CN119511149A - Secondary circuit on-off simulation test device - Google Patents
Secondary circuit on-off simulation test device Download PDFInfo
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- CN119511149A CN119511149A CN202411728316.2A CN202411728316A CN119511149A CN 119511149 A CN119511149 A CN 119511149A CN 202411728316 A CN202411728316 A CN 202411728316A CN 119511149 A CN119511149 A CN 119511149A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
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Abstract
The invention relates to a secondary circuit on-off simulation test device, and belongs to the technical field of secondary circuit detection. The device comprises a signal generation module, a signal acquisition module, a signal processing module, a test analysis module, an intelligent diagnosis module, a control module, a display module, a data storage module, a power module and other structures. The invention can solve the problems of accuracy, safety and high efficiency of the existing secondary circuit on-off simulation test work and can rapidly detect the on-off state of the secondary circuit. Various states of the secondary circuit in actual operation are simulated, potential problems are found in advance, and the reliability of the power system is improved. The workload of manual testing is reduced, and the testing efficiency and accuracy are improved.
Description
Technical Field
The invention belongs to the technical field of secondary circuit detection, and particularly relates to a secondary circuit on-off simulation test device.
Background
With the promotion of smart power grid construction, intelligent substations are emerging in large numbers. The intelligent substation replaces hard cable connection of a conventional substation with a virtual secondary circuit based on networked digital communication, and Sampling Values (SV) of a station control layer, a spacer layer and a process layer and a general object-oriented substation event (GOOSE) of the intelligent substation are mainly transmitted through a digital communication network. The characteristics of digitalization and virtualization make the secondary circuit relationship complex, the number of the secondary circuits is numerous, and higher requirements are put on the on-off test of the secondary circuits, so that more efficient and accurate test technology is needed to verify the correctness of circuit connection. With the continuous development of power systems, the scale and complexity of power facilities such as transformer stations, power plants and the like are increasing, and the number and complexity of secondary circuits are correspondingly improved. This makes it difficult for conventional manual testing methods to meet the testing requirements of large-scale, complex power systems, and development of automated, intelligent testing techniques is urgently needed.
In the past, for the on-off condition of some elements in the secondary circuit, such as the on-off condition of a pressing plate, a visual method is often adopted, and the judgment is carried out by virtue of personal experience of a tester. The method has the advantages that the detection result is low in precision, misjudgment is easy to occur, and hidden faults are difficult to find. For example, if the pressing plate is turned on after the screws are fastened, it is difficult to accurately judge the pressing plate by visual observation, and hidden danger may be brought to the safe operation of the power system. Multimeters are a common detection tool in power operations, but in some specific secondary loop tests, multimeters have limitations. For example, when testing the on-off of the secondary circuit platen, the principle of the resistor and buzzer of the multimeter may not meet the test requirements due to the working environment and circuit characteristics of the platen, and the on-off condition of the platen cannot be effectively detected. The relay protection device is an important protection device of the power system, and the correct action of the relay protection device depends on the reliable operation of the secondary circuit. In order to ensure that the relay protection device can accurately and timely act, strict test is required to be carried out on the on-off condition of the secondary circuit. For example, when a power system fails, the relay protection device needs to acquire failure information through a secondary circuit, and judges whether tripping is needed according to the failure information. If the secondary circuit has faults such as open circuit, the relay protection device may not act correctly, thereby affecting the safe operation of the power system.
With the continuous development of the electric power technology, novel relay protection devices are continuously emerging, and the devices have higher requirements on the aspects of signal quality, transmission speed and the like of a secondary circuit. Therefore, a more accurate secondary circuit on-off simulation test technology is needed to meet the test requirements of the novel relay protection device. Once the power system fails, the production and life of people can be seriously influenced, and even the personal safety is endangered. Therefore, reliable operation of the secondary circuit must be ensured, and thus, the on-off condition of the secondary circuit needs to be comprehensively and accurately tested, and potential fault hidden dangers are discovered and eliminated in time. The reliability of the electrical equipment is directly related to the stable operation of the electrical system. The secondary circuit is taken as an important component of the power equipment, and the on-off condition of the secondary circuit has an important influence on the reliability of the power equipment. Through the secondary loop on-off simulation test, faults in the secondary loop can be found in advance, and the reliability of the power equipment is improved.
