CN113484643A - Electronic structural component cold and hot impact test method and test equipment - Google Patents
Electronic structural component cold and hot impact test method and test equipment Download PDFInfo
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- CN113484643A CN113484643A CN202110780882.8A CN202110780882A CN113484643A CN 113484643 A CN113484643 A CN 113484643A CN 202110780882 A CN202110780882 A CN 202110780882A CN 113484643 A CN113484643 A CN 113484643A
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Abstract
The invention discloses a cold and hot impact test method and test equipment for an electronic structural member, and the cold and hot impact test method and test equipment comprise a base plate and a first test box, wherein a combined sliding groove is formed in the top of the base plate, a sliding block is connected to the inside of the combined sliding groove in a sliding mode, a rotating disc is installed at the top of the sliding block, an upright rod is installed at the top of the rotating disc, two groups of electric telescopic rods which are symmetrically arranged are installed on the surface of the upright rod, a threaded rod is connected to the tail end of each electric telescopic rod in a threaded mode, a placing frame is installed at the bottom of each threaded rod, and the surface, far away from the electric telescopic rods, of each placing frame is provided with the first test box and the second test box which are symmetrically arranged. The invention can detect and analyze the specific performance of the electronic structural part when the electronic structural part is subjected to a cold and hot impact test by arranging the first test box and the second test box, and can judge the performance of the electronic structural part material by observing the color change condition and the precipitation generation condition of the solution in the reagent bottle by arranging the detection plate and the reagent bottle.
Description
Technical Field
The invention relates to the technical field of cold and hot shock testing, in particular to a cold and hot shock testing method and testing equipment for an electronic structural part.
Background
In the process of rapid temperature change, damage to the product due to expansion with heat and contraction with cold or other reasons is detected, the test is called as cold-hot impact test, the adaptability of the electronic structural component to rapid change of ambient temperature can be tested through the cold-hot impact test, the design and process defects of the electronic structural component product can be found in the engineering development stage, and the method has important experimental significance in the aspects of promoting the electronic structural component product and performance in the later stage.
The existing cold and hot impact test equipment has the defects that:
1. reference CN211527677U discloses a cold-hot impact test device for temperature sensors, the device includes a high temperature furnace, one side of the high temperature furnace is provided with a fixture for mounting the temperature sensors, and a driving mechanism for driving the fixture to reciprocate, the fixture drives the temperature sensors to stretch into and withdraw from the high temperature furnace, and one side of the driving mechanism is provided with an air cooler for blowing air to the temperature sensors. The utility model discloses a high temperature furnace, air-cooler are drawn temperature sensor's abrupt range big, and temperature variation rate improves to the material fatigue that the cold and hot impact of aggravation leads to, has increased the test number of times in the unit interval through actuating mechanism, shortens test cycle with this, but the device is when carrying out cold and hot impact test, only to the fatigue resistance ability detection of electronic structure material, fail to detect to whether the normal operation of electronic structure continues, lead to the test result comparatively to limit;
2. the comparison document CN108469393A discloses a cold and hot impact test device, "including: the heating device is connected with the cooling device through a pipeline, two ends of the pipeline respectively extend into the heating device and the cooling device, a valve body for controlling the on-off of the pipeline is arranged on the pipeline, a carrying cylinder is arranged in the pipeline in a sliding mode, and the carrying cylinder is connected with a conveying mechanism for driving the carrying cylinder to reciprocate back and forth so as to convey the carrying cylinder into the heating device or the cooling device; the cold and hot impact test equipment with the structure utilizes the pipeline to transmit the object carrying cylinder for placing the workpiece, the communication between the heating device and the cooling device is isolated through the valve body, the cold and hot conversion process and the impact recovery time are short, the test equipment is small in size, low in cost, high in energy utilization efficiency and simple and convenient to operate, so that the test equipment with high cost performance is provided for the workpiece with small size needing the cold and hot impact test, but when the cold and hot impact test is carried out, the heat resistance of the electronic structural part cannot be detected in the heat resistance test process, and the detection result is not comprehensive;
3. the comparison document CN105841936A discloses a thermostat cold-hot impact test system, "comprising: the device comprises a cold and hot impact chamber, a thermostat suspended in the cold and hot impact chamber, a displacement sensor and a water spraying pipe; the hot water tank, the first pipeline, the spray pipe, the cold and hot impact chamber and the second pipeline form a thermal impact loop, the hot water pump and the first electromagnetic valve are connected in series on the first pipeline, and the first pipeline is provided with a first temperature sensor and a first pressure sensor; the cold impact loop consists of a cold water tank, a third pipeline, a water spray pipe, a cold and hot impact chamber and a fourth pipeline, wherein the third pipeline is connected with a cold water pump and a second electromagnetic valve in series and is provided with a second temperature sensor and a second pressure sensor; the control unit controls the first electromagnetic valve and the second electromagnetic valve to be opened or closed alternately, so that one of the hot impact loop and the cold impact loop is opened and the other is closed. The device has the advantages that the rapid switching between different temperature boundary conditions is realized, the opening and closing speed and the change condition of the thermostat can be accurately measured, but the multi-range switching cannot be realized in the range of cold and hot impact inside the cold and hot impact chamber of the device, so that the cold and hot impact test range of the device is not comprehensive enough, and the data accuracy of the test performance is low.
