CN115683963A - Device and method for testing lunar dust deposition uniformity - Google Patents
Device and method for testing lunar dust deposition uniformity Download PDFInfo
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- CN115683963A CN115683963A CN202211140686.5A CN202211140686A CN115683963A CN 115683963 A CN115683963 A CN 115683963A CN 202211140686 A CN202211140686 A CN 202211140686A CN 115683963 A CN115683963 A CN 115683963A
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- 238000012216 screening Methods 0.000 claims abstract description 121
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- 238000010998 test method Methods 0.000 claims description 2
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The application relates to the technical field of spaceflight, in particular to a device and a method for testing lunar dust deposition uniformity, wherein the device comprises a vacuum chamber, a temperature regulation and control system, a dust falling device, a screening device and a sample platform, wherein: a support frame is arranged in the vacuum chamber along the vertical direction, and a fixed frame, a first slide rail and a second slide rail are sequentially arranged from top to bottom along the horizontal direction of the support frame; the dust falling device is arranged on the fixing frame; the screening device is arranged on the first sliding rail and can slide on the first sliding rail through the first traction electric cylinder; the sample table is arranged on the second slide rail and can slide on the second slide rail through a second traction electric cylinder; the temperature regulation system is arranged on the side wall of the vacuum chamber. According to the method and the device, whether the moon dust is uniformly deposited or not can be judged, the output characteristic of the moon dust deposition under different deposition uniformity input conditions is evaluated, a ground testing and evaluation method is better provided for on-orbit accurate data inversion, and the consistency of earth-moon space data is realized.
Description
Technical Field
The application relates to the technical field of aerospace, in particular to a device and a method for testing lunar dust deposition uniformity.
Background
The moon dust deposition hazard is an unsolved problem in a moon detection task, and is particularly reflected in the aspect of efficiency reduction of a solar cell panel. At present, the evaluation method for measuring the moon dust deposition hazard through the output characteristic change of the solar cell panel at home and abroad has great defects, which is mainly reflected in that: in the ground measurement calibration process, the influence of different deposition uniformity and real-time temperature of the lunar dust on the measurement output characteristics is not considered, the lunar dust deposition characteristic measurement belongs to micro-quality detection, and a very large output characteristic error can be caused by small input characteristic disturbance, so that a large error exists in the ground inversion process of data after in-orbit measurement, in-orbit deposition data cannot be accurately obtained, and reliable data support cannot be further provided for lunar dust protection of a solar cell panel. Therefore, a lunar dust uniformity testing device and a measurement and evaluation method need to be designed for evaluating lunar dust deposition output characteristics under different deposition uniformity input conditions, and a ground testing and evaluation method is better provided for on-orbit accurate data inversion, so that lunar space data consistency is realized.
Disclosure of Invention
The main purpose of the present application is to provide a device and a method for testing lunar dust deposition uniformity, which can measure the current output characteristics of a solar cell under different lunar dust deposition qualities and different temperature conditions in real time on line, and provide reliable theoretical data support for subsequent calibration of an on-orbit lunar dust measuring instrument and power characteristic analysis of a solar cell panel.
In order to achieve the above object, the present application provides a device for testing uniformity of lunar dust deposition, comprising a vacuum chamber, a temperature control system, a dust falling device, a screening device and a sample stage, wherein: the temperature regulation and control system, the dust falling device, the screening device and the sample platform are all arranged in the vacuum chamber; the top of the vacuum chamber is provided with an observation window, and the outside of the vacuum chamber is provided with a plurality of interfaces; a support frame is arranged in the vacuum chamber along the vertical direction, and a fixed frame, a first slide rail and a second slide rail are sequentially arranged from top to bottom along the horizontal direction of the support frame; the dust falling device is arranged on the fixing frame; the screening device is arranged on the first slide rail and can slide on the first slide rail through the first traction electric cylinder; the sample table is arranged on the second slide rail and can slide on the second slide rail through a second traction electric cylinder; the temperature regulation and control system is arranged on the side wall of the vacuum chamber.
Further, the dust falling device comprises a moon dust storage box, a baffle rotating motor, a push-pull magnet and a position induction switch, wherein: the moon dust storage box is fixed below the fixing frame and is not provided with an upper cover plate and a lower bottom plate; the baffle is arranged below the lunar dust storage box, is matched with the lunar dust storage box and shields the bottom of the lunar dust storage box; the baffle plate rotating motor is fixed on the strip-shaped plate on one side below the fixing frame, and the output shaft is connected with the baffle plate; the push-pull magnet is fixed on the strip-shaped plate on the other side below the fixing frame and can strike the lunar dust storage box; the position sensing switches are symmetrically arranged on the lunar dust storage box.
Further, the sieving mechanism passes through the lifting support setting on first slide rail, including lift electric cylinder, rotating electrical machines, rotary rod, nylon brush and screening dish, wherein: one end of the lifting electric cylinder is arranged on the fixed frame, and the other end of the lifting electric cylinder is connected with the rotating motor through the mounting plate; the rotating motor is fixed on the lifting bracket, and an output shaft is connected with the rotating rod; one end of the rotating rod is connected with an output shaft of the rotating motor, and the other end of the rotating rod is connected with the nylon brush; the screening disc is connected with the first traction electric cylinder and slides along the first slide rail under the drive of the first traction electric cylinder; the front and back sides of the screening disk are provided with induction plates.
Further, the sample platform passes through the sliding support setting on the second slide rail, including temperature sensor, quartz crystal microbalance and solar wafer, wherein: the sample table is connected with the second traction electric cylinder and slides along the second slide rail under the driving of the second traction electric cylinder; the solar cell is arranged in the center of the sample table; the plurality of quartz crystal microbalances are uniformly distributed along the circumferential direction of the solar cell piece by taking the solar cell piece as a center, and the plurality of quartz crystal microbalances and the solar cell piece are positioned at the same horizontal position; the temperature sensor is attached to the back surface of the solar cell; the front side and the rear side of the sample table are provided with induction plates.
Furthermore, a dust falling position switch and a screening position switch are arranged on the lifting support on the first sliding rail.
Furthermore, a dust falling position switch, a screening position switch and an illumination position switch are arranged on the sliding support on the second sliding rail.
Furthermore, a vacuum pump, a solar simulator and a control system are arranged outside the vacuum chamber.
Further, the temperature regulating system controls the temperature in the vacuum chamber to be-40-90 ℃.
In addition, the application also provides a testing method applying the lunar dust deposition uniformity testing device, which comprises the following steps:
step 1: weighing the lunar dust, and then loading the lunar dust into a lunar dust storage box, wherein the lunar dust storage box and a screening disc are located at a dust falling position, and a sample table is located at an illumination position, namely right below an observation window;
step 2: turning on the vacuum pump, observing the change of vacuum degree in the vacuum chamber, wherein the vacuum degree is 10 -5 Keeping the vacuum degree unchanged for 30min when Pa, opening a switch of a temperature regulation system, keeping the temperature after the temperature reaches a temperature value required by the test, and measuring the frequency of the quartz crystal microbalance;
and 3, step 3: opening the solar simulator, enabling light to irradiate the sample platform through the observation window, measuring output current of the solar cell, recording the current value as the no-load short-circuit output current of the solar cell after the current output is stable, starting a second traction electric cylinder, enabling the sample platform to slide to a dust falling position, triggering a dust falling position switch on a sliding support by the front side induction plate and the rear side induction plate of the sample platform, and enabling the sample platform to be located right below the screening disc;
and 4, step 4: starting a baffle rotating motor in the dust falling device, moving away a baffle below a lunar dust storage box, when a position sensing switch on the lunar dust storage box has no trigger signal, namely the baffle is completely opened, stopping the rotation of the baffle rotating motor, striking the lunar dust storage box by electrifying a push-pull magnet, enabling lunar dust to leak out of the lunar dust storage box and fall into a screening disc, starting the baffle rotating motor again to rotate the baffle below the lunar dust storage box after the lunar dust falls into the screening disc, and stopping the baffle rotating motor when the two position sensing switches are triggered;
and 5: after the lunar dust falls into the screening disc, starting a first traction electric cylinder to enable the screening disc to slide along a first slide rail, when sensing plates on the front side and the rear side of the screening disc trigger a screening position switch on a lifting support, closing the first traction electric cylinder, enabling the screening disc to reach a screening position at the moment, starting the lifting electric cylinder after the screening disc is in place, driving a rotating motor, a rotating rod and a nylon brush to descend for a set distance, enabling the nylon brush to enter the screening disc, starting the rotating motor after the nylon brush enters the screening disc, and enabling the nylon brush to brush lunar dust particles to enable the lunar dust to be deposited on a sample platform through a screen of the screening disc;
and 6: after the lunar dust falls into the screening plate, starting a second traction electric cylinder to enable the sample platform to slide along a second sliding rail, when the sensing plates on the front side and the rear side of the sample platform trigger a screening position switch, closing the second traction electric cylinder, enabling the sample platform to reach a screening position, depositing the lunar dust on the sample platform from a filter screen of the screening plate by a nylon brush, and enabling the lunar dust to be in contact with a temperature sensor, a quartz crystal microbalance and a solar cell piece;
and 7: according to a quartz crystal microbalance increment formula, calculating whether the deposition of the lunar dust mass on the sample platform is uniform, if so, starting a lifting electric cylinder, and lifting a nylon brush to the outside of a screening disc;
and 8: according to a relation formula of the frequency and the mass of the quartz crystal microbalance, calculating the average value of the deposition mass of the lunar dust on each quartz crystal microbalance and the deposition mass of the lunar dust on a plurality of quartz crystal microbalances when the lunar dust is uniformly deposited, and taking the value as the average mass of the deposition mass of the lunar dust on the solar cell sheet under the condition of uniform deposition;
and step 9: after the lunar dust quality is judged to be uniformly deposited, a second traction electric cylinder is started to enable the sample platform to slide to the position right below an observation window of the vacuum chamber along a second slide rail, when the induction plates on the front side and the rear side of the sample platform trigger an illumination position switch, the sample platform is in place, the second traction electric cylinder is closed, and light rays of the solar simulator penetrate through the observation window to vertically irradiate the surface of the sample platform;
step 10: after the lunar dust is uniformly deposited on the solar cell, the short-circuit current of the solar cell changes under the set illumination intensity, and the current output characteristics of the solar cell under different deposition uniformity input conditions are evaluated according to the deposition characteristics of the solar cell.
The device and the method for testing the uniformity of lunar dust deposition provided by the invention have the following beneficial effects:
1. the invention mainly aims to measure the change of the output characteristic of the solar cell with the deposition quality after the lunar dust is uniformly deposited, judge and evaluate the lunar dust deposition uniformity, eliminate the output value deviation of the solar cell caused by the overlapping coverage or local accumulation of multilayer particles after the lunar dust is non-uniformly deposited and provide a reliable ground experiment test result for the on-orbit data measurement result.
2. According to the invention, the dust falling quality can be controlled by pushing and pulling the magnet when the moon dust falls through the dust falling device, so that the moon dust falling quality at each time is small, and the test times of qualified screening in the subsequent uniform moon dust deposition screening process are reduced.
3. The lunar dust screening device designed by the invention obtains the lunar dust uniform deposition characteristic of the measured object by comparing the output characteristics of a plurality of micro quality measurement sensors at the circumference of the measured object, is an evaluation test method based on measured data, and has the test precision as high as 10 -10 The g magnitude can make the judgment precision of the uniform deposition characteristic high.
4. The temperature control can not only eliminate the temperature output deviation of the measured object caused by temperature change, but also study the output characteristic change at different temperatures, and is beneficial to realizing the test data uniformity in the lunar environment.
5. The method greatly increases the invertibility of the ground test result of the output characteristic of the solar cell lunar dust deposition pollution in the orbital lunar environment, can be used for quantitatively calculating the on-orbit measurement error of the solar cell lunar dust deposited unevenly in the future, and greatly improves the accuracy of the test result.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, serve to provide a further understanding of the application and to enable other features, objects, and advantages of the application to be more apparent. The drawings and the description of the exemplary embodiments of the present application are provided for explaining the present application and do not constitute an undue limitation on the present application. In the drawings:
FIG. 1 is a schematic structural diagram of a lunar dust deposition uniformity testing apparatus provided according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of the interior of a vacuum chamber of a lunar dust deposition uniformity testing apparatus provided according to an embodiment of the present application
FIG. 3 is a schematic view of a dust falling device of a lunar dust deposition uniformity testing apparatus provided according to an embodiment of the present application;
FIG. 4 is a schematic view of a screening apparatus of a lunar dust deposition uniformity testing apparatus provided according to an embodiment of the present application;
FIG. 5 is a schematic diagram of a sample stage of a lunar dust deposition uniformity testing apparatus provided in accordance with an embodiment of the present application;
FIG. 6 is a top view of a screening device of a lunar dust deposition uniformity testing apparatus provided in an embodiment of the present application on a first sliding rail;
FIG. 7 is a top view of a second slide rail on a sample stage of the apparatus for testing uniformity of lunar dust deposition provided by the embodiments of the present application;
in the figure: 1-vacuum chamber, 11-observation window, 2-temperature regulation system, 3-dust falling device, 31-monthly dust storage box, 32-baffle, 33-baffle rotating motor, 34-push-pull magnet, 35-position inductive switch, 36-dust falling position switch, 4-screening device, 41-lifting electric cylinder, 42-rotating motor, 43-rotating rod, 44-nylon brush, 45-screening disk, 46-first traction electric cylinder, 47-screening position switch, 5-sample table, 51-temperature sensor, 52-quartz crystal microbalance, 53-solar cell sheet, 54-second traction electric cylinder, 55-illumination position switch, 6-fixed frame, 7-first slide rail, 8-second slide rail and 9-induction plate.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances in order to facilitate the description of the embodiments of the application herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In this application, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings. These terms are used primarily to better describe the present application and its embodiments, and are not used to limit the indicated devices, elements or components to a particular orientation or to be constructed and operated in a particular orientation.
Moreover, some of the above terms may be used to indicate other meanings besides the orientation or positional relationship, for example, the term "on" may also be used to indicate some kind of attachment or connection relationship in some cases. The specific meaning of these terms in this application will be understood by those of ordinary skill in the art as the case may be.
In addition, the term "plurality" shall mean two as well as more than two.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
As shown in fig. 1-2, the present application provides a device for testing uniformity of lunar dust deposition, comprising a vacuum chamber 1, a temperature regulation system 2, a dust falling device 3, a screening device 4 and a sample stage 5, wherein: the temperature regulation and control system 2, the dust falling device 3, the screening device 4 and the sample table 5 are all arranged in the vacuum chamber 1; the top of the vacuum chamber 1 is provided with an observation window 11, and the outside is provided with a plurality of interfaces; a support frame is arranged in the vacuum chamber 1 along the vertical direction, and a fixed frame 6, a first slide rail 7 and a second slide rail 8 are sequentially arranged from top to bottom along the horizontal direction of the support frame; the dust falling device 3 is arranged on the fixed frame 6; the screening device 4 is arranged on the first slide rail 7 and can slide on the first slide rail 7 through a first traction electric cylinder 46; the sample stage 5 is arranged on the second slide rail 8 and can slide on the second slide rail 8 through a second traction electric cylinder 54; the temperature regulation system 2 is arranged on the side wall of the vacuum chamber 1.
Specifically, the device for testing the uniformity of lunar dust deposition provided by the embodiment of the application is mainly used for measuring the current output characteristics of the solar cell 53 under the conditions of different lunar dust deposition qualities and different temperatures in real time in an online manner with high precision, and the measurement precision can reach 1 × 10- 10 g. The vacuum chamber 1 is mainly used forThe testing environment is kept vacuum, a plurality of interfaces are arranged outside the vacuum chamber 1 and can be connected with a vacuum pump, a vacuumizing device and the like, and the vacuum degree in the vacuum chamber 1 is adjusted according to the actual testing environment. The temperature control system 2 is mainly used for adjusting the temperature of the test environment, and can adjust the temperature in the vacuum chamber 1 in real time according to the actual test environment. The observation window 11 on the top of the vacuum chamber 1 is mainly used for observing the accumulation condition of the lunar dust on the sample stage 5, and the sample stage 5 can be irradiated by using a solar simulator through the observation window 11, so that the characteristic of the current output of the solar cell under the set illumination intensity after the lunar dust is uniformly deposited on the solar cell 53 is obtained. The support frame is used for supporting and fixing the whole device. The dust falling device 3 is mainly used for storing a certain mass of the lunar dust and is capable of falling the lunar dust into the screening device 4. The screening device 4 is mainly used for screening and depositing fallen lunar dust, slides on the first slide rail 7 through the first traction electric cylinder 46, and can slide to different positions according to different practical situations. The sample stage 5 is provided with various types of sensors, and is mainly used for measuring the lunar dust deposited on the sample stage, collecting various parameters under the condition that the lunar dust is uniformly deposited, then performing calculation test according to the parameters to obtain the deposition characteristics of the solar cell, and the sample stage 5 slides on the second slide rail 8 through the second traction electric cylinder 54 and can slide to different positions according to different actual conditions.