The methods commonly used in the past are as follows:
(1) Multimeter testing method:
the working principle is that the resistance gear of the universal meter can provide certain current, when the circuit connected with the two ends of the meter pen is conducted, the current can pass through the universal meter, a lower resistance value can be displayed or buzzing prompt sound is emitted, otherwise, when the circuit is disconnected, the current cannot pass through, and the resistance value displayed by the universal meter tends to infinity or does not emit buzzing sound.
The operation method comprises the steps of connecting a red meter pen of the universal meter to the head end of a loop for short-distance loop measurement, connecting a black meter pen to the tail end of the loop, indicating that the loop is conducted if a buzzer of the universal meter sounds, and possibly disconnecting the loop if the buzzer of the universal meter does not sound. For long-distance loop measurement, one end of the loop is firstly short-circuited to the ground, the other end of the loop is grounded through a buzzer of the universal meter, and if the on-off gear is conducted, a beeping sound is generated to prompt that the loop is conducted and the loop is the same cable core.
The electric measuring device has the defects that if the two ends of the loop are provided with voltages with different polarities, the short circuit of the on-off gear of the universal meter can cause tripping of an outlet of the protection device, under the condition that secondary loop cables are numerous, workers can easily operate too quickly, measurement is inaccurate or the situation of omission occurs, and the electric measuring gear and the on-off gear of the common universal meter are required to be manually switched, so that the risk of misoperation exists.
(2) Short-cut method:
The working principle is that a well-insulated wire is used for shorting certain points in a secondary circuit suspected of breaking faults. If the circuit returns to normal operation after the short circuit, the problem of disconnection exists between the two points which are in short circuit is indicated.
The operation method is divided into a local short connection method and a long short connection method. The local short-circuit method is to press the control elements such as the start button and the like to avoid releasing, then to sequentially short-circuit each contact or line segment in the loop by using the lead, and to restore the normal operation of the circuit when the short-circuit reaches a certain point, to indicate that the fault point is at the position, and the short-circuit method is to short-circuit two or more contacts or line segments at a time to check the fault, so that the defect that the local short-circuit method cannot check the fault under certain conditions can be overcome.
The short circuit operation needs to be carried out under the condition of confirming that the voltage is normal, and the load cannot be directly short-circuited, otherwise, other problems such as short circuit of a secondary circuit and the like can be caused.
(3) Voltage measurement method:
the working principle is that the on-off condition of the circuit is judged by measuring the voltage of certain points in the secondary circuit. If the voltage is not measured at the position where the voltage is supposed to be measured under normal conditions, or if the voltage value is abnormal, the circuit before the position is likely to have a problem of disconnection, otherwise, if the voltage is supposed to be measured at the position where the voltage is supposed to be not measured, the circuit is likely to have a problem of short circuit, misconnection and the like.
The operation method comprises the steps of using a voltmeter or an instrument with a voltage measurement function to correctly connect a meter pen to a position where voltage measurement is required, reading a voltage value, and analyzing and judging. For example, when the secondary circuit pressing plate is tested for on-off, the voltage at the two ends of the pressing plate can be measured first, if the voltage exists, whether the circuit is abnormal or not needs to be checked further, and if the voltage does not exist, on-off test can be performed.
The disadvantage is that for some complex secondary circuits, a thorough understanding of the circuit principle is required in order to correctly select the measurement point, otherwise erroneous conclusions may be drawn.
Therefore, how to overcome the defects of the prior art is a problem to be solved in the technical field of secondary circuit detection at present.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides a secondary circuit on-off simulation test device.
