CN120405388A - Test fixtures and test systems - Google Patents
Test fixtures and test systemsInfo
- Publication number
- CN120405388A CN120405388A CN202510901972.6A CN202510901972A CN120405388A CN 120405388 A CN120405388 A CN 120405388A CN 202510901972 A CN202510901972 A CN 202510901972A CN 120405388 A CN120405388 A CN 120405388A
- Authority
- CN
- China
- Prior art keywords
- test
- load
- terminal
- connection end
- junction box
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a test fixture and a test system, wherein the test fixture comprises a base, a junction box, a test connecting assembly and a supporting plate, the base comprises a shell, a first groove arranged on the upper surface of the shell and a test connecting end arranged on the shell, the test connecting end is used for connecting test equipment, a first clamping terminal is arranged on the side wall of the first groove and is electrically connected with the test connecting end, a second clamping terminal corresponding to the first clamping terminal is arranged on the outer wall of the junction box, the junction box is embedded in the first groove and is clamped with the second clamping terminal, the test connecting assembly is arranged on the junction box and comprises a test thimble, the test thimble is electrically connected with the second clamping terminal, the supporting plate is provided with a through hole and is arranged on the test connecting assembly and used for placing a PCB board, the test thimble passes through the through hole and is electrically connected with a test pad on the PCB board, and the test equipment is used for testing the PCB board. The technical scheme can reduce the test cost and improve the test efficiency.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a testing jig and a testing system.
Background
At present, electric vehicles are increasingly accepted and selected by people, and the technical requirements on electric vehicle charging piles are continuously improved. When the electric automobile fills electric pile and leaves the factory, will generally fill electric automobile and fill electric pile and carry out the factory test to guarantee the reliability of product.
Along with the continuous improvement of the intellectualization of the charging pile, the testing system of the charging pile is not updated all the time, and the testing technology is not innovated all the time. However, the conventional factory test of the charging pile requires to formulate different test jigs for different charging pile control boards, which results in high test cost and is inconvenient to test different charging pile control boards efficiently.
Disclosure of Invention
The embodiment of the invention provides a test fixture and a test system, which are used for solving the problem of higher test cost of testing different charging pile control boards.
A test fixture comprises a base, a junction box, a test connection assembly and a supporting plate;
The base comprises a shell, a first groove arranged on the upper surface of the shell, and a test connecting end arranged on the shell, wherein the test connecting end is used for connecting test equipment;
The outer wall of the junction box is provided with a second clamping terminal corresponding to the first clamping terminal; the junction box is embedded in the first groove, and the first clamping terminal is clamped with the second clamping terminal;
The test connection assembly is arranged on the junction box and comprises a test thimble, and the test thimble is electrically connected with the second clamping terminal;
The supporting plate is provided with a through hole and is arranged on the test connection assembly and used for placing a PCB, the test thimble passes through the through hole and is electrically connected with a test pad on the PCB, and the test equipment is used for testing the PCB.
Further, the test fixture further comprises a fixing assembly connected with the junction box and used for fixing the PCB on the supporting plate.
The PCB fixing device comprises a fixing assembly, a fixing assembly and a supporting plate, wherein the fixing assembly comprises a fixing support, a guide rod, a pressing fixing plate and a pressing handle, the fixing support is arranged on the junction box, a guide groove is formed in the middle of the fixing support, the guide rod is in sliding connection with the guide groove, the pressing fixing plate is connected with the guide rod, and the pressing handle is connected with the guide rod and used for driving the guide rod to slide relative to the guide groove so that the pressing fixing plate can fix the PCB on the supporting plate.
Further, the test connection assembly comprises a thimble fixing plate and the test thimble;
The thimble fixing plate is provided with a thimble fixing table, and the test thimble is arranged on the thimble fixing table.
A test system comprises test equipment and the test fixture;
The test equipment is connected with the test connection end of the test fixture and is used for testing the PCB on the test fixture.
Further, the PCB is a charging pile control board, and the testing equipment is used for carrying out vehicle charging test and vehicle discharging test on the PCB.