Further, as shown in fig. 3, the dust falling device 3 includes a lunar dust storage box 31, a baffle 32, a baffle rotating motor 33, a push-pull magnet 34, and a position sensing switch 35, wherein: the moon dust storage box 31 is fixed below the fixed frame 6 without an upper cover plate and a lower bottom plate; the baffle 32 is arranged below the lunar dust storage box 31, is matched with the lunar dust storage box 31 and shields the bottom of the lunar dust storage box; the baffle plate rotating motor 33 is fixed on a strip-shaped plate on one side below the fixed frame 6, and an output shaft is connected with the baffle plate 32; the push-pull magnet 34 is fixed on the strip-shaped plate at the other side below the fixed frame 6 and can strike the lunar dust storage box 31; the position sensing switches 35 are symmetrically arranged on the lunar dust storage box 31. The lunar dust storage box 31 is a box body without a cover and a bottom, wherein the baffle 32 completely covers the bottom of the lunar dust storage box 31 and serves as a bottom plate of the lunar dust storage box, in an initial state, the baffle 32 is located right below the lunar dust storage box 31, when a test is carried out, lunar dust with a certain quality is placed in the lunar dust storage box 31, then the baffle rotating motor 33 is started, the baffle 32 below is moved away, when the position sensing switch 35 on the lunar dust storage box 31 has no trigger signal, namely the baffle 32 is completely opened, at the moment, the baffle rotating motor 33 stops rotating, the push-pull magnet 34 is controlled to be electrified to hit the lunar dust storage box, the end part of the push-pull magnet is provided with a rubber sleeve, when the lunar dust storage box 31 is hit, a buffering effect can be achieved, the lunar dust leaks out from the lunar dust storage box 31 and falls into the screening disc 45, after the lunar dust falls into the screening disc 45, the baffle rotating motor 33 is started again to rotate the baffle 32 to the position below the lunar dust storage box 31, and when the two position sensing switches 35 are triggered, the baffle rotating motor 33 stops working.
Further, as shown in fig. 4, the screening device 4 is disposed on the first slide rail 7 through a lifting bracket, and includes a lifting electric cylinder 41, a rotating motor 42, a rotating rod 43, a nylon brush 44, and a screening disk 45, wherein: one end of the lifting electric cylinder 41 is arranged on the fixed frame 6, and the other end is connected with the rotating motor 42 through a mounting plate; the rotating motor 42 is fixed on the lifting bracket, and the output shaft is connected with the rotating rod 43; one end of the rotating rod 43 is connected with an output shaft of the rotating motor 42, and the other end is connected with the nylon brush 44; the screening disc 45 is connected with a first traction electric cylinder 46 and slides along the first slide rail 7 under the driving of the first traction electric cylinder 46; the front and back sides of the screening plate 45 are provided with induction plates 9. In an initial state, the screening device 4 is located right below the dust falling device 3, when the month dust falls into the screening disc 45, the first traction electric cylinder 46 is started, the screening disc 45 slides along the first sliding rail 7, when the sensing plates 9 on the front side and the rear side of the screening disc 45 trigger the screening position switch 47 on the lifting support, the first traction electric cylinder 46 is closed, the screening disc 45 reaches the screening position at the moment, the lifting electric cylinder 41 is started after the screening disc 45 reaches the screening position, the rotating motor 42, the rotating rod 43 and the nylon brush 44 are driven to descend for a certain distance, the nylon brush 44 enters the screening disc 45, the rotating motor 42 is started after the nylon brush 44 enters the screening disc 45, the nylon brush 44 can rotatably brush the month dust particles, and the month dust is deposited on the sample platform 5 below through the screening disc filter screen.
Further, as shown in fig. 5, the sample stage 5 is disposed on the second slide rail 8 through a slide bracket, and includes a temperature sensor 51, a quartz crystal microbalance 52 and a solar cell 53, wherein: the sample table 5 is connected with a second traction electric cylinder 54 and slides along a second slide rail 8 under the driving of the second traction electric cylinder 54; the solar cell 53 is arranged at the center of the sample stage 5; the number of the quartz crystal microbalances 52 is multiple, the plurality of the quartz crystal microbalances 52 are uniformly distributed along the circumferential direction of the solar cell 53 by taking the solar cell 53 as the center, and the plurality of the quartz crystal microbalances 52 and the solar cell 53 are all in the same horizontal position; the temperature sensor 51 is attached to the back surface of the solar cell 53; the front and rear sides of the sample stage 5 are provided with induction plates 9. After the lunar dust falls into the screening disc 45, the second traction electric cylinder 54 is started to enable the sample platform 5 to slide along the second slide rail 8, when the sensing plates 9 on the front side and the rear side of the sample platform 5 trigger the screening position switch 47, the second traction electric cylinder 54 is closed, the sample platform 5 reaches the position right below the screening disc 45, the nylon brush 44 can brush out the lunar dust from the filter screen of the screening disc 45, the lunar dust is deposited on the sample platform 5 and contacts with the temperature sensor 51, the quartz crystal microbalance 52 and the solar cell. In the embodiment of the present application, the temperature sensor 51 is preferably a platinum resistance temperature sensor, the quartz crystal microbalances 52 are preferably 15MHZ quartz crystal microbalances, the number of which is preferably 6, 6 quartz crystal microbalances 52 are located on a circle with a radius of 2cm and centered on the solar cell 53, and the 6 quartz crystal microbalances are uniformly distributed on the circumference with an included angle of 60 ° in each pair.
