CN119881600A - Integrated circuit product testing device and method thereof - Google Patents
Integrated circuit product testing device and method thereof Download PDFInfo
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- CN119881600A CN119881600A CN202510131890.8A CN202510131890A CN119881600A CN 119881600 A CN119881600 A CN 119881600A CN 202510131890 A CN202510131890 A CN 202510131890A CN 119881600 A CN119881600 A CN 119881600A
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- bottom supporting
- supporting plate
- conveyor belt
- circuit product
- fixedly connected
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the technical field of circuit product testing, in particular to an integrated circuit product testing device and a method thereof, comprising a first conveying belt, a testing table and a second conveying belt, wherein a detecting machine body is arranged on the testing table, a probe is arranged on the lower end face of the detecting machine body, a bottom supporting plate is arranged below the probe, mounting plates are arranged on the front side and the rear side of the bottom supporting plate, auxiliary conveying belts are arranged on the mounting plates, a Z-axis pressing strip is arranged on one side of the auxiliary conveying belt, a storage cavity for accommodating the bottom supporting plate is arranged on the testing table, a group of lateral main clamping plates are rotatably arranged on the horizontal two sides of the bottom supporting plate, and pressing plates are arranged on the lateral main clamping plates through a detachable structure.
Description
Technical Field
The invention relates to the technical field of circuit product testing, in particular to an integrated circuit product testing device and method.
Background
In the modern electronics industry, integrated circuits are widely used in various electronic devices as core elements for information processing and transmission. With the continuous development of integrated circuit technology and the improvement of integration level, the testing and verification of products becomes more complex. Traditional integrated circuit testing methods often rely on specialized testing equipment, and the testing process is not only time-consuming, but also susceptible to human operation and environmental factors, resulting in limited accuracy and reliability of the test results.
Existing test devices typically suffer from several problems:
Firstly, the existing test flow is mostly dependent on manual operation, is easily affected by human errors, is difficult to meet the requirement of large-scale production on automation, and limits the production efficiency and the output capacity.
Secondly, existing test devices are typically designed for specific types of integrated circuits, lack adaptability to different sized circuit products, and increase development and testing costs.
Disclosure of Invention
The present invention is directed to an integrated circuit testing device and a method thereof, which solve the problems set forth in the background art.
In order to achieve the aim, the invention provides the technical scheme that the integrated circuit product testing device comprises a first conveyor belt, a test bench and a second conveyor belt, wherein a detection machine body is fixedly arranged on the test bench, a probe is arranged on the lower end face of the detection machine body, a bottom supporting plate is arranged right below the probe and used for carrying out bottom supporting on a product, and the bottom supporting plate is driven by a jacking device and moves up and down on the test bench in a straight line and is used for jacking the product upwards to be in tight contact with the probe;
The front side and the rear side of the bottom supporting plate are respectively provided with a group of mounting plates, one sides of the two groups of mounting plates, which are close to each other, are respectively provided with a group of auxiliary conveying belts for conveying products from the first conveying belt to the second conveying belt, the two groups of mounting plates are linearly moved in opposite directions by a driving device and are used for adjusting the distance between the two groups of auxiliary conveying belts, one sides of the two groups of auxiliary conveying belts, which are away from each other, are respectively provided with a Z-axis pressing strip, the two groups of Z-axis pressing strips are driven by a linkage assembly and move along L-shaped tracks on the mounting plates, the linkage assembly is used for compressing and positioning the products forwards and backwards, and the jacking device is used for providing power for the linkage assembly;
The test bench is provided with a storage cavity for accommodating the bottom supporting plate, a group of lateral main clamping plates are rotatably arranged on the horizontal two sides of the bottom supporting plate, the lateral main clamping plates are driven by a driven assembly and perform 180-degree up-down overturning motion, and pressing sheets are arranged on the lateral main clamping plates through detachable structures and used for pressing and positioning the products left and right.
Preferably, the jacking device comprises an electric pushing cylinder, an end cover of the electric pushing cylinder is fixedly arranged on the bottom wall of the storage cavity, a piston column of the electric pushing cylinder extends outwards and is fixedly connected with the lower end face of the bottom supporting plate, a group of transverse pushing plates are fixedly connected to the front side and the rear side of the bottom supporting plate, and the transverse pushing plates are connected to the linkage assembly.
