CN116953491B - Bluetooth chip test fixture - Google Patents
Bluetooth chip test fixture Download PDFInfo
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- CN116953491B CN116953491B CN202311218794.4A CN202311218794A CN116953491B CN 116953491 B CN116953491 B CN 116953491B CN 202311218794 A CN202311218794 A CN 202311218794A CN 116953491 B CN116953491 B CN 116953491B
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- 238000012360 testing method Methods 0.000 title claims abstract description 149
- 239000000523 sample Substances 0.000 claims abstract description 138
- 230000005540 biological transmission Effects 0.000 claims description 47
- 230000007246 mechanism Effects 0.000 claims description 33
- 238000013016 damping Methods 0.000 claims description 21
- 239000000725 suspension Substances 0.000 claims description 8
- 230000000149 penetrating effect Effects 0.000 claims description 7
- 239000000696 magnetic material Substances 0.000 claims description 6
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 230000003044 adaptive effect Effects 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 description 22
- 238000000034 method Methods 0.000 description 20
- 230000008569 process Effects 0.000 description 16
- 238000010030 laminating Methods 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 238000012536 packaging technology Methods 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 210000001503 joint Anatomy 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000012345 traction test Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to a Bluetooth chip testing tool, which belongs to the technical field of Bluetooth chip testing and comprises a base, wherein a test bench for placing a Bluetooth chip to be tested, a testing device for testing the Bluetooth chip and a probe for adjusting the position of the testing device are arranged on the base, so that the testing device is self-adaptive to Bluetooth chip adjusting devices with different types and sizes.
Description
Technical Field
The invention relates to the field of chip testing, in particular to the field of Bluetooth chip testing, and particularly relates to a Bluetooth chip testing tool.
Background
In the Bluetooth chip test process, like the common chip test, probes are adopted to contact pins and are electrified for test, but the Bluetooth chip is smaller in size, pins are generally arranged on the surface of the chip through a BGA packaging technology, the distance between the pins is too small and is generally calculated in millimeter, the probes in test equipment are provided with a certain diameter, the smaller the diameter is, the larger the manufacturing cost of the probes is, the operation standardization is improved, therefore, when the high-precision Bluetooth chip is subjected to in-out test, the probes in the test equipment are required to be replaced, the cost is higher, in addition, the probes in the conventional chip test equipment are generally fixedly arranged, the positions of the probes are unchanged, one probe jig corresponds to one type of chip, when the same test equipment is used for testing Bluetooth chips of different types, the probes are required to be replaced in advance and debug in advance, or the test equipment is replaced, and no matter what mode is, the method is more complicated.
Disclosure of Invention
In order to solve the problems mentioned in the background, the invention provides a Bluetooth chip testing tool.
In order to achieve the technical purpose, the technical scheme adopted by the invention is as follows.
A Bluetooth chip testing tool comprises a base, wherein a test board for placing a Bluetooth chip to be tested, a testing device for testing the Bluetooth chip and an adjusting device for adjusting the position of a probe in the testing device are arranged on the base, so that the testing device is self-adaptive to Bluetooth chips of different model sizes.
Further, a stand column is vertically arranged on the base, a cantilever and a linear module a are slidably arranged on the stand column, the cantilever is horizontally arranged, the linear module a is used for pulling the cantilever to displace along the vertical direction, and a bracket group is arranged at the suspension end of the cantilever;
the base is also provided with a linear module b, the linear module b is used for pulling the test bench to displace along the extending direction of the cantilever, the vertical center line of the test bench and the center line of the cantilever along the extending direction are positioned in the same vertical plane, the vertical plane is a central plane, and when the Bluetooth chip is positioned on the test bench, the vertical center line of the Bluetooth chip coincides with the vertical center line of the test bench.
Further, the bracket group comprises a rotating shaft vertically arranged at the suspension end of the cantilever, the rotating shaft is in power connection with a first motor arranged on the cantilever through a power transmission part a, a sliding frame is arranged on the outer circular surface of the rotating shaft, the extending direction of the sliding frame is tangential to the outer circular surface of the rotating shaft, and a shaft core wire of the rotating shaft is positioned in a central plane;
The carriage is provided with a connecting frame and a linear module c, the extending direction of the connecting frame is perpendicular to the extending direction of the carriage, the connecting frame is in sliding connection with the carriage, and the linear module c is used for driving the connecting frame to displace.
Further, the bottom of the rotating shaft is provided with an installing table, the bottom of the installing table is vertically provided with a sliding cylinder, a sliding column is arranged in the sliding cylinder in a sliding manner, the bottom end of the sliding column extends out of the sliding cylinder and is coaxially provided with a pressure plate, and the vertical center line of the installing table, the shaft core line of the rotating shaft and the vertical center line of the sliding cylinder are overlapped;
the center of the pressure plate is provided with a probe hole, a temperature measuring probe is arranged in the probe hole, a spring a is arranged between the sliding column and the sliding cylinder, and the compression elasticity of the spring a drives the sliding column to vertically move downwards.
Further, the testing device comprises a testing mechanism, the mounting table is rectangular, the testing mechanism is provided with four groups and is distributed on the four sides of the mounting table in a one-to-one correspondence manner, and each group of testing mechanism consists of a plurality of groups of testing components distributed in an array manner along the extending direction of the sides of the mounting table;
the testing component is including being the mobile jib of vertical arrangement, the slide opening has been seted up on the mount table, mobile jib slidable mounting is in the slide opening and can rotate around self vertical central line, the top of mobile jib is located the mount table top and is provided with the nut, the bottom is located the below of mount table, the outside of mobile jib still is provided with damping piece and damping washer, damping washer's lower terminal surface and mount table's up end laminating, damping piece's up end and mount table's lower terminal surface laminating, the outside cover of mobile jib is equipped with the spring b that is located between nut and the damping washer.
Further, an outer sleeve column positioned below the mounting table is arranged outside the main rod, and the outer sleeve column and the main rod are detachably mounted through a clamping part a;
the upper end of the outer sleeve column is open, the lower end of the outer sleeve column is closed, the clamping part a comprises clamping pieces a, and the clamping pieces a are provided with two groups and are respectively positioned at two sides of the main rod;
the clamping piece a comprises a guide rod a horizontally arranged in the outer sleeve column, a clamping block a is slidably arranged outside the guide rod a, a spring c positioned between the cavity wall of the outer sleeve column and the clamping block a is sleeved outside the guide rod a, the clamping block a is abutted against the main rod by the spring c, and the outer sleeve column and the main rod are assembled by clamping the clamping block a of the clamping piece a distributed on two sides of the main rod.
Further, the side wall of the closed end of the outer sleeve, which is away from the sliding cylinder, is provided with a mounting groove, and the side wall of the outer sleeve, which is towards the sliding cylinder, is provided with a penetrating nozzle which is communicated with the mounting groove;
the probe consists of a horizontal section and a vertical section, wherein the tail end of the horizontal section is provided with a tail block made of magnetic materials, the other end of the horizontal section passes through the mounting groove and the penetrating nozzle and is connected with the vertical section, and the bottom end of the vertical section is provided with a needle point of the probe;
the mounting groove is internally provided with a clamping part b, the clamping part b is used for clamping the horizontal section of the probe, the clamping part b comprises clamping pieces b, and the clamping pieces b are provided with two groups and are respectively positioned at the upper side and the lower side of the horizontal section of the probe;
The clamping piece b comprises a guide rod b vertically arranged in the mounting groove, a clamping block b is arranged outside the guide rod b, a spring d positioned between the groove wall of the mounting groove and the clamping block b is sleeved outside the guide rod b, the clamping block b is abutted to the horizontal section of the probe by the elasticity of the spring d, and the clamping of the horizontal section of the probe is realized through the clamping blocks b of two groups of clamping pieces b distributed on the upper side and the lower side of the horizontal section of the probe.
Further, the bottom of the clamping block a is provided with an inclined plane a, and the distance between the inclined planes a in the two groups of clamping pieces a is decreased from bottom to top;
the distance between the inclined planes b in the two groups of clamping pieces b decreases along the square of the mounting groove opening pointing to the groove bottom;
in the two groups of clamping pieces b, a guide rod b in the clamping piece b above the probe is in sliding connection with the wall of the mounting groove, the guide rod b is fixed with the clamping block b, a connecting rod extends from the top end of the guide rod b, an unlocking block is arranged on the top end of the connecting rod, an inclined plane c is arranged at the top of the unlocking block, and the inclined plane c is parallel to the inclined plane a and is attached to the inclined plane a.
Further, the adjusting device comprises a movable frame which is slidably arranged on the connecting frame, a linear module d for pulling the movable frame to move, an adjusting mechanism for adaptively adjusting the position of the probe in the testing device and a power mechanism for providing adjusting power for the adjusting mechanism;
The adjusting mechanism comprises a mounting frame, sliding guide matching in the vertical direction is formed between the mounting frame and the movable frame, a first screw rod and a third motor are mounted on the movable frame, the third motor is in power connection with the first screw rod through a power transmission piece c, and the first screw rod is vertically arranged and in threaded connection with the mounting frame;
a triggering block is arranged on one side of the mounting frame, facing the axis core wire of the rotating shaft, and an upper inclined plane and a lower inclined plane are arranged on one side of the triggering block, facing the axis core wire of the rotating shaft, and are respectively parallel to the inclined planes b in the two groups of clamping pieces b;
an electromagnet a is further arranged on one side, facing the axis core wire of the rotating shaft, of the mounting frame, a magnetic attraction block made of magnetic materials is arranged on the side wall, facing away from the sliding cylinder, of the outer sleeve column, and when the trigger block is inserted into the mounting groove, the clamping part b is enabled to loosen the clamping of the horizontal section of the probe, the electromagnet a is in contact with the magnetic attraction block;
the adjusting mechanism further comprises a support, a sliding rail is arranged at the top end of the support, sliding guide matching with the connecting frame in the extending direction is formed between the sliding rail and the mounting frame, an electromagnet b is arranged on one side, facing the rotating shaft core wire, of the support, a slot is arranged on one side, facing the rotating shaft core wire, of the electromagnet b, an upper inclined surface and a lower inclined surface of the triggering block are symmetrically arranged relative to the central line of the slot, and when the triggering block is inserted into the mounting slot, the clamping part b is enabled to loosen clamping of the probe horizontal section, and a tail block arranged at the tail end of the probe horizontal section is inserted into the slot.
Further, the power mechanism comprises a transmission shaft and a rotating shaft which are vertically arranged, the transmission shaft is in a hollow shaft shape and is arranged on the movable frame, and the transmission shaft is in power connection with a second motor arranged on the movable frame through a power transmission part b;
the rotating shaft is arranged on the mounting frame and is also coaxially sleeved in the transmission shaft, the rotating shaft and the transmission shaft form power connection through the linkage component, and when the rotating shaft is displaced along the axial direction, the transmission shaft continuously outputs power to the rotating shaft through the linkage component;
a power transmission part d is arranged between the rotating shaft and the sliding rail, and the power transmission part d is used for driving the sliding rail to slide by utilizing the power generated by rotation of the rotating shaft.
Compared with the prior art, the invention has the beneficial effects that:
1. the test fixture can be self-adaptive to Bluetooth chips of different models and sizes, has wider test range and is more flexible to use.
2. The probe of this test fixture is adjusted, is provided with two kinds: adjusting a aiming at a common type Bluetooth chip and adjusting b aiming at a high-precision Bluetooth chip;
in the adjustment mode a, through the cooperation of rotation axis and sharp module c, realize the position switching between the probes of the multiunit test component in four sets of accredited testing organization, realize that adjusting device switches between arbitrary probe position in the testing arrangement promptly, realize adjusting process, in the same way, in the adjustment mode b, also through the cooperation of rotation axis and sharp module c, realize that adjusting device switches between arbitrary probe position in the testing arrangement, in addition, in the adjustment mode, through the cooperation of rotation axis and sharp module c, can also drive the probe around the vertical central line rotation of mobile jib, make the needle point of probe draw close each other, and the needle point part is the finest part on the probe, based on this, the probe of this scheme can be under the unchangeable condition of probe thickness, furthest's adaptation high accuracy bluetooth chip, accommodation is wider, application range is wider, the application range is wider.
Drawings
FIG. 1 is a schematic diagram of the structure of the present invention in the adjustment b mode;
FIG. 2 is a schematic diagram of the structure of the present invention in the adjustment a mode;
FIG. 3 is a schematic diagram of the structure of the base, the test bench, the linear module a and the linear module b;
FIG. 4 is a schematic diagram of the structure of the bracket set, the testing device and the adjusting device;
FIG. 5 is a schematic structural view of a bracket set;
FIG. 6 is a schematic view of the structure of the rotating shaft, carriage, mounting table and slide cylinder;
FIG. 7 is an exploded view of the mounting table, slide, temperature probe and slide post;
FIG. 8 is a schematic structural view of a test member;
fig. 9 is a schematic structural view of the main lever;
FIG. 10 is a cross-sectional view of a test member;
FIG. 11 is a schematic illustration of the cooperation of the adjustment device with the test member;
FIG. 12 is a schematic view of the structure of the adjusting device;
FIG. 13 is a partial schematic view of an adjusting device;
fig. 14 is a schematic structural view of the mounting frame, the trigger block, the clamping block b and the electromagnet a;
fig. 15 is a schematic structural view of the transmission shaft, the rotation shaft, the stay, the electromagnet b, and the power transmission member d;
fig. 16 is a top view of a plurality of sets of probes.
