CN111496149B - Double-bending machine for probe - Google Patents

Double-bending machine for probe Download PDF

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Publication number
CN111496149B
CN111496149B CN202010323236.4A CN202010323236A CN111496149B CN 111496149 B CN111496149 B CN 111496149B CN 202010323236 A CN202010323236 A CN 202010323236A CN 111496149 B CN111496149 B CN 111496149B
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CN
China
Prior art keywords
bending
probe
support
clamping
reciprocating driving
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Active
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CN202010323236.4A
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CN111496149A (en
Inventor
张明海
付盼红
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Weinan Hi Tech Zone Wood King Technology Co Ltd
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Weinan Hi Tech Zone Wood King Technology Co Ltd
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Priority to CN202010323236.4A priority Critical patent/CN111496149B/en
Publication of CN111496149A publication Critical patent/CN111496149A/en
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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21GMAKING NEEDLES, PINS OR NAILS OF METAL
    • B21G1/00Making needles used for performing operations
    • B21G1/003Needles for special purposes, e.g. knitting, crochet, hat-pins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21FWORKING OR PROCESSING OF METAL WIRE
    • B21F1/00Bending wire other than coiling; Straightening wire

Abstract

The invention discloses a double bending machine for a probe, which comprises a clamping mechanism, wherein the probe is tightly installed in the clamping mechanism; the bending mechanism is positioned on the outer side of the clamping mechanism and used for bending the probe for the first time; the second bending mechanism is positioned on the outer side of the clamping mechanism and is used for bending the probe for the second time; the clamping mechanism is arranged on the sliding mechanism and can move towards the first bending mechanism and the second bending mechanism along with the sliding mechanism. This two crib crimpers are used to probe has solved current manual work and has buckled the man-hour to the probe, has the problem that inefficiency and defective percentage are high.

