CN118688500A - Probe type connector performance testing equipment - Google Patents

Abstract

The embodiment of the application provides probe type connector performance detection equipment. The probe type connector performance detection device comprises a tester, a resistor disc, a power supply and an upper computer. The tester comprises a base, a bracket, a placing plate and a force measuring mechanism; the accommodating groove of the placing plate is used for placing the probe type connector to be tested. The force measuring mechanism comprises a first driving device, a pressure sensor and at least one detection probe, wherein the first driving device drives the pressure sensor and the detection probe to be arranged in a sliding manner along the height direction of the tester relative to the base, and the pressure sensor is used for detecting the elasticity of the probe type connector. The resistive disk is used to measure the impedance and current of the probe connector. Therefore, the detection probe is controlled to press down the probe type connector to be detected so as to measure the elastic force of the probe type connector, and meanwhile, the power supply and the resistor disc are conducted with the probe type connector to be detected, so that the measurement of the current and the impedance of the probe type connector is realized, the detection duration of at least one probe type connector is shortened, and the detection rate is improved.

Description

Probe type connector performance testing equipment

Technical Field

The present application relates to the field of connector testing, and in particular to a probe-type connector performance testing device.

Background Art

Pogo pin is a spring-type probe precision connector made of three basic components: needle shaft, spring, and needle tube. It can be used in some small and delicate electronic products such as mobile phones. It is widely used in semiconductor equipment to play a connecting role.

During the production process, it is necessary to test whether the spring force, current and contact resistance of the product meet the design to ensure that the Pogo pin works stably and reliably. Current tests usually use different equipment at different stations to perform spring force tests, current tests and impedance tests, resulting in long testing time and low testing efficiency.

Summary of the invention

An embodiment of the present application provides a probe-type connector performance testing device, which can be designed to simultaneously complete elastic force testing, current testing and resistance testing of at least one probe-type connector, reduce the testing time of the spring probe and improve the testing efficiency.

The probe connector performance detection device provided in the embodiment of the present application includes a tester, a resistor disk, a power supply and a host computer. The tester includes a base, a bracket, a placement plate and a force measuring mechanism; the bracket is connected to the base, the placement plate is placed on the top surface of the base, the force measuring mechanism is installed on the bracket, and at least one accommodating groove is formed on the placement plate, and the accommodating groove is used to place the probe connector to be tested; the force measuring mechanism includes a first driving device, a pressure sensor and at least one detection probe, the pressure sensor and the detection probe are connected to the first driving device, the first driving device drives the pressure sensor and the detection probe to slide relative to the base along the height direction of the tester, and the pressure sensor is used to detect the elastic force of the probe connector. The resistor disk is electrically connected to the tester, and the resistor disk is used to measure the impedance and current of the probe connector between the detection probe and the placement plate. The power supply is electrically connected to the tester. The host computer is electrically connected to the tester, the resistor disk and the power supply.

In certain embodiments, the first driving device includes a guide member, a sliding member and a motor, wherein the guide member is connected to the bracket, and the sliding member is slidably disposed on the guide member; one end of the pressure sensor is connected to the sliding member, and the other end is connected to the detection probe; the motor is connected to the sliding member, and the motor is used to drive the sliding member to drive the pressure sensor and the detection probe to slide relative to the guide member along the height direction of the tester.

In some embodiments, the force measuring mechanism further includes an insulating member, one end of the insulating member is connected to the pressure sensor, and the other end of the insulating member is connected to the detection probe.

In some embodiments, the probe-type connector performance testing equipment also includes a suction device electrically connected to a host computer, the suction device is connected to a first driving device, the first driving device drives the suction device to slide relative to the base along the height direction of the tester, and the suction device is used to suck in the probe-type connector after testing.

In some embodiments, the probe-type connector performance testing equipment also includes a second driving device, which is connected to the placement plate, and the second driving device is used to drive the placement plate to move relative to the base along the length direction and/or width direction of the tester, so that the probe-type connector to be tested in at least one accommodating groove is aligned with the suction device along the height direction of the tester.

In certain embodiments, the probe-type connector performance detection device further includes an image acquisition device mounted on the base, and the image acquisition device is used to capture an image of the probe-type connector.

In certain embodiments, the probe-type connector performance testing device further includes a mechanical clamp connected to the base, and the mechanical clamp is used to place the probe-type connector to be tested into the receiving groove.

In certain embodiments, the probe-type connector performance testing device further includes a temperature measuring component, wherein the temperature measuring component is disposed on the base and is used to measure the temperature of the probe-type connector to be tested.

In certain embodiments, the surface of the placement plate is plated with gold.

In certain embodiments, the surface of the detection probe is plated with gold.

In the probe connector performance testing device of the embodiment of the present application, the detection probe is controlled to move to press down the probe connector to be tested to measure the elastic force of the probe connector, while the power supply and the resistor disk are connected to the probe connector to be tested, thereby enabling the measurement of the power supply and impedance of the probe connector. The present application completes the test items that were originally tested at at least two workstations at one workstation, shortening the detection time of at least one probe connector and improving the detection rate.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application, and those skilled in the art can obtain other drawings based on these drawings without creative work.

FIG. 1 is a schematic structural diagram of a probe-type connector performance testing device according to an embodiment of the present application.

FIG. 2 is another schematic diagram of the structure of the probe-type connector performance testing device according to an embodiment of the present application.

FIG. 3 is a schematic structural diagram of a force measuring mechanism according to an embodiment of the present application.

Explanation of the main component symbols: probe-type connector performance testing equipment 1000, tester 100, base 10, top surface 11, bracket 20, placement plate 30, accommodating groove 301, force measuring mechanism 40, first driving device 41, guide member 411, sliding member 412, motor 413, pressure sensor 42, detection probe 43, resistor disk 200, power supply 300, host computer 400, suction device 500, second driving device 600, image acquisition device 700, mechanical clamp 800, temperature measuring component 900.

DETAILED DESCRIPTION

The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

In the description of the present application, it should be understood that the terms, "length", "width", "top", "bottom", "inside", "outside", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

In the description of this application, it should be understood that terms such as "first" and "second" are only used to distinguish similar objects and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features.

In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or mutual communication; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

The disclosure below provides many different embodiments or examples to realize the different structures of the present application. In order to simplify the disclosure of the present application, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present application.

Referring to Figures 1 and 2, the probe connector performance testing device 1000 provided in the embodiment of the present application includes a tester 100, a resistor disk 200, a power supply 300 and a host computer 400. The tester 100 includes a base 10, a bracket 20, a placement plate 30 and a force measuring mechanism 40. The bracket 20 is connected to the base 10, the placement plate 30 is placed on the top surface 11 of the base 10, the force measuring mechanism 40 is installed on the bracket 20, and at least one accommodating groove 301 is formed on the placement plate 30, and the accommodating groove 301 is used to place the probe connector to be tested.

The force measuring mechanism 40 includes a first driving device 41, a pressure sensor 42 and at least one detection probe 43. The pressure sensor 42 and the detection probe 43 are connected to the first driving device 41. The first driving device 41 drives the pressure sensor 42 and the detection probe 43 to slide relative to the base 10 along the height direction of the tester 100. The pressure sensor 42 is used to detect the elastic force of the probe type connector.

The resistor disk 200 is electrically connected to the tester 100, and is used to measure the impedance and current of the probe type connector between the detection probe 43 and the placement board 30. The power supply 300 is electrically connected to the tester 100. The host computer 400 is electrically connected to the tester 100, the resistor disk 200 and the power supply 300.

In the probe connector performance testing device 1000 of the embodiment of the present application, by controlling the detection probe 43 to move and press down the probe connector to be tested to measure the elastic force of the probe connector, the power supply 300 and the resistor disk 200 are connected to the probe connector to be tested, thereby enabling the measurement of the current and impedance of the probe connector. The present application completes the three test items of elastic force, current and resistance that were originally tested at at least two workstations at one workstation, thereby shortening the detection time of at least one probe connector and improving the detection rate.

It should be noted that in this application, for the convenience of writing, the height direction of the tester 100 is defined as the Z-axis direction, the width direction of the tester 100 is defined as the Y-axis direction, and the length direction of the tester 100 is defined as the X-axis direction.

Specifically, the detection principle of the probe connector performance detection device 1000 is to electrically connect the positive and negative electrodes of the power supply 300 to the resistor disk 200 through two wires respectively, and the resistor disk 200 is electrically connected to the detection probe 43 through one wire, and then electrically connected to the placement board 30 through another wire. The probe connector is placed on the placement board 30 through the accommodating groove 301, and the first driving device 41 drives the detection probe 43 to move along the Z-axis direction toward the placement board 30 until the detection probe 43 abuts against the side of the probe connector to be tested away from the placement board 30 to apply an elastic force to the probe connector, and the pressure sensor 42 connected to the detection probe 43 can detect the magnitude of the elastic force. At the same time, the power supply 300 is connected to the resistor disk 200, and the resistor disk 200 is electrically connected to the detection probe 43 and the placement plate 30. When the detection probe 43 moves along the Z-axis direction and contacts the probe connector to be tested, the power supply 300, the resistor disk 200 and the probe connector to be tested are turned on. The current and resistance of the probe connector to be tested can be detected through the detection circuit of the resistor box. The measured elastic force value, working current and resistance value of the probe connector can be output to the host computer 400 software module for display.