In order to achieve the above purpose, the technical scheme adopted by the invention is as follows:
The secondary circuit break-make simulation testing arrangement includes:
The signal generation module is used for simulating various signal sources in the secondary circuit;
the signal acquisition module is used for acquiring the electric signals in the secondary circuit;
The signal processing module is connected with the signal acquisition module and is used for processing the signal acquisition module so as to filter external interference signals;
The test analysis module is connected with the signal processing module and is used for carrying out test analysis according to the electric signals in the secondary circuit obtained after the processing of the signal processing module, so as to obtain the on-off state of the secondary circuit to be detected;
The intelligent diagnosis module is respectively connected with the signal processing module and the test analysis module and is used for performing intelligent diagnosis according to the electric signal in the secondary circuit obtained after the processing of the signal processing module and the on-off state of the secondary circuit to be detected obtained by the test analysis module, so as to obtain whether the secondary circuit to be detected is broken, poor in contact or damaged in elements;
The control module is respectively connected with the signal acquisition module, the test analysis module and the intelligent diagnosis module and is used for controlling the operation of the signal acquisition module, the test analysis module and the intelligent diagnosis module;
The display module is respectively connected with the test analysis module and the intelligent diagnosis module and is used for displaying the analysis result of the test analysis module and the diagnosis result of the intelligent diagnosis module;
The data storage module is respectively connected with the signal acquisition module, the signal processing module and the test analysis module and is used for storing the data acquired by the signal acquisition module, the analysis result of the test analysis module and the diagnosis result of the intelligent diagnosis module.
The power module is respectively connected with the signal acquisition module, the signal processing module, the test analysis module, the intelligent diagnosis module, the control module, the display module and the data storage module and is used for supplying power to the signal acquisition module, the signal processing module, the test analysis module, the intelligent diagnosis module, the control module, the display module and the data storage module.
Further, it is preferable that the secondary circuit includes a relay protection circuit, a control circuit, and a signal circuit.
Further, it is preferred that the signal acquisition module comprises a non-contact acquisition unit.
Further, preferably, the signal acquisition module is connected with the terminal in a clamping manner, and the external switch of the secondary circuit on-off simulation test device is shifted to realize remote signaling switching-in, so that the remote switching-in node is conducted with the public terminal, and the non-contact simulation switching-in is realized.
Further, preferably, the control module is used for detecting whether the secondary circuit on-off simulation test device is normally connected, whether parameters are set correctly, and if so, the acquisition module, the test analysis module and the intelligent diagnosis module can be controlled to work.
Further, preferably, the intelligent diagnosis module is further used for analyzing and judging the possible fault types and positions in the secondary circuit, and giving corresponding early warning prompts through the display module.
Further, the circuit protection module is preferably further connected with the power module and the signal acquisition module respectively and used for performing overvoltage protection, overcurrent protection and short-circuit protection, and is also preferably used for automatically cutting off the power module when the condition of overvoltage or overcurrent in the secondary loop is detected.
Further, it is preferable that the control module employs a programmable logic controller.
Further, it is preferable that the test analysis module is considered to be in a secondary circuit open state when the voltage signal is lower than 70V, and is otherwise in a path state.
The device mainly comprises a control module, a signal acquisition module, a power module and the like. The control module is responsible for the operation control of the whole device, including setting test parameters, starting test and the like.
According to the invention, through terminal clamping, an external switch is stirred to realize remote signaling opening (remote signaling opening: testing the port of positive power input used for remote signaling on-off), a remote control opening node (remote control opening: testing the port of remote control point closing correctness output) is conducted with a public end (the public end refers to the power positive port in a remote signaling and remote control loop), so that non-contact analog opening is realized, meanwhile, the switch supports mobile phone communication docking, 4G network or mobile phone Bluetooth starting test short circuit can be realized, personal injury accident event caused by improper operation caused by personnel contact short circuit test is avoided, and working efficiency and safety are improved.