The test connection end comprises a power supply connection end, a load connection end and a first signal connection end, wherein the power supply connection end is arranged on a first outer wall of the shell;
the testing equipment comprises main control equipment, an adjustable power supply, a load tester and a multifunctional load;
The output end of the adjustable power supply is connected with the power supply connecting end or the load connecting end, and the second signal connecting end of the adjustable power supply is connected with the first signal connecting end;
the input end of the multifunctional load is connected with the load connecting end or the power supply connecting end, and the third signal connecting end of the multifunctional load is connected with the first signal connecting end;
The load tester is connected with the load connecting end and the first signal connecting end, or the load tester is connected with the power supply connecting end and the first signal connecting end;
The main control equipment is connected with the adjustable power supply, the load tester and the multifunctional load.
Further, the upper surface of the shell is also provided with a charging gun seat, a plug, a socket and a line pressing terminal block;
the first clamping terminal is electrically connected with the charging gun seat, the plug, the socket and the line pressing terminal block.
The testing equipment further comprises a leakage switch, wherein the output end of the adjustable power supply is connected with the power supply connecting end or the load connecting end through the leakage switch, and the main control equipment is further connected with the leakage switch.
Further, the testing system further comprises a rotatable cradle head, wherein the rotatable cradle head is used for placing the testing jig.
The embodiment of the invention provides a test fixture and a test system, wherein the test fixture comprises a base, a junction box, a test connecting assembly and a supporting plate, the base comprises a shell, a first groove arranged on the upper surface of the shell and a test connecting end arranged on the shell, the test connecting end is used for connecting test equipment, a first clamping terminal is arranged on the side wall of the first groove, the first clamping terminal is electrically connected with the test connecting end, a second clamping terminal corresponding to the first clamping terminal is arranged on the outer wall of the junction box, the junction box is embedded in the first groove, the first clamping terminal is clamped with the second clamping terminal, the test connecting assembly is arranged on the junction box, the test connecting assembly comprises a test thimble, the test thimble is electrically connected with the second clamping terminal, a through hole is formed in the supporting plate and is used for placing a PCB board, the test thimble passes through the through hole and is electrically connected with a test pad on the PCB board, and the test equipment is used for testing the PCB board.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments of the present invention will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a top view of a test fixture according to an embodiment of the invention;
FIG. 2 is a schematic diagram of a test fixture according to an embodiment of the invention;
FIG. 3 is a schematic diagram of a test fixture according to an embodiment of the invention;
FIG. 4 is a schematic diagram of a test system according to an embodiment of the invention;
FIG. 5 is another schematic diagram of a test system according to an embodiment of the invention.
In the figure, 1, a test fixture, 11, a base, 111, a first clamping terminal, 112, a test connection end, 113, a charging gun seat, 114, a plug, 115, a socket, 116, a line pressing terminal table, 12, a junction box, 121, a second clamping terminal, 13, a test connection component, 131, a thimble fixing plate, 132, a test thimble, 14, a supporting plate, 15, a fixing component, 151, a fixing bracket, 152, a guide rod, 153, a press buckle fixing plate, 2, a main control device, 3, an adjustable power supply, 4, a load tester, 5, a multifunctional load, 6, a leakage switch, 7, a rotatable cradle head, 8 and a PCB.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be understood that the present invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the dimensions and relative dimensions of layers and regions may be exaggerated for the same elements throughout for clarity.
It will be understood that when an element or layer is referred to as being "on," "adjacent," "connected to," or "coupled to" another element or layer, it can be directly on, adjacent, connected, or coupled to the other element or layer, or intervening elements or layers may be present. In contrast, when an element is referred to as being "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" another element or layer, there are no intervening elements or layers present. It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the present invention.
Spatially relative terms, such as "under," "below," "beneath," "under," "above," "over," and the like, may be used herein for ease of description to describe one element or feature's relationship to another element or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use and operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements or features described as "under" or "beneath" other elements would then be oriented "on" the other elements or features. Thus, the exemplary terms "below" and "under" may include both an upper and a lower orientation. The device may be otherwise oriented (rotated 90 degrees or other orientations) and the spatially relative descriptors used herein interpreted accordingly.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. As used herein, the term "and/or" includes any and all combinations of the associated listed items.
In the following description, for the purpose of providing a thorough understanding of the present invention, detailed structures and steps are presented in order to illustrate the technical solution presented by the present invention. Preferred embodiments of the present invention are described in detail below, however, the present invention may have other embodiments in addition to these detailed descriptions.
