CN115031808A - Level meter and detection method thereof - Google Patents

Abstract

The invention relates to the field of material measurement, in particular to a material level gauge and a detection method thereof. The probe module and the calculation module of the material level gauge of the present invention are designed separately, the calculation module can be placed in an indoor safe area, personnel can control the calculation module, the calculation module has an independent MCU, and the software of the calculation module can be upgraded at any time. The detection method of the material level meter of the present invention obtains the material stacking height according to the intensity of gamma rays in different directions, is not affected by the type and property of the material, overcomes the defects of the traditional method, and has higher accuracy and adaptability.

Description

A material level meter and its detection method

technical field

The invention relates to the field of material measurement, in particular to a material level gauge and a detection method thereof.

Background technique

At present, the level gauges based on gamma ray detection all adopt an integrated design, and the probe, counting, display and communication modules for gamma ray detection are integrated in one module. Since the location where the level gauge is placed during normal operation is in the gamma ray field, the location is relatively remote and unsafe. It makes the movement, maintenance, repair, software upgrade and function improvement of the material level meter extremely inconvenient, which limits the use of the material level meter.

In addition, the common level gauge detection based on gamma ray detection determines the position and stacking height of materials by detecting the intensity of gamma ray. However, different batches of materials have different sources and generally have different radiation intensities, so the relationship between the detected intensity and the position and stacking height of the materials changes with the changes of the materials, but the current level gauges on the market cannot Different adjustment of the test results will cause deviations in the test results.

SUMMARY OF THE INVENTION

In view of the problems existing in the prior art, the purpose of the present invention is to provide a material level gauge and a detection method thereof.

In order to achieve the above objects, the present invention adopts the following technical solutions to achieve.

A material level meter includes a probe module and a calculation module;

The probe module includes a detection direction adjustment mechanism, a gamma ray probe, a first MCU and a first wireless communication unit;

The detection direction adjustment mechanism includes a base plate, a first servo motor whose output shaft is in a vertical direction is arranged on the base plate, a turntable is arranged on the output shaft of the first servo motor, and a first servo motor whose output shaft is in a horizontal direction is arranged on the side of the turntable away from the base plate. Two servo motors, the output shaft of the second servo motor is connected with one end of the swing arm, and the connection point between the output shaft of the second servo motor and the swing arm is on the axial extension line of the output shaft of the first servo motor;

The gamma ray probe is arranged at the other end of the swing arm, and the detection direction of the gamma ray probe is consistent with the axial direction of the swing arm;

The first MCU is arranged in the base plate; the first MCU is used to control the detection direction adjustment mechanism to adjust the detection direction of the gamma ray probe, and to receive the gamma ray intensity data detected by the gamma ray probe and send it to the first wireless communication unit;

The first wireless communication unit is arranged in the base plate; the first wireless communication unit is used to send the gamma ray intensity data detected by the gamma ray probe to the computing module, and receive the control signal sent by the computing module and transmit it to the first MCU;

The first MCU is respectively electrically connected with the first servo motor, the second servo motor, the gamma ray probe, and the first wireless communication unit;

The computing module includes a second MCU and a second wireless communication unit; the second MCU and the second wireless communication unit are electrically connected;

The second MCU is used for outputting control signals and calculating the material stacking height with gamma ray intensity data;

The second wireless communication unit is used for receiving the gamma ray intensity data sent by the detection module, and sending the control signal output by the second MCU to the detection module.

A detection method for a material level meter, comprising the following steps:

Step 1, the probe module of the material level gauge is arranged above the material container, and the vertical distance from the bottom surface of the material container is H ₁ ;

Step 2, the swing arm swings until the axial direction is vertical downward, as the initial direction;

Step 3: The swing arm swings in the clockwise or counterclockwise direction at 1° steps; after each swing of the swing arm, keep it for a certain period of time; when the horizontal angle of the swing arm is 0 and maintain for a certain period of time, the swing arm Swing to the initial direction;

Step 4: Calculate the material stacking height according to all the gamma ray intensity data detected by the gamma ray probe.

Compared with the prior art, the beneficial effects of the present invention are: the probe module and the calculation module are designed separately, the calculation module can be placed in an indoor safe area, personnel can control the calculation module, the calculation module has an independent MCU, and the calculation module can be adjusted at any time. software upgrade. The stacking height of the material is obtained according to the gamma ray intensity in different directions, which is not affected by the type and nature of the material, overcomes the defects of the traditional method, and has higher accuracy and adaptability.