Disclosure of Invention
The invention aims to provide a method and a device for testing cold and hot shock of an electronic structural part, so as to solve the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme: the cold and hot impact testing equipment for the electronic structural part comprises a base plate and a first testing box, wherein a combined sliding groove is formed in the top of the base plate, a sliding block is connected inside the combined sliding groove in a sliding mode, a rotating disc is installed at the top of the sliding block, a vertical rod is installed at the top of the rotating disc, two groups of electric telescopic rods which are symmetrically arranged are installed on the surface of the vertical rod, a threaded rod is connected to the tail end of each electric telescopic rod in a threaded mode, a placing frame is installed at the bottom of each threaded rod, and the surface, away from the electric telescopic rods, of the placing frame is provided with the first testing box and the second testing box which are symmetrically arranged;
the inside of a test box and No. two test boxes all is equipped with the intermediate layer, interbedded internally mounted has the heat preservation dottle pin, the panel is installed to the back wall of a test box, the ampere meter is installed to the inside diapire of a test box, the warning lamp is installed to one side inner wall of a test box, and warning lamp and ampere meter electric connection.
Preferably, one side outer wall of a test box and No. two test boxes all runs through and installs the protection hose, and the inner wall of protection hose encircles and installs the heat preservation cotton, the voltmeter is installed to the inside diapire of No. two test boxes, the alarm is installed to one side inner wall of No. two test boxes, and alarm and voltmeter electric connection.
Preferably, the high temperature test case is installed to top one side of bed plate, the survey test panel is all installed to the both sides outer wall of high temperature test case, one side surface mounting who keeps away from the high temperature test case of survey test panel has two sets of fixed blocks of staggering from top to bottom arranging, the reagent bottle is installed at the top of fixed block, the division board is installed to the inner wall of reagent bottle, independent second solution chamber and first solution chamber about the division board falls into with reagent bottle inner space, silver nitrate solution has been deposited to the inside in first solution chamber, bromine aqueous solution has been deposited to the inside in second solution chamber, the inside of division board is run through and is installed the breather pipe, and the tail end of breather pipe extends to the inside of trying the high temperature test case, the body surface that the breather pipe is located second solution chamber is equipped with the blow vent.
Preferably, cascaded low temperature test box is installed to the opposite side at bed plate top, and cascaded low temperature test box and high temperature test box symmetrical arrangement, cascaded low temperature test box's internally mounted has No. two insulation boards that three equidistance of group were arranged, and one of them is a set of No. two insulation boards are close to one side surface mounting of cascaded low temperature test box inner wall has the fan, frozen water mixing box, dry refrigerator and liquid nitrogen case are installed to the roof of cascaded low temperature test box, and frozen water mixing box, dry refrigerator and liquid nitrogen case and No. two insulation board interval arrangements of three groups, No. two control panels are installed to one side outer wall of cascaded low temperature test box, the surface mounting of No. two control panels has the control valve of arranging from top to bottom of three groups.
Preferably, the board of placing of two sets of symmetrical arrangement is installed at the top of bed plate, and two sets of both sides that are located cascaded low temperature test box respectively of placing the board, the bracing piece is all installed in the top four corners of placing the board, the cover plate is installed at the top of bracing piece, and the inside of cover plate is hollow transparent structure, CCD camera and protruding board of passing through are installed to the bottom equidistance of cover plate, and protruding board and CCD camera interval arrangement of passing through.
Preferably, the inside of the combined sliding chute is composed of sliding chutes which are staggered transversely and longitudinally.
Preferably, the internally mounted of high temperature test case has a thermal-insulated board that three equidistance of group were arranged, the heating otter board is all installed to the both sides outer wall of thermal-insulated board, a control panel is installed to one side outer wall of high temperature test case, the surface mounting of a control panel has four control knob of arranging from top to bottom of group, control knob and every group heating otter board electric connection, high temperature test case) is close to a side surface of combination spout and is equipped with a test import that four equidistance of group were arranged.
Preferably, the discharging pipes are installed at the bottoms of the dry refrigerator and the liquid nitrogen box, the electronic valves are installed on the surfaces of the discharging pipes, and the control valves are respectively electrically connected with the fan, the electronic valves on the surfaces of the discharging pipes at the bottoms of the dry refrigerator and the liquid nitrogen box.
Preferably, the surface of one side of the stepped low-temperature test box, which is close to the combined sliding chute, is provided with four groups of second test inlets which are arranged at equal intervals.