The user can judge whether the probe connector meets the design according to the obtained elastic force value, working current and resistance value of the probe connector, that is, to ensure whether the probe connector can be stable and reliable during operation. The above values can also be used to predict the life of the probe connector, and estimate how many times the probe connector can be used normally.

Please refer to FIG. 1 . In some embodiments, the number of the receiving slot 301 can be one, the number of the detection probe 43 can also be one, and the receiving slot 301 and the detection probe 43 are aligned along the Z-axis direction. In this way, when the number of probe-type connectors to be tested is small, each probe-type connector to be tested can be placed in the receiving slot 301 in turn to test the elastic force value, working current and resistance value, and the test items that were originally tested at at least two stations can be completed at one station, which shortens the detection time of a single probe-type connector and improves the detection rate.

In some embodiments, there are multiple probe connectors to be tested, accommodating slots 301, and detection probes 43, wherein the number of detection probes 43 is less than the number of probe connectors to be tested and accommodating slots 301, and the number of probe connectors to be tested inserted into accommodating slots 301 may be less than or equal to the number of accommodating slots 301. In this way, when there are a large number of probe connectors to be tested and a small number of detection probes 43, a small number of detection probes 43 can be used to perform elastic force, current, and impedance tests on a large number of probe connectors to be tested in batches, thereby reducing the time for loading and thus improving the detection rate.

It is understandable that when the number of the detection probes 43 is less than the number of the probe connectors to be tested and the accommodating groove 301, the probe connectors to be tested on the accommodating groove 301 can be divided into a first group and a second group. Along the Z-axis direction, the probe connectors to be tested aligned with the detection probe 43 group are the first group, and the remaining probe connectors to be tested are the second group. The probe connector performance detection device 1000 can also include a motion component. The motion component is connected to the placement plate 30 or the first drive device 41, and the motion component is used to drive the placement plate 30 or the pressure sensor 42 and the detection probe 43 to move in the plane formed by the X-axis direction and the Y-axis direction. When detecting the first group of probe connectors, the detection probe 43 is driven by the first drive device 41 to move in the direction close to the placement plate 30 along the Z-axis direction so that the detection probe 43 applies an elastic force to the probe connector, and while measuring the elastic force, the impedance and current of each probe connector in the first group can also be measured.

After the detection of the first group of probe-type connectors is completed, if the motion component is connected to the placement plate 30, the motion component drives the placement plate 30 to move in the plane formed by the X-axis direction and the Y-axis direction so that part of the second group of probe-type connectors to be tested moves to a position aligned with the detection probe 43. The first driving device 41 drives the detection probe 43 to move in the direction close to the placement plate 30 along the Z-axis direction so that the detection probe 43 applies elastic force to the probe-type connector, and the impedance and current of each probe-type connector in the second group can be measured while measuring the magnitude of the elastic force.

If the motion component is connected to the first driving device 41, the motion component drives the pressure sensor 42 and the detection probe 43 to move in the plane formed by the X-axis direction and the Y-axis direction so that the detection probe 43 moves to a position aligned with a part of the second group of probe-type connectors to be tested. The first driving device 41 drives the detection probe 43 to move along the Z-axis direction toward the placement plate 30 so that the detection probe 43 applies an elastic force to the probe-type connector. While measuring the size of the elastic force, the impedance and current of each probe-type connector in the second group can also be measured.

Repeat the above operation until all probe connectors have been tested. In this way, the first driving device 41 drives the test probe 43 to slide downward along the Z axis to measure the elastic force of the probe connector, and at the same time, the probe connector is connected to the resistor disk 200 and the power supply 300 to facilitate the measurement of the resistance and current of the probe connector.

After completing the inspection of some probe connectors, the motion component drives the probe connectors to be tested or the detection probe 43 on the placement plate 30 to move so that the remaining probe connectors to be tested are aligned with the detection probe 43, and then the same elastic force, current and resistance tests are performed. This can reduce the time for repeated unloading and loading, and greatly improve the inspection rate.

It should be noted that when the motion component drives the placement plate 30 to move in the plane formed by the X-axis direction and the Y-axis direction, the movement mode can be that the placement plate 30 slides along the X-axis direction and/or the Y-axis direction relative to the base 10, or the placement plate 30 rotates relative to the base 10 on the plane formed by the X-axis direction and the Y-axis direction, and there is no limitation here.

