CN117897610A - 荧光x射线分析装置以及x射线的光阑构件 - Google Patents

荧光x射线分析装置以及x射线的光阑构件 Download PDF

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Publication number
CN117897610A
CN117897610A CN202280059055.2A CN202280059055A CN117897610A CN 117897610 A CN117897610 A CN 117897610A CN 202280059055 A CN202280059055 A CN 202280059055A CN 117897610 A CN117897610 A CN 117897610A
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CN
China
Prior art keywords
opening
ray
primary
diaphragm member
rays
Prior art date
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Pending
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CN202280059055.2A
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English (en)
Chinese (zh)
Inventor
秋山刚志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN117897610A publication Critical patent/CN117897610A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/02—Irradiation devices having no beam-forming means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN202280059055.2A 2021-08-31 2022-03-10 荧光x射线分析装置以及x射线的光阑构件 Pending CN117897610A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021141055 2021-08-31
JP2021-141055 2021-08-31
PCT/JP2022/010561 WO2023032286A1 (ja) 2021-08-31 2022-03-10 蛍光ｘ線分析装置およびｘ線の絞り部材

Publications (1)

Publication Number Publication Date
CN117897610A true CN117897610A (zh) 2024-04-16

Family

ID=85411782

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280059055.2A Pending CN117897610A (zh) 2021-08-31 2022-03-10 荧光x射线分析装置以及x射线的光阑构件

Country Status (4)

Country Link
US (1) US12523623B2 (https=)
JP (1) JP7711760B2 (https=)
CN (1) CN117897610A (https=)
WO (1) WO2023032286A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0288607U (https=) 1988-12-28 1990-07-13
JPH07140573A (ja) 1992-10-09 1995-06-02 Tadashi Yogi Ｘ線の不用線束除去用自動絞り
JP2503862B2 (ja) 1993-04-23 1996-06-05 株式会社島津製作所 蛍光ｘ線分析装置
JPH08247968A (ja) 1995-03-07 1996-09-27 Ishikawajima Harima Heavy Ind Co Ltd 非破壊検査装置
JP3639855B2 (ja) 1998-10-30 2005-04-20 理学電機工業株式会社 蛍光ｘ線分析装置
JP4303378B2 (ja) 1999-09-17 2009-07-29 株式会社堀場製作所 漏洩ｘ線遮蔽機構
JP2001208705A (ja) 2000-01-27 2001-08-03 Mitsubishi Heavy Ind Ltd 散乱ｘ線式欠陥検出装置及びｘ線検出装置
JP3603122B2 (ja) 2001-05-15 2004-12-22 理学電機工業株式会社 蛍光ｘ線分析装置
JP2009002795A (ja) * 2007-06-21 2009-01-08 Shimadzu Corp 蛍光ｘ線分析装置
US8223925B2 (en) 2010-04-15 2012-07-17 Bruker Axs Handheld, Inc. Compact collimating device

Also Published As

Publication number Publication date
JP7711760B2 (ja) 2025-07-23
US20240385130A1 (en) 2024-11-21
JPWO2023032286A1 (https=) 2023-03-09
US12523623B2 (en) 2026-01-13
WO2023032286A1 (ja) 2023-03-09

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