CN113506590B - An independent and precise temperature-controlled solid-state hard disk aging test module - Google Patents
An independent and precise temperature-controlled solid-state hard disk aging test module Download PDFInfo
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- CN113506590B CN113506590B CN202110811755.XA CN202110811755A CN113506590B CN 113506590 B CN113506590 B CN 113506590B CN 202110811755 A CN202110811755 A CN 202110811755A CN 113506590 B CN113506590 B CN 113506590B
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- state disk
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- 230000032683 aging Effects 0.000 title claims abstract description 56
- 238000012360 testing method Methods 0.000 title claims abstract description 44
- 238000010438 heat treatment Methods 0.000 claims abstract description 16
- 239000007787 solid Substances 0.000 claims description 36
- 210000001503 joint Anatomy 0.000 claims description 8
- 230000000670 limiting effect Effects 0.000 claims description 6
- 238000001125 extrusion Methods 0.000 claims description 5
- 238000009423 ventilation Methods 0.000 claims description 3
- 230000000712 assembly Effects 0.000 claims description 2
- 238000000429 assembly Methods 0.000 claims description 2
- 238000003032 molecular docking Methods 0.000 abstract 2
- 238000003825 pressing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 229960000074 biopharmaceutical Drugs 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- Testing Of Individual Semiconductor Devices (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
本发明涉及一种独立精确控温固态硬盘老化测试模组，包含壳体、风道尾管、抽风风扇和载具；所述壳体、风道尾管和抽风风扇从前往后依次连通；所述壳体呈扁平状，前部设置有开口的老化室，后部设置有上下间隔放置的控制室；所述老化室的内端设置有对接测试插头，顶部和底部分别设置有加热片，内部还设置有温度传感器；所述载具可滑动的插入老化室内，并使待测固态硬盘的插口与对接测试插头连接；所述载具位于两片加热片之间，并形成与风道尾管连通的风道；本发明通过在载具的顶部和底部形成与风道尾管连通的风道，以及配合两片加热片，能独立对固态硬盘精确温控，提高测试精准度，且具有结构简单紧凑、体积小巧等优点。
The present invention relates to an independent and precise temperature-controlled solid-state hard disk aging test module, comprising a shell, an air duct tail pipe, an exhaust fan and a carrier; the shell, the air duct tail pipe and the exhaust fan are connected in sequence from front to back; the shell is flat, with an open aging chamber at the front and a control chamber spaced apart at the back; a docking test plug is provided at the inner end of the aging chamber, heating plates are provided at the top and bottom respectively, and a temperature sensor is also provided inside; the carrier can be slidably inserted into the aging chamber, and the socket of the solid-state hard disk to be tested is connected to the docking test plug; the carrier is located between two heating plates, and forms an air duct connected to the air duct tail pipe; the present invention forms an air duct connected to the air duct tail pipe at the top and bottom of the carrier, and cooperates with two heating plates, so as to independently and precisely control the temperature of the solid-state hard disk, improve the test accuracy, and has the advantages of simple and compact structure and small size.
Description
Technical Field
The invention relates to the technical field of high-temperature aging tests, in particular to an independent and accurate temperature control solid state disk aging test module.
Background
The high-temperature aging test equipment is equipment for testing high-temperature and severe environments simulated by high-performance electronic products, is important experimental equipment for improving the stability and reliability of the products, is an important production process for improving the quality and the competitiveness of the products of various production enterprises, and is widely applied to the fields of power electronics, computers, communication, bio-pharmaceuticals and the like.
With the rapid development of the solid state disk industry, the performance requirements on test equipment are higher and higher, so that a plurality of solid state disk high-temperature aging test equipment, such as an SSD solid state disk aging test cabinet disclosed by the prior art 201821206547.7, and a solid state disk high-temperature aging test equipment disclosed by the prior art 202020508858.X, are arranged on the market, and in the prior art, a plurality of solid state disks are tested in a high temperature box at the same time, and the temperature control is uneven after the solid state disk is carried by high Wen Xiangdai, so that the solid state disks often have uneven temperature steps, the solid state disk performance is caused, the test effect and the result accuracy are influenced, and the solid state disk reliability test equipment is applied to a large-scale high-temperature test equipment disclosed by the prior art 201721456171.0, and has huge size and occupies a large laboratory area.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide an independent and accurate temperature control solid state disk aging test module.
