC-voltage intermediate circuit | |
| CN208125878U (en) | A kind of dipulse test platform | |
| JP3108455B2 (en) | How to measure breakdown voltage | |
| US8073644B2 (en) | Automatic voltage-identifying power supply device and method thereof | |
| CN1388381A (en) | Energy shock measuring system and method for electronic elements | |
| JPH0943302A (en) | Insulation test method and its device | |
| JP3703410B2 (en) | Solar simulation method for solar cell measurement and solar simulator using this method | |
| JP3259370B2 (en) | Capacitor insulation resistance measuring device | |
| JP2529086B2 (en) | Pressure test equipment | |
| CN207440201U (en) | A kind of condenser leakage current multichannel independent test system | |
| JPH07298503A (en) | Go/no-go decision device for battery of uninterruptible power supply | |
| CN113376441B (en) | System and method for measuring parasitic inductance parameters of thin film capacitor | |
| CN112378995B (en) | Electric spark generating device, energy testing device and electric spark generating system | |
| CN211043547U (en) | Reliability life test device for rail transit vehicle power capacitor | |
| JPH02103479A (en) | Method for testing withstand voltage against electrostatic discharge | |
| US9121876B2 (en) | Generated power output measuring apparatus | |
| JP3563723B2 (en) | Test load device for glow discharge load | |
| CN2370547Y (en) | High-temperature aging table for capacitor | |
| JP2007292686A (en) | Resistance measuring device and method | |
| Fazakas et al. | Polarity Determination of Electrolytic Capacitors in Power Supplies from external terminals | |
| JP3643062B2 (en) | Power supply for electric dust collection | |
| JP3281164B2 (en) | Foot Lift Detection Method Using IC In-Circuit Tester |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |