CN117589674B - Clamp for chip test - Google Patents

Clamp for chip test Download PDF

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Publication number
CN117589674B
CN117589674B CN202311569277.1A CN202311569277A CN117589674B CN 117589674 B CN117589674 B CN 117589674B CN 202311569277 A CN202311569277 A CN 202311569277A CN 117589674 B CN117589674 B CN 117589674B
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arc
chip
arc ring
circle
clamping
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CN117589674A (en
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彭河蒙
郭小童
范树迁
刘懿铭
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Chongqing Saibao Industrial Technology Research Institute Co ltd
Chongqing Institute of Green and Intelligent Technology of CAS
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Chongqing Saibao Industrial Technology Research Institute Co ltd
Chongqing Institute of Green and Intelligent Technology of CAS
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25BTOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
    • B25B11/00Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
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  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

The invention relates to the technical field of clamps for chip testing, and particularly discloses a clamp for chip testing, which comprises a supporting rod, a first arc ring rotationally connected with the supporting rod, a second arc ring rotationally connected with the first arc ring, a groove formed at the end part of the first arc ring, and a lug which is arranged at the end part of the second arc ring, can penetrate through the groove and can be fixed with the groove, wherein the front side and the back side of the first arc ring and the front side and the back side of the second arc ring are detachably connected with lenses for amplifying objects, and a plurality of test holes are formed in the lenses; the first arc ring is provided with a first connecting rod coaxially connected with the supporting rod, the second arc ring is fixedly connected with a second connecting rod, and opposite ends of the first connecting rod and the second connecting rod are respectively fixedly connected with a clamping piece for clamping the edge end face of the chip in a rotating manner; the device solves the problems that the traditional chip clamping size is less and the clamping position is not damaged to the chip.

Description

一种芯片测试用夹具A chip testing fixture

技术领域Technical Field

本申请涉及芯片测试用夹具技术领域,具体公开了一种芯片测试用夹具。The present application relates to the technical field of chip testing fixtures, and specifically discloses a chip testing fixture.

背景技术Background Art

在生产芯片时,为了实现芯片的高效生产,需要将芯片固定在夹具中进行测试;When producing chips, in order to achieve efficient chip production, the chips need to be fixed in a fixture for testing;

目前针对于这些夹具而言,多数改进基本在于一个芯片夹具仅能适应一个型号的芯片,当生产者有多种需要生产的芯片时,需要备用多套夹具,既提高夹具的适用范围上入手;At present, most improvements to these fixtures are that one chip fixture can only adapt to one type of chip. When the manufacturer has multiple chips to produce, multiple sets of fixtures are needed to improve the scope of application of the fixture.

这种改进本质是没有问题的,但是却没有实际出发,随着技术的迭代,芯片这种东西不仅需要正面测试,同时也需要也需要背面测试,因为很多芯片的正反两面均存在需要测试的项目;There is nothing wrong with this improvement in essence, but it has not been put into practice. With the iteration of technology, chips not only need front-side testing, but also back-side testing, because many chips have items that need to be tested on both sides.

由于芯片的正反两面均需要测试,传统的可改变尺寸的夹具已经不适用,传统的可改变尺寸的夹具由于本身的夹具缺陷,只能测试单一面,并且,目前的可改变尺寸的夹具要么实现尺寸改变,要么可测试多面,两者无法兼容,并且现在的可改变尺寸的夹具在夹持芯片上,存在技术不足:Since both the front and back sides of the chip need to be tested, the traditional resizable fixture is no longer applicable. Due to its own fixture defects, the traditional resizable fixture can only test a single side. In addition, the current resizable fixtures can either change the size or test multiple sides, which are not compatible. In addition, the current resizable fixtures have technical deficiencies in clamping the chip:

现在的夹具在夹持芯片上普遍采取夹具夹持芯片的边缘,进而实现芯片的固定,这种模式在以前是可行,但是现在,某些情况就实现不了,现在的芯片不仅追求大算力,还追求小制成,因此需要在极为有限的面积设置出最为合理的电路图,因此,以前夹具夹持芯片的边缘非常容易破坏到芯片的电路设计,进而导致芯片受损,因此,基于上述缺陷,发明人提出一种芯片测试用夹具。Nowadays, the clamp generally clamps the edge of the chip to fix the chip. This mode was feasible in the past, but now it cannot be realized in some cases. Today's chips not only pursue high computing power, but also small manufacturing, so it is necessary to set up the most reasonable circuit diagram in an extremely limited area. Therefore, the edge of the chip clamped by the clamp in the past can easily damage the circuit design of the chip, thereby causing damage to the chip. Therefore, based on the above defects, the inventor proposes a chip testing fixture.

发明内容Summary of the invention

本发明的目的在于解决了传统的芯片夹持尺寸较少且夹持位置不对导致芯片受损的问题。The purpose of the present invention is to solve the problem that the conventional chip clamping size is small and the clamping position is incorrect, resulting in chip damage.

为了达到上述目的,本发明提供以下基础方案:In order to achieve the above object, the present invention provides the following basic scheme:

一种芯片测试用夹具,包括支撑杆、与支撑杆转动连接的第一弧圈、与第一弧圈转动连接的第二弧圈、开在第一弧圈端部的凹槽和设置在第二弧圈端部的可穿过凹槽并可与凹槽固定的凸块,所述第一弧圈与所述第二弧圈的正反两面可拆卸连接有用于放大物体的透镜,所述透镜上开有若干测试孔;A chip testing fixture comprises a support rod, a first arc ring rotatably connected to the support rod, a second arc ring rotatably connected to the first arc ring, a groove opened at the end of the first arc ring, and a protrusion arranged at the end of the second arc ring and capable of passing through the groove and being fixed to the groove, wherein the first arc ring and the second arc ring are detachably connected to the front and back surfaces thereof with lenses for magnifying an object, and the lenses are provided with a plurality of test holes;

第一弧圈上设有与支撑杆同轴连接的第一连接杆,所述第二弧圈上固接有第二连接杆,所述第一连接杆与所述第二连接杆相向一端分别固接有以及转动连接有用于芯片边缘端面夹持的夹持件;The first arc ring is provided with a first connecting rod coaxially connected to the support rod, the second arc ring is fixedly connected to a second connecting rod, and the first connecting rod and the second connecting rod are respectively fixedly connected and rotatably connected to a clamping member for clamping the edge end surface of the chip at one end facing each other;

所述夹持件包括固定块、开在固定块上的固定槽、设置在固定槽的底部的挤压组件、设置在固定槽两内侧壁的海绵和与挤压组件连接的伸出组件,所述伸出组件从固定块两侧穿出并与芯片的边缘接触。The clamping member includes a fixing block, a fixing groove opened on the fixing block, an extrusion component arranged at the bottom of the fixing groove, a sponge arranged on two inner side walls of the fixing groove, and a protruding component connected to the extrusion component, wherein the protruding component passes through two sides of the fixing block and contacts the edge of the chip.

本基础方案的原理及效果在于:The principles and effects of this basic solution are:

1.与现有技术相比,本装置结构简单,构思巧妙,本装置在外观测试上具备显著优势,第一弧圈与所述第二弧圈的正反两面可拆卸连接有用于放大物体的透镜,可以直接通过扩大芯片,方便更好的更加容易的观察芯片的外观,并且能够快速的发现外观的不足。1. Compared with the prior art, the device has a simple structure and an ingenious design. The device has significant advantages in appearance testing. The front and back sides of the first arc ring and the second arc ring are detachably connected with lenses for magnifying objects, which can directly magnify the chip, facilitate better and easier observation of the appearance of the chip, and quickly discover defects in the appearance.

2.与现有技术相比,本装置即可以实现尺寸改变,又可以实现测试正反两面,实现了尺寸改变和测试正反两面的有机结合,尺寸改变和测试正反两面两个功能互不干扰,互不影响。2. Compared with the prior art, the device can realize both size change and testing of both sides, realizing an organic combination of size change and testing of both sides. The two functions of size change and testing of both sides do not interfere with each other.

3.与现有技术相比,本装置解决了传统的芯片夹持尺寸较少的问题,第一弧圈上设有与支撑杆同轴连接的第一连接杆,所述第二弧圈上固接有第二连接杆,第一连接杆与第二连接杆相向一端分别固接有以及转动连接有用于芯片边缘端面夹持的夹持件,利用第一弧圈和第二弧圈相向移动,实现两个夹持件的距离的改变,通过两个夹持件的距离的改变实现对多种尺寸的芯片的夹持。3. Compared with the prior art, the present device solves the problem of the smaller size of the traditional chip clamping. The first arc circle is provided with a first connecting rod coaxially connected to the support rod, and the second arc circle is fixedly connected to the second connecting rod. The first connecting rod and the second connecting rod are respectively fixedly connected and rotatably connected at the opposite ends thereof with clamping members for clamping the edge end faces of the chip. The distance between the two clamping members is changed by moving the first arc circle and the second arc circle toward each other, and the clamping of chips of various sizes is achieved by changing the distance between the two clamping members.

4.与现有技术相比,本装置解决了夹持位置不对导致芯片受损的问题,夹持件包括固定块、开在固定块上的固定槽、设置在固定槽的底部的挤压组件、设置在固定槽两内侧壁的海绵和与挤压组件连接的伸出组件,所述伸出组件从固定块两侧穿出并与芯片的边缘接触,利用芯片自身存在的重力,实现伸出组件启动,进而利用伸出组件包裹芯片的边缘并与芯片的边缘的接触,不直接接触芯片的正面和反面,由于设置了两块夹持件,利用两块夹持件的互相配合,实现伸出组件对芯片的边缘的接触,进而解决了夹持位置不对导致芯片受损的问题。4. Compared with the prior art, the present device solves the problem of chip damage caused by incorrect clamping position. The clamping member includes a fixed block, a fixed groove opened on the fixed block, an extrusion assembly arranged at the bottom of the fixed groove, a sponge arranged on the two inner walls of the fixed groove, and a protruding assembly connected to the extrusion assembly. The protruding assembly passes through both sides of the fixed block and contacts with the edge of the chip. The gravity of the chip itself is used to start the protruding assembly, and then the protruding assembly is used to wrap the edge of the chip and contact the edge of the chip without directly contacting the front and back sides of the chip. Since two clamping members are provided, the two clamping members cooperate with each other to achieve the contact of the protruding assembly with the edge of the chip, thereby solving the problem of chip damage caused by incorrect clamping position.

进一步,所述凹槽与所述凸块的连接处设有螺纹螺钉。Furthermore, a threaded screw is provided at the connection between the groove and the protrusion.

进一步,所述支撑杆与第一弧圈的连接处设有转动轴承,所述支撑杆的上端设有延长部,所述延长部穿过第一弧圈与第一连接杆同轴连接,所述支撑杆远离第一连接杆的一端固接有支撑座,所述支撑座的自由端固接有橡胶垫且支撑座的尺寸大于支撑杆的尺寸。Furthermore, a rotating bearing is provided at the connection between the support rod and the first arc circle, an extension portion is provided at the upper end of the support rod, the extension portion passes through the first arc circle and is coaxially connected to the first connecting rod, and one end of the support rod away from the first connecting rod is fixedly connected to a support seat, the free end of the support seat is fixedly connected to a rubber pad and the size of the support seat is larger than that of the support rod.

进一步,所述第一弧圈远离凹槽的一端设有转动轴,所述转动轴包括固定端和转动端,所述第一弧圈安装在固定端上,所述第二弧圈安装在转动端上,所述第二弧圈朝外的最大转动角度为第一弧圈与第二弧圈保持平齐时停止。Furthermore, a rotating shaft is provided at one end of the first arc circle away from the groove, and the rotating shaft includes a fixed end and a rotating end, the first arc circle is installed on the fixed end, and the second arc circle is installed on the rotating end, and the maximum outward rotation angle of the second arc circle is when the first arc circle and the second arc circle are kept flush.

进一步,所述第一弧圈和所述第二弧圈的正反端面均固接有磁铁片,所述透镜与磁铁片磁性连接,所述透镜为放大镜。Furthermore, magnet sheets are fixedly connected to the front and back end surfaces of the first arc loop and the second arc loop, and the lens is magnetically connected to the magnet sheet, and the lens is a magnifying glass.

进一步,所述挤压组件开在固定块内部的空腔、安装在空腔内的若干弹簧和若干挤压块,所述弹簧的一端穿出固定块与挤压块。Furthermore, the extrusion assembly has a cavity opened inside the fixed block, a plurality of springs and a plurality of extrusion blocks installed in the cavity, and one end of the spring passes through the fixed block and the extrusion block.

进一步,所述伸出组件包括设置在空腔内部的弹性气囊和与弹性气囊连通的保护柱,所述固定槽的两侧开有通孔,所述保护柱可从通孔垂直穿出,所述弹性气囊与弹簧的另一端固接,所述保护柱可保护芯片的边缘面。Furthermore, the extending component includes an elastic airbag arranged inside the cavity and a protective column connected to the elastic airbag. Through holes are opened on both sides of the fixing groove, and the protective column can pass through the through holes vertically. The elastic airbag is fixedly connected to the other end of the spring, and the protective column can protect the edge surface of the chip.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

图1示出了本申请实施例提出的一种芯片测试用夹具的结构示意图;FIG1 shows a schematic structural diagram of a chip testing fixture proposed in an embodiment of the present application;

图2示出了本申请实施例提出的一种芯片测试用夹具中固定块的俯视流程图;FIG2 is a top view flowchart of a fixing block in a chip testing fixture proposed in an embodiment of the present application;

图3示出了本申请实施例提出的一种芯片测试用夹具中弹性气囊的安装示意图。FIG3 shows a schematic diagram of the installation of an elastic airbag in a chip testing fixture according to an embodiment of the present application.

具体实施方式DETAILED DESCRIPTION

为更进一步阐述本发明为实现预定发明目的所采取的技术手段及功效,以下结合附图及较佳实施例,对依据本发明的具体实施方式、结构、特征及其功效,详细说明如后。In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the specific implementation mode, structure, characteristics and effects of the present invention are described in detail below in combination with the accompanying drawings and preferred embodiments.

说明书附图中的附图标记包括:支撑杆1、第一连接杆2、支撑杆3、第一透镜4、第二透镜5、测试孔6、第二连接杆7、第一夹持件8、第二夹持件9、转动块10、凸块11、凹槽12、第一弧圈13、第二弧圈14、转动轴15、固定槽16、挤压块17、保护柱18、弹簧19、弹性气囊20。The figure marks in the drawings of the specification include: support rod 1, first connecting rod 2, support rod 3, first lens 4, second lens 5, test hole 6, second connecting rod 7, first clamping member 8, second clamping member 9, rotating block 10, protrusion 11, groove 12, first arc circle 13, second arc circle 14, rotating shaft 15, fixing groove 16, extrusion block 17, protective column 18, spring 19, elastic airbag 20.

实施例如图1、图2和图3所示:The embodiments are shown in Figures 1, 2 and 3:

一种芯片测试用夹具,包括支撑杆1、与支撑杆1转动连接的第一弧圈13、与第一弧圈13转动连接的第二弧圈14、开在第一弧圈13端部的凹槽12和设置在第二弧圈14端部的可穿过凹槽12并可与凹槽12固定的凸块11,第一弧圈13与所述第二弧圈14的正反两面可拆卸连接有用于放大物体的透镜,透镜上开有若干测试孔6;A chip testing fixture comprises a support rod 1, a first arc ring 13 rotatably connected to the support rod 1, a second arc ring 14 rotatably connected to the first arc ring 13, a groove 12 opened at the end of the first arc ring 13, and a protrusion 11 arranged at the end of the second arc ring 14 and capable of passing through the groove 12 and being fixed to the groove 12, and lenses for magnifying objects are detachably connected to the front and back surfaces of the first arc ring 13 and the second arc ring 14, and a plurality of test holes 6 are opened on the lenses;

具体的:Specific:

如图1所示,支撑杆1与第一弧圈13的连接处设有转动轴15承,支撑杆1的上端设有延长部,延长部穿过第一弧圈13与第一连接杆2同轴连接,支撑杆1远离第一连接杆2的一端固接有支撑座,支撑座的自由端固接有橡胶垫且支撑座的尺寸大于支撑杆1的尺寸。As shown in Figure 1, a rotating shaft 15 is provided at the connection between the support rod 1 and the first arc circle 13, and an extension portion is provided at the upper end of the support rod 1. The extension portion passes through the first arc circle 13 and is coaxially connected to the first connecting rod 2. The end of the support rod 1 away from the first connecting rod 2 is fixedly connected to a support seat, and the free end of the support seat is fixedly connected to a rubber pad and the size of the support seat is larger than that of the support rod 1.

第一弧圈13远离凹槽12的右端设有转动轴15,转动轴15包括固定端和转动端,第一弧圈13安装在固定端上,第二弧圈14安装在转动端上,第二弧圈14朝外的最大转动角度为第一弧圈13与第二弧圈14保持平齐时停止。A rotating shaft 15 is provided at the right end of the first arc circle 13 away from the groove 12. The rotating shaft 15 includes a fixed end and a rotating end. The first arc circle 13 is installed on the fixed end, and the second arc circle 14 is installed on the rotating end. The maximum outward rotation angle of the second arc circle 14 is when the first arc circle 13 and the second arc circle 14 are kept flush.

关于透镜:第一弧圈13和所述第二弧圈14的正反端面均固接有磁铁片,透镜与磁铁片磁性连接,透镜为放大镜,具体的:安装在第一弧圈13上的透镜为第一透镜4,安装在第二弧圈14上的透镜为第二透镜5,如图1所示,凹槽12与所述凸块11的连接处设有螺纹螺钉。Regarding the lens: the front and back end faces of the first arc circle 13 and the second arc circle 14 are fixed with magnet sheets, and the lens is magnetically connected to the magnet sheet. The lens is a magnifying glass. Specifically: the lens installed on the first arc circle 13 is the first lens 4, and the lens installed on the second arc circle 14 is the second lens 5. As shown in Figure 1, a threaded screw is provided at the connection between the groove 12 and the protrusion 11.

第一弧圈13上设有与支撑杆1同轴连接的第一连接杆2,第二弧圈14上固接有第二连接杆7,第一连接杆2与所述第二连接杆7相向一端分别固接有以及转动连接有用于芯片边缘端面夹持的夹持件;The first arc ring 13 is provided with a first connecting rod 2 coaxially connected to the support rod 1, the second arc ring 14 is fixedly connected to a second connecting rod 7, and the first connecting rod 2 and the second connecting rod 7 facing each other are respectively fixedly connected and rotatably connected with a clamping member for clamping the edge end surface of the chip;

具体的:夹持件根据安装位置来说,分为第一夹持件8和第二夹持件9,第一夹持件8安装在第一弧圈13上,第二夹持件9安装在第二弧圈14上,对于第二连接杆7与第二夹持件9之间的转动:第二连接杆7与第二夹持件9之间设有转动块10,通过转动块10实现第二夹持件9相对于第二连接杆7的转动。Specifically: the clamping member is divided into a first clamping member 8 and a second clamping member 9 according to the installation position. The first clamping member 8 is installed on the first arc circle 13, and the second clamping member 9 is installed on the second arc circle 14. Regarding the rotation between the second connecting rod 7 and the second clamping member 9: a rotating block 10 is provided between the second connecting rod 7 and the second clamping member 9, and the rotation of the second clamping member 9 relative to the second connecting rod 7 is realized by the rotating block 10.

夹持件包括固定块、开在固定块上的固定槽16、设置在固定槽16的底部的挤压组件、设置在固定槽16两内侧壁的海绵和与挤压组件连接的伸出组件,伸出组件从固定块两侧穿出并与芯片的边缘接触。The clamping member includes a fixing block, a fixing groove 16 opened on the fixing block, an extrusion component arranged at the bottom of the fixing groove 16, a sponge arranged on the two inner walls of the fixing groove 16, and a protruding component connected to the extrusion component, which passes through both sides of the fixing block and contacts the edge of the chip.

具体的:挤压组件开在固定块内部的空腔、安装在空腔内的若干弹簧19和若干挤压块17,弹簧19的上端穿出固定块与挤压块17,伸出组件包括设置在空腔内部的弹性气囊20和与弹性气囊20连通的保护柱18,固定槽16的两侧开有通孔,保护柱18可从通孔垂直穿出,弹性气囊20与弹簧19的下端固接,保护柱18可保护芯片的边缘面。Specifically: the extrusion component is opened in the cavity inside the fixed block, and a plurality of springs 19 and a plurality of extrusion blocks 17 are installed in the cavity. The upper end of the spring 19 passes through the fixed block and the extrusion block 17. The extending component includes an elastic airbag 20 arranged in the cavity and a protective column 18 connected to the elastic airbag 20. Through holes are opened on both sides of the fixed groove 16, and the protective column 18 can pass vertically through the through holes. The elastic airbag 20 is fixedly connected to the lower end of the spring 19, and the protective column 18 can protect the edge surface of the chip.

具体实现过程:Specific implementation process:

第一步,转动第二弧圈14,使得第二弧圈14朝右转动与第一弧圈13保持平齐后停止,此时露出了位于第一弧圈13上的夹持件,取出需要测试的芯片,垂直放进固定槽16,芯片的两面与海绵接触,利用海绵对芯片进行基础性的保护,然后芯片的底部与挤压块17,使得弹簧19压缩,弹簧19一直压缩后,使得弹性气囊20压缩,气体进入保护柱18,保护柱18从通孔垂直穿出后保护芯片的两端边缘面;The first step is to rotate the second arc ring 14 so that the second arc ring 14 rotates rightward and keeps flush with the first arc ring 13 and then stops. At this time, the clamping piece on the first arc ring 13 is exposed, and the chip to be tested is taken out and vertically placed into the fixing groove 16. The two sides of the chip are in contact with the sponge, and the sponge is used to provide basic protection for the chip. Then, the bottom of the chip and the extrusion block 17 compress the spring 19. After the spring 19 is compressed, the elastic airbag 20 is compressed, and the gas enters the protection column 18. The protection column 18 vertically passes through the through hole to protect the edge surfaces of both ends of the chip;

第二步,此时用手持续按压住芯片保持住保护柱18的状态,另一只手转动转动轴15,使得第二弧圈14朝左转动,然后凹槽12开始与凸块11配合,此时需要观察两个夹持件的位置;Step 2: Use one hand to keep pressing the chip to keep the protective column 18 in place, and use the other hand to rotate the rotating shaft 15 so that the second arc 14 rotates to the left, and then the groove 12 begins to cooperate with the protrusion 11. At this time, the positions of the two clamps need to be observed;

第三步,对于位于第二弧圈14内的夹持件而言,设置为转动连接,无论芯片的大小,都是第二弧圈14内的夹持件的左端先与芯片接触,然后第二弧圈14内的夹持件的左端停止,由于第二弧圈14内的夹持件为转动状态,当继续用力,第二弧圈14内的夹持件的的左端朝上运动,右端朝下,实现第二弧圈14内的夹持件平齐,进而两块夹持件的平齐,此时,就可以使用连接螺钉,利用螺钉来固定凹槽12与凸块11此时的位置,实现第二弧圈14与第一弧圈13的位置的固定;The third step is to set the clamping member in the second arc circle 14 to be connected in rotation. Regardless of the size of the chip, the left end of the clamping member in the second arc circle 14 contacts the chip first, and then the left end of the clamping member in the second arc circle 14 stops. Since the clamping member in the second arc circle 14 is in a rotating state, when the force is continued, the left end of the clamping member in the second arc circle 14 moves upward and the right end moves downward, so that the clamping member in the second arc circle 14 is flush, and then the two clamping members are flush. At this time, the connecting screws can be used to fix the position of the groove 12 and the protrusion 11 at this time, so as to fix the position of the second arc circle 14 and the first arc circle 13;

第四步,对于两块夹持件而言,均会对芯片产生夹持力,该夹持力使得各自的保护柱18可从通孔垂直穿出,进而保护芯片的边缘面。In the fourth step, both clamping members will generate clamping force on the chip, and the clamping force enables the respective protection columns 18 to vertically pass through the through holes, thereby protecting the edge surface of the chip.

第五步,开始测试,通过磁铁片安装透镜,通过透镜的放大作用,对芯片的外观进行测试,此时还可以转动第一弧圈13,实现芯片的正反两面的调换,然后可以对芯片的正面和背面进行外观测试;The fifth step is to start the test, install the lens through the magnet sheet, and test the appearance of the chip through the magnification effect of the lens. At this time, the first arc ring 13 can also be rotated to achieve the exchange of the front and back sides of the chip, and then the front and back sides of the chip can be tested for appearance;

第六步,如图1所示,在透镜上安装有测试孔6,利用测试孔6将测试工具插过透镜与芯片连接后,开始测试芯片的功能即可;Step 6, as shown in FIG1 , a test hole 6 is installed on the lens. After the test tool is inserted through the lens and connected to the chip through the test hole 6, the function of the chip can be tested;

测试完毕后,一切合格之后,取出连接螺钉,打开第一弧圈13,取出芯片即可。After the test is completed and everything is qualified, remove the connecting screws, open the first arc ring 13, and take out the chip.

本装置解决了传统的芯片夹持尺寸较少且夹持位置不对导致芯片受损的问题。The device solves the problem that the traditional chip clamping size is small and the clamping position is incorrect, resulting in chip damage.

以上所述,仅是本发明的较佳实施例而已,并非对本发明作任何形式上的限制,虽然本发明已以较佳实施例揭示如上,然而并非用以限定本发明,任何本领域技术人员,在不脱离本发明技术方案范围内,当可利用上述揭示的技术内容做出些许更动或修饰为等同变化的等效实施例,但凡是未脱离本发明技术方案内容,依据本发明的技术实质对以上实施例所作的任何简介修改、等同变化与修饰,均仍属于本发明技术方案的范围内。The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Although the present invention has been disclosed as a preferred embodiment as above, it is not used to limit the present invention. Any technical personnel in this field can make some changes or modify the technical contents disclosed above into equivalent embodiments without departing from the scope of the technical solution of the present invention. However, any brief modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention are still within the scope of the technical solution of the present invention.

Claims (3)

1.一种芯片测试用夹具,其特征在于:包括支撑杆、与支撑杆转动连接的第一弧圈、与第一弧圈转动连接的第二弧圈、开在第一弧圈端部的凹槽和设置在第二弧圈端部的穿过凹槽并与凹槽固定的凸块,所述第一弧圈与所述第二弧圈的正反两面可拆卸连接有用于放大物体的透镜,所述透镜上开有若干测试孔;1. A chip testing fixture, characterized in that it comprises a support rod, a first arc ring rotatably connected to the support rod, a second arc ring rotatably connected to the first arc ring, a groove opened at the end of the first arc ring, and a protrusion arranged at the end of the second arc ring and passing through the groove and fixed to the groove, the first arc ring and the second arc ring are detachably connected to the front and back sides of the lens for magnifying the object, and the lens is provided with a plurality of test holes; 第一弧圈上设有与支撑杆同轴连接的第一连接杆,所述第二弧圈上固接有第二连接杆,所述第一连接杆与所述第二连接杆相向一端分别固接有以及转动连接有用于芯片边缘端面夹持的夹持件,第一弧圈和第二弧圈相向移动,实现两个夹持件的距离的改变,通过两个夹持件的距离的改变实现对多种尺寸的芯片的夹持;The first arc ring is provided with a first connecting rod coaxially connected to the support rod, the second arc ring is fixedly connected to the second connecting rod, and the first connecting rod and the second connecting rod are respectively fixedly connected and rotatably connected to clamping members for clamping the edge end surface of the chip at the ends facing each other. The first arc ring and the second arc ring move toward each other to change the distance between the two clamping members, and the clamping of chips of various sizes is achieved by changing the distance between the two clamping members; 所述夹持件包括固定块、开在固定块上的固定槽、设置在固定槽的底部的挤压组件、设置在固定槽两内侧壁的海绵和与挤压组件连接的伸出组件,所述伸出组件从固定块两侧穿出并与芯片的边缘接触;The clamping member includes a fixing block, a fixing groove opened on the fixing block, a squeezing assembly arranged at the bottom of the fixing groove, a sponge arranged on two inner side walls of the fixing groove, and a protruding assembly connected to the squeezing assembly, wherein the protruding assembly passes through two sides of the fixing block and contacts the edge of the chip; 所述挤压组件开在固定块内部的空腔、安装在空腔内的若干弹簧和若干挤压块,所述弹簧的一端穿出固定块与挤压块;The extrusion assembly comprises a cavity opened inside the fixed block, a plurality of springs and a plurality of extrusion blocks installed in the cavity, and one end of the spring passes through the fixed block and the extrusion block; 所述伸出组件包括设置在空腔内部的弹性气囊和与弹性气囊连通的保护柱,所述固定槽的两侧开有通孔,所述保护柱从通孔垂直穿出,所述弹性气囊与弹簧的另一端固接,所述保护柱保护芯片的边缘面;The extension assembly includes an elastic airbag arranged inside the cavity and a protective column connected to the elastic airbag, through holes are opened on both sides of the fixing groove, the protective column vertically passes through the through holes, the elastic airbag is fixedly connected to the other end of the spring, and the protective column protects the edge surface of the chip; 所述第一弧圈远离凹槽的一端设有转动轴,所述转动轴包括固定端和转动端,所述第一弧圈安装在固定端上,所述第二弧圈安装在转动端上,所述第二弧圈朝外的最大转动角度为第一弧圈与第二弧圈保持平齐时停止;A rotating shaft is provided at one end of the first arc circle away from the groove, the rotating shaft includes a fixed end and a rotating end, the first arc circle is mounted on the fixed end, the second arc circle is mounted on the rotating end, and the maximum outward rotation angle of the second arc circle is when the first arc circle and the second arc circle are kept flush; 转动第二弧圈,使得第二弧圈朝右转动与第一弧圈保持平齐后停止,此时露出了位于第一弧圈上的夹持件,将需要测试的芯片垂直放进固定槽,芯片的两面与海绵接触,然后芯片的底部与挤压块使得弹簧压缩,弹簧一直压缩后,使得弹性气囊压缩,气体进入保护柱,保护柱从通孔垂直穿出后保护芯片的两端边缘面;The second arc circle is rotated to the right and kept flush with the first arc circle and then stopped. At this time, the clamping piece on the first arc circle is exposed. The chip to be tested is placed vertically into the fixing groove. The two sides of the chip are in contact with the sponge. Then the bottom of the chip and the extrusion block compress the spring. After the spring is compressed, the elastic airbag is compressed, and the gas enters the protective column. The protective column vertically passes through the through hole to protect the edge surfaces at both ends of the chip. 持续按压住芯片保持住保护柱的状态,同时转动转动轴,使得第二弧圈朝左转动,凹槽开始与凸块配合;Keep pressing the chip to hold the protective column in place, and at the same time rotate the shaft so that the second arc turns to the left, and the groove begins to engage with the bump; 对于位于第二弧圈内的夹持件而言,设置为转动连接,无论芯片的大小,都是第二弧圈内的夹持件的左端先与芯片接触,然后第二弧圈内的夹持件的左端停止,由于第二弧圈内的夹持件为转动状态,当继续用力,第二弧圈内的夹持件的的左端朝上运动,右端朝下,实现第二弧圈内的夹持件平齐,进而两块夹持件的平齐,此时,就可以使用连接螺钉来固定凹槽与凸块此时的位置,实现第二弧圈与第一弧圈的位置的固定。For the clamping member located in the second arc circle, it is set to a rotating connection. No matter the size of the chip, the left end of the clamping member in the second arc circle contacts the chip first, and then the left end of the clamping member in the second arc circle stops. Since the clamping member in the second arc circle is in a rotating state, when force continues to be applied, the left end of the clamping member in the second arc circle moves upward and the right end moves downward, so that the clamping member in the second arc circle is flush, and then the two clamping members are flush. At this time, the connecting screws can be used to fix the position of the groove and the protrusion at this time, so as to fix the position of the second arc circle with the first arc circle. 2.根据权利要求1所述的一种芯片测试用夹具,其特征在于:所述支撑杆与第一弧圈的连接处设有转动轴承,所述支撑杆的上端设有延长部,所述延长部穿过第一弧圈与第一连接杆同轴连接,所述支撑杆远离第一连接杆的一端固接有支撑座,所述支撑座的自由端固接有橡胶垫且支撑座的尺寸大于支撑杆的尺寸。2. A chip testing fixture according to claim 1, characterized in that: a rotating bearing is provided at the connection between the support rod and the first arc ring, an extension portion is provided at the upper end of the support rod, the extension portion passes through the first arc ring and is coaxially connected to the first connecting rod, the end of the support rod away from the first connecting rod is fixedly connected to a support seat, the free end of the support seat is fixedly connected to a rubber pad and the size of the support seat is larger than the size of the support rod. 3.根据权利要求1所述的一种芯片测试用夹具,其特征在于:所述第一弧圈和所述第二弧圈的正反端面均固接有磁铁片,所述透镜与磁铁片磁性连接,所述透镜为放大镜。3. A chip testing fixture according to claim 1, characterized in that: the front and back end surfaces of the first arc loop and the second arc loop are fixedly connected with magnet sheets, the lens is magnetically connected to the magnet sheet, and the lens is a magnifying glass.
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