CN117702254A

CN117702254A - Abnormality determination method, abnormality determination device, electronic device and storage medium

Info

Publication number: CN117702254A
Application number: CN202311100341.1A
Authority: CN
Inventors: 郭力; 李广砥; 王正远; 杨正华; 周宏坤; 卓珍珍
Original assignee: Longi Green Energy Technology Co Ltd
Current assignee: Longi Green Energy Technology Co Ltd
Priority date: 2023-08-29
Filing date: 2023-08-29
Publication date: 2024-03-15

Abstract

The embodiment of the invention provides an anomaly determination method, an anomaly determination device, anomaly determination equipment and an anomaly determination medium. The method comprises the following steps: in the process of pulling up single crystals, at least two single crystal rod images in preset time length of an equal diameter stage are obtained, bright ring areas in each single crystal rod image are detected, abnormal conditions of the single crystal rods are determined according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images, the coincidence degree of the bright ring areas corresponding to the plurality of single crystal rod images is used for analyzing the growth variation of the single crystal rods to find the abnormal conditions of the single crystal rods, so that abnormal man-hour after the abnormal conditions is reduced, single yield is improved, the risk that the rod falls to hit a crucible when arc striking is serious is avoided, and better guarantee is provided for production safety.

Description

Abnormality determination method, abnormality determination device, electronic device and storage medium

Technical Field

The present invention relates to the field of crystal preparation, and in particular, to an abnormality determination method, an abnormality determination apparatus, an electronic device, and a storage medium.

Background

The preparation process of the monocrystalline silicon material mainly comprises a Czochralski method (Czochralski process/CZ), and the polycrystalline silicon raw material is refined into monocrystalline silicon by the Czochralski method. The process of generating rod-shaped monocrystalline silicon crystals in the process of pulling up the monocrystalline comprises the steps of charging, heating and melting, pre-temperature adjusting, seeding, shouldering, shoulder rotating, constant diameter, ending and the like.

When the polysilicon raw material is melted, seeding cannot be started immediately, and the temperature is higher than the seeding temperature, and the temperature must be reduced. The pre-tempering is to adjust the temperature to a proper temperature, contact seed crystals (i.e., shaped single crystals) previously loaded at the end of the wire rope with the liquid surface, and then adjust the temperature to the seeding temperature by tempering. Seeding is the growth of silicon molecules along the lattice direction of a seed crystal at a seeding temperature, thereby forming a single crystal. The shouldering is to gradually grow the crystal diameter to a required diameter, and a section of crystal with the diameter gradually becoming larger to the required diameter or so is pulled out along with the length gradually becoming longer in the shouldering process so as to eliminate crystal dislocation. After the crystal grows to the diameter required by production in the shouldering process, the crystal enters the shouldering process. The shoulder is to control the crystal diameter to the diameter required for production. And after the shoulder turning is finished, the step of equal diameter control is carried out, and in the step, the crystal is grown according to the set diameter equal diameter through automatic control of the pulling speed and the temperature.

In the crystal pulling process, the equal-diameter growth process and the ending process of the silicon rod are both vital links, and the follow-up process is directly influenced. Abnormal conditions such as abnormal distortion, deformation, arc striking and the like of the silicon rod can be caused in the equal-diameter growth process of the silicon rod due to factors such as temperature, raw materials and the like, and abnormal conditions of ending and breaking can occur in the ending process of the silicon rod.

At present, the equal-diameter growth process and the ending process both need manual real-time detection, when the abnormal condition of the silicon rod just appears, naked eyes are difficult to judge, if the abnormal condition of the silicon rod is not found or found untimely by the naked eyes, the abnormal condition of the silicon rod is judged for a period of time after the abnormal condition, abnormal working hours are increased after the abnormal condition of the silicon rod, single production is affected, and if arc striking is serious, even the risk that the rod falls to hit a crucible is caused.

Disclosure of Invention

In view of the above problems, embodiments of the present invention are provided to provide an anomaly determination method for overcoming the above problems or at least partially solving the above problems, so as to solve the problems that abnormal situations such as abnormal twisting, deformation, arcing, etc. of a crystal rod are not found or not found timely, so that abnormal working hours increase after the abnormal situation of the crystal rod, single yield is affected, and even the risk of rod dropping and crucible hitting occurs when arcing is serious.

Correspondingly, the embodiment of the invention also provides an abnormality determination device, electronic equipment and a storage medium, which are used for ensuring the realization and application of the method.

In order to solve the above problems, an embodiment of the present invention discloses an anomaly determination method, including:

in the process of pulling up single crystals, at least two single crystal rod images in a preset time length of an equal diameter stage are obtained;

Detecting a bright ring region in each single crystal rod image;

and determining the abnormal condition of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images.

Optionally, determining the abnormal condition of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images includes:

determining an intersection area and a union area of the bright ring areas according to the bright ring areas corresponding to the at least two single crystal rod images;

and determining the abnormal condition of the single crystal rod according to the coincidence degree of the intersection region and the union region.

Optionally, the determining the intersection area and the union area of the bright ring areas according to the bright ring areas corresponding to the at least two single crystal rod images includes:

determining a first pixel location within the bright ring area in each bright ring image and a second pixel location within the bright ring area in any bright ring image; wherein the bright ring image comprises a bright ring area and a non-bright ring area;

determining the intersection area according to the first pixel position;

and determining the union region according to the second pixel position.

Optionally, the determining the abnormal condition of the single crystal bar according to the coincidence degree of the intersection region and the union region includes:

Calculating the coincidence degree between the intersection region and the union region;

and determining the abnormal condition of the single crystal rod according to the coincidence degree and a preset threshold value.

