CN111816591B - Chip loading system and chip loading method - Google Patents
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- CN111816591B CN111816591B CN202010723482.9A CN202010723482A CN111816591B CN 111816591 B CN111816591 B CN 111816591B CN 202010723482 A CN202010723482 A CN 202010723482A CN 111816591 B CN111816591 B CN 111816591B
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- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
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- H10P72/3212—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips or lead frames
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
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Abstract
本发明公开了一种装片系统及装片方法,属于半导体封装技术领域。本发明的系统包括圆片台、中转载台、导轨、加热器、第一焊头和第二焊头,中转载台包括圆盘和收集框,圆盘设置于收集框内,且圆盘的上方设有吹气管;导轨上设有载体。本发明的方法为利用第一焊头将芯片从圆片台移动至中转载台,在中转载台修正芯片角度,并利用吹气管和收集框去除芯片表面的硅屑,之后利用第二焊头将芯片移至载体,并通过加热器将芯片焊接至载体上。本发明为了克服现有技术的装片过程中,芯片表面残留有硅屑且芯片易损坏的不足,本发明可以去除芯片表面的硅屑,且可以避免芯片和吸嘴受损,进一步可以对芯片的安装角度进行矫正,以此实现对芯片的准确安装。
The invention discloses a chip loading system and a chip loading method, belonging to the technical field of semiconductor packaging. The system of the present invention includes a wafer platform, an intermediate transfer platform, guide rails, a heater, a first welding head and a second welding head, the intermediate transfer platform includes a disk and a collection frame, the disk is arranged in the collection frame, and the A blowing pipe is arranged on the top; a carrier is arranged on the guide rail. The method of the present invention is to use the first welding head to move the chip from the wafer stage to the transfer station, correct the angle of the chip on the transfer station, and use the blowing pipe and the collection frame to remove the silicon chips on the surface of the chip, and then use the second welding head The chip is moved to the carrier, and the chip is soldered to the carrier by the heater. In order to overcome the disadvantages of silicon chips remaining on the chip surface and easily damaged chips in the chip loading process of the prior art, the present invention can remove the silicon chips on the chip surface, avoid damage to the chip and the suction nozzle, and further reduce the damage to the chip. Correct the installation angle to achieve accurate installation of the chip.
Description
技术领域technical field
本发明属于半导体封装技术领域,更具体地说,涉及一种装片系统及装片方法。The invention belongs to the technical field of semiconductor packaging, and more specifically relates to a chip loading system and a chip loading method.
背景技术Background technique
装片机是半导体封装生产线中的关键设备,其在芯片封装中具有非常广泛的应用。随着技术的进步,装片机的装片精度正向着亚微米级发展,进而支撑起了目前业内所称的微组装技术。在现有技术中,装片机台主要由圆片台、顶针基座、焊头和轨道组成,采用装片机台进行装片的步骤如下:The chip loader is the key equipment in the semiconductor packaging production line, and it has a very wide range of applications in chip packaging. With the advancement of technology, the loading accuracy of the loading machine is developing towards the sub-micron level, which in turn supports the so-called micro-assembly technology in the industry. In the prior art, the chip loading machine is mainly composed of a wafer table, a thimble base, a welding head and a track. The steps of using the chip loading machine for loading are as follows:
步骤一:顶针基座中的顶针顶起圆片台上的单颗芯片;步骤二:焊头将顶起的芯片吸起;步骤三:焊头将吸起的芯片,并将芯片安装至轨道上的芯片载体(引线框或基板)上;步骤四:轨道加热,通过高温让芯片与芯片载体结合。针对上述的现有技术的装片机台及其装片工艺,存在以下不足:1、采用耐高温吸嘴吸取芯片时,芯片表面有硅屑,且耐高温吸嘴硬度较高,容易挤压破坏芯片表面电路;2、采用低硬度的吸嘴时,高温会使低硬度吸嘴损坏。3、芯片在装片过程中会出现旋转角,且在装片过程无法校验修正角度。Step 1: The thimble in the thimble base lifts up a single chip on the wafer stage; Step 2: The welding head picks up the lifted chip; Step 3: The welding head picks up the chip and installs the chip on the track on the chip carrier (lead frame or substrate); step 4: track heating, and combine the chip with the chip carrier through high temperature. For the above-mentioned prior art chip loading machine and its loading process, there are the following deficiencies: 1. When using a high-temperature-resistant suction nozzle to suck chips, there are silicon chips on the surface of the chip, and the high-temperature-resistant suction nozzle has high hardness and is easy to squeeze Destroy the surface circuit of the chip; 2. When using a low-hardness nozzle, high temperature will damage the low-hardness nozzle. 3. The chip will have a rotation angle during the loading process, and the correction angle cannot be verified during the loading process.
针对上述问题,现有技术也给出了一些解决方案,例如发明创造名称为:一种接力式快速取片、装片装置及其采用它的装片机(申请日:2017年7月21日;申请号201710604150.7),该方案通过采用第一转臂和第二转臂实现取片和装片,并采用驱动装置用于驱动中转台沿X、Y方向运动并驱动中转台圆周转动,从而可以对芯片的安装角度进行修正。但是该方案的不足之处在于:并未解决芯片表面硅屑的残留问题。In view of the above problems, the prior art also provides some solutions. For example, the name of the invention is: a relay-type quick film taking, film loading device and its film loading machine (application date: July 21, 2017 ; Application No. 201710604150.7), the scheme realizes the taking and loading of the film by using the first rotating arm and the second rotating arm, and uses a driving device to drive the turntable to move along the X and Y directions and drive the turntable to rotate in a circle, so that the The mounting angle of the chip is corrected. However, the disadvantage of this solution is that it does not solve the problem of residual silicon shavings on the chip surface.
综上所述,在装片过程中,如何去除芯片表面硅屑以及避免芯片受损,是现有技术亟需解决的问题。To sum up, how to remove silicon shavings on the chip surface and avoid damage to the chip during the chip loading process is an urgent problem to be solved in the prior art.
发明内容Contents of the invention
1.要解决的问题1. The problem to be solved
本发明为了克服现有技术的装片过程中,芯片表面残留有硅屑且芯片易损坏的不足,提出了一种装片系统及装片方法,可以去除芯片表面的硅屑,并且可以避免芯片和吸嘴在装片过程中受损,进一步可以对芯片的安装角度进行矫正,以此实现对芯片的准确安装。In order to overcome the disadvantages of silicon chips remaining on the surface of the chip and easily damaged chips in the chip loading process of the prior art, the present invention proposes a chip loading system and a chip loading method, which can remove the silicon chips on the chip surface and avoid chip damage. And the suction nozzle is damaged during the loading process, and the installation angle of the chip can be corrected further, so as to realize the accurate installation of the chip.
2.技术方案2. Technical solution
为了解决上述问题,本发明所采用的技术方案如下:In order to solve the above problems, the technical scheme adopted in the present invention is as follows:
本发明的一种装片系统,包括:圆片台,圆片台的下方设有顶针基座;中转载台,中转载台包括圆盘和收集框,圆盘设置于收集框内,且圆盘的上方设有吹气管;导轨,导轨上设有载体,该载体用于承载芯片;加热器,加热器用于对载体进行加热;第一焊头,第一焊头用于将芯片从圆片台移至中转载台;第二焊头,第二焊头用于将芯片从中转载台移至载体。A film loading system of the present invention comprises: a wafer table, a thimble base is arranged under the wafer table; An air blowing pipe is arranged above the disc; a guide rail is provided with a carrier for carrying chips; a heater is used for heating the carrier; a first welding head is used for removing the chip from the wafer The platform is moved to the transfer platform; the second welding head is used to move the chip from the transfer platform to the carrier.
更进一步地,还包括马达,马达通过传动带与中转载台连接。Furthermore, a motor is also included, and the motor is connected with the transfer platform through a transmission belt.
更进一步地,圆盘上设有真空孔,且圆盘下方设有真空器,真空孔与真空器连接。Furthermore, a vacuum hole is provided on the disk, and a vacuum device is provided under the disk, and the vacuum hole is connected with the vacuum device.
更进一步地,还包括摄像头,摄像头与马达连接,该摄像头用于拍摄芯片图像并计算芯片的旋转角度,再根据旋转角度控制马达调整芯片的安装角度。Furthermore, it also includes a camera, which is connected to the motor, and the camera is used to take images of the chip and calculate the rotation angle of the chip, and then control the motor to adjust the installation angle of the chip according to the rotation angle.
更进一步地,真空器设置于收集框的底部,且收集框的内部与真空器连接,收集框的表面设有细孔。Furthermore, the vacuum device is arranged at the bottom of the collection frame, and the inside of the collection frame is connected with the vacuum device, and the surface of the collection frame is provided with fine holes.
更进一步地,加热器上设有若干个真空孔。Furthermore, several vacuum holes are provided on the heater.
本发明的一种装片方法,采用上述的一种装片系统,包括以下步骤:A film loading method of the present invention adopts the above-mentioned film loading system, comprising the following steps:
S100、对载体进行加热,同时利用第一焊头将芯片从圆片台移至中转载台的圆盘上;S100, heating the carrier, and at the same time using the first welding head to move the chip from the wafer stage to the disk of the transfer stage;
S200、利用吹气管对圆盘上的芯片进行吹气,使得芯片上的硅屑脱离芯片表面并掉落至收集框内;S200, blowing air on the chips on the disc with the air blowing pipe, so that the silicon chips on the chips are separated from the surface of the chips and fall into the collection frame;
S300、利用摄像头拍摄芯片图像并计算芯片的旋转角度,而后摄像头根据旋转角度控制马达调整芯片的安装角度;S300, use the camera to capture the image of the chip and calculate the rotation angle of the chip, and then the camera controls the motor to adjust the installation angle of the chip according to the rotation angle;
S400、利用第二焊头将芯片从圆盘移至载体上,同时加热器对载体继续加热并将芯片焊接至载体上;S400, using the second welding head to move the chip from the disc to the carrier, while the heater continues to heat the carrier and weld the chip to the carrier;
循环上述步骤,直至载体的每个单元都焊接有芯片,再利用导轨将装有芯片的载体移至出料处。The above steps are repeated until each unit of the carrier is soldered with a chip, and then the carrier with the chip is moved to the discharge place by using the guide rail.
更进一步地,步骤S100中对载体进行加热的具体过程为:先利用加热器的真空孔吸附载体,再利用加热器对载体进行加热。Furthermore, the specific process of heating the carrier in step S100 is: firstly, the vacuum hole of the heater is used to absorb the carrier, and then the heater is used to heat the carrier.
更进一步地,步骤S100中利用第一焊头将芯片从圆片台移至中转载台的圆盘的具体过程为:先利用顶针基座将芯片从圆片台上顶起,再利用第一焊头吸取芯片并将芯片移至圆盘上,然后开启真空器并通过圆盘的真空孔吸附芯片。Further, in step S100, the specific process of using the first welding head to move the chip from the wafer stage to the disc of the transfer stage is as follows: firstly use the thimble base to lift the chip from the wafer stage, and then use the first The welding head picks up the chips and moves them to the disc, then turns on the vacuum and sucks the chips through the vacuum holes of the disc.
3.有益效果3. Beneficial effect
相比于现有技术,本发明的有益效果为:Compared with the prior art, the beneficial effects of the present invention are:
(1)本发明一种装片系统,通过设置第一焊头和第二焊头,可以避免芯片和吸嘴在装片过程中受损;进一步通过摄像头和马达,即可对芯片的安装角度进行矫正,从而实现对芯片的准确安装;此外通过设置收集框和吹气管,即可解决芯片表面硅屑残留的问题,从而可以保证生产产品的质量。(1) A chip loading system of the present invention, by setting the first welding head and the second welding head, can avoid damage to the chip and suction nozzle during the chip loading process; further through the camera and motor, the mounting angle of the chip can be adjusted Correction is carried out to achieve accurate installation of the chip; in addition, by setting the collection frame and blowing pipe, the problem of silicon residue on the surface of the chip can be solved, thereby ensuring the quality of the produced product.
(2)本发明的一种装片方法,可以避免芯片和吸嘴在装片过程中受损,并且可以对芯片的安装角度进行矫正,而且可以在装片过程中同时对两个芯片进行处理,从而大大提高了装片的效率。(2) A loading method of the present invention can avoid damage to the chip and suction nozzle during the loading process, and can correct the installation angle of the chip, and can process two chips simultaneously during the loading process , thereby greatly improving the efficiency of film loading.
附图说明Description of drawings
图1为本发明的一种装片系统的结构示意图;Fig. 1 is a schematic structural view of a loading system of the present invention;
图2为本发明的中转载台的主视图;Fig. 2 is the front view of the transfer platform of the present invention;
图3为本发明的中转载台的俯视图。Fig. 3 is a top view of the intermediate transfer platform of the present invention.
标号说明:100、圆片台;110、顶针基座;200、中转载台;210、圆盘;211、真空孔;212、真空器;220、收集框;230、吹气管;300、导轨;310、载体;320、加热器;410、第一焊头;420、第二焊头;500、马达;510、传动带;600、摄像头。Reference numerals: 100, wafer stage; 110, thimble base; 200, transfer stage; 210, disc; 211, vacuum hole; 212, vacuum device; 220, collection frame; 230, blowing pipe; 300, guide rail; 310, carrier; 320, heater; 410, first welding head; 420, second welding head; 500, motor; 510, transmission belt; 600, camera.
具体实施方式Detailed ways
为使本发明实施例的目的、技术方案和优点更加清楚,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本发明一部分实施例,而不是全部的实施例;而且,各个实施例之间不是相对独立的,根据需要可以相互组合,从而达到更优的效果。因此,以下对在附图中提供的本发明的实施例的详细描述并非旨在限制要求保护的本发明的范围,而是仅仅表示本发明的选定实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, rather than all the embodiments; moreover, each embodiment is not relatively independent, and can be combined with each other according to needs, so as to achieve better effects. Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
为进一步了解本发明的内容,结合附图和实施例对本发明作详细描述。In order to further understand the content of the present invention, the present invention will be described in detail in conjunction with the accompanying drawings and embodiments.
实施例1Example 1
结合图1所示,本发明的一种装片系统,包括圆片台100、中转载台200、导轨300、第一焊头410和第二焊头420,圆片台100的下方设有顶针基座110,通过顶针基座110可将放置于圆片台100的芯片顶起,从而可以便于第一焊头410吸取芯片。第一焊头410用于将芯片从圆片台100移至中转载台200,本实施例中第一焊头410采用低硬度吸嘴,即吸嘴头采用橡胶等软性材质,即第一焊头410不会造成芯片表面压伤,从而可以避免芯片损坏。As shown in FIG. 1 , a loading system of the present invention includes a
结合图2和图3所示,本发明的中转载台200包括圆盘210和收集框220,圆盘210可以放置芯片,本实施例的圆盘210的材质为金属。值得说明的是,圆盘210上设有真空孔211,且圆盘210的下方设有真空器212,该真空器212与真空孔211连接,即开启真空器212后,圆盘210可以通过真空孔211吸附芯片,从而可以便于第二焊头420吸取芯片。值得进一步说明的是,圆盘210设置于收集框220内,且圆盘210的上方设有吹气管230,通过吹气管230可以将芯片表面的硅屑吹掉,并通过收集框220收集掉落的硅屑,进一步地真空器212设置于收集框220的底部,收集框220的内部与真空器212连接,且收集框220的表面设有细孔,通过收集框220表面的细孔可以吸附掉落的硅屑,从而可以避免硅屑沾到其他部件上,进而可以保证生产产品的质量。As shown in FIG. 2 and FIG. 3 , the
此外,本发明的中转载台200可以进行旋转,具体地,本发明的装片系统还包括马达500和摄像头600,马达500与摄像头600连接,马达500通过传动带510与中转载台200连接;摄像头600对芯片拍照得到芯片图像,并将芯片图像与基准图像进行角度比较,计算得到芯片的旋转角度,再根据芯片的旋转角度控制马达500调整芯片的安装角度,即摄像头600将控制指令发至马达500,马达500通过传动带510带动中转载台200转动,进而可以实现对芯片安装角度的矫正。In addition, the
本发明的第二焊头420用于将安装角度矫正后的芯片从中转载台200移至载体310,该载体310设置于导轨300上,具体地,关闭真空器212和吹气管230,第二焊头420吸取圆盘210上的芯片,并将芯片移至载体310上。进一步地,本发明的系统还包括加热器320,加热器320用于对载体310进行加热,具体地,导轨300将载体310移至加热器320的表面,加热器320设有若干个真空孔211,通过真空孔211可以吸附载体310;加热器320对载体310进行加热,当第二焊头420将芯片移至载体310时,加热器320继续对载体310进行加热并将芯片焊接至载体310上。本实施例中第二焊头420采用耐高温吸嘴,从而可以避免加热器320导致第二焊头420损坏的问题。The
本发明的系统通过设置第一焊头410和第二焊头420,可以避免芯片和吸嘴在装片过程中受损;进一步通过摄像头600和马达500,即可对芯片的安装角度进行矫正,从而实现对芯片的准确安装;此外通过设置收集框220和吹气管230,即可解决芯片表面硅屑残留的问题,从而可以保证生产产品的质量。The system of the present invention can avoid damage to chips and suction nozzles during the loading process by setting the
本发明的一种装片方法,采用上述的一种装片系统,具体步骤如下:A kind of film loading method of the present invention adopts above-mentioned a kind of film loading system, and concrete steps are as follows:
S100、对载体310进行加热,具体地,利用导轨300将载体310移至加热器320处,加热器320通过真空孔211吸附载体310并对载体310进行加热,使得载体310能够达到装片的温度条件;S100, heating the
与此同时,利用第一焊头410将芯片从圆片台100移至中转载台200的圆盘210上;具体地,先利用顶针基座110将芯片从圆片台100上顶起,而后第一焊头410吸取芯片并将芯片移至圆盘210上,再开启真空器212并通过圆盘210的真空孔211吸附芯片。At the same time, the
S200、利用吹气管230对圆盘210上的芯片进行吹气,使得芯片上的硅屑脱离芯片表面并掉落至收集框220内,且收集框220通过其表面的细孔吸附掉落的硅屑,从而可以避免硅屑沾到其他部件上。S200, use the
S300、利用摄像头600对芯片进行拍照并识别计算芯片的旋转角度,摄像头600根据旋转角度控制马达500调整芯片的安装角度;具体地,先利用摄像头600对芯片进行拍照得到芯片图像,而后将芯片图像与基准图像进行角度比较,并计算得到芯片的旋转角度,再根据芯片的旋转角度控制马达500调整芯片的安装角度,即摄像头600发送控制指令发至马达500,马达500通过传动带510带动中转载台200转动,实现对芯片安装角度的矫正。S300. Use the
S400、利用第二焊头420将芯片从圆盘210移至载体310上,具体地,先关闭真空器212和吹气管230,然后第二焊头420吸取芯片移至正在加热的载体310上,此时加热器320对载体310继续加热并将芯片焊至载体310上;S400, using the
循环上述步骤,直至载体310上每个单元都焊接有芯片,之后关闭加热器320的真空孔211,并通过导轨300将装有芯片的载体310移至出料处。值得说明的是,当芯片在进行步骤S400时,可以对另一颗芯片进行装片,即对另一颗芯片执行步骤S100、S200和S300,从而可以缩短整个芯片的装片时间,大大提高了装片的效率。The above steps are repeated until each unit on the
本发明的一种装片方法,可以避免芯片和吸嘴在装片过程中受损,并且可以对芯片的安装角度进行矫正,而且可以在装片过程中同时对两个芯片进行处理,从而大大提高了装片的效率。A chip loading method of the present invention can avoid damage to chips and suction nozzles during the chip loading process, and can correct the mounting angle of the chip, and can process two chips simultaneously during the chip loading process, thereby greatly The efficiency of film loading is improved.
