CN114201072B - Calibration method, device, equipment and storage medium of touch chip - Google Patents
Calibration method, device, equipment and storage medium of touch chip Download PDFInfo
- Publication number
- CN114201072B CN114201072B CN202111432983.2A CN202111432983A CN114201072B CN 114201072 B CN114201072 B CN 114201072B CN 202111432983 A CN202111432983 A CN 202111432983A CN 114201072 B CN114201072 B CN 114201072B
- Authority
- CN
- China
- Prior art keywords
- calibration value
- calibration
- frequency
- target
- touch chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000012360 testing method Methods 0.000 claims abstract description 97
- 238000013142 basic testing Methods 0.000 claims abstract description 36
- 238000013101 initial test Methods 0.000 claims abstract description 8
- 239000003990 capacitor Substances 0.000 claims description 6
- 238000004891 communication Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000012163 sequencing technique Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002783 friction material Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012806 monitoring device Methods 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Human Computer Interaction (AREA)
- Electronic Switches (AREA)
Abstract
The invention discloses a calibration method, a device, equipment and a storage medium of a touch chip, wherein the method comprises the steps of obtaining basic test frequency of each basic RC calibration value of the touch chip to be calibrated; determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of testing, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the quick and accurate calibration of the touch chip is realized.
Description
Technical Field
The present invention relates to the field of semiconductor technologies, and in particular, to a method, an apparatus, a device, and a storage medium for calibrating a touch chip.
Background
At present, each touch chip is provided with a frequency for normal operation at normal temperature, but the natural frequencies of the chips are different from each other inevitably in the production process of the touch chips. In order to enable the touch chips with different natural frequencies to normally work at the same frequency at normal temperature, the touch chips need to be calibrated before leaving a factory. The existing calibration method is to continuously test based on the intermediate value, and continuously change the next calibration value in the analysis of the test result so as to continuously approach the target value until a satisfactory result is obtained.
Disclosure of Invention
The invention provides a method, a device, equipment and a storage medium for calibrating a touch chip, which aim to simplify and improve the efficiency and accuracy of chip calibration.
In order to achieve the above object, the present invention provides a method for calibrating a touch chip, the method being applied to a calibration device of the touch chip, the method comprising: the method is applied to the calibration equipment of the touch control chip, and comprises the following steps:
Acquiring basic test frequency of each basic RC (Resistor-capacitor) calibration value of a touch chip to be calibrated;
Determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency;
determining a target calibration value range based on the initially selected RC calibration value;
And determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
Preferably, the step of determining a preliminary selected RC calibration value from the base RC calibration values based on the difference between the base test frequency and the ideal frequency comprises:
And calculating the basic test frequency difference value of each basic test frequency and the ideal frequency, and determining the basic RC calibration value corresponding to the basic test frequency with the minimum basic test frequency difference value as the primary RC calibration value.
Preferably, the step of determining a target calibration value range based on the initially selected RC calibration value comprises:
Determining a calibration value interval in which the initially selected RC calibration value is located as a target calibration value range;
the step of determining a target calibration value range based on the initially selected RC calibration value further comprises:
Sequentially setting the test RC calibration values of the touch chip to be calibrated as a plurality of primary RC calibration values in the target calibration value range;
and after the frequency test is carried out, recording the primary selection test frequency corresponding to the plurality of primary selection RC calibration values.
Preferably, the step of determining, as the target RC calibration value, a candidate RC calibration value having a first selected test frequency closest to the ideal frequency from the target calibration value range includes:
comparing the primary selected test frequency of each primary selected RC calibration value within the target calibration value range with the ideal frequency;
and determining a primary RC calibration value corresponding to the primary test frequency with the smallest difference as the target RC calibration value.
Preferably, before the step of determining the primary selected RC calibration value corresponding to the primary selected test frequency with the smallest difference as the target RC calibration value, the method further includes:
And comparing the difference value corresponding to the initial selection test frequency with the smallest difference value with a preset difference value, and if the difference value is larger than the preset difference value, sending out warning information.
