CN117583259A - Three-temperature test sorting equipment - Google Patents

Abstract

The utility model relates to a chip test field especially relates to a three temperature test sorting equipment, and its technical scheme is, including organism, the loading attachment of setting in organism one end, unloader, be used for conveying the chip to the conveyer of test unit and the transfer device who sets up between loading attachment and test unit, conveyer is including being used for conveying the grabbing subassembly first of chip on the loading attachment and being used for grabbing subassembly second of chip on the transfer device, grabbing subassembly first snatchs transfer device with the chip on the loading attachment, transfer device is used for conveying the chip to the test unit within range, grabbing subassembly second is used for snatching the chip on the transfer device in the test unit. The chip three-temperature testing device has the effects of improving the testing efficiency of the chip three-temperature testing and improving the conveying efficiency of the chip.

Description

A three-temperature testing and sorting equipment

Technical field

This application relates to the field of chip testing, and in particular to a three-temperature testing and sorting equipment.

Background technique

In order to improve the quality of chips shipped out of the factory, after the chip processing is completed, the performance of the chips needs to be tested. The chips that are in good condition are then packaged and shipped out of the factory, and those with problems are recycled and processed uniformly.

Existing chips will be tested at three temperatures using high and low temperature testing equipment before leaving the factory. The three temperatures include high temperature, normal temperature and low temperature. The three temperature test is to detect whether the chip operates normally in three states. During the use of existing testing equipment, staff are required to place the chips in the tray to the testing unit in sequence for testing. After the testing is completed, the staff will take out the tested chips and classify and place the chips based on the testing results. .

However, existing test equipment has low efficiency during use and manual sorting of chips, which cannot meet the needs of large-scale and efficient production.

Contents of the invention

In order to improve the test efficiency of the three-temperature test of the chip and improve the transmission efficiency of the chip, this application provides a three-temperature test and sorting equipment.

The three-temperature testing and sorting equipment provided by this application adopts the following technical solution:

A three-temperature testing and sorting equipment, including a machine body, a loading device and an unloading device provided at one end of the body, a transmission device for transmitting chips to a test unit, and a transfer device provided between the loading device and the test unit , the transfer device includes a grabbing component one for transporting the chips on the loading device and a grabbing component two used for grabbing the chips on the transfer device. The grabbing component one grabs the chips on the loading device. The transfer device is used to transfer the chip to the test unit, and the grabbing component 2 is used to grab the chip on the transfer device into the test unit.

By adopting the above technical solution, the loading device is used to place untested chips, the unloading device is used to place tested chips, the transmission device adjusts the position of the chips, and the transfer device shortens the transmission distance of the transmission device and speeds up transmission efficiency. The grabbing component 1 grabs the chip from the loading device to the transfer device. The transfer device then transports the chip to the test unit. Then the grabbing component 2 grabs the chip on the transfer device and puts it into the test unit for testing. The transfer device effectively speeds up the transfer efficiency of the chip, and the transfer device shortens the transfer distance between the first and second grab components and improves the transfer efficiency of the chips.

Preferably, the grabbing component 1 includes a linear motor 1 arranged along the width direction of the body, a linear motor 2 arranged on the linear motor 1 and arranged along the length direction of the body, and a pick-up part 1 arranged on the linear motor 2. , the machine body is provided with a support frame I for supporting the linear motor I; the machine body is also provided with a transport device for transporting the loading device and the unloading device loading tray, the transport device includes a A fixed frame, a moving component provided on the fixed frame, and a chuck component provided on the moving component. The moving component drives the chuck component to move. The chuck component is used to transport materials on the loading device or the unloading device. plate.

By adopting the above technical solution, the linear motor 1 drives the linear motor 2 to move along the width direction of the machine body, the material picking part 1 moves synchronously with the linear motor 2, and the linear motor 2 drives the material picking part 1 to move along the length direction of the machine body, which facilitates picking up. When the material is picked up, the support frame is used to install the linear motor; the transport device carries the material tray, and the fixed frame is used to install the moving component. The moving component drives the chuck assembly to move above the material tray, and the chuck assembly clamps the material tray. , after clamping, the moving component drives the material tray to adjust its position.

Preferably, the grabbing component 2 includes a linear motor 3 arranged on both sides along the length direction of the machine body, a linear motor 4 arranged between the two groups of linear motors 3, and a pick-up part 2 arranged on the linear motor 4, so The machine body is provided with a support frame 2 for supporting the linear motor 3, and the material pick-up piece 2 is used to grab the chip on the transfer device into the test unit.

By adopting the above technical solution, the linear motor 3 drives the linear motor 4 to move along the length direction of the machine body, the linear motor 4 drives the pick-up part 2 to move along the width direction of the machine body, the pick-up part 2 grabs the chip on the transfer device, and the support frame 2 For mounting linear motors III.

Preferably, the material picking part 2 includes a mounting base provided on the linear motor 4, a push cylinder provided on the mounting base, a control panel provided on the piston end of the pushing cylinder, and several picking nozzles provided on the mounting base. The mounting base is provided with a moving slide rail along the horizontal direction, the material taking nozzle is provided with a moving block located on the moving slide rail, the control panel is provided with a number of guide grooves tilted along the vertical direction, and the moving block There is a guide block located in the guide groove.

By adopting the above technical solution, the four linear motors drive the mounting base to move synchronously, and push the cylinder to drive the control board to move up and down. When the control board moves up and down, it will drive the guide block in the guide groove to move along the length direction of the guide groove. When the guide block moves , driving the moving block to move along the length direction of the moving slide rail, making it easy to control the spacing between several picking nozzles, and to grab chips according to the chip placement spacing.

Preferably, the control panel is provided with positioning grooves located at both ends of the guide groove, and the spacing between adjacent positioning grooves is consistent.

By adopting the above technical solution, the distance between the ends of adjacent guide grooves is consistent, which facilitates unified control of the distance between the pickup nozzles, and the positioning grooves improve the stability of the pickup nozzles at the end nodes of the guide grooves.

Preferably, the transfer device includes a mounting rack arranged along the chip transfer path, a guide assembly arranged on the mounting rack, a transfer plate one arranged at the feeding end of the mounting rack, a transfer plate two arranged at the discharging end of the mounting rack and a The driving assembly on the mounting bracket has a number of grooves for loading chips on the top surfaces of the first and second intermediate turntables, and the driving assembly is used to drive the first and second intermediate turntables to move.

By adopting the above technical solution, the installation frame installs the guide assembly, the intermediate turntable one and the second transfer plate are used to load the chip, the driving assembly is used to drive the intermediate turntable one and the second transfer plate to move, and the guide assembly is used to guide the intermediate turntable one and the intermediate turntable 2. Perform dislocation movement to improve the transmission efficiency of the transfer device, and the groove is used to load chips.

Preferably, the guide assembly includes a guide plate one provided on one side of the installation frame in the length direction and a guide plate two provided on the other side of the installation frame in the length direction. The guide plate one has a strip groove along the length direction, so The guide plate two is provided with a guide groove along the length direction, and the driving assembly is provided with a positioning seat one for positioning the middle turntable one and a positioning seat two for positioning the middle turntable two. The positioning seat one is provided with a guide groove along the height direction. Control slide rail, the bottom surface of the intermediate turntable one is provided with a positioning slide block located on the control slide rail, the positioning slide block is provided with a guide block located in the guide groove, and the positioning seat two is provided with a strip-shaped Bar block in the slot.

By adopting the above technical solution, guide plate one and guide plate two determine the movement range of intermediate turntable one and two. The strip grooves and bar-shaped blocks are used to improve the movement stability of intermediate turntable two and determine the movement path of intermediate turntable two. , the guide block and the guide groove are used to guide the movement of the middle turntable 1; the positioning seat 1 is used to drive the component to control the movement of the middle turntable 1, the positioning seat 2 is used to drive the component to control the movement of the middle turntable 2, the positioning slider and the control slide rail It is convenient for the intermediate turntable to move up and down.

Preferably, the guide groove includes a lifting part 1, a descending part and a lifting part 2 arranged sequentially along the length direction. The lifting part 1 and the lifting part 2 have the same horizontal height, and the descending part has a horizontal height higher than the lifting part 1. The level of the lower part is low, and the end of the descending part gradually extends upward to the lifting part one or the lifting part two.

By adopting the above technical solution, the guide groove guides the middle turntable 1 to move. When the middle turntable 1 moves from the lifting part 1 to the descending part, the horizontal height of the top surface of the middle turntable 1 is lower than the bottom surface of the middle turntable 2, which facilitates the movement of the middle turntable 1 and the middle turntable 1. The second turntable performs staggered transmission to improve the transfer volume and transfer efficiency of the transfer device.

Preferably, the feeding ends of the first guide plate and the second guide plate are equipped with several detection sensors.

By adopting the above technical solution, the detection sensor is used to detect whether the chips on the first and second intermediate turntables are placed properly.

Preferably, the driving assembly includes a driving motor arranged at the feeding end of the mounting frame, a transmission wheel one arranged at the output end of the driving motor, a transmission wheel two arranged at the other end of the mounting frame and a transmission belt, and the transmission belt connects the transmission wheel one and the transmission belt. Wheel two, the transmission belt includes a connecting part one and a connecting part two, the positioning seat one is located at the end of the connecting part one close to the transmission wheel one, and the positioning seat two is located at the end of the connecting part two close to the transmission wheel two.

By adopting the above technical solution, the driving motor drives the transmission wheel 1 to rotate, the transmission wheel 1 rotates to drive the transmission belt to move, the movement of the transmission belt drives the transmission wheel 2 to rotate, when the transmission belt moves, the positioning seat 1 moves towards the transmission wheel 2, and the positioning seat 2 moves towards The transmission wheel moves.

To sum up, by using the transmission device, the chip transmission efficiency can be effectively improved, the chip sorting time can be shortened, and the overall chip testing efficiency can be improved. The transfer device can effectively shorten the transmission distance of the transmission device and improve the transmission efficiency.

Description of drawings

Figure 1 is a schematic diagram of the external structure of a three-temperature testing and sorting equipment of the present application;

Figure 2 is a schematic diagram of the internal structure of a three-temperature testing and sorting equipment of the present application;

Figure 3 is a schematic structural diagram of the handling device of the present application;

Figure 4 is a schematic structural diagram of the transmission device of the present application;

Figure 5 is a schematic structural diagram of the grabbing component 1 of this application;

Figure 6 is a schematic structural diagram of the transfer device of the present application;

Figure 7 is a schematic structural diagram 2 of the transfer device of this application;

Figure 8 is a structural schematic diagram three of the transfer device of this application;

Figure 9 is a schematic structural diagram of the second grabbing component of this application;

FIG. 10 is an enlarged view of A in FIG. 9 .

Explanation of reference signs: 1. Machine body; 2. Feeding device; 3. Unloading device; 4. Conveying device; 41. Grasping component one; 411. Linear motor one; 412. Linear motor two; 413. Material picking part 1; 42. Grasping component 2; 421. Linear motor 3; 422. Linear motor 4; 423. Material picking piece 2; 4231. Mounting base; 4232. Pushing cylinder; 4233. Control board; 4234. Material picking nozzle; 5. Transfer device; 51. Installation frame; 52. Guide assembly; 521. Guide plate one; 5211. Strip groove; 522. Guide plate two; 53. Transfer plate one; 531. Positioning slider; 5311. Guide block; 54. Intermediate turntable two; 55. Drive assembly; 551. Drive motor; 552. Transmission wheel one; 553. Transmission wheel two; 554. Transmission belt; 5541. Connection part one; 5542. Connection part two; 6. Support frame one; 7. Carrying device; 71. Fixed frame; 72. Moving component; 73. Chuck component; 8. Support frame two; 9. Moving slide rail; 10. Moving block; 11. Guide groove; 12. Guide block; 13. Positioning groove; 14. Groove; 15. Guide groove; 151. Lifting part one; 152. Descending part; 153. Lifting part two; 16. Positioning seat one; 161. Control slide rail; 17. Positioning seat two; 171. Bar block; 18. Detection sensor.

Detailed ways

The present application will be further described in detail below with reference to Figures 1-10.

The embodiment of the present application discloses a three-temperature testing and sorting equipment. Referring to Figures 1 and 2, it includes a machine body 1, a loading device 2 installed on the body 1, an unloading device 3, a conveyor 4, a handling device 7 and a transfer device 5. The loading device 2 is installed at one end of the body 1, and the lower The feeding device 3 is installed on one side of the feeding device 2. The conveying device 4 includes a grabbing component 41 and a grabbing component 2 42. The grabbing component 41 grabs the chips on the loading device 2 and transfers them to the transfer device 5. The device 5 transfers the chip to the range of the test unit, and then the grabbing component 2 42 grabs the chip on the transfer device 5 into the test unit for testing operation.