Optionally, the calculating the degree of coincidence between the intersection region and the union region includes:

acquiring the number of first pixels of the intersection area and the number of second pixels of the union area;

and determining the coincidence degree according to the number of the first pixel points and the number of the second pixel points.

Optionally, the determining the degree of coincidence according to the number of the first pixels and the number of the second pixels includes:

calculating the ratio of the number of the first pixel points to the number of the second pixel points;

and calculating the difference between the preset value and the ratio as the coincidence degree.

determining a first area of the intersection region and a second area of the union region;

and determining the coincidence degree according to the first area and the second area.

Optionally, the preset threshold includes a preset distortion threshold and a preset arcing threshold, the preset distortion threshold is smaller than the preset arcing threshold, and determining, according to the degree of coincidence and the preset threshold, an abnormal condition of the single crystal rod includes:

If the coincidence degree is between the preset distortion threshold value and the preset arc striking threshold value, determining that the single crystal rod is distorted abnormally;

if the coincidence degree exceeds the preset arcing threshold value, determining that the single crystal rod is abnormal in arcing;

and if the coincidence degree does not exceed the preset distortion threshold value, determining that the single crystal rod grows normally.

Optionally, the preset duration is a crystal transition period.

The embodiment of the invention also discloses an abnormality determination device, which comprises:

the image acquisition module is used for acquiring at least two single crystal rod images within a preset duration of the constant diameter stage in the process of pulling the single crystal;

the bright ring detection module is used for detecting a bright ring region in each single crystal rod image;

the abnormality determination module is used for determining abnormal conditions of the single crystal rods according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images.

Optionally, the anomaly determination module includes:

an intersection union determination submodule, configured to determine an intersection region and a union region of the bright ring regions according to bright ring regions corresponding to the at least two single crystal rod images;

and the abnormality determination submodule is used for determining the abnormal condition of the single crystal bar according to the coincidence degree of the intersection region and the union region.

Optionally, the intersection union determination submodule includes:

a position determining unit configured to determine a first pixel position within the bright ring area in each bright ring image and a second pixel position within the bright ring area in any one of the bright ring images; wherein the bright ring image comprises a bright ring area and a non-bright ring area;

an intersection determination unit configured to determine the intersection region according to the first pixel position;

and the union determining unit is used for determining the union region according to the second pixel position.

Optionally, the anomaly determination submodule includes:

a degree calculating unit configured to calculate a degree of coincidence between the intersection region and the union region;

and the abnormality determining unit is used for determining the abnormal condition of the single crystal rod according to the coincidence degree and a preset threshold value.

Optionally, the degree calculating unit includes:

a number acquisition subunit, configured to acquire the number of first pixels in the intersection area and the number of second pixels in the union area;

the first degree determining subunit is configured to determine the degree of coincidence according to the number of the first pixel points and the number of the second pixel points.

Optionally, the first degree determining subunit is specifically configured to: calculating the ratio of the number of the first pixel points to the number of the second pixel points; and calculating the difference between the preset value and the ratio as the coincidence degree.

Optionally, the degree calculating unit includes:

an area determining subunit configured to determine a first area of the intersection area and a second area of the union area;

and the second degree determining subunit is used for determining the coincidence degree according to the first area and the second area.

Optionally, the preset threshold includes a preset distortion threshold and a preset arcing threshold, the preset distortion threshold is smaller than the preset arcing threshold, and the anomaly determination submodule includes:

a distortion anomaly determination unit configured to determine that a distortion anomaly occurs in the single crystal rod if the degree of coincidence is between the preset distortion threshold and the preset arcing threshold;

the arc striking abnormality determining unit is used for determining that the single crystal rod is abnormal in arc striking if the coincidence degree exceeds the preset arc striking threshold value;

and the normal growth determining unit is used for determining that the single crystal rod grows normally if the coincidence degree does not exceed the preset distortion threshold value.

Optionally, the preset duration is a crystal transition period.

The embodiment of the invention also discloses an electronic device which is characterized by comprising a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory are communicated with each other through the communication bus;

a memory for storing a computer program;

and a processor for performing the method steps described above when executing the program stored on the memory.

The embodiment of the invention also discloses a readable storage medium, which enables the electronic device to execute one or more of the methods in the embodiment of the invention when the instructions in the storage medium are executed by the processor of the electronic device.

The embodiment of the invention has the following advantages:

according to the embodiment of the invention, at least two single crystal rod images in a preset duration of an equal diameter stage are acquired in a single crystal pulling process, a bright ring area in each single crystal rod image is detected, and the abnormal condition of the single crystal rod is determined according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images, so that the abnormal condition of the single crystal rod is found by analyzing the growth variation of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the plurality of single crystal rod images, the abnormal man-hour after the abnormal condition is reduced, the single production is further improved, the risk of dropping the rod and smashing the crucible when the arc is serious is avoided, and better guarantee is provided for production safety.

Drawings

FIG. 1 is a flow chart of steps of an embodiment of an anomaly determination method of the present invention;

FIG. 2 is a schematic illustration of an image of a normally grown single crystal rod;

FIG. 3 is a schematic illustration of a single crystal rod image of a scratch anomaly;

FIG. 4 is a schematic illustration of a single crystal rod image of a warp anomaly;

FIG. 5 is a schematic diagram of the fusion of the two images of FIG. 2 together;

FIG. 6 is a schematic diagram of the fusion of the two images of FIG. 3;

FIG. 7 is a schematic diagram of the fusion of the two images of FIG. 4

FIG. 8 is a schematic diagram of the threshold segmentation result of FIG. 2;

FIG. 9 is a schematic diagram of the threshold segmentation result of FIG. 3;

FIG. 10 is a schematic diagram of the threshold segmentation result of FIG. 4;

FIG. 11 is a schematic illustration of an intersection region and a union region of the two images of FIG. 8;

FIG. 12 is a schematic illustration of an intersection region and a union region of the two images of FIG. 9;

FIG. 13 is a schematic illustration of an intersection region and a union region of the two images of FIG. 10;

FIG. 14 is a flowchart of the steps of an embodiment of an anomaly determination method of the present invention;

fig. 15 is a block diagram showing the construction of an embodiment of an abnormality determining apparatus of the present invention;

FIG. 16 is a block diagram illustrating a computing device for anomaly determination, diameter determination, according to an example embodiment.