The reference numerals in the drawings are:
100. a base; 101. a linear module a; 102. a cantilever; 103. a linear module b; 104. a test bench; 105. a support box;
200. A bracket group; 201. a rotation shaft; 202. a first motor; 203. a power transmission member a; 204. a carriage; 205. a connecting frame; 206. a linear module c; 207. a mounting table; 208. a slide cylinder; 209. a spool; 210. a pressure plate; 211. a spring a; 212. a temperature measurement probe;
300. a testing device; 301. a probe; 302. tail blocks; 303. a main rod; 304. a damping block; 305. a damping washer; 306. a nut; 307. a spring b; 308. an outer sleeve column; 309. a guide rod a; 310. a clamping block a; 311. a spring c; 312. a guide rod b; 313. a clamping block b; 314. a spring d; 315. a connecting rod; 316. unlocking the block; 317. wearing a mouth;
400. an adjusting device; 401. a straight line module d; 402. a movable frame; 403. a second motor; 404. a third motor; 405. a mounting frame; 406. a transmission shaft; 407. a first screw rod; 408. a power transmission member b; 409. a power transmission member c; 410. a trigger block; 411. an electromagnet a; 412. a rotating shaft; 413. a power transmission member d; 414. a support post; 415. an electromagnet b; 416. a slot.
Detailed Description
In order to further describe the technical means and effects adopted by the present invention for achieving the intended purpose, the following detailed description will refer to the specific implementation, structure, characteristics and effects according to the present invention with reference to the accompanying drawings and preferred embodiments.
As shown in fig. 1-15, a bluetooth chip testing tool includes a base 100, a test board 104 for placing a bluetooth chip to be tested, a testing device 300 for testing the bluetooth chip, and a probe 301 for adjusting the position of the testing device 300 are disposed on the base 100, so that the testing tool can adapt to bluetooth chips with different types and sizes, the testing range is wider, and the use is more flexible.
As shown in fig. 1-3, the solution further includes a cantilever 102, where the cantilever 102 has a bracket set 200 mounted on a suspension end, and the testing device 300 and the adjusting device 400 are both mounted on the bracket set 200.
Specifically, the base 100 is vertically provided with a vertical column, the cantilever 102 is horizontally arranged and is in sliding connection with the vertical column, the vertical column is further provided with a linear module a101, and the linear module a101 is used for pulling the cantilever 102 to displace along the vertical direction.
The linear module a101 comprises a screw rod a vertically arranged on a stand column and a motor a in power connection with the screw rod a, the cantilever 102 is in threaded connection with the screw rod a, the motor a operates to drive the screw rod a to rotate, the screw rod a rotates to drive the cantilever 102 to displace along the vertical direction, and when the cantilever 102 displaces along the vertical direction, the bracket group 200, the testing device 300 and the adjusting device 400 are carried along, and the testing device 300 moves along the vertical direction, namely, the probe 301 in the testing device 300 moves downwards to be in contact with a Bluetooth chip pin or moves upwards to be out of contact with the Bluetooth chip pin.
As shown in fig. 1-3, the base 100 is further provided with a linear module b103, and the linear module b103 is used for pulling the test bench 104 to displace along the extending direction of the cantilever 102.
Specifically, the linear module b103 includes a screw b and a guide rail mounted on the base 100, the screw b, the guide rail and the cantilever 102 are parallel to each other, the input end of the screw b is dynamically connected with a motor b, and the test bench 104 is in threaded connection with the screw b and is also in sliding connection with the guide rail.
The vertical center line of the test bench 104 and the center line of the cantilever 102 in the extending direction are located in the same vertical plane, and the vertical plane is a center plane.
The motor b operates to drive the screw rod b to rotate, the screw rod b rotates to drive the test bench 104 to displace along the extending direction of the cantilever 102, the test bench 104 moves together with the Bluetooth chip placed on the test bench 104, and the Bluetooth chip can be moved to the position right below the test device 300 by the movement, so that pins on the Bluetooth chip are in one-to-one correspondence with the probes 301 in the test device 300.
As shown in fig. 3, when the bluetooth chip is located on the test bench 104, the vertical center line of the bluetooth chip coincides with the vertical center line of the test bench 104.
In the preferred embodiment, the test bench 104 may be a vacuum suction bench, and the bluetooth chip placed on the test bench 104 may be fixed by vacuum suction, and a supporting box 105 may be detachably mounted on the test bench 104, where the size of the inner cavity of the supporting box 105 is matched with the size of the bluetooth chip, and the supporting box 105 is provided with multiple groups, and the sizes of the supporting boxes are matched with the sizes of the types of the bluetooth chip one by one, and when the sizes of the types of the bluetooth chip to be tested are changed, the supporting box 105 on the test bench 104 may be directly detached, the new and corresponding supporting box 105 may be replaced, and the depth of the supporting box 105 is smaller than the thickness of the bluetooth chip.
As shown in fig. 4 and 5, the bracket set 200 includes a rotating shaft 201 vertically mounted at the suspension end of the suspension arm 102, the rotating shaft 201 is in power connection with a motor 202 mounted on the suspension arm 102 through a power transmission member a203, the rotating shaft 201 is driven to rotate by the motor 202, a carriage 204 is provided on an outer circumferential surface of the rotating shaft 201, and an extending direction of the carriage 204 is tangential to the outer circumferential surface of the rotating shaft 201.
The axial core line of the rotation shaft 201 is located in the center plane.
The carriage 204 is provided with a connecting frame 205 and a linear module c206, the extending direction of the connecting frame 205 is perpendicular to the extending direction of the carriage 204, the connection between the connecting frame 205 and the carriage 204 is in sliding connection, the linear module c206 is used for driving the connecting frame 205 to displace along the extending direction of the carriage 204, the linear module c206 comprises a screw rod c and a motor c, the screw rod c is arranged on the carriage 204, the axial direction of the screw rod c is parallel to the extending direction of the carriage 204, the screw rod c is in power connection with the motor c, the connecting frame 205 is in threaded connection with the screw rod c, the motor c operates to drive the screw rod c to rotate, the screw rod c rotates to drive the connecting frame 205 to displace along the extending direction of the carriage 204, the adjusting device 400 is arranged on the connecting frame 205, the connecting frame 205 moves together with the adjusting device 400, and the rotating shaft 201 rotates together with the carriage 204, the connecting frame 205 and the adjusting device 400.
As shown in fig. 6 and 7, a mounting table 207 is provided at the bottom of the rotating shaft 201, a slide cylinder 208 is vertically mounted at the bottom of the mounting table 207, a slide column 209 is slidably provided in the slide cylinder 208, an internal step is provided at the lower opening end of the slide cylinder 208, an external step is provided at the top end of the slide column 209, the cooperation of the internal step and the external step prevents the slide column 209 from separating from the slide cylinder 208, the bottom end of the slide column 209 extends out of the slide cylinder 208 and is coaxially mounted with a pressure plate 210, and the vertical center line of the mounting table 207, the axial core line of the rotating shaft 201 and the vertical center line of the slide cylinder 208 coincide.
The center of the platen 210 is provided with a probe hole in which a temperature probe 212 is disposed.
A spring a211 is arranged between the sliding column 209 and the sliding cylinder 208, and the compression elasticity of the spring a211 drives the sliding column 209 to vertically move downwards.
The test device 300 is mounted on the mounting table 207.
After the position of the probe 301 in the test apparatus 300 is adjusted, the bluetooth chip test is started:
firstly, placing a Bluetooth chip on a test bench 104, and running a linear module b103 to draw the test bench 104 and the Bluetooth chip to move to the position right below a test device 300, so that the positions of probes 301 are matched with the positions of pins of the Bluetooth chip in a one-to-one correspondence manner;
then, the linear module a101 operates to drive the cantilever 102, the bracket set 200 and the testing device 300 to vertically move down together, so that the probes 301 are in one-to-one correspondence with the pins of the Bluetooth chip, in the process, the initial position of the pressure plate 210 is lower than the height of the probes 301, so that the pressure plate 210 is in contact with the upper end surface of the Bluetooth chip, in the subsequent downward moving process, the pressure plate 210 does not continuously move, and the spring a211 is compressed.
As shown in fig. 4, the testing device 300 includes a testing mechanism, and the bluetooth chip is generally square or rectangular, and the solution is described by using the bluetooth chip as a rectangular or square, but the solution can also be applied to bluetooth chips with polygonal or circular shapes.
The mounting table 207 is rectangular in shape, and the test mechanisms are provided with four groups and are distributed at four sides of the mounting table 207 in a one-to-one correspondence.
Each set of test mechanisms is comprised of a plurality of sets of test members arranged in an array along the side extension of the mounting table 207.
As shown in fig. 3 and 8-10, a test member;
the test component includes the mobile jib 303 that is vertical arrangement, the slide hole has been seted up on the mount table 207, mobile jib 303 slidable mounting is in the slide hole, the top of mobile jib 303 is located the mount table 207 top and is provided with nut 306, the bottom is located the below of mount table 207, the outside of mobile jib 303 still is provided with damping piece 304 and damping washer 305, the lower terminal surface of damping washer 305 and the up end laminating of mount table 207, the up end of damping piece 304 and the lower terminal surface laminating of mount table 207, the outside cover of mobile jib 303 is equipped with the spring b307 that is located between nut 306 and damping washer 305, spring b307 plays damping spring effect, specifically, circle on the mobile jib 303 below, can rotate around self vertical central line, the elasticity of spring b307 makes closely laminating between damping washer 305 and the mount table 207, make closely laminating between damping piece 304 and the mount table 207, increase the frictional force between both and the mount table 207, increase the damping that hinders the mobile jib 303 rotates and receives, when not receiving adjusting device 400 initiative, hinder the ni, do not take place the rotation.
As shown in fig. 10, the outer part of the main lever 303 is provided with an outer sleeve 308 below the mounting table 207, and the outer sleeve 308 and the main lever 303 are detachably mounted by a clamping member a, specifically:
the upper end of the outer sleeve column 308 is open, the lower end is closed, and the clamping part a comprises clamping pieces a, wherein the clamping pieces a are provided with two groups and are respectively positioned at two sides of the main rod 303.
The clamping piece a comprises a guide rod a309 horizontally arranged in the outer sleeve column 308, a clamping block a310 is slidably arranged outside the guide rod a309, a spring c311 positioned between the cavity wall of the outer sleeve column 308 and the clamping block a310 is sleeved outside the guide rod a309, the clamping block a310 is abutted against the main rod 303 by the spring c311, the main rod 303 is clamped under the combined action of the clamping blocks a310 of the clamping piece a distributed on two sides of the main rod 303, and friction lines are arranged on the end face of the clamping block a310 in a preferred embodiment.
As shown in fig. 10, a mounting groove is formed in the side wall of the closed end of the outer sleeve 308, which is away from the sliding cylinder 208, and a penetrating nozzle 317 is formed in the side wall of the outer sleeve facing the sliding cylinder 208, and the penetrating nozzle 317 is communicated with the mounting groove.
As shown in fig. 3, the pins of the bluetooth chip are generally disposed on the surface of the chip by BGA packaging technology, so as shown in fig. 8 and 10, the probe 301 used in the test fixture is composed of a horizontal section and a vertical section, the tail end of the horizontal section is provided with a tail block 302 made of magnetic material, such as iron, the other end of the horizontal section passes through the mounting groove and the through nozzle 317 and is connected with the vertical section, and the bottom end of the vertical section is the tip of the probe 301 for contacting with the pins.
The mounting groove is internally provided with a clamping part b, the clamping part b is used for clamping the horizontal section of the probe 301, so that the horizontal section of the probe 301 and the mounting groove are detachably mounted, and after the clamping part b is loosened, the probe 301 can move.
The clamping part b comprises clamping pieces b, wherein the clamping pieces b are provided with two groups and are respectively positioned on the upper side and the lower side of the horizontal section of the probe 301, and specifically:
as shown in fig. 10, the clamping member b includes a guide rod b312 vertically installed in the installation groove, a clamping block b313 is installed at the outer part of the guide rod b312, a spring d314 located between the groove wall of the installation groove and the clamping block b313 is sleeved at the outer part of the guide rod b312, the clamping block b313 is abutted against the horizontal section of the probe 301 by the elastic force of the spring d314, and the clamping of the horizontal section of the probe 301 is realized by the combined action of the clamping blocks b313 of two groups of clamping members b distributed on the upper side and the lower side of the horizontal section of the probe 301, and in a preferred embodiment, friction lines are arranged on the end surface of the clamping block b313, which is in the meaning that the friction force between the clamping block b313 and the horizontal section of the probe 301 is increased, so that the clamping of the clamping member b to the probe 301 is more stable.
As shown in fig. 10, the bottom of the clamping block a310 is provided with an inclined plane a, and the distance between the inclined planes a in the two groups of clamping pieces a decreases from bottom to top; when the inclined surface b receives a vertically upward force, the force pushes the inclined surface a to enable the clamping block a310 to be far away from the main rod 303, the clamping part a releases the clamping between the clamping part a and the main rod 303, and the connection between the outer sleeve column 308 and the main rod 303 is broken.
The clamping block b313 is provided with an inclined plane b at one side facing the notch of the mounting groove, and the distance between the inclined planes b in the two groups of clamping pieces b decreases along the square of the notch of the mounting groove pointing to the bottom of the groove; when the adjusting means 400 applies a force acting on the inclined surface b in the depth direction of the installation groove, the force will push the inclined surface b, so that the clamping block b313 is far away from the horizontal section of the probe 301, and the clamping part b releases the clamping of the horizontal section of the probe 301.
As shown in fig. 10, in the two groups of clamping pieces b, a guide rod b312 in the clamping piece b above the probe 301 is in sliding connection with the wall of the mounting groove, the guide rod b312 is fixed with a clamping block b313, the top end of the guide rod b312 extends to form a connecting rod 315, the top end of the connecting rod 315 is provided with an unlocking block 316, the top of the unlocking block 316 is provided with an inclined plane c, and the inclined plane c is parallel to the inclined plane a and is attached to the inclined plane a; when the adjusting device 400 applies a force to the inclined surface b, the clamping part b releases the clamping of the horizontal section of the probe 301, and meanwhile, the clamping block b313 in the clamping part b above the probe 301 moves upwards together with the guide rod b312, the connecting rod 315 and the unlocking block 316, so that the clamping part a releases the clamping with the main rod 303 through the cooperation of the inclined surface c and the inclined surface a.
In addition, the guide rod b312 in the clamping member b above the probe 301 can be slidably mounted in the mounting groove, the guide rod b312 and the clamping block b313 form a sliding fit, the connecting rod 315 directly passes through the groove wall of the mounting groove and is connected with the clamping block b313, and the clamping block b313 can move upwards together with the connecting rod 315 and the unlocking block 316, so that the clamping member a releases the clamping with the main rod 303.
As shown in fig. 11-15, the adjusting device 400 is mounted on the connecting frame 205, and the rotating shaft 201 cooperates with the linear module c to match the position of the adjusting device 400 with the position of the single test member in the test device 300, specifically: firstly, the rotation shaft 201 rotates to enable the carriage 204 to be parallel to the side edge of the mounting table 207, then, the linear module c operates to drive the adjusting device 400 to move along the extending direction of the carriage 204, namely along the extending direction of the side edge of the mounting table 207, so that the position of the adjusting device 400 can be adjusted between the positions of a plurality of groups of test members in the test mechanism corresponding to the side edge of the mounting table 207, and after the group of test mechanisms are adjusted, the rotation shaft 201 rotates to enable the carriage 204 to be parallel to the next side edge of the mounting table 207, and the above steps are repeated.
The adjusting device 400 comprises a movable frame 402 slidably mounted on the connecting frame 205, a linear module d401 for pulling the movable frame 402 to move, an adjusting mechanism for adaptively adjusting the position of the probe 301 in the testing device 300, and a power mechanism for providing adjusting power for the adjusting mechanism.
As shown in fig. 11 and 12, the linear module d401 includes a screw d and a motor d mounted on the connecting frame 205, the screw d is parallel to the connecting frame 205, the screw d is in power connection with the motor d, the movable frame 402 is in threaded connection with the screw d, the motor d operates to drive the screw d to rotate, and the screw d rotates to displace the movable frame 402 along the extending direction of the connecting frame 205.
As shown in fig. 12-15, the adjusting mechanism comprises a mounting frame 405, a sliding guide fit in the vertical direction is formed between the mounting frame 405 and a movable frame 402, a first screw rod 407 and a third motor 404 are mounted on the movable frame 402, the third motor 404 is in power connection with the first screw rod 407 through a power transmission part c409, the first screw rod 407 is vertically arranged and in threaded connection with the mounting frame 405, the third motor 404 operates to drive the first screw rod 407 to rotate, and the first screw rod 407 rotates to enable the mounting frame 405 to displace in the vertical direction.
The side of the mounting frame 405 facing the axis core line of the rotating shaft 201 is provided with a trigger block 410, the side of the trigger block 410 facing the axis core line of the rotating shaft 201 is provided with an upper inclined plane and a lower inclined plane, the upper inclined plane and the lower inclined plane are respectively parallel to the inclined planes b in the two groups of clamping pieces b, and in the process of inserting the trigger block 410 into the mounting groove, the clamping parts b are enabled to loosen the clamping of the horizontal section of the probe 301 through the matching of the upper inclined plane, the lower inclined plane and the inclined planes b.
The side of the mounting frame 405 facing the axial core line of the rotating shaft 201 is also provided with an electromagnet a411, the side wall of the outer sleeve column 308 facing away from the sliding barrel 208 is provided with a magnetic attraction block made of magnetic materials, such as iron, and when the trigger block 410 is inserted into the mounting groove to enable the clamping part b to loosen clamping of the horizontal section of the probe 301, the electromagnet a411 is in contact with the magnetic attraction block, and magnetic attraction force is generated between the electromagnet a411 and the magnetic attraction block when the electromagnet a411 is electrified, so that the outer sleeve column 308 is attracted onto the mounting frame 405 through the cooperation of the electromagnet a411 and the magnetic attraction block, namely, at the moment, the outer sleeve column 308 and the mounting frame 405 can be regarded as a whole, and when the motor three 404 operates to enable the mounting frame 405 to move, the outer sleeve column 308 moves together.
The adjusting mechanism further comprises a support column 414, a sliding rail is arranged at the top end of the support column 414, sliding guide fit is formed between the sliding rail and the mounting frame 405, the guiding direction of the sliding rail is parallel to the extending direction of the connecting frame 205, an electromagnet b415 is arranged on one side of the support column 414, facing the axis core wire of the rotating shaft 201, a slot 416 is formed on one side of the electromagnet b415, facing the axis core wire of the rotating shaft 201, the upper inclined surface and the lower inclined surface of the trigger block 410 are symmetrically arranged with respect to the center line of the slot 416, when the trigger block 410 is inserted into the mounting slot to enable the clamping part b to loosen clamping of the horizontal section of the probe 301, the tail block 302 arranged at the tail end of the horizontal section of the probe 301 is inserted into the slot 416, magnetic adsorption force is generated between the electromagnet b415 and the tail block 302, and at the moment, when the support column 414 is pulled by the sliding rail to move, the electromagnet b415 moves along with the probe 301.
As shown in fig. 13 and 15, the power mechanism includes a transmission shaft 406 and a rotating shaft 412 which are vertically arranged, the transmission shaft 406 is in a hollow shaft shape and is mounted on the movable frame 402, and the transmission shaft 406 and a second motor 403 mounted on the movable frame 402 form power connection through a power transmission member b 408.
The rotating shaft 412 is mounted on the mounting frame 405, the rotating shaft 412 is also coaxially sleeved inside the transmission shaft 406, the rotating shaft 412 and the transmission shaft 406 form power connection through a linkage component, and when the rotating shaft 412 is displaced along the axial direction, the transmission shaft 406 continuously outputs power to the rotating shaft 412 through the linkage component, and specifically, the linkage component comprises an internal spline arranged on the transmission shaft 406 and an external spline arranged on the rotating shaft 412.
Be provided with power transmission piece d413 between pivot 412 and the slide rail, power transmission piece d413 is used for utilizing the power that pivot 412 rotated and produces to drive the slide rail and slides, specifically, power transmission piece d413 includes the rack fixed with the slide rail, install the gear on mounting bracket 405, the direction of extension of rack is on a parallel with the direction of guidance of slide rail and gear and rack engagement, power connection between gear and the pivot 412, specifically, install the jackshaft on the mounting bracket 405, realize power connection through worm gear between jackshaft and the pivot 412, realize power connection through the belt drive between jackshaft and the gear.
The second motor 403 runs to drive the transmission shaft 406 to rotate through the power transmission part b408, the transmission shaft 406 rotates to drive the rotating shaft 412 to synchronously rotate through the linkage part, the rotating shaft 412 rotates to drive the gear to rotate through the worm gear, the intermediate shaft and the belt transmission in sequence, the gear is matched with the rack, the sliding rail slides along with the supporting column 414, and the supporting column 414 moves along with the probe 301 through the electromagnet b 415.
The working principle of the invention is as follows:
as shown in fig. 16, fig. 16 shows the arrangement distribution of the probes, in the probe arrangement shown above or below, all the probes in the same arrangement are parallel to each other, which is for the bluetooth chip of the common signal, but some of the bluetooth chips use very precise electronic devices, the corresponding bluetooth chip is very small in size and high in precision, the other parts except the tip part of the probes are of a certain thickness, two adjacent probes are adhered to each other, it is difficult to match pins on the high-precision bluetooth chip, and then the probes need to rotate around the vertical center line of the main rod to make the tip part of the probes as close as possible, as shown on the right side in fig. 16, so the adjustment modes of the probes related to the invention are divided into two modes: adjusting a aiming at a common type Bluetooth chip and adjusting b aiming at a high-precision Bluetooth chip;
Adjusting a:
and (3) a step of: firstly, the rotation shaft 201 rotates to enable the carriage 204 to be parallel to the side edge of the mounting table 207, and then the linear module c operates to drive the adjusting device 400 to move along the extending direction of the carriage 204, namely along the extending direction of the side edge of the mounting table 207, so that the adjusting device 400 is matched with the position of the first probe 301 to be debugged;
and II: the adjusting device 400 is in butt joint with the probe 301;
firstly, the third motor 404 operates to drive the mounting frame 405 to displace in the vertical direction, so that the trigger block 410 and the mounting groove are positioned on the same straight line;
then, the linear module d401 operates to drive the movable frame 402, the adjusting mechanism and the power mechanism to move together to approach the mounting table 207, in the moving process, when the trigger block 410 is inserted into the mounting groove to enable the clamping component b to loosen the clamping of the horizontal section of the probe 301 and enable the clamping component a to loosen the clamping between the main rod 303, the electromagnet a411 contacts with the magnetic attraction block, the electromagnet a411 is electrified to generate magnetic attraction force with the magnetic attraction block, the outer sleeve column 308 is attracted onto the mounting frame 405 through the cooperation of the electromagnet a411 and the magnetic attraction block, the outer sleeve column 308 and the mounting frame 405 can be regarded as a whole, meanwhile, the tail block 302 arranged at the tail end of the horizontal section of the probe 301 is inserted into the slot 416, the electromagnet b415 is electrified to generate magnetic attraction force with the tail block 302, and the probe 301 and the strut 414 can be regarded as a whole;
Thirdly,: adjusting the position of the probe 301;
height adjustment of probe 301: the third motor 404 operates to drive the mounting frame 405 to displace along the vertical direction, the mounting frame 405 moves to move together with the outer sleeve 308 and the probe 301, and then the height adjustment of the probe 301 is realized, and the height adjustment is mainly implemented in that: according to the pin distribution condition on the Bluetooth chip, the height of the probe 301 which is not needed is increased, and the probe is not contacted with the Bluetooth chip in the subsequent test process;
tip position adjustment of probe 301: the second motor 403 is operated to drive the sliding rail to slide, and the sliding rail slides and moves together with the support 414, the electromagnet b415 and the probe 301, so that the probe 301 is displaced along the extending direction of the horizontal section, namely, the position of the needle tip of the probe 301 is adjusted, and the main appearance is that: correspondingly matching the needle tip position of the probe 301 with the pin position of the Bluetooth chip;
fourth, the method comprises the following steps: when the position adjustment of the probe 301 is finished, the electromagnet a411 and the electromagnet b415 are powered off and repeat two times in reverse, so that the clamping component b clamps the horizontal section of the probe 301 again, the clamping component a clamps the main rod 303 again, and the testing device 400 is out of contact with the probe 301;
fifth step: the linear module c operates to drive the adjusting device 400 to move along the extending direction of the side edge of the mounting table 207, so that the adjusting device 400 matches with the position of the next probe 301 to be debugged, and the position adjusting process of the probe 301 is repeated;
After the positions of the probes 301 on the same side of the mounting table 207 are adjusted, the rotation shaft 201 rotates to make the carriage 204 parallel to the next side of the mounting table 207, and the position adjustment of the probes 301 in the next test mechanism is performed, so that the above steps are repeated until the position adjustment of all the probes 301 is completed.
Adjusting b:
the first three steps are consistent with the first three steps in the adjustment a, and are not repeated;
after the height and the position along the extending direction of the horizontal segment of the probe 301 are adjusted:
fourth, the method comprises the following steps: the rotating shaft 301 rotates and the linear module c206 drives the connecting frame 205 to displace along the extending direction of the carriage 204, and the connecting frame and the carriage are matched, and the testing device 300 is used for transmission, so that the whole testing component rotates around the vertical center line of the main rod 303 by a preset angle to be matched with the pin position on the Bluetooth chip;
fifth step: when the position adjustment of the probe 301 is finished, the electromagnet a411 and the electromagnet b415 are powered off and repeat two times in reverse, so that the clamping component b clamps the horizontal section of the probe 301 again, the clamping component a clamps the main rod 303 again, and the testing device 400 is out of contact with the probe 301;
sixth,: the rotation shaft 301 and the linear module c cooperate to operate, so that the adjusting device 400 is matched with the position of the next probe 301 to be debugged, and the position adjusting process of the probe 301 is repeated;
After the positions of the probes 301 on the same side of the mounting table 207 are adjusted, the rotation shaft 201 rotates to make the carriage 204 parallel to the next side of the mounting table 207, and the position adjustment of the probes 301 in the next test mechanism is performed, so that the above steps are repeated until the position adjustment of all the probes 301 is completed.
In the fourth of the above-mentioned adjustments b, specifically: since the connecting frame 205 is perpendicular to the carriage 204 and the carriage 204 is tangential to the rotation shaft 201, and since the extending direction of the horizontal segment of the probe 301 clamped by the adjusting device 400 is parallel to the extending direction of the connecting frame 205, the rotational displacement of the tip of the probe 301 can be divided into two sub-displacements during the process that the whole test member rotates around the vertical center line of the main rod 303 by a preset angle: the radial partial displacement a in the extending direction of the link 205 and the tangential partial displacement a in the extending direction of the carriage 204 can be divided into two partial displacements: the radial partial displacement b along the extending direction of the connecting frame 205 and the tangential partial displacement b along the extending direction of the carriage 204 are named as tangential partial displacement c, so that the radial partial displacement a is equal to the radial partial displacement b, the tangential partial displacement c is equal to the difference between the tangential partial displacement a and the tangential partial displacement b, the rotation shaft 301 in the fourth embodiment can be matched with the linear module c206, the whole test member rotates around the vertical center line of the main rod 303, in combination, the radial partial displacement a requiring the rotation displacement of the tip of the probe 301 is calculated, the radial partial displacement b of the rotation shaft 201 is consistent with the radial partial displacement a, and then the tangential partial displacement b of the rotation shaft 201 is compensated by the tangential partial displacement c of the connecting frame 205, so that the sum of the tangential partial displacement c and the tangential partial displacement b is equal to the radial partial displacement a, and the fourth embodiment is achieved.
After the probe 301 of the testing device 300 is adjusted, a batch testing process of bluetooth chips is performed:
and (3) a step of: placing a bluetooth chip on the test bench 104 by prior art means;
and II: the linear module b103 runs the traction test table 104 and the Bluetooth chip to move to the position right below the test device 300, so that the positions of the probes 301 are matched with the positions of pins of the Bluetooth chip in a one-to-one correspondence manner;
thirdly,: the linear module a101 operates to drive the cantilever 102, the bracket set 200 and the testing device 300 to move vertically together, so that the probes 301 are in one-to-one correspondence with pins of the Bluetooth chip, in the process, the initial position of the pressure plate 210 is lower than the height of the probes 301, so that the pressure plate 210 is in contact with the upper end surface of the Bluetooth chip, in the subsequent downward moving process, the pressure plate 210 does not move continuously, the spring a211 is compressed, the Bluetooth chip is further fixed by the pressure plate 210, the subsequent probes 301 are prevented from being in contact with the pins, and in the subsequent testing process, the Bluetooth chip is prevented from being offset, in addition, in the testing process, the temperature of the Bluetooth chip can be sensed in real time through the temperature measuring probe 212, the test of the Bluetooth chip is related to the temperature of the Bluetooth chip in the testing process, and the test of the Bluetooth chip is more comprehensive and accurate;
Fourth, the method comprises the following steps: after the test is finished, the linear module a101 runs reversely, so that the probe 301 is separated from the contact of the Bluetooth chip, the linear module b103 runs to pull the test bench 104 and the Bluetooth chip away from the test device 300, the Bluetooth chip is taken away through the prior art, a new Bluetooth chip to be tested is placed on the test bench 104, and the test is repeated.
The present invention is not limited to the above embodiments, but is capable of modification and variation in detail, and other modifications and variations can be made by those skilled in the art without departing from the scope of the present invention.
Claims (8)
1. The utility model provides a bluetooth chip test fixture, its includes base (100), is provided with on base (100) and is used for laying testboard (104) of waiting to test bluetooth chip, its characterized in that: the base (100) is also provided with a testing device (300) for testing the Bluetooth chips and an adjusting device (400) for adjusting the positions of the probes (301) in the testing device (300) so that the testing device (300) is adaptive to the Bluetooth chips with different models and sizes;
A stand column is vertically arranged on the base (100), a cantilever (102) and a linear module a (101) are slidably arranged on the stand column, the cantilever (102) is horizontally arranged, the linear module a (101) is used for pulling the cantilever (102) to displace along the vertical direction, and a bracket group (200) is arranged at the suspension end of the cantilever (102);
the base (100) is also provided with a linear module b (103), the linear module b (103) is used for pulling the test bench (104) to displace along the extending direction of the cantilever (102), the vertical center line of the test bench (104) and the center line of the cantilever (102) along the extending direction are positioned in the same vertical plane, the vertical plane is a central plane, and when the Bluetooth chip is positioned on the test bench (104), the vertical center line of the Bluetooth chip coincides with the vertical center line of the test bench (104);
the bracket group (200) comprises a rotating shaft (201) vertically arranged at the suspension end of the cantilever (102), the rotating shaft (201) is in power connection with a first motor (202) arranged on the cantilever (102) through a power transmission piece a (203), a carriage (204) is arranged on the outer circular surface of the rotating shaft (201), the extending direction of the carriage (204) is tangential to the outer circular surface of the rotating shaft (201), and a shaft core wire of the rotating shaft (201) is positioned in a central plane;
The carriage (204) is provided with a connecting frame (205) and a linear module c (206), the extending direction of the connecting frame (205) is perpendicular to the extending direction of the carriage (204), the connecting frame (205) is in sliding connection with the carriage (204), and the linear module c (206) is used for driving the connecting frame (205) to displace.
2. The bluetooth chip testing fixture according to claim 1, wherein: the bottom of the rotating shaft (201) is provided with a mounting table (207), the bottom of the mounting table (207) is vertically provided with a sliding cylinder (208), a sliding column (209) is arranged in the sliding cylinder (208), the bottom end of the sliding column (209) extends out of the sliding cylinder (208) and is coaxially provided with a pressure plate (210), and the vertical center line of the mounting table (207), the shaft core line of the rotating shaft (201) and the vertical center line of the sliding cylinder (208) are overlapped;
the center of pressure disk (210) is provided with the probe hole, is provided with temperature probe (212) in the probe hole, is provided with spring a (211) between traveller (209) and slide (208), and the compression elasticity of spring a (211) orders about traveller (209) vertical downmovement.
3. The bluetooth chip testing fixture according to claim 2, wherein: the testing device (300) comprises a testing mechanism, wherein the mounting table (207) is rectangular, the testing mechanism is provided with four groups of testing members which are distributed on the four sides of the mounting table (207) in a one-to-one correspondence manner, and each group of testing mechanism consists of a plurality of groups of testing members which are distributed in an array manner along the extending direction of the sides of the mounting table (207);
The testing component is including being perpendicular mobile jib (303) of arranging, the slide opening has been seted up on mount table (207), mobile jib (303) slidable mounting is in the slide opening and can rotate around self vertical central line, the top of mobile jib (303) is located mount table (207) top and is provided with nut (306), the bottom is located the below of mount table (207), the outside of mobile jib (303) still is provided with damping piece (304) and damping washer (305), the lower terminal surface of damping washer (305) is laminated with the up end of mount table (207), the up end of damping piece (304) is laminated with the lower terminal surface of mount table (207), the outside cover of mobile jib (303) is equipped with spring b (307) that are located between nut (306) and damping washer (305).
4. A bluetooth chip testing fixture according to claim 3, wherein: an outer sleeve column (308) positioned below the mounting table (207) is arranged outside the main rod (303), and the outer sleeve column (308) and the main rod (303) are detachably mounted through a clamping part a;
the upper end of the outer sleeve column (308) is open, the lower end of the outer sleeve column is closed, the clamping part a comprises clamping pieces a, and the clamping pieces a are provided with two groups and are respectively positioned at two sides of the main rod (303);
The clamping piece a comprises a guide rod a (309) horizontally arranged in an outer sleeve column (308), a clamping block a (310) is slidably arranged outside the guide rod a (309), a spring c (311) positioned between the cavity wall of the outer sleeve column (308) and the clamping block a (310) is sleeved outside the guide rod a (309), the clamping block a (310) is abutted against the main rod (303) through the spring c (311), and the clamping block a (310) of the clamping piece a distributed on two sides of the main rod (303) clamps the main rod (303) to realize assembly between the outer sleeve column (308) and the main rod (303).