The embodiment provides a test fixture 1, as shown in fig. 1 to 3, comprising a base 11, a junction box 12, a test connecting assembly 13 and a supporting plate 14, wherein the base 11 comprises a shell, a first groove arranged on the upper surface of the shell, and a test connecting end 112 arranged on the shell, the test connecting end 112 is used for connecting test equipment, a first clamping terminal 111 is arranged on the side wall of the first groove, the first clamping terminal 111 is electrically connected with the test connecting end 112, a second clamping terminal 121 corresponding to the first clamping terminal 111 is arranged on the outer wall of the junction box 12, the junction box 12 is embedded in the first groove, the first clamping terminal 111 is clamped with the second clamping terminal 121, the test connecting assembly 13 is arranged on the junction box 12, the test connecting assembly 13 comprises a test thimble 132, the test thimble 132 is electrically connected with the second clamping terminal 121, a through hole is arranged on the supporting plate 14 and is used for placing a PCB 8, the test thimble 132 passes through the through hole and is electrically connected with a test pad on the PCB 8, and the test equipment is used for testing the PCB 8.
Wherein, this PCB board 8 is the electric pile control panel that fills in the electric pile. The test equipment is used for vehicle charge and discharge testing of the PCB board 8, for example.
It will be appreciated that the number and positions of the first clamping terminals 111, the second clamping terminals 121 and the test connection terminals 112 may be determined according to the actual PCB board 8 to be tested, which is not limited herein.
As an example, the test connection end 112 is connected to the test equipment by way of a patch plug 114, so as to facilitate replacement according to the test requirements.
As an example, the PCB board 8 may be fixed to the tray 14 by an additional fixing component 15, and the PCB may be fixed to the tray 14 by a fixing structure on the tray 14. The fixing structure can be a limiting structure or a buckling structure. So as to ensure the accuracy and reliability of the test result.
As an example, when testing the PCB 8, the PCB 8 is disposed on the supporting plate 14, and the test pad on the PCB 8 is electrically connected with the test thimble 132, so that the test pad is electrically connected with the test device through the test thimble 132, the circuit in the junction box 12, the second clamping terminal 121, the first clamping terminal 111 and the test connection terminal 112, so that the test device can test the PCB. When the PCB 8 needs to be replaced for testing, the replaced PCB 8 can be retested only by sequentially removing the supporting plate 14, the test connecting assembly 13 and the junction box 12 and readjusting the layout of the test ejector pins 132 in the test connecting assembly 13 and the circuit connected with the test ejector pins 132 in the junction box 12, so that the whole test fixture 1 is prevented from being replaced, the test cost is reduced, and the test efficiency is improved.
Further, the test fixture 1 further comprises a junction box fixing structure connected with the base 11 and the junction box 12 for fixing the junction box 12 in the first groove when the junction box 12 is embedded in the first groove. Illustratively, the junction box fixing structure comprises a buckle structure, the buckle structure comprises a buckle and a limiting piece, one buckle and the limiting piece are arranged on the base 11, the other buckle and the limiting piece are arranged on the junction box 12, and the buckle is matched with or separated from the limiting piece. Alternatively, the number of the fastening structures may be selected according to practical needs, which is not limited herein.
In this embodiment, the test fixture 1 includes a base 11, a junction box 12, a test connection assembly 13, and a pallet 14; the base 11 comprises a shell, a first groove arranged on the upper surface of the shell, and a test connection end 112 arranged on the shell, wherein the test connection end 112 is used for being connected with test equipment, a first clamping terminal 111 is arranged on the side wall of the first groove, the first clamping terminal 111 is electrically connected with the test connection end 112, a second clamping terminal 121 corresponding to the first clamping terminal 111 is arranged on the outer wall of the junction box 12, the junction box 12 is embedded in the first groove, the first clamping terminal 111 is clamped with the second clamping terminal 121, the test connection assembly 13 is arranged on the junction box 12, the test connection assembly 13 comprises a test thimble 132, the test thimble 132 is electrically connected with the second clamping terminal 121, a supporting plate 14 is provided with a through hole and is arranged on the test connection assembly 13 and used for placing the PCB 8, the test thimble 132 penetrates through the through hole and is electrically connected with a test pad on the PCB 8, and the test equipment is used for testing the PCB 8, so that when the PCB 8 is replaced and tested, only the layout of the test thimble 132 in the test connection assembly 13 and a circuit connected with the test thimble 132 in the junction box 12 are required to be readjusted, the whole test fixture can be replaced, the test fixture cost of the PCB 8 can be reduced, and the whole test fixture cost can be avoided.