Preferably, the step of obtaining the basic test frequency of each basic RC calibration value of the touch chip to be calibrated further includes:
setting the basic RC calibration value of the touch chip to be calibrated, and dividing a plurality of calibration value intervals based on the basic RC calibration value.
Preferably, the step of determining, as the target RC calibration value, a candidate RC calibration value having a first selected test frequency closest to the ideal frequency from the target calibration value range further includes:
And acquiring the limited frequency of the operation of the touch chip to be calibrated, and performing frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
In addition, in order to achieve the above object, an embodiment of the present invention further provides a calibration device for a touch chip, where the calibration device for a touch chip includes:
The acquisition module is used for acquiring basic test frequencies of various basic RC (Resistor-capacitor) calibration values of the touch chip to be calibrated;
A first determining module, configured to determine a primary selected RC calibration value from the base RC calibration values based on a difference between the base test frequency and an ideal frequency;
The second determining module is used for determining a target calibration value range based on the initially selected RC calibration value;
And a third determining module, configured to determine, from the target calibration value range, a candidate RC calibration value with a first selected test frequency closest to the ideal frequency as a target RC calibration value.
In addition, in order to achieve the above objective, an embodiment of the present invention further provides a calibration device for a touch chip, including a memory, a processor, and a calibration program for the touch chip stored in the memory, where the calibration program for the touch chip is executed by the processor to implement the steps of the method as described above.
In addition, to achieve the above object, an embodiment of the present invention further provides a computer readable storage medium, where a calibration program of a touch chip is stored, where the calibration program of the touch chip is executed by a processor to implement the steps of the method as described above.
Compared with the prior art, the method, the device, the equipment and the storage medium for calibrating the touch chip provided by the invention comprise the steps of obtaining basic test frequencies of basic RC calibration values of the touch chip to be calibrated; determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of testing, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the quick and accurate calibration of the touch chip is realized.
Drawings
Fig. 1 is a schematic hardware structure diagram of a calibration device for a touch chip according to embodiments of the present invention;
FIG. 2 is a flowchart of a calibration method of a touch chip according to a first embodiment of the present invention;
FIG. 3 is a flowchart of a second embodiment of a method for calibrating a touch chip according to the present invention;
Fig. 4 is a schematic functional block diagram of a calibration device for a touch chip according to a first embodiment of the invention.
The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The embodiment of the invention mainly relates to a calibration device of a touch chip, which is used for calibrating the touch chip, wherein the calibration device of the touch chip can test the frequency of the touch chip through a STM32 and other microcontrollers. ST is an intentional semiconductor group (SGS-THOMSON), M is an abbreviation for Microelectronics, 32 represents 32 bits, STM32 is a 32 bit microcontroller developed by ST company. STM32 belongs to a microcontroller, and is provided with various common communication interfaces, can be connected with sensors with various functions, and can control various types of equipment.
The touch control in the touch control chip related to the embodiment of the invention refers to a single-point or multi-point touch control technology; the chip is IC (Integrated Circuit Chip), which refers to a metal sheet or a nonmetal sheet with end surfaces capable of being integrated with the friction lining and the friction material layer, generally refers to all electronic components, and is a circuit module which integrates various electronic components on a silicon plate to realize a certain specific function. It is the most important part of the electronic equipment, and bears the functions of operation and storage. The application range of the touch chip covers almost all electronic equipment for military and civil use. The silicon wafer, which contains the integrated circuit, is small and often part of a computer or other device.
The production process of the touch chip is complex, and although the manufacturing process from raw materials to finished products is mature, precise control can be realized, the frequency of the touch chip manufactured by the same standard and the same process can be different. Therefore, the touch chip needs to be calibrated before leaving the factory so as to ensure the subsequent normal and stable use.