Preferably, the linkage assembly comprises a driven deflector rod, a driving deflector rod and a vertical push plate, wherein the vertical push plate is inserted in the mounting plate in a limiting manner, and the lower end of the vertical push plate extends into the storage cavity and is provided with a limiting perforation for accommodating the transverse push plate.
Preferably, the upper end of the vertical push plate stretches into the Z-axis pressing strip and is fixedly connected with a driving deflector rod, a driving chute for accommodating the driving deflector rod is formed in the Z-axis pressing strip, a rectangular slot for accommodating the Z-axis pressing strip is formed in the mounting plate, L-shaped matching grooves are formed in two sides of the rectangular slot, a driven deflector rod which is inserted into the L-shaped matching grooves is fixedly connected with the side wall of the Z-axis pressing strip, and the transverse displacement of the L-shaped matching grooves is consistent with that of the driving chute.
Preferably, the driven component comprises a first spring, a T-shaped push bar, a cylindrical pin, a rectangular moving seat, a second spring, a transverse rack and a spur gear, wherein the spur gear is fixedly sleeved on a rotating shaft, one end of the transverse rack is meshed with the spur gear, the other end of the transverse rack extends into a bottom supporting plate and is fixedly connected with the rectangular moving seat, and one side, close to the transverse rack, of the rectangular moving seat is fixedly connected with the second spring.
Preferably, the rectangular moving seat and the T-shaped pushing bar are both arranged in the bottom supporting plate in a limiting sliding manner, a first spring is fixedly arranged at the lower end of the T-shaped pushing bar, the upper end of the T-shaped pushing bar stretches into the rectangular moving seat and is fixedly connected with a cylindrical pin, and a lateral chute for accommodating the cylindrical pin is formed in the rectangular moving seat in a penetrating manner.
Preferably, the driving device comprises screw nuts, driving screws, belt pulleys, a transmission belt and a motor, wherein two groups of screw nuts are fixedly connected to the lower end of each group of mounting plates, the screw nuts are arranged in the test bench in a limiting sliding mode, one driving screw is inserted in each group of screw nuts, the output end of the motor is fixedly connected with one group of driving screws, the threads of the two driving screws in the same row are opposite in direction and are fixedly welded coaxially, a group of belt pulleys are sleeved on the driving screws connected with the motor and the driving screws in the same row, and the transmission belt is sleeved outside the two groups of belt pulleys.
Preferably, the heights of the first conveyor belt, the auxiliary conveyor belt and the second conveyor belt are gradually decreased, and a group of material guide plates are arranged between the first conveyor belt and the auxiliary conveyor belt and between the auxiliary conveyor belt and the second conveyor belt.
Preferably, the detachable component comprises an adjusting screw and a guide rod, wherein the guide rod is provided with four guide rods and is uniformly distributed at four corners of the pressing sheet, one end of the guide rod is fixedly connected with the pressing sheet, the other end of the guide rod penetrates through the lateral main clamping plate and is fixedly connected with a limiting disc, one end of the adjusting screw is fixedly connected with a rotating wheel, and the other end of the adjusting screw penetrates through the lateral main clamping plate and is in limiting running fit with the back of the pressing sheet.
An integrated circuit product testing method for an integrated circuit product testing device, the method comprising the steps of:
s1, sequentially and equidistantly arranging circuit products to be detected on a first conveyor belt, and conveying the circuit products to be detected onto an auxiliary conveyor belt one by the first conveyor belt;
s2, when the circuit product is just under the probe, the electric pushing cylinder is quickly opened, the piston column of the electric pushing cylinder extends outwards and pushes the bottom supporting plate to move upwards, in the process, the Z-axis pressing bar moves in an L-shaped track under the action of the linkage assembly, and the Z-axis pressing bar compresses and positions the circuit product forwards and backwards and moves upwards along with the circuit product, meanwhile, the lateral main clamping plate rotates upwards by 180 degrees under the action of the driven assembly, so that the pressing plate compresses and positions the two horizontal sides of the circuit product, and the circuit product positioned in a plurality of directions moves upwards along with the bottom supporting plate and is in abutting connection with the probe, so that stable detection is performed;
And S3, after the detection is finished, the piston column of the product is retracted inwards and pulls the bottom supporting plate to move downwards through the electric pushing cylinder, and in the process, the Z-axis pressing strip and the pressing sheet release the detected circuit product immediately, so that the product can be normally conveyed to the second conveying belt by the auxiliary conveying belt after the detection is finished.