The control module is used for detecting whether the secondary circuit on-off simulation test device is normally connected and whether parameters are set correctly, wherein the parameters refer to the closing time of a switch of the tester, and if the parameters are set correctly, the acquisition module, the test analysis module and the intelligent diagnosis module can be controlled to work.
The invention can solve the problems of accuracy, safety and high efficiency of the existing secondary circuit on-off simulation test work and can rapidly detect the on-off state of the secondary circuit. Various states of the secondary circuit in actual operation are simulated, potential problems are found in advance, and the reliability of the power system is improved. The workload of manual testing is reduced, and the testing efficiency and accuracy are improved. The method mainly comprises the following aspects:
1. Improving test efficiency
The traditional testing method may take a lot of time to check the on-off problem in the secondary circuit one by one. The test device can quickly detect the whole loop, and greatly shortens the test time. For example, in maintenance of a secondary circuit of a large-scale transformer station, a fault point can be rapidly determined, equipment outage time is reduced, and usability of a power system is improved.
And the automatic test can realize an automatic test flow, and reduce the complexity and uncertainty of manual operation. The device can automatically perform on-off test according to a preset program, does not need to manually and frequently switch test tools and judge test results, and improves the consistency and accuracy of the test.
2. Improving test accuracy
Accurate measurement, namely, a more accurate measurement result can be provided, and the on-off state of the secondary circuit can be accurately judged. Compared with the traditional method such as visual inspection or simple multimeter test, the testing device can detect tiny current and voltage changes, and erroneous judgment is avoided. For example, for some loops with unobvious on-off states, the device accurately determines the on-off conditions of the loops through high-precision sensors and analysis algorithms.
Eliminating interference, that is, in a complex electromagnetic environment, the traditional testing method is easy to be interfered, so that the testing result is inaccurate. The testing device of the invention has anti-interference capability, can effectively eliminate external interference factors, and ensures the reliability of the testing result. For example, in an environment close to high voltage equipment or in the presence of a strong electromagnetic field, the test device of the present invention can operate stably without being affected by external interference.
3. Enhanced security
The invention adopts non-contact test to judge the on-off of the loop through the change of the induction magnetic field or the electric field, and the invention does not need to directly contact the loop, thereby reducing the electric shock risk.
In the traditional testing method, safety accidents caused by improper operation of testers can be prevented. The test device generally has a clear operation flow and a safety protection mechanism, and can prevent misoperation. The testing device provided by the invention has the safety interlocking function, and can perform the test only after the parameters are correctly connected and set, so that equipment damage or personnel injury caused by misoperation is avoided.
4. Adapting to complex secondary circuit structure
In response to the trend of digitization and intellectualization, as the digitization and intellectualization of the power system are developed, the structure of the secondary circuit becomes more complicated. The traditional testing method is difficult to meet the testing requirement of the novel secondary circuit, and the testing device can adapt to different types of secondary circuits, including virtual secondary circuits in a digital communication network. For example, for an intelligent substation secondary circuit based on the Ethernet, the testing device can test through a network communication protocol, and accurately judge the on-off state of the circuit.
Different requirements of different power equipment and application scenes on secondary circuit on-off test are met. The testing device can be customized and adjusted according to specific testing requirements, and various complex testing scenes are met. For example, for substations of different voltage classes, power plants and secondary circuits in industrial control systems, the test device can provide corresponding test functions and parameter settings, ensuring the comprehensiveness and effectiveness of the test.
Compared with the prior art, the invention has the beneficial effects that:
1. Improving test accuracy
1. Accurately judging on-off state
The traditional testing method such as visual inspection and experience judgment is easy to misjudge, and the testing device adopts an advanced detection technology, so that the on-off state of the secondary circuit can be accurately determined. For example, by means of high-precision resistance measurement, current induction or signal transmission monitoring, the on state and the off state can be clearly distinguished, and erroneous judgment caused by subjective factors is avoided.