Referring to fig. 1, fig. 1 is a schematic hardware structure diagram of a calibration device for a touch chip according to various embodiments of the present invention. In an embodiment of the present invention, the calibration device of the touch chip may include a processor 1001 (e.g. a central processing unit Central Processing Unit, a CPU), a communication bus 1002, an input port 1003, an output port 1004, and a memory 1005. Wherein the communication bus 1002 is used to enable connected communications between these components; the input port 1003 is used for data input; the output port 1004 is used for data output, and the memory 1005 may be a high-speed RAM memory or a stable memory (non-volatile memory), such as a disk memory, and the memory 1005 may be an optional storage device independent of the processor 1001. Those skilled in the art will appreciate that the hardware configuration shown in fig. 1 is not limiting of the invention and may include more or fewer components than shown, or may combine certain components, or a different arrangement of components.
With continued reference to fig. 1, the memory 1005 in fig. 1, which is a readable storage medium, may include an operating system, a network communication module, an application program module, and a calibration program for a touch chip. In fig. 1, the network communication module is mainly used for connecting with a server and performing data communication with the server; the processor 1001 is configured to call a calibration program of the touch chip stored in the memory 1005, and perform the following operations:
Acquiring basic test frequency of each basic RC (Resistor-capacitor) calibration value of a touch chip to be calibrated;
Determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency;
determining a target calibration value range based on the initially selected RC calibration value;
And determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
The calibration device based on the touch chip provides a first embodiment of the calibration method of the touch chip. Referring to fig. 2, fig. 2 is a flowchart illustrating a calibration method of a touch chip according to a first embodiment of the invention.
As shown in fig. 1, a first embodiment of the present invention proposes a method for calibrating a touch chip, where the method is applied to a calibration device of the touch chip, and the method includes:
step S101, obtaining basic test frequency of each basic RC (Resistor-capacitor) calibration value of a touch chip to be calibrated;
The touch chip comprises an RC circuit, the RC circuit is correspondingly provided with an RC register for frequency calibration, the size of the RC register is 8 bits, the adjustable range (hexadecimal) is 0-FF, and 256 (decimal) values can be set, namely 256 frequencies are correspondingly arranged. Generally, each chip has an ideal frequency, for example, a touch chip of 16MHZ is required.
The frequency of the touch chip can be obtained by the STM32 in this embodiment. Specifically, the calibration value in the RC register in the touch chip to be calibrated is set to a designated calibration value, then a test signal is input, the test frequency of the touch chip to be calibrated is detected by the SMT32, and then the test frequency is transmitted to the calibration device of the touch chip, so that the calibration device of the touch chip can calibrate based on the received test frequency.
Before testing a touch chip to be calibrated, setting the basic RC calibration value of the touch chip to be calibrated, for example, under hexadecimal, setting the basic RC calibration value of an RC register to 9 values (x 1-x9): 40. 50, 60, 70, 80, 90, A0, B0, C0. And dividing a plurality of calibration value intervals based on the basic RC calibration value. The respective basic calibration values may be taken as the mid-points of the intervals, and the calibration value intervals set respectively are 36-45, 46-55, 56-66, etc.
After the setting of the basic calibration values is completed, the calibration value of the RC register of the touch chip to be calibrated is set as one of the basic calibration values, then a test signal is input, the test frequency under the basic calibration value is detected through the SMT32, and the test frequency is sent to the calibration equipment of the touch chip. It will be appreciated that the number of basic frequency tests per round depends on the number of basic calibration values, and if there are 9 basic calibration values, then 9 tests are required. In actual production, more or fewer basic calibration values can be set according to factors such as production conditions, use requirements and the like of the chip.
Step S102, determining a primary RC calibration value from the basic RC calibration value based on the difference value between the basic test frequency and the ideal frequency;
And after each basic test frequency is obtained, calculating a basic test frequency difference value between each basic test frequency and the ideal frequency, and determining a basic RC calibration value corresponding to the basic test frequency with the minimum basic test frequency difference value as a primary RC calibration value.
