CN117856894A - A three-temperature error code test device for optical modules - Google Patents
A three-temperature error code test device for optical modules Download PDFInfo
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- CN117856894A CN117856894A CN202410043651.2A CN202410043651A CN117856894A CN 117856894 A CN117856894 A CN 117856894A CN 202410043651 A CN202410043651 A CN 202410043651A CN 117856894 A CN117856894 A CN 117856894A
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- temperature control
- control unit
- optical module
- temperature
- bit error
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- Chemical & Material Sciences (AREA)
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- Semiconductor Lasers (AREA)
Abstract
The invention provides a three-temperature error code testing device of an optical module, and belongs to the technical field of optical module testing. The three-temperature error code testing device comprises: a test case defining at least one slot; the error code testing unit is positioned in the testing box body; the drawer is used for installing the optical module, and is arranged to be inserted from the slot until the optical module is connected with the error code testing unit, so that the error code testing unit tests the optical module; the first temperature control unit is positioned in the test box body and used for controlling the temperature of the optical module; the adjusting mechanism is positioned in the test box body and connected with the first temperature control unit and is used for driving the first temperature control unit to do lifting motion so as to adjust the height of the first temperature control unit, thereby enabling the first temperature control unit to be in contact with or separated from the optical module. The invention solves the problem of bad appearance caused by scratch of the outer surface of the test module when the optical module is inserted into or pulled out of the socket of the DUT board in the prior art.
Description
Technical Field
The invention relates to the technical field of optical module testing, in particular to a three-temperature error code testing device of an optical module.
Background
In the current three-temperature error code test of the optical module, a mode of adopting a semiconductor refrigeration piece to heat and cool the module is single-sided TEC (Thermo Electric Cooler, semiconductor refrigerator) temperature control and double-sided TEC temperature control. In the existing TEC temperature-controlled three-temperature error code testing device, because the contact height positions of a module hot surface and a TEC refrigerating piece heat sink are inconsistent due to inconsistent module packaging, namely inconsistent thickness, a module is usually corresponding to a temperature-controlled clamp. In order to make the TEC cooling plate work efficiently, the TEC cooling plate is usually fixed on the water cooling row, so that the replacement of the fixture involves the plugging of the waterway water pipe connector, and a certain risk of water leakage exists.
In addition, in the device for controlling temperature of the TEC refrigerating sheet, for high efficiency of heat conduction, the optical module needs to be in good contact with the heat sink, scratch of the appearance of the module easily occurs in the process of plugging and unplugging, in the prior art, when the optical module is plugged into or unplugged from a socket of a DUT (Device Under Test, in-test device) board, zero friction is difficult to be achieved between the optical module and the heat sink or between the optical module and the cage, and when the optical module is plugged and unplugged from the device/fixture, the outer surface of the tested module is scratched to some extent, so that the appearance is poor. In order to reduce the bad scratch of the module, part of optical module manufacturers avoid the bad scratch by adopting a mode of attaching a high-temperature adhesive tape on the heat sink/module in the production test process. The method can avoid scratch of the appearance surface of the module in the test process, but can reduce the temperature rising and reducing efficiency (according to actual test data, the test time length of the high-temperature adhesive tape is increased by more than 50% compared with that of the high-temperature adhesive tape which is not attached), thereby greatly improving the production test efficiency and cost.
Disclosure of Invention
An object of the present invention is to provide an error code testing device for an optical module, so as to solve the problem in the prior art that the optical module is scratched by the outer surface of the testing module when the optical module is plugged into or pulled out of a socket of a DUT board, resulting in poor appearance.
A further object of the present invention is to improve the production test efficiency of the error code testing device and reduce the production cost.
In particular, the present invention provides a three-temperature error code testing device of an optical module, comprising:
a test case defining at least one slot;
the error code testing unit is positioned in the testing box body;
the drawer is used for installing the optical module, and is arranged to be inserted from the slot until the optical module is connected with the error code testing unit, so that the error code testing unit tests the optical module;
the first temperature control unit is positioned in the test box body and used for controlling the temperature of the optical module;
the adjusting mechanism is positioned in the test box body and connected with the first temperature control unit and is used for driving the first temperature control unit to do lifting motion so as to adjust the height of the first temperature control unit, so that the first temperature control unit is contacted with or separated from the optical module.
Further, the adjusting mechanism includes:
the sliding rail is arranged at the bottom of the test box body;
a first slider arranged to move under control along the extension direction of the slide rail, the first slider having a first incline;
the second sliding block is used for supporting the first temperature control unit and is contacted with the first inclined surface of the first sliding block, and the second sliding block is arranged to move along the first inclined surface when the first sliding block moves along the sliding rail so as to drive the first temperature control unit to do lifting movement.
Further, the second sliding block is provided with a second inclined plane matched with the first inclined plane, and the second sliding block is arranged to move along the first inclined plane when the first sliding block moves along the sliding rail, so that the first temperature control unit is driven to do lifting movement.
Further, the adjusting mechanism includes:
the first driving piece is connected with the first sliding block and used for driving the first sliding block to move along the sliding rail.
Further, the adjusting mechanism further includes:
and the limiting structure is arranged at the top of the second sliding block so as to limit the lifting distance of the second sliding block.
Further, the adjusting mechanism includes:
the membrane type air cylinder is arranged below the first temperature control unit and is used for inflating or deflating under control so as to drive the first temperature control unit to do lifting movement.
Further, the method further comprises the following steps:
the second temperature control unit is arranged in the test box and positioned above the drawer and used for controlling the temperature of the optical module.
Further, the second temperature control unit includes:
the bracket is provided with a temperature control source;
the temperature control seat is arranged at the bottom of the bracket and is communicated with the Wen Kongyuan;
and one end of the heat sink piece is connected with the bottom of the temperature control seat, and the other end of the heat sink piece is abutted to the optical module.
Further, the second temperature control unit includes:
the second driving piece is arranged in the bracket and connected with the temperature control seat and used for driving the temperature control seat to move up and down so as to enable the heat sink piece to be contacted with or separated from the optical module.
Further, the method further comprises the following steps:
the guide post is arranged in the test box body, one end of the guide post is connected with the top of the test box body, and the other end of the guide post is connected with the bottom of the test box body and penetrates through the first temperature control unit and/or the second temperature control unit, so that the first temperature control unit and/or the second temperature control unit move along the extending direction of the guide post.
Further, the temperature control device also comprises an elastic piece, wherein the elastic piece is sleeved on the outer side of the guide post, one end of the elastic piece is abutted to the upper surface of the first temperature control unit, and the other end of the elastic piece is abutted to the bottom of the second temperature control unit.
According to the invention, the first temperature control unit is arranged to be in adjustable contact with the optical module, so that the optical module rises to a contact state during testing to control the temperature of the optical module, and is separated from the optical module after the optical module is tested, so that the optical module can be taken out and cannot be rubbed with the first temperature control unit, and the problem that in the prior art, the optical module is scratched by the outer surface of the test module when the optical module is inserted into or pulled out of a socket of a DUT board, and poor appearance is caused is solved.
Furthermore, the optical module installation structure of the drawer type optical module enables the error code testing device to test a plurality of optical modules at one time, thereby improving the production testing efficiency of the error code testing device and reducing the production cost.
The above, as well as additional objectives, advantages, and features of the present invention will become apparent to those skilled in the art from the following detailed description of a specific embodiment of the present invention when read in conjunction with the accompanying drawings.
Drawings
Some specific embodiments of the invention will be described in detail hereinafter by way of example and not by way of limitation with reference to the accompanying drawings. The same reference numbers will be used throughout the drawings to refer to the same or like parts or portions. It will be appreciated by those skilled in the art that the drawings are not necessarily drawn to scale. In the accompanying drawings:
FIG. 1 is a schematic diagram of an overall structure of an error code testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a cooling structure of an error code testing apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating a first structure of a first temperature control unit and an adjusting mechanism of the error code testing apparatus according to an embodiment of the present invention;
FIG. 4 is a schematic diagram illustrating a second structure of a first temperature control unit and an adjusting mechanism of the error code testing apparatus according to an embodiment of the present invention;
FIG. 5 is an exploded view of an adjustment mechanism of the bit error testing apparatus according to one embodiment of the present invention;
FIG. 6 is a schematic diagram illustrating a second temperature control unit of the error testing apparatus according to an embodiment of the present invention;
in the figure: 1. a test box; 10. a slot; 11. a guide post; 12. an elastic member; 2. an error code testing unit; 3. a drawer; 4. a first temperature control unit; 5. an adjusting mechanism; 50. a slide rail; 51. a first slider; 510. a first inclined surface; 52. a second slider; 520. a second inclined surface; 53. a first driving member; 54. a limit structure; 6. an optical module; 7. a second temperature control unit; 70. a bracket; 71. a temperature control source; 72. a temperature control seat; 73. a heat sink sheet; 74. and a second driving member.
Detailed Description
In the description of the present embodiment, it should be understood that the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature, i.e. one or more such features. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise. When a feature "comprises or includes" a feature or some of its coverage, this indicates that other features are not excluded and may further include other features, unless expressly stated otherwise.
Unless specifically stated or limited otherwise, the terms "mounted," "connected," "secured," "coupled," and the like should be construed broadly, as they may be fixed, removable, or integral, for example; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. Those of ordinary skill in the art will understand the specific meaning of the terms described above in the present invention as the case may be.
Furthermore, in the description of the present embodiments, a first feature "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features not being in direct contact but being in contact through another feature therebetween. That is, in the description of the present embodiment, the first feature being "above", "over" and "upper" the second feature includes the first feature being directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature "under", "beneath", or "under" a second feature may be a first feature directly under or diagonally under the second feature, or simply indicate that the first feature is less level than the second feature.
Unless specifically defined and limited otherwise, all terms (including technical and scientific terms) used in the description of this embodiment have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
In the description of the present embodiment, a description referring to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Fig. 1 is a schematic diagram of an overall structure of an error code testing apparatus according to an embodiment of the present invention. FIG. 2 is a schematic diagram of a cooling structure of an error code testing apparatus according to an embodiment of the present invention. Fig. 3 is a first schematic structural diagram of a first temperature control unit and an adjusting mechanism of the error code testing device according to an embodiment of the invention. Fig. 4 is a second schematic structural diagram of the first temperature control unit and the adjusting mechanism of the error code testing device according to an embodiment of the invention. Fig. 5 is an exploded view of an adjustment mechanism of the error testing apparatus according to one embodiment of the present invention. In one embodiment, as shown in fig. 1 to 5, the optical module testing apparatus includes a testing box 1, an error code testing unit 2, a drawer 3, a first temperature control unit 4, and an adjusting mechanism 5. Wherein, one side of the test box 1 is defined with at least one slot 10, and the error code test unit 2 is disposed in the test box 1. In addition, the drawer 3 is used for installing the optical module 6, and the drawer 3 is inserted into the test box 1 from the slot 10 until the optical module 6 is connected with the error code test unit 2, so that the error code test unit 2 can test the optical module 6.
The first temperature control unit 4 is arranged in the test box 1 and is positioned below the optical module 6 to control the temperature of the optical module 6, the adjusting mechanism 5 is connected with the first temperature control unit 4 and is used for driving the first temperature control unit 4 to do lifting motion so as to adjust the height of the first temperature control unit 4, so that the first temperature control unit 4 is contacted with or separated from the optical module 6, and the optical module 6 cannot rub with the first temperature control unit 4 when the drawer 3 is inserted or pulled out, so that the integrity of the optical module 6 is ensured.
Specifically, the optical module testing device has a testing box 1, at least one slot 10 is provided on the side of the testing box 1, and each slot 10 is plugged with a drawer 3 for mounting an optical module 6 to be tested. And the error code testing unit 2, the first temperature control unit 4 and the adjusting mechanism 5 are arranged in the testing box body 1. The error code testing unit 2 is connected with the optical module 6 when the drawer 3 is inserted to test the optical module 6, and the adjusting mechanism 5 is connected with the first temperature control unit 4 and is located below the drawer 3, so that the first temperature control unit 4 can adjust the height of the first temperature control unit 4 under the driving of the adjusting mechanism 5, the first temperature control unit 4 can be contacted with or separated from the optical module 6, and the optical module 6 cannot rub or scratch with the first temperature control unit 4 when the drawer 3 is inserted or pulled out, so that the integrity of the optical module 6 is guaranteed.
In this embodiment, the first temperature control unit 4 is set to be adjustably in contact with the optical module 6, so that the optical module 6 rises to a contact state during testing to perform temperature control on the optical module, and is separated from the optical module 6 after the optical module 6 is tested, so that the optical module 6 can be taken out, friction with the first temperature control unit 4 can not occur, and therefore the problem that in the prior art, the optical module 6 is scratched by the outer surface of the test module when the optical module 6 is plugged into or pulled out of a socket of a DUT board, and poor appearance is caused is solved.
In addition, the first temperature control unit 4 in this embodiment not only can cool down and dissipate heat of the optical module 6, but also can heat and preserve heat of the optical module 6, and the first temperature control unit 4 is to make the optical module 6 always in an ideal testing temperature range during testing, so as to avoid influence on the testing accuracy of the optical module 6 caused by overlarge temperature variation.
Further, the optical modules 6 are installed by arranging the drawers 3, so that the error code testing device can test a plurality of optical modules 6 at one time, the production testing efficiency of the error code testing device is improved, and the production testing cost is reduced.
In one embodiment, as shown in fig. 4 and 5, the adjusting mechanism 5 includes a slide rail 50, a first slider 51, a second slider 52, and a first driving member 53. The sliding rail 50 is installed at the bottom of the test box 1, the first sliding block 51 is connected with the first driving member 53, the first sliding block 51 has a first inclined plane 510 and is installed on the sliding rail 50, so that the first sliding block 51 can move along the extending direction of the sliding rail 50 under the driving of the first driving member 53, the second sliding block 52 is used for supporting the first temperature control unit 4, and the second sliding block 52 contacts with the first inclined plane 510 of the first sliding block 51, in addition, the second sliding block 52 is configured to move along the first inclined plane 510 when the first sliding block 51 moves along the sliding rail 50, so as to drive the first temperature control unit 4 to do lifting movement.
Specifically, the first slider 51 of the adjusting mechanism 5 is disposed on the slide rail 50 and connected to the first driving member 53, so that the first slider 51 can move along the extending direction of the slide rail 50 under the driving of the first driving member 53, and furthermore, the first slider 51 has a first inclined surface 510, and the first inclined surface 510 contacts with the second slider 52, so that the first slider 51 can drive the second slider 52 to move, and the second slider 52 is used to support the first temperature control unit 4, so that the first temperature control unit 4 can move under the driving of the first slider 51, and further, the first temperature control unit 4 can contact with or separate from the optical module 6.
Further, the second slider 52 has a second inclined surface 520, the second inclined surface 520 contacts with the first inclined surface 510, and the second slider 52 is configured to move relatively along the first inclined surface 510 when the first slider 51 moves along the sliding rail 50, so as to drive the first temperature control unit 4 to move up and down, and further enable the first temperature control unit 4 to contact with or separate from the optical module 6.
Of course, rollers may be disposed at the second slider 52, and when the first slider 51 moves along the direction of the sliding rail 50, the first inclined surface 510 and the rollers of the second slider 52 move relatively, so as to drive the second slider 52 to rise or fall, and further enable the first temperature control unit 4 to contact or separate from the optical module 6.
Further, the adjusting mechanism 5 further has a limiting structure 54, and the limiting structure 54 is disposed on top of the second slider 52 to limit the rising distance of the second slider 52, so that the first temperature control unit 4 will not damage the optical module 6 when rising to the contact position under the driving of the second slider 52.