For some tiny on-off changes, such as poor contact, virtual connection and the like, the testing device can sensitively detect and give out clear indication. For example, when the situation that the contact resistance is slightly larger but is not completely disconnected exists in the secondary circuit, the device can timely find out the potential fault hidden trouble by accurately measuring the change of the resistance value.
2. Reducing external interference effects
In an actual test environment, various external interference factors, such as electromagnetic interference, noise, etc., may exist, and these factors may affect the accuracy of the test result. The secondary circuit on-off simulation test device is generally provided with an anti-interference design, can effectively shield external interference and ensures the reliability of test results.
For example, the stability and accuracy of the testing device in a complex electromagnetic environment can be improved by adopting the technical means of connecting the testing points through a shielded cable, removing noise through a filter circuit and the like.
2. Improving test efficiency
1. Rapid detection
The testing device can finish the on-off detection of the secondary circuit in a short time, and the testing time is greatly saved. Compared with the traditional manual testing method, the automatic testing device can be used for sequentially detecting a plurality of testing points rapidly, a testing tool does not need to be manually switched and a testing result is recorded, and testing speed and testing efficiency are improved.
For example, the test device of the present invention may complete a full test of a secondary circuit in a few seconds, whereas conventional methods may take a few minutes or even longer.
2. Intelligent diagnosis
The testing device has an intelligent diagnosis function, and can automatically analyze and judge the type and the position of faults possibly existing in the secondary circuit according to the detected signals. This not only reduces the time and effort of manual analysis, but also improves the accuracy and efficiency of fault diagnosis.
For example, when the secondary circuit is detected to be not in communication, the device can judge whether the circuit is disconnected, poor contact or faults caused by element damage and the like by analyzing the signal characteristics, and give corresponding fault prompt information, so that maintenance personnel can conveniently and rapidly locate and solve the problems.
3. Enhancing test security
1. Avoiding human error operation
The traditional testing method needs manual operation, and risks of misoperation, such as misconnection of a testing line, miscontact of a live part and the like, are easy to occur, and personal injury or damage to testing equipment can be caused to testing personnel. The secondary circuit on-off simulation test device generally adopts an automatic operation mode, reduces human intervention and reduces the possibility of misoperation.
For example, the device can be automatically tested by a preset test program, and a tester only needs to operate and monitor outside a safe distance, so that direct contact with a high-voltage part and a dangerous area is avoided.
2. Safety protection function
The testing device provided by the invention generally has various safety protection functions, such as overvoltage protection, overcurrent protection, short-circuit protection and the like, and can timely discover and process abnormal conditions in the testing process so as to protect the safety of testing equipment and personnel.
For example, when the testing device detects that overvoltage or overcurrent occurs in the secondary circuit, the testing power supply can be automatically cut off, so that the damage of the testing device and the occurrence of electric shock accidents of personnel are prevented.
4. Adapting to complex test environments
1. Multifunction performance
The secondary circuit on-off simulation test device generally has multiple test functions and can adapt to different types of secondary circuits and test requirements. For example, multiple tests such as resistance measurement, voltage measurement, current measurement, etc. can be performed simultaneously, and different types of signals (such as alternating current signals, direct current signals, digital signals, etc.) can be detected and analyzed.
In addition, the device can be customized according to actual needs, and specific test requirements, such as testing of high-voltage and high-current secondary circuits, testing of secondary circuits under special environments (such as high temperature, high humidity, strong magnetic field and the like), and the like, are met.
2. Portability and flexibility
To meet the requirements of field testing, test devices are often designed to be relatively portable and flexible. Can be conveniently carried to different test sites for testing, and is not limited by sites.
The testing device adopts a handheld design, is small in size, light in weight and simple and convenient to operate, and can carry out data transmission and remote control with an upper computer in a wireless communication mode, so that the flexibility and convenience of testing are improved.
