CN1265621C - Defect pixel correction of solid state image sensor and information forming method and imaging device - Google Patents
Defect pixel correction of solid state image sensor and information forming method and imaging device Download PDFInfo
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Abstract
In a solid-state image sensor in which a large number of pixel cells each comprised of a combination of a main photosensitive pixel having a relatively large area and a subsidiary photosensitive pixel having a relatively small area are arranged, if the subsidiary photosensitive pixel has a defect for any pixel cell, division photometry data during AE processing is read, and the defective pixel is replaced with a value obtained by dividing the output value of the main photosensitive pixel at the same position by a sensitivity ratio only for a section for which it is determined that the main photosensitive pixel is not saturated. Thus, the pixel value of a defective pixel can be accurately corrected without causing a reduction in resolution sensitivity compared to a conventional method of correcting a defective pixel using surrounding pixel information.
Description
Technical field
The present invention relates to a kind of method and imaging device that is used for proofreading and correct the solid state image sensor defect pixel, more particularly, relate to a kind of technology that is applied to the electronic image recording equipment of digital camera for example or film camera, this is a kind of signal processing technology that is created in the defective (shortcoming) in the photosensitive pixel in the production of solid state image sensor that is used for proofreading and correct.The invention still further relates to a kind of digital camera that comprises image device, this image device has two types light receiving element of light-receiving photosensitivity different for each pixel and light receiving signal saturation level, and a kind of being used in the method that is installed in the image device generation Pixel Information on the digital camera.
Background technology
Be used in the solid state image sensor in the series products of digital camera, for example charge-coupled device (CCD) is compared with the photographic silver halide of routine and is had very little dynamic range, therefore compare with photographic silver halide, even as if the captured image of correct exposure also may some be unsatisfactory.In addition, the loss and the overfocus high light of so-called shadow detail may take place, cause depending on the image quality serious degradation of image-forming condition.In order to eliminate these unfavorable factors, a kind of method is proposed, this method can be by obtaining great amount of images that Same Scene is exposed in various degree and cooperating the great amount of images data that calculate to obtain to have image than great dynamic range.
Japanese Unexamined Patent Publication No is that the document of No.9-205589 discloses a kind of CCD solid-state imaging apparatus, this equipment is divided into a unit cell two types optical receiving region (ISO zone and low speed zone), and respectively in conjunction with or the additional signal of reading from two optical receiving regions, thereby obtain the increase of dynamic range, two types optical receiving region has different photosensitivity for a large amount of light receiving part (unit cell) that is arranged on two-dimensionally on the optical receiving surface.
The solid state image sensor of CCD and so on is to obtain by form a large amount of for example photo-sensitive cells of photodiode on Semiconductor substrate, but in the production of imageing sensor, owing to enter impurity in the Semiconductor substrate etc., may at the bottom of the local loop, produce the defect pixel that to catch pixel value.
For the imageing sensor with such defect pixel, Japanese Unexamined Patent Publication No is that the document of No.7-143403 discloses the technology that a kind of basis is come the pixel value of correct defective pixels from the composite signal of contiguous defect pixel a large amount of pixels on every side.
Use the image device of CCD and so on to have the optical receiving region that forms to millions of very little light receiving elements by integrated hundreds of thousands, so production does not for example have, and the image device of the defective light receiving element of defect pixel is inconvenient.Thereby, carry out treatment for correcting so that know existence for the defective of each pixel (defective data) in the image device/do not exist in advance, whether defective tables of data is stored in the nonvolatile memory of the digital camera that is equipped with corresponding image device to write down each pixel, and when handling picture signal, digital camera replaces the signal (for example being the document of No.1-29475 referring to Japanese patent application publication No.) of each defect pixel with reference to the tables of data that is stored in the nonvolatile memory with the signal of contiguous normal pixel.
In a kind of correction solid state image sensor that uses as routine operation in the method for defective, carry out to proofread and correct and be judged as defective so that will in production process, show the photosensitive pixel of the irregular status that is equal to or greater than institute's qualification level, if and the number of defective is equal to or less than the number that is limited, usually use Pixel Information on every side to replace the signal of from the photosensitive pixel that is judged as defective, exporting, or usually export the mean value of several surrounding pixels.
Bearing calibration according to this routine, if considerable photosensitive pixel is judged as defective, and proofread and correct from the signal of these defective outputs with the value of surrounding pixel, before picture signal was handled, the view data that is produced was as being filtered by the suprabasil low pass filter in part (LPF) so.
Wide dynamic range of two types light receiving element of different light-receiving photosensitivity and light receiving signal saturation level of image device with to(for) each pixel has the light receiving element that has increased number in fact.In this case, if the data table stores that is produced for the mixing output of the stored charge of the light receiving element under each low-light level (standard signal) situation, the stored charge of light receiving element under high brightness (high-brightness signal) situation and standard signal and high-brightness signal is in nonvolatile memory, nonvolatile memory need have big memory capacity so, and makes treatment for correcting complicated.
Summary of the invention
Consider that these situations make the present invention, an object of the present invention is to provide a kind of method that is used for correct defective pixels and a kind of can not causing resolves that photosensitivity descends and the imaging device of the pixel value of correct defective pixels accurately, another purpose of the present invention provides a kind of digital camera, this digital camera has the function of effective correcting imaging device and uses a spot of information with respect to the light receiving element number, such image device has two types light receiving element for different light-receiving photosensitivity of each pixel and light receiving signal saturation level, and a kind of method that produces Pixel Information in the digital camera that is used in.
In order to achieve the above object, the present invention is directed to a kind of method that is used for proofreading and correct the solid state image sensor defect pixel, the structure that has a plurality of pixel cells of arranging according to predetermined set in this solid state image sensor, each pixel cell is combined by main photosensitive pixel with relatively large area and relative auxiliary photosensitive pixel than small size, and extract selectively by according to the signal of the signal charge of main photosensitive pixel opto-electronic conversion with according to signal by the signal charge of auxiliary photosensitive pixel opto-electronic conversion, described method comprises the steps: if for any unit of solid state image sensor, the main photosensitive pixel that constitutes pixel cell is a normal pixel, and auxiliary photosensitive pixel is a defect pixel, judges so whether the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell pixel cell on every side that contains the auxiliary photosensitive pixel of defectiveness is lower than the predetermined level of saturation of the saturated output of indication; And if the level of the signal of obtaining the main photosensitive pixel of the pixel cell around be present in the pixel cell that contains the auxiliary photosensitive pixel of defectiveness is lower than saturation level, so according to the pixel value of the auxiliary photosensitive pixel of pixel value defect correcting of the main photosensitive pixel in the pixel cell of the value that is equal to the defective photosensitive pixel.
According to the present invention, can obtain the information of homophase on the optics for main photosensitive pixel and auxiliary photosensitive pixel, and main photosensitive pixel in same pixel cell and auxiliary photosensitive pixel are under the prerequisite of same position almost, can operate main photosensitive pixel and auxiliary photosensitive pixel.If auxiliary photosensitive pixel is defective in a pixel cell, and can not from auxiliary photosensitive pixel, extract normal signal, use the pixel value of the auxiliary photosensitive pixel of output valve (pixel value) defect correcting of the normal main photosensitive pixel in the pixel cell so.Yet,, so only carry out this correction if the level of the signal of obtaining is lower than saturation level from the main photosensitive pixel (normal pixel) that is present in defect pixel pixel cell on every side.
If the level of the signal of obtaining from the main photosensitive pixel that is present in defect pixel pixel cell on every side equals saturation level, promptly the pixel value for main photosensitive pixel is saturated high-brightness region, so preferably carry out conventional (low-pass filtering type) and proofread and correct, this is that to proofread and correct the defective of auxiliary photosensitive pixel be inappropriate because be used in the pixel value of the main photosensitive pixel in the same pixel cell.
On the contrary, if the level of the signal of obtaining from the main photosensitive pixel that is present in defect pixel pixel cell on every side is lower than saturation level, the dynamic range that does not promptly exceed main photosensitive pixel, the pixel value that is used in a main photosensitive pixel in the pixel cell is so proofreaied and correct the defective of assisting photosensitive pixel, this is because there is the relation of determining (for example, proportionality) between incident light total amount and the pixel value.Therefore, proofread and correct to compare with routine and reduced the low-pass filtering influence, and after correction, can obtain the parsing photosensitivity.
According to a scheme of the present invention, the pixel value of the main photosensitive pixel of the pixel value by being equal to the auxiliary photosensitive pixel of defective removes the ratio of the photosensitivity of main photosensitive pixel to the photosensitivity of auxiliary photosensitive pixel, judges the pixel value of the auxiliary photosensitive pixel of defective.
