CN115389910A - A burn-in experiment board structure and its high-temperature dynamic burn-in system for integrated circuits - Google Patents

Abstract

The invention discloses an aging experiment board structure and its integrated circuit high-temperature dynamic aging system, and relates to the technical field of integrated circuit board testing. slot, and each power slot is provided with a power connection positioning structure, and each power connection positioning structure is electrically connected to a controller for detecting the working state of the corresponding integrated circuit board, and the controller is electrically connected for power supply The wireless power supply block, the controller is provided with a wireless module for controlling the wireless interaction of the terminal. The present invention uses the gravity of the integrated circuit board itself to fix it, so it is more labor-saving when plugged in and helps to improve the detection efficiency. In addition, the present application By constructing a piston-type moving structure, the high-temperature chamber of the test is guaranteed to be closed from the outside world, which reduces the heat loss caused by feeding and discharging, and also reduces the cost, with strong practicability.

Description

A burn-in experiment board structure and its high-temperature dynamic burn-in system for integrated circuits

technical field

The invention relates to the technical field of integrated circuit board testing, in particular to an aging test board structure and an integrated circuit high temperature dynamic aging system.

Background technique

An integrated circuit is a microelectronic device or component that uses a certain process to interconnect components such as transistors, resistors, capacitors, and inductors required in a circuit, and interconnects them together to form a small or several small semiconductor chips or chips. Dielectric substrate, and then encapsulated in a package, to become a microstructure with the required circuit function, the existing integrated circuit needs to be tested before use, to ensure the quality of the integrated circuit board, but the dust collection circuit board in the wiring During the process, the user needs to connect the circuit to the burn-in board by screwing or welding. Since the burn-in platform needs to perform high-temperature burn-in tests on a large number of integrated circuits at the same time, the key is to ensure the stability of the power connection. It is very hard to plug in the integrated circuit, so the wiring of the integrated circuit needs to consume a lot of time for the user, thereby reducing the work efficiency of the burn-in platform. Based on this, we now provide a burn-in test board structure and its integrated circuit high-temperature dynamic burn-in The system can eliminate the disadvantages of existing devices.

Contents of the invention

The object of the present invention is to provide a burn-in test board structure and its high-temperature dynamic burn-in system for integrated circuits, so as to solve the problems in the background technology.

To achieve the above object, the present invention provides the following technical solutions:

A burn-in experiment board structure, including a board body and an electric slot arranged on its upper end for inserting an integrated circuit board to be tested, each electric slot is provided with an electrical connection positioning structure, and each electrical connection positioning structure Both are electrically connected to a controller for detecting the working state of the corresponding integrated circuit board, the controller is electrically connected to a wireless power supply block for power supply, and the controller is provided with a wireless module for controlling wireless interaction of terminals.

On the basis of the above technical solutions, the present invention also provides the following optional technical solutions:

In an optional solution: the power connection positioning structure includes grooves arranged on the left and right inner sides of the wireless power supply block, a sliding frame is slidably provided in each groove, and a guide is provided at the outer end of each sliding frame rod, the guide rod is slidably set with the guide hole on the groove, the guide rod and the inner bottom of the guide hole are connected and fixed by a return spring, each of the upper ends of the sliding frame is provided with a The surface of the clamping positioning block is tightly pressed. Each clamping positioning block is provided with a movable contact that is in contact with the electrical contact of the integrated circuit board. Each movable contact is provided with a contact that is electrically connected to the controller. For the electric terminal, a load-bearing slider for supporting the bottom of the integrated circuit board is horizontally arranged in the plug-in slot, and the two ends of the load-bearing slider are slidably set with the inner wall of the groove respectively, and the left and right sides of the load-bearing slider are respectively set There is a side chute, and the side chute is slidably matched with the sliding frame. The lower end of the bearing slider is provided with a V-shaped guide chute extending upward. contact with the transmission against the lever.

In an optional solution: the upper end of the transmission resisting rod has an arc surface structure.

In an optional solution: a tapered hole is provided in the middle of the bottom of the board.

