CN112683628A - Rapid preparation method of non-conductive and non-magnetic ceramic material test sample strip - Google Patents
Rapid preparation method of non-conductive and non-magnetic ceramic material test sample strip Download PDFInfo
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- CN112683628A CN112683628A CN202110016587.5A CN202110016587A CN112683628A CN 112683628 A CN112683628 A CN 112683628A CN 202110016587 A CN202110016587 A CN 202110016587A CN 112683628 A CN112683628 A CN 112683628A
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Abstract
The invention discloses a method for quickly preparing a non-conductive and non-magnetic ceramic material test sample strip, which comprises the following specific steps of determining the size of a sample, preparing a disc-shaped blank, cutting a ceramic sample strip, cutting a first square thin plate and a second square thin plate, respectively cutting a first square through hole and a second square through hole on the square thin plate and the second square thin plate, and finally grinding the ceramic sample strip by using the first square through hole and the second square through hole; the method is suitable for obtaining the ceramic sample strip meeting the requirements of a three-point or four-point bending strength test, has high processing efficiency and simple and convenient operation, can ensure the surface roughness and the parallelism of the opposite surface by only adopting common equipment, and effectively improves the reliability of the subsequent three-point bending strength test result.
Description
Technical Field
The invention relates to the field of material mechanical property testing, in particular to a rapid preparation method of a non-conductive and non-magnetic ceramic material test sample strip.
Background
The ceramic material has ultrahigh hardness, chemical stability, high strength, high temperature resistance, wear resistance, oxidation resistance, good optical performance, acoustic performance, electromagnetic performance and the like, is often applied to various fields of machinery, aerospace, electronics, biology and the like, and is one of the most active fields of modern material scientific development. Because the ceramic material has the characteristics of high hardness and low toughness, the toughening research on the ceramic material becomes one of the hot directions of the development of the advanced ceramic material in recent years. The three-point bending test is an important test method for obtaining the bending strength and the fracture toughness of the material, how to quickly prepare the material meets the requirements of the national standard GB/T4741-1999 on the size and the precision of a ceramic material three-point bending test sample, and a reasonable sample preparation method is particularly important.
Disclosure of Invention
Aiming at the technical defects, the invention aims to provide a method for quickly preparing a non-conductive and non-magnetic ceramic material test sample strip, which has high processing efficiency and simple and convenient operation, adopts common equipment, can ensure the surface roughness and the parallelism of opposite surfaces, and effectively improves the reliability of a subsequent three-point bending strength test result.
In order to solve the technical problems, the invention adopts the following technical scheme:
the invention provides a method for quickly preparing a non-conductive and non-magnetic ceramic material test sample strip, which specifically comprises the following steps:
s1, determining the size of the sample, assuming that the width and the thickness of the required sample are a and b respectively, and the length is not less than the span L of the three-point or four-point bending resistance experiment;
s2, preparing a disc-shaped blank through a sintering experiment, wherein the diameter of the disc-shaped blank is (L + delta), the thickness of the disc-shaped blank is (b +0.2), and delta is a size allowance so as to ensure that a plurality of ceramic sample strips meeting the length requirement can be cut out from a single disc-shaped blank;
s3, cutting a plurality of ceramic sample strips with the width dimension of (a +0.4) on the disc-shaped blank, and ensuring that the length dimension is not less than L and the thickness of the ceramic sample strips is (b + 0.2);
s4, cutting a first square thin plate with the thickness of (a-0.1) and a second square thin plate with the thickness of (b-0.1) from the 45 steel plate;
s5, cutting a plurality of first square through holes (L + delta) x (b +0.4) on a first square thin plate, taking the first square thin plate as a grinding clamp, placing the first square thin plate on an electromagnetic chuck of a surface grinding machine for adsorption clamping, then placing ceramic sample strips into the first square through holes in batches, filling paraffin in gaps between the ceramic sample strips and the first square through holes, turning the ceramic sample strips to grind two surfaces in sequence, wherein the removal amount is 0.2 respectively until the width of the ceramic sample strips is a to ensure that the ceramic sample strips are stably clamped;
s6, cutting a plurality of second square through holes (L + delta) x (a +0.2) on the second square thin plate, using the second square thin plate as a grinding clamp, repeating the step S5, and carrying out plane grinding on the other two opposite surfaces of the ceramic sample strip until the thickness of the ceramic sample strip is (b + 0.04);
s7, finely grinding the upper surface and the lower surface of the ceramic sample strip in the thickness direction by using boron carbide powder on the ground glass until no scratch is observed on the surface by naked eyes;
and S8, polishing the surface of the ceramic sample strip to finally obtain a sample meeting the requirements.
Preferably, the cutting steps in steps S4, S5 and S6 are all performed by using a wire electric discharge machine.
Preferably, the first square through holes in the step S5 and the second square through holes in the step S6 are uniformly distributed in a rectangular array, and the number of the first square through holes and the number of the second square through holes are adjusted according to the length and the width of the first square thin plate and the second square thin plate respectively.
Preferably, the disc-shaped blank is cut using a diamond inner diameter slicer in step S3.
Preferably, the ceramic spline surface is polished with a diamond polishing agent in step S8.
The invention has the beneficial effects that: the method is suitable for obtaining the ceramic sample strip meeting the requirements of a three-point or four-point bending strength test, has high processing efficiency and simple and convenient operation, can ensure the surface roughness and the parallelism of the opposite surface by only adopting common equipment, and effectively improves the reliability of the subsequent three-point bending strength test result.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a disk-shaped blank according to an embodiment of the present invention;
fig. 2 is a schematic structural view of a first square thin plate and a first square through hole according to an embodiment of the present invention;
fig. 3 is a diagram illustrating a state where a ceramic sample strip is placed in a first square thin plate according to an embodiment of the present invention.
Description of reference numerals:
1. a disk-shaped blank; 2. a ceramic sample strip; 3. a first square thin plate; 4. a first square through hole; 5. an electromagnetic chuck.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1 to 3, a method for rapidly preparing a test sample bar of non-conductive and non-magnetic ceramic material specifically comprises the following steps:
s1, determining the size of the sample, assuming that the width and thickness of the required sample are respectively 4mm and 3mm, the length is 30mm, and the span of the three-point bending resistance test is 20 mm;
s2, preparing a disc-shaped blank 1 through a sintering experiment, wherein the diameter of the disc-shaped blank 1 is 40mm, the thickness of the disc-shaped blank is 3.2mm, and the size allowance is 10mm, so that a plurality of ceramic sample strips 2 meeting the length requirement are cut out from a single disc-shaped blank 1;
s3, cutting a plurality of ceramic sample strips 2 with the width of 4.4mm from the disc-shaped blank 1 by using a diamond inside diameter slicer, and ensuring that the length of the ceramic sample strips 2 is not less than 30mm and the thickness of the ceramic sample strips 2 is 3.2 mm;
s4, cutting a first square thin plate 3 with the thickness of 3.9mm and a second square thin plate with the thickness of 2.9mm from a 45 steel plate;
s5, cutting a plurality of first square through holes 4 with the size of 40 multiplied by 3.4mm on a first square thin plate 3, placing the first square thin plate 3 as a grinding clamp on an electromagnetic chuck 5 of a surface grinding machine for adsorption clamping, then placing ceramic sample strips 2 into the first square through holes 4 in batches, filling paraffin in gaps between the ceramic sample strips 2 and the first square through holes 4 to ensure stable clamping of the ceramic sample strips 2, turning over the ceramic sample strips 2 to grind two surfaces in sequence, wherein the removal amount is 0.2mm respectively until the width of the ceramic sample strips 2 is 4 mm;
s6, cutting a plurality of second square through holes of 40 multiplied by 4.2mm on the second square thin plate, taking the second square thin plate as a grinding clamp, repeating the step of S5, and carrying out plane grinding on the other two opposite surfaces of the ceramic sample strip 2 until the thickness of the ceramic sample strip 2 is 3.04 mm;
s7, finely grinding the upper surface and the lower surface of the ceramic sample strip 2 in the thickness direction by using boron carbide powder on the ground glass until no scratch is observed on the surface by naked eyes;
and S8, finally, polishing the surface of the ceramic sample strip 2 by using a diamond polishing agent to finally obtain a sample meeting the requirements.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (5)
1. A method for rapidly preparing a non-conductive and non-magnetic ceramic material test sample bar is characterized by comprising the following steps:
s1, determining the size of the sample, assuming that the width and the thickness of the required sample are a and b respectively, and the length is not less than the span L of the three-point or four-point bending resistance experiment;
s2, preparing a disc-shaped blank through a sintering experiment, wherein the diameter of the disc-shaped blank is (L + delta), the thickness of the disc-shaped blank is (b +0.2), and delta is a size allowance so as to ensure that a plurality of ceramic sample strips meeting the length requirement can be cut out from a single disc-shaped blank;
s3, cutting a plurality of ceramic sample strips with the width dimension of (a +0.4) on the disc-shaped blank, and ensuring that the length dimension is not less than L and the thickness of the ceramic sample strips is (b + 0.2);
s4, cutting a first square thin plate with the thickness of (a-0.1) and a second square thin plate with the thickness of (b-0.1) from the 45 steel plate;
s5, cutting a plurality of first square through holes (L + delta) x (b +0.4) on a first square thin plate, taking the first square thin plate as a grinding clamp, placing the first square thin plate on an electromagnetic chuck of a surface grinding machine for adsorption clamping, then placing ceramic sample strips into the first square through holes in batches, filling paraffin in gaps between the ceramic sample strips and the first square through holes, turning the ceramic sample strips to grind two surfaces in sequence, wherein the removal amount is 0.2 respectively until the width of the ceramic sample strips is a to ensure that the ceramic sample strips are stably clamped;
s6, cutting a plurality of second square through holes (L + delta) x (a +0.2) on the second square thin plate, using the second square thin plate as a grinding clamp, repeating the step S5, and carrying out plane grinding on the other two opposite surfaces of the ceramic sample strip until the thickness of the ceramic sample strip is (b + 0.04);
s7, finely grinding the upper surface and the lower surface of the ceramic sample strip in the thickness direction by using boron carbide powder on the ground glass until no scratch is observed on the surface by naked eyes;
and S8, polishing the surface of the ceramic sample strip to finally obtain a sample meeting the requirements.
2. The method for rapidly preparing a non-conductive and non-magnetic ceramic material test spline according to claim 1, wherein the cutting steps in the steps S4, S5 and S6 are all performed by using a wire cut electrical discharge machine.
3. The method for rapidly preparing a non-conductive and non-magnetic ceramic material test spline according to claim 1, wherein the first square through holes and the second square through holes in the step S6 are uniformly distributed in a rectangular array in the step S5, and the number of the first square through holes and the number of the second square through holes are respectively adjusted according to the length and the width of the first square thin plate and the second square thin plate.
4. The method for rapid preparation of test bars of non-conductive, non-magnetic ceramic material according to claim 1, wherein the disc-shaped blanks are cut with a diamond inside diameter slicer in step S3.
5. The method for rapidly manufacturing a non-conductive, non-magnetic ceramic material test bar according to claim 1, wherein the surface of the ceramic bar is polished with a diamond polishing agent in step S8.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110016587.5A CN112683628A (en) | 2021-01-07 | 2021-01-07 | Rapid preparation method of non-conductive and non-magnetic ceramic material test sample strip |
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| CN202110016587.5A CN112683628A (en) | 2021-01-07 | 2021-01-07 | Rapid preparation method of non-conductive and non-magnetic ceramic material test sample strip |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201841450U (en) * | 2010-10-19 | 2011-05-25 | 广西晶联光电材料有限责任公司 | Edging clamp for planar ceramic target |
| CN203765463U (en) * | 2014-04-17 | 2014-08-13 | 京东方光科技有限公司 | Polishing clamp |
| CN206869668U (en) * | 2017-06-22 | 2018-01-12 | 洛阳鹏起实业有限公司 | A kind of thin slice sanding apparatus |
| CN110814935A (en) * | 2019-10-29 | 2020-02-21 | 首钢京唐钢铁联合有限责任公司 | Non-magnetic steel impact sample grinding clamp and grinding method |
| CN111982737A (en) * | 2020-09-02 | 2020-11-24 | 中国矿业大学 | Preparation method of separated Hopkinson pressure bar test metal sample |
-
2021
- 2021-01-07 CN CN202110016587.5A patent/CN112683628A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201841450U (en) * | 2010-10-19 | 2011-05-25 | 广西晶联光电材料有限责任公司 | Edging clamp for planar ceramic target |
| CN203765463U (en) * | 2014-04-17 | 2014-08-13 | 京东方光科技有限公司 | Polishing clamp |
| CN206869668U (en) * | 2017-06-22 | 2018-01-12 | 洛阳鹏起实业有限公司 | A kind of thin slice sanding apparatus |
| CN110814935A (en) * | 2019-10-29 | 2020-02-21 | 首钢京唐钢铁联合有限责任公司 | Non-magnetic steel impact sample grinding clamp and grinding method |
| CN111982737A (en) * | 2020-09-02 | 2020-11-24 | 中国矿业大学 | Preparation method of separated Hopkinson pressure bar test metal sample |
Non-Patent Citations (1)
| Title |
|---|
| 王超: "晶须增韧TiB_2基陶瓷刀具的制备工艺与力学性能研究", 《中国优秀博硕士学位论文全文数据库(硕士) 工程科技Ⅰ辑》 * |
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