Drawings
FIG. 1 is a schematic diagram of a secondary circuit on-off simulation test device, wherein the arrow direction is the trend of data or signals;
FIG. 2 is a schematic diagram of a secondary circuit on-off simulation test device, wherein the arrow direction is the trend of data or signals;
FIG. 3 is an external front view of a secondary loop on-off simulation test device in an application example;
fig. 4 is an internal structural diagram of the secondary circuit on-off simulation test device in the application example.
Detailed Description
The present invention will be described in further detail with reference to examples.
It will be appreciated by those skilled in the art that the following examples are illustrative of the present invention and should not be construed as limiting the scope of the invention. The specific techniques or conditions are not identified in the examples and are performed according to techniques or conditions described in the literature in this field or according to the product specifications. The materials or equipment used are conventional products available from commercial sources, not identified to the manufacturer.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless expressly stated otherwise, as understood by those skilled in the art. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. Further, "connected" as used herein may include wireless connections. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.
In the description of the present invention, unless otherwise indicated, the meaning of "a plurality" is two or more. The orientation or state relationship indicated by the terms "inner", "upper", "lower", etc. are orientation or state relationship based on the drawings, are merely for convenience of description and simplification of description, and do not indicate or imply that the apparatus or element in question must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the invention.
In the description of the present invention, unless explicitly stated or limited otherwise, the terms "mounted," "connected," and "configured" should be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected, mechanically connected, electrically connected, or indirectly connected via an intermediate medium. The specific meaning of the above terms in the present invention is understood by those of ordinary skill in the art according to the specific circumstances.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
Example 1
As shown in fig. 1, the secondary circuit on-off simulation test device includes:
a signal generation module 100 for simulating various signal sources in the secondary circuit;
The signal acquisition module 101 is used for acquiring an electric signal in the secondary circuit;
the signal processing module 102 is connected with the signal acquisition module 101 and is used for processing the signal acquisition module 101 so as to filter external interference signals;
The test analysis module 103 is connected with the signal processing module 102 and is used for carrying out test analysis according to the electric signals in the secondary circuit obtained after the processing of the signal processing module 102 so as to obtain the on-off state of the secondary circuit to be detected;
The intelligent diagnosis module 104 is respectively connected with the signal processing module 102 and the test analysis module 103 and is used for performing intelligent diagnosis according to the electric signals in the secondary circuit obtained after the processing of the signal processing module 102 and the on-off state of the secondary circuit to be detected obtained by the test analysis module 103, so as to obtain whether the secondary circuit to be detected is broken, poor in contact or damaged in elements;
The control module 105 is respectively connected with the signal acquisition module 101, the test analysis module 103 and the intelligent diagnosis module 104 and is used for controlling the operation of the signal acquisition module 101, the test analysis module 103 and the intelligent diagnosis module 104;
The display module 106 is respectively connected with the test analysis module 103 and the intelligent diagnosis module 104 and is used for displaying the analysis result of the test analysis module 103 and the diagnosis result of the intelligent diagnosis module 104;
the data storage module 107 is respectively connected with the signal acquisition module 101, the signal processing module 102 and the test analysis module 103, and is used for storing data acquired by the signal acquisition module 101, analysis results of the test analysis module 103 and diagnosis results of the intelligent diagnosis module 104.
The power module 108 is respectively connected with the signal acquisition module 101, the signal processing module 102, the test analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106 and the data storage module 107, and is used for supplying power to the signal acquisition module 101, the signal processing module 102, the test analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106 and the data storage module 107.