A high-temperature dynamic aging system for integrated circuits, including a test box and a heating block arranged inside it for heating, a thermometer for detecting temperature is also provided inside the test box, and a sealing block is provided at the bottom of the test box block, a piston chamber is provided in the middle of the upper end of the blocking block, and a lifting loading block is provided at the position of the piston chamber, and an experimental inner chamber is provided on the left and right sides of the lifting loading block to facilitate the placement of the experimental plate structure. The left and right sides of the test box and the blocking block are provided with openings corresponding to the experimental inner cavity, a feed horizontal plate is provided on the test box on the left side of the opening, and a feeding horizontal plate is provided on the test box on the right side of the opening. The unloading horizontal plate, the feeding horizontal plate and the unloading horizontal plate are used to carry the experimental plate structure, and the feeding horizontal plate is provided with a feeding mechanism for pushing the experimental plate structure into the experimental inner cavity. The bottom of the chamber is equipped with a wireless charging module for powering the experimental board structure. There are two wireless charging modules, which are symmetrically arranged on both sides of the experimental inner chamber. The experimental inner chamber between the two wireless charging modules is equipped with a A fine-tuning mechanism for adjusting the position of the experimental plate structure, and the lifting and lowering loading block is connected with a lifting mechanism for driving its up and down movement.

In an optional solution: the lifting mechanism includes a transmission screw horizontally arranged at the bottom of the test box, and the transmission screw is provided with two threaded areas with different screw directions, and each threaded area is equipped with a Traction sliders, each traction slider is slidingly arranged on the top of the test box, the left end of the transmission screw is connected to the traction motor for driving it to rotate, the right end of the transmission screw is connected to the inner wall of the test box for rotation, each traction slider The lower ends are all rotatably provided with a connecting rod, and the lower ends of each connecting rod are rotatably connected with a hanging block, and the hanging block is arranged on the upper end of the lifting and lowering loading block.

In an optional solution: the fine-tuning mechanism includes an installation cavity arranged on the bottom plate of the experimental inner cavity, a lifting push rod is installed on the bottom plate of the installation cavity, and a conical positioning block is provided at the output end of the lifting push rod , the tapered positioning block cooperates with the tapered hole at the bottom of the experimental plate structure.

In an optional solution: the feeding mechanism includes a pusher block slidably arranged on the feed horizontal plate, the pusher block is screwed on the feed screw, and one end of the feed screw is rotatably connected to the fixed block on the inner wall of the test box , the other end of which is connected to a feeding motor for driving it to rotate.

Compared with the prior art, the beneficial effects of the present invention are as follows:

The present invention uses the gravity of the integrated circuit board itself to fix it, so it saves more labor when plugging in, which helps to improve the detection efficiency. In addition, the application ensures that the high-temperature chamber for testing is sealed from the outside world by building a piston-type moving structure, reducing the The heat loss caused by feeding and discharging also reduces the cost and has strong practicability.

Description of drawings

Fig. 1 is a structural schematic diagram of the aging test plate of the present invention.

Fig. 2 is a partially enlarged view of the structure of the aging test plate structure of the present invention.

Fig. 3 is a schematic structural diagram of the integrated circuit high-temperature dynamic aging system in the present invention.

Fig. 4 is a schematic diagram of the internal structure of the integrated circuit high temperature dynamic aging system in the present invention.

Notes on reference signs: test box 11, transmission screw 12, connecting rod 13, traction slider 14, traction motor 15, heating block 16, integrated circuit board 17, experimental board structure 18, feed horizontal plate 19, push material block 20 , installation cavity 21, lifting push rod 22, conical positioning block 23, experiment inner cavity 24, unloading horizontal plate 25, blocking block 26, lifting loading block 27, hanging block 28;

Plate body 29, guide chute 30, guide hole 31, guide rod 32, sliding frame 33, clamping positioning block 34, plug-in slot 35, bearing slider 36, controller 37, wireless power supply block 38, transmission pressing rod 39.

Detailed ways

In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

In one embodiment, as shown in FIGS. 1-2 , a burn-in test board structure includes a board body 29 and an electrical plug slot 35 arranged at its upper end for inserting an integrated circuit board to be tested, and each plug There is a power connection positioning structure in the slot 35, and each power connection positioning structure is electrically connected to a controller 37 for detecting the working state of the corresponding integrated circuit board, and the controller 37 is electrically connected to a wireless power supply for power supply. Block 38, the controller 37 is provided with a wireless module for controlling the wireless interaction of the terminal, so that when the integrated circuit board in the corresponding power slot 35 is in poor working condition, the controller 37 will pass the wireless module to the corresponding integrated circuit board. The number is sent to the control terminal so that unqualified products can be eliminated later;