Description

Double-bending machine for probe
Technical Field
The invention belongs to the technical field of precision hardware processing equipment, and particularly relates to a double bending machine for a probe.
Background
Precision hardware processing, namely, processing raw materials (stainless steel, copper materials, aluminum materials, iron materials and the like) into various high-precision parts according to the drawing or sample requirements of customers by using mechanical equipment such as a lathe, a milling machine, a drilling machine, polishing and the like.
The probe belongs to a high-end electronic type precise hardware element, is mainly used as a contact medium for electrical test, and is widely applied to the fields of aviation, aerospace, war industry, medical treatment, photoelectricity and the like at present. In the production process of the probe, blind holes, micropores, slotting, bending and the like are mainly involved. For bending processing of the probe, the probe is small in size, so that the probe is difficult to process by using traditional processing equipment, and at present, the bending processing is mainly completed manually by a person by means of a simple tool.
According to the production experience of the inventor, the existing probe bending processing mode has the following defects: (1) bending is finished manually, so that the bending degree of the probe is difficult to be ensured to be consistent all the time, and particularly when the probe needs to be subjected to multi-bending processing, the final formed product has larger error and higher defective rate; (2) the labor efficiency is low, and the method is not suitable for large-scale production and processing operation.
Disclosure of Invention
The invention aims to provide a double bending machine for a probe, which aims to solve the problems of low efficiency and high defective rate in the existing manual bending process of the probe.
In order to achieve the purpose, the invention adopts the technical scheme that: a double bending machine for a probe comprises:
the clamping mechanism is used for tightly clamping the probe;
the bending mechanism is positioned on the outer side of the clamping mechanism and used for bending the probe for the first time;
the second bending mechanism is positioned on the outer side of the clamping mechanism and is used for bending the probe for the second time;
the clamping mechanism is arranged on the sliding mechanism and can move towards the first bending mechanism and the second bending mechanism along with the sliding mechanism.
The technical scheme of the invention also has the following characteristics:
the sliding mechanism comprises a first guide rail, a first reciprocating driving mechanism is arranged in the first guide rail, a first base plate is arranged on the first guide rail in a sliding mode, the telescopic end of the first reciprocating driving mechanism is connected with the side portion of the first base plate, a second guide rail and a second reciprocating driving mechanism are arranged on the first base plate, a second base plate is arranged on the second guide rail in a sliding mode, the telescopic end of the second reciprocating driving mechanism is connected with the side portion of the second base plate, and a clamping mechanism is arranged on the second base plate.
The clamping mechanism comprises a base, the base is arranged on the second substrate through a plurality of supporting columns, a third reciprocating driving mechanism is arranged on the base, the telescopic end of the third reciprocating driving mechanism stretches out downwards and is connected with an upper module, a lower module is arranged below the upper module, and the lower module is arranged on the second substrate.
An upper template is arranged on the telescopic end of the third reciprocating driving mechanism, and the upper module is arranged on the upper template; the second substrate is provided with a lower template, and the lower module is arranged on the lower template.
The first bending mechanism comprises a first support and a fourth reciprocating driving mechanism, and a bending block for bending the probe is rotatably arranged in the first support; and the telescopic end of the fourth reciprocating driving mechanism extends into the first support and then is rotatably connected with the bending block.
The two-way bending mechanism comprises a second support, a rotary cylinder is arranged in the second support, the rotating end of the rotary cylinder is connected with two bending blocks used for bending the probe, and a material holding block is arranged on the side portion of the second support and used for supporting the probe.
A return spring is arranged in the second support, and the middle part of the material holding block is sleeved in the return spring; a fifth reciprocating driving mechanism is further arranged in the second support, a jacking block with a step surface on the side part is arranged at the telescopic end of the fifth reciprocating driving mechanism, and the non-step surface part of the jacking block is used for jacking the material supporting block.
The first support, the second support and the fifth reciprocating driving mechanism are arranged on the third support.
The first guide rail, the third support and the fourth reciprocating driving mechanism are all arranged on the case.
The third support is disposed on the chassis by a plurality of pillars.
The invention has the beneficial effects that: the invention relates to a double bending machine for a probe, which is specially designed for multi-pass bending processing of the probe, and adopts the principle that a bending framework is adopted to clamp the probe, then a first bending processing of the probe is finished by using a first bending mechanism, and then a sliding mechanism is used to move the clamping mechanism to a second bending mechanism to finish a second bending processing of the probe; the probe uses the double bending machine to replace the existing manual multiple bending processing of the probe, so that the efficiency is high, the bending degree of all the probes can be basically kept consistent through the machining mode, and the generation of defective products is greatly reduced.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a perspective view of a double bending machine for a probe according to the present invention;
FIG. 2 is a schematic structural diagram of a probe of the present invention during a first bending process with a double bending machine;
FIG. 3 is a schematic structural diagram of a probe of the present invention during a second bending process by a double bending machine;
FIG. 4 is a schematic structural view of a probe after being bent for the first time and bent for the second time by a double bending machine for the probe according to the present invention;
FIG. 5 is a schematic structural diagram of a bending mechanism region of a probe double bending machine according to the present invention;
FIG. 6 is a schematic structural diagram of two bending mechanism regions of a double bending machine for a probe according to the present invention.
In the figure: 1. the device comprises a case, 2, a first guide rail, 3, a first base plate, 4, a second guide rail, 5, a rotary cylinder, 6, a second bending block, 7, a second support, 8, a third reciprocating driving mechanism, 9, a base, 10, a stand column, 11, a support column, 12, an upper template, 13, a first support, 14, a second base plate, 15, a second reciprocating driving mechanism, 16, a lower template, 17, a guide column, 18, a support, 19, a first reciprocating driving mechanism, 20, a second support, 21, a lower module, 22, an upper module, 23, a fourth reciprocating driving mechanism, 24, a material supporting block, 25, a tightening block, 26 and a fifth reciprocating driving mechanism.
Detailed Description
The following embodiments are described in detail with reference to the accompanying drawings, so that how to implement the technical features of the present invention to solve the technical problems and achieve the technical effects can be fully understood and implemented.
As shown in fig. 1, a double bending machine for a probe according to the present invention includes:
the clamping mechanism is used for tightly clamping the probe;
the bending mechanism is positioned on the outer side of the clamping mechanism and used for bending the probe for the first time;
the second bending mechanism is positioned on the outer side of the clamping mechanism and is used for bending the probe for the second time;