Compared with the prior art, the invention has the beneficial effects that:
1. The invention forms an automatic testing device through the designs of the bottom supporting plate, the first conveying belt, the second conveying belt and the two groups of auxiliary conveying belts, can rapidly and continuously test integrated circuit products, remarkably reduces manual intervention and testing time, thereby improving the overall production efficiency, and provides accurate positioning through the design of the Z-axis pressing strip and the lateral main clamping plate, thereby ensuring that circuit products are positioned at the same testing position during each test, improving the testing consistency and reliability and reducing testing errors caused by inaccurate positioning.
2. According to the invention, the driven deflector rod, the driving deflector rod and the vertical push plate are matched with the L-shaped matching groove and the driving chute for use, so that the linear up-down motion of the transverse push plate can be converted into the L-shaped track motion of the Z-axis pressing bar, the Z-axis pressing bar can rapidly press and position the circuit product front and back before the bottom support plate lifts the product, and can keep moving upwards along with the bottom support plate after pressing, thereby effectively preventing the circuit product from shifting in the process of butting with the ejector pin in an upward movement manner, and improving the accuracy of a final test result.
3. According to the invention, through the design of the first spring, the T-shaped push bar, the cylindrical pin, the rectangular movable seat, the second spring, the transverse rack and the spur gear, the lateral main clamp plate can adaptively perform 180-degree up-down overturning movement according to the movement state of the bottom support plate, when the bottom support plate moves upwards, the lateral main clamp plate overturns upwards and performs compression positioning on a product in the horizontal direction, and when the bottom support plate moves downwards, the lateral main clamp plate overturns downwards and rapidly loosens the product, so that the product can be normally conveyed to the second conveyor belt by the auxiliary conveyor belt after detection.
4. Through setting up screw nut, drive screw, belt pulley, driving belt and motor cooperation and use, can realize the straight line motion in opposite directions of two sets of mounting panels to this adjusts the interval size between two sets of auxiliary conveyor belts and between two sets of side direction main plates, thereby can adapt to the circuit product of equidimension and shape, makes testing arrangement have stronger commonality and flexibility, can reduce the repetition investment to testing arrangement.
Drawings
Fig. 1 is a schematic perspective view of the structure of the present invention.
Fig. 2 is a schematic view of another view of the structure of the present invention.
FIG. 3 is a schematic view of the shell probe, mounting plate, auxiliary conveyor belt and test station of the present invention.
Fig. 4 is a perspective view of the auxiliary conveyor belt, the bottom support plate and the driving device according to the present invention.
Fig. 5 is a schematic view of the mounting plate, auxiliary conveyor belt, bottom support plate and driving device of the present invention.
Fig. 6 is a schematic perspective view of the mounting plate, auxiliary conveyor belt and Z-axis batten of the present invention.
Fig. 7 is a schematic view of the bottom support plate, the lateral push plate, and the jacking device of the present invention.
Fig. 8 is a schematic view, partly in section, of a bottom support plate according to the invention.
Fig. 9 is an exploded view of the side-to-side main plate and driven assembly of the present invention.
FIG. 10 is a schematic view of the mounting plate, auxiliary conveyor belt, lead screw nut, and Z-axis bead of the present invention.
FIG. 11 is an exploded view of the gear linkage assembly, Z-axis bead and mounting plate of the present invention.
