CN112763961A - Hall current sensor chip error correction equipment and method thereof - Google Patents
Hall current sensor chip error correction equipment and method thereof Download PDFInfo
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- CN112763961A CN112763961A CN202110011346.1A CN202110011346A CN112763961A CN 112763961 A CN112763961 A CN 112763961A CN 202110011346 A CN202110011346 A CN 202110011346A CN 112763961 A CN112763961 A CN 112763961A
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- 238000007664 blowing Methods 0.000 claims description 21
- 238000001035 drying Methods 0.000 claims description 21
- 238000010438 heat treatment Methods 0.000 claims description 18
- 230000017525 heat dissipation Effects 0.000 claims description 14
- 239000000428 dust Substances 0.000 claims description 11
- 238000007789 sealing Methods 0.000 claims description 11
- 239000011521 glass Substances 0.000 claims description 6
- 238000001816 cooling Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000009434 installation Methods 0.000 abstract description 3
- 230000004907 flux Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
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- 230000009286 beneficial effect Effects 0.000 description 1
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
本发明属于电流传感器芯片校正技术领域，尤其为一种霍尔电流传感器芯片误差校正设备及其方法,包括测试箱，所述测试箱的内部开设有安装槽，所述安装槽的内底壁固定连接有控制器，所述控制器的左侧设有存储器，所述控制器的右侧设有电源模块，所述测试箱的内底壁固定连接有固定杆，所述固定杆的顶端固定连接有放置板，所述放置板的顶部固定连接有定位块。本发明通过定位架、定位块、定位杆、弹簧和夹板的配合，可以对该芯片本体进行有效定位，使得该芯片本体在检测和校正时更加稳定和方便，通过控制器、电源模块、存储器和电流电压检测仪的使用，使得该芯片本体在进行检测时更加智能化，对该芯片本体进行检测和校正的数据更加精准。
The invention belongs to the technical field of current sensor chip correction, in particular to a Hall current sensor chip error correction device and a method thereof, comprising a test box, wherein an installation groove is opened inside the test box, and the inner bottom wall of the installation groove is fixed A controller is connected, a memory is arranged on the left side of the controller, a power supply module is arranged on the right side of the controller, a fixing rod is fixedly connected to the inner bottom wall of the test box, and the top of the fixing rod is fixedly connected There is a placing plate, and a positioning block is fixedly connected to the top of the placing plate. The present invention can effectively position the chip body through the cooperation of the positioning frame, the positioning block, the positioning rod, the spring and the splint, so that the chip body is more stable and convenient during detection and correction. The use of the current and voltage detector makes the chip body more intelligent during detection, and the data for detecting and correcting the chip body is more accurate.
Description
Technical Field
The invention relates to the technical field of current sensor chip correction, in particular to Hall current sensor chip error correction equipment and a method thereof.
Background
The Hall current sensor chip can be widely applied to various fields of variable frequency speed regulation devices, inversion devices, UPS power supplies, inversion welding machines, electrolytic plating, numerical control machines, microcomputer monitoring systems, power grid monitoring systems and the like which need to isolate and detect current and voltage. The Hall current sensor chip is based on a magnetic balance type Hall principle, namely a closed loop principle, when magnetic flux generated by a primary side current IP is concentrated in a magnetic circuit through a high-quality magnetic core, a Hall element is fixed in an air gap to detect the magnetic flux, and a plurality of turns of coils wound on the magnetic core output reverse compensation current for offsetting the magnetic flux generated by the primary side IP, so that the magnetic flux in the magnetic circuit is always kept to be zero. Through the processing of a special circuit, the output end of the sensor chip can output current change which accurately reflects the primary current. The device has the advantages of wide measurement range, high response speed, high measurement precision, good linearity, good dynamic performance, wide working frequency band, high reliability, strong overload capacity, large measurement range, small volume, light weight, easy installation and the like.
However, the existing hall current sensor chip has some defects, when the ambient temperature changes, the voltage output by the hall current sensor chip has certain errors, so that the measured current is inaccurate, and when the hall current sensor chip is detected and corrected, the correction and the detection are basically performed in a manual mode.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides error correction equipment and method for a Hall current sensor chip, and solves the problems that when the ambient temperature of the existing Hall current sensor chip changes, the voltage output by the Hall current sensor chip has certain errors, so that the measured current is inaccurate, and the detection efficiency and the precision of a manual mode are low.
(II) technical scheme
In order to achieve the purpose, the invention provides the following technical scheme: a Hall current sensor chip error correction device comprises a test box, wherein a mounting groove is formed in the test box, a controller is fixedly connected to the inner bottom wall of the mounting groove, a memory is arranged on the left side of the controller, a power module is arranged on the right side of the controller, a fixing rod is fixedly connected to the inner bottom wall of the test box, a placing plate is fixedly connected to the top end of the fixing rod, a positioning block is fixedly connected to the top of the placing plate, the surface of the positioning block is in contact with a chip body, a positioning frame is fixedly connected to the top of the placing plate, a positioning rod is fixedly connected to the inner wall of the positioning frame, a spring is sleeved on the surface of the positioning rod, a sliding block is connected to the surface of the positioning rod in a sliding manner, a clamping plate is fixedly connected to one side of the sliding block, the bottom of the clamping plate is in, one side of the test box is fixedly connected with a current and voltage detector, the other side of the test box is fixedly connected with a drying box, the surface of the drying box is provided with an air inlet, the inner wall of the drying box is fixedly connected with a heating pipe, the back of the drying box is fixedly connected with a connecting pipe, the end part of the connecting pipe is fixedly connected with an air blower, one side of the air blower is fixedly connected with a blowpipe, the end part of the blowpipe penetrates through the interior of the test box, the end part of the blowpipe is fixedly connected with an air blowing plate, the back surface of the air blowing plate is fixedly connected with the inner wall of the test box, the surface of the test box is provided with a display screen, the back of the test box is provided with a heat dissipation groove, the inner wall of the heat dissipation groove is provided with a heat dissipation fan, the inner wall fixedly connected with filter screen of radiating groove, the surface of test box is connected with sealing door through hinge rotation.
As a preferred technical solution of the present invention, the output terminals of the current and voltage detector and the temperature sensor are electrically connected to the input terminal of the chip body, the output terminal of the power module is electrically connected to the input terminal of the chip body, and the input terminals of the power module, the current and voltage detector and the temperature sensor are electrically connected to the output terminal of the controller.
As a preferred technical scheme of the present invention, the input ends of the memory and the display screen are electrically connected to the output end of the controller, and the output end of the controller is electrically connected to the input ends of the heating pipe and the blower.
As a preferred technical scheme, the top of the test box is provided with a fixing groove, the inner bottom wall of the fixing groove is fixedly connected with a top cover through a screw, the top of the top cover is provided with a heat dissipation port, and the inner wall of the heat dissipation port is fixedly connected with a first dustproof net.
As a preferable technical scheme of the invention, the bottom of the test box is fixedly connected with supporting legs, the bottom of each supporting leg is provided with a rubber pad, and the number of the supporting legs is four.
As a preferred technical scheme of the invention, the inner wall of the air inlet is fixedly connected with a second dust screen, the positioning blocks are L-shaped, and the number of the positioning blocks is two.
As a preferable technical scheme of the invention, the surface of the sealing door is provided with a glass window, and the surface of the sealing door is fixedly connected with a handle.
The invention also provides a method for correcting the error of the Hall current sensor chip, which comprises the following steps:
step S1, firstly, moving the clamping plate on the surface of the positioning rod to extrude the spring, placing the chip body on the surface of the positioning block under the action of the elastic force of the spring, then putting down the clamping plate, and effectively limiting the chip body by the clamping plate through the resilience force of the spring;
step S2, starting a blower, a heating pipe and a temperature sensor through a controller, filtering air from an air inlet through a second dust screen, entering the interior of a drying box, heating the filtered air through the heating pipe, then enabling the dried air to enter the blower, enabling the blower to enable the air to enter the interior of the drying box through a blowing pipe and a blowing plate, and enabling the temperature sensor to monitor the air in the testing box in real time so as to facilitate the controller to effectively control the temperature in the testing box;
step S3, the current and voltage detector may detect and correct the data of the current and voltage of the chip body, the current and voltage detector feeds the data of the current and voltage detected by the chip body back to the controller, and the controller stores the detected and corrected data in the memory and displays the detected and corrected data on the display screen.
(III) advantageous effects
Compared with the prior art, the invention provides the error correction equipment and the method for the Hall current sensor chip, and the equipment and the method have the following beneficial effects:
1. according to the Hall current sensor chip error correction equipment and the method thereof, the chip body can be effectively positioned through the matching of the positioning frame, the positioning block, the positioning rod, the spring and the clamping plate, so that the chip body is more stable and convenient to detect and correct, through the use of the controller, the power supply module, the memory and the current and voltage detector, the chip body is more intelligent when being detected, and the data detected and corrected by the chip body is more accurate.