In some embodiments, there are multiple probe connectors to be tested, accommodating slots 301, and detection probes 43, and the number of probe connectors to be tested, accommodating slots 301, and detection probes 43 corresponds to each other. Along the Z-axis direction, each accommodating slot 301 and the corresponding detection probe 43 are aligned. In this way, multiple detection probes 43 cooperate with multiple accommodating slots 301, and the first driving device 41 simultaneously drives multiple detection probes 43 to slide downward along the Z-axis to simultaneously measure the elastic force of multiple probe connectors, and also connects multiple probe connectors to the resistor disk 200 and the power supply 300 to facilitate the measurement of the resistance and current of each probe connector. At the same time, elastic force detection, current detection, and impedance detection are performed on multiple probe connectors to be tested, which improves the performance detection efficiency of multiple probe connectors to be tested and saves time.

The plurality of receiving grooves 301 on the placement plate 30 may be arranged in a rectangular array or in a circular array, which is not limited here. Accordingly, the detection probes 43 are arranged in the same manner as the receiving grooves 301 .

In some embodiments, at least one adsorption hole is formed on the placement plate 30, and the adsorption hole is arranged corresponding to the receiving groove 301 and is connected to the receiving groove 301. In this way, when the probe connector to be tested is inserted into the receiving groove 301, the adsorption hole can adsorb the probe connector to prevent the probe connector from moving before the detection probe 43 is pressed down to abut against the probe connector, thereby affecting the subsequent measurement structure.

In some embodiments, the placement plate 30 may also be provided with an air channel, the air channel is connected to the adsorption air hole, the air channel is connected to the external device to provide negative pressure, and the air channel can provide an air flow channel with negative pressure to the adsorption air hole, so that the adsorption air hole can adsorb the probe-type connector to be tested in the receiving groove 301. It can be understood that when the detection probe 43 abuts against the probe-type connector to be tested, the external device is controlled to disconnect the negative pressure provided to the air channel, so that the adsorption air hole loses the adsorption force to avoid interference with the elastic force value measured by the probe-type connector.

The probe type connector performance testing device 1000 may further include a platform 50, on which the tester 100, the resistor disk 200, the power supply 300 and the host computer 400 are all placed. In some embodiments, a support leg 13 is provided under the base 10, and the support leg 13 is used to contact the platform 50 to reduce the wear of the platform 50 on the bottom surface of the base 10.

Please refer to FIG. 1 and FIG. 2. In some embodiments, a plurality of buttons 12 are provided on the base 10. The buttons 12 can be used to control whether the first driving device 41 drives the pressure sensor 42 and the detection probe 43 to slide up or down along the Z-axis direction; and control the speed mode of the first driving device 41 driving the pressure sensor 42 and the detection probe 43 to slide along the Z-axis direction, such as high speed, medium speed, low speed, uniform acceleration, uniform deceleration or uniform speed; the buttons 12 can also be used to control the height of the first driving device 41 driving the pressure sensor 42 and the detection probe 43 to slide up or down along the Z-axis direction; the buttons 12 can also be used to control the first driving device 41 to drive the pressure sensor 42 and the detection probe 43 to start sliding or stop sliding along the Z-axis direction. The buttons 12 can also be used to control the number of times the first driving device 41 drives the pressure sensor 42 and the detection probe 43 to squeeze the probe connector to be tested, the duration of each squeezing, and the interval between two adjacent squeezings.

The user can control the specific movement mode of the pressure sensor 42 and the detection probe 43 through the button 12. The user can control how the pressure sensor 42 and the detection probe 43 move relative to the probe connector according to different types of probe connectors and the usage scenarios of the probe connector. For example, if you need to simulate the use of the probe connector when using an electronic cigarette, the user can control the detection probe 43 to press down and hold the probe connector for 5 seconds and then release it through the button 12, and then press down and hold it again after an interval of 5 seconds, and repeat it 10,000 times, which can eventually simulate the current resistance and life of the probe connector when using an electronic cigarette, and at the same time, it can also test the elasticity and impedance in real time.

In some embodiments, the surface of the placement board 30 is gold-plated. In this way, the influence of the placement board 30 on the impedance test of the probe connector can be reduced, so that the impedance of the probe connector measured is close to the real value.

In some embodiments, the surface of the detection probe 43 is gold-plated. In this way, the influence of the detection probe 43 on the impedance test of the probe connector can be reduced, so that the measured impedance of the probe connector is close to the real value.