According to another aspect of the present invention, any pixel cell for solid state image sensor, if constituting the main photosensitive pixel of pixel cell is defect pixel, so according to the pixel value of the pixel value defect correcting master photosensitive pixel of the main photosensitive pixel that is present in the pixel cell around the pixel cell that contains defectiveness master photosensitive pixel.
In another scheme, carry out the routine of the defective that is used for main photosensitive pixel without restriction and proofread and correct, carry out the above-mentioned correction of the pixel value that uses the main photosensitive pixel in same pixel cell simultaneously for the defective of auxiliary photosensitive pixel.
Another scheme of the present invention is characterised in that, any pixel cell for solid state image sensor, if constituting the main photosensitive pixel of pixel cell is defect pixel, and auxiliary photosensitive pixel is a normal pixel, so according to the pixel value of the pixel value defect correcting master photosensitive pixel of the auxiliary photosensitive pixel in the pixel cell of pixel value that is equal to defective master photosensitive pixel, if the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell around the pixel cell that contains defectiveness master photosensitive pixel exceeds preassigned.
If use the pixel value of the auxiliary photosensitive pixel in same pixel cell to proofread and correct the defective of main photosensitive pixel constantly at each, because big gain may make S/N worsen, so preferred the execution is used for because gamma (gamma) conversion etc. can also make the routine of the low brightness area of S/N deterioration proofread and correct.Wherein, whether what be defined in advance that judgement can make that S/N worsens is a determined value of low-light level part, and if exceed determined value, the pixel value of defective master photosensitive pixel uses the pixel value of the auxiliary photosensitive pixel in same pixel cell so.
In another scheme, when proofreading and correct the defective of main photosensitive pixel, the photosensitivity of pixel main photosensitive pixel on duty that is equal to the auxiliary photosensitive pixel in the pixel cell of pixel value of defective master photosensitive pixel is to the calculating of the ratio of the photosensitivity of auxiliary photosensitive pixel, thereby judges the pixel value of defective master photosensitive pixel.
In order to achieve the above object, the present invention also provides a kind of imaging device, comprise: solid state image sensor with a plurality of pixel cell structures that are provided with according to the predetermined arrangement form, each pixel cell is constituted by main photosensitive pixel with relatively large area and relative auxiliary photosensitive pixel than small size, and extracts selectively by according to the signal of the signal charge of main photosensitive pixel opto-electronic conversion with according to the signal by the signal charge of auxiliary photosensitive pixel opto-electronic conversion; Judge device, if any pixel cell for solid state image sensor, the main photosensitive pixel that constitutes pixel cell is that normal pixel and auxiliary photosensitive pixel are defect pixels, judges so whether the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell pixel cell on every side that contains the auxiliary photosensitive pixel of defectiveness is lower than the predetermined level of saturation of the saturated output of indication; And defect pixel correction device, if with judging that device judges that the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell around the pixel cell that contains defect pixel is lower than saturation level, so according to the pixel value of the auxiliary photosensitive pixel of pixel value defect correcting of the main photosensitive pixel in the pixel cell of the pixel value that is equal to the auxiliary photosensitive pixel of defective.
Preferably, for main photosensitive pixel in same pixel cell and auxiliary photosensitive pixel the colour filter of same colour cell is set, and a small camera lens is provided above each pixel cell, for a pixel cell.
In order to achieve the above object, the present invention also provides a kind of digital camera that comprises image device, this image device has for different light-receiving photosensitivity of each pixel and two types light receiving element of light receiving signal saturation level, digital camera comprises: memory, and storage is used for being limited to the Pixel Information of at least one light receiving element tool defective pixels as defect pixel; And correction processing circuit, according to the output signal of Pixel Information correct defective pixels.
Digital camera is proofreaied and correct the output signal of defectiveness pixel according to being used for being limited at least one light receiving element tool defective pixels as the Pixel Information of defect pixel, carries out correction thereby might use with respect to the number of light receiving element effectively than a small amount of information.
The present invention also provides a kind of method that is used for producing at image device Pixel Information, image device has the imaging region that is made of a plurality of pixels and has for different light-receiving photosensitivity of each pixel and first and second light receiving elements of light receiving signal saturation level, and described method comprises the steps: to read for the output signal of first light receiving element of each pixel so that produce whether defective information of indication pixel; Read for the output signal of second light receiving element of each pixel so that produce whether defective information of indication pixel; And calculate the logic of a plurality of information in above-mentioned steps, produce and and produce to be used to limit and have the pixel that equals 1 result of calculation Pixel Information as defect pixel.
According to the present invention, can correctly produce and be used for being limited to the Pixel Information of at least one light receiving element tool defective pixels as defect pixel.
The present invention also provides a kind of method that is used for producing at image device Pixel Information, image device has the imaging region that is made of a plurality of pixels, each pixel has different light-receiving photosensitivity and first and second light receiving elements of light receiving signal saturation level, and described method comprises the steps: at every turn to read the output signal of the output signal of first light receiving element and second light receiving element so that produce whether defective information of indication pixel for each pixel; Read for the output signal of first light receiving element of each pixel so that produce whether defective information of indication pixel; Read for the output signal of second light receiving element of each pixel so that produce whether defective information of indication pixel; And calculate the logic of a plurality of information in above-mentioned steps, produce and and produce to be used to limit and have the pixel that equals 1 result of calculation Pixel Information as defect pixel.
According to the present invention, can correctly and apace produce and be used for being limited to the Pixel Information of at least one light receiving element tool defective pixels as defect pixel.
Description of drawings
Characteristic of the present invention and other target and beneficial effect are described below with reference to the accompanying drawings, in institute's drawings attached, indicate identical or similar part with identical reference character.Therein:
Fig. 1 is the structured flowchart as the electronic camera of one embodiment of the invention;
Fig. 2 is the plane graph of structure of the optical receiving surface of CCD shown in Figure 1;
Fig. 3 is the sectional view along the line 3-3 intercepting of Fig. 2;
Fig. 4 is the sectional view along the line 4-4 intercepting of Fig. 2;
Fig. 5 is the integrally-built schematic plan view of CCD shown in Figure 1;
Fig. 6 is the diagrammatic sketch of the light transfer characteristic of main photosensitive pixel and auxiliary photosensitive pixel;
Fig. 7 is the detailed block diagram of signal processing unit shown in Figure 1;
Fig. 8 is the flow chart of the defect correction handling procedure of embodiment magazine first control example of the present invention;
Fig. 9 is the flow chart of the defect correction handling procedure of the embodiment magazine second control example of the present invention;
Figure 10 is the flow chart of the defect correction handling procedure of embodiment magazine the 3rd control example of the present invention;
Figure 11 has provided the plane graph of another example of CCD structure;
Figure 12 is the sectional view along the line 12-12 intercepting of Figure 11;
Figure 13 has provided the plane graph of another example of CCD structure;
Figure 14 has shown the total amount of incident light in the conventional imaging device and the relation between the output signal (photosensitivity curve);
Figure 15 is the principle key-drawing that has the image device of main pixel and auxiliary pixel on each pixel;
Figure 16 is the flow chart of a program that is used to produce Pixel Information as the embodiment of the invention;
Figure 17 is the flow chart of another program that is used to produce Pixel Information as the embodiment of the invention;
Figure 18 is the flow chart of another program that is used to produce Pixel Information as the embodiment of the invention;
Figure 19 is the flow chart of another program that is used to produce Pixel Information as the embodiment of the invention; And
Figure 20 is the block diagram as an example of the digital camera structure of the embodiment of the invention.
Embodiment
To explain the preferred embodiments of the present invention with reference to the accompanying drawings.
Fig. 1 is the structured flowchart as the electronic camera of one embodiment of the invention.Camera 10 is digital cameras, it can convert the optical imagery of the object taken to DID by CCD solid state image sensor (hereinafter referred CCD) 135, and, the method that is used for proofreading and correct the defectiveness image as the embodiment of the invention a kind of also is applied to the part signal processing apparatus, and this signal processor is handled the figure signal of obtaining from CCD13.
Usually by being installed in all operations of CPU (CPU) the 16 control cameras 10 in the camera 10.CPU16 is the control device according to pre-set programs control principal phase machine system, and as the computing equipment of carrying out various types of calculating, the calculating that for example automatic exposure (AE) is calculated, automatic focusing (AF) calculates, defect pixel correction is calculated and be used for to Automatic white balance (AWB).