2. According to the Hall current sensor chip error correction equipment and the method thereof, the test box, the drying box, the heating pipe, the air blower and the blowing plate are used for detecting and correcting data of the chip body when the environmental temperature changes, and the temperature inside the chip body and the test box can be monitored in real time by using the temperature sensor, so that the data of the current and voltage detector when the chip body is detected and corrected are more accurate.
Drawings
FIG. 1 is a main sectional view of the present invention;
FIG. 2 is a front view of the present invention;
FIG. 3 is a side view of the present invention;
FIG. 4 is an enlarged view taken at A of FIG. 1 in accordance with the present invention;
fig. 5 is a schematic block diagram of the present invention.
In the figure: 1. a test box; 2. mounting grooves; 3. a controller; 4. a memory; 5. a power supply module; 6. fixing the rod; 7. placing the plate; 8. positioning blocks; 9. a chip body; 10. a positioning frame; 11. positioning a rod; 12. a spring; 13. a slider; 14. a splint; 15. a temperature sensor; 16. a current-voltage detector; 17. a drying oven; 18. an air inlet; 19. heating a tube; 20. a connecting pipe; 21. a blower; 22. a blowpipe; 23. a blowing plate; 24. a display screen; 25. a heat sink; 26. a heat radiation fan; 27. a filter screen; 28. a sealing door; 29. fixing grooves; 30. a top cover; 31. a heat dissipation port; 32. a first dust screen; 33. supporting legs; 34. a second dust screen; 35. a glass window.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Examples
Referring to fig. 1-5, the present invention provides the following technical solutions: a Hall current sensor chip error correction device comprises a test box 1, a mounting groove 2 is arranged in the test box 1, a controller 3 is fixedly connected to the inner bottom wall of the mounting groove 2, a memory 4 is arranged on the left side of the controller 3, a power module 5 is arranged on the right side of the controller 3, a fixing rod 6 is fixedly connected to the inner bottom wall of the test box 1, a placing plate 7 is fixedly connected to the top end of the fixing rod 6, a positioning block 8 is fixedly connected to the top of the placing plate 7, a chip body 9 is in surface contact with the positioning block 8, a positioning frame 10 is fixedly connected to the top of the placing plate 7, a positioning rod 11 is fixedly connected to the inner wall of the positioning frame 10, a spring 12 is sleeved on the surface of the positioning rod 11, a sliding block 13 is connected to the surface of the positioning rod 11, a clamping plate 14 is fixedly connected to one side of the sliding block 13, the bottom of, one side fixedly connected with current and voltage detector 16 of test box 1, the opposite side fixedly connected with drying cabinet 17 of test box 1, air intake 18 has been seted up on the surface of drying cabinet 17, the inner wall fixedly connected with heating pipe 19 of drying cabinet 17, the back fixedly connected with connecting pipe 20 of drying cabinet 17, the tip fixedly connected with air-blower 21 of connecting pipe 20, one side fixedly connected with blowing pipe 22 of air-blower 21, the tip of blowing pipe 22 runs through the inside of test box 1, the tip fixedly connected with blowing board 23 of blowing pipe 22, the back of blowing board 23 and the inner wall fixed connection of test box 1, the surface of test box 1 is equipped with display screen 24, radiating groove 25 has been seted up at the back of test box 1, radiator fan 26 is installed to the inner wall of radiating groove 25, the inner wall fixedly connected with filter screen 27 of radiating groove 25, the surface of test box 1 is connected with sealing door 28 through.
In this embodiment, the chip body 9 is placed on the positioning block 8 for positioning, the pressure spring 12 is slid on the surface of the positioning rod 11 through the clamping plate 14, so that the clamping plate 14 can effectively limit the chip body 9, the stability of the chip body 9 is improved, then the blowing plate 23 can uniformly heat the inside of the testing box 1 through the cooperation of the heating pipe 19 and the blower 21, the controller 3 can effectively control the temperature inside the testing box 1 through the monitoring of the temperature sensor 15, in order to enable the chip body 9 to have more accurate data detected and corrected by the current and voltage detector 16 when the temperature changes, and in order to perform heat dissipation treatment on the electronic element inside the mounting groove 2 through the use of the heat dissipation groove 25, the filter screen 27 and the heat dissipation fan 26, the electronic element is more stable when the chip body 9 is detected and corrected, the working efficiency of the chip body 9 in detection and correction is higher.
Specifically, the output ends of the current and voltage detector 16 and the temperature sensor 15 are electrically connected to the input end of the chip body 9, the output end of the power module 5 is electrically connected to the input end of the chip body 9, and the input ends of the power module 5, the current and voltage detector 16 and the temperature sensor 15 are electrically connected to the output end of the controller 3.
In this embodiment, the model of the current-voltage detector 16 is D69-2049, which is to detect and correct the voltage and current in the chip body 9, the model of the temperature sensor 15 is XY-WTH1, the temperature sensor 15 can detect the real-time temperature of the chip body 9, so that the current-voltage detector 16 is more accurate when detecting and correcting the chip body 9, the power module 5 can provide current to the chip body 9, which is to facilitate the test of the chip body 9, the model of the controller 3 is DKC-Y220, and the controller 3 is configured to receive all data and control in the device.
Specifically, the input ends of the memory 4 and the display screen 24 are electrically connected to the output end of the controller 3, and the output end of the controller 3 is electrically connected to the input ends of the heating pipe 19 and the blower 21.
In this embodiment, the memory 4 can store the data detected and corrected by the current and voltage detector 16 for the chip body 9, so as to facilitate searching and comparison, and the display screen 24 can display the data, so that people can conveniently observe the data detected and corrected by the chip body 9.
Specifically, fixed slot 29 has been seted up at the top of test box 1, and the inner diapire of fixed slot 29 passes through screw fixedly connected with top cap 30, and thermovent 31 has been seted up at the top of top cap 30, the first dust screen 32 of inner wall fixedly connected with of thermovent 31.
In this embodiment, the top cover 30 is connected to the fixing groove 29 by screws, so that the top cover 30 can be easily mounted and dismounted, and the electronic components in the mounting groove 2 can be conveniently overhauled.
Specifically, the bottom fixedly connected with supporting leg 33 of test box 1, the bottom of supporting leg 33 is equipped with the rubber pad, and the quantity of supporting leg 33 is four.
In this embodiment, the cooperation through supporting leg 33 and rubber pad is used for improving this test box 1's stability, can also reduce the wearing and tearing of this test box 1 bottom simultaneously, and then has prolonged this test box 1's life.
Specifically, the inner wall of the air inlet 18 is fixedly connected with a second dust screen 34, the positioning blocks 8 are L-shaped, and the number of the positioning blocks 8 is two.
In this embodiment, through the use of second dust screen 34, can prevent that the dust from getting into the inside of drying cabinet 17, can effectively avoid this heating pipe 19 to take place to damage, be the L type through the shape of two locating pieces 8, place chip body 9 on the surface of locating piece 8, be convenient for effectively fix a position this chip body 9.
Specifically, a glass window 35 is disposed on the surface of the sealing door 28, and a handle is fixedly connected to the surface of the sealing door 28.
In this embodiment, the glass window 35 is provided to observe the chip body 9 inside the test box 1, and the handle makes the sealing door 28 time-saving and labor-saving when opened.
The invention also provides a method for correcting the error of the Hall current sensor chip, which comprises the following steps:
step S1, firstly, moving the clamping plate 14 on the surface of the positioning rod 11 to extrude the spring 12, placing the chip body 9 on the surface of the positioning block 8 under the action of the elastic force of the spring 12, then, putting down the clamping plate 14, and effectively limiting the chip body 9 by the clamping plate 14 through the resilience force of the spring 12;
step S2, starting the air blower 21, the heating pipe 19 and the temperature sensor 15 through the controller 3, filtering air from the air inlet 18 through the second dust screen 34, entering the drying box 17, heating the filtered air through the heating pipe 19, then enabling the dried air to enter the air blower 21, enabling the air blower 21 to enable the air to enter the drying box 17 through the blowing pipe 22 and the blowing plate 23, and enabling the temperature sensor 15 to monitor the air inside the testing box 1 in real time, so that the controller 3 can effectively control the temperature inside the testing box 1;
step S3, the current and voltage detector 16 may detect and correct the data of the current and voltage of the chip body 9, the current and voltage detector 16 feeds the data of the current and voltage detected by the chip body 9 back to the controller 3, and the controller 3 stores the detected and corrected data in the memory 4 and then displays the detected and corrected data on the display screen 24.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
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| CN202110011346.1A CN112763961B (en) | 2021-01-06 | 2021-01-06 | Hall current sensor chip error correction equipment and method thereof |
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| CN202110011346.1A CN112763961B (en) | 2021-01-06 | 2021-01-06 | Hall current sensor chip error correction equipment and method thereof |
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| CN112763961B (en) | 2022-07-15 |
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