Preferably, the working steps of the test device are as follows:
s1, when the test equipment is used for carrying out corresponding cold and hot impact, the electronic structural part can be placed in the placing frame, then the electronic structural part is connected to the bottom of the electric telescopic rod through the threaded rod, and the connecting lead in the protective hose is connected to the surface of the binding post on the surface of the electronic structural part to form a closed circuit;
s2, immediately adjusting the temperature inside four independent cavities isolated by three groups of first temperature insulation plates inside the high-temperature test box according to the test temperature requirement, and creating a precondition for the test equipment to perform thermal tests under different high-temperature conditions;
s3, simultaneously, according to the test requirements, adjusting the power of a fan, adjusting the temperature state of a cavity inside the fan to be kept at a zero-upper low-temperature state, wherein the temperature of an ice-water mixture stored inside an ice-water mixing box is zero, so that the internal temperature of the area where the ice-water mixing box inside the stepped low-temperature test box is located can be zero, and the internal temperature of the cavity where the dry refrigerator is located can reach subzero through dry ice released by the dry refrigerator;
s4, firstly, contracting the electric telescopic rod in one step to enable the length of the electric telescopic rod to be smaller than the distance between the upright rod and the high-temperature test box and the stepped low-temperature test box, rotating the upright rod, selecting a corresponding chute channel in the combined chute as required, then starting the electric telescopic rod to enable the tail end of the electric telescopic rod to extend, driving the placing frame to simultaneously enter the cavities with corresponding temperatures in the high-temperature test box and the stepped low-temperature test box through the first test inlet and the second test inlet respectively, and receiving corresponding temperature tests;
s5, when a high-temperature test is carried out, when the cable surface layer and the plastic synthetic substance on the surface of the electronic structural part placed inside the placing frame cannot meet the corresponding high-temperature resistant requirement, the cable surface layer and the plastic synthetic substance are softened and melted, at the moment, the internal mixed gas is transmitted into the reagent bottle through the vent pipe extending into the high-temperature test box and is sequentially contacted with the solutions inside the first solution cavity and the second solution cavity, the bromine water solution can fade due to formaldehyde contained in the mixed gas, the hydrogen chloride gas in the mixed gas can react with silver ions in the silver nitrate solution after being dissolved in the liquid to generate precipitates, and the strength of the high-temperature resistant performance of the electronic structural part inside the test equipment can be judged by judging the color and precipitation generation condition of the solution inside the reagent bottle;
s6, after the electronic structural component in the placing frame is subjected to corresponding high-temperature and low-temperature tests, repeating the step 4, and then realizing cold-heat exchange of the testing environment, wherein in the process, whether the internal circuit of the electronic structural component can normally work under the condition of cold-heat alternate impact can be judged by observing the current and voltage conditions in the first testing box and the second testing box under the condition of heat insulation, and then the performance of the electronic structural component under the environment of cold-heat impact of the electronic structural component is tested;
s7, after the cold and hot impact structure, taking out the electronic structural part placed inside the frame, placing the surface of the board, observing whether the surface of the electronic structural part is obviously deformed or not through the amplification effect of the convex transparent board, detecting whether the surface of the electronic structural part is slightly deformed or not through a CCD camera, detecting whether the appearance of the electronic structural part is deformed or not during cold and hot impact test, and judging whether the performance of the manufacturing material of the electronic structural part is good or not.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention is provided with a first test box, a second test box, a heat preservation spacer, a protection hose, a voltmeter, an alarm, an ammeter, an alarm lamp and a battery panel, wherein the heat preservation spacer can avoid the damage of high-temperature or low-temperature environment of a placing frame to related components in the first test box and the second test box, so as to ensure the stable proceeding of the test operation, the heat preservation cotton in the protection hose also has the function of heat preservation, so as to prevent the internal connecting cable from being influenced by the high-temperature and low-temperature environment, ensure the smooth circuit connection, when the electronic structural member in the placing frame is subjected to cold and heat impact test, if the electronic structural member can not resist the cold and heat impact, the circuit board on the surface of the electronic structural member is damaged, at the moment, the ammeter and the battery panel can not form a passage, at the moment, the alarm lamp is lightened, if the electronic structural member is influenced by the cold and heat impact, the normal operation of the electronic structural member is disturbed, at the moment, the indication number of the voltmeter is weakened, the alarm is further prompted to send an alarm prompt, and the specific condition of the electronic structural part can be judged when the electronic structural part receives the cold and hot shock test through the states of the alarm and the warning lamp.
2. The invention is provided with a test board, a reagent bottle, a vent pipe, a first solution cavity and a second solution cavity, under the high temperature state, when the cable surface layer on the surface of the electronic structural member and the plastic synthetic substance can not meet the corresponding high temperature resistant requirement, the cable and the plastic synthetic substance can generate the softening and melting phenomenon, because the cable and the plastic synthetic substance are made of high molecular polymers, the interior of the cable and the plastic synthetic substance can generate the mixed gas containing formaldehyde and hydrogen chloride after melting, at the moment, the internal mixed gas is transmitted to the interior of the reagent bottle through the vent pipe extending into the interior of the high temperature test box and is contacted with the solutions in the first solution cavity and the second solution cavity in sequence, the formaldehyde contained in the mixed gas can lead the bromine water solution to fade, the hydrogen chloride gas in the mixed gas can react with the silver ions in the silver nitrate solution after being dissolved in the liquid to generate the precipitate, and by judging the color of the solution in the reagent bottle and the generation condition of the precipitate, the strength of the high-temperature resistance of the electronic structural part in the test equipment can be judged.
3. The invention can avoid the mutual exchange of the heat inside four cavities inside the stepped low-temperature test box and ensure the constancy of the low-temperature environment by installing the stepped low-temperature test box, the second control board, the fan, the ice water mixing box, the dry refrigerator, the liquid nitrogen box, the second heat insulation board and the second test inlet, and the heat insulation material is filled inside the second heat insulation board.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic view of the mounting structure of the electric telescopic rod, the placing frame, the first test box and the second test box of the present invention;
FIG. 3 is a schematic view of the high temperature test chamber and test board mounting structure of the present invention;
FIG. 4 is a schematic diagram of the structure at A in FIG. 3 according to the present invention;
FIG. 5 is a schematic view of the internal cross-sectional mounting structure of the reagent bottle of the present invention;
FIG. 6 is a schematic view of the internal installation structure of the stepped low temperature testing box of the present invention;
FIG. 7 is a schematic view of a front mounting structure of the stepped low temperature testing box of the present invention;
FIG. 8 is a schematic view of the internal installation structure of the second test box of the present invention;
FIG. 9 is a schematic view of a first embodiment of the present invention;
fig. 10 is a schematic view of the cover plate, the convex transparent plate and the CCD camera mounting structure of the present invention.
In the figure: 1. a base plate; 101. a combined chute; 102. a slider; 2. erecting a rod; 201. an electric telescopic rod; 3. placing the frame; 301. a threaded rod; 4. a high temperature test box; 401. a first heat insulation plate; 402. a first control panel; 403. heating the screen plate; 404. test import No. one; 5. a test board; 501. a fixed block; 502. a reagent bottle; 503. a breather pipe; 504. a first solution chamber; 505. a second solution chamber; 506. a separator plate; 6. a stepped low temperature test box; 601. a second control panel; 602. a fan; 603. an ice-water mixing tank; 604. a dry refrigerator; 605. a liquid nitrogen tank; 606. a second heat insulation plate; 607. a test inlet II; 7. a first test cartridge; 701. a second test box; 702. a heat preservation isolation pad; 703. a protective hose; 704. a voltmeter; 705. an alarm; 706. an ammeter; 707. a warning light; 708. a battery plate; 8. placing the plate; 801. a cover plate; 802. a convex through plate; 803. a CCD camera.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "connected," and the like are to be construed broadly, such as "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1-10, an embodiment of the present invention is shown: a cold and hot impact test device for an electronic structural part comprises a base plate 1 and a test box 7, wherein a combined sliding groove 101 is formed in the top of the base plate 1, a sliding block 102 is connected to the inside of the combined sliding groove 101 in a sliding mode, a vertical rod 2 and a placing frame 3 can be driven to realize switching of test inlets through sliding of the sliding block 102 inside the combined sliding groove 101, the temperature requirements of the test device for cold and hot impact test in different environments are met, a rotary table is mounted at the top of the sliding block 102, the vertical rod 2 is mounted at the top of the rotary table, the vertical rod 2 can be driven to adjust the direction through rotating of the rotary table, the placing frame 3 at the tail end of an electric telescopic rod 201 is enabled to switch directions, conditions are provided for cold and hot alternation of the electronic structural part inside the placing frame 3, two groups of electric telescopic rods 201 which are symmetrically arranged are mounted on the surface of the vertical rod 2, and distance adjustment during cold and hot exchange of the placing frame 3 can be assisted through the electric telescopic rods 201, the threaded rod 301 is connected to the tail end of the electric telescopic rod 201 in a threaded mode, the placing frame 3 is installed at the bottom of the threaded rod 301, the placing frame 3 and the electric telescopic rod 201 can be flexibly connected and disconnected through the threaded rod 301, so that the electronic structural part can be conveniently taken and placed, and the first test box 7 and the second test box 701 which are symmetrically arranged are installed on the surface, away from the electric telescopic rod 201, of the placing frame 3;
the first test box 7 and the second test box 701 are internally provided with interlayers, a heat-insulating spacer 702 is arranged inside the interlayers, a battery panel 708 is arranged on the rear wall of the first test box 7, an ammeter 706 is arranged on the bottom wall inside the first test box 7, a warning lamp 707 is arranged on the inner wall of one side of the first test box 7, the warning lamp 707 is electrically connected with the ammeter 706, the heat-insulating spacer 702 can avoid the damage of the high-temperature or low-temperature environment of the placing frame 3 to relevant components inside the first test box 7 and the second test box 701, the stable test operation is ensured, the heat-insulating cotton inside the protective hose 703 also plays a role in heat insulation, the internal connecting cables are prevented from being influenced by the high-temperature or low-temperature environment, the smooth circuit connection is ensured, when the electronic structural member inside the placing frame 3 is subjected to a cold and heat impact test, if the electronic structural member cannot resist the cold and heat impact, the circuit board on the surface of the electronic structural member is damaged, at this moment, the ammeter 706 and the battery board 708 cannot form a passage, the warning lamp 707 is turned on, if the electronic structural component is affected by cold and hot shock, the electronic structural component is interfered to normally work, the reading of the voltmeter 704 is weakened at this moment, the alarm 705 is further prompted to send out a warning prompt, and the specific condition of the electronic structural component when the electronic structural component is subjected to the cold and hot shock test can be judged through the states of the alarm 705 and the warning lamp 707.
Further, one side outer wall of a test box 7 and a test box 701 all runs through and installs protection hose 703, and protection hose 703's inner wall encircles and installs the heat preservation cotton, and voltmeter 704 is installed to the inside diapire of No. two test boxes 701, and alarm 705 is installed to one side inner wall of No. two test boxes 701, and alarm 705 and voltmeter 704 electric connection.
Further, a high temperature test box 4 is installed on one side of the top of the base plate 1, test plates 5 are installed on the outer walls of two sides of the high temperature test box 4, two groups of fixing blocks 501 which are arranged in a vertically staggered manner are installed on the surface of one side, away from the high temperature test box 4, of each test plate 5, a reagent bottle 502 is installed on the top of each fixing block 501, a partition plate 506 is installed on the inner wall of each reagent bottle 502, the partition plate 506 divides the inner space of each reagent bottle 502 into a second solution cavity 505 and a first solution cavity 504 which are independent from each other from top to bottom, a silver nitrate solution is stored in each first solution cavity 504, a bromine water solution is stored in each second solution cavity 505, vent pipes 503 are installed in the partition plate 506 in a penetrating manner, the tail ends of the vent pipes 503 extend into the high temperature test box 4, vent holes are formed in the pipe body surfaces, located in the second solution cavities 505, and the two groups of vent pipes 503 on one side can be arranged in a staggered manner through the fixing blocks 501, the cable surface layer and the plastic synthetic substance on the surface of the electronic structural component can soften and melt when the cable surface layer and the plastic synthetic substance on the surface of the electronic structural component can not meet the corresponding high temperature resistance requirement under the high temperature state, because the cable and the plastic synthetic substance are both made of high molecular polymers, the cable and the plastic synthetic substance can generate mixed gas containing formaldehyde and hydrogen chloride after melting, at the moment, the internal mixed gas is transmitted into the reagent bottle 502 through a vent pipe 503 extending into the high temperature test box 4 and is contacted with the solutions in the first solution cavity 504 and the second solution cavity 505 in sequence, the bromine water solution can fade due to the formaldehyde contained in the mixed gas, the hydrogen chloride gas in the mixed gas can react with silver ions in the silver nitrate solution after being dissolved in the liquid to generate precipitates, and the color and the precipitate generation condition of the solution in the reagent bottle 502 are judged, the strength of the high-temperature resistance of the electronic structural part in the test equipment can be judged, and the partition plate 506 is used for dividing the interior of the reagent bottle 502 into two independent solution chambers so as to facilitate observation.
Further, the other side of the top of the base plate 1 is provided with a stepped low-temperature test box 6, the stepped low-temperature test box 6 and the high-temperature test box 4 are symmetrically arranged, three groups of second heat insulation plates 606 which are equidistantly arranged are arranged in the stepped low-temperature test box 6, one side surface of one group of the second heat insulation plates 606 close to the inner wall of the stepped low-temperature test box 6 is provided with a fan 602, the top wall of the stepped low-temperature test box 6 is provided with an ice water mixing box 603, a dry refrigerator 604 and a liquid nitrogen box 605, the ice water mixing box 603, the dry refrigerator 604 and the liquid nitrogen box 605 are arranged at intervals with the three groups of the second heat insulation plates 606, the outer wall of one side of the stepped low-temperature test box 6 is provided with a second control plate 601, the surface of the second control plate 601 is provided with three groups of control valves which are arranged up and down, and the heat insulation materials are filled in the second heat insulation plates 606, so that the mutual exchange of the four cavities in the stepped low-temperature test box 6 can be avoided, the constancy of the low-temperature environment is ensured, and in addition, the fan 602, the ice-water mixing box 603, the dry refrigerator 604 and the liquid nitrogen box 605 can assist the stepped low-temperature test box 6 to create four groups of stepped temperature spaces from zero to room temperature, zero, tens of degrees below zero and tens of degrees below zero to one hundred degrees below zero, so as to enlarge the temperature variation range of the test equipment during the cold and hot shock test.
Further, two sets of symmetrically arranged placing plates 8 are mounted on the top of the base plate 1, the two sets of placing plates 8 are respectively located on two sides of the stepped low-temperature testing box 6, supporting rods are mounted on four corners of the top of the placing plates 8, the top of each supporting rod is provided with a cover plate 801, the interior of each cover plate 801 is of a hollow transparent structure, a CCD camera 803 and a convex transparent plate 802 are mounted at the bottom of each cover plate 801 at equal intervals, the convex transparent plates 802 and the CCD cameras 803 are arranged at intervals, after the cold and hot impact test is finished, the electronic structural component inside the placing frame 3 is taken out and placed on the surface of the placing plate 8, the surface of the electronic structural component is magnified and checked through the transparent cover plates 801 and the convex transparent plates 802, so that whether the surface of the electronic structural component is subjected to obvious appearance changes such as cracking, bulging and the like or not is observed, and whether the surface of the electronic structural component is subjected to fine deformation and defect detection through the CCD camera 803 or not, and then the surface appearance of the electronic structural part after the cold and hot impact test is comprehensively detected, and the performance of the manufacturing material of the electronic structural part is judged.
Further, the inside of combination spout 101 is for violently indulging crisscross spout and constitute, and every group spout is corresponding with the position of high temperature test case 4 and the four group test imports of cascaded low temperature test case 6 surface respectively, through sliding in combination spout 101 is inside, changeable different test imports, and then carry out the cold and hot shock test of different temperature ranges.
Further, three groups of first temperature insulation plates 401 which are equidistantly arranged are arranged in the high-temperature test box 4, heating screen plates 403 are arranged on the outer walls of two sides of each first temperature insulation plate 401, a first control plate 402 is arranged on the outer wall of one side of the high-temperature test box 4, four groups of control knobs which are vertically arranged are arranged on the surface of the first control plate 402 and are electrically connected with each group of heating screen plates 403, four groups of first test inlets 404 which are equidistantly arranged are arranged on the surface of one side, close to the combined chute 101, of the high-temperature test box 4, through the first test inlets 404, electronic structural members placed in the frame 3 can be conveniently placed in the high-temperature test box 4 to carry out corresponding heat-resisting tests under different high-temperature conditions, the first temperature insulation plates 401 can divide the internal space of the high-temperature test box 4 into independent cavities with the temperature not mutually transmitted by the temperature insulation characteristic, so that the test equipment can carry out independent high-temperature tests, the heating power of the heating net plate 403 in each group of cavities can be adjusted through the first control plate 402, so that the temperature test requirements of the test equipment under different dare conditions are met.
Further, the discharging pipe is all installed to the bottom of dry refrigerator 604 and liquid nitrogen case 605, the surface mounting of discharging pipe has the electronic valve, the control valve respectively with fan 602 and dry refrigerator 604 and liquid nitrogen case 605 bottom discharging pipe surface's electronic valve electric connection, through the control valve on No. two control panel 601 surfaces, can adjust the power of fan 602, aeration cooling effect when strengthening cold and hot shock test, and then play corresponding cold and hot shock test purpose, secondly open dry refrigerator 604 and liquid nitrogen case 605 through the control valve, can provide different cooling temperature to the space at the two places, and then create cascaded low temperature environment.
Further, the surface of one side of the stepped low-temperature test box 6 close to the combined chute 101 is provided with four sets of test inlets 607 arranged at equal intervals, so that the electronic structural member placed inside the placing frame 3 enters the stepped low-temperature test box 6 to provide an entering condition.