CPU16 is connected on the memory of read-only memory (ROM) 20 and for example random-access memory (ram) 22 by bus 18.The program of carrying out by CPU16, be used for controlling required various types of data etc. and all be stored in ROM20.Zone that the program that is used as memory 22 expands and the evaluation work zone of CPU 16, and with acting on the temporary transient zone of storing of view data.
Electric erazable programmable random access memory (EEPROM) 24 is connected on the CPU16.EEPROM24 is a nonvolatile semiconductor memory member, deposit the information of the defect pixel of CCD13, the specific information that is used for the required data of AE, AF, AWB or the like control or sets therein by the user, and can rewrite necessary data, even when powered-down, also can keep the content of information.CPU16 carries out necessary calculating etc. at EEPROM24.
The operating unit 30 of importing various command for the user is provided for camera 10.Operating unit 30 comprises various operating units, for example shutter release button, ZSW and mode conversion switch.Shutter release button is to be used for the operated device of input instruction to begin to take a picture, and is to comprise that the two-stage with S1 switch and S2 switch launch as surprise attack the type switch, opens the S1 switch when partly pressing button, opens the S2 switch when the total head button.Along with S1 opens, carry out AE processing and AF and handle, along with S2 opens, carry out the exposure that is used to store.ZSW is the operated device that changes over picture scaling factor and play the scaling factor.Mode conversion switch is to be used for the operated device that switches between imaging pattern and the play mode.
In addition, except that above-described device, operating unit 30 also comprises according to the imaging purpose sets optimal operation mode (continuous exposure pattern, the automated imaging pattern, manual imaging pattern, image mode, landscape patterns, the night vision pattern, or the like) imaging pattern set device, and operated device, for example, the menu button that is used for display menu screen on LCD (display device) 32, be used for selecting the cross button of desired project from menu screen, be used to provide order to limit item selected or to carry out the OK button of handling, and be used for input command to delete for example item selected, interior perhaps the making of cancellation indication returned recently the cancel button of mode of operation the preceding.
In addition, operating unit 30 not only comprises for example structure of pause switch element, rotator element and lever switch, but also comprises by selecting the determined configuration of user interface of desired project from menu screen.
Signal from operating unit 30 is input to CPU16.The CPU16 basis is controlled each circuit of camera 10 from the input signal of operating unit, and carries out the demonstration control of for example lens driving control, imaging operation control, image processing control, image data storage/Play Control, LCD 32.
LCD 32 can be used as electronic viewfinder, the visual angle when being used to check photographic images.LCD 32 also as the display screen of user interface, shows necessary information in the above, for example menu information, option and setting content.In addition, dissimilar display devices, for example organic EL (electroluminescence) can also be used to replace LCD.
The imaging function of camera 10 is described now.
Camera 10 comprises optical system unit 34 and CCD13.The imageing sensor of different system, for example MOS type solid state imaging system can be used for replaced C CD13.Optical system unit 34 comprises taking lens (not shown), aperture and mechanical shutter member.Taking lens is made of the autozoom camera lens, although and not demonstrating detailed optical texture in the accompanying drawings, taking lens mainly comprises influences the focal length lens that scaling factor changes scaling factor variable lens group, the corrective lens group of (focal length is variable) behavior and helps focal length to adjust.
When the ZSW of user's operating operation unit 30, according to switching manipulation from CPU16 optic system for outputting control signal to motor drive circuit 36.According to the control signal from CPU16, motor drive circuit 36 produces the signal that is used to drive camera lens, and signal is offered zoom motor (not shown).Like this, order about the zoom motor with motor driven voltage from motor drive circuit 36 outputs, and scaling factor variable lens group and corrective lens group in the taking lens are moved to and fro along optical axis, thereby change the focal distance (optical zoom scaling factor) of taking lens.
The light that passes optical system unit 34 enters the optical receiving surface of CCD13.On the optical receiving surface of CCD13, a large amount of optical sensor (light receiving element) is set, and the colour filter of the primary colors of redness (R), green (G) and blue (B) is set with the predetermined arrangement structure corresponding to each optical sensor with plane form.
With each optical sensor the subject image that forms on the optical receiving surface of CCD13 is converted to signal charge total amount corresponding to the incident light total amount.CCD13 has the electric function of controlling the control electric charge accumulating time (shutter speed) of each optical sensor according to the timing of shutter pulse.
According to the pulse of supplying with from CCD driver 40, read the signal charge that accumulates in each optical sensor of CCD13 continuously, as the voltage signal (picture signal) corresponding to signal charge, and a picture signal from CCD 13 outputs sends analog processing unit 42 to.Analog processing unit 42 is the processing units that comprise correlated-double-sampling (CDS) circuit and gain adjustment circuit, and in this analog processing unit 42, carry out sampling processing and color separation is become the processing of the colour signal of R, G and B and the signal level of adjusting each colour signal.
With A/D converter 44 picture signal from analog processing unit 42 outputs is converted to digital signal, be stored in the memory 22 by digital signal processing unit 46 then.Timing generator (TG) 48 offers CCD driver 40, analog processing unit 42 and A/D converter 44 to timing signal according to the order of CPU16, and makes circuit synchronous with timing signal.
Signal processing unit 46 also is used as the digital signal processing module of the remote controller of reading/writing of control storage 22.Signal processing unit 46 is image processing devices, comprise the defect pixel correction unit, carry out automatic computing unit that AE/AF/AWB handles, white balance circuit, gamma (gamma) change-over circuit, synchronous circuit (be used to proofread and correct the spatial displacement of the colour signal that the filter arrangement by single dull and stereotyped CCD produces, to calculate the color of each point), brightness/color difference xor signal generation circuit, contour correction circuit and contrast correction circuit, and according to command process picture signal from the CPU 16 that uses memory 22.
By bus 18 data (CCDRAM data) that are stored in the memory 22 are sent to signal processing unit 46.Make the view data that is input to signal processing unit 46 be subjected to for example white balance adjustment processing, gamma (gamma) conversion process and the predetermined process that is used to convert to luminance signal (Y-signal) and color difference xor signal (Cr, Cb signal) (YC processing), be stored in then in the memory 22.
If the image of taking is display output, from memory 22, reads view data so, and be sent to display circuit 50.The view data that is sent to display circuit 50 is converted to the signal (for example, the color composite image signal of NTSC pattern) of the preassigned pattern that is used to show, output to LCD 32 then.With from the picture signal of the CCD13 output view data the rewrite memory 22 termly, and a picture signal that produces from view data is provided to LCD 32, thereby the image of taking (coherent image) is presented in real time on the LCD 32.The user is by being presented at the angle (synthesizing) of image (so-called coherent image) the energy field of view on the LCD 32.
When the user determines the angle in the visual field and presses shutter release button, CPU16 detects these then, and partly handling of response shutter release button (S1=ON), and respond being used for the CCD exposure of photographic images and reading control by startup entirely of shutter release button (S2=ON) by carrying out AE processing and AF.
In other words, CPU16 carries out various types of calculating, for example focal length is estimated to calculate and the AE from shot image data of response S1=ON calculates, transmit a control signal to motor driven circuit 36 according to result calculated, and control AF motor (not shown) with the focal length lens of moving optical system unit 34 to focal position.
The AE computing unit comprises and is used for a screen of the image of taking is divided into a plurality of zones (for example 16 * 16) and the integrated circuit that is used for the rgb signal in each zone of cutting apart, and integrated value is offered CPU16.Can measure the value of the lump of the colour signal that is used for each RGB, maybe can measure and be used for only one of these signal (for example, G signal) by the value of lump.
CPU16 carries out weighted sum according to the value of the lump that obtains from the AE computing unit, the brightness of inspected object (main body brightness), and calculate the exposure value (imaging EV value) that is suitable for imaging.
In order correctly to carry out photometry beyond the wide dynamic range, twice of the AE of camera 10 or repeatedly carry out photometry correctly to confirm the brightness of object.When beyond the scope of 5-17EV, carrying out photometry, can beyond the scope of 3EV, carry out the photometry that provides with a photometry, for example when changing conditions of exposure in four photometrys of maximum place execution.
Under certain conditions of exposure, carry out photometry, and monitor the integration value in each zone of cutting apart.If any saturated zone is present in the image, carries out photometry so and change conditions of exposure simultaneously.On the other hand,, so correctly carry out photometry, and therefore do not make the further change of conditions of exposure if unsaturated zone is present in the image.
Like this, twice or repeatedly carry out photometry carrying out photometry in addition at wide region (5-17EV), and judge best conditions of exposure.In addition, for the camera of each type, can set the scope that can be maybe should measure with a photometry as only scope.