In an embodiment, the test fixture 1 further comprises a fixing component 15, and the fixing component 15 is connected with the test box and is used for fixing the PCB 8 on the supporting plate 14.
In this embodiment, the fixing component 15 is connected with the test box, and is used for fixing the PCB 8 on the supporting board 14, so that when the PCB 8 is tested, the PCB 8 is fixed on the supporting board 14, stability and reliability in the testing process are ensured, and accuracy of the test result is improved.
In one embodiment, the fixing assembly 15 includes a fixing bracket 151, a guide rod 152, a press buckle fixing plate 153 and a press buckle handle, wherein the fixing bracket 151 is disposed on the test box, a guide slot is disposed in the middle of the fixing bracket 151, the guide rod 152 is slidably connected with the guide slot, the press buckle fixing plate 153 is connected with the guide rod 152, and the press buckle handle is connected with the guide rod 152 and is used for driving the guide rod 152 to slide relative to the guide slot, so that the press buckle fixing plate 153 fixes the PCB 8 on the supporting plate 14.
As an example, the fixing bracket 151 is fixedly disposed on the test box, and the user adjusts the guide rod 152 to slide relative to the guide slot through the press button handle, so that the guide rod 152 drives the press button fixing plate 153 to fix the PCB 8 on the supporting plate 14, or releases the PCB 8 to replace a different PCB 8 for testing.
As an example, the side of the press-fastening fixing plate 153 opposite to the PCB 8 is provided with a press-fastening protrusion, and when the press-fastening fixing plate 153 fixes the PCB 8 on the pallet 14, the press-fastening protrusion abuts against the PCB 8. For example, the number and positions of the press-buckling protrusions may be set according to actual demands. The press-button fixing plate 153 is detachably connected with the guide rod 152, so that different press-button fixing plates 153 can be replaced to adapt to different PCB boards 8.
In this embodiment, the fixing bracket 151 is disposed on the test box, a guide groove is disposed in the middle of the fixing bracket 151, a guide rod 152 is slidably connected with the guide groove, a press buckle fixing plate 153 is connected with the guide rod 152, and a press buckle handle is connected with the guide rod 152 and is used for driving the guide rod 152 to slide relative to the guide groove, so that the press buckle fixing plate 153 fixes the PCB 8 on the supporting plate 14, the structure is simple, and meanwhile stability and reliability of the PCB 8 in the test process are ensured.
In one embodiment, the test connection assembly 13 includes a thimble fixing plate 131 and a test thimble 132, wherein the thimble fixing plate 131 is provided with a thimble fixing table, and the test thimble 132 is arranged on the thimble fixing table.
As an example, one surface of the thimble fixing plate 131 is disposed on the junction box 12, and the other surface is provided with thimble fixing tables, where the number, positions and heights of the thimble fixing tables can be set according to actual requirements, for fixing the test thimble 132. The test thimble 132 passes through the thimble fixing table to be electrically connected with a circuit in the junction box 12, thereby realizing electric signal transmission.
In this embodiment, the test connection assembly 13 includes a thimble fixing plate 131 and a test thimble 132, wherein the thimble fixing plate 131 is provided with a thimble fixing table, and the test thimble 132 is arranged on the thimble fixing table to fix the test thimble 132 through the thimble fixing table, so as to ensure that the test thimble 132 is more stable in the test process.
The embodiment provides a test system, as shown in fig. 4, which comprises test equipment and the test fixture 1, wherein the test equipment is connected with a test connection end 112 of the test fixture 1 and is used for testing the PCB 8 on the test fixture 1.
In one embodiment, the PCB 8 is a charging pile control board, and the testing device is used for performing vehicle charging test and vehicle discharging test on the PCB 8.