In this embodiment, by arranging the first slider 51 with the first inclined surface 510, the second slider 52 and the first driving piece 53, the first slider 51 can move along the extending direction of the sliding rail 50 under the driving of the first driving piece 53, so as to drive the second slider 52 to rise or fall, and further drive the first temperature control unit 4 to rise or fall, and further enable the first temperature control unit 4 to contact or separate from the optical module 6 in the drawer 3, and further enable the optical module 6 not to rub or scratch with the first temperature control unit 4 when the drawer 3 is inserted or pulled out, so that the integrity of the optical module 6 is ensured.
In addition, by arranging the second inclined surface 520 at the second slider 52, not only can the second slider 52 move along the direction of the first inclined surface 510 of the first slider 51, so that the second slider 52 can meet the design requirement, but also the production cost can be reduced, and the mass production is facilitated.
In another embodiment, the adjusting mechanism 5 may be a membrane cylinder, in this embodiment, the adjusting mechanism 5 is directly disposed at the bottom of the test box 1 and contacts the first temperature control unit 4, and when the first temperature control unit 4 needs to be driven to rise, the adjusting mechanism 5 is inflated or deflated under control to drive the first temperature control unit 4 to do lifting motion.
In this embodiment, not only can promote error code testing arrangement's suitability through setting up different adjustment mechanism 5, make it can satisfy different user demands, but also can effectively reduce manufacturing cost.
Fig. 6 is a schematic structural diagram of a second temperature control unit of the error code testing device according to an embodiment of the present invention. In one embodiment, as shown in fig. 1, 2 and 6, a second temperature control unit 7 is further disposed in the test case 1, and the second temperature control unit 7 is disposed above the drawer 3 to control the temperature of the upper surface of the optical module 6. The second temperature control unit 7 includes a support 70, a temperature control seat 72, a heat sink 73 and a second driving member 74, the support 70 is provided with a temperature control source 71, and the temperature control seat 72 is disposed below the support 70, and the temperature control seat 72 is communicated with the temperature control source 71, so that the temperature control seat 72 can realize a temperature reduction function, the heat sink 73 is disposed at the bottom of the temperature control seat 72, one end of the heat sink is connected with the temperature control seat 72, and the other end of the heat sink is contacted with or separated from the optical module 6, so as to realize the temperature control function of the optical module 6.
Specifically, the second temperature control unit 7 has a bracket 70, and a temperature control source 71 and a second driving member 74 are disposed on the bracket 70, and a temperature control seat 72 is disposed at the bottom of the bracket 70, and the temperature control seat 72 is connected to the second driving member 74 and is in communication with the temperature control source 71, so that the temperature control seat 72 can move up and down under the driving of the second driving member 74. In addition, be provided with heat sink piece 73 in the bottom of control by temperature change seat 72, this heat sink piece 73 is connected with control by temperature change seat 72 to make heat sink piece 73 can follow control by temperature change seat 72 and move together, thereby make heat sink piece 73 can contact or separate with optical module 6, and then make drawer 3 when inserting or extracting, optical module 6 can not take place friction or scratch with second control by temperature change unit 7, and then guaranteed optical module 6's integrality.
In this embodiment, the second temperature control unit 7 is set to be adjustably in contact with the optical module 6, so that the optical module 6 is lowered to a contact state during testing, so as to control the temperature of the optical module 6, and is separated from the optical module after the optical module 6 is tested, so that the optical module 6 can be taken out, and friction can not occur between the optical module 6 and the second temperature control unit 7, thereby solving the problems that in the prior art, the optical module 6 is scratched by the outer surface of the test module when the optical module 6 is inserted into or pulled out of a socket of a DUT board, and poor appearance is caused.
In addition, the second temperature control unit 7 in this embodiment not only can cool down and dissipate heat of the optical module 6, but also can heat and preserve heat of the optical module 6, and the second temperature control unit 7 is to make the optical module 6 always in an ideal testing temperature range during testing, so as to avoid influence of excessive temperature variation on the testing accuracy of the optical module 6.
In a further embodiment, as shown in fig. 1 and 6. The error code testing device is also provided with a guide post 11. The guide pillar 11 is arranged in the test box body 1, one end of the guide pillar 11 is connected with the top of the test box body 1, the other end of the guide pillar 11 is connected with the bottom of the test box body 1 and penetrates through the first temperature control unit 4 and/or the second temperature control unit 7, so that the first temperature control unit 4 and/or the second temperature control unit 7 can move along the extending direction of the guide pillar 11 when moving, and the cooling effectiveness of the first temperature control unit 4 and/or the second temperature control unit 7 on the optical module 6 is ensured.
In addition, an elastic member 12 is further disposed on the outer side of the guide post 11, one end of the elastic member 12 abuts against the upper surface of the first temperature control unit 4, and the other end abuts against the lower surface of the second temperature control unit 7, so that the second temperature control unit 7 can be separated from the optical module 6 under the action of the elastic member 12 when the test is completed, and the drawer 3 can be pulled out.
Specifically, the guide pillar 11 is disposed in the test box 1, and the guide pillar 11 passes through the first temperature control unit 4 and/or the second temperature control unit 7, so that the movement direction of the first temperature control unit 4 and/or the second temperature control unit 7 is limited, and the first temperature control unit 4 and/or the second temperature control unit 7 can move along the extending direction of the guide pillar 11, so that the first temperature control unit 4 and/or the second temperature control unit 7 can be contacted more stably when contacting the optical module 6 in the drawer 3, and the cooling effect of the first temperature control unit 4 and/or the second temperature control unit 7 is ensured.
In the present embodiment, the guide post 11 is disposed and the guide post 11 penetrates through the first temperature control unit 4 and/or the second temperature control unit 7, so that the first temperature control unit 4 and/or the second temperature control unit 7 can move along the extending direction of the guide post 11, thereby ensuring the effectiveness of cooling the optical module 6 by the first temperature control unit 4 and/or the second temperature control unit 7. By arranging the elastic piece 12, the heat sink 73 can be separated from the optical module 6 after the second temperature control unit 7 completes the test of the optical module 6, so that the optical module 6 cannot rub with the second temperature control unit 7 when being inserted or pulled out, and the integrity of the optical module 6 is ensured.
By now it should be appreciated by those skilled in the art that while a number of exemplary embodiments of the invention have been shown and described herein in detail, many other variations or modifications of the invention consistent with the principles of the invention may be directly ascertained or inferred from the present disclosure without departing from the spirit and scope of the invention. Accordingly, the scope of the present invention should be understood and deemed to cover all such other variations or modifications.
Claims (11)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410043651.2A CN117856894A (en) | 2024-01-11 | 2024-01-11 | A three-temperature error code test device for optical modules |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410043651.2A CN117856894A (en) | 2024-01-11 | 2024-01-11 | A three-temperature error code test device for optical modules |
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| Publication Number | Publication Date |
|---|---|
| CN117856894A true CN117856894A (en) | 2024-04-09 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202410043651.2A Pending CN117856894A (en) | 2024-01-11 | 2024-01-11 | A three-temperature error code test device for optical modules |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120800747A (en) * | 2025-09-03 | 2025-10-17 | 武汉钧恒科技有限公司 | Highly adjustable light module test fixture |
| CN120811479A (en) * | 2025-09-04 | 2025-10-17 | 苏州联讯仪器股份有限公司 | Optical module bit error rate test equipment |
-
2024
- 2024-01-11 CN CN202410043651.2A patent/CN117856894A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120800747A (en) * | 2025-09-03 | 2025-10-17 | 武汉钧恒科技有限公司 | Highly adjustable light module test fixture |
| CN120811479A (en) * | 2025-09-04 | 2025-10-17 | 苏州联讯仪器股份有限公司 | Optical module bit error rate test equipment |
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