In some embodiments, the surface of the placement board 30 and the surface of the detection probe 43 are gold-plated, thereby further reducing the impact of the external resistance of the probe connector on the probe connector by the probe connector performance detection device 1000, making the measured impedance of the probe connector closer to the true value, thereby improving the accuracy of the impedance detection of the probe connector by the probe connector performance detection device 1000.

Referring to FIG. 2 and FIG. 3 , in some embodiments, the first driving device 41 may include a guide member 411, a sliding member 412, and a motor 413. The guide member 411 is connected to the bracket 20, and the sliding member 412 is slidably disposed on the guide member 411. One end of the pressure sensor 42 is connected to the sliding member 412, and the other end is connected to the detection probe 43. The motor 413 is connected to the sliding member 412, and the motor 413 is used to drive the sliding member 412 to drive the pressure sensor 42 and the detection probe 43 to slide relative to the guide member 411 along the height direction of the tester 100.

In this way, under the driving action of the motor 413, the sliding member 412 can drive the pressure sensor 42 and the detection probe 43 to slide along the Z-axis direction relative to the guide member 411 toward the placement plate 30, so that the detection probe 43 is pressed down to abut against the probe connector to be tested, thereby allowing current to be conducted between the power supply 300 and the resistor disk 200 and the probe connector to be tested, thereby achieving simultaneous measurement of the elastic force, current and resistance of the probe connector, shortening the detection time and improving the detection rate.

After the measurement is completed, the motor 413 drives the sliding member 412 to drive the pressure sensor 42 and the detection probe 43 to slide along the Z-axis direction relative to the guide member 411 in the direction away from the placement plate 30, so as to release the resistance of the detection probe 43 to the probe connector, thereby facilitating the removal of the measured probe connector on the placement plate 30.

The sliding member 412 is connected to the output end of the motor 413, and the guide member 411 cooperates with the sliding member 412. The guide member 411 can be a slide groove or a slide rail, etc., and the sliding member 412 can be a roller or a slider, etc. The number of the sliding members 412 can be 1, 2, or 3, etc., which is not limited here.

In some embodiments, the first driving device 41 may further include two blocks, which are respectively arranged at both ends of the guide member 411 along the Z-axis direction. The blocks can prevent the sliding member 412 from slipping off the guide member 411.

In some embodiments, the force measuring mechanism 40 may further include an insulating member, one end of the insulating member is connected to the pressure sensor 42 , and the other end of the insulating member is connected to the detection probe 43 .

Since the pressure sensor 42 is connected to the detection probe 43, when the detection probe 43 abuts against the probe connector, the pressure of the probe connector on the detection probe 43 will be transmitted to the pressure sensor 42. Since the tester is electrically connected to the detection circuit in the resistor disk 200, in order to prevent the charge on the detection probe 43 from being transmitted to the pressure sensor 42 and destroying the energized elements inside the pressure sensor 42, an insulating member is provided between the detection probe 43 and the pressure sensor 42 to prevent the pressure sensor 42 from being damaged.

Please refer to Figure 2. In some embodiments, the probe-type connector performance testing equipment 1000 also includes a suction device 500 electrically connected to the host computer 400. The suction device 500 is connected to the first driving device 41. The first driving device 41 drives the suction device 500 to slide relative to the base 10 along the height direction of the tester 100. The suction device 500 is used to suck in the probe-type connector after testing.

In this way, after completing the elastic force test, current test and impedance test on the probe connector, the probe connector that does not meet the design can be screened out and marked as defective according to the elastic force, current and impedance values of the probe connector. The suction device 500 can suck up the defective probe connector to remove it, eliminating manual removal and improving the detection efficiency of the probe connector performance detection equipment 1000.

Specifically, the suction device 500 may include a suction nozzle and an air pipe. The air pipe is connected to the suction nozzle, and the external device is connected to the air pipe to provide negative pressure for the suction device 500. The air pipe can provide a negative pressure air flow channel for the suction nozzle, so that the suction nozzle can suck the defective probe-type connector. It can be understood that when the detection probe 43 is pressed down to abut against the probe-type connector to be tested, the external device is controlled to disconnect the negative pressure provided to the air pipe, and the suction nozzle loses the adsorption force to avoid the adsorption force interfering with the elastic force value measured by the probe-type connector.

In some embodiments, the probe-type connector performance testing device 1000 may further include a defective collection box, and the suction device 500 may suck the defective probe-type connector into the defective collection box.

In some embodiments, after the suction device 500 sucks the unqualified probe-type connector and places it in the defective collection box, the suction device 500 can also suck and place the qualified probe-type connector in a specific area, eliminating manual unloading and improving work efficiency. It is understandable that the suction device 500 can also suck and place the qualified probe-type connector in a specific area, and then suck and place the unqualified probe-type connector in the defective collection box. It can also be that the suction device 500 places each probe-type connector in a corresponding position according to the information on whether each probe-type connector is qualified or not sent by the host computer 400.