Specifically, a basic test frequency difference value (Δf 1＝f1x-f0, x is the number of basic test frequencies) between each basic test frequency (f 11-f1x) and the ideal frequency (f 0) is calculated. And then sequencing the basic test frequency differences from large to small or from small to large, determining the basic test frequency with the minimum basic difference based on the sequencing result, determining the basic RC calibration value as the result of the basic frequency test of the round, and marking the basic RC calibration value as a primary RC calibration value (v ').
Step S103, determining a target calibration value range based on the initially selected RC calibration value;
And after the primary RC standard value is determined, determining a calibration value interval in which the pre-divided primary RC calibration value is positioned as a target calibration value range. For example, if the determined initial RC calibration value (v ') is 60, then the corresponding 56-66 is determined as the target calibration value range. It will be appreciated that, since in the first round of basic frequency testing, it has been determined that the basic test frequency corresponding to the preliminary selected RC calibration value is closest to the ideal frequency, the best calibration value should also be before and after the preliminary selected RC calibration value, i.e. in the calibration value interval in which the preliminary selected RC calibration value is located.
After the calibration value interval is determined, sequentially setting the calibration value of an RC register in the touch chip as a plurality of primary RC calibration values in the target calibration value range; then, inputting test signals, obtaining primary selection test frequencies of the primary selection RC calibration values of the second round of test through the SMT32, respectively inputting the test signals, and recording the primary selection test frequencies corresponding to a plurality of the primary selection RC calibration values. The number of the initial calibration value tests corresponds to the number of the calibration values in the target interval, and if 16 calibration values exist, 16 tests are performed.
Step S104, determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
Specifically, comparing the primary selected test frequency (f 21-f2n, n is the number of primary selected RC calibration values) of each primary selected RC calibration value within the target calibration value range with the ideal frequency (f 0); and determining a primary RC calibration value corresponding to the primary test frequency with the smallest primary test frequency difference (Deltaf 2＝f2n-f0) as the target RC calibration value (v 0).
Theoretically, by the method provided by the embodiment, it can be determined that the calibration value of each touch chip has obtained the optimal working frequency. However, some touch chips generate damage that is difficult to repair during the production process, so that it is difficult to obtain a good operating frequency regardless of calibration. In this embodiment, the difference value corresponding to the initially selected test frequency with the smallest difference value is compared with a preset difference value, if the difference value is larger than the preset difference value, the corresponding touch control chip is indicated to be poor in quality, and good working frequency cannot be achieved, so that warning information is sent out for operators to further screen the touch control chip. Therefore, the scheme can also be used for eliminating inferior touch chips, and the yield of the touch chips from the factory can be improved.
It will be appreciated that in other embodiments, after a base or preliminary test frequency is obtained that differs from the ideal frequency by 0, the test may be stopped and the corresponding calibration value determined to be the target RC calibration value. Therefore, after the ideal frequency is obtained, the test is stopped, so that useless labor is avoided, the purpose of frequency calibration is achieved, and resources are saved.
According to the embodiment, through the scheme, basic test frequencies of basic RC calibration values of the touch chip to be calibrated are obtained; determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of testing, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the quick and accurate calibration of the touch chip is realized.
As shown in fig. 2, a second embodiment of the present invention provides a method for calibrating a touch chip, based on the first embodiment shown in fig. 1, the step of determining, from the target calibration value range, a candidate RC calibration value with a first selected test frequency closest to the ideal frequency as a target RC calibration value further includes:
step S105: and acquiring the limited frequency of the operation of the touch chip to be calibrated, and performing frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
The touch chip can emit heat in the operation process, the heat is not timely emitted, the temperature of the chip can be increased, the performance of the touch chip can be restricted after the temperature is increased, and even equipment carried by the touch chip can be burnt out when the temperature is increased seriously. In general, when the temperature of the touch chip reaches a certain threshold, the frequency of the touch chip is limited, and the frequency of the touch chip is limited necessarily so as to sacrifice the performance of the chip. When the chip is put into use, the relation between the working frequency and the temperature is generally controlled by various methods, and even the chip is forced to be shut down so as to protect equipment. Considering that the use environments of different devices are different, the embodiment considers the environment parameters before the touch control chip leaves the factory, so that the service life of the chip is prolonged, and the accuracy of chip calibration can be improved from the use angle.