Further, the working steps of the test equipment are as follows:
s1, when the test equipment is used for carrying out corresponding cold and hot impact, the electronic structural part can be placed in the placing frame 3, then the electronic structural part is connected to the bottom of the electric telescopic rod 201 through the threaded rod 301, and a connecting lead in the protective hose 703 is connected to the surface of a binding post on the surface of the electronic structural part to form a closed circuit;
s2, immediately adjusting the temperature inside four independent cavities isolated by three groups of first temperature insulation boards 401 inside the high-temperature test box 4 according to the test temperature requirement, and creating a precondition for the test equipment to perform thermal tests under different high-temperature conditions;
s3, simultaneously, according to the test requirements, adjusting the power of the fan 602, adjusting the temperature state of the cavity inside the fan 602 to be kept at a low temperature state above zero, wherein the temperature of the ice-water mixture stored inside the ice-water mixing box 603 is zero, so that the temperature inside the area where the ice-water mixing box 603 inside the stepped low-temperature test box 6 is located can be zero, and the temperature inside the cavity where the dry refrigerator 604 is located can reach below zero through the dry ice released by the dry refrigerator 604, and similarly, the temperature inside the cavity can be kept at tens of degrees below zero through the liquid nitrogen box 605, so that the low-temperature state created inside the stepped low-temperature test box 6 can keep a larger span, and the temperature requirements of cold and heat impact tests in different cold and heat ranges can be met;
s4, then, the electric telescopic rod 201 is further contracted to make its length smaller than the distance between the upright rod 2 and the high temperature test box 4 and the stepped low temperature test box 6, the upright rod 2 is rotated, the corresponding chute channel inside the combined chute 101 is selected as required, then the electric telescopic rod 201 is started to extend its tail end, the placing frame 3 is driven to enter the cavities with corresponding temperatures inside the high temperature test box 4 and the stepped low temperature test box 6 through the first test inlet 404 and the second test inlet 607, respectively, and the corresponding temperature tests are received;
s5, when a high-temperature test is carried out, when the cable surface layer and the plastic synthetic substance on the surface of the electronic structural part placed inside the placing frame 3 cannot meet the corresponding high-temperature resistant requirements, a softening and melting phenomenon occurs, at the moment, the internal mixed gas is transmitted into the reagent bottle 502 through the vent pipe 503 extending into the high-temperature test box 4 and is sequentially contacted with the solutions inside the first solution cavity 504 and the second solution cavity 505, the bromine water solution can fade due to formaldehyde contained in the mixed gas, the hydrogen chloride gas in the mixed gas can react with silver ions in the silver nitrate solution after being dissolved in the liquid to generate precipitates, and the strength of the high-temperature resistant performance of the electronic structural part inside the test equipment can be judged by judging the color of the solution inside the reagent bottle 502 and the generation condition of the precipitates;
s6, after the electronic structural component in the placing frame 3 is subjected to corresponding high-temperature and low-temperature tests, repeating the step 4, and then realizing cold-heat exchange of the testing environment, wherein in the process, whether the internal circuit of the electronic structural component can normally work under the condition of cold-hot alternating impact can be judged by observing the current and voltage conditions in the first testing box 7 and the second testing box 701 under the condition of heat insulation, and then the performance of the electronic structural component under the environment of cold-hot impact of the electronic structural component is tested;
s7, after the cold and hot impact structure, taking out the electronic structural part inside the placing frame 3, placing the electronic structural part on the surface of the placing plate 8, observing whether the surface of the electronic structural part is obviously deformed or not through the amplification effect of the convex transparent plate 802, detecting whether the surface of the electronic structural part is slightly deformed or not through the CCD camera 803, detecting and verifying whether the appearance of the electronic structural part is deformed or not during the cold and hot impact test, and judging whether the performance of the manufacturing material of the electronic structural part is good or not.
The working principle is as follows: when the test equipment is used for carrying out corresponding cold and hot impact, an electronic structural part can be placed in the placing frame 3, then the electronic structural part is connected to the bottom of the electric telescopic rod 201 through the threaded rod 301, a connecting lead in the protective hose 703 is connected to the surface of a binding post on the surface of the electronic structural part to form a closed circuit, the temperature in four independent cavities separated by three groups of one-number heat insulation plates 401 in the high-temperature test box 4 is adjusted according to the test temperature requirement, a precondition is created for the test equipment to carry out thermal test under different high-temperature conditions, meanwhile, the power of the fan 602 is adjusted according to the test requirement, the temperature state of the cavity in the fan 602 is adjusted to be kept at a zero low temperature state, in addition, the temperature of an ice water mixture stored in the ice water mixing box 603 is zero, the temperature in the area where the ice water mixing box 603 in the stepped low-temperature test box 6 is located can be zero, the dry ice released by the dry refrigerator 604 can make the inside of the cavity of the dry refrigerator 604 reach zero, and similarly, the temperature inside the cavity can be kept at zero by tens of degrees by the liquid nitrogen box 605, so that the low temperature state created inside the stepped low temperature test box 6 can keep a larger span to meet the temperature requirement of cold and hot impact test in different cold and hot ranges, then the electric telescopic rod 201 is contracted by one step to make the length smaller than the distance between the upright rod 2 and the high temperature test box 4 and the stepped low temperature test box 6, the upright rod 2 is rotated, the corresponding chute channel inside the combined chute 101 is selected according to the requirement, then the electric telescopic rod 201 is started to extend the tail end of the electric telescopic rod to drive the placing frame 3 to simultaneously enter the cavities with corresponding temperatures inside the high temperature test box 4 and the stepped low temperature test box 6 through the first test inlet 404 and the second test inlet 607, receiving corresponding temperature test, when the high temperature test is carried out, the surface layer of the cable on the surface of the electronic structural component placed inside the placing frame 3 and the plastic synthetic substance can generate softening and melting phenomena when the cable and the plastic synthetic substance can not meet corresponding high temperature resistant requirements, at the moment, the internal mixed gas is transmitted into the reagent bottle 502 through the vent pipe 503 extending into the high temperature test box 4 and is sequentially contacted with the solutions inside the first solution cavity 504 and the second solution cavity 505, the bromine water solution can fade due to formaldehyde contained in the mixed gas, the hydrogen chloride gas in the mixed gas can react with silver ions in the silver nitrate solution after being dissolved in the liquid to generate precipitates, the strength of the high temperature resistant performance of the electronic structural component inside the test equipment can be judged by judging the color of the solution inside the reagent bottle 502 and the generation condition of the precipitates, and the electronic structural component placed inside the placing frame 3 can receive corresponding high temperature, After the low temperature test, the placing frame 3 is turned, and the cold and heat exchange of the test environment can be realized, by observing the current and voltage conditions inside the test box No. 7 and the test box No. 701 under the condition of thermal insulation, can judge whether the internal circuit of the electronic structural component can work normally under the condition of cold and hot alternate impact, further, the performance of the electronic structural member under the cold and hot impact environment of the electronic structural member is tested, and after the cold and hot impact structure, the electronic structural component inside the placing frame 3 is taken out, placed on the surface of the placing plate 8, and by the magnifying effect of the convex transparent plate 802, the obvious deformation of the surface of the electronic structural component can be observed, the CCD camera 803 can be used for detecting the fine deformation of the surface of the electronic structural component, therefore, whether the appearance of the electronic structural component is deformed or not during the cold and hot impact test is detected and verified, and the performance of the manufacturing material of the electronic structural component is judged.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (10)
1. The utility model provides an electronic structure spare cold and hot impact test equipment, includes bed plate (1) and test box (7), its characterized in that: the testing device comprises a base plate (1) and is characterized in that a combined sliding groove (101) is formed in the top of the base plate (1), a sliding block (102) is connected to the inside of the combined sliding groove (101) in a sliding mode, a rotating disc is installed at the top of the sliding block (102), a vertical rod (2) is installed at the top of the rotating disc, two groups of electric telescopic rods (201) which are symmetrically arranged are installed on the surface of the vertical rod (2), a threaded rod (301) is connected to the tail end of each electric telescopic rod (201) in a threaded mode, a placing frame (3) is installed at the bottom of each threaded rod (301), and a first testing box (7) and a second testing box (701) which are symmetrically arranged are installed on the surface, far away from the electric telescopic rods (201), of each placing frame (3);
the inside of a test box (7) and No. two test box (701) all is equipped with the intermediate layer, interbedded internally mounted has heat preservation shock insulator (702), panel (708) are installed to the back wall of a test box (7), ampere meter (706) are installed to the inside diapire of a test box (7), warning lamp (707) are installed to one side inner wall of a test box (7), and warning lamp (707) and ampere meter (706) electric connection.
2. A cold-thermal shock testing apparatus for electronic structural components according to claim 1, wherein: one side outer wall of a test box (7) and No. two test box (701) all runs through and installs protection hose (703), and the inner wall of protection hose (703) encircles and installs the heat preservation cotton, voltmeter (704) are installed to the inside diapire of No. two test box (701), alarm (705) are installed to one side inner wall of No. two test box (701), and alarm (705) and voltmeter (704) electric connection.
3. A cold-thermal shock testing apparatus for electronic structural components according to claim 1, wherein: the test bed is characterized in that a high-temperature test box (4) is installed on one side of the top of the base plate (1), test boards (5) are installed on the outer walls of the two sides of the high-temperature test box (4), one side surface of each test board (5) far away from the high-temperature test box (4) is provided with two groups of fixing blocks (501) which are arranged in a staggered mode from top to bottom, a reagent bottle (502) is installed on the top of each fixing block (501), a partition board (506) is installed on the inner wall of each reagent bottle (502), the partition board (506) divides the inner space of each reagent bottle (502) into an upper independent second solution cavity (505) and a first solution cavity (504), a silver nitrate solution is stored in the first solution cavity (504), a bromine solution is stored in the second solution cavity (505), a vent pipe (503) is installed in the partition board (506) in a penetrating mode, and the tail end of each vent pipe (503) extends to the inside of the test high-temperature test box (4), the vent pipe (503) is arranged on the surface of the pipe body of the second solution cavity (505) and is provided with a vent hole.
4. A cold-thermal shock testing apparatus for electronic structural components according to claim 1, wherein: the other side of the top of the base plate (1) is provided with a stepped low-temperature test box (6), the stepped low-temperature test box (6) and the high-temperature test box (4) are symmetrically arranged, three groups of second heat insulation plates (606) which are equidistantly arranged are arranged in the stepped low-temperature test box (6), one side surface of one group of the second heat insulation plate (606) close to the inner wall of the stepped low-temperature test box (6) is provided with a fan (602), the top wall of the stepped low-temperature test box (6) is provided with an ice-water mixing box (603), a dry refrigerator (604) and a liquid nitrogen box (605), and the ice-water mixing box (603), the dry refrigerator (604) and the liquid nitrogen box (605) are arranged at intervals with the three groups of second heat insulation plates (606), a second control board (601) is arranged on the outer wall of one side of the stepped low-temperature test box (6), three groups of control valves which are arranged up and down are arranged on the surface of the second control plate (601).
5. A cold-thermal shock testing apparatus for electronic structural components according to claim 1, wherein: the top of bed plate (1) is installed two sets of symmetrical arrangement places board (8), and two sets of board (8) of placing are located the both sides of cascaded low temperature test case (6) respectively, the bracing piece is all installed in the top four corners of placing board (8), cover plate (801) is installed at the top of bracing piece, and the inside of cover plate (801) is hollow transparent structure, CCD camera (803) and protruding through plate (802) are installed to the bottom equidistance of cover plate (801), and protruding through plate (802) and CCD camera (803) interval arrangement.
6. A cold-thermal shock testing apparatus for electronic structural components according to claim 1, wherein: the inside of the combined sliding chute (101) is composed of sliding chutes which are staggered transversely and longitudinally.
7. A cold-thermal shock testing apparatus for electronic structural components according to claim 1, wherein: the internally mounted of high temperature test case (4) has a thermal-insulated board (401) that three equidistance of group were arranged, heating otter board (403) are all installed to the both sides outer wall of thermal-insulated board (401), control panel (402) are installed to one side outer wall of high temperature test case (4), the surface mounting of control panel (402) has four control knob of arranging from top to bottom of group, control knob and every group heating otter board (403) electric connection, one side surface that high temperature test case (4)) is close to combination spout (101) is equipped with a test import (404) that four equidistance of group were arranged.
8. The apparatus for testing cold and hot shock of electronic structural part according to claim 4, wherein: the bottom parts of the dry refrigerator (604) and the liquid nitrogen box (605) are respectively provided with a discharge pipe, the surface of each discharge pipe is provided with an electronic valve, and the control valves are respectively and electrically connected with the fan (602) and the electronic valves on the surface of the discharge pipes at the bottom parts of the dry refrigerator (604) and the liquid nitrogen box (605).
9. The apparatus for testing cold and hot shock of electronic structural part according to claim 4, wherein: the surface of one side of stepped low-temperature test box (6) close to combined sliding chute (101) is provided with four sets of test inlets (607) arranged at equal intervals.
10. A method for testing a cold-thermal shock testing apparatus for an electronic structural component according to any one of claims 1 to 9, wherein the testing apparatus is operated by the steps of:
s1, when the test equipment is used for carrying out corresponding cold and hot impact, the electronic structural part can be placed in the placing frame (3), then the electronic structural part is connected to the bottom of the electric telescopic rod (201) through the threaded rod (301), and a connecting lead in the protective hose (703) is connected to the surface of a binding post on the surface of the electronic structural part to form a closed circuit;
s2, immediately adjusting the temperature inside four independent cavities isolated by three groups of first temperature insulation plates (401) inside the high-temperature test box (4) according to the test temperature requirement, and creating a precondition for the test equipment to perform thermal tests under different high-temperature conditions;
s3, simultaneously, according to the test requirements, adjusting the power of a fan (602), adjusting the temperature state of a cavity inside the fan (602) to be kept at a low temperature state above zero, wherein the temperature of an ice-water mixture stored inside an ice-water mixing box (603) is zero, the temperature of the area where the ice-water mixing box (603) inside a stepped low-temperature test box (6) is located can be zero, the temperature inside the cavity where a dry refrigerator (604) is located can reach below zero through dry ice released by the dry refrigerator (604), and similarly, the temperature inside the cavity can be kept at tens of degrees below zero through a liquid nitrogen box (605), so that the low-temperature state created inside the stepped low-temperature test box (6) can keep a large span, and the temperature requirements of cold and hot impact tests in different cold and hot ranges can be met;
s4, firstly, contracting the electric telescopic rod (201) in one step to enable the length of the electric telescopic rod to be smaller than the distance between the upright rod (2) and the high-temperature test box (4) and the stepped low-temperature test box (6), rotating the upright rod (2), selecting a corresponding chute channel in the combined chute (101) as required, then starting the electric telescopic rod (201), extending the tail end of the electric telescopic rod, driving the placing frame (3) to simultaneously enter cavities with corresponding temperatures in the high-temperature test box (4) and the stepped low-temperature test box (6) through the first test inlet (404) and the second test inlet (607), and receiving corresponding temperature tests;
s5, when a high-temperature test is carried out, when the cable surface layer of the surface of the electronic structural component placed inside the placing frame (3) and the plastic synthetic substance cannot meet the corresponding high-temperature resistant requirement, the cable surface layer and the plastic synthetic substance are softened and melted, at the moment, the internal mixed gas is transmitted to the inside of the reagent bottle (502) through the vent pipe (503) extending into the high-temperature test box (4), and is sequentially contacted with the solutions inside the first solution cavity (504) and the second solution cavity (505), the bromine water solution can be faded due to formaldehyde contained in the mixed gas, hydrogen chloride gas in the mixed gas can react with silver ions in the silver nitrate solution after being dissolved in the liquid to generate precipitates, and the strength of the high-temperature resistant performance of the electronic structural component inside the test equipment can be judged by judging the color and precipitation generation condition of the solution inside the reagent bottle (502);
s6, after the electronic structural component in the placing frame (3) is subjected to corresponding high-temperature and low-temperature tests, repeating the step 4, and then realizing cold-heat exchange of the testing environment, wherein in the process, whether the internal circuit of the electronic structural component can normally work under the condition of cold-hot alternate impact can be judged by observing the internal current and voltage conditions of the first testing box (7) and the second testing box (701) under the condition of heat insulation, and then the performance of the electronic structural component under the environment of cold-hot impact of the electronic structural component is tested;
s7, after the cold and hot impact structure, taking out the electronic structural part inside the placing frame (3), placing the electronic structural part on the surface of the placing plate (8), observing whether the surface of the electronic structural part is obviously deformed or not through the amplification effect of the convex transparent plate (802), and detecting whether the surface of the electronic structural part is slightly deformed or not through the CCD camera (803), so as to detect and verify whether the appearance of the electronic structural part is deformed or not during cold and hot impact test, and judge the performance of the manufacturing material of the electronic structural part.
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| CN113670603A (en) * | 2021-10-22 | 2021-11-19 | 常州华德机械有限公司 | Ultra-low temperature gearbox testing device for electric locomotive |
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