Referring to Figures 2 and 3, the handling device 7 includes a fixed frame 71 installed on the machine body 1, a moving component 72 installed on the fixed frame 71, and a chuck assembly 73 fixed on the moving component 72. The moving component 72 is a linear motor. , the moving component 72 drives the chuck component 73 to move above the material tray, so that the chuck component 73 can transport the empty tray on the loading device 2 to the unloading device 3, and the grabbing component 242 can directly place the tested chips on the bottom. On the feeding device 3.

Referring to Figures 2 and 4, the loading device 2 includes a material tray seat installed on the machine body 1 and used to carry the material tray and a lifting driver installed on the material tray seat. The unloading device 3 includes a material tray seat installed on the machine body 1. And there is a material carrying seat for loading the material tray and a lifting driving component two installed on the material carrying seat and used to drive the material tray to move up and down. This application is provided with two groups of material tray seats and four groups of material loading seats. One group of material tray seats is used to place empty material trays, and the other group of material tray seats is used to place full material trays with chips placed; the four groups of material loading seats are all used to place Empty material tray, waiting for grabbing component 2 42 to place the tested chips in the empty material tray for collection.

Referring to Figures 4 and 5, the grabbing component 141 is activated to grab the chips in the full tray onto the transfer device 5. The grabbing component 41 includes a linear motor 411, a linear motor 412 installed on the linear motor 411, and a picking part 413 installed on the linear motor 412. A support frame 6 is fixedly installed on the body 1. The first motor 411 is fixedly installed on the support frame 6 , and the linear motor 411 extends along the width direction of the body 1 . The linear motor 411 drives the second linear motor 412 to move along the width direction of the body 1 . The driving direction of the linear motor two 412 is to drive along the length direction of the body 1. The linear motor two 412 drives the material picking part 1 413 to move along the length and square of the body 1. The linear motor one 411 and the linear motor two 412 expand the material picking part 1 413. The material retrieval range facilitates retrieval of materials with one piece of material 413. The material picking part 413 includes a plurality of suction nozzles and a driving member for driving the plurality of suction nozzles to move up and down. The driving member may be a driving structure such as a linear motor or a cylinder.

Referring to Figures 5 and 6, the picking piece 413 grabs the chip onto the transfer device 5. The transfer device 5 includes a mounting frame 51 fixedly mounted on the body 1, a guide assembly 52 mounted on the mounting frame 51, and a guide assembly 52 mounted on the mounting frame 51. The intermediate turntable one 53 at the feed end of the installation frame 51, the intermediate turntable two 54 installed at the discharge end of the installation frame 51, and the drive assembly 55 provided on the installation frame 51, the top surfaces of the intermediate turntable one 53 and the intermediate turntable two 54 are provided with There are a plurality of grooves 14, the grooves 14 are used for loading chips, and the spacing between adjacent grooves 14 is consistent to facilitate the discharge of the material picking piece 1413. The discharging end of the mounting frame 51 is located close to the loading device 2 . The mounting frame 51 extends toward the test unit and is located in the middle of the testing unit to facilitate subsequent grabbing components 2 42 to grab the chips on the transfer device 5 .

Referring to FIGS. 6 and 7 , the guide assembly 52 is used to guide the first intermediate turntable 53 and the second intermediate turntable 54 to move in misalignment. The guide assembly 52 includes a guide plate 521 fixedly installed on one side of the installation frame 51 in the length direction and a guide plate 2 522 fixedly installed on the other side of the installation frame 51 in the length direction. The guide plate 521 is used to guide the intermediate turntable 54 to move. , the guide plate two 522 is used to guide the intermediate turntable one 53 to move. The detection sensors 18 located at the feeding end of the mounting frame 51 are fixedly installed on the top surfaces of the first guide plate 521 and the second guide plate 522. The number of detection sensors 18 is the same as the number of detection sensors 18 on the side of the first guide plate 521 and the second guide plate 522 close to the detection sensor 18. The number of grooves 14 is the same, and the detection sensor 18 is used to detect whether the chips in the first intermediate turntable 53 or the second intermediate turntable 54 are placed properly and whether stacking occurs.