In this embodiment, the limiting frequency of the operation of the touch chip to be calibrated is obtained in advance, where the limiting frequency includes a high-temperature limiting frequency and a low-temperature limiting frequency. For example, some chips used for indoor equipment, the working environment temperature is generally 20-25 ℃; the chip used for the refrigeration house equipment can be at-10-0 ℃; the chip for some outdoor units may be 30-40 c. Before production, the use place of the chip to be calibrated can be generally known, and the highest temperature and the lowest temperature of the chip capable of working normally can be predicted based on the use place and the heat dissipation coefficient of the touch chip during normal working. And after the highest temperature and the lowest temperature are determined, the ideal frequency is replaced by the limited high frequency and the limited low frequency on the premise of protecting the normal use of the touch control chip. And calibrating with the limited high frequency and the limited low frequency respectively to obtain corresponding limited high frequency calibration values and limited low frequency calibration values.
Specifically, the calibration value in the RC register in the touch chip to be calibrated is set to a designated calibration value, then a test signal is input, the test frequency of the touch chip to be calibrated is detected by the SMT32, and then the test frequency is transmitted to the calibration device of the touch chip, so that the calibration device of the touch chip can calibrate based on the received test frequency. Test procedure and two rounds of test referred to in example 1: and (3) testing the basic frequency and the initial fixed frequency, and only replacing the ideal frequency with the limited high frequency and the limited low frequency to screen corresponding calibration values.
Further, the environmental parameters further include a continuous use duration. The duration of use for an environmental monitoring device may be thousands of hours, while the duration of use for some portable devices may be only a few hours. Therefore, in other embodiments, the long-to-use calibration value may also be set based on the long-to-use time, and in general, the operating frequency of the long-to-use touch chip may be lower, so that a low ideal frequency is set, and then the basic frequency test and the initial frequency test are performed to obtain the RC calibration value capable of prolonging the service life of the touch chip.
According to the scheme, the limiting frequency of the operation of the touch chip to be calibrated is obtained, the frequency test is carried out based on the limiting frequency, the limiting RC calibration value serving as the touch chip to be calibrated is obtained, the RC calibration value of the touch chip is secondarily adjusted based on the actual operation environment parameters of the touch chip on the basis of determining the RC calibration value, and therefore the touch chip can be calibrated quickly and accurately, and the service life of the touch chip can be prolonged.
Further, to achieve the above objective, the present invention further provides a calibration device for a touch chip, specifically, referring to fig. 4, fig. 4 is a schematic functional block diagram of a first embodiment of a calibration device for a touch chip according to the present invention, where the device includes:
An obtaining module 10, configured to obtain a basic test frequency of each basic RC (Resistor-capacitor) calibration value of a touch chip to be calibrated;
A first determining module 20, configured to determine a primary selected RC calibration value from the base RC calibration values based on a difference between the base test frequency and an ideal frequency;
a second determining module 30 for determining a target calibration value range based on the initially selected RC calibration value;
A third determining module 40 is configured to determine, from the target calibration value range, a candidate RC calibration value with a first selected test frequency closest to the ideal frequency as a target RC calibration value.
Further, the first determining module includes:
And the first determining unit is used for calculating the basic test frequency difference value between each basic test frequency and the ideal frequency and determining a basic RC calibration value corresponding to the basic test frequency with the minimum basic test frequency difference value as a primary RC calibration value.
Further, the second determining module includes:
and the second determining unit is used for determining the calibration value interval where the initially selected RC calibration value is located as a target calibration value range.