Description of drawings

The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

Fig. 1 is the structural block diagram of the material level meter embodiment of the present invention;

Fig. 2 is the structural representation of the detection direction adjustment mechanism of the embodiment of the material level gauge of the present invention; Fig. 2 (a) is a front view, and Fig. 2 (b) is a side view;

Fig. 3 is a detection schematic diagram of the detection method of the material level gauge of the present invention.

Description of reference numerals: 1 base plate, 2 first servo motor, 3 turntable, 4 second servo motor, 5 swing arm, 6 gamma ray probe.

Detailed ways

The embodiments of the present invention will be described in detail below in conjunction with the examples, but those skilled in the art will understand that the following examples are only used to illustrate the present invention and should not be regarded as limiting the scope of the present invention.

Referring to Fig. 1, a material level meter includes a probe module and a calculation module;

The probe module includes a detection direction adjustment mechanism, a gamma ray probe, a first MCU and a first wireless communication unit;

Referring to FIG. 2 , the detection direction adjustment mechanism includes a base plate 1 , a first servo motor 2 whose output shaft is a vertical direction is arranged on the base plate 1 , a turntable 3 is arranged on the output shaft of the first servo motor 2 , and the turntable 3 is far from the base plate 1 . One side is provided with a second servo motor 4 whose output shaft is in a horizontal direction, the output shaft of the second servo motor 4 is connected to one end of the swing arm 5, and the connection point between the output shaft of the second servo motor 4 and the swing arm 5 is at the first On the axial extension line of the output shaft of the servo motor 2;

The gamma ray probe 6 is arranged at the other end of the swing arm 5, and the detection direction of the gamma ray probe 6 is consistent with the axial direction of the swing arm 5;

The first MCU is arranged in the base plate; the first MCU is used to control the detection direction adjustment mechanism to adjust the detection direction of the gamma ray probe, and to receive the gamma ray intensity data detected by the gamma ray probe and send it to the first wireless communication unit;

The first wireless communication unit is arranged in the base plate; the first wireless communication unit is used to send the gamma ray intensity data detected by the gamma ray probe to the computing module, and receive the control signal sent by the computing module and transmit it to the first MCU;

The first MCU is respectively electrically connected with the first servo motor, the second servo motor, the gamma ray probe, and the first wireless communication unit;

The computing module includes a second MCU and a second wireless communication unit; the second MCU and the second wireless communication unit are electrically connected;

The second MCU is used for outputting the control signal, and calculating the material stacking height from the gamma ray intensity data;

The second wireless communication unit is used for receiving the gamma ray intensity data sent by the detection module, and sending the control signal output by the second MCU to the detection module.

The first wireless communication unit and the second wireless communication unit use WIFI for wireless communication.

The operator controls the detection direction of the gamma ray probe by changing the control signal output by the second MCU.

Referring to Fig. 3, a detection method of a material level meter comprises the following steps:

Step 1, the probe module of the material level gauge is arranged above the material container, and the vertical distance from the bottom surface of the material container is H ₁ ;

Step 2, the swing arm swings until the axial direction is vertical downward, as the initial direction;

Step 3: The swing arm swings counterclockwise in steps of 1°; after each swing of the swing arm, keep it for a certain period of time, so that the gamma ray probe can stably detect the gamma ray intensity; when the horizontal included angle of the swing arm is 0 and hold for a certain period of time, the swing arm swings to the initial direction;

Step 4: Calculate the material stacking height according to all the gamma ray intensity data detected by the gamma ray probe. The sub-steps are as follows:

Sub-step 4.1, calculate the difference between the gamma ray intensities of adjacent detection directions, and obtain two adjacent detection directions with the largest absolute value of the difference in gamma ray intensity;

Sub-step 4.2, compare the gamma ray intensities of the two detection directions, the detection direction corresponding to the larger gamma ray intensity is the material boundary; the reason is that the gamma ray intensity emitted by the material is much greater than that of other materials in the material bin The gamma ray intensity emitted by the material, so when the probe is pointed at the material boundary, the gamma ray intensity changes most drastically.

Sub-step 4.3, calculate the vertical distance H ₂ between the detection module and the material boundary, as shown in the following formula:

H ₂ =s*tanα

In the formula, s is the horizontal distance from the detection module to the material boundary, α is the horizontal included angle of the detection direction when the detection direction is the material boundary direction; α=90°-n*1°, where n is the number of swings;

Sub-step 4.4, calculate the material stacking height h, as shown in the following formula:

h=H ₁ -H ₂

Further, the turntable is rotated in steps of 10°, and steps 3 to 4 are repeated after each rotation until the rotation angle of the turntable is greater than or equal to 360°, and 36 material stacking heights are obtained; the average value of all material stacking heights is obtained. The average stacking height of materials; the difference in stacking heights of materials at different boundaries can also be obtained.

Although the present invention has been described in detail with general description and specific embodiments in this specification, some modifications or improvements can be made on the basis of the present invention, which will be obvious to those skilled in the art. Therefore, these modifications or improvements made without departing from the spirit of the present invention fall within the scope of the claimed protection of the present invention.

Claims (4)

1. a material level meter, is characterized in that, comprises probe module and calculation module; The probe module includes a detection direction adjustment mechanism, a gamma ray probe, a first MCU and a first wireless communication unit; The detection direction adjustment mechanism comprises a base plate (1), a first servo motor (2) whose output shaft is a vertical direction is arranged on the base plate (1), and a turntable (3) is arranged on the output shaft of the first servo motor (2), A second servo motor (4) whose output shaft is in a horizontal direction is arranged on the side of the turntable (3) away from the bottom plate (1), and the output shaft of the second servo motor (4) is connected to one end of the swing arm (5). The connection point between the output shaft of the servo motor (4) and the swing arm (5) is on the axial extension line of the output shaft of the first servo motor (2); The gamma ray probe (6) is arranged at the other end of the swing arm (5), and the detection direction of the gamma ray probe (6) is consistent with the axial direction of the swing arm (5); The first MCU is arranged in the base plate; the first MCU is used to control the detection direction adjustment mechanism to adjust the detection direction of the gamma ray probe, and to receive the gamma ray intensity data detected by the gamma ray probe and send it to the first wireless communication unit; The first wireless communication unit is arranged in the base plate; the first wireless communication unit is used to send the gamma ray intensity data detected by the gamma ray probe to the computing module, and receive the control signal sent by the computing module and transmit it to the first MCU; The first MCU is respectively electrically connected with the first servo motor, the second servo motor, the gamma ray probe, and the first wireless communication unit; The computing module includes a second MCU and a second wireless communication unit; the second MCU and the second wireless communication unit are electrically connected; The second MCU is used for outputting control signals and calculating the material stacking height with gamma ray intensity data; The second wireless communication unit is used for receiving the gamma ray intensity data sent by the detection module, and sending the control signal output by the second MCU to the detection module. 2. the detection method of a material level gauge, based on the described material level gauge of claim 1, is characterized in that, comprises the following steps: Step 1, the probe module of the material level gauge is arranged above the material container, and the vertical distance from the bottom surface of the material container is H ₁ ; Step 2, the swing arm swings until the axial direction is vertical downward, as the initial direction; Step 3: The swing arm swings in the clockwise or counterclockwise direction at 1° steps; after each swing of the swing arm, keep it for a certain period of time; when the horizontal angle of the swing arm is 0 and maintain for a certain period of time, the swing arm Swing to the initial direction; Step 4: Calculate the material stacking height according to all the gamma ray intensity data detected by the gamma ray probe. 3. the detection method of material level gauge according to claim 2, is characterized in that, the substep of step 4 is as follows: Sub-step 4.1, calculate the difference between the gamma ray intensities of adjacent detection directions, and obtain two adjacent detection directions with the largest absolute value of the difference in gamma ray intensity; Sub-step 4.2, compare the gamma ray intensities of the two detection directions, then the detection direction corresponding to the larger gamma ray intensity is the material boundary; Sub-step 4.3, calculate the vertical distance H ₂ between the detection module and the material boundary, as shown in the following formula: H ₂ =s*tanα In the formula, s is the horizontal distance from the detection module to the material boundary, α is the horizontal included angle of the detection direction when the detection direction is the material boundary direction; Sub-step 4.4, calculate the material stacking height h, as shown in the following formula: h=H ₁ -H ₂ . 4. The detection method of a material level gauge according to claim 2, characterized in that it further comprises that the turntable rotates according to a set step distance, and steps 3 to 4 are repeated after each rotation until the rotation angle of the turntable is greater than or equal to 360° to obtain multiple material stacking heights; average the stacking heights of all materials to obtain the average stacking height of materials.

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