Further, as shown in fig. 6, a dust falling position switch 36 and a screening position switch 47 are provided on the lifting bracket on the first slide rail 7. The sensing plates 9 on the front side and the rear side of the screening disk 45 can respectively trigger and sense with the dust falling position switch 36 and the screening position switch 47, when the moon dust falls, the screening disk 45 is driven to slide on the first slide rail 7 to stop at the dust falling position, namely, the moon dust storage box 31 is arranged under the moon dust storage box 31 to receive the moon dust falling in the moon dust storage box 31, when the moon dust is screened, the screening disk 45 is driven to slide on the first slide rail 7 to stop at the screening position, the nylon brush 44 is controlled to descend, and the moon dust in the screening disk 45 is brushed.
Further, as shown in fig. 7, a dust fall position switch 36, a screening position switch 47, and an illumination position switch 55 are provided on the slide holder on the second slide rail 8. The sensing plates 9 on the front and rear sides of the sample stage 5 can be triggered and sensed by the dust falling position switch 36, the screening position switch 47 and the illumination position switch 55, respectively. In an initial state, the sample stage 5 is located at an illumination position, namely, right below the observation window 11, and is used for acquiring initial parameters of each sensor on the sample stage 5, and then the sample stage 5 is driven to slide on the second slide rail 8 so as to stop at a dust falling position (according to actual test conditions, the moon dust in the moon dust storage box 31 can be directly fallen, and parameters of uneven moon dust deposition are acquired through the sample stage 5).
Further, a vacuum pump, a solar simulator and a control system are arranged outside the vacuum chamber 1. The outside of the vacuum chamber 1 can be provided with various adjusting control systems under the actual condition, the adjusting control systems are connected with the internal device through a cable interface, the driving of various motors in the vacuum chamber 1 and the acquisition and transmission analysis of various sensor data are controlled, the vacuum degree in the vacuum chamber 1 is adjusted by arranging a vacuum pump, and the illumination intensity is adjusted through a solar simulator.
Further, the temperature regulating system 2 controls the temperature in the vacuum chamber 1 to be-40 ℃ to 90 ℃. The temperature control system 2 is mainly used for adjusting the temperature inside the vacuum chamber 1, is connected with an external circulating pump and a control system through pipelines according to actual conditions, and realizes the control of the temperature inside the vacuum chamber 1 in a liquid circulation mode, wherein the temperature control range is preferably-40-90 ℃, and the temperature control precision is 0.5 ℃.
In addition, the embodiment of the application also provides a testing method applying the lunar dust deposition uniformity testing device, which comprises the following steps:
step 1: the method comprises the following steps of weighing the lunar dust, loading the lunar dust into a lunar dust storage box 31 after weighing, wherein the lunar dust storage box 31 and a screening disc 45 are located at a dust falling position, and a sample platform 5 is located at an illumination position, namely right below an observation window 11;
and 2, step: the vacuum pump was turned on to observe the change in the vacuum degree in the vacuum chamber 1, the vacuum degree being 10 -5 Keeping the vacuum degree unchanged for 30min in Pa, opening a switch of the temperature regulating system 2, keeping the temperature after the temperature reaches a temperature value required by the test, and measuring the frequency f of the quartz crystal microbalance 52 0 ；
And step 3: opening the solar simulator to enable light to irradiate the sample table 5 through the observation window 11, measuring the output current of the solar cell piece 53, and recording the current value as the no-load short-circuit output current I of the solar cell piece 53 after the current output is stable 0 Starting a second traction electric cylinder 54 to enable the sample platform 5 to slide to a dust falling position, and triggering the dust falling position switch 36 on the sliding support by the front and rear side sensing plates 9 of the sample platform 5 at the moment to enable the sample platform 5 to be positioned right below the screening disc 45;
and 4, step 4: starting a baffle rotating motor 33 in the dust falling device 3, moving away a baffle 32 below the lunar dust storage box 31, when a position sensing switch 35 on the lunar dust storage box 31 has no trigger signal, namely the baffle 32 is completely opened, stopping the rotation of the baffle rotating motor 33, striking the lunar dust storage box by electrifying a push-pull magnet 34, enabling the lunar dust to leak out of the lunar dust storage box 31 and fall into a screening disc 45, after the lunar dust falls into the screening disc 45, starting the baffle rotating motor 33 again to rotate the baffle 32 below the lunar dust storage box 31, and stopping the baffle rotating motor 33 when both the position sensing switches 35 are triggered;
and 5: after the lunar dust falls into the screening disc 45, starting the first traction electric cylinder 46 to enable the screening disc 45 to slide along the first slide rail 7, when the sensing plates 9 on the front side and the rear side of the screening disc 45 trigger a screening position switch 47 on the lifting support, closing the first traction electric cylinder 46, enabling the screening disc 45 to reach a screening position, starting the lifting electric cylinder 41 after the screening disc 45 reaches the screening position, driving the rotating motor 42, the rotating rod 43 and the nylon brush 44 to descend for a set distance h, enabling the nylon brush 44 to enter the screening disc 45, and after the nylon brush 44 enters the screening disc 45, starting the rotating motor 42 and enabling the nylon brush 44 to brush lunar dust particles to enable the lunar dust to be deposited on the sample platform 5 through a screening disc filter screen;
step 6: after the lunar dust falls into the screening disc 45, starting a second traction electric cylinder 54 to enable the sample platform 5 to slide along a second slide rail 8, when the sensing plates 9 on the front side and the rear side of the sample platform 5 trigger a screening position switch 47, closing the second traction electric cylinder 54, enabling the sample platform 5 to reach a screening position, and depositing the lunar dust on the sample platform 5 from a filter screen of the screening disc 45 by the nylon brush 44 to be in contact with the temperature sensor 51, the quartz crystal microbalance 52 and the solar cell;