In order to achieve the aim, the technical scheme adopted by the invention is that the aging test module of the independent and accurate temperature control solid state disk comprises a shell, an air duct tail pipe, an exhaust fan and a carrier;
The shell, the air duct tail pipe and the exhaust fan are sequentially communicated from front to back;
the shell is flat, the front part of the shell is provided with an aging chamber with an opening, and the rear part of the shell is provided with a control chamber which is arranged at intervals up and down;
the inner end of the aging chamber is provided with a butt joint test plug, the top and the bottom are respectively provided with a heating plate, and the inside is also provided with a temperature sensor;
the control chamber is respectively connected with the butt-joint test plug, the heating plate, the temperature sensor and the exhaust fan;
the carrier is slidably inserted into the aging chamber, the socket of the solid state disk to be tested is connected with the butt joint test plug, and the carrier is positioned between the two heating plates and forms an air duct communicated with the tail pipe of the air duct.
Preferably, the two sides of the aging chamber are respectively provided with a horizontally placed guide strip, and the two sides of the carrier are respectively provided with a guide chute corresponding to the guide strips.
Preferably, the outer ends of the two guide strips are respectively provided with a guide part which is inclined outwards.
Preferably, clamping grooves are respectively arranged on two sides of an inlet of the aging chamber, and locking components which can extend into the clamping grooves are respectively arranged on two sides of a handle of the carrier.
Preferably, each group of lock catch components comprises a containing groove arranged in the carrier handle and a lock block which is arranged in the containing groove and is in an F shape, wherein the lock block comprises a lock body, a lock head which is arranged outside the lock body and can extend into the clamping groove, a limiting part which is arranged inside the lock body and can prevent the lock block from sliding out of the containing groove, an extrusion part which is arranged on the lock body and can extend out of the carrier handle, a guide pillar which is arranged inside the extrusion part and is parallel to the lock body, and a spring which is sleeved on the guide pillar and drives the lock head to move towards the clamping groove.
Preferably, a chamfer is arranged on the inner side of the lock head.
Preferably, both sides and the top and the bottom of the inlet of the aging chamber are provided with guide surfaces which are arranged obliquely outwards.
Preferably, two sides of the control room are respectively provided with ventilation openings which are oppositely arranged.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
1. according to the invention, through the ultra-narrow air duct design and the cooperation of two heating plates, the solid state disk can be independently and accurately temperature-controlled, the temperature control precision can reach 1 ℃, and the test precision is improved;
2. The invention has the advantages of simple and compact structure, small volume and the like by forming the air duct communicated with the air duct tail pipe at the top and the bottom of the carrier;
3. the invention has the whole modularized design, can be stacked and placed, and is convenient for rapid assembly.
Drawings
The technical scheme of the invention is further described below with reference to the accompanying drawings:
FIG. 1 is a schematic structural diagram of an independent accurate temperature control solid state disk aging test module according to the invention;
FIG. 2 is a vertical sectional view of an independent accurate temperature control solid state disk aging test module according to the invention;
FIG. 3 is a cross-sectional view of the aging test module of the independent precise temperature control solid state disk in the horizontal direction;
FIG. 4 is an enlarged view of a portion of FIG. 2 at A;
FIG. 5 is an enlarged view of a portion of FIG. 3 at A;
fig. 6 is a schematic structural diagram of the carrier after the solid state disk is mounted in the present invention.
Wherein, 1, a shell; 11, clamping grooves, 12, ventilation openings, 13, a control room, 14, a butt joint test plug, 15, a heating plate, 16, an air duct, 17, a guide strip, 18, a guide part, 19, a guide surface, 2, an air duct tail pipe, 3, an exhaust fan, 4, a carrier, 41, a containing groove, 42, a lock body, 43, a lock head, 44, a limiting part, 45, an extrusion part, 46, a guide pillar, 47, a spring, 48, a guide chute, 49, a handle, 5, a solid state disk, 51 and a socket.
Detailed Description
The invention will be described in further detail with reference to the accompanying drawings and specific examples.
Fig. 1-6 are diagrams showing an independent accurate temperature control solid state disk aging test module, which comprises a shell 1, an air duct tail pipe 2, an induced draft fan 3 and a carrier 4;
The shell 1, the air duct tail pipe 2 and the exhaust fan 3 are sequentially communicated from front to back;
the shell 1 is flat, the front part is provided with an aging chamber with an opening, and the rear part is provided with a control chamber 13 which is arranged at intervals up and down;
the inner end of the aging chamber is provided with a butt joint test plug 14, the top and the bottom are respectively provided with a heating plate 15, and the inside is also provided with a temperature sensor;
The control room 13 is respectively connected with the butt-joint test plug 14, the heating plate 15, the temperature sensor and the exhaust fan 3 in a wire way;
The carrier 4 is slidably inserted into the aging chamber and enables the socket 51 of the solid state disk 5 to be tested to be connected with the butt joint test plug 14, the carrier 4 is positioned between the two heating plates 15 and forms an air duct 16 communicated with the air duct tail pipe 2, and the air duct has a gap of only 1 mm.