Further, the second determining module further includes:
the setting unit is used for sequentially setting the test RC calibration values of the touch chip to be calibrated as a plurality of primary RC calibration values in the target calibration value range;
and the primary selection test frequency recording unit is used for recording primary selection test frequencies corresponding to the plurality of primary selection RC calibration values after the frequency test is carried out.
Further, the third determining module includes:
the first comparison unit is used for comparing the primary selection test frequency of each primary selection RC calibration value in the target calibration value range with the ideal frequency;
and the third determining unit is used for determining the primary RC calibration value corresponding to the primary test frequency with the smallest difference as the target RC calibration value.
Further, the third determining module further includes:
and the second comparison unit is used for comparing the difference value corresponding to the initial selection test frequency with the minimum difference value with a preset difference value, and sending out warning information if the difference value is larger than the preset difference value.
Further, the acquisition determining module further includes:
And acquiring the limited frequency of the operation of the touch chip to be calibrated, and performing frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
Further, the third determining module further includes:
And the correction unit is used for acquiring the environmental parameters of the operation of the touch chip to be calibrated, and taking a multiplier of the target RC calibration value and the environmental correction factor as the working RC calibration value of the touch chip to be calibrated.
In addition, the invention further provides a computer readable storage medium, the computer readable storage medium stores a calibration program of the touch chip, and the calibration program of the touch chip realizes the steps of the calibration method of the touch chip when being run by the processor, which are not described herein.
Compared with the prior art, the invention discloses a calibration method, a device, equipment and a storage medium of a touch chip, wherein the method comprises the steps of obtaining basic test frequencies of basic RC calibration values of the touch chip to be calibrated; determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of testing, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the quick and accurate calibration of the touch chip is realized.
The foregoing description is only of the preferred embodiments of the present invention and is not intended to limit the scope of the invention, and all equivalent structures or modifications in the structures or processes described in the specification and drawings, or the direct or indirect application of the present invention to other related technical fields, are included in the scope of the present invention.
Claims (9)
1. A method for calibrating a touch chip, the method being applied to a calibration device of the touch chip, the method comprising:
Acquiring calibration values of each basic RC (Resistor-capacitor) of a touch chip to be calibrated, and setting the calibration value of an RC register of the touch chip to be calibrated as one of the basic RC calibration values successively; testing and obtaining basic test frequencies under the basic RC calibration values;
Determining a preliminary RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency;
determining a target calibration value range based on the initially selected RC calibration value;
Determining a candidate RC calibration value with the initial test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value;
the step of determining a target calibration value range based on the initially selected RC calibration value comprises:
Determining a calibration value interval in which the initially selected RC calibration value is located as a target calibration value range;
the step of determining a target calibration value range based on the initially selected RC calibration value further comprises:
Sequentially setting the test RC calibration values of the touch chip to be calibrated as a plurality of primary RC calibration values in the target calibration value range;
and after the frequency test is carried out, recording the primary selection test frequency corresponding to the plurality of primary selection RC calibration values.
2. The method of claim 1, wherein the step of determining a preliminary RC calibration value from the base RC calibration value based on the difference between the base test frequency and an ideal frequency comprises:
And calculating the basic test frequency difference value of each basic test frequency and the ideal frequency, and determining the basic RC calibration value corresponding to the basic test frequency with the minimum basic test frequency difference value as the primary RC calibration value.
3. The method of claim 1, wherein the step of determining, from the target calibration value range, a candidate RC calibration value having a preliminary test frequency closest to the ideal frequency as a target RC calibration value comprises:
comparing the primary selected test frequency of each primary selected RC calibration value within the target calibration value range with the ideal frequency;
and determining a primary RC calibration value corresponding to the primary test frequency with the smallest difference as the target RC calibration value.
4. The method of claim 3, wherein the step of determining as the target RC calibration value the preliminary selected RC calibration value corresponding to the preliminary selected test frequency having the smallest difference further comprises:
And comparing the difference value corresponding to the initial selection test frequency with the smallest difference value with a preset difference value, and if the difference value is larger than the preset difference value, sending out warning information.
