CN115219777A - Current testing device - Google Patents

Abstract

The invention discloses a current test device which comprises a first switch and at least two shunt units, wherein the first switch is used for being connected in series in a loop to be tested during testing, each shunt unit of the at least two shunt units comprises a shunt and a second switch, the shunt and the second switch are connected in series and then are connected in parallel with the first switch, different shunts have different ranges, and the shunt with the corresponding range is connected into the loop to be tested by controlling the connection or disconnection of the first switch and the second switch so as to obtain the current value of the loop to be tested through the shunt. Therefore, high-precision testing of current can be achieved, and after the circuit is connected for one time, the current divider with different measuring ranges can be switched to safely and quickly under the condition of no power failure, and testing efficiency is greatly improved.

Description

Current test equipment

technical field

The invention relates to the technical field of current testing, in particular to a current testing device.

Background technique

Usually, when testing working current and quiescent current, since the measured currents are different and unpredictable, a large-range shunt should be used to measure the current during the current test. After the actual required range is determined, power off and replace Remeasure for the shunt of the actual desired range. This method needs to replace the shunt in the case of power failure, which not only does not conform to the test process, but also is cumbersome and inefficient.

SUMMARY OF THE INVENTION

The present invention aims to solve one of the technical problems in the related art at least to a certain extent. Therefore, the purpose of the present invention is to provide a current test device, which can not only realize high-precision current test, but also can switch to shunts of different ranges safely and quickly under the condition of uninterrupted power after one line connection. , greatly improving the test efficiency.

In order to achieve the above purpose, an embodiment of the present invention proposes a current testing device, including: a first switch and at least two shunt units, the first switch is used to be connected in series in the circuit to be tested during testing, and the at least two shunt units are Each shunt unit includes a shunt and a second switch, and the shunt and the second switch are connected in parallel with the first switch after being connected in series, and different shunts have different ranges. Turn on or off to connect the shunt of the corresponding range to the circuit to be tested, so as to obtain the current value of the circuit to be tested through the shunt.

According to the current testing device of the embodiment of the present invention, by connecting the first switch in series in the circuit to be tested, and connecting the shunt and the second switch of each shunt unit in the at least two shunt units in series and then in parallel with the first switch, And by controlling the on or off of the first switch and the second switch, the shunt of the corresponding range is connected to the loop to be tested, so as to obtain the current value of the loop to be tested through the shunt. As a result, not only can the high-precision current test be achieved, but also after a line is connected, it can be switched to shunts of different ranges safely and quickly without interruption, which greatly improves the test efficiency.

According to an embodiment of the present invention, the above-mentioned current testing device further includes a controller, which is connected to the first switch, the second switch and the shunt, respectively, and is used to control the turn-on or turn-off of the first switch and the second switch , and obtain the current value of the shunt.

According to an embodiment of the present invention, the controller is specifically configured to: after the circuit to be tested is turned on, first control the second switch corresponding to the shunt with the largest range to be in the closed state, and then control the first switch to be in the open state, so as to Connect the shunt with the maximum range to the circuit to be tested; obtain the current value of the shunt with the maximum range, and determine the target range of the loop to be tested according to the current value; obtain the shunt with the target range, and first control the shunt with the target range The second switch corresponding to the shunt is in the closed state, and then the second switch corresponding to the shunt with the largest range is controlled to be in the open state, so that the shunt with the target range is connected to the circuit to be tested, and the shunt with the target range is obtained. The current value of the device is used as the current value of the circuit to be tested.

According to an embodiment of the present invention, the controller is further specifically configured to: control the first switch to be in a closed state before the circuit to be tested is turned on, so that the shunt is in a short-circuit state.

According to an embodiment of the present invention, the above-mentioned current testing device further includes a control panel, and the control panel is provided with a first control key and at least two second control keys, and the first control keys are used to control the first control key under the control of the user. When the switch is turned on or off, the at least two second control keys are in one-to-one correspondence with the second switches in the at least two shunt units, and are used to control the on or off of the corresponding second switches under the control of the user.

According to an embodiment of the present invention, the above-mentioned current testing device further includes a data output unit, the data output unit is connected to the shunt, and is used for acquiring and outputting the current value of the circuit to be tested.

According to an embodiment of the present invention, the above-mentioned current testing device further includes a display unit, which is connected to the data output unit and used to display the current value of the circuit to be tested.

According to an embodiment of the present invention, the above-mentioned current testing device further includes a communication unit, which is connected to the data output unit and the external device respectively, and is used for transmitting the current value of the loop to be tested to the external device.