Detailed Description

In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.

Referring to fig. 1, a flowchart illustrating steps of an embodiment of an anomaly determination method according to the present invention may specifically include the following steps:

step 101, acquiring at least two single crystal rod images in a preset duration of an isodiametric stage in the process of pulling up the single crystal.

In the embodiment of the present invention, the Czochralski process is a process of pulling a raw material into a single crystal using a Czochralski method, for example, a process of Czochralski silicon. The Czochralski single crystal process may be divided into an isodiametric stage, a final stage, etc.

In an embodiment of the present invention, the Czochralski crystal apparatus is an apparatus for Czochralski single crystal, such as a single crystal furnace for Czochralski single crystal silicon. Shooting the inside of the crucible through the camera, and observing the process of pulling the single crystal rod after the constant diameter stage begins.

In the embodiment of the invention, in the isodiametric stage of the process of pulling the single crystal rod, the single crystal rod is photographed, and the obtained image is recorded as a single crystal rod image. The single crystal rod image includes an image of the single crystal rod, an image of a liquid formed by melting a raw material, a partial image of a crucible, a partial image of a heat shield, and the like. In particular, an appropriate image may be taken according to actual needs, which is not limited in the embodiment of the present invention. For example, the single crystal rod image is an image obtained by obliquely pitching the single crystal rod from above.

In an embodiment of the present invention, at least two single crystal rod images need to be images taken over a preset period of time. The preset duration cannot be too short, for example, 1 second. If the preset time period is too short, the change of at least two single crystal rod images is too small, so that the abnormal condition cannot be obviously determined. The preset time period must not be too long, for example, 30 minutes. If the preset time period is too long, the normal change in the growth process of the single crystal rod can be erroneously detected as an abnormal condition. Any suitable preset duration may be specifically adopted, which is not limited in the embodiment of the present invention.

For example, in one crystal rotation period, two single crystal rod images are acquired, or a plurality of single crystal rod images are acquired at a plurality of set time points, etc., so that detection is continuously performed during the process of pulling up the single crystal rod.

The schematic diagram of the image of a normally grown single crystal rod is shown in fig. 2, which includes two images taken at intervals of a certain duration in one crystal rotation period. The schematic diagram of the single crystal rod image with abnormal arc drawing as shown in fig. 3 includes two images shot at intervals of a certain duration in one crystal rotation period. The diagram of the abnormal distortion single crystal rod image shown in fig. 4 includes two images taken at intervals of a certain duration in one crystal rotation period.

The distortion abnormality is an abnormal change in the growth state of the single crystal rod, and is a change in the shape of the single crystal rod, while the position of the single crystal rod is substantially unchanged. The arc striking abnormality is also an abnormal change in the growth state of the single crystal rod, and is a large change in the position of the single crystal rod at the time of growth.

In an alternative embodiment of the invention, the positions of the crystal lines in at least two single crystal rod images are different, i.e. in each diameter measurement, no matter how many single crystal rod images are, the positions of the crystal lines in at least two single crystal rod images are different. For example, the number of crystal lines of a single crystal rod is 4, and if the time interval of two single crystal rod images is n/4 of the crystal rotation period, wherein n is a natural number, the positions of the crystal lines in the two single crystal rod images appear at the same position. The single crystal bar images with different crystal line positions can further eliminate the influence of the crystal line on anomaly detection, and improve the accuracy of anomaly determination.

In an alternative embodiment of the present invention, the number of crystal lines of the single crystal rod is m, and in the at least two single crystal rod images, a time interval between shooting times of at least two single crystal rod images is not equal to a crystal rotation period of n/m, where n is a natural number.

The number of crystal lines of the single crystal bar is m. The time interval for taking the images of the single crystal rod is related to the period of the crystal rotation and the number of crystal lines under normal conditions. In at least two single crystal bar images, the time interval of the shooting time of at least two single crystal bar images should not be equal to n times of the crystal rotation period of 1/m, and n is a natural number, so that the situation that crystal lines in different single crystal bar images cannot appear in the same position is ensured, and the accuracy of anomaly detection is improved.

In an alternative embodiment of the present invention, the preset duration is one crystal transition period, so that each crystal transition period can determine the abnormal condition once.

Step 102, detecting bright ring regions in each single crystal rod image.

In the embodiment of the invention, in the constant diameter stage, the overall brightness of the single crystal rod image is lower, and a bright ring appears at the position of the solution level of the single crystal rod immersed in the crucible. Within a preset time period, the positions and the shapes of the bright rings in the normal at least two single crystal rod images are not changed greatly, the shapes of the bright rings of the single crystal rods with abnormal distortion are changed greatly, and the positions of the bright rings of the single crystal rods with abnormal arc striking are changed.

To visually see the change of the bright ring in different situations, the two images in fig. 2 and 3 are combined into one image for observation. The two images in fig. 2 are fused together to give fig. 5, and little change in the bright ring area can be observed. The two images in fig. 3 are fused together to obtain fig. 6, and a significant positional deviation of the bright ring region can be observed. The two images in fig. 4 are fused together to give fig. 7, and the widening of the bright ring area can be observed.