In the figure, 1, a first conveyor belt; 2, a test bench, 201, a storage cavity, 202, a vertical chute, 3, a second conveyor belt, 4, a detection machine body, 5, a probe, 6, a mounting plate, 601, an L-shaped matching groove, 7, an auxiliary conveyor belt, 8, a screw nut, 9, a driving screw, 10, a belt pulley, 11, a driving belt, 12, a first motor, 13, a Z-axis layering, 14, a driven deflector rod, 15, a driving chute, 16, a driving deflector rod, 17, a vertical push plate, 18, a transverse push plate, 19, a bottom support plate, 20, an electric push cylinder, 21, a first spring, 22, a T-shaped push rod, 23, a cylindrical pin, 24, a rectangular moving seat, 25, a lateral chute, 26, a second spring, 27, a transverse rack, 28, a spur gear, 29, a rotating shaft, 30, a lateral main clamping plate, 31, an adjusting screw, 32, a tabletting and 33, and a guide rod.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1 to 11, the invention provides a technical scheme that an integrated circuit product testing device comprises a first conveyor belt 1, a test table 2 and a second conveyor belt 3, wherein a detection machine body 4 is fixedly arranged on the test table 2, a probe 5 is arranged on the lower end surface of the detection machine body 4, a bottom supporting plate 19 is arranged right below the probe 5 and is used for carrying out bottom supporting on products, the bottom supporting plate 19 is driven by a jacking device and moves up and down on the test table 2 in a straight line and is used for jacking up the products to be in tight contact with the probe 5, a group of mounting plates 6 are arranged on the front side and the rear side of the bottom supporting plate 19, one side, close to each other, of the two groups of mounting plates 6 is provided with a group of auxiliary conveyor belts 7 and is used for conveying the products from the first conveyor belt 1 to the second conveyor belt 3, the two groups of mounting plates 6 are in straight line opposite movement by a driving device and are used for adjusting the distance between the two groups of auxiliary conveyor belts 7, one side, two groups of auxiliary conveyor belts 7 are respectively provided with a Z-axis pressing bar 13, the two groups of Z-axis pressing bars 13 are driven by a component and move up and L-shaped tracks on the mounting plates 6 and are used for carrying out tight contact with the probes 5, a left side and a main clamping plate 30 is arranged on the two sides of the main clamping plate 30 and a main clamping plate 30 is arranged on the main clamping plate, and a main clamping plate 30 is arranged on the main clamping plate 30 and a side of the main clamping plate 30 side and a main clamping plate is arranged on the main clamping plate, and a main clamping plate 30 is rotatably and a side arranged on the main clamping plate 30.
Furthermore, the invention forms an automatic testing device through the designs of the bottom supporting plate 19, the first conveyor belt 1, the second conveyor belt 3 and the two groups of auxiliary conveyor belts 7, can rapidly and continuously test integrated circuit products, remarkably reduces manual intervention and testing time, thereby improving the overall production efficiency, and provides accurate positioning through the designs of the Z-axis pressing strip 13 and the lateral main clamping plate 30, so that the circuit products can be ensured to be positioned at the same testing position during each test, thereby improving the consistency and reliability of the test, and reducing testing errors caused by inaccurate positioning.
As shown in fig. 4 and 7, the jacking device includes an electric push cylinder 20, an end cover of the electric push cylinder 20 is fixedly arranged on a bottom wall of the storage cavity 201, a piston column of the electric push cylinder 20 extends outwards and is fixedly connected with a lower end surface of a bottom supporting plate 19, a group of transverse pushing plates 18 are fixedly connected to front and rear sides of the bottom supporting plate 19, and the transverse pushing plates 18 are connected to the linkage assembly.
Specifically, by opening the electric push cylinder 20, the piston rod thereof is extended outward and pushes the bottom support plate 19 to move up and down, and the lateral push plate 18 connected to the bottom support plate 19 is also moved up and down.
As shown in fig. 10 to 11, the linkage assembly includes a driven deflector rod 14, a driving deflector rod 16 and a vertical push plate 17, the vertical push plate 17 is inserted in the mounting plate 6 in a limiting manner, and the lower end of the vertical push plate 17 extends into the storage cavity 201 and is provided with a limiting perforation for accommodating the transverse push plate 18. The upper end of the vertical push plate 17 stretches into the Z-axis pressing bar 13 and is fixedly connected with a driving deflector rod 16, a driving chute 15 for accommodating the driving deflector rod 16 is formed in the Z-axis pressing bar 13, a rectangular slot for accommodating the Z-axis pressing bar 13 is formed in the mounting plate 6, L-shaped matching grooves 601 are formed in two sides of each rectangular slot, a driven deflector rod 14 which is inserted into the L-shaped matching grooves 601 is fixedly connected to the side wall of the Z-axis pressing bar 13, and the transverse displacement of the L-shaped matching grooves 601 is consistent with that of the driving chute 15.
Further, through setting up driven driving lever 14, initiative driving lever 16 and vertical push pedal 17 and L shape cooperation groove 601 and drive chute 15 cooperation use, can be with the straight line up-and-down motion of horizontal push pedal 18 change into the L shape orbit motion of Z axle press bar 13 for Z axle press bar 13 can compress tightly the location around the circuit product before bottom sprag board 19 jack-up fast, and can keep moving up the action along with bottom sprag board 19 continues after compressing tightly, thereby effectively prevent that the circuit product from shifting up and the thimble carries out the in-process of butt joint, with this accuracy that promotes final test result.