在上文中结合具体的示例性实施例详细描述了本发明。但是,应当理解,可在不脱离由所附权利要求限定的本发明的范围的情况下进行各种修改和变型。详细的描述和附图应仅被认为是说明性的,而不是限制性的,如果存在任何这样的修改和变型,那么它们都将落入在此描述的本发明的范围内。此外,背景技术旨在为了说明本技术的研发现状和意义,并不旨在限制本发明或本申请和本发明的应用领域。The present invention has been described in detail above with reference to specific exemplary embodiments. However, it should be understood that various modifications and changes can be made without departing from the scope of the present invention as defined in the appended claims. The detailed description and drawings are to be regarded as illustrative only and not restrictive, and any such modifications and variations, if any, are intended to fall within the scope of the invention as described herein. In addition, the background art is intended to illustrate the research and development status and significance of the present technology, and is not intended to limit the present invention or the application and the application field of the present invention.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05343502A (en) * | 1992-06-09 | 1993-12-24 | Fuji Electric Co Ltd | Die bonding apparatus |
| JPH09102572A (en) * | 1995-10-06 | 1997-04-15 | Ibiden Co Ltd | Adhesive mounting equipment for chip substrates |
| CN107665827A (en) * | 2016-07-29 | 2018-02-06 | 上海微电子装备(集团)股份有限公司 | Chip bonding apparatus and method |
| CN108257897A (en) * | 2018-04-03 | 2018-07-06 | 浙江辛帝亚自动化科技有限公司 | A kind of eutectic machine |
Family Cites Families (6)
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|---|---|---|---|---|
| CN107134422A (en) * | 2016-02-29 | 2017-09-05 | 上海微电子装备(集团)股份有限公司 | Chip bonding device and method |
| CN206893996U (en) * | 2017-02-16 | 2018-01-16 | 深圳瑞波光电子有限公司 | A kind of chip mounter |
| CN107248501B (en) * | 2017-07-21 | 2023-09-08 | 苏州艾科瑞思智能装备股份有限公司 | A relay type rapid film picking and loading device and a film loading machine using the same |
| CN109390249A (en) * | 2017-08-10 | 2019-02-26 | 上海微电子装备(集团)股份有限公司 | Semiconductor manufacturing apparatus |
| CN110504192B (en) * | 2019-06-10 | 2022-05-27 | 义乌臻格科技有限公司 | Production method suitable for microchip mass transfer pick-up head |
| CN111390319B (en) * | 2020-04-23 | 2021-04-16 | 大连优迅科技股份有限公司 | A chip eutectic welding equipment |
-
2020
- 2020-07-24 CN CN202010723482.9A patent/CN111816591B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05343502A (en) * | 1992-06-09 | 1993-12-24 | Fuji Electric Co Ltd | Die bonding apparatus |
| JPH09102572A (en) * | 1995-10-06 | 1997-04-15 | Ibiden Co Ltd | Adhesive mounting equipment for chip substrates |
| CN107665827A (en) * | 2016-07-29 | 2018-02-06 | 上海微电子装备(集团)股份有限公司 | Chip bonding apparatus and method |
| CN108257897A (en) * | 2018-04-03 | 2018-07-06 | 浙江辛帝亚自动化科技有限公司 | A kind of eutectic machine |
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