In the embodiment of the invention, for each single crystal rod image, the bright ring area in the image is detected, and specifically, the corresponding image representing the bright ring area, that is, the bright ring image, can be generated, or any other applicable way can be used for representing the bright ring area. The bright ring image includes a bright ring region and a non-bright ring region.

For example, using the same threshold segmentation algorithm and parameters, a bright ring region in a single crystal bar image is segmented, and according to the segmentation result, a bright ring image is generated, such as the schematic diagram of the threshold segmentation result of fig. 2 shown in fig. 8, such as the schematic diagram of the threshold segmentation result of fig. 3 shown in fig. 9, and such as the schematic diagram of the threshold segmentation result of fig. 4 shown in fig. 10. The bright ring image may be obtained in any suitable manner, which is not limited in the embodiment of the present invention.

The implementation of the embodiment of the invention has lower requirements on the algorithm for generating the bright ring image, and can ensure the consistency of the result by adopting the unified and same algorithm and parameters, so that the method has wide applicability for determining the abnormal condition.

In actual production, the camera is installed and the like, so that the camera has a large visual field, a small visual field and the like, and the scheme of the invention has good adaptability. The small view field means that the camera can only shoot the left side and the right side of the bright ring, and the large view field means that the camera can shoot the lower half part of the bright ring. The at least two single crystal bar images may be small field of view or may be large field of view, but in the practice of embodiments of the present invention, the field of view of the camera is required to be fixed to ensure that the corresponding fields of view of the at least two single crystal bar images are the same.

And step 103, determining abnormal conditions of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images.

In the embodiment of the invention, the bright ring area corresponding to each single crystal rod image can reflect the shape of the cross section of the single crystal rod at the solution and the junction of the solution, namely the shape of the single crystal rod growth. The degree of coincidence of the bright ring areas corresponding to the at least two single crystal rod images can reflect the change condition of the shape of the single crystal rod at the growth position. Within a preset period of time, the shape of the growth part of the normal at least two single crystal rod images cannot be changed greatly, the shape of the growth part of the distorted abnormal single crystal rod can be changed greatly, and the growth part of the arc-striking abnormal single crystal rod can be changed.

In the embodiment of the present invention, the degree of coincidence is information for representing the degree of coincidence between the plurality of bright ring regions, and specifically any suitable degree of coincidence may be adopted, which is not limited in the embodiment of the present invention.

For example, for each two adjacent bright ring areas corresponding to the single crystal rod images, the quotient of the area of the bright ring area in the previous single crystal rod image divided by the area of the bright ring area in the next single crystal rod image is calculated, and then the average value of the quotient of all the areas is calculated to be used as the coincidence degree, or the quotient of the number of the pixels of the bright ring area in the previous single crystal rod image divided by the number of the pixels of the bright ring area in the next single crystal rod image is calculated to be used as the coincidence degree, and then the average value of the quotient of the number of all the pixels is calculated to be used as the coincidence degree.

For another example, if the intersection area of the bright ring areas corresponding to the at least two single crystal bar images is the overlapping portion of the bright ring areas corresponding to the at least two single crystal bar images, the quotient obtained by dividing the area of the intersection area by the average value of the areas of the bright ring areas corresponding to the at least two single crystal bar images may be the degree of overlapping, or the quotient obtained by dividing the number of pixels of the intersection area by the average value of the number of pixels of the bright ring areas corresponding to the at least two single crystal bar images may be the degree of overlapping.

For another example, if the intersection area of the bright ring areas corresponding to the at least two single crystal bar images is the overlapping portion of the bright ring areas corresponding to the at least two single crystal bar images, and the union area of the bright ring areas corresponding to the at least two single crystal bar images is the entire bright ring area, the quotient obtained by dividing the area of the intersection area by the area of the union area may be the degree of coincidence, or the quotient obtained by dividing the number of pixels of the intersection area by the number of pixels of the union area may be the degree of coincidence.

In the embodiment of the invention, the higher the coincidence degree is, the more normal the single crystal rod is, the lower the coincidence degree is, and the more abnormal the single crystal rod is. In the specific implementation, the higher the value of the degree of coincidence, the higher the degree of coincidence, or the lower the value of the degree of coincidence, the lower the degree of coincidence, may be according to the definition of the degree of coincidence.

In some embodiments, the greater the value of the degree of coincidence, the more likely an anomaly is to occur in the single crystal rod, and the greater the value of the degree of coincidence exceeds a preset threshold, the anomaly is determined to occur in the single crystal rod. For example, if the value of the degree of coincidence exceeds a preset threshold, it is determined that the single crystal rod is abnormal in growth, and if the value of the degree of coincidence does not exceed a preset threshold, it is determined that the single crystal rod is normal in growth. For another example, if the value of the degree of coincidence is within the preset range, it is determined that the single crystal rod is abnormal in torsion, if the value of the degree of coincidence is lower than the lower limit of the preset range, it is determined that the single crystal rod is normal in growth, and if the value of the degree of coincidence exceeds the upper limit of the preset range, it is determined that the single crystal rod is abnormal in arc.

In other embodiments, the smaller the value of the degree of coincidence, the more likely an abnormality is to occur in the single crystal rod, and the lower the value of the degree of coincidence is below a preset threshold, the abnormality is determined to have occurred in the single crystal rod. For example, if the value of the degree of coincidence is lower than a preset threshold, it is determined that the single crystal rod is abnormal in growth, and if the value of the degree of coincidence exceeds a preset threshold, it is determined that the single crystal rod is normal in growth. For another example, if the value of the degree of coincidence is within the preset range, it is determined that the single crystal rod is abnormal in torsion, if the value of the degree of coincidence is lower than the lower limit of the preset range, it is determined that the single crystal rod is abnormal in arc, and if the value of the degree of coincidence exceeds the upper limit of the preset range, it is determined that the single crystal rod is normal in growth.