During operation, a worker inserts the carrier 4 provided with the solid state disk 5 to be tested into the aging chamber, connects the socket 51 of the solid state disk 5 to be tested with the butt joint test plug 14, then controls the temperature of the solid state disk 5 to be tested independently and accurately through the control chamber 13, heats the solid state disk 5 to reach the set temperature through the two heating plates 15 when the temperature sensor detects that the temperature in the aging chamber is lower than the set temperature, dissipates heat through the air draft fan 3 when the temperature sensor detects that the temperature in the aging chamber is higher than the set temperature, and reaches the set temperature, and the temperature control precision can reach 1 ℃, so that the accurate temperature control of the solid state disk 5 and the accurate result of the aging test are realized.
Furthermore, the two sides of the aging chamber are respectively provided with the horizontally placed guide strips 17, the two sides of the carrier 4 are respectively provided with the guide sliding grooves 48 corresponding to the guide strips 17, when the carrier 4 is inserted into the aging chamber, the guide strips 17 at the two sides of the aging chamber are respectively positioned in the guide sliding grooves 48 at the two sides of the carrier 4, so that the guiding function is achieved, the carrier 4 can be ensured to be positioned in the middle of the two heating plates 15, and the temperature is more uniform.
Further, the outer ends of the two guide strips 17 are respectively provided with a guide part 18 which is inclined outwards, so that the guide parts play a role in guiding, and the guide strips 17 at the two sides of the aging chamber conveniently slide into the guide sliding grooves 48 at the two sides of the carrier 4.
Furthermore, the two sides of the inlet of the aging chamber are respectively provided with a clamping groove 11, the two sides of the handle 49 of the carrier 4 are respectively provided with a locking component which can extend into the clamping grooves 11, and the carrier 4 can be fixed in the aging chamber through the locking component and the clamping grooves 11 to achieve a limiting effect.
Further, each group of the latch assemblies comprises a containing groove 41 arranged in the handle 49 and a locking block which is arranged in the containing groove 41 and takes the shape of F; the lock block comprises a lock body 42, a lock head 43 arranged outside the lock body 42 and capable of extending into the clamping groove 11, a limiting part 44 arranged inside the lock body 42 and preventing the lock block from sliding out of the accommodating groove 41, a pressing part 45 arranged on the lock body 42 and capable of extending out of the clamping groove 11, a guide pillar 46 arranged inside the pressing part 45 and parallel to the lock body 42, and a spring 47 sleeved on the guide pillar 46 and driving the lock head 43 to move into the clamping groove 11, wherein when the carrier 4 is inserted into an aging chamber, the lock head 43 extends into the clamping groove 11 under the elasticity of the spring 47 so as to fix the carrier 4 in the aging chamber, when the carrier 4 is required to be taken out from the aging chamber, the pressing part 45 is pressed down, the lock body 42 is moved away from the clamping groove 11 against the elasticity of the spring 47, the lock head 43 is then pulled out of the clamping groove 11, finally the pressing part 45 is released, the lock body 42 is driven to return to the initial position under the elasticity of the spring 47, and simultaneously the lock block is prevented from sliding out of the accommodating groove 41 under the action of the limiting part 44.
Further, a chamfer is arranged on the inner side of the lock head 43, so that the lock head 43 can conveniently extend into the clamping groove 11.
Further, both sides and top and bottom of ageing room entry all are provided with the guide surface 19 that outwards inclines to place, play the guide effect, and the carrier 4 of being convenient for stretches into the ageing room.
Further, the two sides of the control chamber 13 are respectively provided with a vent 12 which is placed opposite to each other, so as to play a role in heat dissipation and facilitate the reduction of the temperature in the control chamber 13.
The foregoing is merely a specific application example of the present invention, and the protection scope of the present invention is not limited in any way. All technical schemes formed by equivalent transformation or equivalent substitution fall within the protection scope of the invention.