According to an embodiment of the present invention, the communication unit includes at least one of a CAN communication unit and an Ethernet communication unit.

According to an embodiment of the present invention, the above-mentioned current testing device further includes a connection terminal, and the first switch is connected in series in the circuit to be tested through the connection terminal.

Additional aspects and advantages of the present invention will be set forth, in part, from the following description, and in part will be apparent from the following description, or may be learned by practice of the invention.

Description of drawings

1 is a structural block diagram of a current testing device according to a first embodiment of the present invention;

2 is a structural block diagram of a current testing device according to a second embodiment of the present invention;

FIG. 3 is a structural block diagram of a current testing apparatus according to a third embodiment of the present invention.

Detailed ways

The following describes in detail the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

The current testing device provided by the embodiments of the present invention will be described below with reference to the accompanying drawings.

1 is a structural block diagram of a current testing device according to a first embodiment of the present invention. Referring to FIG. 1 , the current testing device includes: a first switch 100 and at least two shunt units 200 . The first switch 100 is used for During the test, it is connected in series in the loop to be tested. Each of the at least two shunt units 200 includes a shunt and a second switch. The shunt and the second switch are connected in parallel with the first switch 100 after being connected in series. Different shunts have Different ranges, wherein by controlling the on or off of the first switch 100 and the second switch, the shunt of the corresponding range is connected to the circuit to be tested, so as to obtain the current value of the circuit to be tested through the shunt.

Specifically, the first switch 100 is used to select whether to connect the shunt unit to the circuit to be tested. When it is selected to be connected, the first switch 100 is in an off state, and the shunt unit is connected in series in the circuit to be tested. A switch 100 is in a closed state, the shunt unit is short-circuited, and the shunt unit is not connected to the circuit to be tested.

The distribution unit may include two or more, and the settings may be selected according to actual requirements. For example, in the example shown in FIG. 1, the distribution unit may include four, which are respectively the distribution units 210, 220, 230 and 240, each of which The shunt units each include a shunt and a second switch, and the shunt and the second switch are connected in series with the first switch 100 in parallel. For example, the shunt unit 210 may include a shunt 211 and a second switch 212 , and the shunt 211 and the second switch 212 The shunt unit 220 may include a shunt 221 and a second switch 222, and the shunt 221 and the second switch 222 are connected in parallel with the first switch 100 after being connected in series; . . . and so on. Among them, the second switch is used to select whether to connect the corresponding shunt to the circuit to be tested. When it is selected to be connected, the second switch is in a closed state, and the corresponding shunt is connected in series in the circuit to be tested; when it is selected not to be connected, the second switch In the disconnected state, the corresponding shunt is disconnected, and the shunt is not connected to the circuit to be tested. The shunt is used to obtain the current value of the circuit to be tested after being connected to the circuit to be tested, and different shunts have different ranges to achieve different current measurements, for example, the range of the shunt 211 (eg 250A) > the shunt 221 The range of the shunt (eg 125A) > the range of the shunt 231 (eg 25A) > the range of the shunt 241 (eg 2.5A).

During the current test, the first switch 100 can be controlled to be in a closed state first to short-circuit each shunt unit, and then the circuit to be tested is turned on, which can not only ensure the normal connection of the circuit to be tested, but also avoid passing the shunt unit. In order to ensure the normal connection of the circuit to be tested, the current inrush current that may exist at the moment when the circuit to be tested is turned on causes damage to the shunt unit.

After the circuit under test is turned on and the current is stable, for example, after a period of time, first connect the shunt with the largest range to the loop under test, for example, control the second switch 212 to be in a closed state, so that the shunt 211 with the largest range is connected to the circuit under test. The circuit under test is then controlled to be in an off state, which can ensure that the circuit under test is always in a live state, so that the shunt can be connected safely and quickly without interruption of power. Then, the shunt obtains the current value of the circuit to be tested in real time, and the actual current of the circuit to be tested can be determined according to the current value, and a shunt with a suitable range can be determined according to the actual current. Then it can be determined that the current shunt 241 with a 2.5A range needs to be selected. At this time, the second switch 242 is first controlled to be in a closed state, so that the shunt 241 is connected to the circuit to be tested, and then the second switch 212 is controlled to be in an open state to switch the The shunt 211 is moved out of the circuit to be tested, so that the shunts of different ranges can be switched safely and quickly without interruption of power, and the current value of the circuit to be tested can be obtained through the shunt 241 with a small range, which can ensure the high precision of the current test.