As shown in fig. 4, 8 and 9, the driven component comprises a first spring 21, a T-shaped push bar 22, a cylindrical pin 23, a rectangular moving seat 24, a second spring 26, a transverse rack 27 and a spur gear 28, wherein the spur gear 28 is fixedly sleeved on a rotating shaft 29, one end of the transverse rack 27 is meshed with the spur gear 28, the other end of the transverse rack 27 stretches into the bottom supporting plate 19 and is fixedly connected with the rectangular moving seat 24, and one side, close to the transverse rack 27, of the rectangular moving seat 24 is fixedly connected with the second spring 26. The rectangular movable seat 24 and the T-shaped push bar 22 are both mounted in the bottom supporting plate 19 in a limiting sliding manner, a vertical chute 202 for accommodating the T-shaped push bar 22 is formed in the side wall of the inside of the storage cavity 201, a first spring 21 is fixedly arranged at the lower end of the T-shaped push bar 22, the upper end of the T-shaped push bar 22 extends into the rectangular movable seat 24 and is fixedly connected with a cylindrical pin 23, and a lateral chute 25 for accommodating the cylindrical pin 23 is formed in the rectangular movable seat 24 in a penetrating manner.
Further, through the design of the first spring 21, the T-shaped push bar 22, the cylindrical pin 23, the rectangular movable seat 24, the second spring 26, the transverse rack 27 and the spur gear 28, the lateral main plate 30 can adaptively perform 180-degree up-down overturning motion according to the motion state of the bottom support plate 19, when the bottom support plate 19 moves up, the lateral main plate 30 overturns upwards and performs compression positioning on a product in the horizontal direction, and when the bottom support plate 19 moves down, the lateral main plate 30 overturns downwards and rapidly loosens the product, so that the product can be normally conveyed onto the second conveyor belt 3 by the auxiliary conveyor belt 7 after detection of the product is completed.
As shown in fig. 4 and 5, the driving device comprises screw nuts 8, driving screws 9, belt pulleys 10, a driving belt 11 and a first motor 12, wherein two groups of screw nuts 8 are fixedly connected to the lower end of each group of mounting plates 6, the screw nuts 8 are mounted in the test bench 2 in a limiting sliding manner, one driving screw 9 is inserted into each group of screw nuts 8, the output end of the first motor 12 is fixedly connected with one group of driving screws 9, the two driving screws 9 in the same row are opposite in screw thread direction and are coaxially welded and fixed, a group of belt pulleys 10 are sleeved on the driving screws connected with the first motor 12 and the driving screws in the same row, and the driving belt 11 is sleeved outside the two groups of belt pulleys 10 together.
Further, through setting up screw nut 8, drive screw 9, belt pulley 10, drive belt 11 and motor 12 cooperation use, can realize the straight line motion in opposite directions of two sets of mounting panels 6 to this adjusts the interval size between two sets of auxiliary conveyor belts 7 and between two sets of side direction main plate 30, thereby can adapt to the circuit product of different sizes and shapes, makes testing arrangement have stronger commonality and flexibility, can reduce the repetition investment to testing arrangement.
As shown in fig. 1 to 2, the heights of the first conveyor belt 1, the auxiliary conveyor belt 7 and the second conveyor belt 3 decrease in sequence, and the test bench 2 is provided with a set of material guiding plates between the first conveyor belt 1 and the auxiliary conveyor belt 7 and between the auxiliary conveyor belt 7 and the second conveyor belt 3. The arrangement is convenient for guiding and conveying the circuit products.
As shown in fig. 7 to 8, the detachable assembly includes an adjusting screw 31 and a guide rod 33, the guide rod 33 is provided with four guide rods and is uniformly distributed at four corners of the pressing sheet 32, one end of the guide rod 33 is fixedly connected with the pressing sheet 32, the other end of the guide rod 33 penetrates through the lateral main plate 30 and is fixedly connected with a limit disc, one end of the adjusting screw 31 is fixedly connected with a rotating wheel, and the other end of the adjusting screw 31 penetrates through the lateral main plate 30 and is in limit running fit with the back surface of the pressing sheet 32.