Claims (8)
1. An independent accurate temperature control solid state disk aging test module is characterized by comprising a shell, an air duct tail pipe, an induced draft fan and a carrier;
The shell, the air duct tail pipe and the exhaust fan are sequentially communicated from front to back;
the shell is flat, the front part of the shell is provided with an aging chamber with an opening, and the rear part of the shell is provided with a control chamber which is arranged at intervals up and down;
the inner end of the aging chamber is provided with a butt joint test plug, the top and the bottom are respectively provided with a heating plate, and the inside is also provided with a temperature sensor;
the control chamber is respectively connected with the butt-joint test plug, the heating plate, the temperature sensor and the exhaust fan;
the carrier is slidably inserted into the aging chamber, the socket of the solid state disk to be tested is connected with the butt joint test plug, and the carrier is positioned between the two heating plates and forms an air duct communicated with the tail pipe of the air duct.
2. The aging testing module for the independent precise temperature control solid state disk of claim 1, wherein guide strips horizontally arranged are respectively arranged on two sides of the aging chamber, and guide sliding grooves corresponding to the guide strips are respectively arranged on two sides of the carrier.
3. The aging testing module of the independent precise temperature control solid state disk of claim 2, wherein the outer ends of the two guide strips are respectively provided with a guide part which is arranged in an outward inclined way.
4. The aging testing module for the independent precise temperature control solid state disk according to any one of claims 1 to 3, wherein clamping grooves are respectively formed in two sides of an inlet of the aging chamber, and locking components capable of extending into the clamping grooves are respectively arranged on two sides of a handle of the carrier.
5. The aging testing module of the independent precise temperature control solid state disk of claim 4, wherein each group of lock catch assemblies comprises a containing groove arranged in a carrier handle and an F-shaped lock block arranged in the containing groove, wherein each lock block comprises a lock body, a lock head arranged outside the lock body and capable of extending into a clamping groove, a limiting part arranged inside the lock body and preventing the lock block from sliding out of the containing groove, an extrusion part arranged on the lock body and capable of extending out of the carrier handle, a guide pillar arranged inside the extrusion part and parallel to the lock body, and a spring sleeved on the guide pillar and driving the lock head to move into the clamping groove.
6. The aging testing module of the independent precise temperature control solid state disk of claim 5, wherein a chamfer is arranged on the inner side of the lock head.
7. The aging testing module of the independent precise temperature control solid state disk of claim 6, wherein guide surfaces which are obliquely arranged outwards are arranged on two sides, the top and the bottom of the inlet of the aging chamber.
8. The aging testing module of an independent and accurate temperature control solid state disk of claim 7, wherein the two sides of the control room are respectively provided with ventilation openings which are oppositely arranged.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110811755.XA CN113506590B (en) | 2021-07-19 | 2021-07-19 | An independent and precise temperature-controlled solid-state hard disk aging test module |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110811755.XA CN113506590B (en) | 2021-07-19 | 2021-07-19 | An independent and precise temperature-controlled solid-state hard disk aging test module |
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| CN113506590A CN113506590A (en) | 2021-10-15 |
| CN113506590B true CN113506590B (en) | 2025-02-18 |
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| CN115754686B (en) * | 2023-01-09 | 2023-04-14 | 法特迪精密科技（苏州）有限公司 | Temperature cycle aging test socket and test method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN216084329U (en) * | 2021-07-19 | 2022-03-18 | 苏州欧康利信息技术有限公司 | Independent accurate temperature control solid state hard drives aging testing module |
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| JP5795744B2 (en) * | 2012-03-15 | 2015-10-14 | アンリツ株式会社 | Measuring apparatus and measuring method |
| KR20170040897A (en) * | 2015-10-06 | 2017-04-14 | 주식회사 스토리지안 | Ssd doubler with multiple interface ports and the multi-device bay system for it |
| CN107680635B (en) * | 2017-11-04 | 2023-12-08 | 深圳市时创意电子有限公司 | Large-scale high-temperature test equipment applied to solid state disk reliability test |
| CN208444602U (en) * | 2018-07-27 | 2019-01-29 | 深圳市高盛试验设备有限公司 | A kind of SSD solid state hard disk burn-in test cabinet |
| TWI839362B (en) * | 2019-07-09 | 2024-04-21 | 智邦科技股份有限公司 | Burn in chamber |
| CN211788187U (en) * | 2020-04-09 | 2020-10-27 | 深圳市时创意电子有限公司 | Solid state hard drives high temperature aging testing equipment |
| CN112562779A (en) * | 2020-12-07 | 2021-03-26 | 苏州浪潮智能科技有限公司 | Solid state disk aging test device and method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN216084329U (en) * | 2021-07-19 | 2022-03-18 | 苏州欧康利信息技术有限公司 | Independent accurate temperature control solid state hard drives aging testing module |
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