CPU16 is according to above-mentioned AE result calculated control aperture and shutter speed, and response S2=ON obtains the image that is used to store.
What make response shutter release button (S2=ON) is subjected to YC processing and other prearranged signal processing in signal processing unit 46 as shown in Figure 1 by shot image data entirely, then, in compression/amplifying circuit 52, compress according to predetermined form (for example, jpeg format).The view data of compression is stored in the medium 14 by medium interface unit 54.Compressed format is not limited to jpeg format, can also use MPEG or other form.
For the device of storing image data, various types of media are for example used Smart Media
TM, Compact Flash
TMSemiconductor memory card, disk, CD and magneto optical disk Deng expression.The device of storing image data is not limited to removable medium, can also be the storage medium (internal storage) that is embedded in admittedly in the camera 10.
When selecting play mode, read out in the last image file of storing in the storage medium (Cun Chu file at last) with the mode selection switch of operating unit 30.Make the data of the image file of from medium 14, reading be subjected to processing and amplifying, and output to monitoring lcd device 32 by display circuit 50 by compression/amplifying circuit 52.
By play manipulate cross button at an information frame, information frame can transmit in mode forward or backwards in play mode.From medium 14, read the next information frame file of transmission, and the image of update displayed.
Fig. 2 is the plane graph of structure of the optical receiving surface of CCD13.Two light receiving units (pixel PIX) placed side by side have been shown among Fig. 2, but in fact, have sentenced level (vertically) direction in the pitch of stationary arrangement and placed a large amount of pixel PIX with vertical (laterally) direction.
Each pixel PIX comprises two photodiode areas 61 and 62 with different photosensitivity.First photodiode area 61 has big relatively area, and constitutes main sensitization part (hereinafter referred master's photosensitive pixel).Second photodiode area 62 has relatively little area, and constitutes auxiliary photosensitive region (hereinafter referred is assisted photosensitive pixel).Vertical passage (VCCD) 63 the right sides of transmitting at pixel PIX.
Structure shown in Fig. 2 is that the pixel of alveolate texture is arranged, and two upper and lower pixel PIX shown in the position placement figure that is replaced with the horizontal direction half pitch between relative to each other.Vertical transmission passage 63 hope that illustrate on the left side of the pixel PIX shown in Fig. 2 are used to read out electric charge and the transmission electric charge from the pixel (not shown), and this pixel setting is the upper and lower side of these pixels PIX not.
Shown in the dotted line among Fig. 2, the carry electrode 64,65,66,67 (referring to EL jointly) that need be used for four phase driven (φ 1, φ 2, φ 3, φ 4) is arranged on vertical transmission passage 63 tops.If constitute carry electrode with two-layer polysilicon, for example, apply first carry electrode 64 of the pulse voltage of φ 1, the third electrode 66 that applies the pulse voltage of φ 3 is to be made of the ground floor polysilicon layer, and applies second carry electrode 65 of pulse voltage of φ 2 and the 4th electrode 67 that applies the pulse voltage of φ 4 is to be made of second layer polysilicon layer.In addition, carry electrode 64 is also controlled reading of electric charge from auxiliary photosensitive pixel 62 to vertical transmission passage 63.Carry electrode 65 is also controlled the reading of electric charge of the main photosensitive pixel 61 from main photosensitive pixel 61 to vertical transmission passage 63.
Fig. 3 is the sectional view along the line 3-3 intercepting of Fig. 1, and Fig. 4 is the sectional view along the line 4-4 intercepting of Fig. 1.As shown in Figure 3, p type trap 71 is formed on the surface of n N-type semiconductor N substrate 70.Two n type districts 73 and 74 are formed on the surf zone of p type trap 71 to form photodiode.With the photodiode in the n type zone of reference number 73 marks corresponding to main photosensitive pixel 61, and with the photodiode in the n type zone of reference number 74 marks corresponding to auxiliary photosensitive pixel 62.P+ type zone 76 is that the raceway groove of pixel PI X stops the zone, and vertically transmitting passage 63 is with it that electricity is isolated.
As shown in Figure 4, constituting vertical n type zone 77 of transmitting passage 63 is set up near the n type zone 73 that constitutes photodiode.P type trap 71 between the n type zone 74 and 77 constitutes the reading transistor.
For example the insulating barrier of silica is formed on the surface of Semiconductor substrate, and is formed thereon by the carry electrode EL that polysilicon forms.Carry electrode EL is set like this so that cover directly over the vertical transmission passage 63.The insulating barrier of silica etc. also is formed on the carry electrode, and forms the covering for example element and the light blocking film 78 with the opening above photodiode of vertical carry electrode 63 thereon with materials such as tungsten.
Form the interlayer dielectric 79 that forms by materials such as silicate glasses by this way covering light blocking film 78, and make the surfacing of film.Color-filter layer 80 is formed on the interlayer dielectric 79.Color-filter layer 80 comprises three kinds or the multiple for example color layer of redness, green and blue region, and a kind of colored region of colour is distributed to each pixel PIX.
On colour filter, form the small camera lens 81 consistent with pixel PIX with erosion resistant or materials similar.A small camera lens 81 is formed on each pixel PIX, and has the function of the light of the opening top incident that gathering defines by light blocking film 78.
Incident light by small camera lens 81 is separated by color-filter layer 81 colours, and enters each photodiode of main photosensitive pixel 61 and auxiliary photosensitive pixel 62.The light that enters each photodiode converts the signal charge corresponding to the total amount of light to, and is read out vertical transmission passage 63 independently of one another.
Like this, two types of picture signals of different photosensitivity (ISO picture signal and low speed signal) can extract from a pixel PIX independently, and obtain the picture signal of homophase on the optics.
Fig. 5 shows pixel PIX and the vertical arrangement that transmits passage 63 in the optical receiving region of CCD13.Pixel PIX is set so that be used on the vertical and horizontal direction half pixel pitch (1/2 pitch) with alveolate texture with the central point of the geometry of landscape mode mobile unit.Just, the pixel PIX located adjacent one another of be in line (or embarking on journey) is to move unit cell arrangement with a line (or going) with respect to vertically (or the laterally) direction of unit cell arrangement in other line (or row) with 1/2 arrangement pitches almost.
The VCCD drive circuit 84 that applies pulse voltage road carry electrode EL is arranged on the right side of optical receiving region PS, and pixel PIX is set among the optical receiving region PS among Fig. 5.As mentioned above, each pixel PIX comprises main sensitization part (main pixel) and auxiliary sensitization part (auxiliary pixel).Close every row is provided with vertical transmission passage 63 with the form of zigzag.
The horizontal transmission passage (HCCD) 85 that transmits the signal charge that sends from vertical transmission passage 30 with the direction of level is arranged on the downside of optical receiving region PS (in vertical bottom of transmitting passage 63 one distolateral on).
Horizontal transmission passage 85 is made of the transmission CCD of two phase driven, and the final stage of horizontal transmission passage 85 is connected to output unit 86.Output unit 86 comprises output amplifier, surveys the signal charge of input and electric charge is outputed to lead-out terminal as signal voltage.Like this, the signal of opto-electronic conversion is output as point-like sequential signal row in pixel PIX.
Fig. 6 is the schematic diagram of the light transfer characteristic of main photosensitive pixel 61 and auxiliary photosensitive pixel 62.Transversal line shows the total amount of incident light, and the longitudinal axis shows the image data value (QL value) after the A/D conversion.In this example, 12 bit data are shown as an example, but are not limited to the number of the position at this place.
As shown in the figure, the light sensitivity ratio between main photosensitive pixel 61 and the auxiliary photosensitive pixel 62 is 1: 1/a (a＞1).The output of main photosensitive pixel 61 and the total amount of incident light are proportional to be increased gradually, and when the total amount of incident light is " c ", output value of reaching capacity (QL value=4095).After this, even the total amount of incident light just adds, the output of main photosensitive pixel 61 also keeps constant." c " is called the saturated light total amount of main photosensitive pixel 61.
On the other hand, the light sensitivity of auxiliary photosensitive pixel 62 is 1/a of the light sensitivity of main photosensitive pixel 61, and when the total amount of incident light be α * c (b＞1, during α=a/b), saturated at QL value=4095/b place.At this moment " α * c " is called the saturated light total amount of auxiliary photosensitive pixel 62.
Like this, by synthetic main photosensitive pixel and auxiliary photosensitive pixel with different light sensitivities, compare with the structure that only has main photosensitive pixel, the dynamic range of CCD13 can increase (in this example with about 4 factor) along with the factor of α.