the clamping mechanism is arranged on the sliding mechanism and can move towards the first bending mechanism and the second bending mechanism along with the sliding mechanism.
The probe can be bent by two procedures by using the double bending machine for the probe, and specifically, the double bending machine for the probe comprises the following steps: as shown in fig. 2, when the probe is bent for the first time, the probe is clamped in the clamping mechanism, and then a bending mechanism is used to complete the first bending of the probe; as shown in fig. 3, after the probe is bent for the first time, the clamping mechanism is moved to the position of the second bending mechanism by using the sliding mechanism, and the second bending mechanism is used to bend the probe for the second time again; as shown in fig. 3, the broken line in the drawing indicates a structure after the first bending process of the probe, and the solid line indicates a structure after the second bending process of the probe.
As shown in fig. 1, in the double bending machine for a probe according to the present invention, the slide mechanism includes a first rail 2, a first reciprocating drive mechanism 19 is provided in the first rail 2, a first substrate 3 is slidably provided on the first rail 2, a telescopic end of the first reciprocating drive mechanism 19 is connected to a side portion of the first substrate 3, a second rail 4 and a second reciprocating drive mechanism 15 are provided on the first substrate 3, a second substrate 14 is slidably provided on the second rail 4, a telescopic end of the second reciprocating drive mechanism 15 is connected to a side portion of the second substrate 14, and a clamping mechanism is provided on the second substrate 14.
The first reciprocating drive mechanism 19 and the second reciprocating drive mechanism 15 are preferably air cylinders, the telescopic ends of which are arranged at 90 °, wherein: the telescopic end of the first reciprocating driving mechanism 19 pushes the first substrate 3 to enable the first substrate to slide along the first guide rail 2, and then the clamping mechanism can drive the probe to move away from and close to a bending mechanism; the telescopic end of the second reciprocating driving mechanism 15 pushes the second substrate 14, so that the second substrate 14 slides along the second guide rail 4, and the clamping mechanism can drive the probe to move away from and close to the second bending mechanism.
As shown in fig. 2, in the double bending machine for probe according to the present invention, the clamping mechanism includes a base 9, the base 9 is disposed on the second substrate 14 through a plurality of pillars 10, a third reciprocating driving mechanism 8 is disposed on the base 9, a telescopic end of the third reciprocating driving mechanism 8 extends downward and is connected to an upper module 22, a lower module 21 is disposed below the upper module 22, and the lower module 21 is disposed on the second substrate 14.
The surface of the upper module 22 and the surface of the lower module 21 are provided with grooves for placing probes, and when the telescopic end of the third reciprocating driving mechanism 8 moves downwards, the probes are clamped in the grooves between the upper module 22 and the lower module 21.
As shown in fig. 2, in the double bending machine for probe of the present invention, an upper mold plate 12 is provided on the telescopic end of the third reciprocating driving mechanism 8, and an upper mold block 22 is provided on the upper mold plate 12; the second substrate 14 is provided with a lower template 16, and the lower module 21 is disposed on the lower template 16.
The upper module 22 is fixed on the telescopic end of the third reciprocating driving mechanism 8 through the upper template 12, and the lower module 21 is fixed on the second base plate 14 through the lower template 16, so that the upper module 22 and the lower module 21 can be assembled quickly.
As shown in fig. 5, in the double bending machine for a probe according to the present invention, a bending mechanism includes a first support 13 and a fourth reciprocating driving mechanism 23, a bending block 25 for bending the probe is rotatably provided in the first support 13; the telescopic end of the fourth reciprocating driving mechanism 23 extends into the first bracket 13 and is rotatably connected with a bending block 25.
One end of the first bending block 25 is rotatably arranged in the first bracket 13 through a rotating shaft, and one end of the first bending block 25 is rotatably connected with the telescopic end of the fourth reciprocating driving mechanism 23 through a pin. When the telescopic end of the fourth reciprocating driving mechanism 23 moves, the bending block 25 makes a curve motion by using the rotating shaft as an axis, and the first bending processing of the probe is completed.
As shown in fig. 6, in the double bending machine for a probe according to the present invention, the two-stage bending mechanism includes a second support 7, a rotary cylinder 5 is disposed in the second support 7, a two-stage bending block 6 for bending the probe is connected to a rotating end of the rotary cylinder 5, and a supporting block 24 is disposed on a side portion of the second support 7, and the supporting block 24 is used for supporting the probe.
When the probe moves to the second bending mechanism, the material supporting block 24 is supported below the probe, the rotary cylinder 5 is started, the rotating end of the rotary cylinder 5 drives the second bending block 6 to complete rotation of a set angle, and the probe is pressed to complete secondary bending.
As shown in fig. 6, in the double bending machine for a probe according to the present invention, a return spring is disposed in the second support 7, and the middle of the supporting block 24 is sleeved in the return spring; a fifth reciprocating driving mechanism 23 is further arranged in the second support 7, a tightening block 25 with a step surface on the side is arranged at the telescopic end of the fifth reciprocating driving mechanism 23, and the non-step surface of the tightening block 25 is used for tightening the material holding block 24.
One end of the material supporting block 24 is larger than the inner diameter of the return spring, the other end of the material supporting block extends out of the return spring and is provided with a nut, the return spring can be limited in the middle of the material supporting block 24, when the telescopic end of the fifth reciprocating driving mechanism 23 moves, the non-step surface part of the jacking block 25 jacks out the material supporting block 24, the material supporting block is located below the probe, and the lower part of the probe is supported, so that secondary bending processing can be completed better.
As shown in fig. 6, the double bending machine for a probe according to the present invention further includes a third frame 20, and the first support 13, the second support 20 and the fifth reciprocating driving mechanism 23 are disposed on the third support 20, so as to facilitate adjustment of installation heights of the first bending mechanism and the second bending mechanism.
Referring to fig. 6, the double bending machine for a probe according to the present invention further includes a case 1, wherein the first rail 2, the third bracket 20 and the fourth reciprocating driving mechanism 23 are all disposed on the case 1, and a stable working platform can be provided for the first rail 2, the third bracket 20 and the fourth reciprocating driving mechanism 23.
As shown in fig. 1, in the double bending machine for a probe according to the present invention, a third support 20 is provided on a machine case 1 by a plurality of support columns 11, and the height of the third support 20 is adjusted by limiting the length of the support columns 11.
As shown in fig. 1, in the double bending machine for a probe according to the present invention, the first reciprocating drive mechanism 19, the second reciprocating drive mechanism 15, the third reciprocating drive mechanism 8, the fourth reciprocating drive mechanism 23 and the fifth reciprocating drive mechanism 26 are fixed by the support 18.
As shown in fig. 1, in the double bending machine for probe according to the present invention, a plurality of guide holes are formed in an upper die plate 12, a plurality of guide posts 17 are formed in a lower die plate 16, and the guide posts 17 slide in the corresponding guide holes, so that the upper die block 22 and the lower die block 21 can be accurately aligned, and the grooves of the two die blocks can be completely aligned.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (6)