and 7: according to the quartz crystal microbalance 52 incremental formula,
Δf i ＝f 0i -f mi -f ti
wherein: i =1,2,3,4,5,6; f. of 0i -the frequency at which no lunar dust initially falls, is constant; f. of mi -the frequency of monthly dust accumulation; f. of ti -frequency after temperature change; at a constant set temperature, neglecting f in the formula ti Measuring the increment of 6 quartz crystal microbalances 52 within the time interval t, and determining the difference value delta f between the increments delta f of any adjacent 2 quartz crystal microbalances dif When the mass deposition rate is less than or equal to 5 percent, the mass deposition of the lunar dust on the circumference with the solar cell 53 as the center and the radius of 2cm is judged to be uniform, at the moment, the lifting electric cylinder 41 is started, the nylon brush 44 is lifted to the outside of the screening disk 45, and if the condition is not met, the f of the 6 quartz crystal microbalances 52 at the moment is recorded m The value is taken as the initial frequency of the next time interval t, and the rotating motor 42 continues to operate until the lunar dust mass deposition is judged to be in a uniform state;
and step 8: according to the frequency-mass relation formula of the quartz crystal microbalance 52,
wherein: Δ f — frequency increment; Δ m-mass increment; natural frequency of f-quartz crystal microbalance 52The ratio; a-area of quartz crystal; rho-quartz crystal density; mu-shear modulus of the quartz wafer, calculating the mass of deposition of the lunar dust on each balance when the lunar dust is uniformly deposited i And average value of the deposition mass of the lunar dust on 6 quartz crystal microbalances 52
This value can be considered as the average mass of the deposition mass of the lunar dust on the solar cell pieces 53 in the case of uniform deposition;
and step 9: after the lunar dust quality is judged to be uniformly deposited, the second traction electric cylinder 54 is started, the sample platform 5 slides to the position right below the observation window 11 of the vacuum chamber 1 along the second slide rail 8, when the induction plates 9 on the front side and the rear side of the sample platform 5 trigger the illumination position switch 55, the sample platform 5 is in place, the second traction electric cylinder 54 is closed, and the light of the solar simulator vertically irradiates the surface of the sample platform 5 through the observation window 11;
step 10: after the lunar dust is uniformly deposited on the solar cell 53, the short-circuit current of the solar cell 53 is changed under the set illumination intensity, and the current output characteristics of the solar cell under different deposition uniformity input conditions are evaluated according to the deposition characteristics of the solar cell.
Specifically, the solar cell has the deposition characteristics of
ΔI scmi ＝I O -ΔI scTi -I i
Wherein: i is i The output short-circuit current of the solar cell 53 at the i-th moment; I.C. A 0 The no-load short-circuit output current of the solar cell 53 is a constant value; delta I scmi -the amount of change in short circuit current after the accumulation of lunar dust at time i; delta I scTi The increase of the short-circuit current after the temperature of the solar cell 53 changes at the ith time, wherein:
wherein: a-temperature coefficient of the selected solar cell 53; a-the area of the selected solar cell 53; t is i The solar cell sheet 53 temperature at the i-th moment; t is i+1 The temperature of the solar cell 53 at the i +1 th moment with a time interval of 1s;
measuring the output short-circuit current I of the solar panel at a certain moment and the temperature T of the solar cell 53 within a time interval of 1s i And T i+1 The short-circuit current increment Δ I of the solar cell 53 after the temperature change at that time is calculated according to a formula scT Finally, the average mass of the lunar dust deposition mass on the solar panel is obtained
At this time, the short-circuit current value Δ I of the solar cell 53 scm ，ΔI scm ＝I 0 -ΔI scT -I；
Repeated tests can obtain the current output characteristics of the solar cell under different lunar dust deposition qualities and different temperature conditions, the short-circuit current I in different deposition qualities m is fitted, and a functional relation of the lunar dust deposition quality and the output short-circuit current of the solar cell 53, namely m = f (I), can be obtained.
The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (9)
1. The utility model provides a be used for lunar dust deposition uniformity testing arrangement, its characterized in that includes vacuum chamber, temperature regulation and control system, dust falling device, sieving mechanism and sample platform, wherein:
the temperature regulating system, the dust falling device, the screening device and the sample table are all arranged in the vacuum chamber;
the top of the vacuum chamber is provided with an observation window, and the outside of the vacuum chamber is provided with a plurality of interfaces;
a support frame is arranged in the vacuum chamber along the vertical direction, and a fixed frame, a first slide rail and a second slide rail are sequentially arranged from top to bottom along the horizontal direction of the support frame;
the dust falling device is arranged on the fixing frame;
the screening device is arranged on the first slide rail and can slide on the first slide rail through a first traction electric cylinder;
the sample table is arranged on the second slide rail and can slide on the second slide rail through a second traction electric cylinder;
the temperature regulation and control system is arranged on the side wall of the vacuum chamber.
2. The apparatus for testing uniformity of lunar dust deposition as claimed in claim 1, wherein the dust falling apparatus comprises a lunar dust storage box, a baffle rotating motor, a push-pull magnet, and a position sensing switch, wherein:
the lunar dust storage box is fixed below the fixing frame and is not provided with an upper cover plate and a lower bottom plate;
the baffle is arranged below the lunar dust storage box, is matched with the lunar dust storage box and shields the bottom of the lunar dust storage box;
the baffle rotating motor is fixed on the strip-shaped plate on one side below the fixed frame, and an output shaft is connected with the baffle;
the push-pull magnet is fixed on the strip-shaped plate on the other side below the fixing frame and can strike the lunar dust storage box;
the position sensing switches are symmetrically arranged on the lunar dust storage box.