Please refer to Figure 2. In some embodiments, the probe-type connector performance testing equipment 1000 may also include a second driving device 600, which is connected to the placement plate 30. The second driving device 600 is used to drive the placement plate 30 to move relative to the base 10 along the length direction and/or width direction of the tester 100, so that the probe-type connector to be tested in at least one accommodating groove 301 is aligned with the suction device 500 along the height direction of the tester 100.

In this way, when there are a large number of probe connectors to be tested in the accommodating groove 301 and a small number of detection probes 43, a small number of detection probes 43 can be used to perform elastic force, current and impedance tests on a large number of probe connectors to be tested in batches, thereby reducing the loading time and improving the detection rate.

Specifically, when the number of detection probes 43 is less than the number of probe-type connectors to be tested and the accommodating grooves 301, the probe-type connectors to be tested on the accommodating grooves 301 can be divided into a first group and a second group. Along the Z-axis direction, the probe-type connectors to be tested aligned with the group of detection probes 43 are the first group, and the remaining probe-type connectors to be tested are the second group.

After the detection of the first group of probe connectors is completed, the second driving device 600 drives the placement plate 30 to move in the plane formed by the X-axis direction and the Y-axis direction, so that part of the second group of probe connectors to be tested moves to a position aligned with the detection probe 43. When the first driving device 41 drives the detection probe 43 along the Z-axis direction toward the placement plate 30 so that the detection probe 43 applies elastic force to the probe connector, the impedance and current of each probe connector in the second group can be measured while measuring the magnitude of the elastic force.

It should be noted that when the second driving device 600 drives the placement plate 30 to move in the plane formed by the X-axis direction and the Y-axis direction, the movement mode can be that the placement plate 30 slides along the X-axis direction and/or the Y-axis direction relative to the base 10, or the placement plate 30 rotates relative to the base 10 on the plane formed by the X-axis direction and the Y-axis direction, and there is no limitation here.

The specific movement mode of the placement plate 30 can be selected according to the arrangement mode of the receiving grooves 301 on the placement plate 30 , so that the receiving grooves 301 on the placement plate 30 can be aligned with the detection probes 43 more accurately.

Exemplarily, if the plurality of accommodating grooves 301 on the placement plate 30 are arranged in a rectangular array, the second driving device 600 can drive the placement plate 30 to slide along the X-axis direction and/or the Y-axis direction relative to the base 10 on the plane formed by the X-axis direction and the Y-axis direction;.

If the multiple accommodating grooves 301 on the placement plate 30 are arranged in a circular or annular array, the second driving device 600 can drive the placement plate 30 to rotate around the center of the placement plate 30 and relative to the base 10 on the plane formed by the X-axis direction and the Y-axis direction. The rotation of the placement plate 30 in situ can reduce the probability of collision between the probe connector to be tested and other components on the base 10, thereby avoiding the collision causing the probe connector to be tested to deflect, which is not conducive to elastic force, current and resistance detection.

Please refer to FIG. 2. In some embodiments, the probe connector performance testing device 1000 may further include an image acquisition device 700 mounted on the base 10, and the image acquisition device 700 is used to capture images of the probe connector. In this way, before the measurement begins, it is possible to determine whether the appearance of certain probe connectors meets the set requirements by collecting images of the probe connectors, so as to facilitate the user to make subsequent operational judgments on the probe connectors to avoid further measurements on probe connectors whose appearance does not meet the requirements and cause waste of resources. For example, the user can choose to perform elastic force, current and impedance tests on probe connectors that meet the requirements, and choose to stop measuring probe connectors that do not meet the requirements to avoid waste of resources.

It is understandable that when the probe connector to be tested is manually placed into the receiving groove 301, the probe connector may be placed incorrectly, that is, the needle of the probe connector is received in the receiving groove 301, so that the spring in the probe connector cannot be deformed when the detection probe 43 is pressed down, thereby making the measured elastic force value inaccurate.

In this way, the image acquisition device 700 can also determine whether the probe type connector is placed upside down in the receiving groove 301 by collecting the image of the probe type connector, so as to avoid affecting the elastic force test result of the probe type connector.

In some embodiments, the image acquisition device 700 can be electrically connected to the second driving device 600 , and in addition to the image information of the probe connector, the image acquisition device 700 can also acquire image information of the receiving groove 301 in the placement plate 30 and image information of the detection probe 43 .

