CN111555801A - Optical signal sampling device and method for optical time domain reflectometer and optical time domain reflectometer - Google Patents
Optical signal sampling device and method for optical time domain reflectometer and optical time domain reflectometer Download PDFInfo
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Abstract
The invention relates to the field of optical time domain reflectometers, in particular to an optical signal sampling device and method for an optical time domain reflectometer and the optical time domain reflectometer. The optical signal sampling device comprises an optical signal receiving module, a signal processing module and a signal processing module, wherein the optical signal receiving module is used for receiving an optical signal returned from an optical fiber to be tested and converting the optical signal into a corresponding electric signal; the data sampling module is connected with the optical signal receiving module and is used for sampling the converted electric signal; and the control module is connected with the data sampling module to adjust the sampling clock phase of the data sampling module, and controls the data sampling module to sample the converted electric signal for multiple times under different sampling clock phases so as to acquire the sampling data of the data sampling module. The invention can greatly improve the resolution of the optical time domain reflectometer and improve the positioning precision of event points in an optical path by a sampling method of a wrong phase without adopting a high-cost sampling chip and increasing the hardware cost.
Description
Technical Field
The invention relates to the field of optical time domain reflectometers, in particular to an optical signal sampling device and method for an optical time domain reflectometer and the optical time domain reflectometer.
Background
The OTDR (Optical Time Domain Reflectometer) detects rayleigh scattering and fresnel reflection values returned from an Optical fiber by transmitting an Optical pulse to the measured Optical fiber to obtain physical characteristics such as length and loss of the measured Optical fiber, and precisely locates an event point and a fault point in the Optical path by means of a data analysis function. The OTDR is mainly used for optical cable engineering construction and optical cable line maintenance work, and mainly used for measuring the length of optical fibers, analyzing link loss and positioning faults. Resolution, which may also be referred to as 1-point resolution, refers to the data sampling interval of the OTDR, which determines the accuracy of the location of the event point on the backscatter curve.
When the optical time domain reflectometer is used for testing, data sampling is carried out at fixed intervals along the length direction of the optical fiber, and the shorter the sampling interval is, the more sampling data points are, which means the higher the positioning precision is. The main factors that influence resolution include sampling distance, time base accuracy, refractive index setting, etc.
Under the condition that the refractive index of the optical fiber is certain, in order to improve the resolution ratio, the traditional method is generally realized by improving the sampling frequency of an AD chip, namely the AD chip with high sampling rate is used, but the AD chip with high sampling rate has high cost, is easily influenced by political factors, and is difficult to supply goods in China.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide an optical signal sampling device and method for an optical time domain reflectometer and an optical time domain reflectometer, aiming at the above-mentioned defects in the prior art, so as to solve the problems of high cost and difficult supply of chips used in the existing optical time domain reflectometer for improving the resolution thereof.
The technical scheme adopted by the invention for solving the technical problems is as follows: an optical signal sampling apparatus for an optical time domain reflectometer is provided, comprising:
the optical signal receiving module is used for receiving the optical signal returned from the optical fiber to be tested and converting the optical signal into a corresponding electric signal;
the data sampling module is connected with the optical signal receiving module and is used for sampling the converted electric signal; and
and the control module is connected with the data sampling module to adjust the sampling clock phase of the data sampling module, and controls the data sampling module to sample the converted electric signal for multiple times under different sampling clock phases so as to acquire sampling data of the data sampling module.
Further preferred embodiments of the present invention are: the control module comprises a main control unit and a clock phase-locked loop unit, the main control unit is provided with the clock phase-locked loop unit to output first clock signals with different clock phases, and the clock phase-locked loop unit transmits the first clock signals to the data sampling module so as to adjust the sampling clock phase of the data sampling module.
Further preferred embodiments of the present invention are: the main control unit is an FPGA chip, and the clock phase-locked loop unit is arranged in the FPGA chip.
Further preferred embodiments of the present invention are: the clock phase-locked loop unit is a clock phase-locked loop chip which is respectively connected with the main control unit and the data sampling module.
Further preferred embodiments of the present invention are: the optical signal receiving module comprises a photodetector and an amplifier, wherein the photodetector is used for receiving optical signals returned from the optical fiber to be detected, the photodetector converts the received optical signals into electric signals and transmits the electric signals to the amplifier, and the optical signals are amplified by the amplifier and then transmitted to the data sampling module.
Further preferred embodiments of the present invention are: the optical signal sampling device also comprises a clock signal generating module connected with the control module, wherein the clock signal generating module generates a second clock signal and transmits the second clock signal to the control module, and the control module generates first clock signals with different clock phases according to the second clock signal and transmits the first clock signals to the data sampling module.
Further preferred embodiments of the present invention are: the control module further comprises a data processing unit for processing the acquired sample data to form an array.
The technical scheme adopted by the invention for solving the technical problems is as follows: the optical time domain reflectometer comprises a laser, an optical directional coupler and any one of the optical signal sampling devices for the optical time domain reflectometer, wherein the laser transmits an optical signal to the optical directional coupler, the optical directional coupler is coupled to a tested optical fiber and decouples the optical signal returned by the tested optical fiber, and the optical signal is transmitted to an optical signal receiving module of the optical signal sampling device.
The technical scheme adopted by the invention for solving the technical problems is as follows: there is provided an optical signal sampling method for an optical time domain reflectometer, the optical signal sampling method being applied to any one of the optical signal sampling apparatuses for an optical time domain reflectometer described above, the optical signal sampling method comprising the steps of:
receiving an optical signal returned from the optical fiber to be detected, and converting the optical signal into a corresponding electric signal;
controlling and adjusting the sampling clock phase of the electric signal sampling;
sampling the electrical signal for a plurality of times at different sampling clock phases;
sample data is acquired.
Further preferred embodiments of the present invention are: the optical signal sampling method further comprises the steps of:
processing data sampled for multiple times on the electric signal under the same sampling clock phase into a corresponding array;
and carrying out interpolation operation on array data corresponding to the sampling data under different sampling clock phases to form a new array.
Compared with the prior art, the optical fiber optical time domain reflectometer has the advantages that the sampling clock phase of the data sampling module is adjusted by the control module, the data sampling module is controlled to sample the electric signals corresponding to the optical signals for multiple times under different sampling clock phases, the sampling data of the data sampling module is obtained, a high-cost sampling chip is not needed, and the optical fiber to be detected is detected and sampled for multiple times by a sampling method with a wrong phase under the condition of not increasing hardware cost, so that the resolution of the optical time domain reflectometer is greatly improved, and the positioning precision of event points in an optical path is improved.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a block diagram of an optical signal sampling apparatus for an optical time domain reflectometer according to the present invention;
FIG. 2 is a block diagram of a first embodiment of an optical signal sampling apparatus for an optical time domain reflectometer according to the present invention;
FIG. 3 is a block diagram of a second embodiment of an optical signal sampling apparatus for an optical time domain reflectometer according to the present invention;
fig. 4 is a block diagram of the structure of an optical signal receiving module of the present invention;
FIG. 5 is a block diagram of the optical time domain reflectometer of the present invention;
FIG. 6 is a block flow diagram of an optical signal sampling method for an optical time domain reflectometer according to the present invention.
Detailed Description
The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings.
As shown in fig. 1 to 3, the present invention provides a preferred embodiment of an optical signal sampling apparatus for an optical time domain reflectometer.
An optical signal sampling device for an optical time domain reflectometer comprises an optical signal receiving module 10, a data sampling module 20 and a control module 30. The optical signal receiving module 10 is configured to receive an optical signal returned from an optical fiber to be tested, and convert the optical signal into a corresponding electrical signal; the data sampling module 20 is connected with the optical signal receiving module 10 to sample the converted electrical signal; the control module 30 is connected with the data sampling module 20 to adjust the sampling clock phase of the data sampling module 20, and controls the data sampling module to sample the converted electrical signal for multiple times under different sampling clock phases, so as to obtain the sampling data of the data sampling module 20, without using a high-cost sampling chip, and under the condition of not increasing hardware cost, the optical fiber to be detected is subjected to multiple detection sampling by a sampling method with a wrong phase, so that the resolution of the optical time domain reflectometer is greatly improved, and the positioning accuracy of event points in an optical path is improved.
Referring to fig. 2 and fig. 3, in this embodiment, the control module 30 includes a main control unit 31 and a clock phase-locked loop unit 32, the main control unit 31 configures the clock phase-locked loop unit 32 to output first clock signals with different clock phases, and the clock phase-locked loop unit 32 transmits the first clock signals to the data sampling module 20 to adjust a sampling clock phase of the data sampling module 20. An external clock signal is input to the clock phase-locked loop unit 32, the main control unit 31 configures the clock phase-locked loop unit 32 to adjust the clock phase of the output first clock signal, so as to output the first clock signals with different clock phases to the data sampling module 20, the data sampling module 20 samples the electric signals corresponding to the optical signals for multiple times in the same clock phase, and samples the electric signals in different clock phases, so that more sampling data can be obtained, the resolution of the optical time domain reflectometer is improved, and the positioning accuracy of event points in an optical path is improved.
The main control unit 31 and the clock phase-locked loop unit 32 may be integrated in a chip, or may be separate chips.
In an embodiment, referring to fig. 2, the main control unit 31 and the clock phase-locked loop unit 32 are integrated in the same chip, the main control unit 31 is an FPGA chip, and the clock phase-locked loop unit 32 is disposed in the FPGA chip. The external second clock signal is input to the clock phase-locked loop unit 32, the output clock phase of the clock phase-locked loop unit 32 is adjusted by the configuration of the FPGA chip, and the first clock signal with different clock phases is output, so that the sampling clock phase of the data sampling module 20 is adjusted, the converted electric signal is sampled for multiple times under different sampling clock phases, the test values of the measured optical fiber under different sampling phases are obtained, the curve analysis data of the optical time domain transmitter is increased, the resolution of the optical time domain reflector is greatly improved, and the positioning precision of event points in an optical path is improved.
In another embodiment, referring to fig. 3, when the main control unit 31 and the clock phase-locked loop unit 32 are separate chips, the clock phase-locked loop unit 32 is a clock phase-locked loop chip connected to the main control unit 31 and the data sampling module 20, respectively. The main control unit 31 may adopt an FPGA chip, and in other embodiments, the main control unit 31 may also adopt chips with control processing functions, such as a CPU, a GPU, and an ARM chip, which all can configure the clock phase-locked loop chip to output the first clock signal with different clock phases. The FPGA chip is configured with a clock phase-locked loop chip to output first clock signals with different clock phases, and the clock phase-locked loop chip transmits the first clock signals with different clock phases to the data sampling module 20, so that the sampling clock phases of the data sampling module 20 are adjusted, the clock phase-locked loop chip samples the converted electric signals under different clock phases, test values of the measured optical fibers under different sampling phases are obtained, the resolution of the optical time domain reflectometer is greatly improved, and the positioning precision of event points in an optical path is improved. The clock phase-locked loop unit 32 adopts a clock phase-locked loop chip, is independent of an FPGA chip, can avoid large errors caused by the FPGA chip and the like, and further improves the precision of the optical signal sampling device.
The model of the clock phase-locked loop chip can be CD4046, MC145152, MC145162, or CC046, and the specific model can be selected according to the need.
Further, referring to fig. 2 and 3, the control module 30 further includes a data processing unit 33 for processing the acquired sample data to form an array. Specifically, the data processing unit 33 is connected to the data sampling module 20, obtains sampling data of the data sampling module 20, and processes data obtained by sampling the electrical signal for multiple times at the same sampling clock phase into a corresponding array; and performing interpolation operation on array data corresponding to the sampling data under different sampling clock phases to form a new array, so that the subsequent analysis and positioning of event points and fault points in the optical path are facilitated, and the positioning precision is improved.
In this embodiment, the data sampling module 20 is an AD chip, and the AD chip samples an electrical signal corresponding to an optical signal and converts the electrical signal obtained by sampling into a digital signal. The clock signal output by the AD chip is a phase-shifted clock of the first clock signal output by the phase-locked loop, which can ensure that the clock of the FPGA chip in the main control unit 31 is homologous, and the sampling clock phase of the AD chip can be adjusted by adjusting the clock phase output by the clock phase-locked loop unit 32, so that the data sampling module 20 can sample the converted electrical signal at different sampling clock phases, convert the sampled electrical signal into a digital signal, obtain a plurality of data, perform OTDR curve analysis, and improve the positioning accuracy of event points in the optical path.
In addition, referring to fig. 4, the optical signal receiving module 10 includes a photodetector 11 and an amplifier 12 for receiving an optical signal returned from the optical fiber under test. The photodetector 11 converts the received optical signal into an electrical signal and transmits the electrical signal to the amplifier 12, the electrical signal is amplified by the amplifier 12 and then transmitted to the data sampling module 20, the AD chip of the data sampling module 20 samples the electrical signal, and the sampled electrical signal is converted into a digital signal.
Referring to fig. 1 to fig. 3, in this embodiment, the optical signal sampling apparatus further includes a clock signal generating module 40 connected to the control module 30, the clock signal generating module 40 generates a second clock signal and transmits the second clock signal to the control module 30, and the control module 30 generates a first clock signal with different clock phases according to the second clock signal and transmits the first clock signal to the data sampling module 20. The clock signal generating module 40 may be a crystal oscillator. Specifically, the second clock signal generated by the crystal oscillator is transmitted to the clock pll unit 32 of the control module 30, and the first clock signal with different clock phases is output through the clock pll unit 32 and transmitted to the AD chip of the data sampling module 20.
The following describes an embodiment of the optical signal sampling apparatus in detail, taking as an example the sampling of the converted amplified electrical signal at four phases 0 °, 90 °, 180 °, 270 °.
The clock signal generating module 40 generates a second clock signal and transmits the second clock signal to the clock phase-locked loop unit 32, the main control unit 31 configures the clock phase-locked loop unit 32 to generate a first clock signal with different clock phases, and the data sampling module 20 samples the amplified electrical signal for multiple times at different clock phases to obtain test values of multiple tested optical fibers.
Specifically, in an optical time domain reflectometer applied to an optical signal sampling apparatus, the length (resolution) of an optical fiber corresponding to each CLK (clock signal) can be calculated by the following calculation formula: l is cT/2n, where L is the length of the optical fiber (resolution of the optical time domain reflectometer) corresponding to each CLK (clock signal), c is the optical transmission speed, T is the time from the emission of the optical signal to the reception of the signal, and n is the refractive index of the optical fiber.
Assume that the clock signal generation block 40 generatesThe clock frequency of the second clock signal is 100Mhz, the AD chip of the data sampling module 20 adopts AD6145 and 100Msps sampling rate, and the length of the optical fiber is L ═ cT/2n ═ 3 × 108(m/s)×10×109(s)/2×1.4680≈1(m)，
The data sampling module 20 samples the data at different clock phases as follows:
1. setting the clock frequency of a first clock signal output by the clock phase-locked loop unit 32 to be 100Mhz, setting the output phase to be 0 degrees, and obtaining an array a by the data sampling module 20;
2. setting the clock frequency of the first clock signal output by the clock phase-locked loop unit 32 to be 100Mhz, the output phase to be 90 degrees, and obtaining an array b by the data sampling module 20;
3. setting the clock frequency of the first clock signal output by the clock phase-locked loop unit 32 to be 100Mhz, the output phase to be 180 degrees, and obtaining an array c by the data sampling module 20;
4. setting the clock frequency of the first clock signal output by the clock phase-locked loop unit 32 to be 100Mhz, the output phase to be 270 degrees, and obtaining an array d by the data sampling module 20;
5. then, the obtained arrays are interpolated to form new arrays [ a 0, b 0, c0, d 0, a 1, b 1, c1, d 1, a 2, b 2, c 2, d 2.
The length of each array corresponds to the number of sample points at the sampling clock phase. And performing interpolation operation on the data acquired under the four different clock phases to form a new array, and performing OTDR curve analysis on the optical time domain reflectometer by using the new array, wherein the resolution is improved to 0.25m from the original 1m, and the resolution is improved to four times of the original resolution, so that the resolution of the optical time domain reflectometer is improved, and the positioning precision of event points in an optical fiber optical path is improved.
The present invention also provides a preferred embodiment of an optical time domain reflectometer, as shown in fig. 5.
Specifically, the optical time domain reflectometer includes a laser 50, an optical directional coupler 60, and an optical signal sampling apparatus for the optical time domain reflectometer as described above, where the laser 50 transmits an optical signal to the optical directional coupler 60, the optical directional coupler 60 couples to a tested optical fiber and decouples the optical signal returned by the tested optical fiber, and the optical signal is transmitted to the optical signal receiving module 10 of the optical signal sampling apparatus. Based on the optical signal sampling device for the optical time domain reflectometer, the optical time domain reflectometer can sample the converted electric signal for many times under different sampling clock phases to obtain the sampling data of the data sampling module 20, and a high-cost sampling chip is not required to be adopted, so that the optical fiber to be detected is subjected to multiple detection sampling by a sampling method with a wrong phase under the condition of not increasing the hardware cost, the resolution of the optical time domain reflectometer is greatly improved, and the positioning precision of event points in an optical path is improved.
As shown in fig. 6, the present invention also provides a preferred embodiment of an optical signal sampling method for an optical time domain reflectometer.
The optical signal sampling method is applied to the optical signal sampling device for the optical time domain reflectometer, and comprises the following steps:
s10, receiving the optical signal returned from the optical fiber to be tested, and converting the optical signal into a corresponding electrical signal;
s20, controlling and adjusting the sampling clock phase of the electric signal sampling;
s30, sampling the electric signal for multiple times under different sampling clock phases;
and S40, acquiring sampling data.
The sampling clock phase of the electric signal sampling is adjusted through control, the electric signal is sampled for many times under different sampling clock phases, a high-cost sampling chip is not needed, more sampling data about the optical fiber can be obtained under the condition that the hardware cost is not increased, the resolution of the optical time domain reflectometer is greatly improved, and the positioning precision of event points in an optical path is improved.
After step S40, the optical signal sampling method further includes the steps of:
s50, processing the data sampled for multiple times by the electric signal under the same sampling clock phase into a corresponding array;
and S60, performing interpolation operation on array data corresponding to the sampling data in different sampling clock phases to form a new array.
The acquired data is subjected to the operation, so that the subsequent analysis and positioning of event points and fault points in the optical path are facilitated, and the positioning precision is improved.
It should be understood that the above embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same, and those skilled in the art can modify the technical solutions described in the above embodiments, or make equivalent substitutions for some technical features; and all such modifications and alterations are intended to fall within the scope of the appended claims.
Claims (10)
1. An optical signal sampling device for an optical time domain reflectometer, comprising:
the optical signal receiving module is used for receiving the optical signal returned from the optical fiber to be tested and converting the optical signal into a corresponding electric signal;
the data sampling module is connected with the optical signal receiving module and is used for sampling the converted electric signal; and
and the control module is connected with the data sampling module to adjust the sampling clock phase of the data sampling module, and controls the data sampling module to sample the converted electric signal for multiple times under different sampling clock phases so as to acquire sampling data of the data sampling module.
2. The optical signal sampling apparatus of claim 1, wherein the control module comprises a main control unit and a clock phase-locked loop unit, the main control unit configures the clock phase-locked loop unit to output a first clock signal with different clock phases, and the clock phase-locked loop unit transmits the first clock signal to the data sampling module to adjust a sampling clock phase of the data sampling module.
3. The optical signal sampling device of claim 2, wherein the main control unit is an FPGA chip, and the clock phase-locked loop unit is disposed in the FPGA chip.
4. The optical signal sampling device of claim 2, wherein the clock pll unit is a clock pll chip connected to the main control unit and the data sampling module, respectively.
5. The optical signal sampling device according to claim 1, wherein the optical signal receiving module includes a photodetector and an amplifier for receiving the optical signal returned from the optical fiber to be tested, the photodetector converts the received optical signal into an electrical signal and transmits the electrical signal to the amplifier, and the optical signal is amplified by the amplifier and then transmitted to the data sampling module.
6. The optical signal sampling apparatus of claim 1, further comprising a clock signal generating module connected to the control module, wherein the clock signal generating module generates a second clock signal and transmits the second clock signal to the control module, and the control module generates a first clock signal with different clock phases according to the second clock signal and transmits the first clock signal to the data sampling module.
7. The optical signal sampling device of claim 2, wherein the control module further comprises a data processing unit for processing the acquired sampled data into an array.
8. An optical time domain reflectometer comprising a laser, an optical directional coupler and an optical signal sampling apparatus for an optical time domain reflectometer as claimed in any of claims 1 to 7, wherein the laser emits an optical signal to the optical directional coupler, the optical directional coupler couples to an optical fiber to be measured and decouples the optical signal returned by the optical fiber to be measured, and transmits the optical signal to an optical signal receiving module of the optical signal sampling apparatus.
9. An optical signal sampling method for an optical time domain reflectometer, wherein the optical signal sampling method is applied to the optical signal sampling apparatus for an optical time domain reflectometer of any one of claims 1 to 7, the optical signal sampling method comprising the steps of:
receiving an optical signal returned from the optical fiber to be detected, and converting the optical signal into a corresponding electric signal;
controlling and adjusting the sampling clock phase of the electric signal sampling;
sampling the electrical signal for a plurality of times at different sampling clock phases;
sample data is acquired.
10. The optical signal sampling method of claim 9, further comprising the steps of:
processing data sampled for multiple times on the electric signal under the same sampling clock phase into a corresponding array;
and carrying out interpolation operation on array data corresponding to the sampling data under different sampling clock phases to form a new array.
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