In an optional embodiment of the present invention, a specific implementation manner of determining the abnormal situation of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images may include: and determining an intersection area and a union area of the bright ring areas according to the bright ring areas corresponding to the at least two single crystal rod images, and determining abnormal conditions of the single crystal rods according to the coincidence degree of the intersection area and the union area.

The bright ring areas corresponding to different single crystal rod images are different. The intersection of the plurality of bright ring regions may be obtained, and specifically an image representing the intersection region may be generated, that is, the intersection image, or the intersection region may be represented in other suitable manners, which is not limited in the embodiment of the present invention. The union of the bright ring regions may be obtained, and an image representing the union region may be generated, that is, the union image, or the union region may be represented in other suitable manners, which is not limited in the embodiment of the present invention.

For example, as shown in FIG. 11, which is a schematic view of the intersection region and the union region of the two images of FIG. 8, the intersection region is on the left, the union region is on the right, and it can be seen that the intersection region and the union region of a normally grown single crystal rod are almost identical. As shown in fig. 12, which is a schematic view of the intersection region and the union region of the two images of fig. 9, the intersection region is on the left side, the union region is on the right side, and it can be seen that the intersection region and the union region of the single crystal rod with abnormal arcing are greatly different. As shown in fig. 13, which is a schematic view of the intersection region and the union region of the two images of fig. 10, the intersection region is on the left side, the union region is on the right side, and it can be seen that the difference between the intersection region and the union region of the single crystal rod with abnormal distortion is large.

Specific implementations of determining the intersection area and the union area of the bright ring areas according to the bright ring areas corresponding to the at least two single crystal rod images may include a plurality of types, which are not limited in the embodiment of the present invention.

For example, an intersection region and a union region are determined according to pixel values of pixel points in each bright ring image, an intersection image is generated according to the intersection region, and a union image is generated according to the union region. The intersection image comprises areas except for the intersection sum of the bright ring areas, and the union image comprises areas except for the intersection sum of the bright ring areas.

For example, in one generation method of the intersection region, the bright ring image is a binarized image, the region having a pixel value of 255 is a bright ring region, the pixel values of the pixels at the same position of the plurality of bright ring images are all multiplied by each other, the pixel value of the pixel in one bright ring image is 0 at one position, the pixel value of the pixel after multiplication is still 0, the pixel value of the pixel in the plurality of bright ring images is 255 at one position, the pixel value of the pixel after multiplication is not 0, and the pixel value of the pixel assigned to the position is 255, and thus the intersection image representing the intersection region can be obtained.

For example, in one generation method of the union region, the bright ring image is a binarized image, the region with the pixel value of 255 is the bright ring region, the pixel values of the pixel points at the same position of the bright ring images are all added up, the pixel value of the pixel point in one bright ring image is 255 at one position, the pixel value of the pixel point after addition is not 0, the pixel value of the pixel point assigned to the position is 255, and the pixel value of the pixel point in one position is 0 at all of the pixel points in the bright ring images, the pixel value of the pixel point after addition is still 0, so that the union image representing the union region can be obtained.

And calculating the coincidence degree of the intersection region and the union region as the coincidence degree of the bright ring regions corresponding to at least two single crystal rod images. Based on the degree of coincidence, the abnormal condition of the single crystal rod can be determined, and the abnormal or abnormal-free (normal) condition can be distinguished, or the abnormal classification and abnormal-free (normal) condition can be distinguished.

In the embodiment of the present invention, specific implementation manners for determining the difference information of the intersection area and the union area may include various embodiments, which are not limited in this embodiment of the present invention.

For example, the ratio of the areas of the bright ring regions in the intersection region and the union region is calculated as the difference information, and the smaller the value of the difference information, the more likely the single crystal rod is to be abnormal.

For another example, the ratio of the number of pixels in the bright ring region in the intersection region and the union region is calculated, and the ratio is subtracted by 1 to obtain difference information, so that the larger the value of the difference information is, the more abnormality is likely to occur in the single crystal rod.

Referring to fig. 14, a flowchart illustrating steps of an embodiment of an anomaly determination method according to the present invention may specifically include the steps of:

step 201, during the process of pulling up single crystals, at least two single crystal rod images are acquired within a preset duration of the constant diameter stage.

In the embodiments of the present invention, the specific implementation manner of this step may be referred to the description in the foregoing embodiments, which is not repeated herein.

Step 202, detecting bright ring regions in each single crystal rod image.

Step 203 of determining a first pixel position within the bright ring area in each bright ring image and a second pixel position within the bright ring area in any of the bright ring images; wherein the bright ring image includes a bright ring region and a non-bright ring region.

In the embodiment of the invention, the pixel points in the bright ring area in each bright ring image are screened out, and the positions of the pixel points are determined to obtain the first pixel position.

For example, the bright ring image is a binarized image, the region having a pixel value of 255 is a bright ring region, and the pixel values of the other regions are 0. The coordinates of the pixel point with the pixel value of 255 in each bright ring image, namely the first pixel position, are screened out.

In the embodiment of the invention, the pixel points in the bright ring area in any bright ring image are screened out, and the positions of the pixel points are determined to obtain the second pixel position.