Further, by rotating the adjusting screw 31, the distance between the presser plate 32 and the side main plate 30 is changed, so that the presser plate 32 can be adapted to circuit products of different lengths.
The invention is used when in use: firstly, circuit products to be detected are sequentially and equidistantly arranged on a first conveyor belt 1 and are conveyed to an auxiliary conveyor belt 7 one by the first conveyor belt 1, when the circuit products are just under a probe 5, a piston column of the circuit products extends outwards and pushes a bottom supporting plate 19 to move upwards by starting an electric push cylinder 20, in the process, a transverse push plate 18 on the bottom supporting plate 19 drives a driving deflector 16 to move upwards, the driving deflector 16 acts on a driving chute 15 to enable a Z-axis pressing bar 13 to bear force to displace, under the cooperation of a driven deflector 14 and an L-shaped cooperation groove 601, the Z-axis pressing bar 13 is firstly subjected to horizontal movement and is subjected to front-back pressing positioning, and along with the further upward movement of the bottom supporting plate 19, the Z-axis pressing bar 13 also moves upwards along with the pressing and positioning of the circuit product, meanwhile, the T-shaped pushing bar 22 moves upwards along with the pressing and positioning of the circuit product, and is in contact with the top wall of the vertical chute 202, so that the T-shaped pushing bar 22 presses the first spring 21 under force and drives the cylindrical pin 23 to move downwards, the cylindrical pin 23 acts on the lateral chute 25, so that the rectangular moving seat 24 presses the second spring 26 under force and pushes the transverse rack 27 to extend outwards, the transverse rack 27 acts on the spur gear 28, the rotating shaft 29 drives the lateral main plate 30 to rotate upwards by 180 degrees, the pressing sheet 32 presses and positions the two horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upwards along with the bottom supporting plate 19 and is in contact with the probe 5, so that the circuit product is stably detected;
After the detection is finished, the electric push cylinder 20 is started again, the piston column of the electric push cylinder is retracted inwards and pulls the bottom supporting plate 19 to move downwards, in the process, the transverse push plate 18 on the bottom supporting plate 19 drives the driving deflector rod 16 to move downwards, the driving deflector rod 16 acts on the driving chute 15 again, so that the Z-axis pressing bar 13 is forced to move downwards firstly and then horizontally and releases circuit products, meanwhile, the T-shaped push bar 22 also moves downwards and gradually moves away from the top wall of the vertical chute 202, the T-shaped push bar 22 drives the cylindrical pin 23 to move upwards under the action of the elastic force of the first spring 21, the cylindrical pin 23 acts on the lateral chute 25, the rectangular moving seat 24 is forced and pulls and pushes the transverse rack 27 to retract inwards, the transverse rack 27 acts on the spur gear 28, and the rotating shaft 29 drives the lateral main clamping plate 30 to rotate downwards by 180 degrees, so that the pressing sheet 32 releases the circuit products, and the auxiliary conveyor belt 7 can be conveyed onto the second conveyor belt 3 normally after the detection of the products is finished.