3. The apparatus for testing the uniformity of lunar dust deposition as claimed in claim 2, wherein the screening apparatus is disposed on the first sliding rail through a lifting bracket, and comprises a lifting electric cylinder, a rotating motor, a rotating rod, a nylon brush and a screening disk, wherein:
one end of the lifting electric cylinder is arranged on the fixed frame, and the other end of the lifting electric cylinder is connected with the rotating motor through a mounting plate;
the rotating motor is fixed on the lifting bracket, and an output shaft is connected with the rotating rod;
one end of the rotating rod is connected with an output shaft of the rotating motor, and the other end of the rotating rod is connected with the nylon brush;
the screening disc is connected with the first traction electric cylinder and slides along the first slide rail under the driving of the first traction electric cylinder;
the front side and the rear side of the screening disc are provided with induction plates.
4. The lunar dust deposition uniformity testing device according to claim 3, wherein the sample stage is arranged on the second slide rail through a sliding support, and comprises a temperature sensor, a quartz crystal microbalance and a solar cell, wherein:
the sample table is connected with the second traction electric cylinder and slides along the second slide rail under the driving of the second traction electric cylinder;
the solar cell is arranged in the center of the sample stage;
the number of the quartz crystal microbalances is multiple, the plurality of the quartz crystal microbalances are uniformly distributed along the circumferential direction of the solar cell piece by taking the solar cell piece as a center, and the plurality of the quartz crystal microbalances and the solar cell piece are positioned at the same horizontal position;
the temperature sensor is attached to the back surface of the solar cell;
the front side and the rear side of the sample table are provided with induction plates.
5. The apparatus according to claim 3, wherein a dust falling position switch and a screening position switch are disposed on the lifting bracket of the first slide rail.
6. The apparatus for testing uniformity of lunar dust deposition as defined in claim 4, wherein a dust falling position switch, a screening position switch and an illumination position switch are disposed on the sliding bracket on the second sliding rail.
7. The apparatus for testing uniformity of lunar dust deposition as claimed in claim 1, wherein a vacuum pump, a solar simulator and a control system are provided outside the vacuum chamber.
8. The apparatus for testing uniformity of lunar dust deposition as claimed in claim 1, wherein said temperature regulation system controls the temperature in said vacuum chamber to be-40 ℃ to 90 ℃.
9. A test method using the apparatus for testing uniformity of lunar dust deposition as claimed in any one of claims 1 to 8, comprising the steps of:
step 1: weighing the lunar dust, and then loading the lunar dust into a lunar dust storage box, wherein the lunar dust storage box and a screening disc are located at a dust falling position, and a sample table is located at an illumination position, namely right below an observation window;
and 2, step: opening a vacuum pump, observing the change of the vacuum degree in the vacuum chamber, keeping the vacuum degree unchanged for 30min when the vacuum degree is 10-5Pa, opening a switch of a temperature regulation system, keeping the temperature after the temperature reaches a temperature value required by the test, and measuring the frequency of the quartz crystal microbalance;
and step 3: opening the solar simulator to enable light to irradiate the sample stage through the observation window, measuring the output current of the solar cell, recording the current value as the no-load short-circuit output current of the solar cell after the current output is stable, starting a second traction electric cylinder to enable the sample stage to slide to a dust falling position, and triggering dust falling position switches on a sliding support by the front and rear side induction plates of the sample stage at the moment to enable the sample stage to be located under a screening disc;
and 4, step 4: starting a baffle rotating motor in the dust falling device, moving away a baffle below a lunar dust storage box, when a position sensing switch on the lunar dust storage box has no trigger signal, namely the baffle is completely opened, stopping the rotation of the baffle rotating motor, striking the lunar dust storage box by electrifying a push-pull magnet, enabling lunar dust to leak out of the lunar dust storage box and fall into a screening disc, starting the baffle rotating motor again to rotate the baffle below the lunar dust storage box after the lunar dust falls into the screening disc, and stopping the baffle rotating motor when the two position sensing switches are triggered;
and 5: after the lunar dust falls into the screening disc, starting a first traction electric cylinder to enable the screening disc to slide along a first slide rail, when sensing plates on the front side and the rear side of the screening disc trigger a screening position switch on a lifting support, closing the first traction electric cylinder, enabling the screening disc to reach a screening position at the moment, starting the lifting electric cylinder after the screening disc is in place, driving a rotating motor, a rotating rod and a nylon brush to descend for a set distance, enabling the nylon brush to enter the screening disc, starting the rotating motor after the nylon brush enters the screening disc, and enabling the nylon brush to brush lunar dust particles to enable the lunar dust to be deposited on a sample platform through a screen of the screening disc;
step 6: after the lunar dust falls into the screening disc, starting a second traction electric cylinder to enable the sample platform to slide along a second slide rail, closing the second traction electric cylinder when the sensing plates on the front side and the rear side of the sample platform trigger a screening position switch, enabling the sample platform to reach a screening position, depositing the lunar dust on the sample platform from a filter screen of the screening disc by using a nylon brush, and enabling the lunar dust to be in contact with a temperature sensor, a quartz crystal microbalance and an electric solar cell;