For example, the bright ring image is a binarized image, the region having a pixel value of 255 is a bright ring region, and the pixel values of the other regions are 0. And screening out the coordinates of the pixel point with the pixel value of 255 in any bright ring image, namely the second pixel position.

Step 204, determining the intersection area according to the first pixel position.

In an embodiment of the invention, an intersection region characterizing the intersection of the bright ring regions is determined from the first pixel position. For example, according to the first pixel position, the pixel value of the pixel point of the corresponding coordinate is assigned to 255, and the pixel values of the other pixel points are assigned to 0, so as to obtain an intersection image representing the intersection region.

In some embodiments, the intersection of the bright ring regions in the intersection region and other regions may take other pixel values, or other distinguishing manners may be used, which the embodiments of the present invention do not limit.

And step 205, determining the union region according to the second pixel position.

In an embodiment of the invention, a union region characterizing the union of the bright ring regions is determined based on the second pixel positions. For example, according to the second pixel position, the pixel value of the pixel point of the corresponding coordinate is assigned to 255, and the pixel values of the other pixel points are assigned to 0, so as to obtain the union image representing the union region.

And step 206, calculating the coincidence degree between the intersection region and the union region.

In the embodiment of the present invention, as described above, the specific implementation manner of calculating the degree of coincidence between the intersection region and the union region may include various kinds, and the embodiment of the present invention is not limited thereto.

In an alternative embodiment of the present invention, a specific implementation manner of calculating the coincidence degree between the intersection region and the union region may include: acquiring the number of first pixels of the intersection area and the number of second pixels of the union area; and determining the coincidence degree according to the number of the first pixel points and the number of the second pixel points.

The number of pixels in the intersection region can represent the size of the intersection region, and the number of the first pixels is obtained. The number of pixels in the union region can represent the size of the union region, and the number of second pixels is obtained.

For example, the number of pixels with the pixel value of 255 in the intersection image is determined to obtain the first number of pixels, and the number of pixels with the pixel value of 255 in the union image is determined to obtain the second number of pixels.

The specific ways of determining the degree of coincidence according to the number of the first pixel points and the number of the second pixel points may include multiple ways. For example, the ratio of the number of the first pixels to the number of the second pixels is calculated, and the smaller the value of the degree of coincidence is, the greater the probability of occurrence of an abnormality of the single crystal rod is, and the more serious the occurrence of the abnormality is. For another example, the absolute value of the difference between the number of the first pixels and the number of the second pixels is calculated as the degree of coincidence, and the larger the value of the degree of coincidence is, the larger the probability of occurrence of an abnormality of the single crystal rod is, and the more serious the occurrence of the abnormality is.

In an optional embodiment of the present invention, determining the degree of coincidence according to the number of the first pixels and the number of the second pixels may include: calculating the ratio of the number of the first pixel points to the number of the second pixel points; and calculating the difference between the preset value and the ratio as the coincidence degree.

Calculating the ratio of the number of the first pixel points to the number of the second pixel points, and subtracting the ratio from a preset value to obtain a result, wherein the larger the value of the coincidence degree is, the lower the coincidence degree is, the larger the probability of the single crystal rod abnormal is, and the more serious the abnormal condition is.

For example, the preset value is taken as 1, the number of the first pixel points is m1, the number of the second pixel points is m2, the ratio of m1 to m2 is calculated, and the degree of coincidence level=1-ratio. The preset value may take any suitable value, which is not limited in this embodiment of the present invention. At this time, the larger the value of the degree of coincidence, the lower the degree of coincidence, the more likely the single crystal rod is abnormal, and the smaller the value of the degree of coincidence, the higher the degree of coincidence, the more likely the single crystal rod is in a normal state.

In an alternative embodiment of the present invention, a specific implementation manner of calculating the coincidence degree between the intersection region and the union region may include: determining a first area of the intersection region and a second area of the union region; and determining the coincidence degree according to the first area and the second area.

The first region area of the intersection region may characterize a size of the intersection region. The second area of the union region may characterize the size of the union region. The area of the intersection region and the area of the union region may be determined in any suitable manner, which is not limited in the embodiment of the present invention.

The specific manner of determining the degree of coincidence may include a plurality of types depending on the first area and the second area. For example, the ratio of the area of the first region to the area of the second region is calculated as the degree of coincidence, and the smaller the value of such degree of coincidence, the greater the probability of occurrence of an abnormality of the single crystal rod, the more serious the occurrence of the abnormality. For another example, the absolute value of the difference between the first region area and the second region area is calculated as the degree of coincidence, and the larger the value of the degree of coincidence is, the larger the probability of occurrence of an abnormality of the single crystal rod is, and the more serious the occurrence of the abnormality is.

For example, the ratio of the areas of the bright ring regions in the intersection region and the union region is calculated as the degree of coincidence, the smaller the value of the degree of coincidence, the lower the degree of coincidence, the more likely the single crystal rod is to be abnormal, the larger the value of the degree of coincidence, the higher the degree of coincidence, and the more likely the single crystal rod is to be in a normal state.

And step 207, determining abnormal conditions of the single crystal rod according to the coincidence degree and a preset threshold value.

In the embodiment of the present invention, a specific implementation manner of determining the abnormal situation of the single crystal ingot according to the overlapping degree and the preset threshold may be referred to the description in the foregoing embodiment, which is not repeated herein. The preset threshold may be set to any suitable value, which is not limited in this embodiment of the present invention.

In an alternative embodiment of the present invention, the preset threshold includes a preset distortion threshold and a preset arc striking threshold, the preset distortion threshold being less than the preset arc striking threshold. According to the coincidence degree and a preset threshold, one specific implementation manner of determining the abnormal condition of the single crystal rod may include: if the value of the coincidence degree is between the preset distortion threshold value and the preset arc striking threshold value, determining that the single crystal rod is distorted abnormally; if the value of the coincidence degree exceeds the preset arc striking threshold value, determining that the single crystal rod is abnormal in arc striking; and if the value of the coincidence degree does not exceed the preset distortion threshold value, determining that the single crystal rod grows normally.

The preset twisting threshold is a threshold for determining that the single crystal rod is abnormal in twisting, and any suitable value may be adopted, which is not limited in the embodiment of the present invention. The preset arcing threshold is a threshold for determining that an arcing abnormality occurs in the single crystal rod, and specifically any suitable value may be adopted, which is not limited in the embodiment of the present invention.

In the embodiment of the invention, a preset distortion threshold value and a preset arc striking threshold value are preset before field use. According to the historical data, calculating the first coincidence degree of the normally grown single crystal rod, the second coincidence degree of the distorted abnormal single crystal rod and the third coincidence degree of the arc-striking abnormal single crystal rod, and determining a preset distortion threshold value and a preset arc-striking threshold value according to the first coincidence degree, the second coincidence degree and the third coincidence degree.

For example, by using history data or test data, the degree of coincidence level_1 of a single crystal rod which normally grows in a period of time, the degree of coincidence level_2 of a single crystal rod which has a distortion abnormality, and the degree of coincidence level_3 of a single crystal rod which has a arcing abnormality are calculated off line. The relationship among the three is as follows: level_1< level_2< level_3. The preset warp threshold th1, th1 is set to be greater than level_1 but less than level_2. The preset arcing threshold th2, th2 is set to be greater than level_2 but less than level_3. By adopting the mode, the preset distortion threshold and the preset arc striking threshold are respectively customized for single-crystal pulling equipment, so that the scheme is suitable for various single-crystal pulling equipment, and accurate results can be obtained on different single-crystal pulling equipment.

In actual production, the damage of arc striking abnormality is much larger than that of distortion abnormality, and when arc striking is serious, a single crystal rod possibly collides with a crucible, so that the single crystal rod is broken, and serious production accidents such as pot upsetting and the like are caused. Therefore, the arc striking is performed as soon as possible, the arc striking degree is reduced until the arc striking is not performed any more, and whether the crystal line is continuously pulled is determined according to the information such as whether the crystal line is disconnected at the moment or not.

According to the embodiment of the invention, at least two single crystal rod images in the preset duration of the equal diameter stage are acquired in the process of pulling single crystals, the bright ring area in each single crystal rod image is detected, the first pixel position in the bright ring area in each bright ring image and the second pixel position in the bright ring area in any bright ring image are determined, the intersection area is determined according to the first pixel position, the union area is determined according to the second pixel position, the coincidence degree between the intersection area and the union area is calculated, the abnormal condition of the single crystal rod is determined according to the coincidence degree and the preset threshold, and the growth variation of the single crystal rod is obtained by utilizing the difference of the intersection and the union of the bright ring areas, so that the abnormal condition of the single crystal rod is found in time, the abnormal man-hour after the abnormal condition is reduced, the single product is further improved, the risk of dropping the single crystal rod when the arc is severely scratched is avoided, and better guarantee is provided for production safety.

It should be noted that, for simplicity of description, the method embodiments are shown as a series of acts, but it should be understood by those skilled in the art that the embodiments are not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the embodiments. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred embodiments, and that the acts are not necessarily required by the embodiments of the invention.

Referring to fig. 15, there is shown a block diagram of an embodiment of an abnormality determining apparatus of the present invention, which may specifically include the following modules:

an image acquisition module 301, configured to acquire at least two single crystal rod images within a preset duration of the constant diameter stage during the process of pulling the single crystal;

a bright ring detection module 302 for detecting a bright ring region in each single crystal rod image;

the anomaly determination module 302 is configured to determine an anomaly of the single crystal rod according to a coincidence degree of bright ring regions corresponding to the at least two single crystal rod images.

Optionally, the anomaly determination module includes:

Optionally, the intersection union determination submodule includes:

Optionally, the anomaly determination submodule includes:

Optionally, the degree calculating unit includes:

Optionally, the preset duration is a crystal transition period.

For the device embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference is made to the description of the method embodiments for relevant points.

Fig. 16 is a block diagram illustrating a configuration of an electronic device 600 for anomaly determination, diameter determination, according to an example embodiment. For example, the electronic device 600 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, an exercise device, a personal digital assistant, and the like.

Referring to fig. 16, the electronic device 600 may include one or more of the following components: a processing component 602, a memory 604, a power component 606, a multimedia component 608, an audio component 610, an input/output (I/O) interface 612, a sensor component 614, and a communication component 616.

The processing component 602 generally controls overall operation of the electronic device 600, such as operations associated with display, telephone calls, data communications, camera operations, and recording operations. The processing component 602 may include one or more processors 620 to execute instructions to perform all or part of the steps of the anomaly determination method, diameter determination method described above. Further, the processing component 602 can include one or more modules that facilitate interaction between the processing component 602 and other components. For example, the processing component 602 may include a multimedia module to facilitate interaction between the multimedia component 608 and the processing component 602.

The memory 604 is configured to store various types of data to support operations at the device 600. Examples of such data include instructions for any application or method operating on the electronic device 600, contact data, phonebook data, messages, pictures, videos, and so forth. The memory 604 may be implemented by any type or combination of volatile or nonvolatile memory devices such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disk.

The power component 604 provides power to the various components of the electronic device 600. The power components 604 may include a power management system, one or more power sources, and other components associated with generating, managing, and distributing power for the electronic device 600.

The multimedia component 608 includes a screen between the electronic device 600 and the user that provides an output interface. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from a user. The touch panel includes one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensor may sense not only the boundary of a touch or slide action, but also the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 608 includes a front camera and/or a rear camera. When the electronic device 600 is in an operational mode, such as a shooting mode or a video mode, the front camera and/or the rear camera may receive external multimedia data. Each front camera and rear camera may be a fixed optical lens system or have focal length and optical zoom capabilities.

The audio component 610 is configured to output and/or input audio signals. For example, the audio component 610 includes a Microphone (MIC) configured to receive external audio signals when the electronic device 600 is in an operational mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signals may be further stored in the memory 604 or transmitted via the communication component 616. In some embodiments, audio component 610 further includes a speaker for outputting audio signals.

The I/O interface 612 provides an interface between the processing component 602 and peripheral interface modules, which may be a keyboard, click wheel, buttons, etc. These buttons may include, but are not limited to: homepage button, volume button, start button, and lock button.

The sensor assembly 614 includes one or more sensors for providing status assessment of various aspects of the electronic device 600. For example, the sensor assembly 614 may detect an on/off state of the device 600, a relative positioning of the components, such as a display and keypad of the electronic device 600, the sensor assembly 614 may also detect a change in position of the electronic device 600 or a component of the electronic device 600, the presence or absence of a user's contact with the electronic device 600, an orientation or acceleration/deceleration of the electronic device 600, and a change in temperature of the electronic device 600. The sensor assembly 614 may include a proximity sensor configured to detect the presence of nearby objects in the absence of any physical contact. The sensor assembly 614 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 614 may also include an acceleration sensor, a gyroscopic sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

The communication component 616 is configured to facilitate communication between the electronic device 600 and other devices, either wired or wireless. The electronic device 600 may access a wireless network based on a communication standard, such as WiFi,2G, or 3G, or a combination thereof. In one exemplary embodiment, the communication part 614 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In one exemplary embodiment, the communications component 614 further includes a Near Field Communication (NFC) module to facilitate short range communications. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID) technology, infrared data association (IrDA) technology, ultra Wideband (UWB) technology, bluetooth (BT) technology, and other technologies.

In an exemplary embodiment, the electronic device 600 may be implemented by one or more Application Specific Integrated Circuits (ASICs), digital Signal Processors (DSPs), digital Signal Processing Devices (DSPDs), programmable Logic Devices (PLDs), field Programmable Gate Arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic elements for performing the anomaly determination methods described above.

In an exemplary embodiment, a non-transitory computer readable storage medium is also provided, such as memory 604, including instructions executable by processor 620 of electronic device 600 to perform the anomaly determination method described above. For example, the non-transitory computer readable storage medium may be ROM, random Access Memory (RAM), CD-ROM, magnetic tape, floppy disk, optical data storage device, etc.

A non-transitory computer readable storage medium, which when executed by a processor of a terminal, causes the terminal to perform an anomaly determination method, the method comprising:

detecting a bright ring region in each single crystal rod image;

Determining the intersection area according to the first pixel position;

and determining the union region according to the second pixel position.

Optionally, the preset duration is a crystal transition period.

In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described by differences from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other.

It will be apparent to those skilled in the art that embodiments of the present invention may be provided as a method, apparatus, or computer program product. Accordingly, embodiments of the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the invention may take the form of a computer program product on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.

Embodiments of the present invention are described with reference to flowchart illustrations and/or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing terminal device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal device, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiment and all such alterations and modifications as fall within the scope of the embodiments of the invention.

Finally, it is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or terminal device comprising the element.

The foregoing has described in detail a method and apparatus for determining anomalies, an electronic device and a readable storage medium, wherein specific examples are employed to illustrate the principles and embodiments of the present invention, and the above examples are only for aiding in the understanding of the method and core concept of the present invention; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present invention, the present description should not be construed as limiting the present invention in view of the above.

Claims

1. An anomaly determination method, comprising:

detecting a bright ring region in each single crystal rod image;

2. The method of claim 1, wherein determining the abnormal condition of the single crystal rod according to the coincidence degree of the bright ring areas corresponding to the at least two single crystal rod images comprises:

3. The method of claim 2, wherein determining intersection and union regions of the bright ring regions from bright ring regions corresponding to the at least two single crystal rod images comprises:

determining the intersection area according to the first pixel position;

and determining the union region according to the second pixel position.

4. The method of claim 2, wherein determining an abnormal condition of the single crystal bar based on the degree of coincidence of the intersection region and the union region comprises:

5. A method according to claim 3, wherein said calculating the degree of coincidence between the intersection region and the union region comprises:

6. The method of claim 5, wherein determining the degree of overlap based on the first number of pixels and the second number of pixels comprises:

7. A method according to claim 3, wherein said calculating the degree of coincidence between the intersection region and the union region comprises:

8. The method of claim 4, wherein the predetermined threshold comprises a predetermined distortion threshold and a predetermined arcing threshold, the predetermined distortion threshold being less than the predetermined arcing threshold, the determining an abnormal condition of the single crystal bar based on the degree of coincidence and the predetermined threshold comprising:

9. The method of claim 1, wherein the predetermined duration is one crystal transition period.

10. An abnormality determination apparatus, characterized by comprising:

11. The electronic equipment is characterized by comprising a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory are communicated with each other through the communication bus;

A memory for storing a computer program;

a processor for carrying out the method steps of any one of claims 1-9 when executing a program stored on a memory.

12. A readable storage medium, characterized in that instructions in the storage medium, when executed by a processor of an electronic device, enable the electronic device to perform the anomaly determination method of one or more of the method claims 1-9.