It is understandable that when the number of the detection probes 43 is less than the number of the probe-type connectors to be tested and the accommodating slots 301, the probe-type connectors to be tested on the accommodating slots 301 include a first group and a second group. Along the Z-axis direction, the probe-type connectors to be tested that are aligned with the detection probe 43 group are the first group, and the remaining probe-type connectors to be tested are the second group. After the detection of the first group of probe-type connectors is completed, the image acquisition device 700 can transmit the image information of the remaining probe-type connectors in the accommodating slots 301 to the second drive device. The second drive device 600 automatically drives the placement plate 30 to move in the plane formed by the X-axis direction and the Y-axis direction according to the information fed back by the image acquisition device 700, so as to complete the detection of part of the second group of probe-type connectors to be tested.

In this way, when the number of probe connectors to be tested on the placement board 30 is large, and the number of detection probes 43 is small, the image acquisition device 700 and the second driving device 600 can cooperate to use a small number of detection probes 43 to perform elastic force, current and impedance tests on a large number of probe connectors to be tested in batches, making the process more intelligent.

Please refer to FIG. 2 . In some embodiments, the probe-type connector performance testing device 1000 may further include a mechanical clamp 800 connected to the base 10 . The mechanical clamp 800 is used to place the probe-type connector to be tested into the receiving groove 301 .

Thus, by using the mechanical gripper 800 to place the probe connector to be tested into the receiving groove 301 , the loading step before testing the probe connector to be tested can be made more time-saving, labor-saving and intelligent compared to manual placement.

In some embodiments, the mechanical gripper 800 is electrically connected to the host computer 400, and the host computer 400 may pre-store specific position information of the mechanical gripper 800, the probe connector to be tested, and the receiving slot 301 on the placement plate 30. The host computer 400 may control the mechanical gripper 800 to grab the probe connector to be tested and place it on the receiving slot 301 according to the position information of the three. When the probe connector to be tested is manually placed into the receiving slot 301, it may accidentally touch the probe connectors in other receiving slots 301 during the placement process, causing the probe connector to shift, resulting in inaccurate elastic force measured when the detection probe 43 presses down the probe connector. By controlling the movement of the mechanical gripper 800 through the host computer 400, the placement of the probe connector can be more time-saving, labor-saving and accurate.

In some embodiments, the mechanical gripper 800 may also include a control device and a distance measuring device that are interconnected, wherein the control device is used to control the movement of the clamp of the mechanical gripper 800 relative to the base 10 and the closing of the clamp, and the distance measuring device is used to determine the distance between the probe-type connector to be tested and the clamp and the distance between each receiving groove 301 and the clamp. The control device can control the movement of the mechanical gripper 800 to grasp and place the probe-type connector, thereby achieving the purpose of saving time, labor and efficiency.

Specifically, when the distance measuring device obtains the distance between the probe connector to be tested and the fixture, the distance information is transmitted to the control device, and the control device controls the fixture to move to grab the probe connector to be tested after receiving the information. Then, the distance measuring device obtains the distance between the receiving slot 301 without the probe connector and the fixture, and transmits the distance information to the control device, and the control device controls the fixture to move and puts the probe connector to be tested into the receiving slot 301 after receiving the information. The above operation is repeated until all the receiving slots 301 are filled with the probe connector to be tested or all the probe connectors to be tested are placed in the receiving slots 301, depending on the number of the probe connectors to be tested and the receiving slots 301.

The distance measuring device may be a laser distance measuring device, an infrared distance measuring device or an ultrasonic distance measuring device, etc., which are not limited here. In some embodiments, the distance measuring device may also be a camera device, which acquires images of the fixture, the probe-type connector to be tested, and the receiving groove 301 on the placement plate 30 in real time through the camera device to determine the aforementioned distance information.

In some embodiments, the mechanical gripper 800 can be electrically connected to the image acquisition device 700, and the image acquisition device 700 can also acquire image information of the placement plate 30. When the mechanical gripper 800 grabs the probe-type connector to be tested, the position of each receiving groove 301 on the placement plate 30 is determined according to the image of the placement plate 30 acquired by the image acquisition device 700. After receiving the position information of each receiving groove 301, the mechanical gripper 800 can better accurately insert each probe-type connector to be tested into the receiving groove 301.

Please refer to Fig. 2. In some embodiments, the probe connector performance testing device 1000 further includes a temperature measuring component 900, which is disposed on the base 10 and is used to measure the temperature of the probe connector to be tested. In this way, the temperature measuring component 900 can be used to monitor the temperature of the probe connector on the placement plate 30 to prevent the probe connector from generating a large amount of heat when a large current passes through the probe connector, thereby preventing the probe connector from being damaged during the measurement process.