After the current test is completed, the first switch 100 can be controlled to be in a closed state first, and then the second switch 242 can be controlled to be in an open state, which is equivalent to temporarily dismantling the test equipment, so that the circuit to be tested can be powered on without interruption when the test is not performed. continue to operate normally.

In this embodiment, by connecting the first switch in series in the loop to be tested, connecting the shunt and the second switch of each of the at least two shunt units in series and then in parallel with the first switch, and by controlling the first The switch and the second switch are turned on or off so that the shunt of the corresponding range is connected to the circuit to be tested, so as to obtain the current value of the circuit to be tested through the shunt. In this way, not only can the high-precision current test be achieved, but also after a line connection, in the case of uninterrupted power, it can be safely and quickly switched to a shunt that is more suitable for the actual test needs, without removing the test equipment and reconnecting it. The test efficiency is greatly improved, and the safety of live replacement of the shunt can be guaranteed.

In some embodiments of the present invention, as shown in FIG. 2 , the above-mentioned current testing apparatus further includes a controller 300, which is connected to the first switch 100, the second switch and the shunt, respectively, for controlling the first switch 100 and the second switch are turned on or off, and the current value of the shunt is obtained.

The controller 300 is specifically used to control the second switch corresponding to the shunt with the largest range to be in a closed state after the loop to be tested is turned on, and then control the first switch 100 to be in an open state, so that the shunt with the largest range is connected. Enter the circuit to be tested; obtain the current value of the shunt with the largest range, and determine the shunt of the target range of the circuit to be tested according to the current value; obtain the shunt with the target range, and first control the corresponding shunt with the target range. The second switch is in the closed state, and then the second switch corresponding to the shunt with the largest range is controlled to be in the open state, so that the shunt with the target range is connected to the circuit to be tested, and the current value of the shunt with the target range is obtained. as the current value of the circuit under test.

Further, the controller 300 is also specifically configured to control the first switch 100 to be in a closed state before the circuit to be tested is turned on, so that the shunt is in a short-circuit state.

That is to say, the entire current test can be automatically completed by the controller 300, so as to realize the high-precision automatic test of the current. For example, the above-mentioned current test equipment may further include an automatic test button and a start test button. Both the automatic test button and the start test button are connected to the controller 300. When the tester connects the current test equipment shown in FIG. 2 to the circuit to be tested and presses the After the button is automatically tested, the controller 300 will control the first switch 100 to be in a closed state, so that the shunt is short-circuited. Then, the tester turns on the circuit to be tested, and after the current of the circuit to be tested is stable, presses the button to start the test. At this time, the controller 300 controls the second switch 212 to be in a closed state, so that the shunt 211 with the largest range is connected to The loop to be tested is then controlled to be in an off state, so as to obtain the current value of the loop to be tested in real time through the shunt 211 . The controller 300 obtains in real time the current value of the loop to be tested obtained by the shunt 211, and judges the current value to determine a shunt with a suitable range according to the current value. For example, the obtained current value is always less than 2.5A, then the It is determined that the current shunt 241 with the 2.5A range needs to be selected. At this time, the controller 300 first controls the second switch 242 to be in a closed state, so that the shunt 241 is connected to the circuit to be tested, and then controls the second switch 212 to be in an open state to Move the shunt 211 out of the loop to be tested, so as to obtain the current value of the loop to be tested through the shunt 241 with a small range. After a period of time or after the number of tests reaches a preset number of times, the controller 300 can first control the first switch 100 to be in a closed state, and then control the second switch 242 to be in an open state, so that the circuit to be tested continues to operate normally without power failure. .

Therefore, the high-precision automatic test of the current can be realized through the controller, and the test button can be externally placed on the box of the current test equipment, so that all switches and shunts can be installed in the box, thus ensuring the safety of the test. .

In some embodiments of the present invention, as shown in FIG. 3 , the above-mentioned current testing device further includes a control panel 400 . The control panel 400 is provided with a first control key 411 and at least two second control keys. The first control key 411 is used to control the on or off of the first switch 100 under the control of the user, and the at least two second control keys are in one-to-one correspondence with the second switches in the at least two shunt units, and are used to control under the control of the user The corresponding second switch is turned on or off. The number of the second manipulation keys is the same as the number of the second switches. For example, in the example shown in FIG. 3 , the second manipulation keys include four, which are the second manipulation keys 421 , The second manipulation key 422 corresponding to the second switch 222, the third manipulation key 423 corresponding to the second switch 232, and the second manipulation key 424 corresponding to the second switch 242, the user can control the first manipulation key by manipulating the second manipulation key. The turn-on or turn-off of the two switches.

That is to say, the entire current test can be completed by a tester by operating the first manipulation key 411 and at least two second manipulation keys on the control panel 400 , thereby realizing a high-precision manual test of the current. Specifically, after the tester connects the current testing device shown in FIG. 3 to the circuit to be tested and presses the first manipulation key 411 , the first switch 100 is in a closed state, and the shunt is short-circuited. Then, the tester turns on the circuit to be tested, and after the current of the circuit to be tested is stable, presses the second control key 421 to control the second switch 212 to be in a closed state, so that the shunt 211 with the largest range is connected to the circuit to be tested , and then press the first manipulation key 411 again to make the first switch 100 in an off state, so as to obtain the current value of the circuit under test in real time through the shunt 211 . The tester checks the current value of the loop to be tested obtained by the shunt 211, and judges the current value to determine a shunt with a suitable range according to the current value. For example, the obtained current value is always less than 2.5A, then the current value can be determined. The shunt 241 with the 2.5A range needs to be selected. At this time, the tester first presses the second control key 424 to make the second switch 242 in a closed state, so that the shunt 241 is connected to the circuit to be tested, and then presses the second control button again. Press the key 421 to make the second switch 212 in an off state, so as to move the shunt 211 out of the circuit under test, so as to obtain the current value of the circuit under test through the shunt 241 with a small range. After the test is completed, the tester presses the first control key 411 again to make the first switch 100 in a closed state, and then presses the second control key 424 again to make the second switch 242 open, so that the loop to be tested is continuously Continue to operate normally without power.

Therefore, high-precision manual testing of current can be achieved through corresponding control keys, and all control keys can be externally placed on the control panel, so that all switches and shunts can be installed in the box, thereby ensuring the safety of the test.

In some embodiments of the present invention, as shown in FIG. 2 and FIG. 3 , the above-mentioned current testing equipment further includes a data output unit 500 connected to the shunt for acquiring and outputting the current value of the circuit to be tested.

Further, the above-mentioned current testing equipment further includes a display unit 600, which is connected to the data output unit 500 for displaying the current value of the circuit to be tested.

Further, the above-mentioned current testing device further includes a communication unit 700, which is connected to the data output unit 500 and the external device respectively, and is used for transmitting the current value of the circuit to be tested to the external device. The communication unit 700 may include at least one of a CAN communication unit and an Ethernet communication unit.

Specifically, the data output unit 500 can be an analog-to-digital conversion unit, which is mainly used to convert the analog current value collected by the shunt into a digital signal, and display it through the display unit 600, or output it to other devices through the communication unit 700, such as computer equipment, etc.

In some embodiments of the present invention, as shown in FIG. 2 and FIG. 3 , the above-mentioned current testing apparatus further includes a connection terminal, and the first switch 100 is connected in series in the circuit to be tested through the connection terminal.

Specifically, the connection terminals may include a positive connection terminal 810 and a negative connection terminal 820, and are connected to the circuit to be tested by drawing a wire from the positive connection terminal 810 and the negative connection terminal 820 respectively, so as to pass the wire connected to the positive connection terminal 810. The current of the loop to be tested is introduced into the current testing equipment, and the current of the loop to be tested is led back to the loop to be tested through the wire connected to the negative terminal 820 . It should be noted that the current carrying capacity of the wire can be determined according to the maximum range of the shunt in the current test equipment. For example, the maximum range of the shunt is 250A, then the current carrying capacity of the wire is 250A. In addition, in practical applications, it is also possible to select a suitable fixture or connection system at the end of the wire according to the actual circuit to be tested, so as to realize quick connection with the circuit to be tested.

To sum up, the current testing device according to the embodiment of the present invention can not only realize the high-precision testing of the current of the loop to be measured, but also can safely and quickly test the different currents according to actual needs without interruption after one connection. The shunt of the range is connected to the circuit to be tested, and at the same time, the two ends of the shunt can be short-circuited at any time to remove the shunt from the circuit to be tested to prevent the impact of high current.