In the related art, the vehicle charge test and the vehicle discharge test of the charging stake control panel are only the metering test for the pure resistive load and the single test port. In the implementation, the vehicle charging test and the vehicle discharging test comprise multi-gear adjustment of a power supply input by the charging pile control board, and multi-load cycle test of resistance, sensibility and capacitive load switching, so that potential safety hazards caused by missing problems in detection of a single output port of the charging pile control board are avoided.
In one embodiment, the test connection end 112 comprises a power connection end, a load connection end and a first signal connection end, wherein the power connection end is arranged on a first outer wall of the shell, the load connection end is arranged on a second outer wall of the shell, the first signal connection end is arranged on a third outer wall of the shell, the test equipment comprises a main control equipment 2, an adjustable power supply 3, a load tester 4 and a multifunctional load 5, an output end of the adjustable power supply 3 is connected with the power connection end or the load connection end, a second signal connection end of the adjustable power supply 3 is connected with the first signal connection end, an input end of the multifunctional load 5 is connected with the load connection end or the power connection end, a third signal connection end of the multifunctional load 5 is connected with the first signal connection end, the load tester 4 is connected with the load connection end and the first signal connection end, or the load tester 4 is connected with the power connection end and the first signal connection end, and the main control equipment 2 is connected with the adjustable power supply 3, the load tester 4 and the multifunctional load 5.
The first signal connection end, the second signal connection end and the third signal connection end are used for testing CC signals and CP signals.
As an example, when the vehicle charge test is performed, the adjustable power supply 3 serves as an external power supply, the multifunction load 5 serves as a vehicle, and the vehicle charge test of the PCB board 8 is implemented. When the vehicle discharge test is carried out, the adjustable power supply 3 is used as the vehicle discharge, the multifunctional load 5 is used as the power load, and the vehicle discharge test of the PCB is realized.
As an example, the PCB board 8 is fixed by the test fixture 1 and electrically connected with the main control device 2, the adjustable power supply 3, the load tester 4 and the multifunctional load 5. The user can configure the operating parameters of the adjustable power supply 3, the load tester 4 and the multifunctional load 5 through the main control device 2. And then the main control equipment 2 receives information such as voltage, current, frequency, leakage value, grounding continuity, CP value and the like fed back by the adjustable power supply 3, the load tester 4, the test fixture 1 and the multifunctional load 5, and performs test analysis. The main control device 2 performs normal and abnormal judgment by integrating information fed back by the adjustable power supply 3, the load tester 4 and the multifunctional load 5, stores all test data of the PCB 8 and writes a unique SN code of the PCB 8 into Flash of the PCB 8 if all the information is normal, alarms and prompts on a display interface of the main control device 2 if the information is abnormal, further, can test abnormal items in a single step until the test data are normal, and further, if the abnormal items are eliminated, the test flow is finished by re-head, so that all the test items are normal at one time.
Illustratively, the operating state of the multi-functional load 5 may be adjusted, such as the multi-functional load 5 adjusting resistive and half-load output, the multi-functional load 5 adjusting resistive and full-load output, the multi-functional load 5 adjusting resistive and 1.25 times load output, the multi-functional load 5 adjusting capacitive and full-load output, the multi-functional load 5 adjusting inductive and full-load output, etc., so as to further refine the test conditions and adapt to different test environments.
Illustratively, the leakage voltage and current are injected through the adjustable power supply 3, for example, the adjustable power supply 3 is controlled to adjust the standard leakage voltage value of the injection according to the B-type leakage standard, the adjustable power supply 3 is controlled to adjust 85% of the standard leakage voltage value of the injection according to the B-type leakage standard, and the adjustable power supply 3 is controlled to adjust 115% of the standard leakage voltage value of the injection according to the B-type leakage standard, so that the performance of the PCB 8 under different leakage conditions is tested.
In this embodiment, the test device includes a main control device 2, an adjustable power supply 3, a load tester 4 and a multifunctional load 5, where an output end of the adjustable power supply 3 is connected to a power supply connection end or a load connection end, a second signal connection end of the adjustable power supply 3 is connected to a first signal connection end, an input end of the multifunctional load 5 is connected to the load connection end or the power supply connection end, a third signal connection end of the multifunctional load 5 is connected to the first signal connection end, the load tester 4 is connected to the load connection end and the first signal connection end, or the load tester 4 is connected to the power supply connection end and the first signal connection end, and the main control device 2 is connected to the adjustable power supply 3, the load tester 4 and the multifunctional load 5, so that multiple gear adjustment, resistance, inductance and capacitive load switching can be performed on a power supply input by a control board of the charging pile, so as to avoid potential safety hazards caused by missing detection of a single output port of the control board of the charging pile.