The power connection positioning structure includes grooves arranged on the left and right sides of the wireless power supply block 38, and a sliding frame 33 is slidably arranged in each groove, and a guide rod 32 is provided at the outer end of each sliding frame 33. The guide rod 32 is slidably arranged with the guide hole 31 on the groove. The guide rod 32 and the inner bottom of the guide hole 31 are connected and fixed by a return spring. The upper end of each sliding frame 33 is provided with a The clamping positioning block 34 that the surface of the board is tightly pressed contacts, and each clamping positioning block 34 is provided with a movable contact that is in contact with the electric contact of the integrated circuit board, and each movable contact is provided with a controller 37 electric contacts. The electrical connection end of the sex connection, a load-bearing slider 36 for supporting the bottom of the integrated circuit board is horizontally provided in the plug-in slot 35, and the two ends of the load-bearing slider 36 are slidably set with the inner wall of the groove respectively, and the load-bearing slider 36 is arranged to slide with the groove inner wall respectively. The left and right sides of the slider 36 are provided with a side chute respectively, and the side chute is slidingly matched with the sliding frame 33. The lower end of the bearing slider 36 is provided with an upwardly extending V-shaped guide chute 30, and the lower end of each sliding frame 33 All are provided with a transmission pressing rod 39 that is in pressure contact with the slope of the guide chute 30, and the upper end of the transmission pressing rod 39 is an arc surface structure;

In the initial state, due to the lack of gravity of the bearing slide block 36 itself, under the action of the back-moving spring, the two sliding frames 33 are far away from the setting, and the two clamping positioning blocks 34 at this time are separated. When the integrated circuit board is used, under the action of gravity, the bearing slider 36 falls down. Under the guidance of the inclined surface of the guide chute 30, the two transmission pressing rods 39 will pull the two sliding frames 33 close. At this time, the clip on the upper end of the sliding frame 33 Holding the positioning block 34 will clamp and fix both sides of the integrated circuit board, and the movable contact on the clamping positioning block 34 will also contact the electric contact on the integrated circuit board, so that the integrated circuit board is connected to electricity. The plug-in method is fixed by the gravity of the integrated circuit board itself, so it is more labor-saving when plugging in, which helps to improve the detection efficiency;

A tapered hole is provided at the middle of the bottom of the plate body 29, and the tapered hole is used to adjust the position of the plate body 29;

In one embodiment, as shown in Figures 3-4, a high-temperature dynamic aging system for integrated circuits includes a test box 11 and a heating block 16 arranged inside it for heating, and the inside of the test box 11 is also provided with There is a thermometer for detecting the temperature, and a plugging block 26 is arranged at the inner bottom of the test box 11, and a piston cavity is arranged at the middle position of the upper end of the blocking block 26, and a lifting and lowering loading block 27 is arranged at the position of the piston cavity, The left and right sides of the lift loading block 27 are provided with an experimental inner chamber 24 that is convenient for the placement of the experimental plate structure, and the left and right sides of the test box 11 and the blocking block 26 are provided with openings corresponding to the experimental inner chamber 24. The test box 11 on the left side of the opening is provided with a feed horizontal plate 19, and the test box 11 on the right side of the opening is provided with a discharge horizontal plate 25, the feed horizontal plate 19 and the discharge horizontal plate 25 are used For carrying the experimental board structure, the feeding horizontal plate 19 is provided with a feeding mechanism for pushing the experimental board structure 18 into the experimental inner chamber 24, and the bottom of the experimental inner chamber 24 is provided with a power supply for the experimental board structure. There are two wireless charging modules, and the wireless charging modules are arranged symmetrically on both sides of the experimental inner cavity 24. The experimental inner cavity 24 between the two wireless charging modules is provided with a fine-tuning mechanism for adjusting the position of the experimental board structure. The lifting loading block 27 is connected to a lifting mechanism for driving it to move up and down;

The lifting mechanism includes a drive screw 12 horizontally arranged at the bottom of the test box 11. The drive screw 12 is provided with two threaded areas with different screw directions, and each threaded area is equipped with a traction slider 14. Each traction slider 14 is slidably arranged on the top of the test box 11. The left end of the transmission screw 12 is connected to the traction motor 15 for driving it to rotate, and the right end of the transmission screw 12 is connected to the inner wall of the test box 11. Slide block 14 lower ends all rotate and are provided with a connecting rod 13, and each connecting rod 13 lower ends are all rotatably connected with hanger block 28, and described hanger block 28 is arranged on lifting material block 27 upper ends, like this, drives traction slide by traction motor 15. The block 14 rotates relative to the drive screw 12, and under the action of the screw thread, the two traction sliders 14 are separated, so that under the pull of the connecting rod 13, the lifting loading block 27 will be pulled out from the piston chamber, otherwise, the lifting loading Block 27 will re-enter the piston cavity;

The fine-tuning mechanism includes an installation cavity 21 arranged on the bottom plate of the experimental inner cavity 24, and a lifting push rod 22 is installed on the bottom plate of the installation cavity 21, and a conical positioning block 23 is provided at the output end of the lifting push rod 22, so that The tapered positioning block 23 cooperates with the tapered hole at the bottom of the experimental board structure. When adjusting, the tapered positioning block 23 is driven upward by the lifting push rod 22, and the tip of the tapered positioning block 23 acts on the tapered hole. When the tapered positioning block 23 fits perfectly with the tapered hole, the structural position of the experimental board is adjusted to the middle, and the wireless charging is just right at this time, and the charging performance is the best;

The feeding mechanism includes a pusher block 20 slidably arranged on the feed horizontal plate 19, and the pusher block 20 is screwed on the feed screw, one end of the feed screw is rotationally connected with the fixed block on the inner wall of the test box 11, and the other end is Connect the feeding motor used to drive its rotation. Under the action of the feeding motor, the pusher block 20 and the feed horizontal plate 19 rotate relatively. Under the action of the thread, the experimental plate structure will be pushed by the pusher block 20 along the feed The horizontal plate 19 slides into the experimental inner cavity 24, and can also be released from the experimental inner cavity 24 on the unloading horizontal plate 25;

The above embodiment discloses a aging test board structure and its integrated circuit high-temperature dynamic aging system, wherein, in actual use, when the integrated circuit board is inserted into the plug-in slot 35, under the action of gravity, the bearing slider 36 Falling, under the guidance of the inclined surface of the guide chute 30, the two transmission pressure rods 39 will pull the two sliding frames 33 close, at this time, the clamping positioning block 34 on the upper end of the sliding frame 33 will clamp and fix the two sides of the integrated circuit board , and the movable contact on the clamping positioning block 34 will also contact the electric contact on the integrated circuit board, so that the integrated circuit board is connected to electricity;

The internal temperature of the test box 11 is heated to the target temperature by the heating block 16, and the experimental board structure filled with integrated circuit boards is placed on the feeding horizontal plate 19, and then sent into the experimental inner cavity 24 by the feeding mechanism, and adjusted by the fine-tuning mechanism. Fine-tune the structure of the experimental board to ensure that the wireless charging is in the best working state, and then pull the lifting loading block 27 upwards through the lifting mechanism, so that the integrated circuit board works at high temperature, and the test data is transmitted to the control terminal. After the experiment is completed, the processing The lifting loading block 27 is sent into the piston cavity, and then the experimental plate structure is pushed to the discharge horizontal plate 25 by the feeding mechanism, thereby completing the discharge.

The above is only a specific implementation of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Anyone skilled in the art can easily think of changes or substitutions within the technical scope of the present disclosure. should fall within the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure should be determined by the protection scope of the claims.

Claims (8)

1. The utility model provides a burn-in experiment plate structure, its characterized in that, including plate body (29) and set up and be used for inserting the plug-in groove (35) of awaiting measuring integrated circuit board at its upper end, all be equipped with one in every plug-in groove (35) and connect electric location structure, every connects electric location structure all electric connection and is used for detecting controller (37) of corresponding integrated circuit board operating condition, controller (37) electric connection is used for the wireless power supply piece (38) of power supply, be equipped with the wireless interactive wireless module of control terminal on controller (37).

2. The aging test board structure according to claim 1, wherein the electric connection positioning structure comprises grooves arranged on the left and right inner sides of the wireless power supply block (38), a sliding frame (33) is slidably arranged in each groove, a guide rod (32) is arranged at the outer end of each sliding frame (33), the guide rod (32) is slidably arranged with a guide hole (31) in each groove, the guide rod (32) is fixedly connected with the inner bottom of the guide hole (31) through a return spring, a clamping positioning block (34) for being in pressing contact with the surface of the integrated circuit board is arranged at the upper end of each sliding frame (33), a movable contact point in contact with the electric contact point of the integrated circuit board is arranged on each clamping positioning block (34), each movable contact point is provided with an electric connection end electrically connected with the controller (37), a bearing sliding block (36) for supporting the bottom of the integrated circuit board is horizontally arranged in the electric insertion groove (35), two ends of the bearing sliding block (36) are respectively slidably arranged with the inner wall of each groove, a side sliding groove is respectively arranged on the left and right sides of the bearing sliding block (36), a sliding groove is provided with a sliding groove, a sliding groove (33) matched with a sliding groove, a sliding groove (30) for guiding a sliding groove (39) for guiding the lower end of a sliding groove (30) extending upwards abutting against a pressing rod.

3. The aging test board structure according to claim 2, wherein the upper end of the transmission pressing rod (39) is of a cambered surface structure.

4. The aging test board structure and the integrated circuit high-temperature dynamic aging system thereof as set forth in claim 1, wherein a tapered hole is provided at a middle position of the bottom of the board body (29).

5. An integrated circuit high temperature dynamic burn-in system comprising the burn-in experiment board structure of claim 4, characterized in that, still include test box (11) and set up in its inside heating block (16) that is used for the heating, the inside thermometer that is used for detecting the temperature that still is equipped with of test box (11), the bottom is equipped with a blocking piece (26) in test box (11), blocking piece (26) upper end intermediate position is equipped with a piston chamber, and this piston chamber position is equipped with a lift carrier block (27), the experiment inner chamber (24) that the experiment board structure of being convenient for was placed are seted up to lift carrier block (27) left and right sides, test box (11) and blocking piece (26) left and right sides are seted up and are tested the corresponding opening of inner chamber (24), are equipped with a feeding diaphragm (19) on test box (11) of opening left side, are equipped with a diaphragm (25) of unloading on test box (11) on opening right side, feeding diaphragm (19) and unloading diaphragm (25) are used for bearing the experiment board structure, be equipped with the wireless power supply module (24) that is used for promoting experiment board structure (18) to get into experiment board structure, be equipped with wireless charging experiment module and carry out wireless charging to the wireless charging experiment module (24) and be equipped with two interior chamber (24) and the wireless charging module (24) that the wireless for the experiment board structure of being equipped with the experiment both sides that the experiment board structure of being equipped with the wireless And the lifting loading block (27) is connected with a lifting mechanism for driving the lifting loading block to move up and down.

6. The integrated circuit high-temperature dynamic ageing system according to claim 5, wherein the lifting mechanism comprises a transmission screw (12) horizontally arranged at the bottom in the test box (11), the transmission screw (12) is provided with two threaded zones with different thread turning directions, each threaded zone is provided with a traction slider (14) in a matching manner, each traction slider (14) is arranged at the top in the test box (11) in a sliding manner, the left end of the transmission screw (12) is connected with a traction motor (15) for driving the transmission screw to rotate, the right end of the transmission screw (12) is rotatably connected with the inner wall of the test box (11), the lower end of each traction slider (14) is rotatably provided with a connecting rod (13), the lower end of each connecting rod (13) is rotatably connected with a hanging block (28), and the hanging block (28) is arranged at the upper end of the lifting load block (27).

7. The high-temperature dynamic aging system of integrated circuits as claimed in claim 5, wherein the fine-tuning mechanism includes a mounting cavity (21) disposed on the bottom plate of the experimental cavity (24), a lifting push rod (22) is mounted on the bottom plate of the mounting cavity (21), a tapered positioning block (23) is disposed at the output end of the lifting push rod (22), and the tapered positioning block (23) is fitted with a tapered hole at the bottom of the experimental plate structure (18).

8. The integrated circuit high-temperature dynamic aging system according to claim 5, wherein the feeding mechanism comprises a material pushing block (20) slidably arranged on the feeding cross plate (19), the material pushing block (20) is in threaded fit with a feeding screw rod, one end of the feeding screw rod is rotatably connected with a fixed block on the inner wall of the test box (11), and the other end of the feeding screw rod is connected with a feeding motor for driving the feeding screw rod to rotate.

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