An integrated circuit product testing method for an integrated circuit product testing device, the method comprising the steps of:
S1, sequentially and equidistantly arranging circuit products to be detected on a first conveyor belt 1, and conveying the circuit products to be detected onto an auxiliary conveyor belt 7 one by the first conveyor belt 1;
S2, when the circuit product is just under the probe 5, the electric pushing cylinder 20 is quickly opened, the piston column of the electric pushing cylinder extends outwards and pushes the bottom supporting plate 19 to move upwards, in the process, the Z-axis pressing bar 13 performs L-shaped track movement under the action of the linkage assembly, and performs pressing and positioning on the circuit product forwards and backwards and simultaneously moves upwards along with the circuit product, meanwhile, the lateral main plate 30 rotates upwards by 180 degrees under the action of the driven assembly, so that the pressing plate 32 performs pressing and positioning on the two horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upwards along with the bottom supporting plate 19 and is in abutting connection with the probe 5, so that stable detection is performed;
And S3, after the detection is finished, the piston column of the product is retracted inwards through the electric pushing cylinder 20 and pulls the bottom supporting plate 19 to move downwards, and in the process, the Z-axis pressing bar 13 and the pressing sheet 32 release the detected circuit products immediately, so that the products can be normally conveyed onto the second conveying belt 3 by the auxiliary conveying belt 7 after the detection is finished.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (10)
1. The integrated circuit product testing device comprises a first conveyor belt (1), a test table (2) and a second conveyor belt (3), and is characterized in that a detection machine body (4) is fixedly arranged on the test table (2), a probe (5) is arranged on the lower end face of the detection machine body (4), a bottom supporting plate (19) is arranged right below the probe (5) and used for carrying out bottom supporting on a product, and the bottom supporting plate (19) is driven by a jacking device and moves up and down on the test table (2) in a straight line and is used for jacking up the product to be in tight contact with the probe (5);
a group of mounting plates (6) are arranged on the front side and the rear side of the bottom supporting plate (19), a group of auxiliary conveying belts (7) are arranged on one sides, close to each other, of the two groups of mounting plates (6) and are used for conveying products from the first conveying belt (1) to the second conveying belt (3), the two groups of mounting plates (6) are linearly moved towards each other by a driving device and are used for adjusting the distance between the two groups of auxiliary conveying belts (7), Z-axis pressing strips (13) are arranged on one sides, away from each other, of the two groups of auxiliary conveying belts (7), the two groups of Z-axis pressing strips (13) are driven by a linkage assembly and move along L-shaped tracks on the mounting plates (6) and are used for compressing and positioning the products forwards and backwards, and the linkage assembly is powered by a jacking device;
The test bench (2) is provided with a storage cavity (201) for accommodating the bottom supporting plate (19), a group of lateral main clamping plates (30) are rotatably arranged on the horizontal two sides of the bottom supporting plate (19), the lateral main clamping plates (30) are driven by a driven component and perform 180-degree up-down overturning movement, and pressing sheets (32) are arranged on the lateral main clamping plates (30) through detachable structures and used for compressing and positioning the products left and right.
2. The integrated circuit product testing device according to claim 1, wherein the jacking device comprises an electric pushing cylinder (20), an end cover of the electric pushing cylinder (20) is fixedly arranged on the bottom wall of the storage cavity (201), a piston column of the electric pushing cylinder (20) extends outwards and is fixedly connected with the lower end face of a bottom supporting plate (19), a group of transverse pushing plates (18) are fixedly connected to the front side and the rear side of the bottom supporting plate (19), and the transverse pushing plates (18) are connected to the linkage assembly.
3. The integrated circuit product testing device according to claim 2, wherein the linkage assembly comprises a driven deflector rod (14), a driving deflector rod (16) and a vertical push plate (17), the vertical push plate (17) is inserted in the mounting plate (6) in a limiting mode, and the lower end of the vertical push plate (17) extends into the storage cavity (201) and is provided with a limiting through hole for accommodating the transverse push plate (18).
4. The integrated circuit product testing device according to claim 3, wherein the upper end of the vertical push plate (17) extends into the Z-axis pressing bar (13) and is fixedly connected with the driving deflector rod (16), a driving chute (15) for accommodating the driving deflector rod (16) is formed in the Z-axis pressing bar (13), a rectangular slot for accommodating the Z-axis pressing bar (13) is formed in the mounting plate (6), L-shaped matching grooves (601) are formed in two sides of the rectangular slot, the driven deflector rod (14) inserted into the L-shaped matching grooves (601) is fixedly connected to the side wall of the Z-axis pressing bar (13), and the transverse displacement of the L-shaped matching grooves (601) is consistent with the transverse displacement of the driving chute (15).
5. The integrated circuit product testing device according to claim 1, wherein the driven component comprises a first spring (21), a T-shaped push bar (22), a cylindrical pin (23), a rectangular moving seat (24), a second spring (26), a transverse rack (27) and a spur gear (28), the spur gear (28) is fixedly sleeved on a rotating shaft (29), one end of the transverse rack (27) is meshed with the spur gear (28), the other end of the transverse rack (27) stretches into a bottom supporting plate (19) and is fixedly connected with the rectangular moving seat (24), and one side, close to the transverse rack (27), of the rectangular moving seat (24) is fixedly connected with the second spring (26).
6. The integrated circuit product testing device according to claim 5, wherein the rectangular movable seat (24) and the T-shaped push rod (22) are both arranged in the bottom supporting plate (19) in a limiting sliding manner, a first spring (21) is fixedly arranged at the lower end of the T-shaped push rod (22), the upper end of the T-shaped push rod (22) stretches into the rectangular movable seat (24) and is fixedly connected with a cylindrical pin (23), and a lateral chute (25) for accommodating the cylindrical pin (23) is formed in the rectangular movable seat (24) in a penetrating manner.