Specifically, the temperature measuring component 900 can be an infrared thermal imager, which can meet the adjustment of measuring the small size of the probe type connector and has a high response speed and resolution. When there are multiple probe type connectors to be tested on the placement board 30, the infrared imager can quickly determine which probe type connector has a temperature higher than the preset temperature value.

In some embodiments, the probe connector performance testing device 1000 may further include a cooling device electrically connected to the temperature measuring component, the cooling device being used to cool the probe connector when the temperature of the probe connector is equal to the first preset temperature, so that the temperature of the probe connector is lower than the second preset temperature value, thereby preventing the probe connector from being damaged due to temperature increase during the current detection process. The first preset temperature is greater than the second preset temperature.

When the detection component is pressed down along the Z-axis direction and against the probe connector to detect elastic force, current and resistance, the temperature measuring component starts to monitor the temperature of the probe connector in real time. When the temperature of one or more of the probe connectors is equal to the first preset temperature, the temperature measuring component transmits the information to the cooling component, and then the cooling component starts the cooling mode to cool the probe connector to be cooled until the temperature of the probe connector is lower than the second preset temperature. In one embodiment, the cooling device can be a fan. In one embodiment, the cooling device can also be a heat sink with a phase change medium.

The cooling device may be disposed on the base 10 or on the detection probe 43, and there is no limitation here, as long as the cooling device can cool the probe connector. The cooling device may include a movable part and a cooling part connected to each other, and the movable part is used to drive the cooling part to move toward the probe connector to be cooled so that the cooling part can better cool the probe connector.

The above is a detailed introduction to the probe connector performance detection device provided in the embodiment of the present application. This article uses specific examples to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the present application. At the same time, for those skilled in the art, according to the ideas of the present application, there will be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims (10)

1. A probe connector performance test apparatus, comprising:

the tester comprises a base, a bracket, a placing plate and a force measuring mechanism; the support is connected with the base, the placing plate is placed on the top surface of the base, the force measuring mechanism is mounted on the support, at least one accommodating groove is formed in the placing plate, and the accommodating groove is used for placing a probe type connector to be tested; the force measuring mechanism comprises a first driving device, a pressure sensor and at least one detection probe, wherein the pressure sensor and the detection probe are connected with the first driving device, the first driving device drives the pressure sensor and the detection probe to slide along the height direction of the tester relative to the base, and the pressure sensor is used for detecting the elasticity of the probe connector;

The resistor disc is electrically connected with the tester and is used for measuring impedance and current of the probe connector conducted between the detection probe and the placing plate;

The power supply is electrically connected with the tester; and

And the upper computer is electrically connected with the tester, the resistor disc and the power supply.

2. The probe connector performance test apparatus according to claim 1, wherein the first driving means includes a guide member connected to the bracket, a slider slidably provided on the guide member, and a motor; one end of the pressure sensor is connected with the sliding piece, and the other end of the pressure sensor is connected with the detection probe; the motor is connected with the sliding piece, and the motor is used for driving the sliding piece to drive the pressure sensor and the detection probe to slide relative to the guide piece along the height direction of the tester.

3. The probe connector performance test apparatus of claim 1, wherein the load cell further comprises an insulator, one end of the insulator being connected to the pressure sensor, the other end of the insulator being connected to the test probe.

4. The probe connector performance detection apparatus according to claim 1, further comprising a suction device electrically connected to the upper computer, the suction device being connected to a first driving device, the first driving device driving the suction device to slide along a height direction of the tester relative to the base, the suction device being configured to suck the detected probe connector.

5. The probe connector performance test apparatus of claim 4, further comprising a second driving device connected to the placement plate, the second driving device being configured to drive the placement plate to move relative to the base along a length direction and/or a width direction of the tester so as to align the probe connector to be tested in the at least one accommodation groove with the suction device along a height direction of the tester.

6. The probe connector performance test apparatus of claim 1, further comprising an image acquisition device mounted on the base for acquiring an image of the probe connector.

7. The probe connector performance test apparatus of claim 1, further comprising a mechanical jaw coupled to the base for placing a probe connector under test into the receptacle.

8. The probe connector performance test apparatus according to claim 1, further comprising a temperature measuring member provided on the base, the temperature measuring member being configured to measure a temperature of the probe connector to be tested.

9. The probe connector performance test apparatus of any one of claims 1-8, wherein the surface of the placement plate is gold plated.

10. The probe connector performance test apparatus of any one of claims 1-8, wherein the surface of the test probe is gold plated.