It should be noted that the logic and/or steps represented in the flowcharts or otherwise described herein, for example, may be considered as an ordered listing of executable instructions for implementing the logical functions, and may be embodied in any computer readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other system that can fetch and execute instructions from an instruction execution system, apparatus, or device), or in combination with these used to execute a system, device or device. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport the program for use by or in connection with an instruction execution system, apparatus, or apparatus. More specific examples (non-exhaustive list) of computer readable media include the following: electrical connections with one or more wiring (electronic devices), portable computer disk cartridges (magnetic devices), random access memory (RAM), Read Only Memory (ROM), Erasable Editable Read Only Memory (EPROM or Flash Memory), Fiber Optic Devices, and Portable Compact Disc Read Only Memory (CDROM). In addition, the computer readable medium may even be paper or other suitable medium on which the program may be printed, as the paper or other medium may be optically scanned, for example, followed by editing, interpretation, or other suitable medium as necessary process to obtain the program electronically and then store it in computer memory.

It should be understood that various parts of the present invention may be implemented in hardware, software, firmware or a combination thereof. In the above-described embodiments, various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented by any one or a combination of the following techniques known in the art: Discrete logic circuits, application specific integrated circuits with suitable combinational logic gates, Programmable Gate Arrays (PGA), Field Programmable Gate Arrays (FPGA), etc.

In the description of this specification, description with reference to the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples", etc., mean specific features described in connection with the embodiment or example , structure, material or feature is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

In addition, the terms "first" and "second" are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, a feature delimited with "first", "second" may expressly or implicitly include at least one of that feature. In the description of the present invention, "plurality" means at least two, such as two, three, etc., unless otherwise expressly and specifically defined.

In the present invention, unless otherwise expressly specified and limited, the terms "installed", "connected", "connected", "fixed" and other terms should be understood in a broad sense, for example, it may be a fixed connection or a detachable connection , or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between the two elements, unless otherwise specified limit. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

Although the embodiments of the present invention have been shown and described above, it should be understood that the above-mentioned embodiments are exemplary and should not be construed as limiting the present invention. Embodiments are subject to variations, modifications, substitutions and variations.

Claims (10)

1. A current testing device, comprising: a first switch and at least two shunt units, wherein the first switch is used to be connected in series in the loop to be tested during testing, and the at least two shunt units in the at least two shunt units; Each shunt unit includes a shunt and a second switch, the shunt and the second switch are connected in series with the first switch, and different shunts have different ranges, wherein by controlling the first switch The switch and the second switch are turned on or off so that the shunt of the corresponding range is connected to the circuit to be tested, so as to obtain the current value of the circuit to be tested through the shunt. 2 . The current testing device according to claim 1 , further comprising: a controller, the controller is connected to the first switch, the second switch and the shunt respectively, and is used to control the The first switch and the second switch are turned on or off, and the current value of the shunt is obtained. 3. The current testing device according to claim 2, wherein the controller is specifically used for: After the circuit to be tested is turned on, first control the second switch corresponding to the shunt with the largest range to be in a closed state, and then control the first switch to be in an open state, so that the shunt with the largest range is connected the circuit to be tested; Obtain the current value of the shunt with the maximum range, and determine the target range of the loop to be measured according to the current value; Obtain a shunt with the target range, and first control the second switch corresponding to the shunt with the target range to be in a closed state, and then control the second switch corresponding to the shunt with the maximum range to be in an open state, The shunt with the target range is connected to the loop to be tested, and the current value of the shunt with the target range is obtained as the current value of the loop to be tested. 4 . The current testing device according to claim 3 , wherein the controller is further specifically configured to: control the first switch to be in a closed state before the loop to be tested is turned on, so that the The shunt is shorted. 5 . The current testing device according to claim 1 , further comprising: a control panel, the control panel is provided with a first control key and at least two second control keys, and the first control key is used for 5 . The at least two second control keys are in one-to-one correspondence with the second switches in the at least two shunt units, and are used to switch on or off the first switch under the control of the user. Under the control of the user, the corresponding second switch is controlled to be turned on or off. 6 . The current testing device according to claim 1 , further comprising: a data output unit, the data output unit is connected to the shunt, and is used to obtain the loop to be tested. 7 . current value and output. 7 . The current testing device according to claim 6 , further comprising: a display unit, the display unit is connected to the data output unit, and is used for displaying the current value of the loop to be tested. 8 . 8 . The current testing device according to claim 6 , further comprising: a communication unit, the communication unit is respectively connected with the data output unit and an external device, and is used for measuring the current value of the loop to be tested. 9 . to the external device. 9 . The current testing device according to claim 8 , wherein the communication unit comprises at least one of a CAN communication unit and an Ethernet communication unit. 10 . 10 . The current testing device according to claim 1 , further comprising: a connection terminal through which the first switch is connected in series in the circuit to be tested. 11 .

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