Referring to Figures 6 and 8, the first guide plate 521 is provided with a strip groove 5211 along the length direction, the second guide plate 522 is provided with a guide groove 15 along the length direction, and the driving assembly 55 is used to drive the intermediate turntable 53 and the intermediate turntable 2 54. Move, the driving assembly 55 is installed with positioning seat one 16 and positioning seat two 17. The upper end of the positioning seat two 17 is fixed on the bottom surface of the positioning seat two 17. The side of the positioning seat two 17 close to the strip groove 5211 is fixed with a bar-shaped Bar block 171 in slot 5211. A control slide rail 161 is fixed on the side of the positioning seat 16 close to the guide groove 15. A positioning slide block 531 located in the control slide rail 161 is fixed on the bottom surface of the intermediate turntable 53. The positioning slide block 531 is fixed on one side close to the guide slot 15. There is a guide block 5311 located in the guide groove 15. When the driving assembly 55 moves, the bar block 171 will move along the length direction of the bar groove 5211, and the guide block 5311 will move along the length square of the guide groove 15, thereby improving the movement of the first turntable 53 and the second turntable 54. stability.

Referring to Figure 8, the driving assembly 55 includes a driving motor 551 fixed on the feeding end of the mounting frame 51, a transmission wheel 552 fixed on the output end of the driving motor 551, a transmission wheel 2 553 installed on the discharge end of the mounting frame 51 and a connecting transmission wheel 552. The transmission belt 554 with the transmission wheel two 553. The rotation of the driving motor 551 drives the transmission wheel one 552 to rotate, the rotation of the transmission wheel one 552 drives the transmission belt 554 to move, the movement of the transmission belt 554 drives the transmission wheel two 553 to rotate synchronously. The transmission belt 554 is divided into a connecting part 5541 and a connecting part 2 5542 through the connection between the rotation axes of the transmission wheel one 552 and the transmission wheel two 553. The positioning seat 16 is fixed on the end of the connection part 5541 close to the transmission wheel 552 for positioning. The second seat 17 is fixed on one end of the connecting portion 5542 close to the second transmission wheel 553. When the driving motor 551 starts, the transmission belt 554 drives the positioning base 16 and the positioning base 2 17 to move in the reverse direction.

Referring to Figures 7 and 8, in order to avoid collision between the intermediate turntable 1 53 and the intermediate turntable 2 54 when moving, and to ensure that the cutting height is consistent, the guide groove 15 includes a lifting portion 151, a descending portion 152 and a descending portion 152 that are opened sequentially along the length of the square. The level of the lifting part 153, the lifting part 151 and the lifting part 2 153 are the same. The level of the lifting part 151 is higher than the level of the descending part 152. The lifting part 151 and the lifting part 2 153 are in contact with the descending part 152. The ends gradually extend toward the descending part 152. When the guide block 5311 moves the descending part 152, the positioning slider 531 moves down on the control slide rail 161, so that the intermediate turntable 53 is located below the intermediate turntable 2 54 to avoid the intermediate turntable. A collision occurred when the first 53 and the second carousel 54 were intersecting.

Referring to Figures 4 and 9, when the retrieval part 1 413 fills the groove 14 on the intermediate turntable 53, the drive motor 551 starts and moves the intermediate turntable 54 to the feeding end of the mounting frame 51 to facilitate the retrieval of the material parts. 1413 continues to place the chip. Then the grabbing component 2 42 grabs the chip on the intermediate turntable 1 53 to the test unit. The grabbing component 42 includes a linear motor 3 421 installed on both sides of the rectangular shape of the body 1. Between the linear motor four 422 and the pick-up piece two 423 installed on the linear motor four 422, a support frame two 8 is fixedly installed on the body 1, the linear motor three 421 is fixed on the support frame two 8, and the linear motor three 421 is raised The stability of the machine body 1 also provides up and down displacement space for the material picking part 2 423. In order to facilitate the material picking part 2 423 to move up and down, the linear motor 4 422 is provided with a linear motor or a cylinder for driving the material picking part 2 423 to move up and down. . The third linear motor 421 drives the second pick-up part 423 to move along the length direction of the body 1, and the fourth linear motor 422 drives the second pick-up part 423 to move along the width direction of the body 1, so that the second pick-up part 423 can conveniently transfer chips to test units at different locations.

Referring to Figures 9 and 10, the material picking part two 423 includes a mounting base 4231 installed on the linear motor four 422, a pushing cylinder 4232 fixed on the mounting base 4231, a control panel 4233 fixed on the piston end of the pushing cylinder 4232, and a control panel 4233 fixed on the piston end of the pushing cylinder 4232. Several material taking suction nozzles 4234 on the seat 4231. Since the spacing of the grooves 14 on the first transfer plate 53 or the second transfer plate 54 is different from the test distance of the test unit, in order to facilitate the picking up and unloading of materials by the picking nozzle 4234, the mounting base 4231 contacts one side of the picking up nozzle 4234 A moving slide rail 9 is fixed in the horizontal direction. A moving block 10 on the moving slide rail 9 is fixed on the side of the picking nozzle 4234 close to the moving slide rail 9. The picking nozzle 4234 is mounted on the moving slide rail 9 through the moving block 10. Make a move. The control panel 4233 is provided with a number of guide grooves 11 inclined along the vertical direction. The number of the guide grooves 11 is consistent with the number of the material taking suction nozzles 4234. The moving block 10 is fixed with a guide block 12 located in the guide grooves 11. The control plate 4233 is provided with positioning grooves 13 located at both ends of the guide groove 11, and the spacing between adjacent positioning grooves 13 is consistent. In this application, several guide grooves 11 are opened in a fan shape, and the distance between adjacent guide grooves 11 gradually decreases upward. When the guide block 12 is located in the positioning groove 13 at the lower end, the distance between adjacent picking nozzles 4234 is the largest. When the distance needs to be reduced, the pushing cylinder 4232 is started, and the pushing cylinder 4232 drives the control plate 4233 to move downward, and the guide block 12 faces The upper part of the guide groove 11 moves, and the moving block 10 translates on the moving slide rail 9, driving the distance between adjacent picking nozzles 4234 to reduce to the test distance of the test unit. After the chip is detected, the picking nozzle 4234 absorbs the chip and places the chip on the material tray of the unloading device 3 to facilitate unified unloading.

The implementation principle of the three-temperature testing and sorting equipment in the embodiment of the present application is as follows: the material picking part 413 adsorbs the chip, the linear motor 411 and the linear motor 2 412 drive the material picking part 413 to move towards the middle turntable 53, in which the turntable 1 After 53 is filled with chips, the drive motor 551 drives the first intermediate turntable 53 to move toward the discharging end of the mounting frame 51; at this time, the first material pick-up part 413 continues to absorb the chips and places the chips in the second intermediate turntable 54. The intermediate turntable one 53 moves into the range of the test unit, and the linear motor three 421 and the linear motor four 422 control the pickup nozzle 4234 to move to the intermediate turntable one 53 to absorb the chip, and transfer the chip to the test unit for testing. This application effectively improves chip transmission efficiency, speeds up the chip testing process, and rationally utilizes equipment loading space.

The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application shall be covered by the scope of protection of the present application. Inside.

Claims (10)

1. A three-temperature testing and sorting equipment, characterized by: including a body (1), a loading device (2) and a unloading device (3) provided at one end of the body (1), used to transfer chips to the test The transfer device (4) of the unit and the transfer device (5) provided between the loading device (2) and the test unit, the transfer device (4) includes a grabber for transferring the chips on the loading device (2) Component one (41) and a grabbing component two (42) for grabbing chips on the transfer device (5). The grabbing component one (41) grabs the chips on the loading device (2) to the transfer device. (5), the transfer device (5) is used to transfer the chip to the test unit, and the grabbing component 2 (42) is used to grab the chip on the transfer device (5) into the test unit. 2. A three-temperature testing and sorting equipment according to claim 1, characterized in that: the grabbing component (41) includes a linear motor (411) arranged along the width direction of the body (1). A linear motor two (412) is provided on the linear motor one (411) and along the length direction of the body (1), and a picking piece (413) is provided on the second linear motor (412). The body (1) There is a support frame one (6) for supporting the linear motor one (411); the body (1) is also provided with a transport device for transporting the loading tray of the loading device (2) and the unloading device (3). (7), the transportation device (7) includes a fixed frame (71) provided on the machine body (1), a moving component (72) provided on the fixed frame (71), and a moving component (72) provided on the moving component (72). The chuck assembly (73). The moving assembly (72) drives the chuck assembly (73) to move. The chuck assembly (73) is used to transport materials on the loading device (2) or the unloading device (3). plate. 3. A three-temperature testing and sorting equipment according to claim 1, characterized in that: the second grabbing component (42) includes three linear motors (421) arranged along both sides of the length direction of the body (1). , the linear motor four (422) arranged between the two groups of linear motors three (421) and the material picking part two (423) arranged on the linear motor four (422), the body (1) is provided with a support The support frame two (8) of the linear motor three (421), the material picking part two (423) is used to grab the chip on the transfer device (5) into the test unit. 4. A three-temperature testing and sorting equipment according to claim 3, characterized in that: the material picking part two (423) includes a mounting seat (4231) arranged on the linear motor four (422), The push cylinder (4232) on the mounting base (4231), the control plate (4233) provided on the piston end of the pushing cylinder (4232), and a number of material taking suction nozzles (4234) provided on the mounting base (4231). (4231) A moving slide rail (9) is provided along the horizontal direction. The material taking suction nozzle (4234) is provided with a moving block (10) located on the moving slide rail (9). The control panel (4233) is provided along the There are several guide grooves (11) inclined in the vertical direction, and the moving block (10) is provided with a guide block (12) located in the guide grooves (11). 5. A three-temperature testing and sorting equipment according to claim 4, characterized in that: the control panel (4233) is provided with positioning grooves (13) at both ends of the guide groove (11), adjacent to the The spacing between positioning grooves (13) is consistent. 6. A three-temperature testing and sorting equipment according to claim 1, characterized in that: the transfer device (5) includes a mounting bracket (51) arranged along the chip transmission path. The guide assembly (52) on the installation frame (51), the intermediate turntable one (53) provided at the feed end of the installation frame (51), the intermediate turntable two (54) provided at the discharge end of the installation frame (51), and the intermediate turntable (54) provided on the installation frame (51) The driving assembly (55) is provided with a number of grooves (14) for loading chips on the top surfaces of the first intermediate turntable (53) and the second intermediate turntable (54). The driving assembly (55) is used to drive The intermediate carousel one (53) and the intermediate carousel two (54) move. 7. A three-temperature testing and sorting equipment according to claim 6, characterized in that: the guide assembly (52) includes a guide plate (521) arranged on one side of the length direction of the mounting frame (51) and a The second guide plate (522) is on the other side of the length direction of the mounting frame (51). The first guide plate (521) is provided with a strip groove (5211) along the length direction. The second guide plate (522) is along the length direction. A guide groove (15) is provided, and the driving assembly (55) is provided with a positioning seat (16) for positioning the middle turntable one (53) and a positioning seat two (17) for positioning the middle turntable two (54). , the positioning seat one (16) is provided with a control slide rail (161) along the height direction, and the bottom surface of the intermediate turntable one (53) is provided with a positioning slide block (531) located in the control slide rail (161), so The positioning slider (531) is provided with a guide block (5311) located in the guide groove (15), and the positioning seat two (17) is provided with a strip block (171) located in the strip groove (5211). . 8. A three-temperature testing and sorting equipment according to claim 7, characterized in that: the guide groove (15) includes a lifting portion (151), a descending portion (152) and a lifting portion sequentially arranged along the length direction. Part two (153), the horizontal height of the lifting part one (151) and the lifting part two (153) are consistent, the horizontal height of the descending part (152) is lower than the horizontal height of the lifting part one (151), the The end of the descending part (152) gradually extends upward to the lifting part one (151) or the lifting part two (153). 9. A three-temperature testing and sorting equipment according to claim 7, characterized in that: the feed ends of the first guide plate (521) and the second guide plate (522) are equipped with several detection sensors (18) . 10. A three-temperature testing and sorting equipment according to claim 7, characterized in that: the driving assembly (55) includes a driving motor (551) arranged at the feeding end of the mounting frame (51), (551) The transmission wheel one (552) at the output end, the transmission wheel two (553) provided at the other end of the mounting frame (51) and the transmission belt (554), the transmission belt (554) connects the transmission wheel one (552) and the transmission wheel Two (553), the transmission belt (554) includes a connection part one (5541) and a connection part two (5542), the positioning seat one (16) is located at one end of the connection part one (5541) close to the transmission wheel one (552) , the positioning seat two (17) is located at one end of the connecting part two (5542) close to the transmission wheel two (553).