In one embodiment, the upper surface of the housing is further provided with a charging gun seat 113, a plug 114, a socket 115 and a wire pressing terminal stand 116, and the first clamping terminal 111 is electrically connected with the charging gun seat 113, the plug 114, the socket 115 and the wire pressing terminal stand 116.
As an example, the test device may not only be electrically connected to the PCB 8 through the test connection end 112, but also be electrically connected to the PCB 8 through the charging gun stand 113, the plug 114, the socket 115 and the wire pressing terminal stand 116 further provided on the upper surface of the housing, so as to improve flexibility of electrical connection.
Illustratively, the housing upper surface includes a first charging gun mount 113, a second charging gun mount 113, a plug 114, a socket 115, a first wire-pressing terminal block 116, and a second wire-pressing terminal block 116. The first charging gun seat 113, the first line pressing terminal stand 116 and the plug 114 are sequentially arranged on one side of the first groove, and the second charging gun seat 113, the second line pressing terminal stand 116 and the socket 115 are arranged on the other side of the first groove. The first charging gun seat 113 is matched with the socket 115, the plug 114 is matched with the second charging gun seat 113, and the first line pressing terminal stand 116 and the second line pressing terminal stand 116 are matched.
In an embodiment, the test device further comprises a leakage switch 6, the output end of the adjustable power supply 3 is connected with the power supply connection end or the load connection end through the leakage switch 6, and the main control device 2 is further connected with the leakage switch 6. In this embodiment, the output end of the adjustable power supply 3 is connected to the power supply connection end or the load connection end through the leakage switch 6, and the main control device 2 is further connected to the leakage switch 6, so that the main control device 2 can also perform a leakage test on the PCB 8. For example, the leakage switch 6 may be an a-type leakage switch 6, the leakage parameter is 30mA, and whether the leakage switch 6 is tripped automatically can be manually observed in the test process, which is used as a judgment of whether the system leakage parameter and CCID parameter are normal.
In one embodiment, as shown in fig. 5, the test system further includes a rotatable cradle head 7, and the rotatable cradle head 7 is used for placing the test fixture 1. In this embodiment, when the vehicle charging test is adjusted to the vehicle discharging test, the rotatable cradle head 7 may be rotated by 180 degrees, and the relative positions of the first outer wall, the second outer wall, and the third outer wall of the housing of the base 11 with respect to the adjustable power supply 3, the load tester 4, and the multifunctional load 5 are adjusted, so that the relative positions of the power supply connection end, the load connection end, and the first signal connection end are adjusted, so that the interface connection is conveniently performed when the vehicle charging test is adjusted to the vehicle discharging test.
The foregoing embodiments are merely illustrative of the technical solutions of the present invention, and not restrictive, and although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that modifications may still be made to the technical solutions described in the foregoing embodiments or equivalent substitutions of some technical features thereof, and that such modifications or substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202510901972.6A CN120405388B (en) | 2025-07-01 | 2025-07-01 | Test fixtures and test systems |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202510901972.6A CN120405388B (en) | 2025-07-01 | 2025-07-01 | Test fixtures and test systems |
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| CN120405388A true CN120405388A (en) | 2025-08-01 |
| CN120405388B CN120405388B (en) | 2026-01-06 |
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| CN219456224U (en) * | 2022-12-16 | 2023-08-01 | 西安太乙电子有限公司 | A test fixture for IGBT module |
| CN219777851U (en) * | 2023-02-28 | 2023-09-29 | 南京鲸翼电力新能源有限公司 | Fill electric pile main control board test fixture |
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2025
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| CN219456224U (en) * | 2022-12-16 | 2023-08-01 | 西安太乙电子有限公司 | A test fixture for IGBT module |
| CN219777851U (en) * | 2023-02-28 | 2023-09-29 | 南京鲸翼电力新能源有限公司 | Fill electric pile main control board test fixture |
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|---|---|
| CN120405388B (en) | 2026-01-06 |
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