The AE that carries out the S1=ON of shutter release button according to the signal of obtaining from main photosensitive pixel 61 handles and the AF processing.If select to carry out the imaging pattern of wide dynamic range imaging, or by result's (for example value of ISO light sensitivity and photometry) of AE or according to wide dynamic range imaging pattern selectively automatically such as white balance gains value, the S2=ON that responds shutter release button so is exposed to CCD13 in the light, and after exposure, at first read the electric charge of main photosensitive pixel 61, read the electric charge of auxiliary photosensitive pixel 62 then, and synchronous with the vertical driving signal (VD) of closing with the mechanical shutter that enters of isolated light.
The processing of the output signal of CCD13 will be described below.
Fig. 7 shows the block diagram of the detailed structure of signal processing unit shown in Figure 1 46.
As shown in Figure 7, signal processing unit 46 comprises side-play amount processing unit 101, shading correction unit 102, defect correction unit 103, white balance (WB) gain unit 104, gammate 105, adder unit 106, YC converting unit 107 and various correcting unit 108.
Side-play amount processing unit 101 is processing units of proofreading and correct the undercurrent element of CCD output, and carries out the calculating that pixel value deducts the value of optical black (OB) signal of obtaining the light-receiving pixel from CCD13.
Shading correction unit 102 is correction processing units in conjunction with the inhomogeneities of the CCD output of the change of the light total amount dispersion that is caused by optical system, and takes advantage of pixel value so that the output level equilibrium according to the position of pixel PIX with pre-prepd correction coefficient.
In addition, because main photosensitive pixel 61 is different with auxiliary photosensitive pixel 62 in the phenomenon that the brightness blackspot produces, carry out different shading corrections for the pixel value of main photosensitive pixel 61 and the pixel value of auxiliary photosensitive pixel 62.Comparing the periphery with the middle section of screen for main photosensitive pixel 61 more becomes in dark; And for auxiliary photosensitive pixel 62 produce unique blackspot (comparing the phenomenon that the total amount that makes at the light of periphery increases with the total amount of light in the middle section of screen) with respect to the position of small camera lens 81 and position in pixel PIX, form auxiliary photosensitive pixel among the pixel PIX.Carry out the signal correction processing that is used to eliminate these phenomenons according to the blackspot pattern of main photosensitive pixel 61 and auxiliary photosensitive pixel 62.
Defect correction unit 103 is processing units of signal value of proofreading and correct the defect pixel of CCD13.The defective of pixel PIX has three aspects, comprising:
(1) only be to make main photosensitive pixel 61 defective situations;
(2) only be to make auxiliary photosensitive pixel 62 defective situations;
(3) be to make main photosensitive pixel 61 and auxiliary photosensitive pixel 62 defective situations simultaneously.
To describe algorithm below in detail corresponding to the defect correction of above-mentioned three aspects, and bearing calibration comprise use around routine (low pass filtered wave mode) method of pixel value of pixel PIX of defectiveness pixel proofread and correct to carry out, and use the normal method of photosensitive pixel or main photosensitive pixel of assisting in same pixel PIX to proofread and correct, and depend on the bearing calibration that situation can change to carry out.
By defect correction unit 103 carry out image data storage that the defect correction processing obtain in memory as the CCDRAM data.The CCDRAM data that are stored in the memory 22 are sent to WB gain unit 104.
WB gain unit 104 comprises the gain variable amplifier of the level of the colour signal that is used to increase and reduce R, G and B, and according to the gain adjustment from each colour signal of command execution of CPU16.The signal that is subjected to gain process in WB gain unit 104 is sent to gammate 105.
Gammate 105 conversion I/O characteristics are so that they become desired gamma characteristic according to the order of CPU16.The picture signal that is subjected to Gamma correction is sent to adder unit 106.Adder unit 106 is the processing units that signal of obtaining from main photosensitive pixel and the signal of obtaining from auxiliary photosensitive pixel added be in the same place (synthesizing), and produces output signal according to following formula (1):
Output signal=g * (signal of main photosensitive pixel)+(1-g) * (signal of auxiliary photosensitive pixel) (1)
Wherein as long as satisfy the requirement of 0≤g≤1, the coefficient g of expression addition rate can be made as only.CPU16 depends on that situation can set coefficient g with changing.
Be sent to YC converting unit 107 from the signal of adder unit output.YC converting unit 107 comprises synchronous processing unit and YC conversion processing unit, the colour (RGB) of space bias to calculate each point of the colour signal of the filter arrangement structure of synchronous processing unit insertion binding signal panel CCD13, the YC conversion processing unit produces the brightness/colored difference from rgb signal.
Brightness/color difference the xor signal (YCrCb) that produces by YC processing unit 107 is sent to various correcting units 108.Various correcting units 108 comprise that for example, profile strengthens (iris correction) unit and has the colour correction unit of colored difference matrix.
A kind of defect correction method in the camera 10 that will illustrate as described above now to be disposed.
Fig. 8 shows the flow chart of the defect correction handling procedure of first control example.When beginning the processing (step S110) of defect correction, at first carry out the defect correction (step S120) of main photosensitive pixel defective 61.Because the positional information of the defect pixel of main photosensitive pixel 61 has been stored among the EEPROM24, according to positional information, the pixel value of the normal main photosensitive pixel 61 of defectiveness pixel setting on every side is used to carry out low pass filter (LPF) type and proofreaies and correct (so that replace the correction of defectiveness pixel with surrounding pixel information, or exporting the mean value of several pixels) (step S130).
All main photosensitive pixel defectives for being stored among the EEPROM24 judge whether to finish the correction (step S140) of main photosensitive pixel defective, and if do not finish to proofread and correct, so for other the treatment for correcting of main photosensitive pixel defective repeating step S130.
If judge the correction that finishes for main photosensitive pixel defective at step S140 place, handle and continue step S150, begin the defect correction of auxiliary photosensitive pixel 62.When the photosensitive pixel defective is assisted in correction, at first, read part photometry data (step S152) for the part photometry zone of containing auxiliary photosensitive pixel defective, and make judgement (average brightness of calculated value indicating area) (step S154) about dynamic range according to the photometry data
Whether the brightness of judging the zone (part) contain auxiliary photosensitive pixel defective (dynamic range is less than 100%) (step S154) in the dynamic range of main photosensitive pixel, if and dynamic range is less than 100%, that is, photosensitive pixel data regional unsaturated handled so and continues step S156.In addition, preferably provide certain allowance to be used to judge saturated.
At step S156 place, the main photosensitive pixel Main[y in pixel PIX no matter] whether [x] be equal to auxiliary photosensitive pixel Sub[y] [x] defective of being corrected is defectiveness or is judged.Carry out judgement according to the defect pixel positional information that is stored among the EEPROM24.
If judge main photosensitive pixel Main[y] [x] be defective, promptly main photosensitive pixel and the auxiliary photosensitive pixel in the photosensitive pixel position of determining ([y] [x]) is defective, still carry out the low pass type and proofread and correct, and near the information of the photosensitive pixel each, judge pixel value (step S158).
On the other hand, if main photosensitive pixel Main[y] [x] be normal pixel, at step S160 place, is used in the main photosensitive pixel Main[y at same position place] output of [x] removes the value that photosensitivity ratio obtains and fills auxiliary photosensitive pixel defective (step S160).
That is to say, judge auxiliary photosensitive pixel Sub[y according to following formula (2)] value of [x]:
Sub[y] [x]=Main[y] [x]/photosensitivity ratio (2)
By the defective that the pixel value that is used in the main photosensitive pixel 61 in the same pixel cell is proofreaied and correct auxiliary photosensitive pixel 62, compare with the routine correction, reduce the low-pass filtering influence, and after proofreading and correct, can keep differentiating photosensitivity.
After step S158 and step S160, handle proceeding to step S170.At step S170 place, judge whether to finish to be stored in the correction of all auxiliary photosensitive pixel defectives among the EEPROM24, and if do not finish to proofread and correct, handle and turn back to step S154, repeat the above-mentioned treatment for correcting of other auxiliary photosensitive pixel defective.
If judge the correction that finishes all auxiliary photosensitive pixel defectives at step S170 place, stop the program (step S180) of defect correction so.
At step S154 place, if dynamic range is equal to or greater than 100%, that is, under the situation in the saturated zone of main photosensitive pixel data, handle proceeding to step S158, proofread and correct by the low pass filtered wave mode and fill auxiliary photosensitive pixel defective.