5. The method of claim 1, wherein the step of obtaining a base test frequency for each base RC calibration value of the touch chip to be calibrated further comprises:
setting the basic RC calibration value of the touch chip to be calibrated, and dividing a plurality of calibration value intervals based on the basic RC calibration value.
6. The method of claim 1, wherein the step of determining, from the target calibration value range, a candidate RC calibration value having a preliminary test frequency closest to the ideal frequency as a target RC calibration value further comprises:
And acquiring the limited frequency of the operation of the touch chip to be calibrated, and performing frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
7. The utility model provides a calibrating device of touch chip which characterized in that, the calibrating device of touch chip includes:
The device comprises an acquisition module, a calibration module and a calibration module, wherein the acquisition module is used for acquiring each basic RC (resistance-Capacitance) calibration value of a touch chip to be calibrated, and setting the calibration value of an RC register of the touch chip to be calibrated as one of the basic RC calibration values successively; testing and obtaining basic test frequencies under the basic RC calibration values;
A first determining module, configured to determine a primary selected RC calibration value from the base RC calibration values based on a difference between the base test frequency and an ideal frequency;
The second determining module is used for determining a target calibration value range based on the initially selected RC calibration value;
a third determining module, configured to determine, from the target calibration value range, a candidate RC calibration value with a first selected test frequency closest to the ideal frequency as a target RC calibration value;
the step of determining a target calibration value range based on the initially selected RC calibration value comprises:
Determining a calibration value interval in which the initially selected RC calibration value is located as a target calibration value range;
the step of determining a target calibration value range based on the initially selected RC calibration value further comprises:
Sequentially setting the test RC calibration values of the touch chip to be calibrated as a plurality of primary RC calibration values in the target calibration value range;
and after the frequency test is carried out, recording the primary selection test frequency corresponding to the plurality of primary selection RC calibration values.
8. A calibration device for a touch chip, comprising a memory, a processor and a calibration program for the touch chip stored on the memory, which calibration program for the touch chip, when run by the processor, implements the steps of the method according to any of claims 1-6.
9. A computer readable storage medium, characterized in that the computer readable storage medium has stored thereon a calibration program for a touch chip, which calibration program when run by a processor realizes the steps of the method according to any of claims 1-6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111432983.2A CN114201072B (en) | 2021-11-29 | 2021-11-29 | Calibration method, device, equipment and storage medium of touch chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111432983.2A CN114201072B (en) | 2021-11-29 | 2021-11-29 | Calibration method, device, equipment and storage medium of touch chip |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114201072A CN114201072A (en) | 2022-03-18 |
| CN114201072B true CN114201072B (en) | 2024-07-19 |
Family
ID=80649450
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111432983.2A Active CN114201072B (en) | 2021-11-29 | 2021-11-29 | Calibration method, device, equipment and storage medium of touch chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114201072B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102918481A (en) * | 2010-03-29 | 2013-02-06 | 电子触控产品解决方案公司 | Method for detecting a sustained contact and corresponding device |
| CN103150076A (en) * | 2013-03-28 | 2013-06-12 | 苏州瀚瑞微电子有限公司 | Method for realizing initial calibration of touch chip |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4249831B2 (en) * | 1998-12-21 | 2009-04-08 | 株式会社アドバンテスト | Timing calibration method, timing calibration apparatus, and IC test apparatus equipped with this timing calibration apparatus |