1. A probe is with two crib crimpers, characterized by, includes:
the clamping mechanism is used for tightly clamping the probe;
the bending mechanism is positioned on the outer side of the clamping mechanism and used for bending the probe for the first time;
the second bending mechanism is positioned on the outer side of the clamping mechanism and is used for bending the probe for the second time;
the clamping mechanism is arranged on the sliding mechanism and can move to the first bending mechanism and the second bending mechanism along with the sliding mechanism;
wherein the content of the first and second substances,
the probe is used for a contact medium of an electric test;
the sliding mechanism comprises a first guide rail (2), a first reciprocating driving mechanism (19) is arranged in the first guide rail (2), a first base plate (3) is arranged on the first guide rail (2) in a sliding mode, the telescopic end of the first reciprocating driving mechanism (19) is connected with the side portion of the first base plate (3), a second guide rail (4) and a second reciprocating driving mechanism (15) are arranged on the first base plate (3), a second base plate (14) is arranged on the second guide rail (4) in a sliding mode, the telescopic end of the second reciprocating driving mechanism (15) is connected with the side portion of the second base plate (14), and the clamping mechanism is arranged on the second base plate (14);
the clamping mechanism comprises a base (9), the base (9) is arranged on the second substrate (14) through a plurality of support columns (10), a third reciprocating driving mechanism (8) is arranged on the base (9), the telescopic end of the third reciprocating driving mechanism (8) extends downwards and is connected with an upper module (22), a lower module (21) is arranged below the upper module (22), and the lower module (21) is arranged on the second substrate (14);
the one-way bending mechanism comprises a first support (13) and a fourth reciprocating driving mechanism (23), and a one-way bending block for bending the probe is rotatably arranged in the first support (13); the telescopic end of the fourth reciprocating driving mechanism (23) extends into the first support (13) and then is rotatably connected with the bending block;
the two-way bending mechanism comprises a second support (7), a rotary cylinder (5) is arranged in the second support (7), the rotating end of the rotary cylinder (5) is connected with two bending blocks (6) used for bending the probe, a material supporting block (24) is arranged on the side portion of the second support (7), and the material supporting block (24) is used for supporting the probe;
the probe is clamped in the clamping mechanism by the double-bending machine, then the first bending processing is finished on the probe by using the one bending mechanism, after the first bending processing is finished on the probe, the clamping mechanism is moved to the position of the two bending mechanisms by using the sliding mechanism, and the second bending processing is carried out on the probe by using the two bending mechanisms again.
2. The double bending machine for the probe according to claim 1, wherein an upper template (12) is arranged on the telescopic end of the third reciprocating driving mechanism (8), and the upper module (22) is arranged on the upper template (12); the second substrate (14) is provided with a lower template (16), and the lower module (21) is arranged on the lower template (16).
3. The double bending machine for the probe according to claim 2, wherein a return spring is arranged in the second bracket (7), and the middle part of the block holding block (24) is sleeved in the return spring; a fifth reciprocating driving mechanism (26) is further arranged in the second support (7), a jacking block (25) with a step surface on the side is arranged at the telescopic end of the fifth reciprocating driving mechanism (26), and the non-step surface part of the jacking block (25) is used for jacking the material supporting block (24).
4. The double bender for probes according to claim 3, further comprising a third support (20), said first support (13), said second support (7) and said fifth reciprocating drive mechanism (26) being arranged on said third support (20).
5. The double bending machine for the probe according to claim 4, further comprising a machine case (1), wherein the first guide rail (2), the third bracket (20) and the fourth reciprocating drive mechanism (23) are all arranged on the machine case (1).
6. The double bender for probes according to claim 5, characterized in that said third support (20) is arranged on said cabinet (1) by means of a plurality of struts (11).
CN202010323236.4A 2020-04-22 2020-04-22 Double-bending machine for probe Active CN111496149B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010323236.4A CN111496149B (en) 2020-04-22 2020-04-22 Double-bending machine for probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010323236.4A CN111496149B (en) 2020-04-22 2020-04-22 Double-bending machine for probe

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CN111496149A CN111496149A (en) 2020-08-07
CN111496149B true CN111496149B (en) 2021-07-06

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1089422A (en) * 1963-11-18 1967-11-01 Eastman Kodak Co An automated manipulator
CN104492931A (en) * 2014-12-12 2015-04-08 昆山市佰奥自动化设备科技有限公司 Automatic flattening and bending equipment
CN204321014U (en) * 2014-12-19 2015-05-13 安徽德系重工科技有限公司 A kind of bending machine feed mechanism
CN206578167U (en) * 2017-01-23 2017-10-24 卓越(苏州)自动化设备有限公司 The workpiece bending mechanism of terminal is provided with groove
CN209006457U (en) * 2018-07-19 2019-06-21 绵阳市长力科技有限公司 A kind of probe bar folder
CN110315002A (en) * 2018-03-28 2019-10-11 儒拉玛特自动化技术(苏州)有限公司 Capacitor stitch shearing bending all-in-one machine
CN110421034A (en) * 2019-06-13 2019-11-08 中电鼎康(天长)科技有限公司 A kind of temperature sensor production probe bending device
CN110586802A (en) * 2019-10-08 2019-12-20 江苏创源电子有限公司 Bending equipment and bending method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080142110A1 (en) * 2006-10-14 2008-06-19 Performance Design, Inc. Crimper for binding coil

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1089422A (en) * 1963-11-18 1967-11-01 Eastman Kodak Co An automated manipulator
CN104492931A (en) * 2014-12-12 2015-04-08 昆山市佰奥自动化设备科技有限公司 Automatic flattening and bending equipment
CN204321014U (en) * 2014-12-19 2015-05-13 安徽德系重工科技有限公司 A kind of bending machine feed mechanism
CN206578167U (en) * 2017-01-23 2017-10-24 卓越(苏州)自动化设备有限公司 The workpiece bending mechanism of terminal is provided with groove
CN110315002A (en) * 2018-03-28 2019-10-11 儒拉玛特自动化技术(苏州)有限公司 Capacitor stitch shearing bending all-in-one machine
CN209006457U (en) * 2018-07-19 2019-06-21 绵阳市长力科技有限公司 A kind of probe bar folder
CN110421034A (en) * 2019-06-13 2019-11-08 中电鼎康(天长)科技有限公司 A kind of temperature sensor production probe bending device
CN110586802A (en) * 2019-10-08 2019-12-20 江苏创源电子有限公司 Bending equipment and bending method

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