This reason is exactly why when proofreading and correct the defective of auxiliary photosensitive pixel 62, at the same position place with main photosensitive pixel adjustment of data defective, only for part, judge that dynamic range is less than 100%, like this for 100% or the part of bigger dynamic range, along with the value of auxiliary photosensitive pixel defective is saturated in the main photosensitive pixel data at same position place, and therefore can not correctly carry out correction, proofread and correct if use the data of main photosensitive pixel to carry out from the viewpoint of level.
No matter main photosensitive pixel is saturated or judge from each the regional calculated value shown in the part photometry data the flow chart of Fig. 8, and in another embodiment, when photographic images under conditions of exposure, judge that with AE control each regional calculated value can judge from the value of being scheduled to whether main photosensitive pixel is saturated in advance.
Handle the back at AE and can judge directly from the view data that obtains with S2=ON whether main photosensitive pixel is saturated.
Fig. 9 shows the flow chart of the defect correction handling procedure of second control example.In Fig. 9, the step identical with the flow chart of Fig. 8 provides identical step numeral and no longer illustrates its explanation.
In the control example shown in Fig. 9, step S152 in the flow chart of the processing of execution in step S153 and step S155 replacement Fig. 8 and the processing of step S154.
That is to say, when beginning the correction (step S150) of auxiliary photosensitive pixel defective, from memory 22, read the main photosensitive pixel data (pixel value of main photosensitive pixel) (step S153) among the pixel PIX of the value that is equal to auxiliary photosensitive pixel defective, and judge be equal to the auxiliary photosensitive pixel Sub[y that is corrected] the main photosensitive pixel Main[y in pixel PIX of the value of [x]] [x] whether saturated (step S155).
As shown in Figure 6, carry out about saturated judgement by judging whether the value of reaching capacity, and less than the value of saturation value (QL value=4095) can be provided for about saturated judgement really constant volume limit (margin) set as the value of determining.
If judge that main photosensitive pixel data the step S155 place among Fig. 9 identical with the value of auxiliary photosensitive pixel defective at the same position place is saturated, carry out conventional (low pass filtered wave mode) so and proofread and correct (step S158).On the other hand, if judge that the main photosensitive pixel data identical with the value of auxiliary photosensitive pixel defective at the same position place are unsaturated, processing proceeding to step S156 so, judges main photosensitive pixel Main[y] [x] defectiveness whether.
If main photosensitive pixel Main[y] [x] defectiveness, carry out the low pass filtered wave mode so and proofread and correct (step S158), if and main photosensitive pixel Main[y] [x] be normal pixel, so main photosensitive pixel Main[y] output of [x] is used to judge auxiliary photosensitive pixel Sub[y] value (step S160) of [x].
Like this, judge according to the actual main photosensitive pixel data that obtain with S2=ON whether main photosensitive pixel 61 is saturated, replace the division photometry data that response S1=ON obtains.
In control example with Fig. 8 and 9 explanations, the data of auxiliary photosensitive pixel 62 are not used in the defect correction of main photosensitive pixel 61, when reading the data of auxiliary photosensitive pixel 62 after the CCDRAM data that obtaining main photosensitive pixel 61, thereby and help to begin apace the signal processing (white balance is handled, gamma is handled, or the like) of the CCDRAM data of main photosensitive pixel 61.
Figure 10 shows the flow chart of the defect correction handling procedure of the 3rd control example.In Figure 10, the step identical with the flow chart of Fig. 8 provides identical step numeral and no longer illustrates its explanation.
When the timing that begins main photosensitive pixel defective at the step S120 place of Figure 10, at first read the part photometry data (step S122) during AE handles in the part photometry zone that is used to contain defect pixel, and judge brightness (step S124) according to the photometry data.
If judge that at the S124 place view data is a high-brightness region, handle proceeding to step S126, wherein judge to be equal to the main photosensitive pixel Main[y that is corrected] auxiliary photosensitive pixel Sub[y among the pixel PIX of the value of [x]] [x] defectiveness whether.Carry out judgement according to the defect pixel positional information in EEPROM24.
If auxiliary photosensitive pixel Sub[y] [x] defectiveness, promptly judge all defectiveness of main photosensitive pixel in determining photosensitive pixel position ([y] [x]) and auxiliary photosensitive pixel, still carry out the low pass filtered wave mode and proofread and correct (step S130) with near photosensitive pixel information filling defect.
On the other hand, at step S130 place, if auxiliary photosensitive pixel Sub[y] [x] be normal pixel, is used in the auxiliary photosensitive pixel Sub[y at same position place so] [x] value of taking advantage of photosensitivity ratio to obtain fills main photosensitive pixel defective (step S132).
Just, judge main photosensitive pixel Main[y according to following formula (3)] value of [x]:
Main[y] [x]=photosensitivity ratio * Sub[y] [x] proofread and correct (3)
Yet,, prune output signal with saturated output valve if exceed saturated output valve with formula (3) result calculated.
If the defective that the data of auxiliary photosensitive pixel 62 are used to proofread and correct main photosensitive pixel 61, by this way, because big gain can worsen S/N, and therefore still carry out the method that the LPF type proofreaies and correct to fill near the pixel value of Pixel Information and be used for low brightness area (zone) with the brightness that is lower than determined value, low brightness area since S/N such as gamma conversion can further worsen.
For near the zone that has greater than the saturated light total amount of the brightness of determined value, the output that is used in the main photosensitive pixel among the same pixel PIX can be proofreaied and correct auxiliary photosensitive pixel defective rightly.
In addition, for having the high-brightness region that exceeds the saturated light total amount,, also exceeded the saturated output valve (4095) of main photosensitive pixel, and therefore pruned corrected value) with saturated output valve (4095) even the data of auxiliary photosensitive pixel multiply by photosensitivity ratio.
After step S130 or step S132, handle proceeding to step S140.At step S140 place, judge whether to finish to be stored in the above-mentioned LPF type correction (step S140) of all the main photosensitive pixel defectives among the EEPROM24, if and do not finish to proofread and correct, handle and turn back to step S124, repeat the treatment for correcting of other main photosensitive pixel defective.
If judge the correction that finishes in all main photosensitive pixel defectives at step S140 place, handle and proceed to step S150, begin the defect correction of auxiliary photosensitive pixel 62.The correction of auxiliary photosensitive pixel defective is described with Fig. 8.
In addition, in the control example shown in Figure 10, the pixel value of auxiliary photosensitive pixel 62 is used to proofread and correct main photosensitive pixel defective, and therefore the data of main photosensitive pixel 61 and the data of auxiliary photosensitive pixel 62 all are stored in the interim suprabasil memory 22.Then, the data of reading the data of main photosensitive pixel 61 and auxiliary photosensitive pixel 62 from memory 22 are used for the processing of defect correction with execution.
Figure 11 shows another example of the structure of CCD13.Figure 11 is a plane graph, and Figure 12 is the sectional view along the line 12-12 intercepting of Figure 11.In these accompanying drawings, or similar elements identical with Fig. 2 and Fig. 3 provides identical mark, and no longer sets forth its explanation.
Shown in Figure 11 and 12, p
+Type isolated area 88 is formed between main photosensitive pixel 61 and the auxiliary photosensitive pixel 62.This isolated area 88 stops zone (raceway groove plug) as raceway groove, and electricity is isolated photodiode region.Light blocking film 89 is formed on isolated area 88 tops corresponding to the position of isolated area 88.
By using light blocking film 89 and isolated area 88, isolate incident light effectively, and next stop the electric charge of accumulative total in main photosensitive pixel 61 and auxiliary photosensitive pixel 62 to mix.Other structure is identical with the structure of the example shown in Fig. 2 and 3.
The geometry of the unit of pixel PIX and the geometry of opening are not limited to the example shown in Fig. 2 and 11, and can have various forms, for example polygon and circle.In addition, the isolated form of light receiving unit (segregation form) is not limited to the form shown in Fig. 2 and 9.
Figure 13 shows another example of the structure of CCD13.In Figure 13, or similar elements identical with the element of the example shown in Fig. 2 and 11 provides identical mark, and no longer sets forth its explanation.Figure 13 shows along the structure of two photosensitive pixels (61,62) of the direction isolation of tilting.
Like this, the accumulative total electric charge of the corresponding photosensitive region of separating can read into vertical transmission passage respectively, and the number of form, separated portions, relevant area size etc. are cut apart in setting suitably.Yet, the area of auxiliary photosensitive pixel is set at value less than the area of main photosensitive pixel.The minimizing of the area of the main photosensitive pixel of preferred restriction is so that the sensitivity decrease minimum.