7. The integrated circuit product testing device according to claim 1, wherein the driving device comprises screw nuts (8), driving screws (9), belt pulleys (10), a transmission belt (11) and a first motor (12), two groups of screw nuts (8) are fixedly connected to the lower end of each group of mounting plates (6), the screw nuts (8) are arranged in the test table (2) in a limiting sliding mode, one driving screw (9) is inserted into each group of screw nuts (8), the output end of the first motor (12) is fixedly connected with one group of driving screws (9), the threads of the two driving screws (9) in the same row are opposite in direction and are coaxially welded and fixed, a group of belt pulleys (10) are sleeved on the driving screws connected with the first motor (12) and the driving screws in the same row, and the two groups of belt pulleys (10) are sleeved with the transmission belt (11) jointly.
8. The integrated circuit product testing device according to claim 1, wherein the heights of the first conveyor belt (1), the auxiliary conveyor belt (7) and the second conveyor belt (3) decrease in sequence, and the test bench (2) is provided with a group of material guiding plates between the first conveyor belt (1) and the auxiliary conveyor belt (7) and between the auxiliary conveyor belt (7) and the second conveyor belt (3).
9. The integrated circuit product testing device according to claim 1, wherein the detachable component comprises an adjusting screw (31) and guide rods (33), the guide rods (33) are provided with four guide rods and are uniformly distributed at four corners of the pressing sheet (32), one end of each guide rod (33) is fixedly connected with the pressing sheet (32), the other end of each guide rod (33) penetrates through the lateral main clamping plate (30) and is fixedly connected with a limiting disc, one end of the adjusting screw (31) is fixedly connected with a rotating wheel, and the other end of the adjusting screw (31) penetrates through the lateral main clamping plate (30) and is in limiting running fit with the back surface of the pressing sheet (32).
10. An integrated circuit product testing method for an integrated circuit product testing apparatus according to any one of claims 1-9, characterized in that the method comprises the steps of:
S1, sequentially and equidistantly arranging circuit products to be detected on a first conveyor belt (1), and conveying the circuit products to be detected onto an auxiliary conveyor belt (7) one by the first conveyor belt (1);
S2, when the circuit product is just under the probe (5), the electric pushing cylinder (20) is quickly opened, the piston column of the electric pushing cylinder extends outwards and pushes the bottom supporting plate (19) to move upwards, in the process, the Z-axis pressing bar (13) moves in an L-shaped track under the action of the linkage assembly, and performs front-back pressing and positioning on the circuit product and simultaneously moves upwards along with the circuit product, meanwhile, the lateral main clamping plate (30) rotates upwards by 180 degrees under the action of the driven assembly, so that the pressing piece (32) performs pressing and positioning on the two horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upwards along with the bottom supporting plate (19) and is in abutting connection with the probe (5), so that stable detection is performed;
And S3, after the detection is finished, the piston column of the product is retracted inwards through the electric pushing cylinder (20) and pulls the bottom supporting plate (19) to move downwards, and in the process, the Z-axis pressing strip (13) and the pressing sheet (32) release the detected circuit products immediately, so that the products can be normally conveyed onto the second conveying belt (3) by the auxiliary conveying belt (7) after the detection is finished.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202510131890.8A CN119881600A (en) | 2025-02-06 | 2025-02-06 | Integrated circuit product testing device and method thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202510131890.8A CN119881600A (en) | 2025-02-06 | 2025-02-06 | Integrated circuit product testing device and method thereof |
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| CN119881600A true CN119881600A (en) | 2025-04-25 |
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| CN202510131890.8A Pending CN119881600A (en) | 2025-02-06 | 2025-02-06 | Integrated circuit product testing device and method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120846807A (en) * | 2025-09-23 | 2025-10-28 | 浙江易胜嘉合科技有限公司 | Quality inspection device for LED display screens after patching |
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2025
- 2025-02-06 CN CN202510131890.8A patent/CN119881600A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120846807A (en) * | 2025-09-23 | 2025-10-28 | 浙江易胜嘉合科技有限公司 | Quality inspection device for LED display screens after patching |
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