| JP5734805B2 (en) * | 2011-10-12 | 2015-06-17 | 株式会社ジャパンディスプレイ | Display device, driving circuit, driving method, and electronic apparatus |
| KR20130119280A (en) * | 2012-04-23 | 2013-10-31 | 한국전자통신연구원 | System and method for auto-calibration of integrated circuit chips at wafer level |
| DE102013014175B4 (en) * | 2013-08-26 | 2018-01-11 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Method for calibrating a measurement setup |
| CN106610755B (en) * | 2016-11-02 | 2019-09-20 | 广州视源电子科技股份有限公司 | Touch screen calibration method and device |
| CN106909252B (en) * | 2017-03-02 | 2019-12-06 | 京东方科技集团股份有限公司 | touch screen frequency point calibration device and method, touch screen and display device |
| KR102377846B1 (en) * | 2017-10-30 | 2022-03-24 | 엘지디스플레이 주식회사 | Touch driving circuit, touch controller and touch display device |
| CN109002207A (en) * | 2018-07-04 | 2018-12-14 | 深圳市文鼎创数据科技有限公司 | A kind of touch chip calibration method, electronic equipment and storage medium |
| CN113498162B (en) * | 2020-04-08 | 2024-02-02 | 炬芯科技股份有限公司 | Frequency offset calibration system and method |
-
2021
- 2021-11-29 CN CN202111432983.2A patent/CN114201072B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102918481A (en) * | 2010-03-29 | 2013-02-06 | 电子触控产品解决方案公司 | Method for detecting a sustained contact and corresponding device |
| CN103150076A (en) * | 2013-03-28 | 2013-06-12 | 苏州瀚瑞微电子有限公司 | Method for realizing initial calibration of touch chip |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114201072A (en) | 2022-03-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8270994B2 (en) | Applications of signal quality observations | |
| US7221991B2 (en) | System and method for monitoring manufacturing apparatuses | |
| KR20040067875A (en) | Methods and apparatus for semiconductor testing | |
| CN103199041B (en) | Management system of wafer acceptable test procedure and application method thereof | |
| CN103885218B (en) | A kind of detection method of substrate and pick-up unit | |
| WO2006014479A2 (en) | Data collection and analysis system | |
| CN114201072B (en) | Calibration method, device, equipment and storage medium of touch chip | |
| CN105518654A (en) | K-nearest neighbor-based method and system to provide multi-variate analysis on tool process data | |
| CN115825797A (en) | Power supply performance test method and related assembly | |
| CN108243439B (en) | Method and system for locating mobile internet data service quality degradation | |
| US7254462B2 (en) | Method and system for measuring a figure of a workpiece | |
| CN101871978A (en) | Method, system and device for determining position of interference source | |
| WO2024002031A1 (en) | Chip temperature test method and apparatus | |
| CN115792583B (en) | Method, device, equipment and medium for testing vehicle-gauge chip | |
| JP2005532754A (en) | Using signal characteristic observations | |
| CN117642707A (en) | Data processing method and device, data display method and device, equipment and medium | |
| US20050075824A1 (en) | Auto-test system for testing the stability of a computer device | |
| CN101651583B (en) | Monitoring information management method and device | |
| US6763313B2 (en) | System and method for measuring an object | |
| CN112235866A (en) | Method, equipment and medium for automatically selecting optimal transmission frequency point in RTK base station | |
| CN113702204B (en) | Prediction method and system for advanced high-temperature alloy endurance strength for high-parameter power station | |
| CN116525482B (en) | Method for calibrating semiconductor detection equipment | |
| JP2017500777A (en) | Method and apparatus for minimizing drive test | |
| WO2023097580A1 (en) | Method and apparatus for predicting lifetime of integrated circuit, and computer-readable storage medium | |
| CN117943893B (en) | Method and device for measuring thermal elongation of main shaft rotating cutter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20240126 Address after: Room 409, 4th Floor, Building 1, No. 199 Weikang Road, Xiangzhou District, Zhuhai City, Guangdong Province, 519000 Applicant after: Zhuhai Hongpeihan Electronic Technology Co.,Ltd. Country or region after: China Address before: 2501, 2401, block a, building 1, Shenzhen new generation industrial park, 136 Zhongkang Road, Meidu community, Meilin street, Futian District, Shenzhen, Guangdong 518000 Applicant before: Shenzhen deminli Technology Co.,Ltd. Country or region before: China |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |