CN114924126A - Method and device for automatically testing pairing performance of transducer under variable-voltage condition - Google Patents

Abstract

The embodiment of the application provides an automatic testing method for pairing performance of an energy converter under a variable pressure condition. The method comprises the following steps: obtaining static capacitance C of each transducer in a transducer pair in a test pipeline under different environmental parameters ₀ And an impedance characteristic curve, the environmental parameters including pressure and flow in the test conduit; determining an impedance admittance chart of susceptance and conductance of each transducer under each environmental parameter according to the static capacitance, the impedance characteristic curve and the transducer circuit equivalent model of each transducer so as to determine the resonant frequency, the half-power frequency, the bandwidth, the quality factor, the dynamic resistance, the dynamic capacitance and the dynamic inductance of each transducer corresponding to each environmental parameter; for each environmental parameter, the paired parameters of the transducer pair under the environmental parameters are compared, and the transducer pair under all the environmental parametersIn the case that the difference between the pairing parameters of both the transducers does not exceed the preset threshold, it is confirmed that the pairing parameters of both the transducers are identical.

Description

Automatic testing method and device for transducer pairing performance under variable voltage conditions

technical field

The present application belongs to the field of transducer equipment, and in particular relates to a method and device for automatic testing of the pairing performance of transducers under variable voltage conditions.

Background technique

Ultrasonic transducers are devices that use the piezoelectric effect of piezoelectric crystals to convert mechanical vibrations generated by ultrasonic waves into electrical signals or generate mechanical vibrations driven by an electric field to emit ultrasonic waves. Ultrasonic flow meters are usually composed of one or more transducer pairs. If the pairing performance of the two transducers in the transducer pair is poor, there will be mismatches between the two transducers in the transducer pair. Issues that cause inaccurate test results in ultrasonic flow meters. However, there is no evaluation standard for the technical indicators and methods of the use characteristics of the transducer used in the ultrasonic flowmeter in the prior art, and there is a lack of research on the performance matching and test equipment of the transducer pair used in the ultrasonic flowmeter in China, resulting in ultrasonic flow. There is no way to carry out a comprehensive performance matching of the transducer pairs used in the meter.

SUMMARY OF THE INVENTION

In view of the above-mentioned defects or deficiencies of the prior art, the embodiments of the present application provide an automatic testing method and device for the pairing performance of transducers under the condition of voltage transformation, which can test the pairing parameters of the transducer pair to determine the transducer pair. Whether the pairing parameters of the two transducers are consistent, so as to improve the test accuracy of the ultrasonic flowmeter.

In order to achieve the above purpose, the first aspect of the present application provides an automatic test method for the pairing performance of transducers under variable voltage conditions, including:

Obtain the static capacitance C ₀ and impedance characteristic curve of each transducer in the transducer pair in the test pipeline under different environmental parameters, and the environmental parameters include the pressure and flow in the test pipeline;

According to the static capacitance and impedance characteristic curves of each transducer, the impedance admittance chart of the susceptance and conductance of each transducer under each environmental parameter is determined, so as to determine that each transducer corresponds to each environmental parameter The resonant frequency and half-power frequency of ;

Determine the bandwidth BW and quality factor Q of each transducer under each environmental parameter according to the resonant frequency and half-power frequency of each transducer;

Determine the dynamic resistance R _m , the dynamic capacitance C _m and the dynamic inductance L _m of each transducer under each environmental parameter through the circuit equivalent model and the impedance admittance diagram;

For each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameters, the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R _m , dynamic capacitance C _m , dynamic inductance L _m , static capacitance C ₀ , Resonant frequency;

When the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed the preset threshold, it is confirmed that the pairing parameters of the two transducers are consistent.

In the embodiment of the present application, the method further includes determining the impedance admittance chart of susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curves of each transducer, including: determining according to the impedance characteristic curve at different The susceptance B and conductance G at the frequency; for each transducer, the impedance admittance diagram of the transducer is determined according to the susceptance B, conductance G, and static capacitance of the transducer.

In the embodiment of the present application, the expression of the impedance and admittance circle diagram is as formula (1):

where G is the conductance, B is the susceptance, R _m is the dynamic resistance, ω is the angular frequency, and C ₀ is the static capacitance of the transducer.

In the embodiment of the present application, the dynamic resistance R _m is calculated according to the formula (2), the dynamic inductance L _m is calculated according to the formula (3), and the dynamic capacitance C _m is calculated according to the formula (4);

R _m =1/G _max formula (2);

Among them, G _max is the maximum value of conductance G, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ and ω ₁ are f respectively The angular frequency corresponding to ₁ and the angular frequency corresponding to f ₂ , f _s is the series resonance frequency, which is the corresponding frequency when the conductance is maximum, and ω _s is the angular frequency corresponding to f _s .

In the embodiment of the present application, the bandwidth BW is calculated according to formula (5), and the quality factor Q is calculated according to formula (6);

BW=Δf=f ₂ -f ₁ formula (5);

Among them, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ , ω ₁ are the angular frequency corresponding to f ₁ and f ₂ respectively The corresponding angular frequency, f _s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω _s is the angular frequency corresponding to f _s .

In the embodiment of the present application, the circuit equivalent model includes: dynamic capacitance C _m , dynamic inductance L _m , dynamic resistance R _m , static resistance R ₀ and static capacitance C ₀ ; the first end of dynamic capacitance C _m and the dynamic inductance The first end of L _m is connected, the second end of the dynamic capacitor C _m is connected to the first end of the dynamic resistance R _m , the first end of the static resistance R ₀ is connected to the first end of the dynamic inductance L _m , and the static resistance R ₀ The second end of the static capacitor _Rm is connected to the second end of the dynamic resistor _Rm , the first end of the static capacitor R0 is connected to the first end of the dynamic inductance _Lm , and the second end of the static capacitor _C0 is connected to the second end of the dynamic resistor _Rm . end connection.

A second aspect of the present application provides a processor configured to perform a method of automatically testing the pairing performance of transducers under variable voltage conditions.

A third aspect of the present application provides a device for automatically testing the pairing performance of transducers. The device for automatically testing the pairing performance of transducers includes: a capacitance meter, used to obtain the static capacitance of each transducer; an impedance analysis device, used for Obtain the impedance characteristic curve of each transducer; a pressure flow device for changing the pressure and flow in the transducer test pipeline; and the above-mentioned processor.

In the embodiment of the present application, the pressure flow device includes: a main pipeline, which in turn includes a first electric ball valve, a pressure sensor transmitter, a transducer fixing device, a standard flow meter, a temperature sensor transmitter, and a second electric ball valve ; boost bypass branch, including a first valve and a second valve, the first end of the first valve is connected with the first electric ball valve, the second end of the first valve is connected with the first end of the second valve, the second The second end of the valve is connected with the main line between the first electric ball valve and the pressure sensor transmitter; the nitrogen injection branch includes the third valve and the fourth valve, and the first end of the third valve is connected with the nitrogen storage device , the second end of the third valve is connected with the first end of the fourth valve, and the second end of the fourth valve is connected with the main line between the first electric ball valve and the pressure sensor transmitter; The fifth valve and the sixth valve, the first end of the fifth valve is in contact with the air, the second end of the fifth valve is connected with the first end of the sixth valve, the second end of the sixth valve is connected with the second electric ball valve and the temperature transmitter Main line connection between sense transmitters.

A fourth aspect of the present application provides a machine-readable medium, where an instruction is stored in the machine-readable medium, and when the instruction is executed by a machine, the machine executes a method for testing the pairing performance of transducers under a transformer condition.

Through the above technical solutions, the transducer pairing performance automatic testing device and method provided by the embodiments of the present application have the following beneficial effects:

The above-mentioned transducer pairing performance automatic testing method, device and storage medium, by verifying the parameters of each transducer under different environmental parameters, impedance analysis is performed on the pairing performance parameters of the transducers, so as to obtain each transducer. pairing parameters. According to the pairing parameters of the transducers under different environmental parameters, it is obtained whether the two transducers in the transducer pair are paired the same, which can improve the pairing consistency of the two transducers in the transducer pair used for testing. , thereby improving the test accuracy of the ultrasonic flowmeter.

Additional features and advantages of the present application will be described in detail in the detailed description that follows.

Description of drawings

The accompanying drawings are used to provide further understanding of the embodiments of the present application, and constitute a part of the specification, and are used to explain the embodiments of the present application together with the following specific embodiments, but do not constitute limitations to the embodiments of the present application. In the attached image:

FIG. 1 schematically shows a schematic flowchart of a method for automatically testing the pairing performance of transducers under variable voltage conditions according to an embodiment of the present application;

FIG. 2 schematically shows a schematic diagram of a transducer admittance circle diagram according to an embodiment of the present application;

FIG. 3 schematically shows a simulation schematic diagram of an equivalent circuit model of a piezoelectric transducer according to an embodiment of the present application;

FIG. 4 schematically shows an automatic test cabinet for transducer pairing performance according to an embodiment of the present application;

FIG. 5 schematically shows a flow chart of a cabinet testing process for automatic testing of transducer pairing performance according to an embodiment of the present application;

FIG. 6 schematically shows a device for changing the pressure and flow of a test pipeline according to an embodiment of the present application;

FIG. 7 schematically shows an internal structure diagram of a computer device according to an embodiment of the present application.

Detailed ways

The specific implementations of the embodiments of the present application will be described in detail below with reference to the accompanying drawings. It should be understood that the specific implementation manners described herein are only used to illustrate and explain the embodiments of the present application, and are not used to limit the embodiments of the present application.

FIG. 1 schematically shows a flow chart of a method for automatically testing the pairing performance of a transducer under a variable voltage condition according to an embodiment of the present application. As shown in FIG. 1, in an embodiment of the present application, a method for automatically testing the pairing performance of transducers under variable voltage conditions is provided, including the following steps:

Step S101 , acquiring static capacitance C ₀ and impedance characteristic curves of each transducer in the transducer pair in the test pipeline under different environmental parameters, where the environmental parameters include pressure and flow in the test pipeline.

The processor can obtain the static capacitance and impedance characteristic curves of each transducer, and these two sets of test data are used to calculate the inherent pairing parameters of each transducer. The static capacitance of the transducer refers to the capacitance generated by the transducer due to clamping, and the impedance characteristic curve of the transducer refers to the susceptance and conductance characteristics reflected by the impedance inside the transducer at different current frequencies. Under different pressures and flow rates, the two transducers in the transducer pair may not fit, so it is necessary to test under various environmental parameters. The environmental parameters altered in this application include pressure and flow within the test pipeline.

Step S102, according to the static capacitance and impedance characteristic curve of each transducer, determine the impedance admittance chart of susceptance and conductance of each transducer under each environmental parameter, so as to determine the relationship between each transducer and each transducer. Resonant frequency and half-power frequency corresponding to environmental parameters.

After acquiring the static capacitance and impedance characteristic curves of the transducers, the processor can calculate the impedance-admittance circle diagram of the susceptance and conductance of each transducer. Based on the obtained impedance-admittance diagram, the processor can determine the resonant frequency and half-power frequency of each transducer. Among them, susceptance is the reciprocal of reactance, conductance is the reciprocal of resistance, and the impedance admittance chart is the relationship between susceptance and conductance in the transducer. The resonance frequency specifically includes series resonance frequency, parallel resonance frequency, positive resonance frequency and anti-resonance frequency.

Step S103: Determine the bandwidth BW and the quality factor Q of each transducer under each environmental parameter according to the resonant frequency and the half-power frequency of each transducer.

The processor can determine the bandwidth and quality factor of each transducer from the known resonant frequency and half power. Each ultrasonic transducer has a bandwidth value, which is the range of operating frequencies of the transducer. The quality factor of a transducer is a quality index that characterizes the ratio of the energy stored by the transducer to the energy lost per week.

Step S104, the dynamic resistance R _m , the dynamic capacitance C _m and the dynamic inductance L _m of each transducer under each environmental parameter are determined by using the circuit equivalent model and the impedance admittance chart.

The processor can combine the equivalent circuit of the transducer according to the impedance and admittance diagram to obtain the dynamic resistance, dynamic capacitance and dynamic inductance of the transducer. The dynamic resistance of the transducer, mainly caused by the mechanical losses of the transducer, also includes the load resistance in the presence of a load. The dynamic capacitance of the transducer is caused by the mechanical compliance of the transducer. The dynamic inductance of the transducer is caused by the transducer mass.

Step S105, for each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameters, the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance _Rm , dynamic capacitance _Cm , dynamic inductance _Lm , static capacitance C ₀ , the resonance frequency.

In an ultrasonic flowmeter, two transducers are included. First, the first transducer transmits ultrasonic signals according to the piezoelectric effect, and the second transducer receives the ultrasonic signals according to the inverse piezoelectric effect. After the second transducer receives the ultrasonic signal and obtains the corresponding parameters, the transmission and reception of the two transducers are switched, the second transducer transmits the ultrasonic signal, and the first transducer receives the ultrasonic signal. The consistency of the pairing parameters of the transducers directly affects the test accuracy of the ultrasonic flowmeter. Therefore, whether the pairing parameters of the two transducers are consistent is extremely important in actual use. In this application, the pairing parameters of the transducer include bandwidth, quality factor, dynamic resistance, dynamic capacitance, dynamic inductance, static capacitance, and resonant frequency. The processor compares the plurality of pairing parameters of the two transducers in the transducer pair to arrive at a pairing result.

Step S106 , if the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed a preset threshold, confirm that the pairing parameters of the two transducers are consistent.

After a pairing test is completed, the pressure and flow control steps of the transducer test pipeline are performed to precisely control the gas pressure and flow through the transducer. Specifically, the air pressure and flow control steps include: controlling the pressure of the gas flowing through the main pipeline by using the main pipeline bypass valve and the vent valve to ensure that the gas can accurately flow through the transducer for detection. The flow regulating valve on the pipeline controls the gas flow, and the pressure, temperature and flow are detected by placing pressure gauges, thermometers and flow meters. Ensure that the pressure and flow of the flowing gas can be accurately controlled, so as to realize the detection of the performance of the transducer pairing parameters under different pressures and flows.

The processor compares the pairing parameters of the two transducers in the transducer pair, and if the difference between each pairing parameter does not exceed a preset threshold, it can determine the two transducers corresponding to the transducer pair device pairing is the same.

In one embodiment, determining the impedance-admittance chart of susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curves of each transducer includes: determining the susceptance at different frequencies according to the impedance characteristic curve B and conductance G; for each transducer, determine the impedance-admittance circle diagram of the transducer according to the susceptance B, conductance G, and static capacitance of the transducer. The processor can calculate the impedance-admittance circle diagram of the susceptance and conductance of the transducer according to the impedance characteristic curve and the static capacitance of each transducer. The susceptance is the reciprocal of the reactance, the conductance is the reciprocal of the resistance, and the impedance-admittance circle diagram is the relationship between the susceptance and the conductance in the transducer, which is a circle in the two-dimensional coordinate system. When the medium is air, that is, there is no load, according to the circuit equivalent model analysis, it can be known that:

时G_m达到最大值

ω_s称为串联谐振角频率。工程上一般把压电换能器的品质因数Q_m定义为：It can be seen from formula (7) that when

When G _m reaches its maximum value

ω _s is called the series resonance angular frequency. In engineering, the quality factor Q _m of a piezoelectric transducer is generally defined as:

Substitute formula (8) into formula (7) to get:

之间连续变化，这种变化快慢由品质因数Q_m决定。根据G_max可确定串联谐振角频率ω_s和动态电阻R_m。如果考虑换能器的静态电阻R₀，

则G(ω)的变化曲线，全部特性曲线上移

根据G_min可以确定静态电阻R₀，根据G_max可以确定串联谐振角频率ω_s和换能器动态电阻R_m。It can be seen from the above equation that G _m is

Continuously changing between, the speed of this change is determined by the quality factor Q _m . The series resonance angular frequency ω _s and the dynamic resistance R _m can be determined according to G _max . If the static resistance R ₀ of the transducer is considered,

Then the change curve of G(ω), all characteristic curves move up

The static resistance R ₀ can be determined according to G _min , and the series resonance angular frequency ω _s and the transducer dynamic resistance R _m can be determined according to G _max .

时，有X_m＝0；当ω→0时，X_m→-∞；当ω→∞时，X_m→+∞；X_m随着ω的增加而单调增加。根据X_m的定义，对B_m进行求导when

When , there is X _m =0; when ω→0, X _m →-∞; when ω→∞, X _m →+∞; X _m increases monotonically with the increase of ω. According to the definition of X _m , take the derivative of B _m

当X_m＝+R_m时，

(3)B_m是在

之间连续变化的。根据B(ω)的阻抗特性曲线可知，当X_m＝±R_m时根据B(ω)的阻抗特性曲线可知，

是半功率点。ω₁、ω₂是半功率点角频率。如果考虑换能器的静态损耗R₀，

则G(ω)的变化曲线，全部特性曲线上移

根据G_min可以确定静态损耗电阻R₀，根据G_max可以确定串联谐振角频率ω_s和换能器动态损耗电阻R_m。It can be seen from formula (11): (1) When X _m =0 or X _m →∞, B _m =0. That is, when ω=0, ω=ωs, ω→∞, B(ω) has three zeros. (2) When X _m =±R _m , B _m has an extreme value; when X _m =-R _m ,

When X _m =+R _m ,

(3) B _m is in

continuously changing between. According to the impedance characteristic curve of B(ω), it can be known from the impedance characteristic curve of B(ω) when X _m =±R _m ,

is the half power point. ω ₁ , ω ₂ are the half-power point angular frequencies. If the static loss R ₀ of the transducer is considered,

Then the change curve of G(ω), all characteristic curves move up

The static loss resistance R ₀ can be determined according to G _min , and the series resonance angular frequency ω _s and the transducer dynamic loss resistance R _m can be determined according to G _max .

In one embodiment, in the method for testing the pairing performance of transducers, the expression of the impedance-admittance circle diagram is as formula (1):

where G is the conductance, B is the susceptance, R _m is the dynamic resistance, ω is the angular frequency, and C ₀ is the static capacitance of the transducer. According to the equivalent circuit of the transducer, the static impedance Z ₀ and the dynamic impedance Z _m can be obtained as,

The relationship between the transducer impedance Z and the transducer admittance Y is: Z=1/Y, the static electric admittance Y ₀ and the dynamic electric admittance Y _m can be obtained as,

Y ₀ =jωC ₀ =jB ₀ formula (14);

In the formula, G ₀ , G _m represent static conductance and dynamic conductance, respectively; B ₀ , B _m represent static susceptance and dynamic susceptance, respectively. Transducer total admittance:

Y=Y ₀ +Y _m =G _m +j(B ₀ +B _m )=G+jB formula (18);

Combining formula (15), we can get:

That is, the expression of the impedance-admittance circle diagram shown in Figure 2:

Among them, f _m and f _n are the frequencies when the admittance amplitude is the largest and the smallest respectively, which are called the maximum admittance frequency and the minimum admittance frequency. f _s is the frequency when the conductance G is the largest, and the L _m -C _m resonance occurs at this frequency, which is called the series resonance frequency; the frequency point f _p is called the parallel resonance frequency. f _a , fr are the frequency points when the _susceptance B is 0, which are called anti-resonance frequency and resonance frequency. f ₁ and f ₂ are the frequencies when the susceptance B is the maximum and minimum, respectively, which are called the half-power point frequency. According to the admittance curve of conductance, susceptance and frequency, the processor calculates the admittance circle diagram.

In one embodiment, determining the dynamic resistance, dynamic capacitance and dynamic inductance of each transducer through the circuit equivalent model and the impedance admittance diagram includes: calculating the dynamic resistance R _m according to the formula (2), and according to the formula (3) Calculate the dynamic inductance L _m , and calculate the dynamic capacitance C _m according to formula (4);

R _m =1/G _max formula (2);

Among them, G _max is the maximum value of conductance G, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ and ω ₁ are f respectively The angular frequency corresponding to ₁ and the angular frequency corresponding to f ₂ , f _s is the series resonance frequency, which is the corresponding frequency when the conductance is maximum, and ω _s is the angular frequency corresponding to f _s . The three transducer pairing parameters, dynamic resistance R _m , dynamic inductance L _m , and dynamic capacitance C _m , are important parameters for confirming whether the transducers are paired. The processor calculates the admittance circle diagram of the conductance and susceptance of the transducer through the static capacitance of the transducer and the transducer admittance curve, and the above three pairing parameters of the transducer can be calculated according to the admittance circle diagram.

In one embodiment, determining the bandwidth and quality factor of each transducer according to the resonant frequency and the half-power frequency of each transducer includes: calculating the bandwidth BW according to formula (5), and calculating the quality factor Q according to formula (6) ;

BW=Δf=f ₂ -f ₁ formula (5);

Among them, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ , ω ₁ are the angular frequency corresponding to f ₁ and f ₂ respectively The corresponding angular frequency, f _s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω _s is the angular frequency corresponding to f _s . Bandwidth and quality factor are important parameters to confirm that the transducers are paired. According to the static capacitance of the transducer and the admittance curve of the transducer, the admittance circle diagram of the conductance and susceptance of the transducer is calculated, and the bandwidth and quality factor of the transducer can be calculated according to the admittance circle diagram.

In one embodiment, the pairing parameters between the two transducers are compared, the pairing parameters corresponding to the two transducers are subtracted, and in the case that the difference of all the pairing parameters does not exceed a preset threshold, The pairing of the two transducers is consistent; in the case that the difference of one or more pairing parameters exceeds the preset threshold, the pairing of the two transducers is inconsistent. The determination of the preset threshold is based on the required accuracy of the transducer and the influence of each parameter on the delay time in the transducer through-beam experiment.

In one embodiment, before the transducer pairing performance test, the step of transilluminating the transducer is further included. Specifically, the transducer beam test can be carried out to adjust the distance of the transducer sending and receiving. The transceiver transducers to be paired are installed at both ends of the pipeline, and the principle of the time difference method is used to transmit and receive signals from the transducers. Further, it is also possible to increase the trans-radiation experiment of the transducer to obtain the time-delay characteristic curve of the transducer, and subsequently, according to the influence of the pairing parameters of the transducer on the time-delay time, set the two transitions in the transducer pair. The threshold of the difference between the paired parameters of the energy device.

In one embodiment, before the transducer pairing performance test, a signal transmission and acquisition step is further included, so as to realize signal excitation of the transmitting transducer and information measurement and acquisition of the receiving transducer. Specifically, the signal transmitting and collecting steps include: connecting the transmitting transducer with the signal generator and the power amplifier for voltage signal excitation; connecting the receiving transducer with the amplifier and the signal collector, and at the same time connecting the signal collector with the processor, so as to collect the The received transducer receives the amplified data of the signal and sends the impedance characteristic parameter to the processor, so that the processor can analyze and process the received data.

For example, in the actual test process, it is necessary to test the paired performance parameters of the two transducers of the transducer pair. The processor will obtain the static capacitance and impedance characteristic curves of the transducer to calculate the conductance and susceptance of the transducer. The impedance characteristic circle diagram of . The processor will obtain the resonant frequency and half-power frequency of the transducer according to the impedance characteristic chart, and then obtain the bandwidth and quality factor of the transducer. The processor obtains the dynamic resistance, dynamic capacitance and dynamic inductance of the transducer according to the circuit equivalent model and the impedance characteristic circle diagram of the transducer. The processor obtains the pairing parameters of the transducer to another transducer, and compares the pairing parameters of the two transducers. Change the internal pressure and flow of the test pipeline, and return to the step of obtaining the static capacitance and impedance characteristic curves of the transducer until the processor compares the paired parameters of the two transducers. Obtain the difference between the pairing parameters of the two transducers in the transducer pair under different pressures and flow rates. After obtaining all the transducer pairing parameters under the preset pressure and flow rate, according to the test accuracy to be achieved by the transducers It is required to determine the threshold corresponding to the difference of the paired parameters. Assuming that the threshold is 1% of the smaller pairing parameters of the two transducers, if there is a difference between one or more pairing parameters that is greater than the threshold, then the pairing of the two transducers is inconsistent; if the pairing parameters of the two transducers are inconsistent The difference does not exceed the threshold, then it can be determined that the parameters of the two transducers are consistent.

Using the above method can ensure the accuracy of data measurement, and the automatic data collection can greatly improve work efficiency and reduce work errors and work costs. In addition, the pairing parameters of the two transducers of the transducer pair are tested, so as to improve the consistency of the pairing of the two transducers of the transducer pair used for testing, and improve the testing accuracy of the ultrasonic flowmeter.

In one embodiment, a schematic diagram of the equivalent model simulation of the internal circuit of the transducer is shown in FIG. 3 . The circuit equivalent model includes: dynamic capacitance C _m , dynamic inductance L _m , dynamic resistance R _m , static resistance R ₀ and static capacitance C ₀ ; the first end of dynamic capacitance C _m is connected to the first end of dynamic inductance L _m , The second end of the dynamic capacitor C _m is connected to the first end of the dynamic resistance R _m , the first end of the static resistance R ₀ is connected to the first end of the dynamic inductance L _m , and the second end of the static resistance R ₀ is connected to the dynamic resistance R The second end of _m is connected, the first end of the static capacitor R ₀ is connected to the first end of the dynamic inductance L _m , and the second end of the static capacitor C ₀ is connected to the second end of the dynamic resistance R _m .

In one embodiment, as shown in FIG. 4 , a cabinet for automatic testing of transducer pairing performance is also provided, including: a capacitance meter for obtaining the static capacitance of each transducer (not shown in the figure) ; Impedance analysis equipment, used to obtain the impedance characteristic curve of each transducer (not shown in the figure); Circuit equivalent model, used to simulate the internal circuit structure of the transformer; Processor, used to perform automatic pairing performance of transducers Methods of testing; signal generators, used to provide electrical signal equipment of various frequencies, waveforms, and output levels; oscilloscopes, used for signal acquisition; power amplifiers, used to amplify signals from signal generators; monitors, used to output paired Result; industrial computer, used for the detection and calculation of data parameters.

In one embodiment, as shown in FIG. 5 , the capacitance meter 505 tests the static capacitance of the transducer, and the processor 506 obtains the test data of the capacitance meter; the impedance analysis device 504 tests the impedance characteristic curve of each transducer, and obtains the The curve of is displayed in the oscilloscope 507, and the processor calculates and obtains the impedance-admittance circle diagram of the transducer according to the curve.

In one embodiment, as shown in FIG. 5 , the processor 506 calculates the resonant frequency and the half-power point frequency of the transducer according to the impedance and admittance diagram of the transducer and the equivalent circuit model; The resonant frequency and the half-power point frequency determine the bandwidth and quality factor of the transducer; the processor 506 determines the dynamic resistance, dynamic capacitance and dynamic inductance of the transducer according to the impedance and admittance diagram and the equivalent circuit model of the transducer.

In one embodiment, as shown in FIG. 5 , the transducer test signal is sent by the signal generator 501, the signal is amplified by the power amplifier 502, and the transducer 503 receives the signal amplified by the power amplifier. The impedance analysis device 504 obtains the impedance characteristic curve of the transducer, and the impedance characteristic curve is shown on the oscilloscope. The processor 506 analyzes and calculates the impedance characteristic curve to obtain the impedance admittance chart of the susceptance and conductance of the transducer.

In one embodiment, as shown in FIG. 5 , after acquiring the pairing parameters of the two transducers of the transducer pair, the processor 507 performs analysis and calculation to confirm the pairing of the two transducers in the transducer pair. Whether the parameter difference exceeds the preset threshold. If the difference of one or more pairing parameters exceeds the preset threshold, the display 507 outputs pairing inconsistency; otherwise, the display 507 outputs the pairing consistency.

In one embodiment, the device for automatically testing the pairing performance of the transducers will output the final transducer pairing result to the display device provided in the cabinet.

In one embodiment, as shown in FIG. 6 , a pressure-flow device for changing the pressure and flow in the transducer testing pipeline is provided, and the device is used before the transducer pairing test or after completing a transducer pairing test , change the pressure in the transducer test pipeline. The pressure flow device includes a main circuit, a boost bypass branch, a nitrogen injection branch, and a venting branch. The main pipeline includes a first electric ball valve 601, a pressure sensing transmitter 602, a transducer fixing device 612, a standard flowmeter 603, a temperature sensing transmitter 604, and a second electric ball valve 605; the boost bypass branch Road, including a first valve 606 and a second valve 607, the first end of the first valve 606 is connected to the first electric ball valve 601, the second end of the first valve 606 is connected to the first end of the second valve 607, the second The second end of the valve 607 is connected to the main pipeline between the first electric ball valve 601 and the pressure sensor transmitter 602; the nitrogen injection branch includes the third valve 609 and the fourth valve 608, and the first valve of the third valve 609 The end is connected with the nitrogen storage device, the second end of the third valve 609 is connected with the first end of the fourth valve 608, and the second end of the fourth valve 608 is connected between the first electric ball valve 601 and the pressure sensor transmitter 602 The main pipeline is connected; the venting branch includes the fifth valve 611 and the sixth valve 610, the first end of the fifth valve 611 is in contact with the air, and the second end of the fifth valve 611 is connected with the first end of the sixth valve 610 , the second end of the sixth valve 610 is connected to the main pipeline between the second electric ball valve 605 and the temperature sensing transmitter 604 .

The specific pressure transformation steps are as follows: during the measurement process, close the electric ball valve 601, valve 606, valve 607 and valve 605, open valve 610 and valve 611, and vent the high-pressure natural gas in the main pipeline from the venting branch. Open the valve 608 and the valve 609, inject nitrogen, and discharge the natural gas in the main pipeline. When the concentration of the exhaust gas and natural gas is lower than a certain concentration, the valve 608 , the valve 609 , the valve 610 and the valve 611 are closed. Install the transducer under test on the fixture 612 . After the installation is completed, open the valve 608, the valve 609, the valve 610 and the valve 611, and then inject nitrogen gas to discharge the air brought in during the installation process out of the main pipeline. When the oxygen concentration of the gas discharged from the exhaust port of the venting branch is lower than the preset concentration, the valve 608 , the valve 609 , the valve 610 and the valve 611 are closed. Open valve 606 and valve 607 and slowly inject natural gas to boost the pressure of the main pipeline. When the internal pressure of the main pipeline reaches the preset pressure, close the valve 606 and the valve 607, and open the valve 601 and the valve 605. At this time, the main pipeline is turned on. By adjusting the opening of the downstream flow regulating valve (not shown in the figure) , control the flow in the main pipeline, and observe the values of the pressure sensor transmitter 602, the standard flowmeter 603, and the temperature sensor transmitter 604 at the same time. After the pressure and flow in the main pipeline are stabilized within the preset range, the transducer parameter pairing test is performed.

For example, the natural gas in the pipeline is first vented from the venting branch, and nitrogen is injected to isolate the natural gas from contacting with air. After installing the transducer, discharge the air that entered the main pipeline during the installation process to the main pipeline, and slowly inject natural gas into the boost bypass branch to boost the pressure of the main pipeline gas. When the pressure is 1MPa, close the boost bypass branch. valve. The flow and flow rate in the main pipeline are controlled by adjusting the opening of the downstream flow control valve. When the flow in the main pipeline to be adjusted is 2m ³ /h and the pressure flow fluctuation is less than 5%, the transducer pairing experiment is carried out. Open the automatic transducer pairing performance test cabinet, and use the capacitance meter in the automatic transducer pairing performance test cabinet to test the static capacitance of each transducer. Using impedance analysis equipment, obtain the impedance characteristic curve of each transducer. After obtaining the two data, the processor in the transducer pairing performance automatic test cabinet will analyze and calculate it according to the circuit equivalent model, and obtain the impedance and admittance chart of conductance and susceptance. The processor calculates the dynamic capacitance, dynamic inductance, dynamic resistance, bandwidth and quality factor of the two transducers based on the obtained impedance and admittance diagram. Change the pressure and flow in the test main circuit, and return to the capacitance meter to test the static capacitance of each transducer until the processor calculates the dynamic capacitance and dynamic inductance of the two transducers according to the obtained impedance and admittance chart. , dynamic resistance, bandwidth and quality factor. After completing all the transducer pairing performance tests under the preset pressure and flow rate, the test process ends. Assuming that the threshold is 2% of the smaller pairing parameter of the two transducers, if there is one or more pairing parameters whose difference is greater than the threshold, then the pairing of the two transducers is inconsistent; if the pairing parameters of the two transducers are different If the difference does not exceed the threshold, then the parameters of the two transducers are paired the same under the pressure flow. The transducer pairing performance automatic test device will output the final pairing performance result.

By using the above method, the pressure and flow of the test pipeline can be changed, so that the transducers can be paired under different loads, the consistency of the pairing of the two transducers of the transducer pair used for testing can be improved, and the test of the ultrasonic flowmeter can be improved. Accuracy.

The processor includes a kernel, and the kernel calls the corresponding program unit from the memory. One or more kernels can be set, and the method for automatic testing of transducer pairing performance under the condition of voltage transformation can be realized by adjusting kernel parameters.

Memory may include non-persistent memory in computer readable media, random access memory (RAM) and/or non-volatile memory, such as read only memory (ROM) or flash memory (flash RAM), the memory including at least one memory chip.

An embodiment of the present application provides a storage medium on which a program is stored, and when the program is executed by a processor, realizes the above-mentioned automatic testing method for transducer pairing parameters under voltage transformation conditions.

An embodiment of the present application provides a processor for running a program, wherein, when the program is running, the above-mentioned automatic testing method for transducer pairing parameters under voltage transformation conditions is executed.

In one embodiment, a computer device is provided, and the computer device may be a terminal, and its internal structure diagram may be as shown in FIG. 7 . The computer equipment includes a processor, a network interface, a display screen, an input device, and a memory (not shown) connected by a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes internal memory and non-volatile storage media. The nonvolatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the execution of the operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, the method for automatically testing the pairing performance of the transducer is realized. The display screen of the computer equipment may be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment may be a touch layer covered on the display screen, or a button, a trackball or a touchpad set on the shell of the computer equipment , or an external keyboard, trackpad, or mouse.

Those skilled in the art can understand that the structure shown in FIG. 7 is only a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the computer equipment to which the solution of the present application is applied. Include more or fewer components than shown in the figures, or combine certain components, or have a different arrangement of components.

An embodiment of the present application provides a device. The device includes a processor, a memory, and a program stored in the memory and running on the processor. When the processor executes the program, the following steps are implemented: acquiring the center of the transducer in the test pipeline. The static capacitance C ₀ and impedance characteristic curves of each transducer under different environmental parameters, including the pressure and flow in the test pipeline; determine each transducer according to the static capacitance and impedance characteristic curves of each transducer The impedance admittance chart of the susceptance and conductance of the transducer under each environmental parameter to determine the resonant frequency and half-power frequency of each transducer corresponding to each environmental parameter; according to the resonant frequency and The half-power frequency determines the bandwidth BW and quality factor Q of each transducer under each environmental parameter; determines the dynamic resistance R of each transducer under each environmental parameter through the circuit equivalent model and the impedance-admittance circle diagram _m , dynamic capacitance C _m and dynamic inductance L _m ; for each environmental parameter, compare the pairing parameters of the transducer pair under environmental parameters, the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R _m , dynamic capacitance C _m , dynamic inductance L _m , static capacitance C ₀ , resonant frequency; when the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed the preset threshold, Confirm that the pairing parameters of the two transducers are the same.

In one embodiment, determining the impedance-admittance chart of susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curves of each transducer includes: determining the susceptance B at different frequencies from the impedance characteristic curve and conductance G; for each transducer, the impedance admittance diagram of the transducer is determined according to the susceptance B, conductance G and static capacitance C ₀ of the transducer.

In one embodiment, after obtaining the impedance characteristic curve and the static capacitance, the expression of the impedance admittance chart is as formula (1):

where G is the conductance, B is the susceptance, R _m is the dynamic resistance, ω is the angular frequency, and C ₀ is the static capacitance of the transducer.

In one embodiment, the dynamic resistance R _m is calculated according to the formula (2), the dynamic inductance L _m is calculated according to the formula (3), and the dynamic capacitance C _m is calculated according to the formula (4);

R _m =1/G _max formula (2);

Among them, G _max is the maximum value of conductance G, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ and ω ₁ are f respectively The angular frequency corresponding to ₁ and the angular frequency corresponding to f ₂ , f _s is the series resonance frequency, which is the corresponding frequency when the conductance is maximum, and ω _s is the angular frequency corresponding to f _s .

In one embodiment, the bandwidth BW is calculated according to formula (5), and the quality factor Q is calculated according to formula (6);

BW=Δf=f ₂ -f ₁ formula (5);

Among them, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ , ω ₁ are the angular frequency corresponding to f ₁ and f ₂ respectively The corresponding angular frequency, f _s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω _s is the angular frequency corresponding to f _s .

In one embodiment, the circuit equivalent model includes: a dynamic capacitance C _m , a dynamic inductance L _m , a dynamic resistance R _m , a static resistance R ₀ and a static capacitance C ₀ ; the first end of the dynamic capacitance C _m and the dynamic inductance L _m The first end of the dynamic capacitor C _m is connected to the first end of the dynamic resistance R _m , the first end of the static resistance R ₀ is connected to the first end of the dynamic inductance L _m , and the first end of the static resistance R ₀ is connected to the first end of the dynamic inductance L m. The two terminals are connected to the second terminal of the dynamic resistor R _m , the first terminal of the static capacitor R ₀ is connected to the first terminal of the dynamic inductance L _m , and the second terminal of the static capacitor C ₀ is connected to the second terminal of the dynamic resistor R _m .

The present application also provides a computer program product, which, when executed on a data processing device, is adapted to execute a program initialized with the following method steps: Obtaining a different environment for each transducer in a pair of transducers in a test pipeline The static capacitance C ₀ and impedance characteristic curve under the parameters, the environmental parameters include the pressure and flow in the test pipeline; according to the static capacitance and impedance characteristic curve of each transducer, determine the electric power of each transducer under each environmental parameter. Impedance and admittance charts of susceptance and conductance to determine the resonant frequency and half-power frequency of each transducer corresponding to each environmental parameter; each transducer is determined from its resonant frequency and half-power frequency Bandwidth BW and quality factor Q under each environmental parameter; determine the dynamic resistance R _m , dynamic capacitance C _m and dynamic inductance of each transducer under each environmental parameter through the circuit equivalent model and the impedance admittance diagram L _m ; for each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameters, the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R _m , dynamic capacitance C _m , dynamic inductance L _m , static capacitance C ₀ , resonance frequency; in the case that the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed the preset threshold, confirm the pairing parameters of the two transducers Consistent.

In one embodiment, determining the impedance-admittance chart of susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curves of each transducer includes: determining the susceptance B at different frequencies from the impedance characteristic curve and conductance G; for each transducer, determine the impedance-admittance circle diagram of the transducer according to the susceptance B, conductance G, and static capacitance of the transducer.

In one embodiment, after obtaining the impedance characteristic curve and the static capacitance, the expression of the impedance admittance chart is as formula (1):

where G is the conductance, B is the susceptance, R _m is the dynamic resistance, ω is the angular frequency, and C ₀ is the static capacitance of the transducer.

In one embodiment, the dynamic resistance R _m is calculated according to the formula (2), the dynamic inductance L _m is calculated according to the formula (3), and the dynamic capacitance C _m is calculated according to the formula (4);

R _m =1/G _max formula (2);

Among them, G _max is the maximum value of conductance G, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ and ω ₁ are f respectively The angular frequency corresponding to ₁ and the angular frequency corresponding to f ₂ , f _s is the series resonance frequency, which is the corresponding frequency when the conductance is maximum, and ω _s is the angular frequency corresponding to f _s .

In one embodiment, the bandwidth BW is calculated according to formula (5), and the quality factor Q is calculated according to formula (6);

BW=Δf=f ₂ -f ₁ formula (5);

Among them, f ₁ and f ₂ are the half-power point frequencies, respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω ₂ , ω ₁ are the angular frequency corresponding to f ₁ and f ₂ respectively The corresponding angular frequency, f _s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω _s is the angular frequency corresponding to f _s .

In one embodiment, the circuit equivalent model includes: a dynamic capacitance C _m , a dynamic inductance L _m , a dynamic resistance R _m , a static resistance R ₀ and a static capacitance C ₀ ; the first end of the dynamic capacitance C _m and the dynamic inductance L _m The first end of the dynamic capacitor C _m is connected to the first end of the dynamic resistance R _m , the first end of the static resistance R ₀ is connected to the first end of the dynamic inductance L _m , and the first end of the static resistance R ₀ is connected to the first end of the dynamic inductance L m. The two terminals are connected to the second terminal of the dynamic resistor R _m , the first terminal of the static capacitor R ₀ is connected to the first terminal of the dynamic inductance L _m , and the second terminal of the static capacitor C ₀ is connected to the second terminal of the dynamic resistor R _m .

As will be appreciated by those skilled in the art, the embodiments of the present application may be provided as a method, a system, or a computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.

The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the present application. It will be understood that each flow and/or block in the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to the processor of a general purpose computer, special purpose computer, embedded processor or other programmable data processing device to produce a machine such that the instructions executed by the processor of the computer or other programmable data processing device produce Means for implementing the functions specified in a flow or flow of a flowchart and/or a block or blocks of a block diagram.

These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory result in an article of manufacture comprising instruction means, the instructions The apparatus implements the functions specified in the flow or flow of the flowcharts and/or the block or blocks of the block diagrams.

These computer program instructions can also be loaded on a computer or other programmable data processing device to cause a series of operational steps to be performed on the computer or other programmable device to produce a computer-implemented process such that The instructions provide steps for implementing the functions specified in the flow or blocks of the flowcharts and/or the block or blocks of the block diagrams.

In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.

Memory may include non-persistent memory in computer readable media, random access memory (RAM) and/or non-volatile memory in the form of, for example, read only memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.

Computer-readable media includes both persistent and non-permanent, removable and non-removable media, and storage of information may be implemented by any method or technology. Information may be computer readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read only memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), Flash Memory or other memory technology, Compact Disc Read Only Memory (CD-ROM), Digital Versatile Disc (DVD) or other optical storage, Magnetic tape cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, computer-readable media does not include transitory computer-readable media, such as modulated data signals and carrier waves.

It should also be noted that the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device comprising a series of elements includes not only those elements, but also Other elements not expressly listed, or which are inherent to such a process, method, article of manufacture, or apparatus are also included. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in the process, method, article of manufacture or apparatus that includes the element.

The above are merely examples of the present application, and are not intended to limit the present application. Various modifications and variations of this application are possible for those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this application shall be included within the scope of the claims of this application.

Claims (10)

1. A method for automatically testing transducer pairing performance under variable voltage conditions, the method comprising:

obtaining static capacitance C of each transducer in a transducer pair in a test pipe under different environmental parameters ₀ And an impedance characteristic curve, the environmental parameters including pressure and flow within the test conduit;

determining an impedance admittance circular diagram of susceptance and conductance of each transducer under each environmental parameter according to the static capacitance and impedance characteristic curve of each transducer so as to determine the resonant frequency and half-power frequency of each transducer corresponding to each environmental parameter;

determining a bandwidth BW and a quality factor Q of each transducer at each environmental parameter from the resonant frequency and the half-power frequency of each transducer;

determining the dynamic resistance R of each transducer under each environmental parameter through a circuit equivalent model and the impedance admittance chart _m Dynamic capacitor C _m And a dynamic inductor L _m ；

For each environmental parameter, comparing pairing parameters of the transducer pair under the environmental parameter, wherein the pairing parameters comprise bandwidth BW, quality factor Q and dynamic resistance R _m Dynamic capacitor C _m Dynamic inductor L _m Static capacitor C ₀ A resonant frequency;

and confirming that the pairing parameters of the two transducers are consistent under the condition that the difference value between the pairing parameters of the two transducers in the transducer pair under all the environmental parameters does not exceed a preset threshold value.

2. The method of claim 1, wherein determining an impedance admittance chart of susceptance and conductance for each transducer from the static capacitance and impedance characteristics of each transducer comprises:

determining susceptance B and conductance G under different frequencies according to the impedance characteristic curve;

for each transducer, determining an impedance admittance chart of the transducer from the susceptance B, the conductance G, and the static capacitance of the transducer.

3. The method for testing pairing performance of the transducer under the transformation condition according to claim 2, wherein the expression of the impedance admittance circular diagram is as shown in formula (1):

wherein G is conductance, B is susceptance, R _m Is a dynamic resistance, omega is an angular frequency, C ₀ Is the static capacitance of the transducer.

4. The method for testing transducer pairing performance under voltage transformation condition according to claim 1, wherein the dynamic resistance R is calculated according to formula (2) _m Calculating the dynamic inductance L according to the formula (3) _m Calculating the dynamic capacitance C according to equation (4) _m ；

R _m ＝1/G _max Formula (2);

wherein G is _max Is the maximum value of conductance G, f ₁ 、f ₂ Are half-power point frequencies, respectively, the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, omega ₂ 、ω ₁ Are respectively f ₁ Corresponding angular frequency sum f ₂ Corresponding angular frequency, f _s Is the series resonance frequency, ω, which is the frequency corresponding to the maximum conductance _s Is f _s Corresponding angular frequency.

5. The method for testing transducer pairing performance under the transformation condition according to claim 1, wherein the bandwidth BW is calculated according to formula (5), and the quality factor Q is calculated according to formula (6);

BW＝Δf＝f ₂ -f ₁ formula (5);

wherein f is ₁ 、f ₂ Are half-power point frequencies, respectively, the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, omega ₂ 、ω ₁ Are respectively f ₁ Corresponding angular frequency sum f ₂ Corresponding angular frequency, f _s Is the series resonance frequency, ω, which is the frequency at which the conductance is maximum _s Is f _s Corresponding angular frequency.

6. The method of claim 1, wherein the circuit equivalent model comprises: dynamic capacitance C _m Dynamic inductor L _m Dynamic resistance R _m Static resistance R ₀ And a static capacitor C ₀ ；

The dynamic capacitor C _m First terminal of and the dynamic inductor L _m Is connected to the first terminal of the dynamic capacitor C _m And the second terminal of (2) and the dynamic resistor R _m Is connected to the first terminal of the static resistor R ₀ First terminal of and the dynamic inductor L _m Is connected to the first terminal of the resistor, the static resistor R ₀ And the second terminal of (2) and the dynamic resistor R _m To the second terminal of the capacitor, the static capacitor R ₀ First terminal of and the dynamic inductor L _m Is connected to the first terminal of the static capacitor C ₀ And the second terminal of (2) and the dynamic resistor R _m Is connected to the second end of the first housing.

7. A processor configured to perform the method of transducer pairing performance automatic testing under varying voltage conditions according to any one of claims 1 to 6.

8. An apparatus for automated testing of transducer pairing performance, comprising:

the capacitance meter is used for acquiring the static capacitance of each transducer;

impedance analysis equipment for acquiring an impedance characteristic curve of each transducer;

the pressure flow device is used for changing the pressure and the flow in the transducer testing pipeline;

the processor of claim 7.

9. The transducer pairing performance testing apparatus of claim 8, the pressure flow device comprising:

the main pipeline sequentially comprises a first electric ball valve, a pressure sensing transmitter, a transducer fixing device, a standard flowmeter, a temperature sensing transmitter and a second electric ball valve;

the boost bypass branch comprises a first valve and a second valve, wherein the first end of the first valve is connected with the first electric ball valve, the second end of the first valve is connected with the first end of the second valve, and the second end of the second valve is connected with a main pipeline between the first electric ball valve and the pressure sensing transmitter;

the nitrogen injection branch comprises a third valve and a fourth valve, wherein the first end of the third valve is connected with a nitrogen storage device, the second end of the third valve is connected with the first end of the fourth valve, and the second end of the fourth valve is connected with a main pipeline between the first electric ball valve and the pressure sensing transmitter;

and the emptying branch comprises a fifth valve and a sixth valve, wherein the first end of the fifth valve is in contact with air, the second end of the fifth valve is connected with the first end of the sixth valve, and the second end of the sixth valve is connected with a main pipeline between the second electric ball valve and the temperature sensing transmitter.

10. A machine readable medium having stored thereon instructions which, when executed by a machine, cause the machine to perform the transducer pairing performance test method of any one of claims 1 to 6 under varying pressure conditions.

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