Now an alternative embodiment of the invention will be described.
Be installed in the total amount restriction that image device on the digital camera is subjected to carrying out the light of opto-electronic conversion, and if the total amount of the light that receives reach a determined value, output signal (light receiving signal) is saturated so as shown in figure 14.This phenomenon usually occurs in the image device.
Thereby, in being installed in according to the image device on the digital camera of the embodiment of the invention, two types light receiving element making different light-receiving photosensitivity (hereinafter, light receiving element with high relatively photosensitivity abbreviates main pixel as, and the light receiving element with low relatively photosensitivity abbreviates auxiliary pixel as) being present in the same image device, and the saturation level of auxiliary pixel is set the degree of the minimizing speed that is equal to or greater than its photosensitivity.For example, compare with main pixel, the photosensitivity of setting auxiliary pixel is 1/16, and the setting saturation level is 1/4.Then, as shown in figure 15, can make opto-electronic conversion, that is, can carry out imaging, be four times big of total amount of the light of main pixel up to the total amount of light.Dynamic range increases by 400%.
With Fig. 2 to Fig. 5 and Figure 11 to Figure 13 the structure that is installed in according to the image device on the digital camera of the embodiment of the invention is described.
The method that is used to produce Pixel Information as one embodiment of the invention will be described now.
Figure 16 shows the flow chart of a program that is used to produce Pixel Information.
At first, set the shading condition, that is, do not have light to enter the condition (S201) of the imaging region of image device.Under this condition, the output signal (hereinafter referred is a standard signal) of reading the main pixel that is used for each pixel (S202), and defective defective data table (1) is (S203) to produce the indication pixel by the defective level of measuring more in advance.Next, read for the auxiliary pixel of each pixel output signal (hereinafter referred is a high-brightness signal) (S204), and defective defective data table (2) is (S205) to produce the indication pixel by the defective level of measuring more in advance.
Then, imaging region (S206) with the rayed image device of standard white level, read the standard signal (S207) that is used for each pixel, and whether defective defective data table (3) is (S208) to produce the indication pixel by the defective level of measuring more in advance.
Then, imaging region (S209) with the rayed image device of standard white level, read the high-brightness signal (S210) that is used for each pixel, and whether defective defective data table (4) is (S211) to produce the indication pixel by the defective level of measuring more in advance.
After this, the logic of calculated data table (1) to (4) and, and produce to be used to limit and have the pixel that equals 1 result of calculation (S212) as the checking list (Pixel Information) of defect pixel.
Figure 17 shows the flow chart of another program that is used to produce Pixel Information.
At first, set shading condition (S321).Under these conditions, be mixed for the standard signal and the high-brightness signal of each pixel and read (S322), and defective defective data table (1) is (S323) to produce the indication pixel by the defective level of measuring more in advance.
Then, imaging region (S324) with the rayed image device of standard white level, read the standard signal (S325) that is used for each pixel, and whether defective defective data table (2) is (S326) to produce the indication pixel by the defective level of measuring more in advance.
Then, imaging region (S327) with the rayed image device of standard white level, read the high-brightness signal (S328) that is used for each pixel, and whether defective defective data table (3) is (S329) to produce the indication pixel by the defective level of measuring more in advance.
After this, the logic of calculated data table (1) to (3) and, and produce to be used to limit and have the pixel that equals 1 result of calculation (S330) as the checking list (Pixel Information) of defect pixel.
According to the program of Figure 17, the signal when producing the light blocking state by Defects of Liquid, each readout sign calibration signal and high-brightness signal, thereby, compare with the example of Fig. 1, make and might obtain defective data to produce checking list within a short period of time.
Figure 18 shows the flow chart of another program that is used to produce Pixel Information.
At first, set shading condition (S431).Under these conditions, be mixed for the standard signal and the high-brightness signal of each pixel and read (S432), and defective defective data table (1) is (S433) to produce the indication pixel by the defective level of measuring more in advance.
Then, imaging region (S434) with the rayed image device of standard white level, read the standard signal (S325) that is used for each pixel, and whether defective defective data table (2) is (S436) to produce the indication pixel by the defective level of measuring more in advance.Then, read the high-brightness signal (S437) that is used for each pixel, and whether defective defective data table (3) is (S438) to produce the indication pixel by the defective level of measuring more in advance.
After this, the logic of calculated data table (1) to (3) and, and produce to be used to limit and have the pixel that equals 1 result of calculation (S439) as the checking list (Pixel Information) of defect pixel.
Figure 19 shows the flow chart of another program that is used to produce Pixel Information.
At first, set shading condition (S541).Under these conditions, be mixed for the standard signal and the high-brightness signal of each pixel and read (S542), and defective defective data table (1) is (S543) to produce the indication pixel by the defective level of measuring more in advance.
Then, imaging region (S544) with the rayed image device of standard white level, read the standard signal and the high-brightness signal (S545) that are used for each pixel, and whether defective defective data table (2) is (S546) to produce the indication pixel by the defective level of measuring more in advance.
After this, the logic of calculated data table (1) to (2) and, and produce to be used to limit and have the pixel that equals 1 result of calculation (S547) as the checking list (Pixel Information) of defect pixel.
According to the program of Figure 18 and 19, compare with the example of Figure 17, make and might obtain defective data in shorter time, to produce checking list.
Figure 20 shows the block diagram according to an example of the structure of the digital camera of the embodiment of the invention.Digital camera 200 comprises optical system 210, imaging device 220, analogy signal processing unit 230, A/D converting unit 240, digital signal processing unit 250, buffer storage 260, compression/magnification processing 270, YC/RGB converting unit 280, media drive 290, lcd driver 300, the LCD310 that is used to monitor, operating unit 320, EEPROM330 and CPU340 etc.
Shown in Fig. 5, image device 220 is wide dynamic range image devices, and output corresponding to the picture signal of the total amount of the light that enters imaging region PS to analogy signal processing unit 230.
Analogy signal processing unit 230 makes the signal of input be subjected to predetermined analog, and for example noise abatement processing, white balance are handled and γ handles, and the signal that output was handled is to A/D converting unit 240.A/D converting unit 240 becomes the analog signal conversion of input data image signal and output digital image signal to digital signal processing unit 250.
Digital signal processing unit 250 makes the digital processing of being scheduled to from the output signal of A/D converting unit 240, and for example, Filtering Processing and defect pixel correction are handled.
Output signal from digital signal processing unit 250 is delivered to YC/RGB converting unit 280, compression/magnification processing 270, lcd driver 300 etc. by buffer storage 260.Compression/magnification processing 270 with the predetermined compressed format compression of for example jpeg format be accumulated in the buffer storage 260 view data and in removable medium 291 storing image data, or amplify from the view data in the removable medium 291.YC/RGB converting unit 280 does not have the view data of compression to convert brightness data Y and colored variance data Cr and Cb to delivering to compression/amplifying unit 270.View data in being stored in removable medium 291 (image of shooting) is presented at the LCD310 that is used to monitor.
For removable medium 291, use small memory card with flash memory, or the like.From removable medium 291, write or read view data by media drive 290.
Provide and have the operating unit 320 that contains various types of operation parts of loosening button.Loosening button is to be used for the operation part of designation number camera 200 with the beginning imaging, if and partly pin button, carry out the focus controlling and the aperture control of optical system, and at every turn when pinning button entirely, photographic images, that is, by image device 220, analogy signal processing unit 230 and A/D converting unit 240 photographed image signals.At this moment, by photometry/range measurement CPU (not shown) control optical system 210, and by the control of imaging system control circuit (not shown) image device 220, analogy signal processing unit 230 and A/D converting unit 240.
Be used for realizing that the various functional programs of digital camera 200 and storage are at EEPROM330.Be stored in data among the EEPROM330 and comprise the checking list that is used for image device 220 that any program produced by Figure 16 to 19.CPU340 comes control figure camera 200 by the program that execution is stored among the EEPROM330 usually.
In digital camera 200, digital signal processing unit 250 is carried out the treatment for correcting of defect pixel, for example, when handling picture signal, with reference to the checking list that is stored among the EEPROM330, replaces the signal of defect pixel in the image device 220 with the signal of normal pixel.
Simultaneously, can be according to the output signal of a checking list correct defective pixels, thereby, might use a little information with respect to the number of the light receiving element of image device 220, carry out effectively and proofread and correct.Can reduce the capacity of the EEPROM330 of storage checking list.