5. The bluetooth chip testing fixture according to claim 4, wherein: the side wall of the closed end of the outer sleeve column (308) which is away from the sliding cylinder (208) is provided with a mounting groove, the side wall of the outer sleeve column which is towards the sliding cylinder (208) is provided with a penetrating nozzle (317), and the penetrating nozzle (317) is communicated with the mounting groove;
the probe (301) consists of a horizontal section and a vertical section, the tail end of the horizontal section is provided with a tail block (302) made of magnetic materials, the other end of the horizontal section passes through the mounting groove and the penetrating nozzle (317) and is connected with the vertical section, and the bottom end of the vertical section is the needle point of the probe (301);
the mounting groove is internally provided with a clamping part b, the clamping part b is used for clamping the horizontal section of the probe (301), the clamping part b comprises clamping pieces b, and the clamping pieces b are provided with two groups and are respectively positioned at the upper side and the lower side of the horizontal section of the probe (301);
The clamping piece b comprises a guide rod b (312) vertically arranged in the mounting groove, a clamping block b (313) is arranged outside the guide rod b (312), a spring d (314) positioned between the groove wall of the mounting groove and the clamping block b (313) is sleeved outside the guide rod b (312), the clamping block b (313) is abutted against the horizontal section of the probe (301) by the elasticity of the spring d (314), and the clamping of the horizontal section of the probe (301) is realized by the clamping blocks b (313) of two groups of clamping pieces b distributed on the upper side and the lower side of the horizontal section of the probe (301).
6. The bluetooth chip testing fixture according to claim 5, wherein: the bottom of the clamping block a (310) is provided with an inclined plane a, and the distance between the inclined planes a in the two groups of clamping pieces a is decreased from bottom to top;
the clamping block b (313) is provided with an inclined plane b towards one side of the notch of the mounting groove, and the distance between the inclined planes b in the two groups of clamping pieces b is gradually decreased along the square of the notch of the mounting groove pointing to the bottom of the groove;
among the two groups of clamping pieces b, a guide rod b (312) and a mounting groove wall in the clamping piece b above the probe (301) form sliding connection, the guide rod b (312) is fixed with a clamping block b (313), a connecting rod (315) extends from the top end of the guide rod b (312), an unlocking block (316) is arranged at the top end of the connecting rod (315), an inclined plane c is arranged at the top of the unlocking block (316), and the inclined plane c is parallel to the inclined plane a and is attached to the inclined plane a.
7. The bluetooth chip testing fixture according to claim 6, wherein: the adjusting device (400) comprises a movable frame (402) which is slidably arranged on the connecting frame (205), a linear module d (401) for pulling the movable frame (402) to move, an adjusting mechanism for adaptively adjusting the position of the probe (301) in the testing device (300), and a power mechanism for providing adjusting power for the adjusting mechanism;
the adjusting mechanism comprises a mounting frame (405), sliding guide matching in the vertical direction is formed between the mounting frame (405) and a movable frame (402), a first screw rod (407) and a third motor (404) are arranged on the movable frame (402), the third motor (404) is in power connection with the first screw rod (407) through a power transmission part c (409), and the first screw rod (407) is vertically arranged and in threaded connection with the mounting frame (405);
a trigger block (410) is arranged on one side of the mounting frame (405) facing the axial core wire of the rotating shaft (201), an upper inclined plane and a lower inclined plane are arranged on one side of the trigger block (410) facing the axial core wire of the rotating shaft (201), and the upper inclined plane and the lower inclined plane are respectively parallel to the inclined planes b in the two groups of clamping pieces b;
an electromagnet a (411) is further arranged on one side, facing the axial core wire of the rotating shaft (201), of the mounting frame (405), a magnetic attraction block made of magnetic materials is arranged on the side wall, facing away from the sliding cylinder (208), of the outer sleeve column (308), and when the trigger block (410) is inserted into the mounting groove, the clamping part b is enabled to loosen the clamping of the horizontal section of the probe (301), the electromagnet a (411) is in contact with the magnetic attraction block;
The adjusting mechanism further comprises a support column (414), a sliding rail is arranged at the top end of the support column (414), a sliding guide fit with the sliding guide fit between the sliding rail and the mounting frame (405) is formed, the guiding direction of the sliding guide fit is parallel to the extending direction of the connecting frame (205), an electromagnet b (415) is arranged on one side, facing the axis core wire of the rotating shaft (201), of the support column (414), a slot (416) is arranged on one side, facing the axis core wire of the rotating shaft (201), of the electromagnet b (415), the upper inclined surface and the lower inclined surface of the trigger block (410) are symmetrically arranged with respect to the central line of the slot (416), and when the trigger block (410) is inserted into the mounting groove, the clamping part b is enabled to loosen the clamping of the horizontal section of the probe (301), and the tail block (302) arranged at the tail end of the horizontal section of the probe (301) is inserted into the slot (416).
8. The bluetooth chip testing fixture according to claim 7, wherein: the power mechanism comprises a transmission shaft (406) and a rotating shaft (412) which are vertically arranged, the transmission shaft (406) is in a hollow shaft shape and is arranged on the movable frame (402), and the transmission shaft (406) and a motor II (403) arranged on the movable frame (402) form power connection through a power transmission part b (408);
the rotating shaft (412) is arranged on the mounting frame (405), the rotating shaft (412) is also coaxially sleeved inside the transmission shaft (406), the rotating shaft (412) and the transmission shaft (406) form power connection through a linkage component, and when the rotating shaft (412) axially displaces, the transmission shaft (406) continuously outputs power to the rotating shaft (412) through the linkage component;
A power transmission piece d (413) is arranged between the rotating shaft (412) and the sliding rail, and the power transmission piece d (413) is used for driving the sliding rail to slide by utilizing power generated by rotation of the rotating shaft (412).
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| CN202311218794.4A CN116953491B (en) | 2023-09-21 | 2023-09-21 | Bluetooth chip test fixture |
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| CN202311218794.4A CN116953491B (en) | 2023-09-21 | 2023-09-21 | Bluetooth chip test fixture |
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| CN116953491A CN116953491A (en) | 2023-10-27 |
| CN116953491B true CN116953491B (en) | 2023-12-15 |
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| CN114252667A (en) * | 2022-01-21 | 2022-03-29 | 普铄电子(上海)有限公司 | Probe card for high-temperature and high-pressure test of power device |
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| CN219609149U (en) * | 2023-03-13 | 2023-08-29 | 上海益深电子有限公司 | A chip detection device with lifting function |
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| CN219609149U (en) * | 2023-03-13 | 2023-08-29 | 上海益深电子有限公司 | A chip detection device with lifting function |
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| CN116953491A (en) | 2023-10-27 |
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