Example 2
As shown in fig. 2, the secondary circuit on-off simulation test device includes:
a signal generation module 100 for simulating various signal sources in the secondary circuit;
The signal acquisition module 101 is used for acquiring an electric signal in the secondary circuit;
the signal processing module 102 is connected with the signal acquisition module 101 and is used for processing the signal acquisition module 101 so as to filter external interference signals;
The test analysis module 103 is connected with the signal processing module 102 and is used for carrying out test analysis according to the electric signals in the secondary circuit obtained after the processing of the signal processing module 102 so as to obtain the on-off state of the secondary circuit to be detected;
The intelligent diagnosis module 104 is respectively connected with the signal processing module 102 and the test analysis module 103 and is used for performing intelligent diagnosis according to the electric signals in the secondary circuit obtained after the processing of the signal processing module 102 and the on-off state of the secondary circuit to be detected obtained by the test analysis module 103, so as to obtain whether the secondary circuit to be detected is broken, poor in contact or damaged in elements;
The control module 105 is respectively connected with the signal acquisition module 101, the test analysis module 103 and the intelligent diagnosis module 104 and is used for controlling the operation of the signal acquisition module 101, the test analysis module 103 and the intelligent diagnosis module 104;
The display module 106 is respectively connected with the test analysis module 103 and the intelligent diagnosis module 104 and is used for displaying the analysis result of the test analysis module 103 and the diagnosis result of the intelligent diagnosis module 104;
the data storage module 107 is respectively connected with the signal acquisition module 101, the signal processing module 102 and the test analysis module 103, and is used for storing data acquired by the signal acquisition module 101, analysis results of the test analysis module 103 and diagnosis results of the intelligent diagnosis module 104.
The power module 108 is respectively connected with the signal acquisition module 101, the signal processing module 102, the test analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106 and the data storage module 107, and is used for supplying power to the signal acquisition module 101, the signal processing module 102, the test analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106 and the data storage module 107.
The secondary circuit comprises a relay protection circuit, a control circuit and a signal circuit.
The signal acquisition module 101 includes a non-contact acquisition unit.
The signal acquisition module 101 is connected with the terminal in a clamping manner, and the external switch of the secondary circuit on-off simulation test device is shifted to realize remote signaling switching-in, so that the switching-on of the remote switching-out node and the public terminal is realized, and the non-contact simulation switching-in is realized.
The control module 105 is used for detecting whether the secondary circuit on-off simulation test device is normally connected, whether parameters are set correctly, and if the parameters are set correctly, the acquisition module 101, the test analysis module 103 and the intelligent diagnosis module 104 can be controlled to work.
The intelligent diagnosis module 104 is further configured to analyze and determine a type and a position of a fault that may exist in the secondary circuit, and give a corresponding early warning prompt through the display module 106.
The circuit protection module 109 is respectively connected with the power module 108 and the signal acquisition module 101 and is used for performing overvoltage protection, overcurrent protection and short-circuit protection, and is also used for automatically cutting off the power module 108 when the condition of overvoltage or overcurrent in the secondary circuit is detected.
The control module 105 employs a programmable logic controller.
In the test analysis module 103, when the voltage signal is lower than 70V, the secondary circuit is considered to be in a broken state, and otherwise, the secondary circuit is considered to be in a passage state.
The invention is applicable to different types of secondary circuits including, but not limited to, relay protection circuits, control circuits, signal circuits, and the like. The device has higher reliability and stability and can normally work in a complex electromagnetic environment.
The invention has a plurality of test modes, such as manual test, automatic test, continuous test and the like, so as to meet different test requirements.
The invention has the functions of data storage and analysis, and can record test data so as to facilitate subsequent analysis and fault investigation.
In view of convenience in field use, the device provided by the invention is small in size, light in weight and convenient to carry.
The signal acquisition module is responsible for acquiring the electric signals in the secondary loop, and can adopt a high-precision analog-to-digital converter (ADC) to carry out digital processing on the signals, so that the precision and the reliability of the test are improved.
The signal acquisition module and the signal processing module have stronger anti-interference capability, can effectively filter external interference signals, and ensure that the acquired signals are true and reliable.
The control module is responsible for controlling the operation of the whole device, including the selection of a test mode and the setting of test parameters. A Microcontroller (MCU) or Programmable Logic Controller (PLC) implementation may be employed.