And, in the above-described embodiments, although to use CCD to have the example of the image device of honeycomb as the wide dynamic range image device, but range of application of the present invention is not restricted to this, and the present invention is effective for complementary metal oxide semiconductors (CMOS) (CMOS) type image device with the image device with matrix structure.
In addition, can suitably change similarly order among the order of readout sign calibration signal, high-brightness signal and Figure 16 to Figure 19.Can suitably revise light blocking for example is set, with the irradiation of standard white directional light with the order of the light-struck condition of high brightness white level.
In above-mentioned example, carry out the flaw indication treatment for correcting with digital signal processing unit 250, but for simplicity, can carry out this processing with CPU340.
Needn't be as form processed pixels information.Just, the data structure of Pixel Information may be arrangement architecture, list structure or any other structure.
In the above description, the CCD of the pixel arrangement with alveolate texture has been described as an example, but range of application of the present invention is not limited thereto, and can uses imageing sensor, so that in square matrix, arrange all pixels with pixel arrangement.
In the above-described embodiments, as an example digital camera has been described, but range of application of the present invention is not limited thereto, and the present invention also is applied to have in other imaging device of electronic imaging function, for example video camera, DVD video camera, have camera function cell phone, the PDAs of camera function is arranged or the mobile personal computer of camera function is arranged.
As mentioned above, according to the present invention, in the solid state image sensor of main photosensitive pixel that includes homophase photographing information optically and auxiliary photosensitive pixel, proofread and correct the defective of auxiliary photosensitive pixel according to the pixel value of the main photosensitive pixel in same pixel cell, thereby compare the analysis photosensitivity after reducing the low pass filtered influence and keeping correction with the correction of routine.
According to being used to be limited to the Pixel Information of at least one light receiving element tool defective pixels as defect pixel, the output signal of digital camera correct defective pixels of the present invention.
Be used to produce the method for checking list in according to the present invention, can accurately produce and be used to be limited to the checking list of at least one light receiving element tool defective pixels as defect pixel.
Yet, be to be understood that not to be intended to the present invention is limited in the disclosed concrete form, and antithesis, the present invention covers all modifications, replacement and the equivalent structure in the spirit and scope of being explained in the additional claim.
Claims (10)
1. method that is used for proofreading and correct the solid state image sensor defect pixel, the structure that has a plurality of pixel cells of arranging according to predetermined set in this solid state image sensor, each pixel cell is combined by main photosensitive pixel with relatively large area and relative auxiliary photosensitive pixel than small size, and extract selectively by according to the signal of the signal charge of main photosensitive pixel opto-electronic conversion with according to the signal by the signal charge of auxiliary photosensitive pixel opto-electronic conversion, it is characterized in that: described method comprises the steps:
If any unit for solid state image sensor, the main photosensitive pixel that constitutes pixel cell is a normal pixel, and auxiliary photosensitive pixel is a defect pixel, judges so whether the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell pixel cell on every side that contains the auxiliary photosensitive pixel of defectiveness is lower than the predetermined level of saturation of the saturated output of indication; And
If the level of the signal of obtaining is lower than saturation level, assist the pixel value of photosensitive pixel so according to the pixel value defect correcting of the main photosensitive pixel in the pixel cell of the value that is equal to the defective photosensitive pixel from the main photosensitive pixel that is present in the pixel cell pixel cell on every side that contains the auxiliary photosensitive pixel of defectiveness.
2. the method for claim 1 is characterized in that:
The pixel value of the main photosensitive pixel of the pixel value by being equal to the auxiliary photosensitive pixel of defective removes the ratio of the photosensitivity of main photosensitive pixel to the photosensitivity of auxiliary photosensitive pixel, judges the pixel value of the auxiliary photosensitive pixel of defective.
3. method as claimed in claim 1 or 2 is characterized in that:
Any pixel cell for solid state image sensor, if constituting the main photosensitive pixel of pixel cell is defect pixel, so according to the pixel value of the pixel value defect correcting master photosensitive pixel of the main photosensitive pixel that is present in the pixel cell around the pixel cell that contains defectiveness master photosensitive pixel.
4. method as claimed in claim 1 or 2 is characterized in that:
Any pixel cell for solid state image sensor, if constituting the main photosensitive pixel of pixel cell is defect pixel, and auxiliary photosensitive pixel is a normal pixel, so according to the pixel value of the pixel value defect correcting master photosensitive pixel of the auxiliary photosensitive pixel in the pixel cell of pixel value that is equal to defective master photosensitive pixel, if the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell around the pixel cell that contains defectiveness master photosensitive pixel exceeds preassigned.
5. method as claimed in claim 4 is characterized in that:
Be equal to the auxiliary sensitization in the pixel cell of pixel value of defective master photosensitive pixel by execution
The photosensitivity of pixel main photosensitive pixel on duty that is equal to the auxiliary photosensitive pixel in the pixel cell of pixel value of defective master photosensitive pixel by execution is to the calculating of the ratio of the photosensitivity of auxiliary photosensitive pixel, thereby judges the pixel value of defective master photosensitive pixel.
6. imaging device is characterized in that:
Solid state image sensor with a plurality of pixel cell structures that are provided with according to the predetermined arrangement form, each pixel cell is combined by the auxiliary photosensitive pixel with large-area relatively main photosensitive pixel and relative small size, and extracts selectively by according to the signal of the signal charge of main photosensitive pixel opto-electronic conversion with according to the signal by the signal charge of auxiliary photosensitive pixel opto-electronic conversion;
Judge device, if any pixel cell for solid state image sensor, the main photosensitive pixel that constitutes pixel cell is that normal pixel and auxiliary photosensitive pixel are defect pixels, judges so whether the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell pixel cell on every side that contains the auxiliary photosensitive pixel of defectiveness is lower than the predetermined level of saturation of the saturated output of indication; And
The defect pixel correction device, if with judging that device judges that the level of the signal of obtaining from the main photosensitive pixel that is present in the pixel cell around the pixel cell that contains defect pixel is lower than saturation level, so according to the pixel value of the auxiliary photosensitive pixel of pixel value defect correcting of the main photosensitive pixel in the pixel cell of the pixel value that is equal to the auxiliary photosensitive pixel of defective.
7. imaging device as claimed in claim 6 is characterized in that:
For main photosensitive pixel in same pixel cell and auxiliary photosensitive pixel the colour filter of same colour cell is set, and a small camera lens is provided above each pixel cell, for a pixel cell.
8. method that is used for producing Pixel Information at image device, this image device has the imaging region that is made of a plurality of pixels and has for different light-receiving photosensitivity of each pixel and first and second light receiving elements of light receiving signal saturation level, it is characterized in that described method comprises the steps:
Read for the output signal of first light receiving element of each pixel so that produce whether defective information of indication pixel;
Read for the output signal of second light receiving element of each pixel so that produce whether defective information of indication pixel; And
The logic of a plurality of information that calculating produces in above-mentioned steps and and produce to be used to limit and have the pixel that equals 1 result of calculation Pixel Information as defect pixel.
9. method that is used for producing Pixel Information at image device, this image device has the imaging region that is made of a plurality of pixels, each pixel has different light-receiving photosensitivity and first and second light receiving elements of light receiving signal saturation level, it is characterized in that described method comprises the steps:
At every turn read the output signal of the output signal of first light receiving element and second light receiving element so that produce whether defective information of indication pixel for each pixel;
Read for the output signal of first light receiving element of each pixel so that produce whether defective information of indication pixel;
Read for the output signal of second light receiving element of each pixel so that produce whether defective information of indication pixel; And
The logic of a plurality of information that calculating produces in above-mentioned steps and and produce to be used to limit and have the pixel that equals 1 result of calculation Pixel Information as defect pixel.
10. digital camera has the image device for two types light receiving element of different light-receiving photosensitivity of each pixel and light receiving signal saturation level, it is characterized in that also comprising:
Memory, storage is used for being limited to the Pixel Information of at least one light receiving element tool defective pixels as defect pixel;
Correction processing circuit is according to the output signal of Pixel Information correct defective pixels;
Described Pixel Information produces according to claim 9 or 10 described Pixel Information production methods.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003009943A JP4051701B2 (en) | 2003-01-17 | 2003-01-17 | Defective pixel correction method and imaging apparatus for solid-state imaging device |
| JP009943/2003 | 2003-01-17 | ||
| JP091948/2003 | 2003-03-28 | ||
| JP2003091948A JP4028422B2 (en) | 2003-03-28 | 2003-03-28 | Digital camera and pixel information creation method |
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| CN1265621C true CN1265621C (en) | 2006-07-19 |
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| KR (1) | KR100609737B1 (en) |
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