and 7: according to a quartz crystal microbalance increment formula, calculating whether the deposition of the lunar dust mass on the sample platform is uniform, if so, starting a lifting electric cylinder, and lifting a nylon brush to the outside of a screening disc;
and 8: according to a relation formula of the frequency and the mass of the quartz crystal microbalance, calculating the average value of the deposition mass of the lunar dust on each quartz crystal microbalance and the deposition mass of the lunar dust on a plurality of quartz crystal microbalances when the lunar dust is uniformly deposited, and taking the value as the average mass of the deposition mass of the lunar dust on the solar cell sheet under the condition of uniform deposition;
and step 9: after the lunar dust quality is judged to be uniformly deposited, a second traction electric cylinder is started to enable the sample platform to slide to the position right below an observation window of the vacuum chamber along a second slide rail, when the induction plates on the front side and the rear side of the sample platform trigger an illumination position switch, the sample platform is in place, the second traction electric cylinder is closed, and light rays of the solar simulator penetrate through the observation window to vertically irradiate the surface of the sample platform;
step 10: after the lunar dust is uniformly deposited on the solar cell, the short-circuit current of the solar cell changes under the set illumination intensity, and the current output characteristics of the solar cell under different deposition uniformity input conditions are evaluated according to the deposition characteristics of the solar cell.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116656155A (en) * | 2023-05-22 | 2023-08-29 | 兰州空间技术物理研究所 | Solar cell surface moon dust protective coating, preparation method thereof and dust prevention efficiency evaluation method |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10132445A1 (en) * | 2001-06-06 | 2002-12-12 | Rag Ag | Device for operation of dust measurement machines especially in explosive or underground areas of coal mines uses a suction pressure to operate a probe sampling head so that an electrical connection is not required |
| DE10140426A1 (en) * | 2001-08-17 | 2003-03-13 | Mars Inc | Device and method for investigating the dusting behavior of substances |
| US7872750B1 (en) * | 2008-09-30 | 2011-01-18 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Space radiation detector with spherical geometry |
| CN102435664A (en) * | 2011-10-20 | 2012-05-02 | 中国航天科技集团公司第五研究院第五一〇研究所 | Inflight measurement device and method for moon surface dust accumulated mass |
| CN104229162A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Solar cell probe calibration method for lunar dust measurement instrument |
| CN107860690A (en) * | 2017-10-26 | 2018-03-30 | 华南农业大学 | A kind of device and method for detecting agricultural unmanned plane spraying droplet deposition uniformity |
| CN108262078A (en) * | 2018-02-13 | 2018-07-10 | 中国科学院西安光学精密机械研究所 | Lunar dust environment simulation test device and method |
| CN109417039A (en) * | 2016-06-20 | 2019-03-01 | 应用材料公司 | Wafer processing apparatus with Capacitive microsensor |
| CN112113877A (en) * | 2020-07-30 | 2020-12-22 | 上海绿蒂智能科技有限公司 | Dust collecting device, dust fall weighing system who contains this dust collecting device |
| CN112161899A (en) * | 2020-07-30 | 2021-01-01 | 上海绿蒂智能科技有限公司 | Dust fall measuring instrument and measuring method thereof |
| CN112185833A (en) * | 2019-07-01 | 2021-01-05 | 应用材料公司 | Real-time detection of particulate matter during deposition chamber fabrication |
| CN113345309A (en) * | 2021-05-07 | 2021-09-03 | 哈尔滨工业大学 | Lunar dust sprinkling device for lunar multi-factor comprehensive environment simulation |
| CN114674917A (en) * | 2022-03-25 | 2022-06-28 | 兰州空间技术物理研究所 | Lunar dust deposition quality in-situ detector and manufacturing method thereof |
-
2022
- 2022-09-19 CN CN202211140686.5A patent/CN115683963B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10132445A1 (en) * | 2001-06-06 | 2002-12-12 | Rag Ag | Device for operation of dust measurement machines especially in explosive or underground areas of coal mines uses a suction pressure to operate a probe sampling head so that an electrical connection is not required |
| DE10140426A1 (en) * | 2001-08-17 | 2003-03-13 | Mars Inc | Device and method for investigating the dusting behavior of substances |
| US7872750B1 (en) * | 2008-09-30 | 2011-01-18 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Space radiation detector with spherical geometry |
| CN102435664A (en) * | 2011-10-20 | 2012-05-02 | 中国航天科技集团公司第五研究院第五一〇研究所 | Inflight measurement device and method for moon surface dust accumulated mass |
| CN104229162A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Solar cell probe calibration method for lunar dust measurement instrument |
| CN109417039A (en) * | 2016-06-20 | 2019-03-01 | 应用材料公司 | Wafer processing apparatus with Capacitive microsensor |
| CN107860690A (en) * | 2017-10-26 | 2018-03-30 | 华南农业大学 | A kind of device and method for detecting agricultural unmanned plane spraying droplet deposition uniformity |
| CN108262078A (en) * | 2018-02-13 | 2018-07-10 | 中国科学院西安光学精密机械研究所 | Lunar dust environment simulation test device and method |
| CN112185833A (en) * | 2019-07-01 | 2021-01-05 | 应用材料公司 | Real-time detection of particulate matter during deposition chamber fabrication |
| CN112113877A (en) * | 2020-07-30 | 2020-12-22 | 上海绿蒂智能科技有限公司 | Dust collecting device, dust fall weighing system who contains this dust collecting device |
| CN112161899A (en) * | 2020-07-30 | 2021-01-01 | 上海绿蒂智能科技有限公司 | Dust fall measuring instrument and measuring method thereof |
| CN113345309A (en) * | 2021-05-07 | 2021-09-03 | 哈尔滨工业大学 | Lunar dust sprinkling device for lunar multi-factor comprehensive environment simulation |
| CN114674917A (en) * | 2022-03-25 | 2022-06-28 | 兰州空间技术物理研究所 | Lunar dust deposition quality in-situ detector and manufacturing method thereof |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116656155A (en) * | 2023-05-22 | 2023-08-29 | 兰州空间技术物理研究所 | Solar cell surface moon dust protective coating, preparation method thereof and dust prevention efficiency evaluation method |
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