The display module is used for displaying the test result and related information, and a Liquid Crystal Display (LCD) or a Light Emitting Diode (LED) indicator lamp can be adopted. The display content is simple and clear, and is convenient for an operator to read.
The power module provides stable power supply for the device. The device can be ensured to normally operate in different working environments by adopting a rechargeable battery or an external power adapter. The power module has the functions of overcharge, overdischarge, short-circuit protection and the like, and the safety of the device is improved.
The invention adopts a test algorithm based on combination of various methods such as resistance measurement, voltage measurement, current measurement and the like, can rapidly and accurately judge the on-off state of the secondary loop, and improves the accuracy and reliability of the test.
For complex secondary circuits, algorithms such as successive approximation method, dichotomy and the like are adopted for testing, so that the testing efficiency is improved.
Preferably, the invention designs a friendly man-machine interface, which is convenient for operators to operate and set. A graphical interface (GUI) may be used to operate by means of a touch screen or keys. The human-machine interface should provide clear operation prompts and error information to help the operator to use the device correctly.
The invention can save the test data into the internal memory or the external storage device for subsequent analysis and fault investigation.
The test device can analyze and process the stored test data to generate a test report and a fault diagnosis result.
Application instance
1. Device structure (as shown in figures 3 and 4)
1. And the control module adopts a PLC as a core control unit and is responsible for the operation control and data processing of the whole device.
2. The signal generation module:
specific electrical signals can be generated for simulating various signal sources in the secondary loop.
Signals of different frequencies, amplitudes and waveforms can be generated to meet the test requirements of different types of secondary circuits.
3. And a power supply module:
providing a stable power supply for the whole device, including a direct current power supply and an alternating current power supply.
The overvoltage and overcurrent protection device has overvoltage and overcurrent protection functions, and ensures the safe operation of the device.
2. Test flow
1. The connecting device comprises:
The signal output port and the signal input port of the test device are respectively connected to corresponding nodes of the secondary circuit.
The firm and reliable connection is ensured, and the bad contact effect on the test result is avoided.
2. And (3) starting a test:
When the start button is pressed, the control module starts the signal generating module to generate a test signal.
The signal enters the secondary loop through the switching module, and the signal detection module starts to detect the signal in the loop.
3. Ending the test:
after the test is completed, a stop button is pressed, and a stop signal is generated and detected.
Disconnecting the testing device from the secondary circuit, and sorting the testing equipment.
3. Application scenario
1. Secondary circuit test of transformer substation:
and carrying out on-off test on secondary circuits such as a relay protection device, a measurement and control device, a metering device and the like in the transformer substation.
The connection accuracy, the signal transmission quality and the like of the secondary circuit can be detected, and the safe operation of the transformer substation is ensured.
2. And (3) secondary loop test of the power plant:
the test device is used for testing secondary circuits of an electrical control system, an automation system and the like of a power plant.
The secondary circuit of equipment such as a generator, a transformer, a circuit breaker and the like can be detected, and the stable power generation of a power plant is ensured.
3. Industrial automation system testing:
the test device is suitable for testing secondary circuits such as various control systems, instrument systems and the like in the field of industrial automation.
The signal transmission among the devices such as the sensor, the actuator, the controller and the like can be detected, and the normal operation of the industrial automation system is ensured.
The foregoing has shown and described the basic principles, principal features and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present invention, and various changes and modifications may be made without departing from the spirit and scope of the invention, which is defined in the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (9)
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| Application Number | Priority Date | Filing Date | Title |
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| CN202411728316.2A CN119511149A (en) | 2024-11-28 | 2024-11-28 | Secondary circuit on-off simulation test device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120972034A (en) * | 2025-10-16 | 2025-11-18 | 南京亚电电力自动化有限公司 | A Visualized Intelligent Electrical Circuit Automatic Testing System and Test Method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120972034A (en) * | 2025-10-16 | 2025-11-18 | 南京亚电电力自动化有限公司 | A Visualized Intelligent Electrical Circuit Automatic Testing System and Test Method |
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